TWI456907B - 數位類比轉換電路及其權重誤差估測與校正方法 - Google Patents

數位類比轉換電路及其權重誤差估測與校正方法 Download PDF

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TWI456907B
TWI456907B TW101147417A TW101147417A TWI456907B TW I456907 B TWI456907 B TW I456907B TW 101147417 A TW101147417 A TW 101147417A TW 101147417 A TW101147417 A TW 101147417A TW I456907 B TWI456907 B TW I456907B
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weight
output
digital
converter
group
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TW101147417A
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TW201424273A (zh
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Hao Chiao Hong
Yu Shien Wang
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Univ Nat Chiao Tung
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Priority to US13/948,322 priority patent/US8836554B2/en
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
    • H03M1/1061—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values using digitally programmable trimming circuits

Claims (16)

  1. 一種數位類比轉換電路，包括：P個轉換器單元，其中包含A個已知權重轉換器單元，以及P-A個未知權重轉換器單元；一輸出切換電路，其係電性連接該等P個轉換器單元並接收每一該轉換器單元之輸出，該輸出切換電路於一錯誤估測模式時，根據一參考群組數位控制訊號於該等P個轉換器單元中動態選取N個該等轉換器單元作為參考轉換器群組，該參考轉換器群組至少包含該等A個已知權重轉換器單元，並根據該參考群組數位控制訊號正比例輸出一參考輸出(Ir)，以及根據一待校群組數位控制訊號於該等P-A個未知權重轉換器單元中動態選取至少一個該未知權重轉換器單元作為待校轉換器群組並產生一待校輸出(Ic)，且該待校輸出小於該參考輸出之最大值；一類比數位轉換器，係依該參考輸出(Ir)和該待校輸出(Ic)的差值產生一數位校正訊號(Do)；一數位控制器，電性連接該類比數位轉換器及該輸出切換電路，係用以產生該參考群組數位控制訊號與該待校群組數位控制訊號，使該參考輸出逼近該待校輸出(Ic)並於接收該數位校正訊號(Do)後產生一數位權重輸出，該數位權重輸出係用以建立一權重表，該數位控制器根據該權重表計算每一該未知權重轉換器單元的真實數位權重；以及 一校正記憶體，電性連接該數位控制器，係用以儲存該數位控制器根據該權重表所計算出之每一該未知權重轉換器單元之真實數位權重。
  2. 如請求項1所述之數位類比轉換電路，其中該類比數位轉換器為一比較器。
  3. 如請求項1所述之數位類比轉換電路，其中該A個已知權重轉換器單元之權重係依序呈2的冪次遞增。
  4. 如請求項1所述之數位類比轉換電路，其中每一該未知權重轉換器單元之名義上權重輸出係相等。
  5. 如請求項1所述之數位類比轉換電路，其中該權重表內之每一該數位權重輸出係經由選取不同的該N個轉換器單元組成不同的該參考轉換器群組所得到之結果。
  6. 如請求項1所述之數位類比轉換電路，其中該數位控制器於正常轉換模式時，係接收一數位輸入訊號並根據該校正記憶體的內容控制該輸出切換電路產生一校正後類比輸出。
  7. 如請求項1所述之數位類比轉換電路，其中該參考輸出(Ir)與該待校輸出(Ic)係為差動訊號。
  8. 一種數位類比轉換電路之權重誤差估測方法，用以於如請求項1所述之數位類比轉換電路中估測該待校輸出(Ic)之真實權重，包括下列步驟：選取M個不同的該待校轉換器群組產生M個不同的該待校輸出，其中M大於或等於P-A； 對每一該待校輸出以逐次逼近法(Successive Approximation)進行估測，利用改變該參考群組數位控制訊號，來控制該參考輸出(Ir)使得該參考輸出(Ir)逐次逼近該待校輸出(Ic)，進而計算出該待校輸出(Ic)之該數位權重輸出；以及依該等待校輸出(Ic)之該數位權重輸出建立該權重表，反覆實施直至該數位控制器可以根據該權重表計算出每一該未知權重轉換器單元之真實數位權重，並儲存於該校正記憶體。
  9. 如請求項8所述之數位類比轉換電路之權重誤差估測方法，其中逐一對該M個待校轉換器群組輸出(IMSB _1 ~IMSB_M )以該逐次逼近法(Successive Approximation)進行估測時，係利用該參考轉換器群組的A個已知權重轉換器單元及部分之該等P-A個未知權重轉換器單元。
  10. 如請求項8所述之數位類比轉換電路之權重誤差估測方法，其中在進行估測時，該數位控制器係利用該權重表內容所對應的多組待解之聯立方程式一併計算出該P-A個未知權重轉換器單元的真實數位權重。
  11. 如請求項8所述之數位類比轉換電路之權重誤差估測方法，其中該參考輸出(Ir)與該待校輸出(Ic)係為差動訊號。
  12. 如請求項8所述之數位類比轉換電路之權重誤差估測方法，其中該P-A個未知權重轉換器單元係以溫度計碼(Thermometer Code)操作，進而提供該待校轉換器群組輸出，以作為該待校輸出Ic。
  13. 如請求項8所述之數位類比轉換電路之權重誤差估測方法，其中該M個待校轉換器單元更可分成二組相同之群組，每一該群組之轉換器單元權重輸出係依序呈2的冪次遞增進而提供2M個待校轉換器群組輸出以作為該待校輸出Ic。
  14. 如請求項8所述之數位類比轉換電路之權重誤差估測方法，其中該等未知權重轉換器單元所提供之每一輸出(IMSB _1 ~IMSB_M )係被切割為至少兩個權重更小的輸出，以確保該待校轉換器群組所提供之最小輸出不大於該參考輸出之最大值。
  15. 如請求項14所述之數位類比轉換電路之權重誤差估測方法，其中每一該輸出(IMSB_m )係切割為至少兩個最小待校輸出(,n{0,1,...})，使該最小待校輸出滿足下式： 其中，Σdk(m,n)ILSB_k 為該N個參考轉換器群組所產生的該參考輸出、dk(m,n) 為該參考群組最終的數位控制訊號，藉此該N個轉換器單元所提供之參考輸出(ILSB_k )即足以估測該待校輸出之數位權重輸出。
  16. 一種數位類比轉換電路之權重誤差校正方法，用以於如請求項1所述之數位類比轉換電路中校正該待校轉換群組之輸出，包括下列步驟：利用該校正記憶體所儲存之真實權重表修正該等轉換器單元的數位控制訊號；以及 利用修正後的該待校轉換器群組以及該參考轉換器群組的數位控制訊號驅動該等轉換器單元產生該數位類比轉換電路之校正後輸出，進而校正該P-A個未知權重轉換器單元所產生的輸出誤差。
TW101147417A 2012-12-14 2012-12-14 數位類比轉換電路及其權重誤差估測與校正方法 TWI456907B (zh)

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US13/948,322 US8836554B2 (en) 2012-12-14 2013-07-23 Digital-to-analog converter (DAC) circuit and weight error estimation/calibration method thereof

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI594579B (zh) * 2016-06-13 2017-08-01 瑞昱半導體股份有限公司 連續逼近暫存器類比數位轉換器及其類比至數位訊號轉換方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140306689A1 (en) * 2013-04-10 2014-10-16 Texas Instruments, Incorporated High resolution current pulse analog measurement
US9432044B1 (en) * 2015-12-18 2016-08-30 Texas Instruments Incorporated Mismatch correction of attenuation capacitor in a successive approximation register analog to digital converter
CN108988860B (zh) * 2017-05-31 2022-08-09 深圳市中兴微电子技术有限公司 一种基于sar adc的校准方法及sar adc系统
TWI645680B (zh) * 2017-09-28 2018-12-21 瑞昱半導體股份有限公司 類比至數位轉換裝置及其類比至數位轉換器校正方法
TWI643462B (zh) * 2017-11-06 2018-12-01 瑞昱半導體股份有限公司 連續漸近暫存器式類比至數位轉換器之位元錯誤率預測電路
CN109039332B (zh) * 2018-06-14 2022-04-01 东南大学 一种逐次逼近型模数转换器及其低功耗开关算法
US10840934B2 (en) * 2019-04-03 2020-11-17 Semiconductor Components Industries, Llc Methods and apparatus for a successive approximation register analog-to-digital converter
US10742225B1 (en) * 2019-12-27 2020-08-11 Intel Corporation n-bit successive approximation register analog-to-digital converter and method for calibrating the same, receiver, base station and mobile device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5684487A (en) * 1995-06-05 1997-11-04 Analog Devices, Incorporated A/D converter with charge-redistribution DAC and split summation of main and correcting DAC outputs
US7129879B1 (en) * 2005-07-12 2006-10-31 Analog Devices, Inc. Method of and apparatus for characterizing an analog to digital converter
US7688238B2 (en) * 2007-03-27 2010-03-30 Slicex, Inc. Methods and systems for calibrating a pipelined analog-to-digital converter
US7969335B2 (en) * 2005-05-06 2011-06-28 Agere Systems Inc. Digital correction of nonlinearity errors of multibit delta-sigma digital to analog converters
US8134486B2 (en) * 2009-08-17 2012-03-13 Taiwan Semiconductor Manufacturing Company, Ltd. DAC calibration

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7002496B2 (en) 2004-01-07 2006-02-21 Texas Instruments Incorporated All-digital calibration of string DAC linearity using area efficient PWL approximation: eliminating hardware search and digital division
TWI249903B (en) * 2005-03-16 2006-02-21 Univ Tsinghua Multi-step analog/digital converter and on-line calibration method thereof
US7839323B2 (en) * 2008-12-29 2010-11-23 Intersil Americas, Inc. Error estimation and correction in a two-channel time-interleaved analog-to-digital converter
US20100164765A1 (en) 2008-12-31 2010-07-01 Masaya Miyahara DAC calibration circuits and methods
US7893853B2 (en) 2008-12-31 2011-02-22 Taiwan Semiconductor Manufacturing Company, Ltd. DAC variation-tracking calibration
JP5465965B2 (ja) * 2009-03-31 2014-04-09 ルネサスエレクトロニクス株式会社 データ処理装置及びデータ処理システム
US8031098B1 (en) 2010-01-19 2011-10-04 National Semiconductor Corporation DAC circuit with pseudo-return-to-zero scheme and DAC calibration circuit and method
US8368571B2 (en) * 2011-03-31 2013-02-05 Analog Devices, Inc. Pipelined ADC having error correction
US8659457B2 (en) * 2012-03-06 2014-02-25 Xw, Llc. Self-compensating digital-to-analog converter and methods of calibration and operation thereof
TWI501562B (zh) * 2012-10-05 2015-09-21 Univ Nat Chiao Tung 估測逐次漸近類比數位轉換器中電容權重誤差之方法與其應用於校正該逐次漸進類比數位轉換器

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5684487A (en) * 1995-06-05 1997-11-04 Analog Devices, Incorporated A/D converter with charge-redistribution DAC and split summation of main and correcting DAC outputs
US7969335B2 (en) * 2005-05-06 2011-06-28 Agere Systems Inc. Digital correction of nonlinearity errors of multibit delta-sigma digital to analog converters
US7129879B1 (en) * 2005-07-12 2006-10-31 Analog Devices, Inc. Method of and apparatus for characterizing an analog to digital converter
US7688238B2 (en) * 2007-03-27 2010-03-30 Slicex, Inc. Methods and systems for calibrating a pipelined analog-to-digital converter
US8134486B2 (en) * 2009-08-17 2012-03-13 Taiwan Semiconductor Manufacturing Company, Ltd. DAC calibration

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI594579B (zh) * 2016-06-13 2017-08-01 瑞昱半導體股份有限公司 連續逼近暫存器類比數位轉換器及其類比至數位訊號轉換方法

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US20140167988A1 (en) 2014-06-19
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