TWI348025B - - Google Patents
Info
- Publication number
- TWI348025B TWI348025B TW096149662A TW96149662A TWI348025B TW I348025 B TWI348025 B TW I348025B TW 096149662 A TW096149662 A TW 096149662A TW 96149662 A TW96149662 A TW 96149662A TW I348025 B TWI348025 B TW I348025B
- Authority
- TW
- Taiwan
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006356384 | 2006-12-28 | ||
PCT/JP2007/074211 WO2008081704A1 (ja) | 2006-12-28 | 2007-12-17 | プローブユニットの配線固定方法およびプローブユニット |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200827729A TW200827729A (en) | 2008-07-01 |
TWI348025B true TWI348025B (zh) | 2011-09-01 |
Family
ID=39588388
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096149662A TW200827729A (en) | 2006-12-28 | 2007-12-24 | Wiring fixing method of probe unit and probe unit |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4804542B2 (zh) |
TW (1) | TW200827729A (zh) |
WO (1) | WO2008081704A1 (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2010117058A1 (ja) * | 2009-04-09 | 2010-10-14 | 日本発條株式会社 | コンタクトプローブおよびプローブユニット |
TWI541515B (zh) * | 2014-06-27 | 2016-07-11 | 旺矽科技股份有限公司 | 探針卡的定位件與探針卡的探針頭 |
KR101819355B1 (ko) | 2016-08-03 | 2018-01-16 | 류동수 | 후 변위 텐션 부여 방식 와이어 프로브 지그 |
KR101819354B1 (ko) | 2016-08-03 | 2018-01-16 | 류동수 | 후 변위 텐션 부여 방식 프로브 지그 제조 방법 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3538036B2 (ja) * | 1998-09-10 | 2004-06-14 | イビデン株式会社 | チェッカーヘッドおよびその製造方法 |
JP2002055118A (ja) * | 2000-08-11 | 2002-02-20 | Citizen Watch Co Ltd | プローバー |
JP2002214285A (ja) * | 2001-01-16 | 2002-07-31 | Nagase & Co Ltd | ピッチ変換治具 |
JP2003130888A (ja) * | 2001-10-26 | 2003-05-08 | Internet Kk | 受けピンを不要としたコンタクトプローブ受け基板 |
JP3690796B2 (ja) * | 2002-01-31 | 2005-08-31 | 株式会社コーヨーテクノス | 検査冶具及びその製造方法並びに回路基板の製造方法 |
JP3848582B2 (ja) * | 2002-02-12 | 2006-11-22 | 株式会社日本マイクロニクス | 電気的接続装置 |
JP2004138385A (ja) * | 2002-10-15 | 2004-05-13 | Ibiden Engineering Kk | チェッカーヘッドおよびその製造方法 |
JP2006126180A (ja) * | 2004-09-30 | 2006-05-18 | Jsr Corp | 回路装置検査用電極装置およびその製造方法並びに回路装置の検査装置 |
JP3849948B1 (ja) * | 2005-11-16 | 2006-11-22 | 日本電産リード株式会社 | 基板検査用治具及び検査用プローブ |
-
2007
- 2007-12-17 WO PCT/JP2007/074211 patent/WO2008081704A1/ja active Application Filing
- 2007-12-17 JP JP2008552081A patent/JP4804542B2/ja active Active
- 2007-12-24 TW TW096149662A patent/TW200827729A/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP4804542B2 (ja) | 2011-11-02 |
WO2008081704A1 (ja) | 2008-07-10 |
TW200827729A (en) | 2008-07-01 |
JPWO2008081704A1 (ja) | 2010-04-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |