TWI346210B - - Google Patents

Info

Publication number
TWI346210B
TWI346210B TW095130794A TW95130794A TWI346210B TW I346210 B TWI346210 B TW I346210B TW 095130794 A TW095130794 A TW 095130794A TW 95130794 A TW95130794 A TW 95130794A TW I346210 B TWI346210 B TW I346210B
Authority
TW
Taiwan
Application number
TW095130794A
Other languages
Chinese (zh)
Other versions
TW200720682A (en
Inventor
Onishi Takeshi
Murano Hisashi
Kondo Masahito
Imaizumi Katsuhiro
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200720682A publication Critical patent/TW200720682A/zh
Application granted granted Critical
Publication of TWI346210B publication Critical patent/TWI346210B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW095130794A 2005-09-15 2006-08-22 Tcp handler TW200720682A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2005/017068 WO2007032077A1 (fr) 2005-09-15 2005-09-15 Dispositif de gestion de protocole tcp

Publications (2)

Publication Number Publication Date
TW200720682A TW200720682A (en) 2007-06-01
TWI346210B true TWI346210B (fr) 2011-08-01

Family

ID=37864683

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095130794A TW200720682A (en) 2005-09-15 2006-08-22 Tcp handler

Country Status (3)

Country Link
JP (1) JP4885139B2 (fr)
TW (1) TW200720682A (fr)
WO (1) WO2007032077A1 (fr)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3173676B2 (ja) * 1992-03-23 2001-06-04 東京エレクトロン株式会社 プローブ装置
JPH10206491A (ja) * 1996-09-30 1998-08-07 Ando Electric Co Ltd プローブ接触痕の確認方式
JPH11344538A (ja) * 1998-05-29 1999-12-14 Hioki Ee Corp 回路基板検査装置
JP2001033520A (ja) * 1999-07-26 2001-02-09 Advantest Corp Ｉｃハンドラ装置のｉｃコンタクト部
JP2002181889A (ja) * 2000-12-13 2002-06-26 Ando Electric Co Ltd プローブカードとｔａｂの位置決め装置

Also Published As

Publication number Publication date
WO2007032077A1 (fr) 2007-03-22
TW200720682A (en) 2007-06-01
JP4885139B2 (ja) 2012-02-29
JPWO2007032077A1 (ja) 2009-03-19

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees