TWI375038B - - Google Patents

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Publication number
TWI375038B
TWI375038B TW97118427A TW97118427A TWI375038B TW I375038 B TWI375038 B TW I375038B TW 97118427 A TW97118427 A TW 97118427A TW 97118427 A TW97118427 A TW 97118427A TW I375038 B TWI375038 B TW I375038B
Authority
TW
Taiwan
Prior art keywords
circuit board
unit
fixed
window
lens group
Prior art date
Application number
TW97118427A
Other languages
English (en)
Chinese (zh)
Other versions
TW200949256A (en
Inventor
Evan Huang
Darren Cheng
Spin Hua
Randy Ye
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW97118427A priority Critical patent/TW200949256A/zh
Publication of TW200949256A publication Critical patent/TW200949256A/zh
Application granted granted Critical
Publication of TWI375038B publication Critical patent/TWI375038B/zh

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
TW97118427A 2008-05-19 2008-05-19 Probe card for testing image sensing chips TW200949256A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW97118427A TW200949256A (en) 2008-05-19 2008-05-19 Probe card for testing image sensing chips

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW97118427A TW200949256A (en) 2008-05-19 2008-05-19 Probe card for testing image sensing chips

Publications (2)

Publication Number Publication Date
TW200949256A TW200949256A (en) 2009-12-01
TWI375038B true TWI375038B (enExample) 2012-10-21

Family

ID=44870875

Family Applications (1)

Application Number Title Priority Date Filing Date
TW97118427A TW200949256A (en) 2008-05-19 2008-05-19 Probe card for testing image sensing chips

Country Status (1)

Country Link
TW (1) TW200949256A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI506279B (zh) * 2013-01-15 2015-11-01 Mjc Probe Inc 高頻探針卡
US9201098B2 (en) 2012-07-13 2015-12-01 Mpi Corporation High frequency probe card
US9244018B2 (en) 2012-07-13 2016-01-26 Mpi Corporation Probe holding structure and optical inspection device equipped with the same

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103543372B (zh) * 2012-07-13 2016-08-24 旺矽科技股份有限公司 光学检测装置
TWI481874B (zh) * 2012-07-13 2015-04-21 Mjc Probe Inc 光學檢測裝置
CN111722093A (zh) * 2019-03-18 2020-09-29 中华精测科技股份有限公司 探针卡测试装置
TWI702404B (zh) * 2019-03-18 2020-08-21 中華精測科技股份有限公司 探針卡測試裝置
TWI730510B (zh) * 2019-11-26 2021-06-11 松翰股份有限公司 全區域影像測試方法與架構

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9201098B2 (en) 2012-07-13 2015-12-01 Mpi Corporation High frequency probe card
US9244018B2 (en) 2012-07-13 2016-01-26 Mpi Corporation Probe holding structure and optical inspection device equipped with the same
TWI506279B (zh) * 2013-01-15 2015-11-01 Mjc Probe Inc 高頻探針卡

Also Published As

Publication number Publication date
TW200949256A (en) 2009-12-01

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