TWI370456B - Memory diagnosing device - Google Patents
Memory diagnosing deviceInfo
- Publication number
- TWI370456B TWI370456B TW095136911A TW95136911A TWI370456B TW I370456 B TWI370456 B TW I370456B TW 095136911 A TW095136911 A TW 095136911A TW 95136911 A TW95136911 A TW 95136911A TW I370456 B TWI370456 B TW I370456B
- Authority
- TW
- Taiwan
- Prior art keywords
- diagnosing device
- memory diagnosing
- memory
- diagnosing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/025—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in signal lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56008—Error analysis, representation of errors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/1202—Word line control
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005329309 | 2005-11-14 | ||
| PCT/JP2006/318568 WO2007055068A1 (ja) | 2005-11-14 | 2006-09-20 | メモリ診断装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200725632A TW200725632A (en) | 2007-07-01 |
| TWI370456B true TWI370456B (en) | 2012-08-11 |
Family
ID=38023075
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW095136911A TWI370456B (en) | 2005-11-14 | 2006-10-04 | Memory diagnosing device |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7966531B2 (zh) |
| JP (1) | JP4312818B2 (zh) |
| KR (1) | KR100946853B1 (zh) |
| CN (1) | CN101310343B (zh) |
| DE (1) | DE112006002842B4 (zh) |
| TW (1) | TWI370456B (zh) |
| WO (1) | WO2007055068A1 (zh) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102010002309B4 (de) * | 2010-02-24 | 2013-04-18 | Endress + Hauser Gmbh + Co. Kg | Verfahren zur Überprüfung der Funktionsfähigkeit eines Speicherelements |
| JP2012027544A (ja) | 2010-07-20 | 2012-02-09 | Toshiba Corp | ライトバックキャッシュを備える情報処理装置、及びその主メモリ診断方法 |
| US8516315B2 (en) * | 2010-09-03 | 2013-08-20 | Stmicroelectronics International N.V. | Testing of non stuck-at faults in memory |
| TWI467593B (zh) * | 2010-09-06 | 2015-01-01 | Fugu Tech Entpr Co Ltd | 用於一非揮發性記憶體陣列之標記方法及初始化方法 |
| JP5409936B2 (ja) * | 2011-02-18 | 2014-02-05 | 三菱電機株式会社 | メモリ診断装置及びメモリ診断方法及びプログラム |
| CN103295645B (zh) * | 2012-02-23 | 2016-03-09 | 安凯(广州)微电子技术有限公司 | 一种动态存储器的扫描检测方法及系统 |
| JP5986474B2 (ja) * | 2012-09-28 | 2016-09-06 | 株式会社東芝 | メモリ故障診断装置、メモリ故障診断方法 |
| CN103455436B (zh) * | 2013-09-23 | 2016-09-14 | 北京经纬恒润科技有限公司 | 一种ram检测方法及系统 |
| CN103824600B (zh) * | 2014-03-05 | 2017-01-04 | 上海华虹宏力半导体制造有限公司 | 存储器测试方法及装置 |
| CN105575437A (zh) * | 2014-10-10 | 2016-05-11 | 上海华虹集成电路有限责任公司 | 智能卡eeprom的测试方法 |
| WO2016143077A1 (ja) * | 2015-03-10 | 2016-09-15 | 三菱電機株式会社 | メモリ診断装置及びメモリ診断プログラム |
| JP6407127B2 (ja) * | 2015-11-05 | 2018-10-17 | 日立オートモティブシステムズ株式会社 | 電子制御装置及び電子制御方法 |
| CN105630644B (zh) * | 2015-12-18 | 2019-05-21 | 无锡飞翎电子有限公司 | 洗衣机中微控制单元的内存检测方法及系统 |
| CN105788646B (zh) * | 2016-03-29 | 2019-05-03 | 杭州和利时自动化有限公司 | 一种ram检测方法及系统 |
| US10510431B2 (en) | 2017-09-22 | 2019-12-17 | Qualcomm Incorporated | Detecting random telegraph noise defects in memory |
| CN110970085B (zh) * | 2018-09-30 | 2021-08-13 | 长鑫存储技术有限公司 | Dram良率分析系统 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61222100A (ja) * | 1985-03-26 | 1986-10-02 | Sharp Corp | 半導体メモリの試験方法 |
| JPS62122000A (ja) * | 1985-11-21 | 1987-06-03 | Nec Corp | 記憶素子 |
| JP2602204B2 (ja) * | 1985-11-29 | 1997-04-23 | 株式会社日立製作所 | 半導体メモリ装置 |
| JP2520234B2 (ja) * | 1986-05-10 | 1996-07-31 | 工業技術院長 | メモリ試験装置 |
| US4891811A (en) * | 1987-02-13 | 1990-01-02 | International Business Machines Corporation | Efficient address test for large memories |
| JPH03101000A (ja) * | 1989-09-13 | 1991-04-25 | Fujitsu Ltd | 記憶媒体の試験方法 |
| US5107501A (en) | 1990-04-02 | 1992-04-21 | At&T Bell Laboratories | Built-in self-test technique for content-addressable memories |
| AU660011B2 (en) * | 1991-04-26 | 1995-06-08 | Nec Corporation | Method and system for fault coverage testing memory |
| JPH05342113A (ja) | 1992-06-05 | 1993-12-24 | Japan Aviation Electron Ind Ltd | 組み込み型システムのｒａｍの故障検出方法 |
| JPH0773665A (ja) | 1993-06-16 | 1995-03-17 | Nec Corp | 半導体メモリ装置の試験方法 |
| US5396619A (en) | 1993-07-26 | 1995-03-07 | International Business Machines Corporation | System and method for testing and remapping base memory for memory diagnostics |
| US6496950B1 (en) * | 1999-08-11 | 2002-12-17 | Lsi Logic Corporation | Testing content addressable static memories |
| DE60042518D1 (de) | 1999-09-15 | 2009-08-20 | Nxp Bv | Verfahren zur speicherprüfung |
| WO2002021234A2 (en) * | 2000-09-06 | 2002-03-14 | Infineon Technologies Ag | Bist for parallel testing of on-chip memory |
| JP3570388B2 (ja) | 2001-04-17 | 2004-09-29 | 日本電気株式会社 | メモリ診断装置及び診断方法 |
| DE10135966B4 (de) * | 2001-07-24 | 2015-06-03 | Qimonda Ag | Verfahren und Vorrichtung zum On-Chip-Testen von Speicherzellen einer integrierten Speicherschaltung |
| JP2003141897A (ja) | 2001-10-31 | 2003-05-16 | Matsushita Electric Ind Co Ltd | メモリの検査装置および方法およびプログラム記憶媒体およびプログラム |
| JP2003281899A (ja) * | 2002-03-22 | 2003-10-03 | Sony Corp | 半導体記憶装置とその試験方法 |
| JP3838932B2 (ja) | 2002-03-28 | 2006-10-25 | Ｎｅｃエレクトロニクス株式会社 | メモリ装置及びメモリ装置の試験方法 |
| JP4179827B2 (ja) | 2002-08-30 | 2008-11-12 | Ｎｅｃエレクトロニクス株式会社 | メモリのテスト回路 |
| CN1523367A (zh) | 2003-02-17 | 2004-08-25 | 上海华园微电子技术有限公司 | 一种测试电可擦除电可编程存储器的性能及其故障的方法 |
| JP2005050393A (ja) * | 2003-07-29 | 2005-02-24 | Toshiba Lsi System Support Kk | 半導体装置およびその故障検出方法 |
| CN100428364C (zh) | 2004-04-07 | 2008-10-22 | 华为技术有限公司 | 存储器地址线测试方法 |
-
2006
- 2006-09-20 WO PCT/JP2006/318568 patent/WO2007055068A1/ja active Application Filing
- 2006-09-20 CN CN200680042518.5A patent/CN101310343B/zh active Active
- 2006-09-20 JP JP2007544073A patent/JP4312818B2/ja active Active
- 2006-09-20 KR KR1020087011725A patent/KR100946853B1/ko active IP Right Grant
- 2006-09-20 DE DE112006002842.1T patent/DE112006002842B4/de active Active
- 2006-09-20 US US12/093,562 patent/US7966531B2/en active Active
- 2006-10-04 TW TW095136911A patent/TWI370456B/zh active
Also Published As
| Publication number | Publication date |
|---|---|
| KR100946853B1 (ko) | 2010-03-09 |
| US20090089631A1 (en) | 2009-04-02 |
| CN101310343A (zh) | 2008-11-19 |
| TW200725632A (en) | 2007-07-01 |
| DE112006002842T5 (de) | 2008-12-11 |
| KR20080063407A (ko) | 2008-07-03 |
| DE112006002842B4 (de) | 2017-06-01 |
| JPWO2007055068A1 (ja) | 2009-04-30 |
| CN101310343B (zh) | 2014-04-30 |
| WO2007055068A1 (ja) | 2007-05-18 |
| JP4312818B2 (ja) | 2009-08-12 |
| US7966531B2 (en) | 2011-06-21 |
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