TWI289383B - Improved bandgap voltage reference - Google Patents
Improved bandgap voltage reference Download PDFInfo
- Publication number
- TWI289383B TWI289383B TW093136623A TW93136623A TWI289383B TW I289383 B TWI289383 B TW I289383B TW 093136623 A TW093136623 A TW 093136623A TW 93136623 A TW93136623 A TW 93136623A TW I289383 B TWI289383 B TW I289383B
- Authority
- TW
- Taiwan
- Prior art keywords
- transistor
- voltage
- circuit
- current
- base
- Prior art date
Links
- 230000000694 effects Effects 0.000 claims description 19
- 238000012937 correction Methods 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 12
- 239000013078 crystal Substances 0.000 claims description 9
- 230000008878 coupling Effects 0.000 claims description 6
- 238000010168 coupling process Methods 0.000 claims description 6
- 238000005859 coupling reaction Methods 0.000 claims description 6
- 230000005611 electricity Effects 0.000 claims description 4
- 230000000295 complement effect Effects 0.000 claims description 3
- 230000003362 replicative effect Effects 0.000 claims description 3
- 230000009977 dual effect Effects 0.000 claims description 2
- 239000000428 dust Substances 0.000 claims description 2
- 230000008030 elimination Effects 0.000 claims description 2
- 238000003379 elimination reaction Methods 0.000 claims description 2
- 238000003199 nucleic acid amplification method Methods 0.000 claims 2
- 230000003321 amplification Effects 0.000 claims 1
- 239000010902 straw Substances 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 abstract description 8
- 230000003503 early effect Effects 0.000 abstract 1
- 238000004088 simulation Methods 0.000 description 8
- 230000008859 change Effects 0.000 description 5
- 230000009467 reduction Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 240000004307 Citrus medica Species 0.000 description 1
- 241000257303 Hymenoptera Species 0.000 description 1
- 244000046052 Phaseolus vulgaris Species 0.000 description 1
- 235000010627 Phaseolus vulgaris Nutrition 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000009966 trimming Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is DC
- G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/30—Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Nonlinear Science (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Control Of Electrical Variables (AREA)
- Amplifiers (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/731,704 US7012416B2 (en) | 2003-12-09 | 2003-12-09 | Bandgap voltage reference |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200533061A TW200533061A (en) | 2005-10-01 |
| TWI289383B true TWI289383B (en) | 2007-11-01 |
Family
ID=34634411
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW093136623A TWI289383B (en) | 2003-12-09 | 2004-11-26 | Improved bandgap voltage reference |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7012416B2 (https=) |
| JP (1) | JP4616275B2 (https=) |
| CN (1) | CN100472385C (https=) |
| TW (1) | TWI289383B (https=) |
| WO (1) | WO2005057313A1 (https=) |
Families Citing this family (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7543253B2 (en) * | 2003-10-07 | 2009-06-02 | Analog Devices, Inc. | Method and apparatus for compensating for temperature drift in semiconductor processes and circuitry |
| FR2866724B1 (fr) * | 2004-02-20 | 2007-02-16 | Atmel Nantes Sa | Dispositif de generation d'une tension electrique de reference de precision amelioree et circuit integre electronique correspondant |
| US7248098B1 (en) * | 2004-03-24 | 2007-07-24 | National Semiconductor Corporation | Curvature corrected bandgap circuit |
| US7173407B2 (en) * | 2004-06-30 | 2007-02-06 | Analog Devices, Inc. | Proportional to absolute temperature voltage circuit |
| US7208930B1 (en) * | 2005-01-10 | 2007-04-24 | Analog Devices, Inc. | Bandgap voltage regulator |
| US7230473B2 (en) * | 2005-03-21 | 2007-06-12 | Texas Instruments Incorporated | Precise and process-invariant bandgap reference circuit and method |
| US7688054B2 (en) * | 2006-06-02 | 2010-03-30 | David Cave | Bandgap circuit with temperature correction |
| US7411380B2 (en) * | 2006-07-21 | 2008-08-12 | Faraday Technology Corp. | Non-linearity compensation circuit and bandgap reference circuit using the same |
| US7576598B2 (en) * | 2006-09-25 | 2009-08-18 | Analog Devices, Inc. | Bandgap voltage reference and method for providing same |
| US8102201B2 (en) | 2006-09-25 | 2012-01-24 | Analog Devices, Inc. | Reference circuit and method for providing a reference |
| US7714563B2 (en) * | 2007-03-13 | 2010-05-11 | Analog Devices, Inc. | Low noise voltage reference circuit |
| US20080265860A1 (en) * | 2007-04-30 | 2008-10-30 | Analog Devices, Inc. | Low voltage bandgap reference source |
| US7656145B2 (en) * | 2007-06-19 | 2010-02-02 | O2Micro International Limited | Low power bandgap voltage reference circuit having multiple reference voltages with high power supply rejection ratio |
| US7605578B2 (en) | 2007-07-23 | 2009-10-20 | Analog Devices, Inc. | Low noise bandgap voltage reference |
| US9110485B2 (en) * | 2007-09-21 | 2015-08-18 | Freescale Semiconductor, Inc. | Band-gap voltage reference circuit having multiple branches |
| CN101464698B (zh) * | 2007-12-19 | 2010-08-11 | 上海华虹Nec电子有限公司 | 电源电路及电源供给方法 |
| US7598799B2 (en) * | 2007-12-21 | 2009-10-06 | Analog Devices, Inc. | Bandgap voltage reference circuit |
| US7612606B2 (en) * | 2007-12-21 | 2009-11-03 | Analog Devices, Inc. | Low voltage current and voltage generator |
| US7902912B2 (en) * | 2008-03-25 | 2011-03-08 | Analog Devices, Inc. | Bias current generator |
| US7750728B2 (en) * | 2008-03-25 | 2010-07-06 | Analog Devices, Inc. | Reference voltage circuit |
| US7880533B2 (en) * | 2008-03-25 | 2011-02-01 | Analog Devices, Inc. | Bandgap voltage reference circuit |
| US8400213B2 (en) * | 2008-11-18 | 2013-03-19 | Freescale Semiconductor, Inc. | Complementary band-gap voltage reference circuit |
| US9218015B2 (en) | 2009-03-31 | 2015-12-22 | Analog Devices, Inc. | Method and circuit for low power voltage reference and bias current generator |
| US8228052B2 (en) * | 2009-03-31 | 2012-07-24 | Analog Devices, Inc. | Method and circuit for low power voltage reference and bias current generator |
| TWI437406B (zh) | 2010-10-25 | 2014-05-11 | Novatek Microelectronics Corp | 低雜訊電流緩衝電路及電流電壓轉換器 |
| TWI502306B (zh) * | 2013-05-13 | 2015-10-01 | Ili Technology Corp | 電流電壓轉換器及其電子裝置 |
| US9600015B2 (en) * | 2014-11-03 | 2017-03-21 | Analog Devices Global | Circuit and method for compensating for early effects |
| CN104503528B (zh) * | 2014-12-24 | 2016-03-30 | 电子科技大学 | 一种降低失调影响的低噪声带隙基准电路 |
| US10310539B2 (en) * | 2016-08-26 | 2019-06-04 | Analog Devices Global | Proportional to absolute temperature reference circuit and a voltage reference circuit |
| US10222817B1 (en) * | 2017-09-29 | 2019-03-05 | Cavium, Llc | Method and circuit for low voltage current-mode bandgap |
| US9864389B1 (en) | 2016-11-10 | 2018-01-09 | Analog Devices Global | Temperature compensated reference voltage circuit |
| US10353414B2 (en) * | 2017-04-07 | 2019-07-16 | Texas Instruments Incorporated | Bandgap reference circuit with inverted bandgap pairs |
| CN108614611B (zh) * | 2018-06-27 | 2024-06-04 | 上海治精微电子有限公司 | 低噪声带隙基准电压源、电子设备 |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3914684A (en) | 1973-10-05 | 1975-10-21 | Rca Corp | Current proportioning circuit |
| US4399398A (en) | 1981-06-30 | 1983-08-16 | Rca Corporation | Voltage reference circuit with feedback circuit |
| US4399399A (en) * | 1981-12-21 | 1983-08-16 | Motorola, Inc. | Precision current source |
| US4603291A (en) | 1984-06-26 | 1986-07-29 | Linear Technology Corporation | Nonlinearity correction circuit for bandgap reference |
| US4808908A (en) | 1988-02-16 | 1989-02-28 | Analog Devices, Inc. | Curvature correction of bipolar bandgap references |
| US4939442A (en) | 1989-03-30 | 1990-07-03 | Texas Instruments Incorporated | Bandgap voltage reference and method with further temperature correction |
| US5053640A (en) | 1989-10-25 | 1991-10-01 | Silicon General, Inc. | Bandgap voltage reference circuit |
| JP2695515B2 (ja) * | 1990-07-19 | 1997-12-24 | ローム株式会社 | 基準電圧発生回路 |
| JPH04338812A (ja) * | 1991-05-16 | 1992-11-26 | Yokogawa Electric Corp | 基準電圧発生回路 |
| US5352973A (en) | 1993-01-13 | 1994-10-04 | Analog Devices, Inc. | Temperature compensation bandgap voltage reference and method |
| US5325045A (en) | 1993-02-17 | 1994-06-28 | Exar Corporation | Low voltage CMOS bandgap with new trimming and curvature correction methods |
| US5424628A (en) | 1993-04-30 | 1995-06-13 | Texas Instruments Incorporated | Bandgap reference with compensation via current squaring |
| US5512817A (en) | 1993-12-29 | 1996-04-30 | At&T Corp. | Bandgap voltage reference generator |
| CN1162191A (zh) * | 1996-03-04 | 1997-10-15 | 摩托罗拉公司 | 电压和电流基准电路 |
| KR100400383B1 (ko) * | 1996-03-07 | 2003-12-31 | 마츠시타 덴끼 산교 가부시키가이샤 | 기준 전압원 회로 및 전압 피드백 회로 |
| JPH09330137A (ja) * | 1996-04-10 | 1997-12-22 | Toshiba Corp | 基準電圧発生回路及び基準電圧発生方法 |
| KR100322527B1 (ko) * | 1999-01-29 | 2002-03-18 | 윤종용 | 밴드갭 전압기준회로 |
| US6157245A (en) | 1999-03-29 | 2000-12-05 | Texas Instruments Incorporated | Exact curvature-correcting method for bandgap circuits |
| US6411158B1 (en) * | 1999-09-03 | 2002-06-25 | Conexant Systems, Inc. | Bandgap reference voltage with low noise sensitivity |
| US6218822B1 (en) | 1999-10-13 | 2001-04-17 | National Semiconductor Corporation | CMOS voltage reference with post-assembly curvature trim |
| DE10011669A1 (de) * | 2000-03-10 | 2001-09-20 | Infineon Technologies Ag | Schaltungsanordnung zum Erzeugen einer Gleichspannung |
| US6614284B1 (en) * | 2001-11-08 | 2003-09-02 | National Semiconductor Corporation | PNP multiplier |
| US6590372B1 (en) * | 2002-02-19 | 2003-07-08 | Texas Advanced Optoelectronic Solutions, Inc. | Method and integrated circuit for bandgap trimming |
| US6677808B1 (en) * | 2002-08-16 | 2004-01-13 | National Semiconductor Corporation | CMOS adjustable bandgap reference with low power and low voltage performance |
| CN2588431Y (zh) * | 2002-12-20 | 2003-11-26 | 上海贝岭股份有限公司 | 采用二阶温度补偿能隙基准电压的电压源 |
| JP2005128939A (ja) * | 2003-10-27 | 2005-05-19 | Fujitsu Ltd | 半導体集積回路 |
-
2003
- 2003-12-09 US US10/731,704 patent/US7012416B2/en not_active Expired - Fee Related
-
2004
- 2004-11-26 TW TW093136623A patent/TWI289383B/zh not_active IP Right Cessation
- 2004-12-07 WO PCT/EP2004/053306 patent/WO2005057313A1/en not_active Ceased
- 2004-12-07 JP JP2006543541A patent/JP4616275B2/ja not_active Expired - Fee Related
- 2004-12-07 CN CNB2004800368249A patent/CN100472385C/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN100472385C (zh) | 2009-03-25 |
| TW200533061A (en) | 2005-10-01 |
| JP2007514225A (ja) | 2007-05-31 |
| WO2005057313A1 (en) | 2005-06-23 |
| US20050122091A1 (en) | 2005-06-09 |
| JP4616275B2 (ja) | 2011-01-19 |
| US7012416B2 (en) | 2006-03-14 |
| CN1890617A (zh) | 2007-01-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |