TWI331686B - - Google Patents

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TWI331686B
TWI331686B TW94113925A TW94113925A TWI331686B TW I331686 B TWI331686 B TW I331686B TW 94113925 A TW94113925 A TW 94113925A TW 94113925 A TW94113925 A TW 94113925A TW I331686 B TWI331686 B TW I331686B
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Taiwan
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substrate
transport
hand
processing
unit
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TW94113925A
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Chinese (zh)
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TW200604643A (en
Inventor
Yoshioka Hitoshi
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Dainippon Screen Mfg
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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Description

九、發明說明: 【發明所屬之技術領域】 本發明有關於一種對半導體基板或液晶玻璃基板等 的薄板狀基板(以下稱為基板”)進行預先確定的一連 串處理(如光阻塗佈處理、顯影處理等)的基板處理裝 爹。 【先前技術】 以往的基板處理裝置,眾所周知是經過複數處理單 元對基板進行光阻塗佈處理、曝光處理、顯影處理等的 頓先確足的一連串的處理。作為此類基板處理裝置例 如在專利文獻1中有所記載。此類基板處理裝置,如該 I利文獻1所示,作為上述處理單元之一,具有由運入 郄31、旋轉塗佈部32、水準測量處理部33、邊緣沖洗部 34、及傳送室(運出部)35構成的光阻塗佈單元^而從 運入部31到傳送室35,通過把基板按順序運送到鄰接的 處理部的滑動部5a-5d運送基板。 上述這樣的基板處理裝置的情況下,如圖11所示, 通過滑動部5d把基板G從邊緣沖洗部34運送到傳送室 35的機構,與邊緣沖洗部34鄰接而設置傳送室,通 過滑動部5d’在圖U中從由實線所示的位置到雙點劃線 戶斤Γ、的位置,將基板G從邊緣沖洗部3 4被運送到該傳送 室35,從傳送室35進一步利用傳送機構39把基板G運 达到預烘單元40。另外,通過相鄰的機器人42進入到預 烘單元40内的雙點劃線所示的位置,經由機器人[Technical Field] The present invention relates to a series of predetermined processes (such as photoresist coating treatment) for a thin plate-shaped substrate (hereinafter referred to as a substrate) such as a semiconductor substrate or a liquid crystal glass substrate. A substrate processing apparatus for development processing, etc. [Prior Art] A conventional substrate processing apparatus is known as a series of processes such as photoresist coating processing, exposure processing, and development processing on a substrate by a plurality of processing units. Such a substrate processing apparatus is described, for example, in Patent Document 1. Such a substrate processing apparatus, as shown in the document 1 described above, has one of the processing units, and has a transfer unit 31 and a spin coating unit. 32. The photoresist coating unit 33, the edge rinsing unit 34, and the transfer chamber (transporting unit) 35 are transported from the transport unit 31 to the transfer chamber 35 by sequentially transporting the substrates to the adjacent processing. The sliding portion 5a-5d of the portion transports the substrate. In the case of the above substrate processing apparatus, as shown in Fig. 11, the substrate G is separated from the edge by the sliding portion 5d. The mechanism for transporting the washing portion 34 to the transfer chamber 35 is disposed adjacent to the edge flushing portion 34 to provide a transfer chamber, and the position of the double-dotted line is shown in FIG. U from the position indicated by the solid line in FIG. The substrate G is transported from the edge flushing portion 34 to the transfer chamber 35, and the substrate G is further transported from the transfer chamber 35 to the pre-baking unit 40 by the transport mechanism 39. In addition, the adjacent robot 42 enters the pre-baking unit. The position shown by the double-dotted line in 40, via the robot

口 V 2014-7082-PF 5 1331686 , 手部’將被運送到預烘單元4 0的基板(j運送到預供單元 40上部的處理室。 專利文獻1:曰本專利申請特開平1卜274265號公報。 . 由上述結構構成的以往的基板處理裝置,由於在從 • 邊緣沖洗部3 4到傳送室3 5的基板運送中,必需要用傳 送機構39及滑動部5d ’這樣就增加了裝置的製造成本。 另外,由於傳送室35及傳送機構39的存在,加長了從 邊緣沖洗部34到預烘單元40的基板運送路徑,因而作 _ 為結果是加長了基板處理裝置的全長。 【發明内容】 本發明是為解決上述問題而完成的,其目的在於提 供一種基板處理裝置,可縮短基板處理裝置的整個長 度’並能降低裝置的製造成本。 本發明所述的基板處理裝置,具有層疊配置的複數 處理至,其中包括:運送室,其相對於上述複數處理室 而層疊配置,處理部,其鄰接於上述運送室而配置;第 • 1運送裝置’其具有裝載基板的手部和主體部,上述主 體部置在上述運送室内,使上述手部在與鄰接配置於 •上述運送室的處理部之間進退動作。 •在此結構中’設置在運送室内的第1運送裝置的主 體部’通過讓手部在運送室和與其鄰接配置的處理部之 間進退動作’從而進行該處理部與運送室之間的基板的 運送。由此’通過第1運送裝置的手部,可直接使基板 在運送至和與其鄰接的處理部之間移動。Port V 2014-7082-PF 5 1331686 , the hand 'will be transported to the substrate of the pre-baking unit 40 (j is transported to the processing chamber at the upper portion of the pre-supply unit 40. Patent Document 1: 曰本专利申请特开平1卜 274265 In the conventional substrate processing apparatus having the above-described configuration, the transport mechanism 39 and the sliding portion 5d' are required to be transported during the substrate transport from the edge flushing portion 34 to the transfer chamber 35. Further, since the transfer chamber 35 and the transport mechanism 39 exist, the substrate transport path from the edge rinse portion 34 to the pre-baking unit 40 is lengthened, and as a result, the total length of the substrate processing apparatus is lengthened. The present invention has been made to solve the above problems, and an object thereof is to provide a substrate processing apparatus capable of shortening the entire length of the substrate processing apparatus and reducing the manufacturing cost of the apparatus. The substrate processing apparatus according to the present invention has a stack. The plurality of disposed processes include: a transport chamber that is stacked and disposed with respect to the plurality of processing chambers, and a processing portion that is adjacent to the transport chamber The first transport device includes a hand for loading a substrate and a main body portion, and the main body portion is placed in the transport chamber to move the hand forward and backward between the processing portion disposed adjacent to the transport chamber. In this configuration, the main body portion of the first transport device installed in the transport chamber performs the advancement and retreat operation between the transport chamber and the processing portion disposed adjacent thereto, thereby performing the substrate between the processing portion and the transport chamber. By this, the substrate can be directly transported between the processing unit and the processing unit adjacent thereto by the hand of the first transport device.

2014-7082-PF 6 1331686 而且,本發明所·述的基板處理裝置,其中還包括第2 運送裝置’上述第2運送裝置在上述運送室與上述複數 處理室之間進行基板運送。 在此構成中,第2運送裝置,把由第丨運送裝置的 手部運送到運送室的基板運送到上述處理室, 理室運送到運送室内的手部。 — 而且,本發明所述的基板處理裝置,其中上述 運送裝置在與處在位於上述運送室内 ' 主叫的狀態的上述第】 運送裝置的手部之間進行基板的交接。 根據此構成,由於第2運送裝置在與處在 室内的狀態的…送裝置的手部之間進行基板的交 接,因此能夠直接而迅速地在第i運送裝置及第 裝置之間進行基板運送,而能對接古 ' 耵长阿基板處理的生產能 力做出貢獻。 fb 此外,本發明所述的基板處理裝置,盆中上述 運送裝置的主體部具有使上述手部旋轉的機構, 手部相對於與上述運送室鄰接配置的複數處理部進退動 作0 在此構成中,由於第1遂读& 乐i遲送裝置的主體部使手部 轉,通過使手部相對於鄰接運送室配置的複數處理 退動作’在與鄰接運送室配置的任—處理部之間都 行基板的運送’因而基板運送方向並不限定於—個方向。 另外,本發明所述的基板處理裴置,其中上 運送裝置設置有複數’各第1運送裝置所具有的各個主 2014-7082-PF 7 1331686 體部,使上述手部相對於鄰接配置的複數 各第1運送裝置被預先確定的處理部進退動作/中針對 根據此構成,由於複數第1運送穿 主體部,使上述手部相對於鄰接配置的、=有的各個 對各第i運送裝置被預先確定的處理部進退動:部中針 可以在與鄰接運送室而配置的複數處理部之間進行2 運送,而基板運送方向並不限定於一個方向。 丁土 此外,本發明所述的基板處理裝置,其中上 運送裝置的主體部具有:中間台,其使上述手部㈣於 上述鄰接配置的處理部進退動作;基部,其使上述中間 台沿著與通過該中間台而使上述手部進退的方向相同的 方向進退動作’這些手部、中間台以及基部是在上下方 向上層疊設置。 在此結構中,由於主體部是使手部、中間台及基部 沿上下方向層疊設置,通過由基部使中間台進退動=、 和由中間台使手部進退動作的兩方的動作,可使手部在 % 上述處理部和運送室之間進退動作。 另外’本發明所述的基板處理裝置’其中在上述第1 運送裝置的中間臺上設置有檢測出在上述手部上是否裝 ' 載有基板的基板檢出感測器》 在此構成中,由於在第1運送裝置的中間臺上設置 有檢測出在手部上是否裝載有基板的基板檢出感測器, 因此不需要從中間台到手部設置使基板檢出感測器工作 用的配線等。 2014-7082-PF 8 1331686 此外,本發明所述的基板處理裝置,其中在上述第i 運送裝置的手部,在其基板裝載面上設置有限制基板向 側面移動的複數突出部,基板被裝載在由這些複數突出 部形成的的範圍内。 ^在此構成中,通過在手部的基板裝栽面上設有複數 突起部,可限制基板向側方移動,使基板在穩定的狀態 下裝載在基板裝載面上進行運送。Further, the substrate processing apparatus according to the present invention further includes a second transport device. The second transport device transports the substrate between the transport chamber and the plurality of processing chambers. In this configuration, the second transport device transports the substrate transported by the hand of the second transport device to the transport chamber to the processing chamber, and the processing chamber is transported to the hand in the transport chamber. Further, in the substrate processing apparatus according to the present invention, the transport device performs the transfer of the substrate between the hand of the first transport device located in the state of the calling room in the transport room. According to this configuration, since the second transport device transfers the substrate between the hands of the transfer device in the indoor state, the substrate can be directly and quickly transported between the i-th transfer device and the first device. And can contribute to the production capacity of the ancient 'A long substrate treatment. Further, in the substrate processing apparatus according to the present invention, the main body portion of the transport device in the tub has a mechanism for rotating the hand, and the hand is moved forward and backward with respect to the plurality of processing portions disposed adjacent to the transport chamber. The main body of the first reading & e-delivery device rotates the hand, and the multi-processing retreat operation of the hand with respect to the adjacent transport chamber is performed between the processing unit disposed adjacent to the adjacent transport chamber The transport of the substrate is performed. Therefore, the substrate transport direction is not limited to one direction. Further, in the substrate processing apparatus according to the present invention, the upper transporting device is provided with a plurality of main 2014-7082-PF 7 1331686 body portions of each of the first transporting devices, and the plurality of hand portions are arranged adjacent to each other. According to this configuration, the first transporting device is configured to move forward and retracting, and the plurality of first transporting main body portions are placed so as to be adjacent to each other. The predetermined processing unit advances and retracts: the intermediate needle can be transported between the plurality of processing units disposed adjacent to the transport chamber, and the substrate transport direction is not limited to one direction. Further, in the substrate processing apparatus according to the present invention, the main body portion of the upper transport device includes a middle portion that moves the hand (4) forward and backward in the adjacent processing portion, and a base portion that causes the intermediate portion to follow The hand, the intermediate stage, and the base are stacked in the vertical direction in the same direction as the direction in which the hand advances and retreats through the intermediate stage. In this configuration, since the main body portion is formed by stacking the hand portion, the intermediate portion, and the base portion in the vertical direction, the operation of both the intermediate table by the base portion and the intermediate portion of the intermediate table can be moved forward and backward. The hand moves forward and backward between % of the processing unit and the transport chamber. Further, in the substrate processing apparatus according to the present invention, the intermediate stage of the first transport apparatus is provided with a substrate detecting sensor that detects whether or not the substrate is mounted on the hand. Since the substrate detecting sensor that detects whether or not the substrate is mounted on the hand is provided on the intermediate stage of the first transport device, it is not necessary to provide wiring for operating the substrate detecting sensor from the intermediate stage to the hand. Wait. In the substrate processing apparatus according to the present invention, the substrate of the i-th transport device is provided with a plurality of protruding portions for restricting the movement of the substrate to the side surface on the substrate loading surface, and the substrate is loaded. Within the range formed by these plural protrusions. In this configuration, by providing a plurality of protrusions on the substrate mounting surface of the hand, the substrate can be restricted from moving laterally, and the substrate can be loaded on the substrate loading surface in a stable state for transportation.

根據本發明,在運送室和鄰接運送室的處理部之 間’通過設置在運送室内的第1運送裝置的手部,可在 運送室和處理部相互之間直接移動基板,而在運送室和 處理室之間沒有必要另外單獨設置例如傳送室或傳送機 構等,所以,就由此而縮短了基板運送路徑,縮短了基 板處理裝置的全長’從而能夠降低裝置的製造成本。 根據本發明,通過第2運送裝置,可將運送室内的 基板運送到上述處理室,或者從處理室把基板運送到運 根據本發明’由於帛2運送裝置是在與處在位於 送室内的狀態的第1運送奘番 刃乐1連廷裝置的手部之間進行基板的交 接’因此能直接而迅速地進杆楚1 ;置、这# 進订第1運送裝置和第2運送 裝置之間的基板運送。 根據本發明,由於第1 轉,使手部相對於與運送室 動作,所以在與鄰接於運送 都能進行基板的運送,基板 運送裝置的主體部使手部旋 鄰接配置的複數處理部進退 室而配置的任一處理部之間 運送方向並不限定於一個方According to the present invention, the hand of the first transport device provided in the transport chamber between the transport chamber and the processing portion adjacent to the transport chamber can directly move the substrate between the transport chamber and the processing portion, and in the transport chamber and It is not necessary to separately provide, for example, a transfer chamber or a transport mechanism between the processing chambers, thereby shortening the substrate transport path and shortening the total length of the substrate processing apparatus, thereby reducing the manufacturing cost of the apparatus. According to the present invention, the substrate in the transport chamber can be transported to the processing chamber by the second transport device, or the substrate can be transported from the processing chamber to the state in which the transport device is located in the transport chamber. The first transport 奘 奘 刃 乐 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 The substrate is shipped. According to the present invention, since the hand is moved relative to the transport chamber by the first turn, the substrate can be transported adjacent to the transport, and the main body of the substrate transfer device can be placed adjacent to each other in the main processing unit. The transport direction between any of the configured processing units is not limited to one side.

2014-7082-PF ⑧ 9 1331686 向0 根據本發明,由於複數第〗運 t Ί* -Λβ .. 送裝置所/、有的各個 4 ’使上述手部相對於鄰接$ 掛久笛t、鄰接配置的複數處理部中針 1運送裝置被預先確定的處 订 J气埋邵進退動作,因此 在/、鄰接運送室而配置的禮 置的複數處理部之間進行基板 運送而基板運送方向並不限定於一個方向。 根據本發明,由於手部 中 向層最” 田於乎部巾間台及基部是沿上下方2014-7082-PF 8 9 1331686 To 0, according to the present invention, since the plural number 〗 〖T Ί * - Λβ .. to the device /, each 4' makes the above hand relative to the adjacent $ hangs t, adjacent In the plurality of processing units, the needle 1 transport device is preliminarily scheduled to move forward and backward. Therefore, the substrate transport is performed between the plurality of processing units disposed adjacent to the transport chamber, and the substrate transport direction is not Limited to one direction. According to the present invention, since the middle layer of the hand is the most "the top of the table, the base and the base are along the upper and lower sides.

且-置,通過由基部使中間台進退動作、及由中間 口:吏手部進退動作的兩者的動作,可以使手部在上述處 理部和運送部之間進退動作,你& &私 、 m退動作從而能夠在使手部從處理 部退開的狀態的第1運淨獎署 ^ 矛1逑这裝置的尺寸較小的同時,確保 當手部進出處理部時使手部的動作範圍較大。 而且,根據本發明,由於從中間台到手部無需設置 使基板檢出感測器卫作用的配線等,這就使進入到處理 部交接基板的手部的構造簡單化,因而也就減少了在和 處理部進行基板交接時發生障礙的可能性。 而且,根據本發明,通過在手部的基板裝載面上設 置的複數突起部,使基板在穩定的狀態下裝載在基板裝 載面上進行運送。這樣,在手部上即使不設置基板吸附 機構等’也能在手部上穩定地裝載基板,因此在需要設 置基板吸附機構的情況下所必需的配管等可以不必設置 在手部等,可以降低手部進入處理部時對處理部的粒子 侵入0 【實施方式】And, by moving the intermediate table forward and backward by the base, and by the operation of both the middle mouth and the hand movement, the hand can move forward and backward between the processing unit and the transport unit, and you && In the state in which the hand is retracted from the processing unit, the size of the device is small, and the size of the device is small when the hand is moved in and out of the processing unit. The range of motion is large. Further, according to the present invention, since it is not necessary to provide wiring or the like for detecting the effect of the substrate from the intermediate stage to the hand, the structure of the hand that has entered the processing unit to transfer the substrate is simplified, thereby reducing the There is a possibility that an obstacle occurs when the processing unit performs the substrate transfer. Moreover, according to the present invention, the substrate is loaded on the substrate loading surface in a stable state by a plurality of projections provided on the substrate loading surface of the hand. In this way, the substrate can be stably placed on the hand without the need for the substrate suction mechanism or the like. Therefore, the piping or the like necessary for the case where the substrate suction mechanism needs to be provided can be eliminated from the hand or the like, and can be lowered. When the hand enters the processing unit, the particles in the processing unit invade 0. [Embodiment]

2014-7082-PF 10 1331686 以下參照附圖説明本發明的實施例。圖丨是表示本 月實施例的基板處理裝置的一例的圖❶基板處理裝 置1主要包括有分度器部(indexer)2、清洗單元1〇、脫 水烘乾早7L 20、光阻塗佈單元30、預烘單元(pre-bake )40顯影單元80、後烘單元(post-bakeunit)90、 及"又置於預烘單元40和曝光單元60之間的緩衝部 (、f fer)50 ’相對於分度器部2,其他的處理部成為連接 成u子形的排列結構,從而按照從分度器部2供給的規 疋=運送順序,在將基板運送到各個單位處理部並在各 個單位處理部處理後,再次返回到上述分度器部2。 基板處理裝置1是將複數處理單元連接、並可連續 處理的塗佈(C0ater) /顯影裝置,與曝光單 元Μ連接而實施光刻法(ph〇t〇_realism process)工序的一部分,所以能夠從光阻塗佈前的清洗 到光阻塗佈、曝光、顯影而連續進行。 在上述分度器部2,設置有裝載容納了基板的盒體4 的盒式裝載部和基板運送機器人3,通過基板運送機器人 3從裝載在上述盒式裝載部的盒體4裏取出基板並交給 ,月洗單元1〇,並且從後烘單元9〇接收處理後的基板並放 回到原來的盒體4裏收存。 上述清洗單元1 0包括有運入部11、紫外線臭氧清洗 部1 2、水洗部1 3、液珠除去部1 4、及運出部1 5,例如, 由上述分度器部2提供的基板,在以水平姿勢運送的同 時’進行清洗處理》2014-7082-PF 10 1331686 An embodiment of the present invention will be described below with reference to the drawings. FIG. 2 is a diagram showing an example of a substrate processing apparatus according to an embodiment of the present invention. The substrate processing apparatus 1 mainly includes an indexer 2, a cleaning unit 1 , a dehydration drying 7 L 20 , and a photoresist coating unit 30 . A pre-bake 40 developing unit 80, a post-bake unit 90, and a buffer portion (f fer) 50' disposed between the pre-baking unit 40 and the exposing unit 60 are relatively In the indexer unit 2, the other processing units are arranged in a u-shaped arrangement, and the substrates are transported to the respective unit processing units and processed in the respective unit processing units in accordance with the gauge=transport order supplied from the indexer unit 2. Then, return to the above-described indexer unit 2 again. The substrate processing apparatus 1 is a coating (C0ater)/developing apparatus that connects and processes a plurality of processing units, and is connected to the exposure unit 而 to perform a part of a photolithography process. It is continuously performed from the cleaning before the photoresist coating to the photoresist coating, exposure, and development. The indexer unit 2 is provided with a cassette loading unit that mounts the cassette 4 in which the substrate is housed, and the substrate transport robot 3, and the substrate transport robot 3 takes out the substrate from the cassette 4 loaded in the cassette loading unit and delivers the substrate to the indexing unit 3 The monthly washing unit is 1 〇, and the processed substrate is received from the post-drying unit 9 并 and returned to the original casing 4 for storage. The cleaning unit 10 includes a transport unit 11, an ultraviolet ozone cleaning unit 1, a water washing unit 13, a liquid droplet removing unit 14, and a transport unit 15, for example, a substrate provided by the indexer unit 2, Carrying out cleaning treatment while transporting in a horizontal position

2014-7082-PF 11 1331686 上述脫水烘乾單元20包括有運入部 目t^、加熱部22、 貼緊強化處理部23及冷卻部24,對於完成7 其妃廿止战了清洗處理的 暴板,首先在加熱部22進行加熱處理以降 %去水分,再刭 可以提高光阻液貼緊性的貼緊強化處硬▲ HMDS(Hexamethyldisilazane)。秋後在> 〇P 23 塗佈 n … 冷却部24對基板 知仃冷部處理。2014-7082-PF 11 1331686 The above-described dehydration drying unit 20 includes a transporting unit t^, a heating unit 22, a close-strengthening processing unit 23, and a cooling unit 24, and the storm plate is cleaned up for the completion of the cleaning process. First, heat treatment is performed on the heating portion 22 to reduce the moisture by a certain amount, and then the HMDS (Hexamethyldisilazane) which can improve the adhesion of the photoresist can be improved. After the fall, the substrate nP 23 is coated with n ... the cooling portion 24 is processed by the substrate.

上述光阻塗佈單元30包括有運入部31、旋轉塗佈部 32、減壓乾燥部33、及邊緣沖洗部(是申請專利範圍中的 處理部的一例)34,首先,在旋轉塗佈部32中,在基板 的表面均句地形成光阻膜,在減壓乾燥部33將其進二減 塵後’再在邊料洗部34中除去基板周圍的不需要的光 阻膜。在邊緣沖洗部34的側方設置有預供單元4〇。 上述預烘單元40包括有將加熱部和冷卻部多級設置 的處理室4lb’通過機器人42,將基板取出或放回該處 理室41b,而對基板施行加熱及冷卻處理。另外,預烘單 元40包括有該處理室41b和設置在此處理室4ib下部的 運送室41a (圖2)。 上述緩衝部50包括有可以收存多塊基板的兩個收存 部51、和設置於這些收存部51之間的機器人52,通過 機器人52,將曝光前的基板及曝光後的基板收存於各收 存部51 ’使基板暫時待命。 上述曝光單元6 0包括有例如縮小投影曝光機等的曝 光機、和進行在曝光單元的曝光圖形的洗印用的定位的 定位(alignment)機構,使預烘後的基板曝光。The photoresist coating unit 30 includes a transport portion 31, a spin coating portion 32, a reduced-pressure drying portion 33, and an edge rinsing portion (an example of a processing portion in the patent application) 34. First, in the spin coating portion In the case of 32, a photoresist film is formed uniformly on the surface of the substrate, and after the dust reduction is performed in the reduced-pressure drying portion 33, the unnecessary photoresist film around the substrate is removed in the edge cleaning portion 34. A pre-supply unit 4A is provided on the side of the edge flushing portion 34. The pre-baking unit 40 includes a processing chamber 41b' in which the heating unit and the cooling unit are disposed in multiple stages, and the substrate 42 is taken out or returned to the processing chamber 41b by the robot 42, and the substrate is subjected to heating and cooling treatment. Further, the pre-baking unit 40 includes the processing chamber 41b and a transport chamber 41a (Fig. 2) provided at a lower portion of the processing chamber 4ib. The buffer unit 50 includes two storage portions 51 that can store a plurality of substrates, and a robot 52 disposed between the storage portions 51. The robot 52 stores the substrate before exposure and the exposed substrate. The substrate is temporarily placed on standby in each of the storage portions 51'. The exposure unit 60 includes, for example, an exposure machine for reducing the projection exposure machine and the like, and an alignment mechanism for performing positioning for printing the exposure pattern of the exposure unit to expose the pre-baked substrate.

2014-7082-PF 12 1331686 上述顯影單元化包括有運入 洗乾燥部83及運出部84。例如 、顯影部82、水 進行顯影液的喷霧,邊施行顯影2影部82,對基板邊 上述後烘單元90包括有運入° 卻部93及運出部94,首先,對:卜加熱部92、冷 熱處理,以蒸發除去基 贫知處理後的基板施行加 土板上殘留的顯 後再施行冷卻處理。 ”影液或h洗液,然 此外,在圖1中,附圖標 預供單…緩衝部5。之間進二::板的裝載台,在 載基板。而且,附圖標記70是把曝二^時’暫時裝 到顯影單元80的傳送帶。 土板運送 這裏,對上述光阻塗佈單 ..,^ 伸早兀30的邊緣沖洗部34、預 烘早兀40及機器人42之間 J丞板運达給予說明。圖2 疋表不邊緣沖洗部34、預烘單元4Q及機器人42的簡略 構成的俯視圖’圖3是表示邊緣沖洗部34及預烘單元 的簡略構成的側視圖。在邊緣沖洗部34内設有基板上下 移動機構34卜在通過8個銷341a a撐基板㈣下部的 狀·癌下’使基板G上下移動。 預供單元40包括有運送室41a、和層疊配置於此運 送室41a的上部的複數處理室41b。在運送室41&内設 f有基板運送機器人4U (第!運送裝置)。基板運送機 器人411將基板G從邊緣沖洗部34運送到運送室4丨&。 此基板運送機器人411包括有裝載基板的手部4111、和 使手部4111朝邊緣沖洗部3 4侧(基板上下移動機構3 4丄2014-7082-PF 12 1331686 The above development unitization includes a carry-in drying portion 83 and a carry-out portion 84. For example, the developing unit 82 and the water spray the developing solution, and the developing portion 2 is applied to the substrate. The post-drying unit 90 includes the transporting portion 93 and the transporting portion 94. First, the heating is performed. The portion 92 is subjected to a cold heat treatment, and the substrate after the evaporation and removal of the substrate is subjected to a cooling treatment. "Shadow liquid or h lotion, in addition, in Figure 1, attached to the icon pre-supply ... buffer section 5. Between the two:: the loading platform of the board, on the carrier substrate. Moreover, the reference mark 70 is exposed The second time 'time is loaded onto the conveyor belt of the developing unit 80. The earth plate is transported here, and the photoresist is coated with the outer edge of the photoresist layer 34, the pre-bake early 40 and the robot 42. Fig. 2 is a plan view showing a schematic configuration of the edge flushing unit 34, the pre-drying unit 4Q, and the robot 42. Fig. 3 is a side view showing a schematic configuration of the edge flushing unit 34 and the pre-baking unit. The edge rinsing unit 34 is provided with a substrate up-and-down moving mechanism 34 that moves the substrate G up and down by the eight pins 341a to support the lower portion of the substrate (four). The pre-supply unit 40 includes a transport chamber 41a and is stacked and disposed. The plurality of processing chambers 41b in the upper portion of the transport chamber 41a. The substrate transport robot 4U (the first transport device) is provided in the transport chamber 41 & f. The substrate transport robot 411 transports the substrate G from the edge flushing portion 34 to the transport chamber 4 & The substrate transport robot 411 includes a loading substrate Hand 4111, and the hand 4111 toward the edge rinsing portion 34 side (substrate up and down moving mechanism 3 4 丄

2014-7082-PF ⑧ 13 丄 331686 側)移動的中間台4112、及使中間台4112朝邊緣沖洗部 34側移動的基部4113。基板運送機器人411,其手部4111 通過基部4113及中間台4112而被移動到邊緣沖洗部34 的内部,該手部4111從基板上下移動機構341接收基板 G,在手部4111裝載著基板G的狀態下,通過基部4113 及中間台4112而再次被移動到運送室41a,這樣,就實 現了將基板G從邊緣沖洗部34運送到運送室41a的運 送。 裝載在手部4111並被移動到運送室41a内的基板 G’從手部4⑴被交付給設置於運送室4U的側方的機 器人42 (第2運送裝置)。機器人42將收到的該基板g 運送到在運送室41a的上部層疊配置的複數處理室4ib 的任意一個。然後,被運送到處理室41b其中之一的基 板通過機器人42而從預烘單元4〇(處理室ο。被取 出,被移送到下一個工序的單元中。 這裏就基板運送機器人411的結構給以說明。圖4 是表示處在被收存於運送室内狀態的基板運送機器人的 俯視圖’圖5是表示處在裝載基板G之前狀態的基板運 达機器人411的俯視圖,圖6是表示裝載基板G時的基 板運送機器人⑴的狀態的俯視圖,圖7是放大表示基 ,運送2器人411的手冑4111的前端部的側視圖,圖8 疋表丁又置在中間台4 u 2上的基板檢出感測器部分的側 視圖。 基板運送機器人411如上所述,包括有手部4ιιι、The 2014-7082-PF 8 13 丄 331686 side) moves the intermediate stage 4112 and the base 4113 which moves the intermediate stage 4112 toward the edge flushing unit 34 side. The substrate transport robot 411 has its hand 4111 moved to the inside of the edge flushing portion 34 by the base portion 4113 and the intermediate portion 4112. The hand portion 4111 receives the substrate G from the substrate up-and-down moving mechanism 341, and the substrate G is loaded on the hand portion 4111. In the state, the base portion 4113 and the intermediate table 4112 are again moved to the transport chamber 41a, so that the transport of the substrate G from the edge flushing portion 34 to the transport chamber 41a is realized. The substrate G' loaded on the hand 4111 and moved into the transport chamber 41a is delivered from the hand 4 (1) to the robot 42 (second transport device) provided on the side of the transport chamber 4U. The robot 42 transports the received substrate g to any one of the plurality of processing chambers 4ib that are stacked on the upper portion of the transport chamber 41a. Then, the substrate conveyed to one of the processing chambers 41b is taken out from the pre-baking unit 4 by the robot 42 (the processing chamber ο. is taken out and transferred to the unit of the next process. Here, the structure of the substrate transport robot 411 is given 4 is a plan view showing a substrate transport robot in a state of being stored in a transport chamber. FIG. 5 is a plan view showing a substrate transport robot 411 in a state before loading the substrate G, and FIG. 6 is a loading substrate G. FIG. 7 is a side view showing the front end portion of the handcuff 4111 of the second person 411, and FIG. 8 is a plan view showing the state of the substrate transport robot (1). A side view of the sensor portion is detected. The substrate transport robot 411 includes the hand 4 ιιι, as described above.

2014-7082-PF 14 1331686 中間台4112及基部4113。基部4113被設置在運送部41a 的底面’在基部4113的上面411 3a上設置有用來驅動中 間台411 2的空氣汽缸411 3b、和引導被此空氣汽缸4丨丨3b 驅動的中間台4112的移動的直動引導機構4113c。該直 動引導機構4113c為了使中間台4112向邊緣沖洗部34 側移動’被a又置成可向邊緣沖洗部34側方向延伸。另外, 空氣汽缸4113b被裝配在直動引導機構4113c的安裝位 置以及不影響中間台411 2的移動的位置上。 中間台4112的下部,以可滑動的形式被安裝在直動 引導機構4113c上。在中間台4112的上面4U2a上設置 有用來驅動手部4111的空氣汽缸4U2b、和引導被此空 氣汽缸4U2b驅動的手部㈣的移動的直動引導機構 4112c。直動引導機構4112c為了使手部4ιιι向邊緣沖 洗部34側移動而被設置成可向邊緣沖洗部⑷則方向延2014-7082-PF 14 1331686 Intermediate stage 4112 and base 4113. The base portion 4113 is provided on the bottom surface ' of the transport portion 41a' on the upper surface 411 3a of the base portion 4113, and is provided with an air cylinder 411 3b for driving the intermediate stage 4112, and a movement for guiding the intermediate stage 4112 driven by the air cylinder 4丨丨3b. Direct motion guiding mechanism 4113c. The linear guide mechanism 4113c is moved to the side of the edge flushing portion 34 in order to move the intermediate table 4112 toward the edge flushing portion 34 side. Further, the air cylinder 4113b is fitted at the mounting position of the linear motion guiding mechanism 4113c and at a position that does not affect the movement of the intermediate stage 4112. The lower portion of the intermediate stage 4112 is slidably mounted on the linear motion guiding mechanism 4113c. On the upper surface 4U2a of the intermediate stage 4112, an air cylinder 4U2b for driving the hand 4111 and a linear motion guiding mechanism 4112c for guiding the movement of the hand (four) driven by the air cylinder 4U2b are provided. The linear motion guiding mechanism 4112c is disposed so as to be movable toward the edge flushing portion (4) in order to move the hand 4ι to the edge flushing portion 34 side.

伸。另外’空氣汽紅4】1 ? h姑故ffi? I '缸4UZb破裝配在直動引導機構411& 的安裝位置以及不影響手部4⑴的移動的位置上。 手部4⑴的下部,以可滑動的形式被安裝在中間台 動引導機構4112…手部4111包括有用以 4111b Λ的.2根長條狀構件41Ua及2根長條狀構件 側方白延伸㈣# 4111a被設置為可朝邊緣沖洗部34 侧方向延伸,而長條狀構件4 侔壯堪姓m , 幻极叹置為可向與長 條狀構件4111a垂直的方向延伸。 我 在各長條狀構件4111 支撐銷(pin)411le而 面’例如裝設4個基板 1C°而且從俯視面看,在手部4⑴的中Stretch. In addition, the 'air redness 4'1?h is the ffi? I' cylinder 4UZb is broken and assembled at the mounting position of the linear motion guiding mechanism 411& and the position which does not affect the movement of the hand 4(1). The lower portion of the hand 4(1) is slidably mounted in the intermediate stage guide mechanism 4112... The hand 4111 includes .2 long strip members 41Ua and 4 strip members extending side by side (4) for 4111b Λ #4111a is disposed to extend toward the side of the edge rinsing portion 34, and the elongated member 4 is sturdy, and the sinus is placed to extend in a direction perpendicular to the elongated member 4111a. I support the pin 411le in each of the elongated members 4111, for example, four substrates 1 C° are mounted, and viewed from the top, in the hand 4 (1)

2014-7082-PF ⑧ 15 央°卩附近,也設置有4個基板支撐銷4111c。基板G就裝 載在這12個基板支揮銷4111。上。此外,在2根長條狀 構件4 111 a的邊緣沖洗部3 4側的前端部(手部4111的前 進方向的刖端部),設有基板引導銷4111d(突出部)。還 有在2根長條狀構件4111b上分別設有2個基板引導 銷(突出部)4111e 、4111f。基板引導銷4Uld的高度如 圖7所示,被設定為高於基板支撐銷4nic,基板引導銷 4111e及4111f也同樣如此。 基板G被裝载在手部4111的基板支撐銷4111。上 時,基板引導銷4111d、4111e的安裝位置被設定成:設 置在長條狀構件4111a上的上述基板引導銷4md與手 部4111前進方向的基板G的前端部相接,設置在長條狀 構件4111b上的上述基板引導銷4nie與手部4ηι前進 方向的基板G的後端部相接。而且,設置在長條狀構件 4111b上的上述基板引導銷41116被安裝在與手部 前進方向的基板G的側面相接的位置。這樣,基板引導 銷41 lid、41 lie可限制裝載在基板支撐銷41Uc上的狀 態的基板G的沿手部4111前進方向的移動,而基板引導 銷4111f則限制該基板G的與手部4ιη前進方向相垂直 的方向的移動。 另外,如圖6所示,在中間台4112的上面的手部4111 前進方向的前端部,當手部41丨i朝邊緣沖洗部34側最 大限度移動時,在其上方手部4111不存在的位置上設置 有基板檢出感測器4114 ^此基板檢出感測器4114如圖8 16In the vicinity of 2014-7082-PF 8 15 , four substrate support pins 4111c are also provided. The substrate G is loaded on the 12 substrate support pins 4111. on. Further, a front end portion of the two elongated members 4 111a on the side of the edge flushing portion 34 (the end portion of the hand 4111 in the forward direction) is provided with a substrate guide pin 4111d (projecting portion). Further, two substrate guide pins (projecting portions) 4111e and 4111f are provided on each of the two elongated members 4111b. The height of the substrate guide pin 4Uld is set to be higher than that of the substrate support pin 4nic as shown in Fig. 7, and the same is true for the substrate guide pins 4111e and 4111f. The substrate G is loaded on the substrate supporting pin 4111 of the hand 4111. In the upper case, the mounting positions of the substrate guide pins 4111d and 4111e are set such that the substrate guide pins 4md provided on the elongated member 4111a are in contact with the front end portion of the substrate G in the advancing direction of the hand portion 4111, and are disposed in a strip shape. The substrate guide pin 4nie on the member 4111b is in contact with the rear end portion of the substrate G in the forward direction of the hand 4n1. Further, the substrate guide pin 41116 provided on the elongated member 4111b is attached to a position in contact with the side surface of the substrate G in the forward direction of the hand. Thus, the substrate guiding pins 41 lid, 41 lie can restrict the movement of the substrate G in the state of being loaded on the substrate supporting pin 41Uc in the advancing direction of the hand portion 4111, and the substrate guiding pin 4111f restricts the advancement of the substrate G and the hand portion 4111 The movement of the direction perpendicular to the direction. Further, as shown in Fig. 6, at the front end portion of the upper hand portion 4111 in the advancing direction of the intermediate table 4112, when the hand portion 41丨i moves to the maximum extent on the edge flushing portion 34 side, the upper hand portion 4111 does not exist. The substrate detecting sensor 4114 is disposed at the position. The substrate detecting sensor 4114 is as shown in FIG. 8 16

2014-7082-PF ⑧ 丄^1686 返回到圖2至圖4所:示的待命位置。 在手部4111裝載了基板G的狀態下,當手部ο。 及中間台4112返回到上述圖2至圖4所示的待命位置 時,機器人42進入到運送室41a内,使其手部仏進入 到由基板支撐銷4111C形成的基板G和長條狀構件 4111a、4111b之間的間隙’直至圖"雙點劃線所表示 的位置為止。 之後手°卩42a上升而成為裝載基板ς的狀態。當 像這樣手部42a裝載了基板G時,機器人42的手部4二 朝離開運送室41a的方向移動,然後,手部42a上升到 f為基板G的收存目的地的處理室4汕的高度為止接 著,手部42a再朝著處理室41b沿水平方向移動進入 到處理至41b内,將基板g收存在處理室4ib内。 本發明不僅僅局限於上述實施例的構成,還可以有 各種各樣的變化。例如,在上述實施例中,雖然說明了 設置在運运室41a的基板運送機器人411將基板G從邊 緣沖洗部34運送到運送室41a側的情況,但本發明的基 板處理裝置1並不局限於此構成,如以下的圖9及圖1〇 所不,也可以設置成由基板運送機器人411將基板G運 送到鄰接於預烘單元40而設置的複數處理部。圖9是表 示預烘單元40、及鄰接於預烘單元4〇的複數處理部的簡 略構成的側視圖,圖1〇是表示預烘單元4〇、鄰接於預烘 單元40的複數處理部及機器人42的簡略構成的俯視圖。 例如’如圖9所示,也可以在預烘單元4〇的運送室2014-7082-PF 8 丄^1686 Returns to the standby position shown in Figure 2 to Figure 4. In the state where the substrate G is loaded on the hand 4111, the hand is ο. When the intermediate stage 4112 returns to the standby position shown in FIGS. 2 to 4 described above, the robot 42 enters the transport chamber 41a, and the hand squats into the substrate G and the elongated member 4111a formed by the substrate supporting pin 4111C. The gap between 4111b is 'up to the position indicated by the double dot line. Then, the hand 卩 42a rises to be in a state in which the substrate ς is loaded. When the substrate G is loaded on the hand 42a, the hand 4 of the robot 42 moves in the direction away from the transport chamber 41a, and then the hand 42a rises to the processing chamber 4 where f is the storage destination of the substrate G. Immediately after the height, the hand 42a is moved in the horizontal direction toward the processing chamber 41b and proceeds to the processing 41b, and the substrate g is stored in the processing chamber 4ib. The present invention is not limited to the configuration of the above embodiment, and various changes are possible. For example, in the above embodiment, the case where the substrate transport robot 411 provided in the transport chamber 41a transports the substrate G from the edge flushing portion 34 to the transport chamber 41a side is described, but the substrate processing apparatus 1 of the present invention does not In addition to this configuration, as shown in FIG. 9 and FIG. 1 below, the substrate transport robot 411 may be configured to transport the substrate G to a plurality of processing units provided adjacent to the pre-baking unit 40. 9 is a side view showing a schematic configuration of a pre-baking unit 40 and a plurality of processing units adjacent to the pre-baking unit 4, and FIG. 1A shows a pre-baking unit 4A, a plurality of processing units adjacent to the pre-baking unit 40, and A top view of a simplified configuration of the robot 42. For example, as shown in Fig. 9, it is also possible to carry the pre-drying unit 4〇 in the transport room.

2014-7082-PF ⑧ 19 1331686 41a,在不同的高度處配置2個基板運送機器人411,通 過使其中一個基板運送機器人411的手部4111沿如圖所 示的箭頭方向移動,從而可以將基板G從鄰接於預烘單 元40的處理部500運送到運送室41a,而通過使另一個 基板運送機器人411的手部4111沿如圖所示的箭頭方向 移動’可以將基板G從鄰接於預烘單元4〇的另一個處理 部501運送到運送室41a。在這種情況下,能夠同時進行 往處理部500及處理部501兩個地方的基板運送。 此外,如圖10所示,也可以是將運送室41a内的基 板運送機器人411設置成可沿水平方向(如圖所示的箭頭 方向)旋轉動作的結構,根據與鄰接於預烘單元4〇而設 置的處理部500、501中的哪一個交接基板G,能夠改變 手部4111的朝向。在這種情況下,由於只需在運送室4ia °又置1台基板運送機器人411就足夠了,因此可以使能 夠向上述兩個方向運送基板G的構成變得比較簡單。 另外,上述基板處理裝置丨在預烘單元4〇和與其鄰 接的處理部之間的基板運送機構的構成,只不過是其中 的1例,並不是只限於上述構成。還有,在預烘單元4〇 和與其鄰接的處理部之間的基板運送方向,也不只限於 從上述邊緣沖洗部34朝向預烘單元40的方向也可以 採用將基板G沿著與其不同的方向(例如反方向)運送 構成。 【圖式簡單說明】 第1圖疋表示本發明一實施例的基板處理裝置的—2014-7082-PF 8 19 1331686 41a, two substrate transport robots 411 are disposed at different heights, and the substrate 4 can be moved by moving the hand 4111 of one of the substrate transport robots 411 in the direction of the arrow as shown in the figure. The substrate G is transported from the processing unit 500 adjacent to the pre-baking unit 40 to the transport chamber 41a, and the substrate 4 is moved from the hand 4111 of the other substrate transport robot 411 in the direction of the arrow as shown in the drawing. The other processing unit 501 of 4 turns is transported to the transport chamber 41a. In this case, the substrate transport to the processing unit 500 and the processing unit 501 can be simultaneously performed. Further, as shown in FIG. 10, the substrate transport robot 411 in the transport chamber 41a may be provided to be rotatable in the horizontal direction (in the direction of the arrow shown), and may be adjacent to the pre-bake unit 4A. Which one of the processing units 500 and 501 is provided to transfer the substrate G can change the orientation of the hand 4111. In this case, it suffices that only one substrate transport robot 411 is placed in the transport chamber 4ia, so that the configuration in which the substrate G can be transported in the above two directions can be made relatively simple. Further, the configuration of the substrate transport mechanism between the pre-baking unit 4A and the processing unit adjacent thereto is merely one example, and the configuration is not limited to the above configuration. Further, the substrate transport direction between the pre-baking unit 4A and the processing portion adjacent thereto is not limited to the direction from the edge flushing portion 34 toward the pre-baking unit 40, and the substrate G may be employed in a different direction. (for example, the opposite direction) transport composition. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a view showing a substrate processing apparatus according to an embodiment of the present invention -

2014-7082-PF 20 例的圖。 · 第2圖是表示邊緣沖洗部、預烘單元及機器人的簡 略構成的俯視圖。 第3圖是表示邊緣沖洗部及預烘單元的簡略構成的 側視圖。 第4圖是表示處於被容納在運送室内的狀態的基板 運送機器人的俯視圖。 第5圖是表示處於裝載基板之前的狀態的基板運送 機器人的俯視圖。 第6圖是表示在裝載基板時的基板運送機器人的狀 態的俯視圖。 第7圖疋放大表示基板運送機器人手部的前端部的 侧視圖。 第8圖是表示設置在中間臺上的基板檢出感測器部 分的側視圖。Figure of the 2014-7082-PF 20 case. Fig. 2 is a plan view showing a schematic configuration of an edge flushing unit, a pre-baking unit, and a robot. Fig. 3 is a side view showing a schematic configuration of an edge rinsing unit and a pre-baking unit. Fig. 4 is a plan view showing the substrate transport robot in a state of being housed in the transport chamber. Fig. 5 is a plan view showing the substrate transfer robot in a state before the substrate is loaded. Fig. 6 is a plan view showing a state of the substrate transport robot when the substrate is loaded. Fig. 7 is an enlarged side view showing the front end portion of the substrate transport robot hand. Fig. 8 is a side view showing the portion of the substrate detecting sensor provided on the intermediate stage.

第9圖是表不預烘單元、及鄰接預烘單元的複數處 理部的簡略構成的側視圖。 第10圖是表示預烘單元、鄰接預烘單元的複數處理 部及機器人的簡略構成的俯視圖。 第11圖是表示以往的基板處理裝置的邊緣沖洗部、 預供單元及機器人的簡略構成的俯視圖。 【主要元件符號說明】 1~基板處理裝置 3 4〜邊緣沖洗部 3 41 a〜銷 30~光阻塗佈單元 34卜基板上下移動機構 341b上面部 21Fig. 9 is a side view showing a schematic configuration of a plurality of pre-baking units and a plurality of processing units adjacent to the pre-baking unit. Fig. 10 is a plan view showing a schematic configuration of a pre-baking unit, a plurality of processing units adjacent to the pre-baking unit, and a robot. 11 is a plan view showing a schematic configuration of an edge rinsing unit, a pre-supply unit, and a robot of a conventional substrate processing apparatus. [Description of main component symbols] 1~Substrate processing apparatus 3 4~Edge rinsing section 3 41 a~pin 30~Photoresist coating unit 34Substrate up and down moving mechanism 341b upper surface 21

2014-7082-PF ⑧ 1331686 40~預烘單元 41a〜運送室 41卜處理室 41卜基板運送機器人 411卜手部 4111a、4111b〜長條狀構件 4111c〜基板支撐銷 411 Id至4111 f〜基板引導銷 4112~中間台 4112a~上面 4112b〜空氣汽缸 4112c〜直動引導機構 4113〜基部 4113a〜上面 4113b〜空氣汽缸 411 3c〜直動引導機構 4114〜基板檢出感測器4114a〜發光部 4114b〜受光部 42〜機器人2014-7082-PF 8 1331686 40~ pre-baking unit 41a to transport chamber 41 processing chamber 41, substrate transport robot 411 hand 4111a, 4111b to strip member 4111c to substrate support pin 411 Id to 4111 f~ substrate guide Pin 4112 - intermediate stage 4112a - upper surface 4112b - air cylinder 4112c - linear motion guiding mechanism 4113 - base portion 4113a - upper surface 4113b - air cylinder 411 3c - linear motion guiding mechanism 4114 - substrate detecting sensor 4114a - light emitting portion 4114b - receiving light Department 42~Robot

42a〜手部 500、501〜處理部 G〜基板42a to hand 500, 501 to processing unit G to substrate

2014-7082-PF 222014-7082-PF 22

Claims (1)

第094113925號中文申請專利範圍修正本、申請專利範圍: 修正日期:98.1.13 Λϋ免更)正木 室 種基板處理裝置,具有層疊配置的複數處理 其特徵在於包括: 運送室,相對於上述複數處理室而層疊配置; 處理部,鄰接於上述運送室而配置; 第1運送裝置,具有裝載基板的手部和設於上述運 送至内而使上述手部在上 退移動的主體部。 4運送至及上述處理部之間進 2.如申請專利範圍第μ所述的 中還包括第2運送裝置, 室與上述複數_理— 34帛2運送裝置在上述運送 複數處理至之間進行基板運送。 3 ·如申請專利範圍第?a 中上㈣2 $ 基板處理裂置,其 Z運送裝置在盘盧力 的上述第1谨7担* /、處在位於上述運送室内的狀態 乐1運送裝置的丰+日日 4 ^ ^ 手。卩之間進行基板的交接。 •如申請專利範圍第 處理萝w . 至3項中任一項所述的基板 处理屐置,其令上述第 手部旋轉的媳堪 運达裝置的主體部具有使上述 轉的機構,使上述 配置的;1于°卩相對於與上述運送室鄰接 1的複數處理部進退動作。 .如申S青專利範圍第1至 處理裝置,其中上、+•曾 3項中任一項所述的基板 運送裝置所且古"1運送裝置設置有複數,各第1 配置的複數處理部使上述手部相對於鄰接 處理部進退動作 、各第1運送裝置被預先確定的 2014-7082-PF1 23 1331686 如申請專利fe圍第1至3項中任一 丄王《3項γ仕一項杯Japanese Patent Application Laid-Open No. 094113925, the scope of the patent application: Date of revision: 98.1.13 Amnesty) The substrate processing device of the positive wooden chamber, the complex processing having a stacked configuration, comprising: a transport chamber, relative to the above complex processing The processing unit is disposed adjacent to the transport chamber. The first transport device includes a hand for loading the substrate and a main body portion that is transported to the inside and moves the hand upward. 4 transported between the processing unit and the processing unit. 2. The second transporting device is further included in the scope of the patent application, and the chamber and the plurality of transport units are transported between the plurality of transports. The substrate is transported. 3 · If you apply for a patent scope? a Middle (four) 2 $ substrate processing split, the Z transport device in the above-mentioned 1st 7th * /, in the state of the transport room in the above-mentioned transport room, the music 1 transport device's abundance + day 4 ^ ^ hand. The substrate is transferred between the crucibles. The substrate processing apparatus according to any one of the preceding claims, wherein the main body of the apparatus for rotating the first hand has a mechanism for rotating the above-mentioned The first processing unit 1 is placed forward and backward with respect to the plurality of processing units adjacent to the transport chamber. In the first embodiment of the invention, the substrate transport device according to any one of the above, and the above-mentioned 3, the ancient "1 transport device is provided with plural, and the plural processing of each first configuration In the case where the hand moves forward and backward with respect to the adjacent processing unit, and each of the first transport devices is predetermined, 2014-7082-PF1 23 1331686, such as any one of the first and third items of the patent application, "3 items" Cup •’中間 配置的處理部進退動 台’其使上述手部相對於上述鄰接配 .. 4* J Λς. AJt^N ' 部’其使上述中間台沿著與通過該中間台而使上 •述手部進退的方向相同的方向進退動作,這些手部、中 間台以及基部是在上下方向上層疊設置。 7. 如申凊專利範圍第6項所述的基板處理裝置,其 十在上述第1運送裝置的中間臺上設置有檢測出在上述 ® 手部上是否裝載有基板的基板檢出感測器》 8. 如申請專利範圍第1至3項中任一項所述的基板 處理裝置,其中在上述第1運送裝置的手部,在其基板 裝載面上設置有限制基板向侧面移動的複數突出部,基 板被裝載在由這些複數突出部形成的的範圍内。 2014-7082-PF1 24• 'Intermediately disposed processing unit into the retracting table' which causes the above-mentioned hand to be attached to the abutment with respect to the above-mentioned abutment.. 4* J Λς. AJt^N 'part' which causes the above-mentioned intermediate stage to pass along with the intermediate stage The hand advances and retreats in the same direction, and the hands, the intermediate table, and the base are stacked in the vertical direction. 7. The substrate processing apparatus according to claim 6, wherein a substrate detecting sensor that detects whether or not a substrate is mounted on the ® hand is provided on an intermediate stage of the first transporting device. The substrate processing apparatus according to any one of claims 1 to 3, wherein the hand of the first transporting device is provided with a plurality of protrusions on the substrate loading surface that restrict the movement of the substrate to the side surface. The substrate is loaded in a range formed by the plurality of protrusions. 2014-7082-PF1 24
TW094113925A 2004-07-28 2005-04-29 Substrate processor TW200604643A (en)

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KR102605917B1 (en) * 2016-04-07 2023-11-27 주식회사 탑 엔지니어링 Scribing apparatus
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