TWI433251B - 用於濕處理晶圓狀物件之周邊區域的裝置及方法 - Google Patents

用於濕處理晶圓狀物件之周邊區域的裝置及方法 Download PDF

Info

Publication number
TWI433251B
TWI433251B TW097143677A TW97143677A TWI433251B TW I433251 B TWI433251 B TW I433251B TW 097143677 A TW097143677 A TW 097143677A TW 97143677 A TW97143677 A TW 97143677A TW I433251 B TWI433251 B TW I433251B
Authority
TW
Taiwan
Prior art keywords
liquid
wafer
gas
peripheral region
processing unit
Prior art date
Application number
TW097143677A
Other languages
English (en)
Chinese (zh)
Other versions
TW200933794A (en
Inventor
亞歷山大 史華弗特那
迪特 法蘭克
喬珍 帕利弗
Original Assignee
蘭研究公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 蘭研究公司 filed Critical 蘭研究公司
Publication of TW200933794A publication Critical patent/TW200933794A/zh
Application granted granted Critical
Publication of TWI433251B publication Critical patent/TWI433251B/zh

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0406Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0411Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H10P72/0414Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • H10P72/0418Apparatus for fluid treatment for etching
    • H10P72/0422Apparatus for fluid treatment for etching for wet etching
    • H10P72/0424Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles

Landscapes

  • Cleaning Or Drying Semiconductors (AREA)
  • Weting (AREA)
TW097143677A 2007-11-23 2008-11-12 用於濕處理晶圓狀物件之周邊區域的裝置及方法 TWI433251B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AT19062007 2007-11-23

Publications (2)

Publication Number Publication Date
TW200933794A TW200933794A (en) 2009-08-01
TWI433251B true TWI433251B (zh) 2014-04-01

Family

ID=40300366

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097143677A TWI433251B (zh) 2007-11-23 2008-11-12 用於濕處理晶圓狀物件之周邊區域的裝置及方法

Country Status (7)

Country Link
US (1) US8801865B2 (https=)
EP (1) EP2215651A1 (https=)
JP (1) JP5336506B2 (https=)
KR (1) KR101505700B1 (https=)
CN (1) CN102084458B (https=)
TW (1) TWI433251B (https=)
WO (1) WO2009065757A1 (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5412230B2 (ja) * 2009-10-19 2014-02-12 株式会社半導体エネルギー研究所 コート材除去装置及びコート材除去方法
US8858755B2 (en) * 2011-08-26 2014-10-14 Tel Nexx, Inc. Edge bevel removal apparatus and method
US9038262B2 (en) * 2012-02-23 2015-05-26 Beijing Sevenstar Electronics Co., Ltd. Device for holding disk-shaped articles and method thereof
CN103418563B (zh) * 2012-05-22 2016-12-14 盛美半导体设备(上海)有限公司 晶片边缘清洗装置
JP6140439B2 (ja) * 2012-12-27 2017-05-31 株式会社荏原製作所 研磨装置、及び研磨方法
WO2014129167A1 (ja) * 2013-02-21 2014-08-28 凸版印刷株式会社 塗布膜除去装置
TWI597770B (zh) 2013-09-27 2017-09-01 斯克林集團公司 基板處理裝置及基板處理方法
US10825705B2 (en) * 2015-05-15 2020-11-03 Suss Microtec Lithography Gmbh Apparatus, system, and method for handling aligned wafer pairs
US10249521B2 (en) * 2016-03-17 2019-04-02 Lam Research Ag Wet-dry integrated wafer processing system
CN107690358B (zh) * 2016-09-30 2020-08-28 深圳市柔宇科技有限公司 柔性触控面板清洗设备
DE102017212887A1 (de) 2017-07-26 2019-01-31 Gebr. Schmid Gmbh Verfahren, Vorrichtung und Anlage zur Leiterplattenherstellung

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE59407361D1 (de) * 1993-02-08 1999-01-14 Sez Semiconduct Equip Zubehoer Träger für scheibenförmige Gegenstände
AT640U1 (de) * 1993-10-22 1996-02-26 Sez Semiconduct Equip Zubehoer Greifer für halbleiterwafer und andere scheibenförmige gegenstände
JP4127866B2 (ja) * 1996-05-21 2008-07-30 東京応化工業株式会社 基板端縁部被膜の除去方法
US6015467A (en) * 1996-03-08 2000-01-18 Tokyo Ohka Kogyo Co., Ltd. Method of removing coating from edge of substrate
ATE211855T1 (de) * 1999-04-28 2002-01-15 Sez Semiconduct Equip Zubehoer Vorrichtung und verfahren zur flüssigkeitsbehandlung von scheibenförmigen gegenständen
US6186873B1 (en) * 2000-04-14 2001-02-13 International Business Machines Corporation Wafer edge cleaning
US7000622B2 (en) * 2002-09-30 2006-02-21 Lam Research Corporation Methods and systems for processing a bevel edge of a substrate using a dynamic liquid meniscus
JP3944368B2 (ja) 2001-09-05 2007-07-11 株式会社荏原製作所 基板処理装置及び基板処理方法
JP3954881B2 (ja) * 2002-03-27 2007-08-08 大日本スクリーン製造株式会社 基板処理装置およびそれを備えたメッキ装置
US20070062647A1 (en) * 2005-09-19 2007-03-22 Bailey Joel B Method and apparatus for isolative substrate edge area processing
KR100481277B1 (ko) * 2002-05-10 2005-04-07 한국디엔에스 주식회사 반도체 제조 장치 및 방법
JP3985250B2 (ja) * 2002-09-13 2007-10-03 和夫 田▲邉▼ ウエーハエッジのエッチング処理装置
JP4095478B2 (ja) * 2003-03-27 2008-06-04 芝浦メカトロニクス株式会社 基板のエッチング装置及びエッチング方法
JP2004214695A (ja) * 2004-03-22 2004-07-29 Dainippon Screen Mfg Co Ltd 基板処理装置および基板処理方法
JP2006060161A (ja) * 2004-08-24 2006-03-02 Dainippon Screen Mfg Co Ltd 基板処理装置
JP2006120666A (ja) * 2004-10-19 2006-05-11 Dainippon Screen Mfg Co Ltd 基板処理装置
JP4601452B2 (ja) * 2005-02-22 2010-12-22 大日本スクリーン製造株式会社 基板処理装置
JP4594767B2 (ja) 2005-03-09 2010-12-08 積水化学工業株式会社 基材外周処理装置
KR20080005974A (ko) * 2005-04-25 2008-01-15 어플라이드 머티어리얼스, 인코포레이티드 기판의 에지를 세정하기 위한 방법 및 장치
JP2008198667A (ja) * 2007-02-08 2008-08-28 Nec Electronics Corp 半導体製造装置及び半導体装置の製造方法

Also Published As

Publication number Publication date
KR101505700B1 (ko) 2015-03-24
EP2215651A1 (en) 2010-08-11
WO2009065757A1 (en) 2009-05-28
US20100288312A1 (en) 2010-11-18
JP5336506B2 (ja) 2013-11-06
CN102084458A (zh) 2011-06-01
JP2011504653A (ja) 2011-02-10
KR20100106339A (ko) 2010-10-01
TW200933794A (en) 2009-08-01
US8801865B2 (en) 2014-08-12
CN102084458B (zh) 2014-07-09

Similar Documents

Publication Publication Date Title
TWI433251B (zh) 用於濕處理晶圓狀物件之周邊區域的裝置及方法
US8657963B2 (en) In-situ backside cleaning of semiconductor substrate
JP4976949B2 (ja) 基板処理装置
JP5726686B2 (ja) 液処理装置、及び液処理装置の制御方法
CN101383271A (zh) 基片处理装置、基片处理方法和基片固定装置
US20040216841A1 (en) Substrate processing apparatus
KR101206923B1 (ko) 매엽식 웨이퍼 세정 장치
EP1696475A1 (en) Substrate treatment device and substrate treatment method
CN106816399A (zh) 基板处理装置及方法
KR20150122008A (ko) 기판 처리 장치
US20080053488A1 (en) Substrate treatment apparatus and substrate treatment method
JP2004172573A (ja) 基板処理装置及び基板処理方法
KR20150121473A (ko) 분사부 및 이를 구비하는 기판 세정장치
CN101808754B (zh) 防止过早干燥的装置、系统和方法
JP2004235216A (ja) 基板処理装置及び方法
KR101499920B1 (ko) 분사부 및 이를 구비하는 기판 세정장치
CN113617721A (zh) 基板清洁装置
JP4347765B2 (ja) 基板処理装置
TWI895902B (zh) 基板處理方法及基板處理裝置
TWI845569B (zh) 半導體基板的處理方法及設備
JP2001267277A (ja) ウェハの洗浄装置及び洗浄方法
KR20160136020A (ko) 기판 세정장치 및 기판 세정방법
KR20070044083A (ko) 웨이퍼 세정 장치
KR20120077515A (ko) 기판 처리 장치
KR20070010820A (ko) 웨이퍼 세정 장치

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees