TW200720682A - Tcp handler - Google Patents

Tcp handler

Info

Publication number
TW200720682A
TW200720682A TW095130794A TW95130794A TW200720682A TW 200720682 A TW200720682 A TW 200720682A TW 095130794 A TW095130794 A TW 095130794A TW 95130794 A TW95130794 A TW 95130794A TW 200720682 A TW200720682 A TW 200720682A
Authority
TW
Taiwan
Prior art keywords
display
tcp
tcp handler
handler
enlarged image
Prior art date
Application number
TW095130794A
Other languages
Chinese (zh)
Other versions
TWI346210B (en
Inventor
Takeshi Onishi
Hisashi Murano
Masahito Kondo
Katsuhiro Imaizumi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200720682A publication Critical patent/TW200720682A/en
Application granted granted Critical
Publication of TWI346210B publication Critical patent/TWI346210B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

In a TCP handler (2), a means that can display an enlarged image of part of a captured image is used as a display (9) for displaying the image taken by a second camera (6b). With the TCP handler (2), the positional relationship between a test pad (P) of a TCP and a probe (81) of a probe card (8) can be visually checked with the aid of an enlarged image displayed on the display (9). Hence, an easy, precise, and quick positioning is possible in performing alignment for initial setting or the like.
TW095130794A 2005-09-15 2006-08-22 Tcp handler TW200720682A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2005/017068 WO2007032077A1 (en) 2005-09-15 2005-09-15 Tcp handler

Publications (2)

Publication Number Publication Date
TW200720682A true TW200720682A (en) 2007-06-01
TWI346210B TWI346210B (en) 2011-08-01

Family

ID=37864683

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095130794A TW200720682A (en) 2005-09-15 2006-08-22 Tcp handler

Country Status (3)

Country Link
JP (1) JP4885139B2 (en)
TW (1) TW200720682A (en)
WO (1) WO2007032077A1 (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3173676B2 (en) * 1992-03-23 2001-06-04 東京エレクトロン株式会社 Probe device
JPH10206491A (en) * 1996-09-30 1998-08-07 Ando Electric Co Ltd Method for verifying probe contact trace
JPH11344538A (en) * 1998-05-29 1999-12-14 Hioki Ee Corp Circuit board inspection device
JP2001033520A (en) * 1999-07-26 2001-02-09 Advantest Corp Ic contact part of ic handler device
JP2002181889A (en) * 2000-12-13 2002-06-26 Ando Electric Co Ltd Device for positioning probe card and tab

Also Published As

Publication number Publication date
JPWO2007032077A1 (en) 2009-03-19
WO2007032077A1 (en) 2007-03-22
JP4885139B2 (en) 2012-02-29
TWI346210B (en) 2011-08-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees