1310089 九、發明說明： 【發明所屬之技術領域】 本發明係提供-種可利制試機於測試站 —、 =作:電性切換連結，而以瞬間電性切換時間取代交換料時厂 進而有效縮短測試站之停滯等待時間，以、’ ， 之電子元件雜檢财法及裝置。 W升檢·產效能 【先前技術】 在現今’電？元件於生產過程中係歷 J確保品質，於電子元件製作完成後，均會進f jj、= 以積體電路(integrated circuit，簡稱員：測丄式作 2係具有料接腳，該接腳型式有導線式接 狀 設計而0 C具有不同電性 ’ 路二電Γ短路測試植 由檢出不良品》 測站數量也械改變，私^ 業者配以檢測之檢 =而配置單一測試站之檢測裝置示意時 料機構移料機構14、第二移1310089 IX. Description of the invention: [Technical field to which the invention pertains] The present invention provides a test machine for testing a test station -, = as: an electrical switching connection, and replacing the exchange material with an instantaneous electrical switching time. Effectively shorten the waiting time of the test station, to ', ' electronic components miscellaneous inspections and methods. W inspection and production efficiency [Prior technology] In today's electricity? In the production process, the components are J to ensure the quality. After the electronic components are manufactured, they will enter f jj, = integrated circuit (referred to as the member: the test type 2 system has the material pin, the pin The type has a wire-type connection design and the 0 C has different electrical characteristics. The road 2 is short-circuited and the test is detected by the defective product. The number of stations is also changed, and the private technician is equipped with the test test = and the single test station is configured. The detecting device indicates the material feeding mechanism 14 and the second shift
試站1 3係設有一具複數巧f稷數個完測1 C ’而測 測試座131 1分別且右Γί5式131 1之測試區131，各 21，β 2 測試接點，並可供置人待測I C 3測站13之驅131，並 測試結果傳輸至機台之中央寺執行電性測試作業，且將 制各機構配合作動，而當^= (c)=中央控制器控 業時，第-移料機構i 4之移二 1c 21於執行檢測作 取出下-待測I c 2 2以待測試。° 1 4 1則可於供料機構1 1處 1310089 請參閱第2圖所示，當測試站丄3 … I C 21電性檢測作業後，該第二移椹j131執灯元 1 51將測試區！3!中之完測j 5即以一移料器 構12處依測試結果分類收置，而笔^取出，並移載至收料機 料機構i 5將完測Μ以第機構1觸二移 測試區1 3 1之測試座;l 3 χ ϊ ^依測1 c 2 2置入於 每當測試座1 3 1内之i C執行生測試作業；惟， 1 3即必須停止測試作業供第πί乍業几畢後’該測試站 行完測！ C及待測J 構1 4、i 5進 嚴重影響檢測的產能。 ” b父換料作業時間即 【發明内容】 ^試站係設有至少第―、J試機;^^測試機， =’使得第—測試區執行待測電子之測試 構可於供料機構處移載另—待測電子^ 業時，移料機 當第-測試區完成電子元件雜第；~啦區内備料’ 性切換，而轉換對第二測試區内之待、、則;Uf試機立即作電 業，該移料機構則將第-測試區之】測^電性檢測作 至收料機構上分類收置；藉此，_責^=測試結果移載 ，奐的連結，以接續對各測試區J之;式區間作電 作業，而可有效縮酬朗進行交換料 t執仃電性檢測 幅提升檢測產能之實用效益。 、 、夺間，進而達到大 【實施方式】 與為使貴審查委員對本發明作更進一步之 只施例並配合圖式，詳述如后： 。解炫舉一較佳 =閱第3圖所示，係為本發日月應用於檢 圖，该檢測裝置包含： l電性之不意 1310089 供料機構30:係用以容置至少—成 收料機構4 0 :係用以容置至少—盛& =待測IC之料盤； 測試站5 0 :係分職有至少第—測完測I C之料盤； ’該第-、二測試區51、^及第二測試區52 試接點之測試座511、e J各設有複數個具測 測試機6 0 :係可各別匹配對應测試站^證 51、52，且其斯生連結於=^二測試區 二測試區5 1、52，而可於第0之第-、 二測試區5 2間作電性切換於區Η及第 S一2内之待測々= 第一移料機構可作第„、二^ Ζ方向）位移之移料器7丄， 及測試站5 0之第~、ς機構3 0 待測Ic：. 一而忒£5 1、52間移載 第二移料機構^0:係設有可作第_、二、三方向（如χ —γ — 2向）位移之移料器81，用以於測試站5〇之 ^ 1' 3試區5 1、5 2及收料機構4 0間移載 空Ε機構9 G :伽以容置空的料盤。 本f明執行IC電性檢測之方法： A)^閱第4圖所示，本發明係可先於測試站5 〇第一測試 二1之各測試座5 i工内置入制j c工〇 1，並使匹 待^測試機6 0電性連結於第-測試區51，而對其内之 c1〇1執行電性檢測作業，此時，該第一移料機 f/0係以移料器7 1於供料機構3 0處取出下-制之 1 c 1 0 2 ; (B)明參閱第5圖所*，於摩式站5 〇之第一測試區5工執行 1310089 ? 1 (U之電购時，該第一移 待測之I 02移载至第二測以= (C) 2 5 21中’而完成第二測試區5 2之備料各測 1性切二至第二性後’立即作 5 2中之待:貝j i C 1 〇 !而接續對第二測試區 ί-J Tl^T^ 5 〇 ⑽器7 i則於供料機構3。處取出=構 (D) 明參閱第7圖所示，該第—移 3之I c i 0 3移载至第 器係將待 中，以完成第一測試區5工之備料义J各測趣5 1 1 之移料器81則將完測j c i 〇 \爲哉，一移料機構8 〇 依檢測結果而分類收置。〇 1移載錢料機構4 0處 而利用-測試區執1二之數個測試區，進 測試站之各戦區_紐=進仃，而測試機於 =_式交換料停滯;i時^ f圖式簡單說明】 第1圖：習式檢測裝置執行j c電性 立 第2圖：習式檢測裂置執行！ c電性::^圖（-）。 第3圖：本發明檢測裝置之示意 欢之不思圖（二）。 第4圖：本發明第一測試區執^ 第5圖:本發明第—測試區^ 1則之示意圖。 匕執灯1C電性檢淑第二測試區備料 1310089 第6圖： 之示意圖。 本發明第二測試區執行1 之示意圖。 c電性檢測及第一測試區出料 弟7圖.本發明第一測試區備料及移料機構將完測 料機構之示意圖。 【主要元件符號說明】 〔習式〕 0移載至收The test station 1 3 system is provided with a plurality of test units 1 C ', and the test area 131 1 and the right side Γ 5 type 131 1 test area 131, 21, β 2 test joints, and can be placed The person to be tested IC 3 station 13 drive 131, and the test results are transmitted to the central station of the machine station to perform electrical test operations, and the various institutions will cooperate with each other, and when ^= (c)= central controller control industry The first-shifting mechanism i 4 shifts 2c 21 to perform the test for taking out - the I c 2 2 to be tested for testing. ° 1 4 1 can be used in the feeding mechanism 1 1 1310089 Please refer to Figure 2, when the test station 丄 3 ... IC 21 electrical testing operation, the second moving j131 lamp unit 1 51 will test area ! In the end of 3!, the j 5 is sorted according to the test result by a shifter structure, and the pen is taken out and transferred to the receiving machine mechanism i 5 will be measured by the first body 1 Move the test area of the test area 1 3 1; l 3 χ ϊ ^ according to the test 1 c 2 2 placed in the test stand 1 3 1 of the i C executive test operation; only, 1 3 must stop the test operation for After the πί乍 industry has finished a few times, the test station is finished! C and the structure to be tested 1 4, i 5 into the production capacity that seriously affects the detection. b b parent refueling operation time [invention content] ^ test station is equipped with at least the first --, J test machine; ^ ^ test machine, = 'the first test area to perform the test of the electronic test can be in the feeding mechanism When shifting another electronic device to be tested, the feeder will complete the electronic component miscellaneous in the first-test zone; the material in the zone will be switched, and the conversion will be in the second test zone; The test machine immediately performs the electricity industry, and the material transfer mechanism performs the measurement and measurement of the first test area to the receiving institution for classification and collection; thereby, the _ responsibility ^= test result transfer, 奂 link, In order to continue the operation of each test area J; the interval can be used for power operation, and the utility model can effectively reduce the practical benefit of exchanging the electrical detection width and detecting the production capacity. In order to make the examination of the present invention further, and to match the drawings, the details are as follows: . . . 解 = = = = = = = = = = = = = = = = = = = = The detection device comprises: l Electrically unconscious 1310089 Feeding mechanism 30: is used to accommodate at least - into a receiver 4 0 : is used to accommodate at least the tray of the IC to be tested; the test station 50: is divided into at least the first - test the IC tray; 'the first and second test areas 51 , and the test area 511 and e J of the test area of the second test area 52 are respectively provided with a plurality of test machines 6 0 : the system can be matched to the corresponding test station ^ 51, 52, and its connection In the =^2 test area 2 test area 5 1 , 52, and can be electrically switched between the 0th and 2nd test areas 5 to be tested in the area 第 and the S 1-2 = first shift The material mechanism can be used as the „, ^ Ζ ) ) ) ) 之 之 丄 丄 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , The second material transfer mechanism ^0: is provided with a shifter 81 which can be used for the displacement of the first, second and third directions (such as χ - γ - 2 direction) for the test station 5 〇 ^ 1 ' 3 test area 5 1, 5 2 and the receiving mechanism 40 transfer vacant mechanism 9 G: gaze to accommodate empty trays. The method for performing IC electrical detection is as follows: A) ^ Figure 4 shows that the present invention can be built before the test station 5 〇 the first test 2 1 test bench 5 i work built into the jc process 1 And the electrical test machine 60 is electrically connected to the first test area 51, and the electrical detection operation is performed on the inner c1〇1. At this time, the first transfer machine f/0 is used for the transfer. The device 7 1 takes out the lower-made 1 c 1 0 2 at the feeding mechanism 30; (B) see Fig. 5, and executes 1310089 1 in the first test area of the motor station 5 5 ( When the U is purchased, the first I TO to be tested is transferred to the second test to = (C) 2 5 21 ' and the second test area 5 2 is prepared for each test. After sex, 'I will immediately wait for 5 2: Be ji C 1 〇! And continue to the second test area ί-J Tl^T^ 5 〇 (10) 7 i is at the feeding mechanism 3. Take out = structure (D As shown in Figure 7, the shifting of the I-ci 0 3 of the first shift to the first system will be completed to complete the transfer of the first test zone 5 The device 81 will complete the test jci 〇 \ as 哉, and a transfer mechanism 8 will be classified according to the detection result. 〇 1 transfer money mechanism 4 0 and use - test area to execute 1 2 test areas, into the test area of each test area _ New = 仃, and the test machine in = _ type exchange material stagnation; i when ^ f schema simple description] Figure 1: The routine detection device performs the jc electrical diagram 2: the routine detection split execution! c electrical:: ^ map (-). Figure 3: The schematic of the detection device of the present invention (2) Figure 4: The first test area of the present invention is carried out. Figure 5: Schematic diagram of the first test area of the present invention. 1 匕 灯 1C electrical inspection second test area preparation 1310089 Figure 6: The schematic diagram of the second test area of the present invention is performed as follows: c Electrical detection and the first test area discharge material 7 diagram. The first test area of the present invention and the material transfer mechanism will complete the schematic diagram of the material inspection mechanism. Component symbol description] [Literature] 0 transfer to receipt
供料機構：11 收料機構：12 測試站：13 測試座：1311 第一移料機構：14 第二移料機構：15 測試機：16 I c ： 2 1 〔本發明〕 供料機構：3 0 收料機構：4 0 測試站：5 0 測試座：51 1 測試座：5 21 測試機：6 0 第一移料機構：70 第一移料機構.8 0 空匣機構：9 0 1 c ： 1 〇 1 1 c ： 1 〇 3 測試區：131 移料器：141 移料器：151 I C ： 2 2 第一測試區：51 第二測試區：5 2 移料器：71 移料器：81 1 C ： 1〇2 9Feeding mechanism: 11 Receiving mechanism: 12 Test station: 13 Test stand: 1311 First transfer mechanism: 14 Second transfer mechanism: 15 Test machine: 16 I c : 2 1 [Invention] Feeding mechanism: 3 0 Receiving mechanism: 4 0 Test station: 5 0 Test stand: 51 1 Test stand: 5 21 Test machine: 6 0 First transfer mechanism: 70 First transfer mechanism. 8 0 Open mechanism: 9 0 1 c : 1 〇1 1 c : 1 〇3 Test area: 131 Pipe feeder: 141 Pipe feeder: 151 IC : 2 2 First test zone: 51 Second test zone: 5 2 Pipe feeder: 71 Pipe feeder: 81 1 C : 1〇2 9