TWI257129B - Dual damascene trench formation to avoid low-k dielectric damage - Google Patents

Dual damascene trench formation to avoid low-k dielectric damage

Info

Publication number
TWI257129B
TWI257129B TW094101238A TW94101238A TWI257129B TW I257129 B TWI257129 B TW I257129B TW 094101238 A TW094101238 A TW 094101238A TW 94101238 A TW94101238 A TW 94101238A TW I257129 B TWI257129 B TW I257129B
Authority
TW
Taiwan
Prior art keywords
forming
dual damascene
layer
dummy portion
over
Prior art date
Application number
TW094101238A
Other languages
English (en)
Other versions
TW200601450A (en
Inventor
Chen-Nan Yeh
Tsiao-Chen Wu
Chao-Cheng Chen
Original Assignee
Taiwan Semiconductor Mfg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Mfg filed Critical Taiwan Semiconductor Mfg
Publication of TW200601450A publication Critical patent/TW200601450A/zh
Application granted granted Critical
Publication of TWI257129B publication Critical patent/TWI257129B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/7682—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing the dielectric comprising air gaps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/76802—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics
    • H01L21/76807—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics for dual damascene structures
    • H01L21/76808—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics for dual damascene structures involving intermediate temporary filling with material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/10—Applying interconnections to be used for carrying current between separate components within a device
    • H01L2221/1005—Formation and after-treatment of dielectrics
    • H01L2221/101—Forming openings in dielectrics
    • H01L2221/1015—Forming openings in dielectrics for dual damascene structures
    • H01L2221/1026—Forming openings in dielectrics for dual damascene structures the via being formed by burying a sacrificial pillar in the dielectric and removing the pillar
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/10—Applying interconnections to be used for carrying current between separate components within a device
    • H01L2221/1005—Formation and after-treatment of dielectrics
    • H01L2221/101—Forming openings in dielectrics
    • H01L2221/1015—Forming openings in dielectrics for dual damascene structures
    • H01L2221/1031—Dual damascene by forming vias in the via-level dielectric prior to deposition of the trench-level dielectric

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
TW094101238A 2004-06-30 2005-01-14 Dual damascene trench formation to avoid low-k dielectric damage TWI257129B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/882,058 US7169701B2 (en) 2004-06-30 2004-06-30 Dual damascene trench formation to avoid low-K dielectric damage

Publications (2)

Publication Number Publication Date
TW200601450A TW200601450A (en) 2006-01-01
TWI257129B true TWI257129B (en) 2006-06-21

Family

ID=35514563

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094101238A TWI257129B (en) 2004-06-30 2005-01-14 Dual damascene trench formation to avoid low-k dielectric damage

Country Status (2)

Country Link
US (1) US7169701B2 (zh)
TW (1) TWI257129B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8791778B2 (en) 2009-04-20 2014-07-29 International Business Machines Corporation Vertical integrated circuit switches, design structure and methods of fabricating same
TWI453814B (zh) * 2006-08-22 2014-09-21 Lam Res Corp 用於電漿蝕刻性能增強的方法

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060038293A1 (en) * 2004-08-23 2006-02-23 Rueger Neal R Inter-metal dielectric fill
US7767570B2 (en) * 2006-03-22 2010-08-03 Taiwan Semiconductor Manufacturing Company, Ltd. Dummy vias for damascene process
US7749894B2 (en) * 2006-11-09 2010-07-06 Chartered Semiconductor Manufacturing Ltd. Integrated circuit processing system
US20080230907A1 (en) * 2007-03-22 2008-09-25 Chartered Semiconductor Manufacturing Ltd. Integrated circuit system with carbon enhancement
US7615484B2 (en) * 2007-04-24 2009-11-10 Chartered Semiconductor Manufacturing Ltd. Integrated circuit manufacturing method using hard mask
US7829450B2 (en) * 2007-11-07 2010-11-09 Infineon Technologies Ag Method of processing a contact pad, method of manufacturing a contact pad, and integrated circuit element
KR101570482B1 (ko) * 2009-10-15 2015-11-20 삼성디스플레이 주식회사 박막 트랜지스터 표시판 및 그 제조 방법
US8796150B2 (en) 2011-01-24 2014-08-05 International Business Machines Corporation Bilayer trench first hardmask structure and process for reduced defectivity
US8951911B2 (en) * 2011-03-31 2015-02-10 Applied Materials, Inc. Process for damascene structure with reduced low-k damage
US9111939B2 (en) * 2012-07-27 2015-08-18 Intel Corporation Metallization of fluorocarbon-based dielectric for interconnects
US9859156B2 (en) * 2015-12-30 2018-01-02 Taiwan Semiconductor Manufacturing Co., Ltd. Interconnection structure with sidewall dielectric protection layer
US10795270B2 (en) * 2017-08-25 2020-10-06 Taiwan Semiconductor Manufacturing Co., Ltd. Methods of defect inspection

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6855629B2 (en) * 2002-07-24 2005-02-15 Samsung Electronics Co., Ltd. Method for forming a dual damascene wiring pattern in a semiconductor device
US20040002210A1 (en) * 2002-06-28 2004-01-01 Goldberg Cindy K. Interconnect structure and method for forming
US6924221B2 (en) * 2002-12-03 2005-08-02 Taiwan Semiconductor Manufacturing Co., Ltd. Integrated process flow to improve copper filling in a damascene structure
US20040175934A1 (en) * 2003-03-04 2004-09-09 International Business Machines Corporation Method for improving etch selectivity effects in dual damascene processing
US7538025B2 (en) * 2003-11-14 2009-05-26 Taiwan Semiconductor Manufacturing Company Dual damascene process flow for porous low-k materials

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI453814B (zh) * 2006-08-22 2014-09-21 Lam Res Corp 用於電漿蝕刻性能增強的方法
US8791778B2 (en) 2009-04-20 2014-07-29 International Business Machines Corporation Vertical integrated circuit switches, design structure and methods of fabricating same
TWI472475B (zh) * 2009-04-20 2015-02-11 Ibm 垂直積體電路切換器、設計結構及其製造方法

Also Published As

Publication number Publication date
TW200601450A (en) 2006-01-01
US7169701B2 (en) 2007-01-30
US20060003576A1 (en) 2006-01-05

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees