TWI297079B - - Google Patents
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- Publication number
- TWI297079B TWI297079B TW92136450A TW92136450A TWI297079B TW I297079 B TWI297079 B TW I297079B TW 92136450 A TW92136450 A TW 92136450A TW 92136450 A TW92136450 A TW 92136450A TW I297079 B TWI297079 B TW I297079B
- Authority
- TW
- Taiwan
- Prior art keywords
- positioning
- test
- point
- patent application
- adjustment
- Prior art date
Links
- 238000012360 testing method Methods 0.000 claims description 74
- 238000000034 method Methods 0.000 claims description 20
- 230000007246 mechanism Effects 0.000 claims description 17
- 238000011960 computer-aided design Methods 0.000 claims description 15
- 238000001514 detection method Methods 0.000 claims description 6
- 238000005259 measurement Methods 0.000 claims description 6
- 238000006073 displacement reaction Methods 0.000 claims description 4
- 239000007787 solid Substances 0.000 claims description 3
- 239000000463 material Substances 0.000 claims 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims 1
- 230000008569 process Effects 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- 238000003825 pressing Methods 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000012550 audit Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000002847 impedance measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 235000009566 rice Nutrition 0.000 description 1
- 238000009987 spinning Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW92136450A TW200521451A (en) | 2003-12-22 | 2003-12-22 | Detecting and positioning method of circuit board and test mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW92136450A TW200521451A (en) | 2003-12-22 | 2003-12-22 | Detecting and positioning method of circuit board and test mechanism |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200521451A TW200521451A (en) | 2005-07-01 |
| TWI297079B true TWI297079B (enExample) | 2008-05-21 |
Family
ID=45068969
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW92136450A TW200521451A (en) | 2003-12-22 | 2003-12-22 | Detecting and positioning method of circuit board and test mechanism |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200521451A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7924033B2 (en) * | 2008-03-21 | 2011-04-12 | Electro Scientific Industries, Inc. | Compensation tool for calibrating an electronic component testing machine to a standardized value |
| TWI732167B (zh) * | 2019-01-03 | 2021-07-01 | 和碩聯合科技股份有限公司 | 阻抗檢查的方法 |
| CN112763802B (zh) * | 2019-11-04 | 2023-04-25 | 航天科工惯性技术有限公司 | 一种电阻检测装置及方法 |
-
2003
- 2003-12-22 TW TW92136450A patent/TW200521451A/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| TW200521451A (en) | 2005-07-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |