TWI456739B - 三維記憶體晶片之控制結構 - Google Patents

三維記憶體晶片之控制結構 Download PDF

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Publication number
TWI456739B
TWI456739B TW100145937A TW100145937A TWI456739B TW I456739 B TWI456739 B TW I456739B TW 100145937 A TW100145937 A TW 100145937A TW 100145937 A TW100145937 A TW 100145937A TW I456739 B TWI456739 B TW I456739B
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circuit
control circuit
slave
chip
main
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TW100145937A
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TW201324748A (zh
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Meng Fan Chang
Wei Cheng Wu
Tsung Hsien Huang
Chien Yuan Chen
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Nat Univ Tsing Hua
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/023—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in clock generator or timing circuitry
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C2029/1202—Word line control
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C2029/1206—Location of test circuitry on chip or wafer
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/26—Accessing multiple arrays
    • G11C2029/2602—Concurrent test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)

Claims (20)

  1. 一種三維記憶體晶片之結構，包括：一主晶片，其具有一主記憶體核心、一第一計時器、一輸入/輸出緩衝器、一第一接觸墊與一第二接觸墊；至少一從屬晶片，其與該主晶片堆疊，其中每一該至少一從屬晶片具有一各別從屬記憶體核心、一第二計時器與一第三接觸墊，其中該至少一從屬晶片不包含輸入/輸出緩衝器；以及一矽晶穿孔結構，耦接該第一接觸墊與該第三接觸墊。
  2. 如請求項1所述之三維記憶體晶片之結構，其中該第一計時器與該第二計時器分別為一第一本地計時器與一第二本地計時器。
  3. 一種三維記憶體晶片之控制結構，包括：一主晶片，其具有一主記憶體核心、一第一計時器、一輸入/輸出緩衝器、一邏輯控制電路層、一第一接觸墊與一第二接觸墊；至少一從屬晶片，其與該主晶片堆疊，其中每一該至少一從屬晶片具有一各別從屬記憶體核心、一第二計時器與一第三接觸墊；一第一矽晶穿孔結構，耦接該第一接觸墊與該第三接觸墊；其中該邏輯控制電路層包含一邏輯控制電路與一第四 接觸墊，該邏輯控制電路耦接該第四接觸墊，其中該主晶片之該邏輯控制電路用以控制該主記憶體核心與該從屬記憶體核心；以及一第二矽晶穿孔結構，耦接該第二接觸墊與該第四接觸墊。
  4. 如請求項3所述之三維記憶體晶片之控制結構，其中該第一計時器與該第二計時器分別為一第一本地計時器與一第二本地計時器。
  5. 一種三維記憶體晶片之控制結構，包括：一主晶片，其具有一主記憶體核心、一輸入/輸出緩衝器與一主控制電路，該主控制電路包括一邏輯控制電路與一第一時序控制電路；以及至少一從屬晶片，其與該主晶片堆疊，其中每一該至少一從屬晶片具有一各別一從屬記憶體核心、一核心測試邏輯電路與一第二時序控制電路；其中該主晶片之該邏輯控制電路用以控制該主記憶體核心與該從屬記憶體核心；其中該主晶片之該第一時序控制電路產生一第一時序，該至少一從屬晶片之該第二時序控制電路產生一第二時序。
  6. 如請求項5所述之三維記憶體晶片之控制結構，其中該 第一時序控制電路產生之該第一時序提供該第二時序控制電路。
  7. 一種三維記憶體晶片之控制結構，包括：一主晶片，其具有一主記憶體核心、一第一時序控制電路與一邏輯控制電路；以及至少一從屬晶片，其與該主晶片堆疊，其中每一該至少一從屬晶片具有一各別一從屬記憶體核心與一第二時序控制電路；其中該主晶片之該邏輯控制電路用以控制該主記憶體核心與該從屬記憶體核心；其中該主晶片之該第一時序控制電路產生一第一時序，該至少一從屬晶片之該第二時序控制電路產生一第二時序。
  8. 如請求項7所述之三維記憶體晶片之控制結構，其中該第一時序控制電路產生之該第一時序提供該第二時序控制電路。
  9. 如請求項7所述之三維記憶體晶片之控制結構，其中該第一時序控制電路與該第二時序控制電路各自包括一本地計時器與一本地偏壓。
  10. 如請求項7所述之三維記憶體晶片之控制結構，其中該 邏輯控制電路包含一指令解碼器、一指令閂鎖電路與一輸入/輸出閂鎖電路。
  11. 一種用於三維記憶體晶片結構之降低漏電流之電路架構，包括：一堆疊晶片，其中該堆疊晶片包含一主晶片與至少一從屬晶片，該主晶片與每一該至少一從屬晶片具有其各自的一記憶體核心，該主晶片包含一邏輯控制電路與一第一時序控制電路，該至少一從屬包含一第二時序控制電路，其中該主晶片之該邏輯控制電路用以控制該些記憶體核心，其中該主晶片之該第一時序控制電路產生一第一時序，該至少一從屬晶片之該第二時序控制電路產生一第二時序；一前置電路，耦接該些記憶體核心；一後置電路，耦接該些記憶體核心；一漏電流追蹤電路，耦接該前置電路；以及一資料保持電路，耦接該前置電路與該後置電路。
  12. 如請求項11所述之用於三維記憶體晶片結構之降低漏電流之電路架構，其中該主晶片提供一相對高電位與一相對低電位給該至少一從屬晶片，利用該漏電流追蹤電路與該資料保持電路，在不同操作電壓下，根據每一該至少一從屬晶片不同的狀況而自我控制該相對高電位與該相對低電位，因此得以減少漏電流之產生。
  13. 如請求項12所述之用於三維記憶體晶片結構之降低漏電流之電路架構，其中該主晶片，具有一第一計時器、一輸入/輸出緩衝器、一第一接觸墊與一第二接觸墊；其中每一該至少一從屬晶片具有一第二計時器與一第三接觸墊；一第一矽晶穿孔結構，耦接該第一接觸墊與該第三接觸墊；該邏輯控制電路耦接一第四接觸墊；以及一第二矽晶穿孔結構，耦接該第二接觸墊與該第四接觸墊。
  14. 如請求項12所述之用於三維記憶體晶片結構之降低漏電流之電路架構，其中該主晶片具有一輸入/輸出緩衝器；以及每一該至少一從屬晶片具有一各別一核心測試邏輯電路。
  15. 如請求項14所述之用於三維記憶體晶片結構之降低漏電流之電路架構，其中該第一時序控制電路產生之該第一時序提供該第二時序控制電路。
  16. 如請求項11所述之用於三維記憶體晶片結構之降低漏電流之電路架構，其中該前置電路與該後置電路分別包含至少一NMOS電晶體與至少一PMOS電晶體。
  17. 如請求項11所述之用於三維記憶體晶片結構之降低漏 電流之電路架構，其中該漏電流追蹤電路包含串連的追蹤電路單元。
  18. 如請求項11所述之用於三維記憶體晶片結構之降低漏電流之電路架構，其中該資料保持電路包括串連的上拉電晶體。
  19. 如請求項11所述之用於三維記憶體晶片結構之降低漏電流之電路架構，其中該漏電流追蹤電路得以箝位至記憶體陣列之一相對高電位。
  20. 如請求項11所述之用於三維記憶體晶片結構之降低漏電流之電路架構，其中該資料保持電路得以箝位至記憶體陣列之一相對高電位。
TW100145937A 2011-12-13 2011-12-13 三維記憶體晶片之控制結構 TWI456739B (zh)

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US13/524,980 US9013908B2 (en) 2011-12-13 2012-06-15 Control scheme for 3D memory IC

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