TWI238026B - Structure and fabricating method of a high-dielectric film formed on an organic substrate - Google Patents

Structure and fabricating method of a high-dielectric film formed on an organic substrate Download PDF

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TWI238026B
TWI238026B TW92136335A TW92136335A TWI238026B TW I238026 B TWI238026 B TW I238026B TW 92136335 A TW92136335 A TW 92136335A TW 92136335 A TW92136335 A TW 92136335A TW I238026 B TWI238026 B TW I238026B
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dielectric film
film layer
scope
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TW92136335A
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TW200522809A (en
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Shih-Yu Cheng
Hung-I Chang
Ching-Yuan Tsu
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Ind Tech Res Inst
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Abstract

A method utilizes core-shell powders of metal-ceramic or ceramic-ceramic structure to fabricate a high-dielectric film on an organic substrate. The powders first mix with a solvent to deposit on the substrate and form a dielectric film. Furthermore, densification process such as laser annealing enables a compact structure of the dielectric film. The obtained dielectric film achieves excellent performances, including a wider control range of solid content, high dielectric constant, low TCC (temperature coefficient of capacitance), and low loss tangent.

Description

1238026 五、發明說明(!) 【發明所屬之技術領域】 特別,》明係關於一種於一基板上製造介電膜層之方法, 米粒$ θ:種於相對較低之溫度條件下’利用高介電性奈 :基板Πίίίΐ屬:陶'或陶甍-陶变之核殼結構顆粒’ 法。 /成/、有回介電常數之介電膜層的結構及製造方 【先前技術】 要趨ί子ΐ ϊ i統之高密度集積化、小型&,為發展之炙 而佔據80%的電路路面功/密度^加,獨立被動電子元件更進 必行。 積兀件的小型化與多功能化已勢在 k者製造技術的進步,祐#1238026 V. Description of the invention (!) [Technical field to which the invention belongs] In particular, "Ming is about a method for manufacturing a dielectric film layer on a substrate, rice grain $ θ: seeded under relatively low temperature conditions Dielectric properties: Substrate Πίίίΐ Genus: Pottery 'or Pottery-Taobian core-shell structure particles' method. / 成 /, the structure and manufacturing method of the dielectric film layer with a dielectric constant of the past [previous technology] It is necessary to make high-density integration, small size & of the system, occupying 80% of the development Circuit work / density is increased, and independent passive electronic components are necessary. The miniaturization and multi-functionality of the building blocks have been advancing in the advancement of manufacturing technology.

度,已小到不易摔和i二斗電子兀件達到的小型化私 術(謝)將元件^人的到\寸;而/,使用傳W 另有將多數個元件《且穿$ 冑之結果。現有技術中, 陣列(Array)產品;、、、二作:广形成不同元件功能的 陣列元件的密度也持續產同^製造^進步,整倘 可靠度及佔面積之缺點。 门樣產生刖述寄生效應、你 於疋’為了縮小元,件彳々诚 或整合到基板外表面:::據電路的面積’使用埋入方式 *法,此乃因埋入::J:之為-般電子構裝常用的 連到基板、可增進電氣功At 耘,具有不需獨立連接線 點。 孔功此、降低成本且製程容易等優Degree, has been so small that it is not easy to fall and the mini-electronic electronic components have achieved the miniaturization (Xie) of the components ^ person to \ inch; and /, use the pass W and also the majority of components "and wear $ 胄 之 之result. In the prior art, Array products; ,,, and two operations: The density of array elements that have widely formed different element functions has continued to produce the same manufacturing and advancement, taking into account the shortcomings of reliability and area. The gate sample produces a parasitic effect. In order to reduce the element, the pieces are integrated or integrated on the outer surface of the substrate. It is a general electronic structure commonly connected to the substrate, which can increase the electrical work, and has no need for independent connection points. Kong Gong, reducing costs and easy process

f 6頁 1238026 五、發明說明(2) 目前,有兩種製造高介電混成膜層的方法,一為基於 滲透(percolation)原理的導體-絕緣基材複合膜層;另一 則為基於隨機的介電材料混合理論,混合絕緣基材(高分 子)與高介電常數之無機材料(陶兗)。 導體-絕緣基材複合膜又稱為導體—無機複材,根據 C.P. Wong 專人的研究(γ· Roa,c.p· Wong, " A Novelf 6 pages 1238026 V. Description of the invention (2) At present, there are two methods for manufacturing a high-dielectric hybrid film layer, one is a conductor-insulating substrate composite film layer based on the principle of percolation; the other is based on random The theory of dielectric material mixing, mixing insulating substrates (polymers) and inorganic materials with high dielectric constants (Tao Ying). Conductor-insulating substrate composite film is also called conductor-inorganic composite material, according to the research of C.P. Wong (γ · Roa, c.p · Wong, " A Novel

Ultra High Dielectric Constant Epoxy SilverUltra High Dielectric Constant Epoxy Silver

Composite for Embedded Capacitor Application11, IEEE 8th International Symposium on Advanced Packaging Materials,p. 2 48 ( 2 0 0 2 )),以片狀銀混合環 氧樹脂,在11 · 23 vo 1 % (體積百分比)的片狀銀混合含量 下’可得到介電常數高達K= 1 0 0 0,介電損失低至tan 5 = 1. 9%之值;但當其片狀銀含量在丨丨· 28v〇1%時,介電常數 bl 50 0,雖然更進一步上升,但介電損失高達tan δ=15%之 值。 所以,以滲透原理製得之導體-無機複材,欲得到穩 疋控制製程之導體含量範圍非常的狹窄,其介電常數與顆 粒組成含量關係之示意圖,如第1圖之曲線Γ丨·導體-絕緣 體」所示;其在臨界滲透之導體含量部分,有突升的高介_ 電常數;但其在很窄的導體含量範圍内,即會因電子跳躍 行為而極速增加漏電情形,產生高介電損失及大幅降低介 電常數。 至於高分子-陶瓷混合複材,又稱為有機-無機複材, 其"電常數與顆粒組成含量關係之示意圖,如第1圖之曲Composite for Embedded Capacitor Application11, IEEE 8th International Symposium on Advanced Packaging Materials, p. 2 48 (2 0 0 2)), flake silver mixed with epoxy resin, flakes at 11 · 23 vo 1% (volume percentage) With a mixed silver content, a dielectric constant as high as K = 1 0 0 0 and a dielectric loss as low as tan 5 = 1. 9% can be obtained; but when its flake silver content is 丨 丨 28v〇1%, Although the dielectric constant bl 50 0 is further increased, the dielectric loss is as high as tan δ = 15%. Therefore, for the conductor-inorganic composite material produced by the principle of permeation, the range of the conductor content for the stable control of the process is very narrow. The schematic diagram of the relationship between the dielectric constant and the particle composition content is shown in the curve of Figure 1 -Insulator "; it has a high dielectric constant in the part of the conductor with critical penetration; but within a narrow range of conductor content, it will increase the leakage situation due to the electron jumping behavior, resulting in high Dielectric loss and greatly reduced dielectric constant. As for the polymer-ceramic hybrid composite, also known as organic-inorganic composite, the schematic diagram of the relationship between its "electric constant and particle composition content" is shown in Figure 1

第7頁 1238026 五、發明說明(3) 線「2·高分子-陶瓷體」所示;前人研究包括T.R· J〇w. 人(High Dielectric Constant Material Development11,IEEE, 1 992 )混合環氧樹脂與锆鈦酸鉛 (PZT )陶瓷顆粒得到高介電常數膜層,而進/步則有 C· P· Wong等人(美國專利US6 5446 5 1 )使用鈦酸鋇 (BaTi03)及#鈦酸鉛(PZT)陶瓷顆粒混合高介電螯合 高分子’但是,在陶瓷顆粒含量大於85ν〇1%時才得到高介 電常數1 5 0 ’要得到更高的介電常數通常需增加陶瓷顆粒 含量。然而,添加高介電常數陶瓷顆粒之固含量大於 ν ο 1 % (體和百分比)以上時,將使膜層變得易脆而增加 加工及組裝困難度,因此,高陶瓷顆粒固含量增加混合製 程的困難度,而介電常數也沒有令人滿意的表現。 因此,以上所述之先前技術中,可以製作成高介電常 ^内埋膜層之方法,皆缺乏製程便利性及穩健性;如欲成 2於可撓性的基板,更如緣木求魚。再者,即使欲以陶瓷 2陶瓷與金屬之核殼結構顆粒作為基礎來形成膜層,雖缺 形:i;;到相當高之介電常數,但現有的技術要直接: 膜層有其困難度;燒結緻密化陶兗的溫度動辄 千度,而一般基板於表面黏著或錫焊製程中,不過 4文攝氏100至2 00度而已,根本無法承受燒結陶究的高 【發明内容】 本Sx明所欲解決之技術問題,在於弈益 製程’於基板上形成具有高介電常數與Page 7 1238026 V. Description of the invention (3) As shown in line "2 · Polymer-Ceramic"; previous studies include TR · Jow. Human (High Dielectric Constant Material Development 11, IEEE, 1 992) mixed epoxy Resin and lead zirconate titanate (PZT) ceramic particles obtain a high dielectric constant film layer, while C.P.Wong et al. (US patent US 6 5446 5 1) use barium titanate (BaTi03) and #titanium Lead-acid (PZT) ceramic particles mixed with high-dielectric chelating polymer 'However, a high dielectric constant of 15.0 is obtained only when the content of ceramic particles is greater than 85 ν0%' To obtain a higher dielectric constant, it is usually necessary to increase the ceramic Particle content. However, when the solid content of the high-dielectric constant ceramic particles is greater than ν ο 1% (volume and percentage), the film layer will become brittle and increase the difficulty of processing and assembly. Therefore, the solid content of the high-ceramic particles will increase. The difficulty of the process and the dielectric constant did not perform satisfactorily. Therefore, in the prior art described above, the methods that can be used to make a high-dielectric constant buried film layer lack the convenience and robustness of the process; if it is to be made of a flexible substrate, it is more like a tree. Furthermore, even if it is intended to form a film layer based on the ceramic-ceramic and metal core-shell structure particles, although the shape is lacking: i ;; to a relatively high dielectric constant, the existing technology is straightforward: the film layer has its difficulties The temperature of the sintered densified ceramic pot is thousands of degrees. Generally, the substrate is adhered to the surface or soldered. However, it is only 100 to 200 degrees Celsius at 4 degrees Celsius. The technical problem that Sx Ming wants to solve is that Yiyi's process' forms on the substrate with high dielectric constant and

__ 第8頁 1238026 發明說明(4) 膜層。 膜層:技術的問㉟,本發明所提供具有高介電 粉體,接著;ϋ ί Ϊ至f ΐ提供具有核殼結構之複數 溶劑披繼而將該等粉體與 ;緻袷化該介電膜層。 ,u 本發明所提供之高介電膜層係 Μ , ^ ^ f Τ 1定用具有核殼結構之粉 體,在相對低的基板溫度條件下, 再 此—具有核殼結構之粉體,其核= f板表面形成; 機妊料 h U ^材為金屬或具導電性的鉦 械材枓,殼材則為具介電特性 I、、、 介電特性材料,因此介電膜声呈^丄;、' ,或者,核為咼 度係數。 电暝層具有向介電常數及低電容溫 再者’所形成之介電膜;呈古 外加能詈“…^ 有南粉體固含*,可利用 丨加此里C如雷射)而加以緻密化。__ Page 8 1238026 Description of the invention (4) Film. Film layer: the technical problem, the present invention provides a high-dielectric powder, and then; ί Ϊ to f ΐ provides a plurality of solvents with a core-shell structure followed by the powder and the dielectric; Film layer. , u The high-dielectric film layer M, ^ ^ f Τ 1 provided in the present invention is a powder having a core-shell structure, and at a relatively low substrate temperature, again—a powder having a core-shell structure, Its core = f surface formation; the organic material h U ^ is a metal or a conductive material, and the shell material is a material with dielectric characteristics I ,,, and so the dielectric film is acoustic ^ 丄;, ', or, the kernel is the degree coefficient. The dielectric layer has a dielectric film formed by the dielectric constant and the low capacitance temperature; it has an ancient external energy "... ^ Younan powder is solidly contained *, and you can use 丨 plus C such as laser) and Densify.

其次,介電膜層之粉體固含量可胡敕A (較佳為64〜84v〇U)間,在1MH°之入乾J5在45〜9〇vo1% 為3。”以上,且在粉體固二數f〇“較佳 數小於1%。 里τ凋叙乾圍之電容溫度係 另外’外加雷射能量在Secondly, the solid content of the powder of the dielectric film layer can be between 敕 A (preferably 64 ~ 84v〇U), and the dryness of J5 at 1MH ° is 3 to 45 ~ 90vo1%. Above, and the powder solid number f0 "is preferably less than 1%. The temperature of the capacitors in the ττ and λ is about ‘plus the laser energy at

頻率5〜15Ηζ條件下,可以;一與脈獨 電膜層,其介電常數達45;以到上兀王介不電,有春機高分子之高^ 本發明達成之功效,在於利用核二電:失低於2.5%。 上形成之介電膜層,具有較之粉f於有編 常數及低電容溫度係數、低介電損:里调^:圍、高介’ 他)丨電相失,且其製程可適用方Under the condition of the frequency of 5 ~ 15Ηζ, it is possible; the dielectric constant of the single-pulse film layer is 45; the electricity to the upper king is not charged, and the high molecular weight of the spring machine is high ^ The effect achieved by the present invention lies in the use of nuclear Second power: loss is less than 2.5%. The dielectric film layer formed thereon has a constant compared with the powder f, a low capacitance temperature coefficient, and a low dielectric loss: tune ^: range, high dielectric ′ other) 丨 phase loss, and the process can be applied to

1238026 一·" ------- 五、發明說明(5) 相對低耐受溫度之基板。 【實施方式】 本發明係使用溶液化學法(例如 ^ 或溶膠凝膠法等)製作且 尺熱法、氧化還原法 其中核材為金屬材料(例如鈦、銀(powder) ’ 導電性的無機材料(例如半導性陶^他,電^屬)或具 材料(例如鈦酸鳃、鈦酸鋇’或為咼介電特性 錯等介電材料),卩寸可 太+H'二氧化鈦、氧化 具高介電常數之無機材例:鈦酸二m度。殼材為 圍。 寻;丨冤材枓),尺寸為奈米尺度範 核咸結構粉體的組成,可以是: 核材 核材 一、任一粉體均由殼材「完全包覆 t、任一粉體均由殼材「部份包覆 tΐ份粉體由殼材完全包覆核材,而另一部份粉體則 : 部份包覆」核材,再加上部份奈米級之殼材粉體 的混合粉體。 中將亡述三種具有核殼結構之粉體,混合於高分子溶劑 々 晨氧树月曰、丙稀酸樹脂等),利用旋轉塗佈或印刷 等方法披錢(deposit )在(有機基板如PCB基板,或矽基 板+、破璃基板),經過固化(cur i ng )黏結程序,即可在 核殼結構粉體之寬固含量範圍,得到具有高介電常數之介 電膜層’其介電常數與粉體固含量關係之示意圖如第1圖 之曲線「3 A ·核殼結構」所示。1238026 I. " ------- V. Description of the invention (5) Relatively low temperature resistant substrate. [Embodiment] The present invention is made by a solution chemistry method (such as ^ or sol-gel method), and the ruler method, the redox method in which the core material is a metal material (such as titanium, silver (powder) 'conductive inorganic material (Such as semiconducting ceramics, electrical materials) or materials (such as gill titanate, barium titanate 'or dielectric materials with mismatched dielectric properties), 卩 inch may be too + H' titanium dioxide, oxide Examples of inorganic materials with high dielectric constants: 2 m degrees of titanate. The shell material is surrounded. The material size is the composition of nano-scale standard nuclear salt powder. It can be: 1.Each powder is completely covered by the shell material, and any powder is completely covered by the shell material. Part of the powder is completely covered by the shell material, and the other part of the powder is: "Partially coated" core material, plus a mixture of nano-grade shell powder. Lieutenant General described three kinds of powders with core-shell structure, mixed with polymer solvent (morning tree, acrylic resin, etc.), and depositing them by spin coating or printing (organic substrates such as PCB substrate, or silicon substrate +, broken glass substrate), after curing (cur i ng) bonding process, a wide range of solid content of the core-shell structure powder can be obtained to obtain a dielectric film layer with a high dielectric constant. The schematic diagram of the relationship between the dielectric constant and the solid content of the powder is shown in the curve "3 A · core-shell structure" in Figure 1.

III 第ίο頁 1238026 五、發明說明(6) 若使用前述之核殼結構粉體’混合分散在溶劑中,再 坡鍍在有機基板上,然後以雷射能暈退火) 以緻密化(densificati〇n)該介電膜層’所得介電膜岸 之介電常數將如第1圖之曲線r3B.核殼結構」於固含量曰 lOOvol%之示意點。由第i圖中各曲線之比較,本發明利用 核殼結構粉體所發展之介電膜層,可在較寬之組成 調整範圍下,得到高介電常妻文,確為—簡易、穩 程0III Page 1238026 V. Description of the invention (6) If the aforementioned core-shell structure powder is mixed and dispersed in a solvent, then plated on an organic substrate, and then annealed with laser energy) to densify (densificati). n) The dielectric constant of the dielectric film layer obtained by the dielectric film layer will be as shown in the curve r3B. Core-shell structure of FIG. 1 at a schematic point where the solid content is 100 vol%. From the comparison of the curves in Fig. I, the dielectric film layer developed by the present invention using the core-shell structure powder can obtain high dielectric constant wife text under a wide composition adjustment range, which is indeed-simple and stable. Cheng 0

士制ί一,本發明所提供具有高介電膜層之有機基 ί::方法,包含第2圖所示之步驟:首&,提供具有核 敢'、、σ構之複數粉體(步驟110 );接著’分散該等粉體至 二溶劑中(步驟120);繼而,將該等粉體與溶劑彼鍍於 一有機基板上以形成一介電膜層(步驟丨3 〇 );最後,固 化或緻密化該介電膜層(步驟丨40)。其中,緻密化程序 可採用雷射退火處理。 以下藉由本發明第一較佳實施例,詳細說明本發明之 技術内容。 •首先,使用水熱合成法在i 5 0〜2 0 0 c條件,以鈦 )金屬為核材、鈦酸勰(SrTi〇3,簡稱st )為殼材,In the case of a Japanese system, the organic-based method with a high dielectric film layer provided by the present invention includes the steps shown in FIG. 2: First & Step 110); then 'disperse the powder into two solvents (step 120); then, the powder and the solvent are plated on an organic substrate to form a dielectric film layer (step 丨 3 〇); Finally, the dielectric film layer is cured or densified (step 40). Among them, the densification procedure can be performed by laser annealing. The technical content of the present invention will be described in detail through the first preferred embodiment of the present invention. • First, use a hydrothermal synthesis method under the conditions of i 5 0 to 2 0 c, with titanium) metal as the core material, and thorium titanate (SrTi〇3, referred to as st) as the shell material,

>成核殼結構之粉體,此粉體定義名稱為Ti—ST。 另外’利用氧化還原法合成奈米級之銀粒子(稱為 n〇 Ag ) ’再加入藕合劑3_(胺基丙基)三甲氧基矽烧 太(、3-ami nopropyl) tri met ho xysi lane )使其反應披覆在 不米級銀粒子表面,形成第一層殼,此反應產物稱為Ag-.> A powder with a nucleated shell structure. The definition of this powder is Ti-ST. In addition, 'Synthesis of nano-sized silver particles (known as n〇Ag) by oxidation-reduction method' is followed by the addition of the coupling agent 3_ (aminopropyl) trimethoxysilicon (3, 3-ami nopropyl) tri met ho xysi lane ) To make its reaction coat on the surface of silver particles, to form a first shell, the reaction product is called Ag-.

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A P S,Pi^後,再加入錄與鈦之有機醇鹽,與a & — a p $在1 5 〇。〇 進行溶膠旋膠時效反應,藉由藕合劑結合錄離子與鈇離子 开y成鈦I鳃第二層殼。而後離心乾燥得到具有核殼粉體結 構之粉體,此類粉體定義名稱為A g — § τ。 將Τι-ST或Ag-ST核殼粉體與丙’烯酸樹脂混合攪拌,使 用旋轉塗佈方法彼鑛在有機基板(以印刷電路板PCB為 例)之銅電極(Cu electrode )上,形成介電膜層,而後 於150 °C固化(curing ),如第3A、3B圖;利用具有電極 圖樣之遮罩覆蓋固化之介電膜層,並濺鍍一金屬電極,例 如金電極(Au electrode),使其與銅底電極形成一金 屬-絕緣膜-金屬之MIM結構,如第3C、3D圖所示;因此, 刖述本餐明咼介電膜層之製造方法,可進一步包含減鍍另 一金屬電極於該介電膜層上,以形成一金屬—絕緣膜—金屬 結構之步驟。接下來,將以此M丨M結構量測介電特性(介 電常數K、介電損失tan 5 )、介電特性隨頻率之穩定性, 以及電谷之溫度穩定性((C(t)-C(25°C))/(C(25°C) (T-25°C)),其中C為電容、T為溫度)等。After A P S, Pi ^, add an organic alkoxide with titanium, and a & a p $ at 150. 〇 Perform the sol-gum aging reaction, and combine the recording ions and osmium ions to form the second shell of titanium I gills through the coupling agent. Then, the powder with a core-shell powder structure is obtained by centrifugal drying, and the definition of such powder is A g — § τ. Mixing and stirring the T-ST or Ag-ST core-shell powder with acrylic resin, and using a spin coating method to form a copper electrode (Cu electrode) on an organic substrate (using a printed circuit board PCB as an example). The dielectric film layer is then cured at 150 ° C, as shown in Figures 3A and 3B; the cured dielectric film layer is covered with a mask with an electrode pattern, and a metal electrode is sputtered, such as an Au electrode ) To form a metal-insulating film-metal MIM structure with the copper bottom electrode, as shown in Figures 3C and 3D; therefore, the manufacturing method of the dielectric film layer described herein may further include reduced plating The step of forming another metal electrode on the dielectric film layer to form a metal-insulating film-metal structure. Next, the dielectric characteristics (dielectric constant K, dielectric loss tan 5), the stability of the dielectric characteristics with frequency, and the temperature stability of the valley ((C (t)) will be measured with this M 丨 M structure. -C (25 ° C)) / (C (25 ° C) (T-25 ° C)), where C is capacitance and T is temperature).

其介電損失tan 5則平均一直都維持在4%左右。當Ti—灯核 殼結構粉體固含量超過9〇v〇l%以後則因有機樹脂含量太 少,致使核殼結構粉體混合不易均句,不僅大大降低介電 請參閱第4圖,對Ti-ST核殼結構形成之介電膜層而 言,在室溫、1MHz下,隨著Ti-ST核殼結構粉體固含量之 增加,介電常數隨之增加;當Ti—ST核殼結構粉體固含量 在64〜84vol%時,介電常數K穩定的維持在3〇〇〜4〇〇之間,Its dielectric loss tan 5 has been maintained at about 4% on average. When the solid content of the Ti-lamp core-shell structure powder exceeds 90 vol%, the content of the organic resin is too small, which makes it difficult to mix the core-shell structure powder. As for the dielectric film formed by the Ti-ST core-shell structure, at room temperature and 1 MHz, as the solid content of the powder of the Ti-ST core-shell structure increases, the dielectric constant increases. When the solid content of the structure powder is 64 ~ 84vol%, the dielectric constant K is stably maintained between 300 ~ 400.

第12 1238026 膜層於有機基板上之附著性’亦因為過多之殘留孔隙,造 成介電常數大幅降低。 請參閱第5圖’對Ag-ST核殼結構介電膜層而言,在室 溫、1 MHz下,隨著Ag-ST核殼結構粉體固含量之增加,介 電常數隨之增加’當A g - S T核殼結構粉體固含量在5 〇〜 7Ovol%,介電常數κ穩定的維持在3 〇〇左右,其介電損失 tan 6則小於7%。當Ag-ST核殼結構粉體固含量在π〜、 82v〇U,介電常數及介電損失則極劇上升,出現類似滲透No. 12 1238026 The adhesion of the film layer on the organic substrate is also caused by the excessive residual pores, which causes the dielectric constant to be greatly reduced. Please refer to Figure 5 'For the Ag-ST core-shell structure dielectric film layer, at room temperature and 1 MHz, as the solid content of the Ag-ST core-shell structure powder increases, the dielectric constant increases accordingly' When the solid content of the powder of Ag-ST core-shell structure is between 50 and 70 vol%, the dielectric constant κ is stably maintained at about 3,000, and its dielectric loss tan 6 is less than 7%. When the solid content of Ag-ST core-shell structure powder is between π ~ and 82v〇U, the dielectric constant and dielectric loss increase sharply, and similar penetration occurs.

之機制’而在高於滲透粉體固含量之後,其介電特性極速 衰減。 、 請參閱第6圖,顯示在Ti-ST與Ag-ST各自介電特性穩 定區内,典型的電容溫度係數TCC (temperature " coefficient of capacitance,即電容之溫度穩定性), 不論ΤΠ-ST核殼結構之介電膜層或Ag — ST核殼結構之介電膜 層j,其電容溫度係數都在1%之範圍内。 'Mechanism 'and its dielectric properties decay rapidly after being higher than the solid content of the osmotic powder. Please refer to Figure 6, which shows the typical capacitance temperature coefficient TCC (temperature " coefficient of capacitance) in Ti-ST and Ag-ST dielectric stability regions, regardless of ΤΠ-ST The dielectric film layer of the core-shell structure or the dielectric film layer of the Ag-ST core-shell structure has a capacitance temperature coefficient in the range of 1%. '

如第7圖所示,對於頻率的介電特性變化,亦可得到 在1 MHz頻率以下,Ti-ST核殼結構介電膜層之介電常數κ大 於400,大於1MHz頻率時,介電常數κ約維持4〇〇。低於 1 MHz頻率以下時,Ag-ST核殼結構介電膜層之介電常數κ大 於2 0 0,大於1MHz頻率,介電常數κ約維持2〇〇。 所以’由第4至7圖可知’核殼結構的介電膜層可以提 供寬範圍之粉體固含量作為調整,並能維持於高介電常 數。粉體固含量可調整範圍在45〜9 Ovol%時,ιΜΗζ下之介 電常數K為2 0 0以上;較佳的粉體固含量可調整範圍在As shown in Figure 7, the dielectric properties of the frequency can also be obtained below 1 MHz. The dielectric constant κ of the Ti-ST core-shell structure dielectric film is greater than 400, and the dielectric constant is greater than 1 MHz. κ is maintained at about 400. When the frequency is lower than 1 MHz, the dielectric constant κ of the Ag-ST core-shell structure dielectric film layer is larger than 200, and when the frequency is higher than 1 MHz, the dielectric constant κ is maintained at about 200. Therefore, as can be seen from Figs. 4 to 7, the dielectric film layer of the core-shell structure can provide a wide range of powder solid content for adjustment, and can be maintained at a high dielectric constant. When the adjustable range of powder solid content is 45 ~ 9 Ovol%, the dielectric constant K at ιΜΗζ is more than 200; the adjustable range of preferred powder solid content is

第13頁 1238026Page 13 1238026

五、發明說明(9) 84νο1%,1ΜΗζ下之介雷♦虹从。 1MHz頻率以下時,核咬 二以上。換言之,低於 敕餘it!夕雪六、w命/ 〇。再者,在任一粉體固含量可調 正耗圍之電合〉皿度係數維持在丨%。 以下說明本發明之第二較佳實施例。 €首3 7用’合膠/旋膠法將Zr、Ti前軀物(例如丙醇锆、 乙知鈦:%鹽),有效包覆於100〜2 0 0nm粒徑之鈦酸鋇基 Y5P BaTl〇3);丨電顆粒’形成核殼結構之粉體,如附件之 圖一A、B 〇 將此核破結構粉體分散在易揮發溶劑(如酒精)中, 使用旋轉塗佈方式披鍍在有機基板,如pCB基板上。 經小於2 5 0 C烘乾爐乾燥附著後,接著以以心⑴準分子雷射 40〜^50mJ/cm2之雷射能量密度,5〜2〇Hz脈衝(puise)頻 率範圍’退火及緻密化該核殼結構介電膜層;重複彼鍍及 退火卜4層,2〜3層之典型膜厚將小於2 m,如附件之圖一c 所示。 利用248nm準分子雷射能量照射後,Ti前軀物包覆之 膜層以65mJ/cm2雷射能量密度退火Y5P_Ti核殼膜層所得之 介電常數在1 MHz頻率量測下約23 0,介電損失小於5%。 請參閱第8、9圖,Z r前軀物包覆之介電膜層,以 12 5mJ/cm2之雷射能量密度緻密化,在i〇z量測下γ5ρ預結 晶粉粒舆Zr前軀體體積比(v〇l% ) 1 ·· 2 ( Y5P : Zr-ge 1 = 1 : 2 )之核殼結構粉體之介電膜層,可得介電常數約2 2 〇, 介電損失小於1· 5%。而Υ5Ρ預結晶粉粒與Zr前軀體體積比V. Description of the invention (9) 84νο1%, Jiu Lei under 1MΗζ Honghong. When the frequency is below 1MHz, the nuclear bite is two or more. In other words, it is lower than it 余 it! 夕 雪 六 、 w 命 / 〇. Furthermore, the coefficient of solid content of any powder with adjustable solid content is maintained at 丨%. The second preferred embodiment of the present invention will be described below. € 37. The Zr and Ti precursors (such as zirconium propoxide, ethidinium:% salt) are effectively coated with barium titanate-based Y5P with a particle size of 100 ~ 200 nm by the 'gluing / spinning method'. BaTl03); 丨 Electric particles' form a core-shell structure powder, as shown in Figure 1A and B of the attachment. This core-breaking structure powder is dispersed in a volatile solvent (such as alcohol). Plated on an organic substrate, such as a pCB substrate. After drying and attaching in a drying furnace with a temperature of less than 250 ° C, the annealing and densification are performed with a laser energy density of 40 ~ ^ 50mJ / cm2 with a cardiac excimer laser and a pulse frequency range of 5 ~ 20Hz. The core-shell structure dielectric film layer; repeating the plating and annealing of 4 layers, the typical film thickness of 2 ~ 3 layers will be less than 2 m, as shown in Figure 1c of the annex. After irradiating with 248nm excimer laser energy, the dielectric layer obtained by annealing the Y5P_Ti core-shell film layer at a laser energy density of 65mJ / cm2 at a laser energy density of 65mJ / cm2, the dielectric constant is about 23 0 at a frequency of 1 MHz. Electricity loss is less than 5%. Please refer to Figures 8 and 9. The dielectric film layer covered by the Zr precursor is densified with a laser energy density of 125mJ / cm2, and the γ5ρ pre-crystallized powder and the Zr precursor are measured at iOz. The dielectric film layer of the core-shell structure powder with a volume ratio (v〇l%) of 1 ·· 2 (Y5P: Zr-ge 1 = 1: 2) can obtain a dielectric constant of about 2 2 0, and the dielectric loss is less than 1.5%. The volume ratio of Y5P pre-crystallized powder to Zr precursor

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五、發明說明(10) 膜層,可得 殼結構之粉 卜3 (Y5P:Zr-gel = l:3)核殼結構粉體之介電 介電常數約450,介電損失小於2· 5%。此種核 體所得電容溫度係數亦在1 %左右。 ^ 綜合上述,本發明利用 形成之介電膜層,具有較寬 數及低電容溫度係數、低# 低耐受溫度之基板。 核殼結構之粉體於有機基板上 之固含量調整範圍、高介電常 電損失,其製程可適用於相對 以上所述者,僅為 以限定本發明實施之範 後,所據以修改替換者 創作。V. Description of the invention (10) The film layer can be obtained as powder 3 of the shell structure (Y5P: Zr-gel = 1: 3) The core-shell structure powder has a dielectric constant of about 450 and a dielectric loss of less than 2.5. %. The temperature coefficient of the capacitance obtained by such a core is also about 1%. ^ In summary, the dielectric film layer formed by the present invention has a substrate with a wide number, a low capacitance temperature coefficient, and a low # low withstand temperature. The adjustment range of the solid content of the core-shell structure powder on the organic substrate and the high dielectric constant loss can be applied to the processes described above, only to limit the scope of the present invention, and to modify and replace it. Creator.

本發明較佳之實施例而已,並非用 圍’熟習此技藝者經本發明之揭露 ,均屬基於本發明技術思想之衍生 因此,在不脫離本發明之技術思想範圍下所作之均等 變化與修飾’皆應涵蓋於本發明之申請專利範圍内。It is only the preferred embodiment of the present invention. It is not intended to be used by those skilled in the art. The disclosure of the present invention is based on the technical ideas of the present invention. Therefore, the same changes and modifications can be made without departing from the scope of the technical ideas of the present invention. It should be covered by the scope of patent application of the present invention.

1238026 圖式簡單說明 一第1圖係本發明核殼結構功能膜與先前技術之比較, 顯示在不同顆粒組成含量(體積百分比)下的介電 現; π蚁衣 第2圖係本發明高介電膜層製造方法之主要流程圖· 第3A-3D圖係本發明於有機基板上形成高介電膜層鱼 ΜΙΜ結構之製造流程圖; /、 第4圖係顯示本發明第一較佳實施例中,於室溫、 ΜΗ:下Tl ^固含里對核-设結構形成之介電膜層的介電 特性變化; ^丨电 第5圖係顯示本發明第一較佳實施例中,於室溫、 ^ Ag ST固含里對核—设結構形成之介電膜層的介電 特性變化; ^丨电 弟6圖係顯示本發明第一較佳實施例中 電容溫度係數變化; θ ^ 圖係顯示本發明第一較佳實施例中,介電膜層之 )丨電特性對頻率之變化; 衝^==示本發明第二較佳實施例中,雷射退火脈 Η員:對Υ5Ρ介電顆粒包覆不同訐前軀膠體殼層比率,在 MHz $測下介電膜層之介電常數變化;及 =9圖係顯示本發明第二較佳實施例中,雷射退火脈 1ΜΗζί Ρ介電顆粒包覆不同訏前軀膠體殼層比率,在 ΜΗζ置測下介電膜層之介電損失變化。 以7附τ件=圖一A、B、C顯示本發明第二較佳實施例中, Γ i萷軀物藉由溶膠凝膠法披覆於鈦酸鋇基(γ 5 Ρ )1238026 The diagram briefly illustrates the first diagram. The first diagram is a comparison of the core-shell structure functional film of the present invention with the prior art, showing the dielectric appearance at different particle composition content (volume percentage); The main flowchart of the manufacturing method of the electrical film layer. Figures 3A-3D are manufacturing flowcharts of the present invention for forming a high dielectric film layer MIM structure on an organic substrate. Figure 4 shows the first preferred embodiment of the present invention. In the example, the dielectric properties of the dielectric film layer formed by the T1 ^ solid-core core-set structure at room temperature and ΜΗ: change in the dielectric properties; Figure 5 shows the first preferred embodiment of the present invention. At room temperature, ^ the dielectric characteristics of the dielectric film layer formed by the core-set structure in the Ag ST solid content; Figure 6 shows the change in the capacitance temperature coefficient of the first preferred embodiment of the present invention; θ ^ The figure shows the change in the electrical characteristics of the dielectric film layer in the first preferred embodiment of the present invention versus frequency; ^ == shows the laser annealing pulse member in the second preferred embodiment of the present invention: For 5P dielectric particles coated with different ratios of colloid shells in the precursor, the dielectric was measured at MHz $ The dielectric constant of the layer is changed; and FIG. 9 shows that in the second preferred embodiment of the present invention, the laser annealing vein 1MΗζί is coated with different ratios of the colloid shell layer of the precursor, and the dielectric is measured under the MΗζ measurement. The dielectric loss of the film changes. 7 attachments = Figures A, B, and C show that in the second preferred embodiment of the present invention, the Γ i 萷 body is coated on the barium titanate group (γ 5 ρ) by the sol-gel method.

第16頁 1238026 圖式簡單說明 粉體,所形成核殼結構之粉體,圖一 A為Zr披覆、圖一 B為 Ti披覆,而圖一C則為PCB基板及其介電膜層。 【圖式符號說明】 步驟1 1 0 提供具有核殼結構之複數粉體 。 步驟1 2 0 分散該等粉體至一溶劑中 步驟1 3 0 將該等粉體與溶劑披鍍於一有機基板上以形成 一介電膜層 步驟1 4 0 固化或緻密化該介電膜層Page 16 1238026 The diagram briefly illustrates the powder, the powder with a core-shell structure formed. Figure 1A is a Zr coating, Figure 1B is a Ti coating, and Figure 1C is a PCB substrate and its dielectric film layer. . [Illustration of Symbols] Step 1 1 0 Provide a plurality of powders with a core-shell structure. Step 1 2 0 Disperse the powders in a solvent Step 1 3 0 Spread the powders and solvents on an organic substrate to form a dielectric film layer Step 1 40 Cure or densify the dielectric film Floor

第17頁Page 17

Claims (1)

1238026 六、申請專利範圍 1 · 一種具有高介電膜層之有機基板製造方法,包含以 驟: v 提供具有核殼結構之複數粉體,該核殼結構传莽批 殼材包覆於至少一核材表面; 以複數 分散該等粉體至一溶劑中; 將該等粉體與該溶劑坡鍍於一有機基板上,以形成一 介電膜層;及 固化該介電膜層。1238026 VI. Application Patent Scope 1 · A method for manufacturing an organic substrate with a high dielectric film layer, comprising the steps of: v providing a plurality of powders having a core-shell structure, the core-shell structure transmitting at least one shell material covered with at least one The surface of the core material; dispersing the powders in a solvent in plural; plating the powders and the solvent on an organic substrate to form a dielectric film layer; and curing the dielectric film layer. 2 ·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法,其中該核材為導電金屬。 3 ·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法,其中該核材為鈦或銀。 4·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法,其中該核材為半導性陶瓷。 土 5 ·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法,其中該核材為鹼土族金屬之鈦酸鹽。 6 ·如申请專利範圍第1項所述具有南介電膜層之有機基板 製造方法,其中該核材係選自鈦酸勰、鈦酸鋇或鈦酸鈣的 群組組合。2. The method for manufacturing an organic substrate with a high dielectric film layer as described in item 1 of the scope of the patent application, wherein the core material is a conductive metal. 3. The method for manufacturing an organic substrate having a high dielectric film layer as described in item 1 of the scope of the patent application, wherein the core material is titanium or silver. 4. The method for manufacturing an organic substrate having a high dielectric film layer as described in item 1 of the scope of the patent application, wherein the core material is a semiconductive ceramic. Soil 5 · The method for manufacturing an organic substrate with a high dielectric film layer as described in item 1 of the scope of the patent application, wherein the core material is a titanate of an alkaline earth metal. 6. The method for manufacturing an organic substrate having a south dielectric film layer as described in item 1 of the scope of the patent application, wherein the core material is selected from the group consisting of hafnium titanate, barium titanate, or calcium titanate. 7 ·如申請專利範圍第1項所述具有南介電膜層之有機基板 製造方法,其中該殼材係遂自鈦酸勰、鈦酸鋇或鈦酸鈣的 群組組合。 8 ·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法,其中該殼材係遞自锆氧化物或鈦氧化物的群組7. The method for manufacturing an organic substrate with a south dielectric film layer as described in item 1 of the scope of patent application, wherein the shell material is selected from the group consisting of hafnium titanate, barium titanate, or calcium titanate. 8 · The method for manufacturing an organic substrate with a high dielectric film layer as described in item 1 of the scope of patent application, wherein the shell material is handed over from a group of zirconium oxide or titanium oxide 12380261238026 六、申請專利範圍 組合。 9·如申請專利範圍第丨項所述具有高介電膜層之 製造方法,其中該等粉體之彼鍍步驟係採用旋轉塗板 刷技術。 我P 10·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法,其中該介電膜層係成形於該有機基板之一 ς底 電極(Cu electr〇de )上。 一 U ·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法,其中更包含濺鍍一金屬電極於該介電膜層上, 以形成一金屬-絕緣膜-金屬結構之步驟。 1 2 ·如申請專利範圍第丨丨項所述具有高介電膜層之有機基 板製造方法,其中濺鐘之該金屬電極為金電極。 1 3 ·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法’其中該有機基板係可為印刷電路板’或者為石夕 基板或玻璃基板或可挽性基板所取代。 1 4 ·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法,其中該介電膜層之固化步驟係使用雷射退火 (annealing)方式,以緻密化該介電膜層。 1 5 ·如申請專利範圍第丨4項所述具有高介電膜層之有機基 板製造方法’其中該雷射退火程序中,較佳的雷射源為準 分子雷射。 1 6 ·如申請專利範圍第丨5項所述具有高介電膜層之有機基 板製造方法’其中該雷射退火程序中,雷射能量密度為4 〇 〜l5〇mJ/cm2 ’脈衝頻率為5~15Hz。 1238026 六、申請專利範圍 1 7·如申請專利範圍第1所述具有高介電膜層 剩、&七& β丄 _ π哉基板 衣la方法,其中該等粉體係選自完整包覆之該核殼妹構、 部份包覆之該核殼結構,與該殼材之奈米級粉體的君^組組 ° 18.如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法,其中該等粉體係使用溶液化學法製作。土 1 9.如申請專利範圍第1項所述具有高介電膜層之有機某板 製造方法,其中該等粉體之製造方法係選自水熱法、= 還原法與溶膠凝膠法之群祖組合。 2::二:青專甘利/目第1項所述具有高介電膜層 < 有機基板 製以方法,其中該等粉體之固含量在45〜9〇V〇U時,兮八 電膜層之介電常數K高於2〇〇。 μ ;1 21,如申請專利範圍第丨項所述具有高介電膜層之有機基板 製造方法,其中該等粉體較佳之粉體固含量在64〜 土 84vol%,該介電膜層之介電常數κ為3 0 0以上。 22·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法’其中該等粉體之固含量於可調整範圍時,該介 電膜層之電容溫度係數(temperature c〇efficient 〇f capacitance)位於 1% 之間。 2 3 ·如申請專利範圍第丨項所述具有高介電膜層之有機基板 製造方法’其中該介電膜層之介電常數K大於2 00,最大之 介電常數大於40 0。 24·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法’其中該有機高分子係為環氧樹脂或丙烯酸樹脂6. Scope of Patent Application Combination. 9. The manufacturing method with a high dielectric film layer as described in item 丨 of the scope of the patent application, wherein the powder plating step is performed by a spin coating brush technique. P10. The method for manufacturing an organic substrate with a high dielectric film layer as described in item 1 of the scope of the patent application, wherein the dielectric film layer is formed on a bottom electrode (Cu electrode) of the organic substrate. A U. The method for manufacturing an organic substrate with a high dielectric film layer as described in item 1 of the scope of the patent application, further comprising sputtering a metal electrode on the dielectric film layer to form a metal-insulating film-metal structure. The steps. 1 2 · The method for manufacturing an organic substrate with a high dielectric film layer as described in item 丨 丨 of the patent application scope, wherein the metal electrode of the splash clock is a gold electrode. 1 3 · The method for manufacturing an organic substrate with a high dielectric film layer as described in item 1 of the scope of the patent application 'wherein the organic substrate may be a printed circuit board' or replaced by a Shi Xi substrate or a glass substrate or a reversible substrate . 1 4 · The method for manufacturing an organic substrate having a high dielectric film layer as described in item 1 of the scope of the patent application, wherein the curing step of the dielectric film layer uses laser annealing to densify the dielectric film Floor. 1 5 · The method for manufacturing an organic substrate having a high dielectric film layer as described in item 4 of the scope of the patent application, wherein in the laser annealing process, a preferred laser source is an excimer laser. 1 6 · The method for manufacturing an organic substrate with a high dielectric film layer as described in item 5 of the scope of the patent application 'wherein the laser annealing process, the laser energy density is 4 0 ~ 15 mJ / cm2' The pulse frequency is 5 ~ 15Hz. 1238026 VI. Scope of patent application 1 7. As described in the scope of patent application No. 1 with a high dielectric film layer remaining, & seven & β 丄 _π 哉 substrate coating la method, wherein the powder system is selected from complete coating The core-shell structure, the partially-coated core-shell structure, and the nano-grade powder of the shell material. ° 18. Has a high dielectric film layer as described in item 1 of the scope of patent applications An organic substrate manufacturing method, wherein the powder system is made using a solution chemistry method. Soil 1 9. The manufacturing method of a certain organic plate with a high dielectric film layer as described in item 1 of the scope of the patent application, wherein the manufacturing method of these powders is selected from hydrothermal method, = reduction method and sol-gel method. Group of ancestors. 2 :: 2: Qingzhan Ganli / Item 1 with a high dielectric film layer < organic substrate manufacturing method, wherein the solid content of these powders is 45 ~ 90V〇U, Xibaden The dielectric constant K of the film is higher than 200. μ; 1 21, as described in the method of the patent application for the organic substrate manufacturing method with a high dielectric film layer, wherein the preferred powder solids content of the powder is 64 ~ 84vol%, the dielectric film layer The dielectric constant κ is 300 or more. 22. The method for manufacturing an organic substrate with a high dielectric film layer as described in item 1 of the scope of the patent application, wherein when the solid content of the powders is within an adjustable range, the temperature coefficient of the capacitance of the dielectric film layer efficient 〇f capacitance) is between 1%. 2 3 · The method for manufacturing an organic substrate having a high dielectric film layer as described in item 丨 of the scope of the patent application, wherein the dielectric constant K of the dielectric film layer is greater than 2000, and the maximum dielectric constant is greater than 400. 24. The method for manufacturing an organic substrate having a high dielectric film layer as described in item 1 of the scope of the patent application, wherein the organic polymer is an epoxy resin or an acrylic resin 第20頁 1238026 六、申請專利範圍 *- 或其相似者。 2 5·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法,其中該溶劑係選自水、酒精或其群組的組合。 T·如申請專利範圍第1項所述具有高介電膜層之有機基板 製造方法,其中該殼材之尺寸為奈米尺度,該核材之尺寸 則為奈米到微米尺度。 2 7· —種具有核殼結構之粉體,用以於一有機基板上形成 一介電膜層,該粉體包含·· 至少一核材,選自導電金屬或半導性陶瓷之群組植 合;及 ' °Page 20 1238026 6. Scope of patent application *-or similar. 25. The method for manufacturing an organic substrate with a high dielectric film layer as described in item 1 of the scope of the patent application, wherein the solvent is selected from the group consisting of water, alcohol, or a group thereof. T. The method for manufacturing an organic substrate with a high dielectric film layer as described in item 1 of the scope of the patent application, wherein the size of the shell material is on the nanometer scale, and the size of the core material is on the nanometer to micrometer scale. 2 7 · —A powder with a core-shell structure for forming a dielectric film layer on an organic substrate. The powder contains at least one core material selected from the group of conductive metals or semi-conductive ceramics Planting; and '° 複數殼材,包覆於該核材表面,為介電陶瓷材料。 2 8.如申請專利範圍第27項所述具有核殼結構之粉體,其 中該核材為鈦或銀。 〃 2 9.如申請專利範圍第27項所述具有核殼結構之粉體,其 中該核材為鹼土族金屬之鈦酸鹽。 3 0 ·如申請專利範圍第2 7項所述具有核殼結構之粉體,其 中該核材係選自鈦酸勰、鈦酸鋇或鈦酸鈣的群組組合。 3 1 ·如申請專利範圍第2 6項所述具有核殼結構之粉體,其 中該殼材係選自鈦酸魏、鈦酸鋇或鈦酸舞的群組組合。A plurality of shell materials are coated on the surface of the core material and are made of a dielectric ceramic material. 2 8. The powder with a core-shell structure as described in item 27 of the scope of patent application, wherein the core material is titanium or silver. 〃 2 9. The powder with a core-shell structure as described in item 27 of the scope of the patent application, wherein the core material is a titanate of an alkaline earth metal. 30. The powder having a core-shell structure according to item 27 in the scope of the patent application, wherein the core material is selected from the group consisting of scandium titanate, barium titanate, or calcium titanate. 3 1 · The powder with a core-shell structure as described in item 26 of the scope of the patent application, wherein the shell material is selected from the group consisting of Wei titanate, barium titanate, or titanate dance. 3 2·如申請專利範圍第27項所述具有核殼結構之粉體,其 中該殼材係選自錯氧化物或欽氧化物的群組組合。 3 3.如申請專利範圍第2 7項所述具有核殼結構之粉體,其 中该有機基板係可為印刷電路板’或者為;g夕基板或玻璃基 板或可撓性基板所取代。3 2. The powder with a core-shell structure as described in item 27 of the scope of the patent application, wherein the shell material is selected from the group consisting of a complex oxide or an oxide. 3 3. The powder with a core-shell structure as described in item 27 of the scope of the patent application, wherein the organic substrate may be a printed circuit board 'or be replaced by a substrate or a glass substrate or a flexible substrate. 第21頁 1238026 六、申請專利範圍 34·如申請專利範圍第27項所述具有核殼結構之粉體,其 中該等粉體係使用溶液化學法製作。 3 5 ·如申請專利範圍第2 7項所述具有核殼結構之粉體,其 中該等粉體之製造方法係選自水熱法、氧化還原法與溶膠 凝膠法之群組組合。 3 6 ·如申請專利範圍第2 7項所述具有核殼結構之粉體,其 中該殼材之尺寸為奈米尺度,該核材之尺寸則為奈米到微 米尺度。 ; 37. —種具有高介/電膜層之有機基板,包含: 一有機基板; 至少一電極,位於該有機基板表面;及 一介電膜層,彼鍍於該有機基板之該電極表面,其包 含具有核殼結構之複數粉體,該核殼結構係以複數殼材包 覆於至少一核材表面; ^ 其中,該核材係選自導電金屬或半導性陶瓷或介電陶 竞之群組組合,該殼材則為介電陶瓷材料。 3 8 ·如申請專利範圍第3 7項所述高介電膜層之有機基板, 其中該核材為鈦或銀。 3 9 ·如申請專利範圍第3 7項所述高介電膜層之有機基板, 其中該核材係選自鈦酸勰、鈦酸鋇或鈦酸鈣的群組組合。 4〇·如申請專利範圍第37項所述高介電膜層之有機基板, 其中该殼材係選自鈦酸勰、欽酸鋇或鈦酸鈣的群組組合。 41 ·如申請專利範圍第3 7項所述高介電膜層之有機基板, 其中該殼材係選自锆氧化物或鈦氧化物的群組組合。Page 21 1238026 6. Scope of patent application 34. The powder with core-shell structure as described in item 27 of the scope of patent application, in which the powder system is made by solution chemistry. 3 5 · The powders with core-shell structure as described in item 27 of the scope of patent application, wherein the manufacturing method of these powders is selected from the group combination of hydrothermal method, redox method and sol-gel method. 36. The powder with a core-shell structure as described in item 27 of the scope of the patent application, wherein the size of the shell material is nanometer scale, and the size of the core material is nanometer to micrometer scale. 37. An organic substrate having a high dielectric / dielectric film layer, comprising: an organic substrate; at least one electrode on the surface of the organic substrate; and a dielectric film layer plated on the electrode surface of the organic substrate, It comprises a plurality of powders having a core-shell structure, and the core-shell structure is covered with a plurality of shell materials on the surface of at least one core material; ^ wherein the core material is selected from conductive metals or semi-conductive ceramics or dielectric ceramics Group, the shell material is a dielectric ceramic material. 38. The organic substrate with a high dielectric film layer as described in item 37 of the scope of patent application, wherein the core material is titanium or silver. 39. The organic substrate with a high dielectric film layer according to item 37 of the scope of the patent application, wherein the core material is selected from the group consisting of scandium titanate, barium titanate, or calcium titanate. 40. The organic substrate with a high dielectric film layer as described in item 37 of the scope of the patent application, wherein the shell material is selected from the group consisting of scandium titanate, barium octoate, or calcium titanate. 41. The organic substrate with a high dielectric film layer as described in item 37 of the scope of patent application, wherein the shell material is selected from the group consisting of zirconium oxide or titanium oxide. 12380261238026 : ^請專利範圍第37項所述高介電膜層之有機基板, ’、"亥電極係為一銅電極(Cu electrode)或金電極。 4 3 ·如申请專利範圍第3 7項所述高介電膜層之有機基板, 其中更包含一金屬電極濺鍍於該介電膜層上,而 屬-絕緣膜-金屬結構。 “ 44·如申請專利範圍第43項所述高介電膜層之有機基板, 其中濺鍍之該金屬電極為金電極。 4 5 ·如申请專利範圍第3 7項所述咼介電膜層之有機其板, 其中该有機基板係可為印刷電路板’或者為石夕基板或玻璃 基板或可撓性基板所取代。 4 6.如申請專利範圍第37項所述高介電膜層之有機基板, 其中該等粉體係選自完整包覆之該核殼結構、部份包覆之 該核殼結構,與該殼材之奈米級粉體的群組組合。4 47·如申請專利範圍第37項所述高介電膜層之有機基板, 其中該殼材之尺寸為奈米尺度’該核材之尺寸則為奈米到 微米尺度。: ^ Please refer to the organic substrate of high dielectric film layer described in item 37 of the patent scope, and the " Hai electrode is a copper electrode or a gold electrode. 43. The organic substrate with a high dielectric film layer as described in item 37 of the scope of the patent application, further comprising a metal electrode sputtered on the dielectric film layer, which belongs to an insulating film-metal structure. "44 · The organic substrate with a high dielectric film layer as described in item 43 of the scope of patent application, wherein the metal electrode sputtered is a gold electrode. 4 5 · The dielectric film layer as described in item 37 of the scope of patent application The organic substrate, wherein the organic substrate may be a printed circuit board, or may be replaced by a stone substrate, a glass substrate, or a flexible substrate. 4 6. The high-dielectric film layer described in item 37 of the scope of patent application Organic substrate, in which the powder system is selected from the group consisting of the core-shell structure that is completely coated, the core-shell structure that is partially coated, and the nano-grade powder of the shell material. 4 47. If you apply for a patent The organic substrate of the high dielectric film layer described in item 37, wherein the size of the shell material is nanometer scale, and the size of the core material is nanometer to micrometer scale. 第23頁Page 23
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