TWI337168B - Testing and classifying machine for use in memory ics - Google Patents

Description

1337168 IX. Description of the Invention: [Technical Field of the Invention] The present invention provides a memory 丨C that can simultaneously transfer and test a plurality of memory ,C, greatly increasing the detection throughput, and effectively improving the carrying and sorting storage memory. Memory IC detection classifier (5). Bud Effect [Prior Art] In today's world, the semiconductor device is divided into logic type C, analog class I C and micro device I c, and the like, taking the logic J c as an example.

The central processing unit on the motherboard is responsible for the central processing unit and other peripherals; the signal is transferred, or transmitted, and the operation is *, the Wei is more complicated, and the IC is lying on the feeding data and installed in The module is mounted on the motherboard, and its functionality is relatively simple. However, no matter what is done, it must pass the inspection operation to eliminate the defective products and ensure the product quality. Because the 1 c with the central processor is directly installed on the motherboard, and the monthly bk is complex and diversified, the operator can make the logic I c can be tested in the actual environment to improve the accuracy of the inspection operation. The physical board (ie, the motherboard) actually assembled by the logic 1 C in the future is used as the test board, so that the logic Ic is in the physical board ΐίΐ detection operation. The detection operation based on the logic 1c is complicated and diverse, and the physical board is usually only provided with one The test suite is used to execute a single logic. The inspection operation is described in the first and second figures. It is an IC detection classification machine used for detecting logic I. It is included in the front end of the machine with feed 匣 ii, plural Receiver 及2 and the first transfer device 1 3 'The feed is £1 1 can be used to take the logic J c to be tested for reclaiming 'each receipt 2 can be placed to complete the logic of the test! c is used for receiving, and the first moving device 13 is used to transfer the cake/finish logic I c, and the rear end of the machine is provided with a plurality of testing devices 14 and a second moving device 丄 5, each The test device king 4 series is provided with a solid board 141 having a single test socket 142, and a crimping mechanism 1 4 3 using the following test 1 C, wherein the seat sleeve 1 4 2 can be placed into a single test The logic Ic17, and the second transfer device 丄5 is used to shift the logic of 5! c 'Alternatively - can be transferred to the machine 1 , the transfer device 16 is used to carry the "re-displacement of 1 c 1 7 and placed on the transfer device 丨6, from the logic of the dry, $ ^ 4 test At the rear end of the t, the second transfer device 5 will transfer the nn to the machine. The load 1 is taken out and transferred to the test device 14 and placed in the logic 31 i! machine case 14 2 to perform the test. The operation is carried out on the ΐ ΐΐ 3 3 3 置 置 ' ' ' ' 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由 由And the classification and collection, to the skill to detect and classify the operation. 疋 逻辑 Logic I C17 uniaxial inverse! ^ Memory 1 (three) in the system of pure (four) stored data, its functional reduction is equivalent to multiple memory 1 〇 Test, if the industry: ί rigidly tested memory 1 c, and via the turn 3 installed ί-;: is a large memory J c detector with multiple test devices, 2, and the waiting time will be more complicated When you look at the consumption, the social bribe is low in memory. ^Can't use this - IC detection classifier is not suitable for performing memory T k detection for staying 0. Therefore, in the fast test Under the demand of increasing capacity and increasing production capacity, how to design a memory IC detection classifier that can greatly improve the detection memory i C capacity and each device operation is the target of the design of the manufacturer. Providing a memory 〗 C detection sorting machine (5) 'containing a supply hopper and a plurality of receiving hoppers provided at the front end of the machine 匣 'test device provided at the rear end of the machine 4, first and second carrier devices, transfer The device and the first and second transfer devices provided between the receiving and the first and second carrying devices and the transfer device; the memory device 1 c for use in the standby/testing, the test device is provided - test circuit board of two test sockets, the first - transfer device is a bucket, and the memory 1 U first - carrier device, the first: carrying: 载 ϊ = = 2 2 carrier device After the memory ic is sent out, the memory of the measured device is taken out at 1 °, and the memory 1 c of the good product is transferred to the good material receipt e, and The body 1 C is transferred to the transfer device, and the first load reverse F can be set to = the memory is loaded. c, then the second material 5 = the memory 1C classification is placed in the receipt of each defective product; by 2, can = ί = ΐ; ΐ 体 1 c, and greatly increase the detection capacity, and ϊ Measure the memory 1 α, and then perform the classification operation, and too = set the waiting time, and effectively improve the performance of the carrier classification and collection. , used to ΐΐϊίί memory 1c classified and placed in each defective product receipt g, and can more effectively improve the performance of the classified storage memory J c. The L system is that the first carrier device can be preheated To be tested: preheating to be tested _! C and section; right purpose four' is located at the front end of the machine with a moving receipt s, 1 and the body IC's health and the results of the test, and The tray in the storage container is used for receiving materials; thereby, the utility model can effectively improve the use of the receiving material in the small-sized and different grades of the machine', so that the reviewing committee can further advance the present invention. It is understood that the preferred embodiment 1337168 embodiment and with the drawings, as detailed below: △, the memory 1 C detection classifier of the present invention is included in Machine E21, empty £2 2, multiple for receiving good goods = body 1 C receiving Μ 3 A, 2 3 b ' and a plurality of used to accommodate defective products = 3 C, 2 3 D, 2 3 E, Moving her, the back end of the test device 2 4, the first carrier device 2 5 air delivery device 2 7, and the first transfer device 2, 8 and the mobile device 2 2, 9 The second transfer device K between the delivery device 26, the receiving material 23B, and the third moving device 3 moving between the transfer device 27, the receiving material E2 3C, and the 3 3 [3 E, 2 3 F q; The supply of dragon ^ ί = two memory 1 C 'empty £ 2 2 system can receive the first by the supply of material ': the first transfer device 2 8 series with a plurality of tips "%1 Γ to The dragon is 21, so that the complex β-replica IC is transferred to the first carrier device 25. Test Quito: Jin showed that 'the test device 24 is equipped with a plurality of tests; ---, a number of pick-and-place devices 2 4 3 i crimping mechanism 2 4 3, used to take, put] j I The memory 1 C and the test socket 2 4 1 are indeed phased, and the first loading device 25 is a memory to be tested one by one in a cyclically alternate carrier mechanism! C, which is attached to the loading end of the machine and the test device - the lowering mechanism 2 5 1 and the second lifting mechanism 2 5 2 ' and is provided with the first and second translation mechanisms 2 5 3 2 5 4, the first and second shifting mechanisms 2 5 3, 2 5 4 respectively have the first and second slips 5 | 2 rq of the memory to be tested which can be moved between the receiving end and the testing device 8 24 ! 〆 (example ° such as 5 3 1 , 2 5 4 1, used to carry a plurality of 2 5 6 and make a sign of Z 8) - the second tray 2 5 5, a difference to be recorded ; 5 5, 2 5 6 can be used as the left and right bits of the memory to be tested in the direction of the "c" position = movement: and the direction of the front and back of the direction of the head - one, two trays 2 5 5, 2% fi Zuo 'Kasei has 4 reclaiming areas, and each IC, into the * first - translation machine two pre-, has not been, out of each memory to be tested memory I CU disk j - slip 11 2 5 3 1 The load-bearing test device can be placed. Since the convenient crimping mechanism 2 4 3 can be fixed at 1 ° 2 4 3 1 = '1 C, the first tray can be the fourth tray 2 5 5 ^Remove the misalignment movement of the memory IC to be tested, or the γ direction 1 right deviation, one memory error to be measured, so that one M' rear position difference is one memory memory IC 2 4 3 i position 4 3 Each pick-and-placer IC, at this time, the first "1" is taken out corresponding to the memory to be tested

-«2 5 lr:T for the first transfer unit 2 8 Place the record 1 c to be tested in the ί 言 ^ See the picture shown in Figure 5, when the part of the first tray 255 is to be taken The second lifting mechanism 2 5 2 system drives the first "downshift" and is placed on the second slider 2 5 4 i, since the middle still contains the memory IC to be tested, the first material The disk 2 5 5 can be used to hold the first memory to be tested 1 c, which is not yet taken out, and the second sliding device 2 5 4 is driven by the second slider 2 5 4 1 to drive the first-枓The disk 2 5 5 leaves the test device 2 4 'and is displaced to the first lifting mechanism 2 5 1 ' and the testing device 2 4 crimping mechanism 2 4 3 of the plurality of pick and place devices 2 4 3 1 will be tested The memory I c is placed in the corresponding test socket 2 41, and the memory 丨c to be tested and the contact 1337168 of the test socket 24 are pressed into contact with each other to perform a test operation.

1—Please refer to Figure 7 for each test socket of the test device 24, and after completion, the multiple pick-up devices of the crimping mechanism 2 4 3 will be tested. The memory Ic completed in the block 2 41 is taken out, and is raised and reset to be discharged. At this time, the first tray 2 5 5 can still maintain the preheating and the undetected condition 1 c; Referring to Figures 3 and 8, the second carrier device 26 is a second stage 261 having a displacement of X X for carrying the measured memory 丨c, and the crimping mechanism of the winding test device 24 2 4 3 After the completed memory Ic is taken out, the second carrier device 26 can drive the second stage 2 61 to be displaced to the lower side of the connecting device 2 4 3 of the testing device 2 for the crimping mechanism 2 4 3 Place the tested memory j ς ' and load the test device 24 for receiving; please refer to Figures 3 and 9, and the second stage 2 61 of the second carrier device 6 will be completed. Memory! After being carried out, the first shifter 2 5 3 of the first transfer device 2 5 3 carries the second tray 2 6 6 containing the memory to be tested 丨c to The test equipment 2 is located for reclaiming, and the first lifting mechanism 2 5 i drives the first tray 2 that is still filled with the measuring unit IC 5 5 5 is moved up to the second by the second translation mechanism 2 5 4 - Translation mechanism 2 5 3 for the first-feed device 28 to be placed in the supplementary suffix I c in order to alternately perform the feeding operation in sequence. Eugene ΐ refers to the first figure, the receiving Ε 2 3 A, 2 3 Β is used to store the memory IC of the special grade, and the transfer device 27 is provided with a plurality of displacements. The stage 2 71 ' is used to carry the defective product memory 丨 c, and the second = the device 29 is provided with a second pick-and-place 291 having a plurality of tips for moving the mountain~ After the second IC 2 of the second carrier device 26 carries the memory IC, the second transfer device 29 utilizes the second pick-and-place device, and the second carrier 2 61 is completed. The memory 1C is taken out and placed in the receiving 匣 2 3 A or the receiving 匣 2 3 B according to the test 00 § 己 体 c , , , , , , , , , , , , , 收 收 收 收 收 收 收 收 收 收 收 收 收 收On the stage 2 71 of the transfer device 27, the memory of the defective product is carried by the stage 27 to the collection ship 1337168 23C, 2 3D, 2 3E and the transfer type charge £23F. The _th transfer device 29 is required to immediately transfer the memory 丨c of the defective product to::, 23c, 23D, 23E__g2 == = the displacement stroke of the second transfer device 2 9 and the waiting of the related device Coffee, but J speed back to the second stage 2 61 transfer After he measured the memory r c.

Please refer to Figures 1 and 12, the receipts of £2 3 C, 2 3 D, 2 3 E and the moving receipt g2 3 F can be subdivided into different grades for storage and measurement of the same level. The defective product memory jc, wherein the moving type receiving container 2 3 f is provided with a transfer device 2 3丄F which can be displaced in the Y direction, and can accommodate a plurality of different levels below the machine 2 The tray is a storage container 2 3 2F which can be displaced in two directions, and the third moving device 3 is provided with a third pick-and-placer 3 0 1 with a plurality of tips for transferring the tested memory I c, when the carrier 2 71 of the transfer device 27 sequentially transports the memory 丨c of the defective product to the receiving container 2 3 c2 3 D 2 2 3 E and the moving receiving device 2 3 F, the first The three-feed device 3 transfers the memory jc of the defective product to the respective receiving ports 2 3 c, 2 3 D, 2 3 E and the moving receiving container 2 3 F by the second pick-and-place device 3 01 When the third pick-and-place device 301 of the third transfer device 30 transfers the memory Ic of the defective product to the transportable receipt H 2 3 F, the storage container 2 3 2 F is differently stored. Grade

The tray' can further visualize the test result, so that the tray that receives the level memory IC is up-shifted to the top of the machine 2, and the tray is removed by the shifter 2 31F for the Y direction for the third pick and place. The device 3 01 puts the memory IC of the defective product into the tray, and completes the operation of sorting and collecting the memory IC. According to this, the present invention can simultaneously transfer and test a plurality of memory ICs, thereby greatly increasing the detection throughput and effectively improving the operational efficiency of the memory IC, which is a practical and progressive design. See the same products and publications open to allow for the invention of patent applications, and apply in accordance with the law. [Simple description of the diagram] The first circle: the configuration diagram of the class Ic detection classifier. 1337168 Fig. 2: Schematic diagram of the test device of the conventional IC detection classifier. Fig. 3 is a schematic view showing the configuration of the memory I C detection classifier of the present invention. Fig. 4 is a schematic view showing the use of the memory I C detection sorting machine of the present invention (1). Figure 5: Schematic diagram of the use of the memory I C detection sorter of the present invention (2). Figure 6: Schematic diagram of the use of the memory I C detection classifier of the present invention (3). Figure 7: Schematic diagram of the use of the memory I C detection classifier of the present invention (4). Figure 8: Schematic diagram of the use of the memory I C detection classifier of the present invention (5). Figure 9: Schematic diagram of the use of the memory I C detection classifier of the present invention (6).

Figure 10: Schematic diagram of the use of the memory I C detection classifier of the present invention (7). Fig. 1 is a schematic view showing the use of the memory I C detection sorting machine of the present invention (8). Fig. 12 is a schematic view showing the moving type receiving magazine of the present invention. [Main component symbol description] [Literature]

Feeding 匣: 11 First moving device: 13 Solid board: 141 Crimp mechanism: 14 3 Transfer device 16 [Invention] Machine: 2 0 Air: 2 2 Receipt: 2 3 A, 2 3 B , Transfer type receiving container: 2 3 F Storage container: 2 3 2 F Test device: 2 4 Test circuit board: 2 4 2 Pick and place device · 2 4 3 1 First carrier device: 2 5 Second lifting mechanism :252 Receipt: 12 Test set: 14 Test set: 14 2 Second transfer unit: 15 IC : 1 7 Feed: 21

23C, 23D, 23E

Transfer: 2 31F Test Seat: 2 41 Crimp Mechanism: 2 4 3 First Lifting Mechanism: 2 51 First Translation Mechanism: 2 5 3 12 1337168 First Slipper: 2 5 3 1 Second Slip Device: 2 5 4 1 Second tray: 2 5 6 Second carrier: 2 6 Transfer device: 2 7 First transfer device: 2 8 Second transfer device: 2 9 Third transfer device: 3 0 Second translation mechanism: 2 5 4 First tray: 2 5 5 Second stage: 2 61 Stage: 2 7 1 First pick-and-place: 2 81 Second pick-and-place: 2 91 Third pick and place : 3 01

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Claims (1)

1337168 X. Patent application scope: 1 · A memory 1 c detection classification machine (5), which includes: supply material: is set on the machine to hold the memory I c to be tested; Material: It is set on the machine's memory IC for bearing the test; the test device is set on the machine, and has a plurality of test sockets for testing the memory IC; The device is installed on the machine for carrying a plurality of memory ICs between the feeding device and the testing device; the transfer device is arranged on the machine table and is provided with a carrier for the carrier device. And receiving a plurality of completed memory Ic during the receiving time; the first moving device is disposed on the machine, and is provided with a first pick-and-place device for transferring a plurality of memory Ic to be tested at a time. The second feeding device is disposed on the machine table and is provided with a second pick-and-place device for transferring a plurality of tested memory Ic at a time between the carrying device and the transferring device The central processor is used to control and integrate the various devices to perform automated operations. 2. According to the memory IC detection classification machine (5) mentioned in the first paragraph of the patent application scope, wherein 'the receipt mechanism is subdivided into good receipts and defective receipts, which are used to determine the difference Level memory I c. 3. The memory I C detection sorting machine according to item 2 of the patent application scope (5) 'where' the second moving device can transfer a plurality of completed memory ICs to the transfer device and the receiving cassette. 4. According to the second aspect of the patent application scope, the memory Ic detection sorting machine (5) 'where the defective product receiving hopper is a moving receiving hopper, the moving receiving Ε is provided as a Υ A directional displacement transfer carrier, and a storage container that can accommodate a plurality of different grade trays and can be displaced in two directions. 1337168 5 · The memory 1c detection sorting machine according to item 2 of the patent range (5) ', 'The transfer device is a memory IC capable of transferring defective products between the defective product receiving cassette and the carrying device. 6 · The memory 1 C detection sorting machine according to the second item of the patent item (5) 22 includes a third moving device having a third pick-and-place device for loading the defective product. Memory 1C to defective product receipts. The memory 1 c detection sorting machine described in the first item of Patent 11 (5) The test suite of the test device is mounted on a test circuit board, which is connected to the test machine. 8. The memory 1c detection sorting machine according to the first item of the patent scope (5) • ill / 丄 The test device is provided with a crimping mechanism with a pick and place device for taking, "recalling the body 1 c in each The socket is pressed and the memory IC to be tested is in contact with the contact of the type 5 socket. 9. The memory 1 C detection classification machine according to the first item of the patent garden (5) The device carries a plurality of s 骽 骽 骽 C C C C C C C C 1 C C 。 C C C C C C C 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆 记忆The alternating mechanism is provided with a first lifting mechanism and a second lifting mechanism at the feeding end of the machine, and 1 1 and 2 translation mechanisms of different degrees of face. The memory 1 C according to the scope of the first item Inspection sorting machine: moving in the feeding position: flat drop = two can be lifted and driven to be placed. A village plate is displaced between the first and second translation mechanisms. Please ί:] the memory 1 C described in the range 1 The sorting machine disc is detected for misalignment movement in different directions for reclaiming, and the second disc 15 is preheated to hold the 5 mnemonic ic to be tested. The memory IC detection sorting machine (5) described in the first item of the scope includes an open space for collecting empty trays. 4 · A memory IC detection sorting machine (5), which includes: Feeding 匣: It is set on the machine to 'place the memory IC to be tested; Receive 匣: is set on the machine' to store the tested memory IC; Test device: is set in On the machine platform, there are a plurality of test sockets for testing the memory Ic; the first carrier device: is disposed on the machine table for carrying a plurality of samples to be tested between the feeding device and the testing device Memory IC; second carrier device: is set on the machine for carrying the test device to complete the memory IC; transfer device: is set on the machine, and is equipped with a stage for the second The carrier device and the receiving magazine carry a plurality of completed memory Ic; the first material moving device is disposed on the machine, and is provided with a first pick-and-place device for transferring a plurality of memories to be tested at a time. The body Ic is between the feeding device and the first carrying device; the first moving device is disposed on the machine table and is provided with a second pick-and-place device for one transfer A number of completed memory files are placed between the second carrier and the transfer device; ^ Fu processor: system (4) and integrated device touch to perform automation, for the use of good receipts And the receipt of defective products. According to the competition, the unique level memory IC is measured. (Wuguang & 7 item 15 1) The C detection classification machine 1 c is in the memory of the fresh-keeping 6 1 5 of the memory 1 c detection sorter iy ' ΐ defective product receipt 11 is the inspection type receiving, the transfer is provided with a shifter that can be used for direction shifting, and can be retracted. f, 4-stage trays and can be used as storage containers for Ζ displacement. The memory 1 C detection sorting machine described in the fifteenth item is a rough intermediate: in the middle, the transfer device can carry the memory I C of the defective product between the second carrying device and the defective product. (4) The memory 1 c detection sorting machine C) according to Item 15: further comprising a third moving device having a third pick-and-place to transfer the memory of the defective product on the transfer device] C to the defective product receipt E conversion, the memory described in item 4 of the patent scope! C detection sorting machine 5, wherein the test socket of the test device is mounted on the test circuit board', the test circuit board is connected to the test machine. Further, the memory IC detection sorting machine Q5) described in claim 14 is applied. wherein the test device is provided with a crimping mechanism with a pick-and-place device for taking, putting, and testing the memory IC. In each test socket, and pressing down the memory IC to be tested and the contact of the test socket. The memory IC detection sorting machine according to item 14 of the patent application scope (f) wherein the first carrier device transports a plurality of memory bodies Ic to be tested in a cyclically alternate mechanism. The memory HI C detection sorting machine (5) according to the second aspect of the patent application scope, wherein the cyclic alternating mechanism of the first carrier device is respectively provided at the feeding end and the testing device on the machine table A lifting mechanism and a second lifting mechanism are provided with first and second translation mechanisms at different heights. According to the memory IC detection sorting machine (5) of claim 23, wherein the first and second translation mechanisms of the first carrier device are respectively movable between the loading end and the testing device. The first and second sliders are configured to carry the first and second trays on which the IC of the memory to be tested is placed, and the first and the 1337168 two lifting mechanisms are respectively capable of lifting and holding the first IC of the memory to be tested. The first and second trays are displaced between the first and second translation mechanisms. 25. The memory IC detection sorting machine (5) according to claim 24, wherein the first and second sliders respectively carry the first and second trays for misalignment movement in different directions. For the material to be taken, the first and second trays can preheat the memory IC to be tested. 2 6 · The memory I C detection sorting machine (5) according to item 14 of the patent application scope, further includes an empty space for collecting empty trays. 18