TWI410647B - 電子放出特性之解析系統及解析方法 - Google Patents

電子放出特性之解析系統及解析方法 Download PDF

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Publication number
TWI410647B
TWI410647B TW098100642A TW98100642A TWI410647B TW I410647 B TWI410647 B TW I410647B TW 098100642 A TW098100642 A TW 098100642A TW 98100642 A TW98100642 A TW 98100642A TW I410647 B TWI410647 B TW I410647B
Authority
TW
Taiwan
Prior art keywords
electron emission
electron
energy
ignition
constant
Prior art date
Application number
TW098100642A
Other languages
English (en)
Chinese (zh)
Other versions
TW200946932A (en
Inventor
Shirun Ho
Keizo Suzuki
Norihiro Uemura
Shunichiro Nobuki
Tatsuya Miyake
Shunsuke Mori
Yoshiro Mikami
Kazutaka Tsuji
Masatoshi Shiiki
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of TW200946932A publication Critical patent/TW200946932A/zh
Application granted granted Critical
Publication of TWI410647B publication Critical patent/TWI410647B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16528—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values using digital techniques or performing arithmetic operations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/28—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using luminous gas-discharge panels, e.g. plasma panels
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J17/00—Gas-filled discharge tubes with solid cathode
    • H01J17/38—Cold-cathode tubes
    • H01J17/48—Cold-cathode tubes with more than one cathode or anode, e.g. sequence-discharge tube, counting tube, dekatron
    • H01J17/49—Display panels, e.g. with crossed electrodes, e.g. making use of direct current

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Environmental & Geological Engineering (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Theoretical Computer Science (AREA)
  • Gas-Filled Discharge Tubes (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Common Detailed Techniques For Electron Tubes Or Discharge Tubes (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
TW098100642A 2008-03-28 2009-01-09 電子放出特性之解析系統及解析方法 TWI410647B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008085871A JP5301861B2 (ja) 2008-03-28 2008-03-28 電子放出特性の解析システム及び解析方法

Publications (2)

Publication Number Publication Date
TW200946932A TW200946932A (en) 2009-11-16
TWI410647B true TWI410647B (zh) 2013-10-01

Family

ID=41252359

Family Applications (1)

Application Number Title Priority Date Filing Date
TW098100642A TWI410647B (zh) 2008-03-28 2009-01-09 電子放出特性之解析系統及解析方法

Country Status (3)

Country Link
JP (1) JP5301861B2 (ja)
KR (1) KR101070578B1 (ja)
TW (1) TWI410647B (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107589361B (zh) * 2017-09-06 2020-10-02 中国工程物理研究院电子工程研究所 一种半导体器件的氧化层中陷阱能级分布的测量方法
JP2021131254A (ja) * 2020-02-18 2021-09-09 アズビル株式会社 光検出システム、放電確率算出方法および受光量測定方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW432352B (en) * 1997-10-31 2001-05-01 Kopin Corp Color microdisplay with thin gap liquid crystal
TW462043B (en) * 1995-01-25 2001-11-01 Discovision Ass Laser driver for controlling electrical current directed to laser in optical disc system
TW527575B (en) * 1998-06-18 2003-04-11 Fujitsu Ltd Method for driving plasma display panel
TWI272784B (en) * 2002-04-22 2007-02-01 Nat Inst Of Advanced Ind Scien High-speed signal transmission system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4153983B2 (ja) * 2000-07-17 2008-09-24 パイオニア株式会社 保護膜、その成膜方法、プラズマディスプレイパネル及びその製造方法
JP4344197B2 (ja) * 2003-08-26 2009-10-14 パナソニック株式会社 絶縁膜測定装置、絶縁膜測定方法及び絶縁膜評価装置
JP4760317B2 (ja) * 2005-11-10 2011-08-31 パナソニック株式会社 プラズマディスプレイパネルの検査方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW462043B (en) * 1995-01-25 2001-11-01 Discovision Ass Laser driver for controlling electrical current directed to laser in optical disc system
TW432352B (en) * 1997-10-31 2001-05-01 Kopin Corp Color microdisplay with thin gap liquid crystal
TW527575B (en) * 1998-06-18 2003-04-11 Fujitsu Ltd Method for driving plasma display panel
TWI272784B (en) * 2002-04-22 2007-02-01 Nat Inst Of Advanced Ind Scien High-speed signal transmission system

Also Published As

Publication number Publication date
JP5301861B2 (ja) 2013-09-25
KR101070578B1 (ko) 2011-10-05
TW200946932A (en) 2009-11-16
KR20090103704A (ko) 2009-10-01
JP2009238680A (ja) 2009-10-15

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