TWI222527B - Apparatus and method for inspecting array substrate - Google Patents

Apparatus and method for inspecting array substrate Download PDF

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Publication number
TWI222527B
TWI222527B TW91122295A TW91122295A TWI222527B TW I222527 B TWI222527 B TW I222527B TW 91122295 A TW91122295 A TW 91122295A TW 91122295 A TW91122295 A TW 91122295A TW I222527 B TWI222527 B TW I222527B
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TW
Taiwan
Prior art keywords
line
capacitor
charge
signal
control
Prior art date
Application number
TW91122295A
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English (en)
Chinese (zh)
Inventor
Atsuto Ohta
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of TWI222527B publication Critical patent/TWI222527B/zh

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  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW91122295A 2001-10-26 2002-09-27 Apparatus and method for inspecting array substrate TWI222527B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001328656A JP4059312B2 (ja) 2001-10-26 2001-10-26 アレイ基板の検査装置及びその検査方法

Publications (1)

Publication Number Publication Date
TWI222527B true TWI222527B (en) 2004-10-21

Family

ID=19144685

Family Applications (1)

Application Number Title Priority Date Filing Date
TW91122295A TWI222527B (en) 2001-10-26 2002-09-27 Apparatus and method for inspecting array substrate

Country Status (2)

Country Link
JP (1) JP4059312B2 (ja)
TW (1) TWI222527B (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4507559B2 (ja) * 2003-10-30 2010-07-21 奇美電子股▲ふん▼有限公司 液晶ディスプレイのアレイ基板の検査装置および検査方法

Also Published As

Publication number Publication date
JP4059312B2 (ja) 2008-03-12
JP2003149281A (ja) 2003-05-21

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MM4A Annulment or lapse of patent due to non-payment of fees