TWI436858B - Substrate grinding apparatus and method using the same - Google Patents
Substrate grinding apparatus and method using the same Download PDFInfo
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- TWI436858B TWI436858B TW098136590A TW98136590A TWI436858B TW I436858 B TWI436858 B TW I436858B TW 098136590 A TW098136590 A TW 098136590A TW 98136590 A TW98136590 A TW 98136590A TW I436858 B TWI436858 B TW I436858B
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- substrate
- polishing
- vacuum
- conveyor belt
- support table
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B9/00—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
- B24B9/02—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
- B24B9/06—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
- B24B9/08—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of glass
- B24B9/10—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of glass of plate glass
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/0069—Other grinding machines or devices with means for feeding the work-pieces to the grinding tool, e.g. turntables, transfer means
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
Description
本發明係關於一種基板研磨裝置及使用該基板研磨裝置之方法,且更特定言之,係關於無需裝載時間即可實現連續研磨基板之基板研磨裝置與使用該基板研磨裝置之方法。 The present invention relates to a substrate polishing apparatus and a method of using the substrate polishing apparatus, and more particularly to a substrate polishing apparatus for continuously polishing a substrate without a load time and a method of using the substrate polishing apparatus.
通常而言,平板顯示器面板或用作面板材料之原玻璃(下文稱之為“基板”)具有銳邊,因此處理期間其易於破裂。因而研磨銳邊之製程有必要防止基板破裂或類似情況出現。 In general, a flat panel display panel or a raw glass used as a panel material (hereinafter referred to as a "substrate") has sharp edges, and thus it is easily broken during processing. Therefore, it is necessary to prevent the substrate from being broken or the like from occurring in the process of grinding the sharp edges.
圖1顯示一傳統基板研磨裝置。如圖中所示,該傳統裝置包括一用於真空固持基板S之研磨台110與用於研磨藉由該研磨台110真空固持之該基板S長短側之上下邊緣之研磨單元120。 Figure 1 shows a conventional substrate polishing apparatus. As shown in the figure, the conventional apparatus includes a polishing table 110 for vacuum-holding the substrate S and a polishing unit 120 for polishing the upper and lower edges of the long and short sides of the substrate S held by the polishing table 110 in a vacuum.
圖2顯示圖1中該基板研磨裝置之操作。 Figure 2 shows the operation of the substrate polishing apparatus of Figure 1.
該研磨台110形成有真空固持該基板S之真空孔111,且該基板S之相對側提供有用以放置該基板S在該等研磨單元120間之一對研磨單元120。 The polishing table 110 is formed with a vacuum hole 111 for vacuum holding the substrate S, and the opposite side of the substrate S provides a pair of polishing units 120 for placing the substrate S between the polishing units 120.
首先,該基板S被裝載至該研磨台110上,並利用經由該等真空孔111形成之真空作用固持於其上(參見(a))。 First, the substrate S is loaded onto the polishing table 110 and held thereon by a vacuum formed by the vacuum holes 111 (see (a)).
在此狀態下,該研磨台110經由該對研磨單元120水準輸送。在水準輸送期間,該等研磨單元120研磨該基板之該等邊緣(參見(b)與(c))。 In this state, the polishing table 110 is level-fed via the pair of polishing units 120. The polishing unit 120 grinds the edges of the substrate during leveling (see (b) and (c)).
當完成研磨操作後,該基板S自該研磨台110卸載,其又返回至裝載一新基板之起始位置。 When the grinding operation is completed, the substrate S is unloaded from the polishing table 110, which in turn returns to the starting position where a new substrate is loaded.
為於研磨完一基板後裝載一新基板,如此一傳統基板研磨裝置返回至該起始位置需要花費時間。因而,該傳統基板研磨裝置存在不能連續實施研磨複數個基板之操作之問題。 In order to load a new substrate after polishing a substrate, it takes time for such a conventional substrate polishing apparatus to return to the starting position. Therefore, the conventional substrate polishing apparatus has a problem that the operation of polishing a plurality of substrates cannot be continuously performed.
本發明係旨在解決如上所述之該等問題,且本發明之一方面係提供一種無需裝載時間即可實現連續研磨基板之基板研磨裝置及使用該基板研磨裝置之方法。 The present invention is directed to solving the above problems, and an aspect of the present invention provides a substrate polishing apparatus for continuously polishing a substrate without a loading time and a method of using the substrate polishing apparatus.
根據本發明之一方面,一基板研磨裝置包括:一輸送基板之輸送單元;一佈置於該輸送單元任一側之研磨單元;與一在研磨區域均勻支撐該基板之支撐台。 According to an aspect of the invention, a substrate polishing apparatus includes: a transport unit that transports a substrate; a polishing unit disposed on either side of the transport unit; and a support table that uniformly supports the substrate in the polishing region.
該輸送單元可為一傳送帶。 The transport unit can be a conveyor belt.
該傳送帶可包括一真空孔。 The conveyor belt can include a vacuum aperture.
該支撐台可佈置於研磨區域內該傳送帶之下方。 The support table can be disposed below the conveyor belt within the abrasive zone.
該支撐台可包括一真空孔,該真空孔與該傳送帶之該真空孔相互連通以真空固持該研磨區域內之該基板。 The support table may include a vacuum hole that communicates with the vacuum hole of the conveyor belt to vacuum hold the substrate in the polishing region.
該支撐台可進一步包括一提供真空密封之密封構件。 The support table can further include a sealing member that provides a vacuum seal.
該密封構件可在該支撐台上表面之邊緣上包括一O型圈。 The sealing member may include an O-ring on the edge of the upper surface of the support table.
該傳送帶可包括一對傳送帶,該對傳送帶佈置於該基板之相對側,用以支撐該基板之該等相對側。 The conveyor belt can include a pair of conveyor belts disposed on opposite sides of the substrate for supporting the opposite sides of the substrate.
該對傳送帶間之間距可調節。 The distance between the pair of conveyor belts can be adjusted.
該基板研磨裝置可進一步包括一輸送台,該輸送台佈置於該對傳送帶之間,用以輸送一被裝載之基板至該研磨區域。 The substrate polishing apparatus may further include a transport stage disposed between the pair of conveyor belts for transporting a loaded substrate to the polishing area.
該輸送台可包括一用以真空固持該基板之真空孔。 The transfer station can include a vacuum aperture for vacuum holding the substrate.
該輸送台可上下驅動。 The conveyor can be driven up and down.
該輸送台可包括一對輸送台。 The transport station can include a pair of transport stations.
根據本發明之另一方面,一基板研磨方法包括:藉由傳送帶輸送基板;及在該基板被輸送時在研磨區域均勻維持該基板與該傳送帶。 According to another aspect of the present invention, a substrate polishing method includes: transporting a substrate by a conveyor belt; and uniformly maintaining the substrate and the conveyor belt in the polishing region while the substrate is being conveyed.
輸送基板可包括當該基板藉由該傳送帶支撐時真空固持與輸送該基板。 Transporting the substrate can include vacuum holding and transporting the substrate as the substrate is supported by the conveyor.
現將參照附圖詳細描述本發明之具體實施例。 Specific embodiments of the present invention will now be described in detail with reference to the drawings.
參照圖3至5,根據本發明之一具體實施例之基板研磨裝 置1包括:輸送基板P之一傳送帶11;一佈置於該傳送帶11任一側之研磨單元20;一在研磨區域內均勻支撐該基板P之支撐台40;與輸送台31、32。 Referring to Figures 3 to 5, a substrate grinding apparatus according to an embodiment of the present invention 1 includes: a conveyor belt 11 for transporting the substrate P; a polishing unit 20 disposed on either side of the conveyor belt 11; a support table 40 for uniformly supporting the substrate P in the polishing region; and a transport table 31, 32.
該傳送帶11係用於連續輸送或支撐該基板之組件且包括一對傳送帶,該對傳送帶支撐該基板P之相對側,用以穩定輸送該基板P。該等傳送帶11被連接至一皮帶傳動裝置12,該皮帶傳動裝置12驅動該等傳送帶11。該對傳送帶11可彼此靠近或彼此分開。因而,該對傳送帶11間之距離可調節。該裝置之組態使得處理各種尺寸之基板成為可能。 The conveyor belt 11 is for continuously conveying or supporting components of the substrate and includes a pair of conveyor belts supporting the opposite sides of the substrate P for stably conveying the substrate P. The conveyor belts 11 are connected to a belt drive 12 which drives the conveyor belts 11. The pair of conveyor belts 11 can be close to each other or separated from each other. Thus, the distance between the pair of conveyor belts 11 can be adjusted. The configuration of the device makes it possible to process substrates of various sizes.
該等研磨單元20形成為一對,用以同時研磨該基板之該等相對側,且每一該等研磨單元20包括一磨石與一心軸。 The polishing units 20 are formed as a pair for simultaneously grinding the opposite sides of the substrate, and each of the polishing units 20 includes a grindstone and a mandrel.
該等輸送台31、32位於該對傳送帶11之間,用以輸送在該傳送帶11一端部處裝載之基板至該等研磨單元20所在處之研磨區域。即,儘管該傳送帶11足以輸送該基板,但該等輸送台31、32係用作更為穩定地輸送該基板之輔助組件。若提供該等輸送台31、32,則該等傳送帶11可僅起支撐該基板之作用。 The transport stages 31, 32 are located between the pair of conveyor belts 11 for transporting the substrate loaded at one end of the conveyor belt 11 to the grinding area where the grinding unit 20 is located. That is, although the conveyor belt 11 is sufficient to convey the substrate, the conveyor tables 31, 32 serve as an auxiliary component for more stably conveying the substrate. If such transport stations 31, 32 are provided, the conveyor belts 11 can only function to support the substrate.
每一該等輸送台31、32形成有用以真空固持該基板之若干真空孔,且可驅動其上下移動。該基板在該傳送帶11之該端部處被裝載時,當真空固持該基板後,該輸送台31或32向上移動並輸送該基板。當輸送該基板完成時,該輸送台31或32釋放一真空,且向下移動,用以返回至其初始位置。該等輸送台31、32同樣組成一對,用以連續輸送基板。舉例言之,當一輸送台31真空固持且輸送該基板時,另一輸送台32返回至其初始位置以裝載一新基板。 Each of the transport stations 31, 32 forms a plurality of vacuum holes for holding the substrate in a vacuum and can be driven to move up and down. When the substrate is loaded at the end of the conveyor belt 11, the conveyor table 31 or 32 moves upward and conveys the substrate after vacuum holding the substrate. When the transfer of the substrate is completed, the transfer table 31 or 32 releases a vacuum and moves downward to return to its original position. The transport stages 31, 32 also form a pair for continuous transport of the substrate. For example, when a conveyor table 31 is vacuum held and transports the substrate, the other conveyor table 32 returns to its original position to load a new substrate.
圖6為根據本發明之一具體實施例之研磨區域之放大圖。如圖中所示,該支撐台40佈置於研磨區域內該等傳送帶11之下方。參照圖7,該支撐台40形成有經由其可形成真空之若干真空孔41,且一用於提供真空密封之O型圈42係以如 此一方式佈置,即其沿週邊佈置之十字形且位元於該支撐台40之上表面中央。 Figure 6 is an enlarged view of a polishing zone in accordance with an embodiment of the present invention. As shown in the figure, the support table 40 is disposed below the conveyor belts 11 in the grinding zone. Referring to Figure 7, the support table 40 is formed with a plurality of vacuum holes 41 through which a vacuum can be formed, and an O-ring 42 for providing a vacuum seal is as This arrangement is such that it is arranged in a cross shape along the circumference and is located at the center of the upper surface of the support table 40.
再參照圖6,每一該等傳送帶11亦形成有該等真空孔11a。因而,當該基板被輸送至該研磨區域時,其藉由該等真空孔41與在該支撐台40及該傳送帶11中形成之真空孔11a所形成之真空固持。 Referring again to Figure 6, each of the conveyor belts 11 is also formed with such vacuum holes 11a. Therefore, when the substrate is transported to the polishing region, it is held by the vacuum formed by the vacuum holes 41 and the vacuum holes 11a formed in the support table 40 and the conveyor belt 11.
換言之,該基板P、該等傳送帶11與該支撐台40在該研磨區域內彼此緊密接觸。在如此一緊密接觸狀態下,該等傳送帶11相對於該支撐台40相對運動時,其隨同該基板一起持續移動。因而,該等傳送帶11與該基板之間無相對運動存在。同樣地,該支撐台40與該等傳送帶11之間存在相對運動。此處,該O型圈42係用作使該支撐台40與該等傳送帶11彼此間可平穩滑動。換言之,該O型圈42不僅提供真空密封,同時亦使得該支撐台40與該等傳送帶11彼此間可平穩滑動。 In other words, the substrate P, the conveyor belts 11 and the support table 40 are in close contact with each other in the grinding region. In such a close contact state, as the conveyor belt 11 moves relative to the support table 40, it continues to move with the substrate. Thus, there is no relative motion between the conveyor belts 11 and the substrate. Likewise, there is relative movement between the support table 40 and the conveyor belts 11. Here, the O-ring 42 serves to smoothly slide the support table 40 and the conveyor belts 11 from each other. In other words, the O-ring 42 not only provides a vacuum seal, but also allows the support table 40 and the conveyor belts 11 to slide smoothly with each other.
因而,該基板藉由該支撐台40於該研磨區域內均勻維持之時,同時藉由該等傳送帶11水準輸送,且該基板之該等相對邊緣藉由佈置於該基板之該等相對側處之該等研磨單元20研磨。 Therefore, when the substrate is uniformly maintained in the polishing region by the support table 40, the substrate is simultaneously conveyed by the conveyor belt 11, and the opposite edges of the substrate are disposed at the opposite sides of the substrate. The grinding units 20 are ground.
下面將參照圖4描述根據本發明之一具體實施例之該基板研磨裝置之操作與研磨方法。 An operation and grinding method of the substrate polishing apparatus according to an embodiment of the present invention will be described below with reference to FIG.
首先,一裝載單元51吸附一將被研磨之基板P3,並將其裝載於該傳送帶11之一端部。 First, a loading unit 51 adsorbs a substrate P 3 to be polished and loads it at one end of the conveyor belt 11.
然後,該輸送台31或32被提升且真空固持該基板P2之同時朝研磨區域輸送該被裝載之基板P2。此處,該等傳送帶11持續操作。 Then, the transport stage 31 or 32 is lifted and the substrate P 2 is vacuum-held while transporting the loaded substrate P 2 toward the polishing area. Here, the conveyor belts 11 continue to operate.
當該基板P2以此方式被輸送至該研磨區域時,經由該支撐台40與該等傳送帶11內形成之該等真空孔形成真空,故該支撐台40、該傳送帶11與該基板P2彼此緊密接觸,同時在該研磨區域內均勻維持該基板。 When the substrate P 2 is transported to the polishing region in this manner, a vacuum is formed through the support table 40 and the vacuum holes formed in the conveyor belts 11, so the support table 40, the conveyor belt 11 and the substrate P 2 The substrates are in close contact with each other while maintaining the substrate uniformly in the polishing region.
在此狀態下,該傳送帶11持續操作,因此該基板P2可隨同該傳送帶11輸送。然而,該傳送帶11相對於該支撐台40滑動。當該基板被輸送之時,該基板之該等相對側處之該等邊緣藉由該等研磨單元20研磨(參見圖3)。 In this state, the conveyor belt 11 continues to operate, so that the substrate P 2 can be conveyed along with the conveyor belt 11. However, the conveyor belt 11 slides relative to the support table 40. When the substrate is being transported, the edges at the opposite sides of the substrate are ground by the grinding unit 20 (see Figure 3).
然後,該被研磨後之基板P1藉由該傳送帶11輸送,且藉由一卸載單元52卸載。 Then, the ground substrate P 1 is conveyed by the conveyor belt 11 and unloaded by an unloading unit 52.
圖3顯示用於研磨一基板相對之長側之基板研磨裝置。當完全研磨完該基板之該等相對之長側後,該基板被裝載進一用於研磨其相對之短側之基板研磨裝置。除該對傳送帶間之距離比圖3中所示之距離大之外,用於研磨該等相對之短側之該基板研磨裝置與圖3中所示之裝置相同。 Figure 3 shows a substrate polishing apparatus for polishing a relatively long side of a substrate. After the opposite long sides of the substrate are completely polished, the substrate is loaded into a substrate polishing apparatus for grinding the opposite short sides thereof. The substrate polishing apparatus for grinding the opposite short sides is the same as the apparatus shown in Fig. 3 except that the distance between the pair of belts is larger than the distance shown in Fig. 3.
如上所述,本發明提供一種無需裝載時間即可連續研磨基板之基板研磨裝置與使用該基板研磨裝置之方法。 As described above, the present invention provides a substrate polishing apparatus capable of continuously polishing a substrate without a load time and a method of using the substrate polishing apparatus.
儘管為圖示說明本發明已經提供一些具體實施例,但熟悉此項技藝之人士顯然明白該等具體實施例係以圖示說明之方式給出,在不偏離本發明之精神與範圍時,可進行各種更改與提供等價之具體實施例。本發明之範圍僅由所附之申請專利範圍與其等價物限定。 Although the present invention has been described in detail with reference to the embodiments of the present invention Specific embodiments are made to make various changes and provide equivalents. The scope of the invention is defined only by the scope of the appended claims and their equivalents.
1‧‧‧基板研磨裝置 1‧‧‧Substrate grinding device
11‧‧‧傳送帶 11‧‧‧Conveyor belt
11a‧‧‧真空孔 11a‧‧‧vacuum hole
12‧‧‧皮帶傳動裝置 12‧‧‧Belt transmission
20‧‧‧研磨單元 20‧‧‧grinding unit
31‧‧‧輸送台 31‧‧‧Conveyor
32‧‧‧輸送台 32‧‧‧Conveyor
40‧‧‧支撐台 40‧‧‧Support table
41‧‧‧真空孔 41‧‧‧vacuum hole
42‧‧‧O型圈 42‧‧‧O-ring
51‧‧‧裝載單元 51‧‧‧Loading unit
52‧‧‧卸載單元 52‧‧‧Unloading unit
110‧‧‧研磨台 110‧‧‧ polishing table
111‧‧‧真空孔 111‧‧‧vacuum hole
120‧‧‧研磨單元 120‧‧‧grinding unit
P‧‧‧基板 P‧‧‧Substrate
P1‧‧‧基板 P 1 ‧‧‧Substrate
P2‧‧‧基板 P 2 ‧‧‧Substrate
P3‧‧‧基板 P 3 ‧‧‧Substrate
S‧‧‧基板 S‧‧‧Substrate
參照該等附圖與上述描述將清楚瞭解本發明之該等上述與其他方面、特徵與優點,其中:圖1顯示一傳統基板研磨裝置;圖2顯示圖1中之該基板研磨裝置之操作;且圖3至7顯示根據本發明之一具體實施例之基板研磨裝置。 The above and other aspects, features and advantages of the present invention will be apparent from the accompanying drawings and the appended claims, wherein: FIG. 1 shows a conventional substrate polishing apparatus; FIG. 2 shows the operation of the substrate polishing apparatus of FIG. And Figures 3 through 7 show a substrate polishing apparatus in accordance with an embodiment of the present invention.
1‧‧‧基板研磨裝置 1‧‧‧Substrate grinding device
11‧‧‧傳送帶 11‧‧‧Conveyor belt
12‧‧‧皮帶傳動裝置 12‧‧‧Belt transmission
20‧‧‧研磨單元 20‧‧‧grinding unit
31‧‧‧輸送台 31‧‧‧Conveyor
32‧‧‧輸送台 32‧‧‧Conveyor
40‧‧‧支撐台 40‧‧‧Support table
P1‧‧‧基板 P 1 ‧‧‧Substrate
P2‧‧‧基板 P 2 ‧‧‧Substrate
P3‧‧‧基板 P 3 ‧‧‧Substrate
Claims (5)
Applications Claiming Priority (1)
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KR1020080106374A KR101075954B1 (en) | 2008-10-29 | 2008-10-29 | Substate grinding apparatus and method using the same |
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TW201026437A TW201026437A (en) | 2010-07-16 |
TWI436858B true TWI436858B (en) | 2014-05-11 |
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TW098136590A TWI436858B (en) | 2008-10-29 | 2009-10-29 | Substrate grinding apparatus and method using the same |
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KR (1) | KR101075954B1 (en) |
TW (1) | TWI436858B (en) |
Families Citing this family (6)
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KR101673150B1 (en) | 2014-07-03 | 2016-11-07 | 주식회사 케이엔제이 | Apparatus and Method for grinding flat panel |
KR101871853B1 (en) | 2015-10-01 | 2018-06-28 | 주식회사 케이엔제이 | Panel machining apparatus for flat type display |
KR102506729B1 (en) * | 2017-07-06 | 2023-03-08 | 주식회사 케이씨텍 | Substrate transfer conveyor and substrate polishing system comprising the same |
KR102042774B1 (en) * | 2017-11-14 | 2019-11-08 | 주식회사 케이씨텍 | Substrate polishing appartus |
KR102137969B1 (en) * | 2017-12-06 | 2020-07-27 | 주식회사 케이씨텍 | Substrate polishing appartus |
KR102199074B1 (en) | 2019-05-28 | 2021-01-06 | 주식회사 케이엔제이 | Substrate grinding apparatus |
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JPS63172556U (en) | 1987-04-28 | 1988-11-09 | ||
JP4069576B2 (en) * | 2000-07-21 | 2008-04-02 | 坂東機工株式会社 | Glass plate processing method and apparatus |
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KR20100047470A (en) | 2010-05-10 |
KR101075954B1 (en) | 2011-10-21 |
TW201026437A (en) | 2010-07-16 |
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