TWI454973B - 用於正規化來自電容性感測器之高阻抗陣列之信號的方法 - Google Patents

用於正規化來自電容性感測器之高阻抗陣列之信號的方法 Download PDF

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TWI454973B
TWI454973B TW097125030A TW97125030A TWI454973B TW I454973 B TWI454973 B TW I454973B TW 097125030 A TW097125030 A TW 097125030A TW 97125030 A TW97125030 A TW 97125030A TW I454973 B TWI454973 B TW I454973B
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sensors
array
signal
determining
scan time
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TW097125030A
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TW200915157A (en
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Ryan Seguine
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Cypress Semiconductor Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
    • G01D5/24—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electronic Switches (AREA)
  • Position Input By Displaying (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Description

用於正規化來自電容性感測器之高阻抗陣列之信號的方法 發明領域
這裏所描述之技術的一般希望是要克服投影電容式(project capacitance)觸摸螢幕應用中由於高阻抗電容性基材導致的信號損失。這裏呈現的是一種用於正規化來自電容性感測器之一高阻抗陣列之信號的方法。
 發明背景
習知的技術對於每一感測器使用相同的值並以相同的時間量來掃描。這對於陣列中每一感測器之末端與最接近連接處之感測器部分具有幾乎相同信號位準的銅感測基材而言是良好的。
在高阻抗電容性基材中，材料之串聯電阻藉由限制可被積累且接著以手指接觸從感測器放電的電荷量來降低可由控制IC所量測到的電容量。這被顯示於關於10個感測器墊片之一菊鏈陣列的第1圖中，像一投影觸摸式螢幕陣列中可見的一樣。
對於列及行感測器組成之一陣列而言，敏感度的降低發生在距該連接最遠的角落處，如第2圖中所示。
右下角的位置具有與左上角的感測器相同的接觸面積量。然而，由於其接近於該連接，該信號位準相對較大。
 發明概要
下文中所討論的技術可廣泛地被概括如下。
揭露了一種用於正規化來自電容性感測器之一高阻抗陣列之信號的方法，其包含下列步驟：決定所有有效的感測器之位置，及使用一純量來增加所有有效的感測器之信號位準。
揭露了一種用於正規化來自感測器之一陣列的一信號的方法，其包含下列步驟：決定所有有效的感測器之位置，及使用一純量來增加所有有效的感測器之信號位準。
揭露了一種用於正規化來自感測器之一陣列的一信號的方法，其包含下列步驟：決定一信號位置，及增加對該整個陣列的掃描時間。
揭露了前面段落之方法，其中該決定該位置之步驟以一形心或以一峰值檢測計算來執行。
揭露了一種用於正規化來自感測器之一陣列的一信號的方法，其包含下列步驟：決定一信號位置，及增加對該整個陣列的掃描時間，其中該決定該位置之步驟以一形心或以一峰值檢測計算來執行，且其中該增加的掃描時間隨著該峰值檢測或形心計算被移動而被更新。
揭露了一種用於正規化來自感測器之一陣列的一信號的方法，其包含下列步驟：決定一信號位置及增加對整個陣列的掃描時間，其中該決定該位置之步驟以一峰值檢測方法來執行，僅對於那些有效的感測器增加該掃描時間。
圖式簡單說明
下列圖式被呈現以較好地理解這裏揭露的發明，但不 作為此發明之限制。
第1圖是對10個感測器墊片之一菊鏈陣列的一習知的描述。
第2圖是對感測器之一陣列及感測器之行設定的一習知的描述。
第3圖是對關於本技術的感測器之一陣列及感測器之行設定的描述。
 較佳實施例之詳細說明
本發明技術較佳地提供一平衡方案，使得距離一連接較遠的感測器位置與接近該連接的那些感測器位置具有相同的信號位準。如現在所描述的，這可以以多種方式來實現。
方法1：
決定位置(以一形心或以一峰值(peak)檢測)且使用一純量來增加所有有效感測器之信號位準。儘管這是最簡單的方案，但其不提高解析度，只提高信號位準。
方法2：
決定位置且對於該整個陣列增加掃描時間。此方法將消耗較多的電力，但其將改善該等列及行之遠端處的信號。此已增加的掃描時間將隨著該峰值檢測/形心計算被移動而被更新。
方法3：
使用該位置(峰值檢測)以僅增加有效的那些感測器的 該感測時間。此方法提高敏感度，同時不會使該掃描時間增加的量如若整個陣列被增加的話可能增加的量一樣多。該等感測器將僅被檢視相對於另一軸上的峰值檢測之一段時間。
此技術優於未實施以前情況之期望的優勢在於：-已提高的敏感度-已提高的解析度建構的其他元件及/或方法可以是本技術可在任何投影電容式基材上被執行，但對於高阻抗基材而言將尤其有用。
這裏所揭露的技術中被認為是新的的一些特徵為：-動態的掃描時間-純量掃描時間/倍數(multiple)此技術提供改良的觸摸螢幕能力。
第1圖是對10個感測器墊片之一菊鏈陣列的一習知的描述。
第2圖是對感測器之一陣列及感測器之行設定的一習知的描述。
第3圖是對關於本技術的感測器之一陣列及感測器之行設定的描述。

Claims (5)

  1. 一種用於正規化來自電容性感測器之一高阻抗陣列之一信號的方法，其包含下列步驟：決定在該電容性感測器之陣列中的一個或多個有效的感測器之位置；及基於所決定的該有效的感測器之位置，藉由增加該有效的感測器之掃描時間來增加該有效的感測器之信號位準。
  2. 如申請專利範圍第1項所述之方法，其還包含下列步驟：使用一純量來增加該一個或多個有效的感測器之信號位準。
  3. 如申請專利範圍第1項所述之方法，其中決定該位置包含執行一形心計算或執行一峰值檢測計算。
  4. 如申請專利範圍第3項所述之方法，其還包含隨著該峰值檢測或形心計算被移動而更新該增加的掃描時間。
  5. 一種用於正規化來自感測器之一陣列的一信號的方法，其包含下列步驟：使用一峰值檢測方法決定一信號位置；及基於所決定的該信號位置，僅對於那些有效的感測器增加掃描時間。
TW097125030A 2007-07-03 2008-07-03 用於正規化來自電容性感測器之高阻抗陣列之信號的方法 TWI454973B (zh)

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