TWI383163B - - Google Patents

Info

Publication number
TWI383163B
TWI383163B TW097128552A TW97128552A TWI383163B TW I383163 B TWI383163 B TW I383163B TW 097128552 A TW097128552 A TW 097128552A TW 97128552 A TW97128552 A TW 97128552A TW I383163 B TWI383163 B TW I383163B
Authority
TW
Taiwan
Application number
TW097128552A
Other languages
Chinese (zh)
Other versions
TW200905221A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of TW200905221A publication Critical patent/TW200905221A/zh
Application granted granted Critical
Publication of TWI383163B publication Critical patent/TWI383163B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW097128552A 2007-07-31 2008-07-29 Inspection jig and inspection apparatus TW200905221A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007198751A JP2009036532A (ja) 2007-07-31 2007-07-31 検査冶具および検査装置

Publications (2)

Publication Number Publication Date
TW200905221A TW200905221A (en) 2009-02-01
TWI383163B true TWI383163B (cg-RX-API-DMAC10.html) 2013-01-21

Family

ID=40331497

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097128552A TW200905221A (en) 2007-07-31 2008-07-29 Inspection jig and inspection apparatus

Country Status (4)

Country Link
JP (1) JP2009036532A (cg-RX-API-DMAC10.html)
KR (1) KR101011360B1 (cg-RX-API-DMAC10.html)
CN (1) CN101358997A (cg-RX-API-DMAC10.html)
TW (1) TW200905221A (cg-RX-API-DMAC10.html)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6255914B2 (ja) * 2013-11-07 2018-01-10 日本電産リード株式会社 検査治具
KR101565344B1 (ko) 2013-12-13 2015-11-03 현대자동차주식회사 차량 연동 단말기 조명 제어 시스템 및 제어 방법
JP6237441B2 (ja) * 2014-04-24 2017-11-29 日本電産リード株式会社 電極構造体、検査治具、及び電極構造体の製造方法
CN106324481B (zh) * 2016-08-23 2018-11-27 管仙福 一种用于集成电路的定位检测装置
IT201700021400A1 (it) * 2017-02-24 2018-08-24 Technoprobe Spa Testa di misura a sonde verticali con migliorate proprietà in frequenza
CN106932615B (zh) * 2017-04-28 2024-02-13 尼得科精密检测设备(浙江)有限公司 检查夹具及具备该检查夹具的检查装置
CN112424615B (zh) * 2018-07-13 2025-02-07 日本电产理德股份有限公司 检查治具以及检查装置
WO2020017159A1 (ja) * 2018-07-18 2020-01-23 日本電産リード株式会社 プローブ、検査治具、検査装置、及びプローブの製造方法
CN113433360B (zh) * 2020-03-23 2023-12-01 奥特斯(中国)有限公司 测试适配器、测试设备和测试部件承载件的方法
KR102324248B1 (ko) * 2020-06-19 2021-11-12 리노정밀(주) 검사 장치용 블록 조립체
CN113639979B (zh) * 2021-07-26 2022-04-26 苏州佳祺仕信息科技有限公司 一种检测治具及用于检测带孔工件性能的检测装置
JP7886104B2 (ja) * 2022-12-13 2026-07-07 東京エレクトロン株式会社 接続組立体、および検査装置
KR102649845B1 (ko) * 2023-11-29 2024-03-21 주식회사 나노시스 반도체 소자 테스터 지그

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040226744A1 (en) * 2003-05-16 2004-11-18 Matsushita Electric Industrial Co., Ltd. Module with built-in circuit component and method for producing the same
TW200532204A (en) * 2004-03-16 2005-10-01 Kimoto Gunsei Electric signal connecting device, and probe assembly and prober device using it
TW200638046A (en) * 2005-04-21 2006-11-01 Koyo Technos K K Inspection jig and inspection equipment
TW200722759A (en) * 2005-12-12 2007-06-16 Ohnishi Electronics Co Ltd Inspection fixture for printed wiring board

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0729838U (ja) * 1993-11-08 1995-06-02 日本電子材料株式会社 座屈応力減少機構付垂直動作式プローブカード
JP3575501B2 (ja) * 1995-05-15 2004-10-13 株式会社日本マイクロニクス プローブ装置
JPH09274054A (ja) * 1996-04-08 1997-10-21 Furukawa Electric Co Ltd:The プローバー
JP3505495B2 (ja) 2000-09-13 2004-03-08 日本電産リード株式会社 基板検査用検査治具、該検査治具を備えた基板検査装置および基板検査用検査治具の組立方法
JP2005338065A (ja) * 2004-04-26 2005-12-08 Koyo Technos:Kk 検査冶具および検査装置
JP3849948B1 (ja) * 2005-11-16 2006-11-22 日本電産リード株式会社 基板検査用治具及び検査用プローブ

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040226744A1 (en) * 2003-05-16 2004-11-18 Matsushita Electric Industrial Co., Ltd. Module with built-in circuit component and method for producing the same
TW200532204A (en) * 2004-03-16 2005-10-01 Kimoto Gunsei Electric signal connecting device, and probe assembly and prober device using it
TW200638046A (en) * 2005-04-21 2006-11-01 Koyo Technos K K Inspection jig and inspection equipment
TW200722759A (en) * 2005-12-12 2007-06-16 Ohnishi Electronics Co Ltd Inspection fixture for printed wiring board

Also Published As

Publication number Publication date
JP2009036532A (ja) 2009-02-19
TW200905221A (en) 2009-02-01
KR20090013139A (ko) 2009-02-04
KR101011360B1 (ko) 2011-01-28
CN101358997A (zh) 2009-02-04

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees