TWI402517B - Test system and test method - Google Patents

Test system and test method Download PDF

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Publication number
TWI402517B
TWI402517B TW99105265A TW99105265A TWI402517B TW I402517 B TWI402517 B TW I402517B TW 99105265 A TW99105265 A TW 99105265A TW 99105265 A TW99105265 A TW 99105265A TW I402517 B TWI402517 B TW I402517B
Authority
TW
Taiwan
Prior art keywords
test
system
method
test method
test system
Prior art date
Application number
TW99105265A
Other versions
TW201129812A (en
Inventor
Chin Yang Lin
Original Assignee
Fugu Tech Entpr Co Ltd
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Filing date
Publication date
Application filed by Fugu Tech Entpr Co Ltd filed Critical Fugu Tech Entpr Co Ltd
Priority to TW99105265A priority Critical patent/TWI402517B/en
Publication of TW201129812A publication Critical patent/TW201129812A/en
Application granted granted Critical
Publication of TWI402517B publication Critical patent/TWI402517B/en

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TW99105265A 2010-02-24 2010-02-24 Test system and test method TWI402517B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW99105265A TWI402517B (en) 2010-02-24 2010-02-24 Test system and test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99105265A TWI402517B (en) 2010-02-24 2010-02-24 Test system and test method

Publications (2)

Publication Number Publication Date
TW201129812A TW201129812A (en) 2011-09-01
TWI402517B true TWI402517B (en) 2013-07-21

Family

ID=49225971

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99105265A TWI402517B (en) 2010-02-24 2010-02-24 Test system and test method

Country Status (1)

Country Link
TW (1) TWI402517B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012086653A1 (en) * 2010-12-22 2012-06-28 日本発條株式会社 Testing system and package retainer
TWI464428B (en) * 2012-11-13 2014-12-11 All Ring Tech Co Ltd

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006059553A1 (en) * 2004-11-30 2006-06-08 Advantest Corporation Electronic component handling device and defective component determination method
TWI264549B (en) * 2001-07-12 2006-10-21 Advantest Corp Pusher with heater, electronic component handling device, and method of controlling temperature of the electronic component
US7129726B2 (en) * 2005-03-31 2006-10-31 Fujitsu Limited Testing device and testing method of a semiconductor device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI264549B (en) * 2001-07-12 2006-10-21 Advantest Corp Pusher with heater, electronic component handling device, and method of controlling temperature of the electronic component
WO2006059553A1 (en) * 2004-11-30 2006-06-08 Advantest Corporation Electronic component handling device and defective component determination method
US7129726B2 (en) * 2005-03-31 2006-10-31 Fujitsu Limited Testing device and testing method of a semiconductor device

Also Published As

Publication number Publication date
TW201129812A (en) 2011-09-01

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