TW200522809A - Structure and fabricating method of a high-dielectric film formed on an organic substrate - Google Patents
Structure and fabricating method of a high-dielectric film formed on an organic substrate Download PDFInfo
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- TW200522809A TW200522809A TW92136335A TW92136335A TW200522809A TW 200522809 A TW200522809 A TW 200522809A TW 92136335 A TW92136335 A TW 92136335A TW 92136335 A TW92136335 A TW 92136335A TW 200522809 A TW200522809 A TW 200522809A
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- 239000000758 substrate Substances 0.000 title claims abstract description 79
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- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 12
- 229910002113 barium titanate Inorganic materials 0.000 claims description 9
- 229910052709 silver Inorganic materials 0.000 claims description 9
- 239000004332 silver Substances 0.000 claims description 9
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 8
- 239000010936 titanium Substances 0.000 claims description 8
- 239000010949 copper Substances 0.000 claims description 6
- 239000010931 gold Substances 0.000 claims description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 4
- 229910052737 gold Inorganic materials 0.000 claims description 4
- 238000000576 coating method Methods 0.000 claims description 3
- 239000003822 epoxy resin Substances 0.000 claims description 3
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- 229920000647 polyepoxide Polymers 0.000 claims description 3
- 238000003980 solgel method Methods 0.000 claims description 3
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- 229910052719 titanium Inorganic materials 0.000 claims description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 2
- 239000011248 coating agent Substances 0.000 claims description 2
- 238000001027 hydrothermal synthesis Methods 0.000 claims description 2
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- WEUCVIBPSSMHJG-UHFFFAOYSA-N calcium titanate Chemical compound [O-2].[O-2].[O-2].[Ca+2].[Ti+4] WEUCVIBPSSMHJG-UHFFFAOYSA-N 0.000 claims 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 3
- 239000011521 glass Substances 0.000 claims 3
- 229910052710 silicon Inorganic materials 0.000 claims 3
- 239000010703 silicon Substances 0.000 claims 3
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims 2
- 229910010293 ceramic material Inorganic materials 0.000 claims 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims 2
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 claims 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims 1
- ZSLUVFAKFWKJRC-IGMARMGPSA-N 232Th Chemical compound [232Th] ZSLUVFAKFWKJRC-IGMARMGPSA-N 0.000 claims 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 claims 1
- 229910052776 Thorium Inorganic materials 0.000 claims 1
- 239000002253 acid Substances 0.000 claims 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 claims 1
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- 229910052744 lithium Inorganic materials 0.000 claims 1
- 150000002739 metals Chemical group 0.000 claims 1
- 239000011824 nuclear material Substances 0.000 claims 1
- 150000007530 organic bases Chemical class 0.000 claims 1
- 229920000620 organic polymer Polymers 0.000 claims 1
- 150000002907 osmium Chemical class 0.000 claims 1
- 229910052762 osmium Inorganic materials 0.000 claims 1
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 claims 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 claims 1
- 239000004065 semiconductor Chemical group 0.000 claims 1
- 239000002689 soil Substances 0.000 claims 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims 1
- 239000011787 zinc oxide Substances 0.000 claims 1
- 229910001928 zirconium oxide Inorganic materials 0.000 claims 1
- 238000000280 densification Methods 0.000 abstract description 3
- 239000002245 particle Substances 0.000 description 15
- 238000005516 engineering process Methods 0.000 description 8
- 239000002243 precursor Substances 0.000 description 7
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 6
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- SJECZPVISLOESU-UHFFFAOYSA-N 3-trimethoxysilylpropan-1-amine Chemical compound CO[Si](OC)(OC)CCCN SJECZPVISLOESU-UHFFFAOYSA-N 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 229910002699 Ag–S Inorganic materials 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 241000283973 Oryctolagus cuniculus Species 0.000 description 1
- 229910052778 Plutonium Inorganic materials 0.000 description 1
- LCKIEQZJEYYRIY-UHFFFAOYSA-N Titanium ion Chemical compound [Ti+4] LCKIEQZJEYYRIY-UHFFFAOYSA-N 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
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- 239000003989 dielectric material Substances 0.000 description 1
- NKZSPGSOXYXWQA-UHFFFAOYSA-N dioxido(oxo)titanium;lead(2+) Chemical compound [Pb+2].[O-][Ti]([O-])=O NKZSPGSOXYXWQA-UHFFFAOYSA-N 0.000 description 1
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- OYEHPCDNVJXUIW-UHFFFAOYSA-N plutonium atom Chemical compound [Pu] OYEHPCDNVJXUIW-UHFFFAOYSA-N 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229910052573 porcelain Inorganic materials 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
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- VEALVRVVWBQVSL-UHFFFAOYSA-N strontium titanate Chemical compound [Sr+2].[O-][Ti]([O-])=O VEALVRVVWBQVSL-UHFFFAOYSA-N 0.000 description 1
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- Inorganic Insulating Materials (AREA)
- Ceramic Capacitors (AREA)
Abstract
Description
200522809200522809
【發明所屬之技術領域】 f發明係關於一種於一基板上法’ 米教+所抑士、 士較低之溫度條件下,利用高介電帙,、 :美柘F : Ϊ之金屬—陶瓷或陶瓷,瓷之核殼結構顆辑Jr 本土板形成具有高介電常數之介電膜層的結構及製造方 法0 【先前技術】 西孩#子構裝系統之高密度集積化、小型化,為發展之主 ’不僅電路功能密度增加,獨立被動電子元件更進 而佔據80%的電路面積,元件的小型化與多功能化已勢在[Technical field to which the invention belongs] The f invention relates to a method of using a high dielectric dielectric 'on a substrate,' Mijiao '+ 抑 抑, and, at a relatively low temperature,:: 柘 柘 F: Ϊ 的 金属 — 陶瓷Or ceramic, porcelain core-shell structure series Jr Native plate structure and manufacturing method of forming a dielectric film layer with a high dielectric constant 0 [Previous technology] High density integration and miniaturization of Xihai #substructure system, For the master of development, not only does the circuit's functional density increase, but independent passive electronic components take up 80% of the circuit area, and the miniaturization and multifunctionalization of components are already underway.
Ik著製造技術的進步,被動電子元件達到的小型化程 , 已小到不易刼控的尺寸;而且,使用傳統表面黏著技 =(SMT )將兀件結合到基板(印刷電路板)之方式,常 導致寄生效應、低可靠度及佔面積之結果。現有技術中, 另有將多數個元件組裝製作在一起,形成不同元件功能的 陣列(Array)產品;這些陣列產品隨製造技術進步,整個 陣列元件的密度也持續增加,同樣產生前述寄生效應、低 可靠度及佔面積之缺點。 於是’為了縮小元件佔據電路的面積,使用埋入方式 或整合到基板外表面的技術,便成為一般電子構裝常用的 方法,此乃因埋入被動元件之製程,具有不需獨立連接線 連到基板、可增進電氣功能、降低成本且製程容易等優 點。Ik is advancing the manufacturing technology. The miniaturization process of passive electronic components has been reduced to a size that is not easy to control. Moreover, the traditional surface adhesion technology = (SMT) is used to bond the components to the substrate (printed circuit board). Often results in parasitic effects, low reliability, and footprint. In the prior art, a plurality of components are assembled and manufactured to form array products with different component functions. With the advancement of manufacturing technology for these array products, the density of the entire array component also continues to increase, which also produces the aforementioned parasitic effect and low Disadvantages of reliability and area. Therefore, in order to reduce the area occupied by the component, the embedded method or the technology integrated on the outer surface of the substrate has become a common method for electronic assembly. This is because the process of embedding passive components has no need for independent connection wires To the substrate, it can improve electrical functions, reduce costs, and make processes easy.
第6頁 200522809 五、發明說明(2) 目前’有兩種製造高介電混成膜層的方法,一為基於 滲透(percolation)原理的導體-絕緣基材複合膜層;另一 則為基於隨機的介電材料混合理論,混合絕緣基材(高分 子)與高介電常數之無機材料(陶瓷)。 導體-絕緣基材複合膜又稱為導體-無機複材,根據 C.P· Wong 等人的研究(Y· Roa,C.P· Wong,” A Novel Ultra High Dielectric Constant Epoxy Silver Composite for Embedded Capacitor Application”, IEEE 8th International Symposium on AdvancedPage 6 200522809 V. Description of the invention (2) At present, there are two methods for manufacturing a high-dielectric mixed film layer, one is a conductor-insulating substrate composite film layer based on the principle of percolation; the other is based on random Dielectric material mixing theory, mixing insulating substrate (polymer) with high dielectric constant inorganic material (ceramic). Conductor-insulating substrate composite film is also called conductor-inorganic composite material, according to the research of CP · Wong et al. (Y · Roa, CP · Wong, "A Novel Ultra High Dielectric Constant Epoxy Silver Composite for Embedded Capacitor Application", IEEE 8th International Symposium on Advanced
Packaging Materials,p· 2 48 ( 2 0 0 2)),以片狀銀混合環 氧樹月曰’在11.23 vol% (體積百分比)的片狀銀混合含量 下’可得到介電常數高達κ= 1 0 0 0,介電損失低至tan 5二 1.9%之值,但當其片狀銀含量在ιι·28νο1%時,介電常數 Κ = 1 5 0 0,雖然更進一步上升,但介電損失高達tan 5=15%之 值。 所以,以滲透原理製得之導體—無機複材,欲得到穩 定控制製程之導體含量範圍非常的狹窄,其介電常數與顆 粒組成含i關係之示意圖,如第1圖之曲線「1 ·導體—絕緣 體」所示;其在臨界滲透之導體含量部分,有突升的高介 電常數;但其在很窄的導體含量範圍内,即會因電子跳躍 行為而極速增加漏電情形,產生高介電損失及大幅降低介Packaging Materials, p. 2 48 (2 0 0 2)), mixed with epoxy resin in the form of flaky silver, said that at a flaky silver mixed content of 11.23 vol% (volume percentage), a dielectric constant as high as κ = 1 0 0 0, the dielectric loss is as low as tan 5.2% 1.9%, but when its flake silver content is ι · 28νο1%, the dielectric constant κ = 15 0 0, although it is further increased, but the dielectric The loss is as high as tan 5 = 15%. Therefore, the conductor-inorganic composite material made based on the principle of infiltration has a very narrow range of conductor content for stable control of the process. The schematic diagram of the relationship between the dielectric constant and the particle composition containing i, such as the curve "1 · Conductor in Figure 1" “Insulator”; it has a high dielectric constant that rises in the critically permeable conductor content; but within a narrow range of conductor content, it will increase the leakage situation due to the electron jumping behavior, resulting in a high dielectric constant. Electricity loss and significantly reduced dielectric
200522809 五、發明說明(3) 線「2·高分子-陶瓷體」所示;前人研究包括T· R. J〇w等 人(’’High Dielectric Constant Material Development”,IEEE, 1 9 92 )混合環氧樹脂與錄鈦酸鉛 (PZT )陶瓷顆粒得到高介電常數膜層,而進一步則有 C· P· Wong等人(美國專利US65446 51 )使用鈦酸鋇 (BaTi〇3)及鍅鈦酸鉛(PZT)陶瓷顆粒混合高介電螯合 南ί子,但是,在陶瓷顆粒含量大於85vol%時才得到高介 I f數1 5 0,要得到更高的介電常數通常需增加陶瓷顆粒 ^ 然而,添加咼介電常數陶瓷顆粒之固含量大於 8〇v〇 1 % (體積百分比)以上時,將使膜層變得易脆而增加 f Μ ^組I困難度,因此,高陶瓷顆粒固含量增加混合製 私的:難度,而介電常數也沒有令人滿意的表現。 數内心術中,可以製作成高介電常 形於可“i: 程便利性及穩健性;如欲成 或陶曼與金屬之核殼結構顆粒匕=,即使欲以陶兗 理論上將得到相當高之介:為基礎來形成膜層,雖然 形陶瓷介電膜層有直困難产.社但現有的技術要直接成 Τ氏上千度,而-般基板:表;陶兗的溫度動軏 攝氏100至200度而已,根;^或錫焊製程中,不過 k。 …、去承雙燒結陶瓷的高 【發明内容】 製程本3f欲解決之技術問題,在於先前技P 於基板上形成具有高介電无別技術缺乏穩疋200522809 V. Description of the invention (3) Line "2 · Polymer-Ceramic"; previous studies include T.R. Jow et al. ("High Dielectric Constant Material Development", IEEE, 1 9 92) Epoxy resin and lead titanate (PZT) ceramic particles are mixed to obtain a high dielectric constant film layer. Further, C.P.Wong et al. (US patent US65446 51) use barium titanate (BaTi〇3) and 鍅Lead titanate (PZT) ceramic particles are mixed with high dielectric sequestration, but high dielectric I f number 1 50 is obtained only when the content of ceramic particles is greater than 85 vol%. To obtain a higher dielectric constant, it is usually necessary to increase Ceramic particles ^ However, when the solid content of the ceramic particles with a dielectric constant greater than 80 vol% (volume percentage) is added, the film layer will become brittle and increase the f M ^ group I difficulty. Increase the solid content of ceramic particles: Difficulty, and the dielectric constant does not perform satisfactorily. In the mathematical technique, it can be made into a high dielectric constant shape. "I: process convenience and robustness; if you want Into the core-shell structure particles of Taurman and metal = even if you want to In theory, you will get a very high dielectric: based on the formation of the film layer, although the shape of the ceramic dielectric film layer is difficult to produce. But the existing technology must be directly thousands of degrees, and the general substrate: table; ceramic The temperature of 兖 is only 100 to 200 degrees Celsius, root; ^ or soldering process, but k. …, To support the high sintered ceramics [Content of the invention] The technical problem to be solved in the process 3f is that the prior art has a high dielectric on the substrate, and there is no stable technology.
f 8頁 .兔吊數與低介電損失之介電 200522809 五、發明說明(4) 膜層 繁於以上習知技術的問題,本發明所提供具有高介電 之3基板製造方法,首先提供具有核殼結構之複數 :Ί:丨坫著分散該等粉體至—溶劑中,繼而將該等粉體與 :1 &鍍於一有機基板上以形成一介電膜層,最後則固化 或敏岔化該介電膜層。 M tf:所提供之高介電膜層係使用具有核殼結構之粉 的基板溫度條件下,於有機基板表面形成; 機材二ί=結構之粉體,其核材為金屬或具導電性的無 性:電特性的無機材料,或者,核為高 度係數。’ * ;丨電膜層具有鬲介電常數及低電容溫 外加介電膜層具有高粉體固含量,可利用 卜 此里(如雷射)而加以緻密化。 ϋ 層之粉體固含量可調整範圍在45,塌 於二且在粉體固含量可調整範圍之電容溫度係 另外’外加雷射能量在能量密声 頻率5〜15ΗΖ條件下,可以得到完全^ "fcm與脈衝 ίΚ達;Π常數達似以上,介電:失二 上形成之介電膜層,且有較寬之粉體於有機基板 "及低電容溫度係數有= 介電 且具衣耘可適用於f page 8. The number of rabbits and the dielectric with low dielectric loss 200522809 V. Description of the invention (4) The problem that the film layer is complicated by the above-mentioned conventional technology. Plurality with core-shell structure: Ί: 丨 disperse these powders into a solvent, and then coat the powders with: 1 & on an organic substrate to form a dielectric film layer, and finally cure Or sensitizing the dielectric film layer. M tf: The provided high-dielectric film layer is formed on the surface of an organic substrate under the temperature of a substrate having a powder with a core-shell structure; the second material of the machine is a powder of a structure whose core material is metal or conductive Asexual: inorganic materials with electrical properties, or cores with a height coefficient. ’*; 丨 The dielectric film layer has a high dielectric constant and low capacitance temperature. The added dielectric film layer has a high powder solid content, which can be densified by using a substrate (such as a laser).固 The powder solid content can be adjusted in the range of 45, and the capacitance temperature in the powder solid content can be adjusted. In addition, the laser energy can be completely obtained under the condition of energy dense sound frequency 5 ~ 15〜Z. " fcm and pulse ίκ and Π constants are more than the above, dielectric: the dielectric film layer formed on the second, and there is a wider powder on the organic substrate " and the low capacitance temperature coefficient is = dielectric and has Yi Yun can be applied to
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第ίο頁 200522809 五、發明說明(6) --- 若使用前述之核殼結構粉體,混合分散在溶劑中,再 坡鍍在有機基板上,然後以雷射能量退火(anneaHng ) 以緻密化(densification)該介電膜層,所得介電膜層 之介電常數將如第1圖之曲線「3Β·核殼結構」於固含量曰 lOOvol%之示意點。由第}圖中各曲線之比較,本發明利用 核殼結構粉體所發展之介電膜層,可在較寬之組成固含量 調整範圍下,得到高介電常數,確為一簡易、穩定之製 程。 心 進一步言之,本發明所提供具有高介電膜層之有機基 板製造方法,包含第2圖所示之步驟:首先,提供具有核 殼結構之複數粉體(步驟110 )丨接著,分散該等粉體至 一溶劑中(步驟1 20 ):繼而,將該等粉體與溶劑披鍍於 一有機基板上以形成一介電膜層(步驟13〇);最後,固 化或緻岔化該介電膜層(步驟1 4 〇 )。其中,緻密化程序 可採用雷射退火處理。 以下藉由本發明第一較佳實施例,詳細說明本發明之 技術内容。 首先’使用水熱合成法在1 5 〇〜2 0 0 C條件,以鈦 (Ti )金屬為核材、鈦酸锶(SrTi %,簡稱ST )為殼材, 形成核殼結構之粉體,此粉體定義名稱為Ti—ST。 另外’利用氧化還原法合成奈米級之銀粒子(稱為 nano-Ag) ’再加入藕合劑3-(胺基丙基)三曱氧基矽烷Aps ((3-aminopropyl) trimethoxysilane)使其反應披覆在 奈米級銀粒子表面,形成第一層殼,此反應產物稱為Ag-.P.200522809 V. Description of the invention (6) --- If the aforementioned core-shell structure powder is used, mixed and dispersed in a solvent, then plated on an organic substrate, and then annealed with laser energy (anneaHng) to densify (Densification) The dielectric film layer, and the dielectric constant of the obtained dielectric film layer will be as shown in the curve "3B · core-shell structure" of Fig. 1 at a schematic point where the solid content is 100 vol%. From the comparison of the curves in the figure}, the dielectric film layer developed by the present invention using the core-shell structure powder can obtain a high dielectric constant under a wide range of composition and solid content adjustment, which is indeed a simple and stable The process. Further speaking, the method for manufacturing an organic substrate having a high dielectric film layer provided by the present invention includes the steps shown in FIG. 2: First, a plurality of powders having a core-shell structure are provided (step 110). Then, the powder is dispersed. Equal powder to a solvent (step 1 20): Next, the powder and the solvent are plated on an organic substrate to form a dielectric film layer (step 13); finally, curing or branching the Dielectric film layer (step 14). Among them, the densification procedure can be performed by laser annealing. The technical content of the present invention will be described in detail through the first preferred embodiment of the present invention. First, a hydrothermal synthesis method is used to form a powder with a core-shell structure under the conditions of 150 ° to 2000 ° C. using titanium (Ti) metal as the core material and strontium titanate (SrTi%, ST for short) as the shell material. The definition of this powder is Ti-ST. In addition, 'synthesis of nano-scale silver particles (called nano-Ag) by redox method' is followed by the addition of the coupling agent 3- (aminopropyl) trimethoxysilane Aps ((3-aminopropyl) trimethoxysilane) to make it react Covered on the surface of nano-scale silver particles to form the first shell, the reaction product is called Ag-.
200522809 五、發明說明(7) APS,隨後,再加入錄與鈥之有機醇鹽,與aps在150 °C 進行溶膠凝膠時效反應,藉由藕合劑結合锶離子與鈦離子 形成鈦酸銷第二層殼。而後離心乾燥得到具有核殼粉體結 構之粉體,此類粉體定義名稱為蛇―ST。 將Ti-ST或Ag-ST核殼粉體與丙烯酸樹脂混合擾拌,使 用旋轉塗佈方法披鍍在有機基板(以印刷電路板pcB為 例)之銅電極(Cu electr〇de )上,形成介電膜層,而後 於150 C固化(curing ),如第3A、3B圖;利用具有電極 圖樣之遮罩覆蓋固化之介電膜層,並濺鍍一金屬電極,例 如金電極(Au electrode ),使其與銅底電極形成一金 f 、絕緣膜-金屬之MIM結構,如第3C、3D圖所示;因此, 發明高介電膜層之製造方&,可進-步包含濺鍍另 钍=-电極於该介電膜層上’以形成一金屬—絕緣膜—金屬 、、、°、之步驟。接下來,將以此Μ IΜ結構量測介電特性(介 =1 iV介電損失tan 5)、介電特性隨頻率之穩定性, ^谷之溫度穩定性((C(T)-C(25°C))/(C(25°C) (τ_ )’其中C為電容、τ為溫度)等。 士,=閱第4圖’對Ti_ST核殼結構形成之介電膜層而 ;常='隨著’τ核殼結構粉體固含量之 在64 s 通之立曰加,當Tl_ST核殼結構粉體固含量 4ν〇ι%時,介電常數κ穩定的維持在 =損失t…平均一直都維持在4%左 少,超過9_1%以後則因有機樹脂含量太 使核級“冓粉體混合不易均句,不僅大大降低介電200522809 V. Description of the invention (7) APS, and then add the organic alkoxide which is used to react with aps at 150 ° C for sol-gel aging reaction. The strontium ion and titanium ion are combined with the coupler to form a titanate pin. Two-layer shell. Then, the powder with a core-shell powder structure was obtained by centrifugal drying, and this powder was defined as Snake-ST. The Ti-ST or Ag-ST core-shell powder is mixed with acrylic resin, and it is coated on a copper electrode (Cu electrode) of an organic substrate (using a printed circuit board pcB as an example) by a spin coating method to form The dielectric film layer is then cured at 150 C, as shown in Figures 3A and 3B; the cured dielectric film layer is covered with a mask having an electrode pattern, and a metal electrode is sputtered, such as an Au electrode So that it forms a gold f, insulating film-metal MIM structure with the copper bottom electrode, as shown in Figures 3C and 3D; therefore, the invention of the manufacturing method of the high dielectric film layer & can further include sputtering Another step is the step of forming an electrode on the dielectric film layer to form a metal-insulating film-metal. Next, the dielectric characteristics (dielectric = 1 iV dielectric loss tan 5), dielectric stability with frequency, and temperature stability ((C (T) -C ( 25 ° C)) / (C (25 ° C) (τ_) 'where C is the capacitance and τ is the temperature), etc., == See Figure 4 for the dielectric film layer formed by the Ti_ST core-shell structure; often = 'With the increase of the solid content of the τ core-shell structure powder at 64 s, when the solid content of the Tl_ST core-shell structure powder is 4v%, the dielectric constant κ is stably maintained at the loss t ... The average has been maintained at 4% or less. After 9_1%, the content of organic resin makes the nuclear-grade "plutonium powder difficult to mix, which not only greatly reduces the dielectric.
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膜層於有機基板上之附著性,亦因為 成介電常數大幅降低。 巧、夕之殘留孔隙,造 1參閱第5圖,對Ag-ST核殼結構介電膜層 ▲、1ΜΗζ下,隨著Ag_ST核殼結構粉體固含 。在^ 電常數隨之增加,當Ag_ST核殼結構粉體固含” 70vol% ’介電常數κ穩定的維持在3〇〇左右其八在5% tan 5則小於7%。tAg_ST核殼結構粉體固含量損失 82vol%,介電常數及介電損失則極劇上 ~ … 之機制,而在高於滲透粉體固含量之後,Α :' 衰減。 "電特性極速The adhesion of the film on the organic substrate is also greatly reduced due to the formation of a dielectric constant. Residual pores of Qiao and Xi are made as shown in Fig. 5. For Ag-ST core-shell structure dielectric film ▲, at 1MΗζ, with Ag_ST core-shell structure powder solids. The dielectric constant increases accordingly when the Ag_ST core-shell powder contains "70vol%" and the dielectric constant κ is stably maintained at about 300, which is less than 7% at 5% tan 5. The tAg_ST core-shell powder The body solid content loss is 82 vol%, and the dielectric constant and dielectric loss are extremely dramatic. However, after the solid content of the osmotic powder is exceeded, Α: 'decay. &Quot; Electrical characteristics extremely fast
請參閱第6圖,顯示在Ti-ST與Ag-ST各自介電特性 定區内,典型的電容溫度係數TCC (temperature 思 coefficient 〇f capacitance,即電容之溫度穩定性), 不論Ti-S丁核殼結構之介電膜層或Ag-ST核殼結構之介電膜 層,其電容溫度係數都在1 %之範圍内。 ' 如第7圖所示,對於頻率的介電特性變化,亦可得到 在1 MHz頻率以下,Ti -ST核殼結構介電膜層之介電常數&大 於400,大於1MHz頻率時,介電常數K約維持4〇〇。低於 1Μ Η z頻率以下時,A g - S T核殼結構介電膜層之介電常數&大 於2 00,大於1MHz頻率,介電常數K約維持2〇〇。 所以,由第4至7圖可知,核殼結構的介電膜層可以提 供寬範圍之粉體固含量作為調整,並能維持於高介電常 數。粉體固含量可調整範圍在45〜9 Ονο 1%時,1MHz下之# 電常數K為2 0 0以上;較佳.的粉體固含量可調整範圍在6 4〜Please refer to Figure 6, which shows the typical capacitor temperature coefficient TCC (temperature coefficient 〇f capacitance, that is, the temperature stability of the capacitor) within the respective dielectric characteristics of the Ti-ST and Ag-ST. The dielectric temperature of the core-shell structure or the Ag-ST core-shell structure has a capacitance temperature coefficient in the range of 1%. 'As shown in Fig. 7, for the change of the dielectric characteristics of the frequency, the dielectric constant of the Ti-ST core-shell structure dielectric film & is greater than 400, and the dielectric constant is below 1 MHz. The electric constant K is maintained at about 400. When the frequency is lower than 1M Η z frequency, the dielectric constant of the Ag-S T core-shell structure dielectric film & is greater than 200, and the frequency is greater than 1 MHz, and the dielectric constant K is maintained at about 200. Therefore, from Figures 4 to 7, it can be seen that the dielectric film layer of the core-shell structure can provide a wide range of powder solid content for adjustment, and can be maintained at a high dielectric constant. Adjustable range of powder solid content is 45 ~ 9 Ονο 1%, # electric constant K at 1MHz is more than 2 0 0; better. Adjustable range of powder solid content is 6 4 ~
第13頁 200522809 五、發明說明(9) 84vol%,1MHz下之介雷赍奴& 电吊數為3 0 0以上。換言之,低於 1 MHz頻率以下時,核殼紝捶入;+ « 一 ^9ΛΛ ^ aI极双軋構介電膜層之介電常數K至少大 於2 0 0,較佳則可大於4〇η。田土 丄 ..^ ^ 不—— U〇 再者,在任一粉體固含量可調 以下說明本發明之第二較佳實施例 整範圍之電容溫度係數維持在1% 、r:i = 膠法將ΖΓ、Tl前軀物(例如丙醇錯、 vJH二Tv!,有效包覆於100〜2〇〇1^粒經之鈦酸鎖基 Y5P (BaTl(U介電顆粒’形成核殼結構之粉體,如附件之 圖一A、B 〇 將此核殼結構粉體分散在易揮發溶劑(如酒精)中, 使用旋轉塗佈方式披鍍在有機基板,如PCB基板上。 I小於2 5 0 C烘軋爐乾燥附著後,接著以以以爪準分子雷射 40〜150mJ/cm2之雷射能量密度,5〜2〇Hz脈衝(puise)頻 率範圍,退火及緻密化該核殼結構介電膜層;重複披鍍及 退火1 4層,2〜3層之典型膜厚將小於2 m,如附件之圖一c 所示。 ^利用248nm準分子雷射能量照射後,Ti前軀物包覆之 膜層以65mJ/cm2雷射能量密度退火Y5p_Ti核殼膜層所得之 ,,常數在1MHz頻率量測下約23〇,介電損失小於5%。 請麥閱第8、9圖,Zr前軀物包覆之介電膜層,以 125mJ/cm2之雷射能量密度緻密化,在1MHz量測下γ5ρ預結 晶粉粒與Zr前軀體體積比(v〇1%)i:2 (Y5p:Zr —gel二 H)之核殼結構粉體之介電膜層,可得介電常數約2 2 0, 介電損失小於1· 5%。而γ5Ρ預結晶粉粒與Zr前軀體體積比Page 13 200522809 V. Description of the Invention (9) 84vol%, the number of Leiyinuo & electric cranes at 1MHz is more than 300. In other words, when the frequency is below 1 MHz, the core-shell is intruded; the dielectric constant K of the double-rolled dielectric film layer of + «1 ^ 9 Λ ^ aI is at least greater than 200, and preferably greater than 40 η.田土 丄 .. ^ ^ No—— U〇 Furthermore, the solid content of any powder can be adjusted below. The temperature range of the capacitor in the second preferred embodiment of the present invention is maintained at 1%, r: i = glue method. ZΓ, Tl precursors (such as propanol, vJH and Tv!) Are effectively coated with 100 to 2000 ^ particles of titanium titanate Y5P (BaTl (U dielectric particles' to form a core-shell structure Powder, as shown in Figures A and B of the attachment. This core-shell structure powder is dispersed in a volatile solvent (such as alcohol), and is applied on an organic substrate, such as a PCB substrate, by spin coating. I is less than 2 5 After the 0 C baking furnace is dried and adhered, the core-shell structure is annealed and densified with a laser energy density of 40 to 150 mJ / cm2 with a claw excimer laser and a pulse frequency range of 5 to 20 Hz. Electrical film layer; repeated plating and annealing of 14 layers, typical thickness of 2 ~ 3 layers will be less than 2 m, as shown in Figure 1c of the appendix. ^ Ti precursor after irradiation with 248nm excimer laser energy The coated film is obtained by annealing the Y5p_Ti core-shell film at a laser energy density of 65mJ / cm2. The constant is about 23 ° at a frequency of 1MHz, and the dielectric loss is small. Please refer to Figures 8 and 9 for details. The dielectric film layer covered by the precursor of Zr is densified with a laser energy density of 125mJ / cm2, and the γ5ρ pre-crystallized powder and Zr are measured at 1MHz. Body volume ratio (v〇1%) i: 2 (Y5p: Zr-gel two H) of the core-shell structure powder dielectric film, the dielectric constant is about 2 2 0, the dielectric loss is less than 1.5 %. And the volume ratio of γ5P pre-crystallized powder to Zr precursor
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五、發明說明(ίο) 1:3 (Y5P:Zr-geW:3)核殼結構粉體之介電膜層,可得 介電常數約4 5 0,介電損失小於2 · 5 %。此種核殼結構之粉 體所得電容溫度係數亦在1 %左右。 〃 綜合上述,本發明利用核殼結構之粉體於有機基板上 形成之介電膜層,具有較寬之固含量調整範圍、高介電常 數及低電容溫度係數、低介電損失,其製程可適用於相對 低耐受溫度之基板。 以上所述者’僅為本發明較佳之實施例而已,旅# = 以限定本發明實施之範圍,熟習此技藝者經本發明之揭露 後,所據以修改替換者,均屬基於本發明技術思想t衍生 創作。 因此,在不脫離本發明之技術思想範圍下所作之均r 變化與修飾,皆應涵蓋於本發明之申請專利範園内。V. Description of the Invention (ίο) 1: 3 (Y5P: Zr-geW: 3) The dielectric film layer of the core-shell structure powder can obtain a dielectric constant of about 450 and a dielectric loss of less than 2.5%. The resulting capacitor temperature coefficient of this core-shell structure powder is also around 1%. 〃 In summary, the present invention uses a core-shell structured powder to form a dielectric film layer on an organic substrate, which has a wide range of solid content adjustment, high dielectric constant, low capacitance temperature coefficient, and low dielectric loss. Suitable for substrates with relatively low temperature resistance. The above mentioned are only the preferred embodiments of the present invention. Travel # = To limit the scope of implementation of the present invention. After the person skilled in the art has disclosed the present invention, the modifications and replacements are based on the technical idea of the present invention. t derivative creation. Therefore, all changes and modifications of r made without departing from the scope of the technical idea of the present invention should be covered by the patent application park of the present invention.
200522809 圖式簡單說明 第1圖係本發明核殼結構功能膜與先前技術之比較, 絲頁不在不同顆粒組成含里(體積百分比)下的介電常數表 現; 第2圖係本發明高介電膜層製造方法之主要流程圖; 弟3A-3D圖係本發明於有機基板上形成高介電膜層與 ΜIΜ結構之製造流程圖; 第4圖係顯示本發明第一較佳實施例中,於室溫、 1MHz下,Ti-ST固含量對核-殼結構形成之介電膜層的介電 特性變化; 弟5圖係顯示本發明第一較佳實施例中,於室溫、 1MHz下,Ag-ST固含量對核-殼結構形成之介電膜層的介電 特性變化; ^ 第6圖係顯示本發明第一較佳實施例中,介電膜層之 電各溫度係數變化; 第7圖係顯示本發明第一較佳實施例中,介電膜層之 介電特性對頻率之變化; 第8圖係顯示本發明第二較佳實施例中,雷射退火脈 Μ頻率對Y5P介電顆粒包覆不同Zr前軀膠體殼層比率,在 MHZ,測下介電膜層之介電常數變化;及 ,_ 第9圖係顯示本發明第二較佳實施例中,雷射退火脈 2頌率對Y 5 P介電顆粒包覆不同2 r前軀膠體殼層比率,在 HZ量測下介電膜層之介電損失變化。 ^附件之圖一A、B、C顯示本發明第二較佳實施例中’ 乂。、Ti前軀物藉由溶膠凝膠法坡覆於鈦酸鋇基(Y5P)200522809 Brief description of the diagram. Figure 1 is a comparison of the core-shell structured functional film of the present invention with the prior art. The silk sheet does not show the dielectric constant under different particle compositions (volume percentage). Figure 2 shows the high dielectric of the present invention. The main flow chart of the method for manufacturing the film layer; Figures 3A-3D are the manufacturing flow chart of the present invention for forming a high-dielectric film layer and the MIM structure on an organic substrate; and Figure 4 shows the first preferred embodiment of the present invention. At room temperature and 1 MHz, the solid content of Ti-ST changes the dielectric characteristics of the dielectric film layer formed by the core-shell structure. Figure 5 shows the first preferred embodiment of the present invention at room temperature and 1 MHz. , Ag-ST solid content changes the dielectric characteristics of the dielectric film layer formed by the core-shell structure; ^ Figure 6 shows changes in the electrical temperature coefficients of the dielectric film layer in the first preferred embodiment of the present invention; FIG. 7 shows the change of the dielectric characteristics of the dielectric film layer to the frequency in the first preferred embodiment of the present invention. FIG. 8 shows the frequency change of the laser annealing pulse M in the second preferred embodiment of the present invention. Y5P dielectric particles cover different Zr precursor colloid shell ratios. In MHZ, The change of the dielectric constant of the lower dielectric film layer; and FIG. 9 shows that in the second preferred embodiment of the present invention, the laser annealing pulse 2 radiance ratio covers different 5 r dielectric precursors of Y 5 P dielectric particles. The colloidal shell layer ratio, the dielectric loss of the dielectric film layer changes under HZ measurement. ^ Figures A, B, and C of the annex show the second embodiment of the present invention. And Ti precursors covered with barium titanate (Y5P) by sol-gel method
200522809 圖式簡單說明 粉體,所形成核殼結構之粉體,圖一A為訐坡覆、圖一b為 Ti披覆,而圖一C則為PCB基板及其介電膜層。 【圖式符號說明】 步驟1 2 0 步驟1 3 0 步驟1 4 0 步驟1 1 0 提供具有核殼結構之複數粉體 分散該等粉體至一溶劑中 將該等粉體與溶劑披鍍於一有機基板上以 一介電膜層 〜成 固化或緻密化該介電膜層200522809 Schematic illustration of powder, powder with core-shell structure formed. Figure 1A shows the slope cover, Figure 1b shows the Ti coating, and Figure 1C shows the PCB substrate and its dielectric film layer. [Illustration of Symbols] Step 1 2 0 Step 1 3 0 Step 1 4 0 Step 1 1 0 Provide a plurality of powders with a core-shell structure and disperse the powders into a solvent. The powders and the solvent are plated on A dielectric film layer on an organic substrate to solidify or densify the dielectric film layer
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TWI464805B (en) * | 2010-03-29 | 2014-12-11 | Tokyo Electron Ltd | Method for integrating low-k dielectrics |
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US8038495B2 (en) | 2006-01-20 | 2011-10-18 | Samsung Mobile Display Co., Ltd. | Organic light-emitting display device and manufacturing method of the same |
KR100635514B1 (en) | 2006-01-23 | 2006-10-18 | 삼성에스디아이 주식회사 | Organic electroluminescence display device and method for fabricating of the same |
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TWI740165B (en) * | 2019-05-30 | 2021-09-21 | 鴻海精密工業股份有限公司 | Device for generating electrical energy |
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