TW579661B - Plasma generation device and plasma processing device - Google Patents

Plasma generation device and plasma processing device Download PDF

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Publication number
TW579661B
TW579661B TW089106543A TW89106543A TW579661B TW 579661 B TW579661 B TW 579661B TW 089106543 A TW089106543 A TW 089106543A TW 89106543 A TW89106543 A TW 89106543A TW 579661 B TW579661 B TW 579661B
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Taiwan
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aforementioned
plasma
power supply
slot
antenna
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TW089106543A
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Chinese (zh)
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Shinzi Nakagami
Takeshi Noguchi
Kenichi Kojima
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Plasma System Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • H01J37/3211Antennas, e.g. particular shapes of coils
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Plasma Technology (AREA)
  • Drying Of Semiconductors (AREA)
  • ing And Chemical Polishing (AREA)

Abstract

The present invention provides a plasma generation device and a plasma processing device, which comprises: a vacuum container 1 with controllable inner pressure; a gas supply mechanism 2 for supplying gas into the vacuum container 1; and, a plasma generation mechanism for emitting electromagnetic wave toward the vacuum container 1 with gas introduction to generate the plasma. The plasma generation mechanism includes: a tank-like antenna 4 for forming the tank 41of electromagnetic wave emission as a conductor; and, an AC power 5 for supplying power to the tank-like antenna 4; and, the tank-like antenna 4 can also has the shape to generate the impedance of the plasma when having low power supply frequency. Thus, the present invention can improve the plasma state without enlarging the dimension of tank-like antenna to prevent the reduction of impedance, and generate the plasma in lower frequency, so as to reduce the manufacturing cost and operation cost.

Description

579661 五、發明說明(1) 發明之背景 發明之領域 本發明與一種電漿產生裝置及電漿處理裝置有關,尤與 具有能得高密度電漿之電感耦合型電漿產生裝置,半導體 裝置及液晶顯示器等製造過程使用之乾蝕刻裝置,研磨加 工裝置等,或其他微細加工之蝕刻,及研磨加工、清潔、 表面改質等,能利用高密度電漿之領域所使用較佳之技藝 有關。 關連之技藝 於半導體裝置及液晶顯示器等製造過程使用之乾蝕刻裝 置、研磨加工裝置等電漿處理裝置之領域中,近年來隨著 處理基板之大型化,要求處理室内產生電漿之大口徑化。 又一方面、亦以確保蝕刻率、研磨率等一定處理速度及裝 置之生產能量為目的,要求電漿之高密度化。其中關於電 漿之高密度化,為促進電漿之激發效率,採用高頻產生電 感搞合型電漿(Inductively Coupled Plasma,以下稱 I C P )之方法。 I C P主要為將高頻電流送至天線激發用線圈,使其於真 空中產生電感磁場,以生成電漿者。而其特徵為針對與 ECR(Electron Cyclotron Resonance)裝置、微波電漿產 生裝置、磁控管R I E裝置等比較,裝置構造比較簡單,於 高真空下將高密度電漿均勻形成於真空容器内。 I C P高壓力使用下,電漿密度之分布強烈依靠外部供給 之電磁場,即由天線製作之電磁場分布之形態。茲以單一579661 V. Description of the invention (1) Background of the invention Field of the invention The present invention relates to a plasma generating device and a plasma processing device, and particularly to an inductively coupled plasma generating device, a semiconductor device, and a plasma generating device having a high density plasma. Liquid crystal display and other dry etching equipment used in the manufacturing process, grinding processing equipment, etc., or other micro-processed etching, grinding processing, cleaning, surface modification, etc., can use high-density plasma in the field of better technology used. Related technologies In the field of plasma processing devices such as dry etching devices and polishing processing devices used in manufacturing processes such as semiconductor devices and liquid crystal displays, in recent years, with the increase in the size of processing substrates, it has been required to increase the size of the plasma generated in the processing chamber. . On the other hand, high plasma density is required for the purpose of ensuring a certain processing speed such as etching rate and polishing rate and the production energy of the device. Regarding the high density of the plasma, in order to promote the excitation efficiency of the plasma, a method of inductively coupled plasma (Inductively Coupled Plasma, hereinafter referred to as I C P) is adopted. I C P is mainly to send high-frequency current to the antenna excitation coil, so that it generates an inductive magnetic field in the air to generate plasma. Its characteristics are compared with ECR (Electron Cyclotron Resonance) device, microwave plasma generation device, magnetron R E E device, etc. The device structure is relatively simple, and high density plasma is formed uniformly in a vacuum container under high vacuum. When I C P is used under high pressure, the distribution of plasma density strongly depends on the externally supplied electromagnetic field, which is the form of the electromagnetic field distribution produced by the antenna. Hereby single

第4頁Page 4

579661 五、發明說明(2) (S i n g 1 e D e s i g η )構造之天線因僅天線附近電磁場較強, 故將引起強烈依靠天線形狀之電漿密度分布之局部化。為 了提高電漿之激發效率,而增加高頻振盪器之頻率時,單 一構造之天線將引起天線阻抗之上昇,或天線製作之電磁 場分布之局部化。針對此,為了抑制天線阻抗之上昇,而 縮短天線長度,乃為與電漿大口徑化矛盾之想法。例如即 使可大口徑化,惟電磁場之空間上不均勻性將引起電漿密 度之不均勻性。 又單一構造之天線,以高頻振盪器激振天線時,對構成 天線之金屬導體表面垂直方向產生強烈振動電場。一方 面、由天線製作之電場將作用力作用於電荷粒子之電漿。 通常因電漿係由其質量比約1 0 0 0倍之不同重正離子與電子 構成,故對電場之感度不同,例如為工業頻率約1 3. 5 6 Μ Η ζ之頻率帶時,針對重離子無法追隨高頻振動之電場不 呈現位置之變化,而因輕電子以此種程度之頻率能充分追 隨,故構成僅電子即時反應於電場改變位置之電漿系。 此種情形時,若天線製作之電場對天線線圈面平行則無 問題,惟若對天線線圈面垂直振動則成為僅電子被天線吸 引、或排斥同步於電場振動而電荷量於天線與電漿間變化 之狀態。此狀態以長時間之級數(〇 r d e r )看時,可看出電 子平均過剩存在於天線附近之結果,此過剩電子激發將隔 離天線與電漿之電介質(真空容器)表面電位對電漿及接地 電位相對降低之效果。具體而言,例如為線狀天線時,因 形成與距天線距離r之反3方成比例之強靜電場,故激發強579661 V. Description of the invention (2) The antenna of (S i n g 1 e D e s i g η) structure has strong electromagnetic field only near the antenna, so it will cause localization of the plasma density distribution that strongly depends on the shape of the antenna. In order to improve the excitation efficiency of the plasma, when the frequency of the high-frequency oscillator is increased, a single structure of the antenna will cause the antenna impedance to increase, or the localization of the electromagnetic field distribution made by the antenna. In view of this, in order to suppress the increase in antenna impedance, shortening the antenna length is an idea that contradicts the increase in the diameter of the plasma. For example, even if the diameter can be increased, the spatial non-uniformity of the electromagnetic field will cause the non-uniformity of the plasma density. With a single structure antenna, when a high frequency oscillator is used to excite the antenna, a strong vibrating electric field is generated in a vertical direction on the surface of the metal conductor constituting the antenna. On one side, the electric field created by the antenna applies a force to the plasma of the charged particles. Generally, the plasma is composed of different heavy ions and electrons with a mass ratio of about 1000 times, so the sensitivity to the electric field is different. For example, when the frequency band is about 1 3. 5 6 Μ Η ζ, Heavy ions cannot follow the high-frequency vibration of the electric field without showing a change in position, and because light electrons can sufficiently follow at this level of frequency, a plasma system is formed in which only the electrons react in real time to the change of position of the electric field. In this case, there is no problem if the electric field produced by the antenna is parallel to the antenna coil surface, but if the antenna coil surface is vibrated vertically, only the electrons are attracted by the antenna, or the electric field is repelled in synchronization with the electric field vibration and the charge is between the antenna and the plasma. State of change. Looking at this state for a long time (〇rder), it can be seen that the average surplus of electrons exists near the antenna. This excess electron excitation will isolate the surface potential of the dielectric (vacuum container) of the antenna from the plasma and the plasma and The effect of a relatively low ground potential. Specifically, for example, in the case of a linear antenna, a strong electrostatic field proportional to the inverse of the distance r from the antenna forms a strong electrostatic field.

第5頁 579661 五、發明說明(3)Page 5 of 579661 V. Description of Invention (3)

Vdc。又此處Vdc定義為「隔離天線與電漿之電介質之空容 器側表面之時間平均之電位」。 又因上述Vdc之發生而產生正離子對真空容器表面之濺 射,故真空容器表面被敲出雜質,而形成基板處理上之重 大問題。又抑制Vdc之方法之一有將法拉第屏蔽之遮蔽板 插入天線與電漿間之方法。然而使用法拉第屏蔽將附帶發 射電磁場之农減’無法有效將能量供給電、疲,故成為能量 效率不佳之電漿處理裝置。 此外,曰本特開平3 - 7 9 0 2 5號公報揭示具備製作電磁場 用平面狀線圈之電漿處理裝置。此電漿處理裝置產生由平 面狀線圈製作之電磁場電感耦合之電漿,以實現電漿均勻 化、高密度化者。然而此電漿處理裝置,上述Vdc發生機 構正符合,併用電介質透鏡等,將附帶迴避此問題之困 難。 為解決上述問題,提出適用槽形天線之技藝。 槽形天線被定義為金屬導體面上所開細長溝,即由槽構 成之發射天件。此槽形天線之特徵為未具有線狀天線具有 之與鄰近場重要距離之反3方成比例之靜電場效果。故容 易迴避上述Vdc發生機構之問題。用此種槽形天線產生電 漿時,已知有於可由振盪器供電之微波導波管開設槽開口 部,以此槽開口部為槽形天線發射電磁波動,由此電磁波 動產生電漿之手法。 但用導波管時,導波管之大小形狀受供電之電磁波波長 之限制。例如,因使用3 0 0 M Hz頻率之電磁波時,其波長Vdc. Here again, Vdc is defined as "the time-averaged potential of the side surface of the air container that isolates the dielectric of the antenna and the plasma". Also, due to the occurrence of the above Vdc, positive ion splashing on the surface of the vacuum container is generated, so the surface of the vacuum container is knocked out of impurities, which causes a major problem in substrate processing. One of the methods to suppress Vdc is to insert a Faraday shield shield between the antenna and the plasma. However, the use of Faraday shields to reduce farming with incident electromagnetic fields cannot effectively supply energy and fatigue, so it becomes a plasma processing device with poor energy efficiency. In addition, Japanese Patent Application Laid-Open No. 3-779925 discloses a plasma processing apparatus having a planar coil for electromagnetic fields. This plasma processing device generates a plasma inductively coupled electromagnetic field made of a planar coil to achieve uniform and high-density plasma. However, this plasma processing device is compatible with the above-mentioned Vdc generating mechanism, and the use of a dielectric lens or the like will have the difficulty of avoiding this problem. In order to solve the above problems, a technique for applying a slot antenna is proposed. A slot antenna is defined as an elongated groove formed on the surface of a metal conductor, that is, a transmitting antenna formed by a slot. The characteristic of this slot antenna is that it does not have the electrostatic field effect that the linear antenna has in proportion to the inverse of the important distance of the adjacent field. Therefore, it is easy to avoid the problems of the above-mentioned Vdc generating mechanism. When using such a slot antenna to generate a plasma, it is known to open a slot opening in a microwave waveguide that can be powered by an oscillator, and use this slot opening as a slot antenna to emit electromagnetic waves. technique. However, when using a waveguide, the size and shape of the waveguide are limited by the wavelength of the electromagnetic wave that is being supplied. For example, when an electromagnetic wave with a frequency of 300 MHz is used, its wavelength

579661 五、發明說明(4) 為1公尺,惟使用3 Μ Η z頻率之電磁波時,其波長成為1 0 0 公尺,隨著所需導波管之大小形狀成為龐大,故事實上於 比微波波長長之區,用導波管供電給槽形天線困難。 又用導波管之手法,因產生電漿狀態大受槽形天線之開 口形狀、配置等,微波導波管中之電磁波動姿態之影響, 致槽形天線之開口形狀、配置等限制增加,而有有時無法 將此等形成為為了獲得電漿處理所需之電漿產生面積及電 漿產生密度所需形狀之問‘。 此外,為了利用電漿處理裝置之真空容器為短之波長之 電磁波,可能引起真空容器中之波動干擾現象,電漿產生 不均勻之情形。 因此,以大口徑均勻產生電漿為目的時,用導波管之槽 形天線之利用方法將受上述限制。 為解決上述問題,本案之發明人等提出如特開平 1 0 _ 0 7 4 5 9 7號公報所載包括槽形天線與供電於該槽形天線 之高頻電源之「電漿產生裝置及電漿處理裝置」。特開平 1 0 - 0 7 45 9 7號公報所載「電漿產生裝置及電漿處理裝置」 包括:處理室,内部收容基板並用電漿處理該基板;及電 漿產生機構,向導入處理氣體之處理室内發射電磁波以產 生電漿;前述電漿產生機構,採用設置於供電給高頻電源 之導體板之槽開口部做為槽形天線,於此槽開口部兩側設 置直接供電點之方法,此外,本電漿處理裝置將多數槽開 口部形成於前述導體上,於各槽分別設置供電點,並設置 控制各槽間供電相位用之相位控制機構之匹配箱等。579661 V. Description of the invention (4) is 1 meter, but when using 3 MW Η z electromagnetic waves, its wavelength becomes 100 meters. As the size and shape of the required waveguide becomes huge, it is actually In regions longer than the microwave wavelength, it is difficult to use a waveguide to power the slot antenna. The method of the waveguide is also used. Because the state of the plasma is greatly affected by the shape and configuration of the slot antenna, the electromagnetic wave posture in the microwave waveguide, and the restrictions on the shape and configuration of the slot antenna are increased. There are cases where it is not possible to form these into a shape required for a plasma generation area and a plasma generation density required for plasma treatment. In addition, in order to use the short-wave electromagnetic wave in the vacuum container of the plasma processing device, it may cause fluctuations in the vacuum container, and the plasma may be uneven. Therefore, for the purpose of uniformly generating plasma with a large aperture, the use of the slot antenna of the waveguide will be limited as described above. In order to solve the above problems, the inventors of the present case proposed a "plasma generating device and a power generator" including a slot antenna and a high-frequency power supply for supplying the slot antenna, as described in JP-A No. 10 _ 0 7 4 5 9 7 Pulp processing unit ". Japanese Patent Application Laid-Open No. 10-0 7 45 9 7 "Plasma generating device and plasma processing device" includes: a processing chamber, which contains a substrate and processes the substrate with a plasma; and a plasma generating mechanism, which introduces processing The gas processing chamber emits electromagnetic waves to generate plasma; the aforementioned plasma generating mechanism uses slot openings provided on a conductor plate for supplying high frequency power as slot antennas, and direct power supply points are provided on both sides of this slot opening. Method, in addition, the plasma processing apparatus forms a plurality of slot openings on the aforementioned conductors, sets power supply points in each slot, and sets a matching box of a phase control mechanism for controlling the power supply phase between the slots.

第7頁 579661 五、發明說明(5) 採此供電方法之槽形天線,不但無需導波管且可消除由 其時電磁波動姿態限制槽開口部形狀之情形。又因可用較 低頻率電磁波,故可防止真空容器中之波動干擾。由於亦 可由產生之電漿狀態等必要性設計槽形天線之形狀配置 等,故為大口徑均勻產生電漿之較佳方法。 適用前述槽形天線之電漿產生裝置,為了減低產生電漿 所需能量,要求希望使用約100 MHz以下之較低頻率。 然而,於槽形天線,使用較低頻率產生電漿時,由於阻 抗不足致槽形天線易短路,又因與電漿之磁性結合較弱, 故有需要大尺寸槽形天線之問題。 更如上述特開平1 0 - 0 74 5 9 7號公報所載供電頻率為3 0 0 Μ Η z時可設計折疊槽形天線長度為約2 0 0公釐,又供電頻率 為5 0 0 Μ Η ζ時可設計圓環狀槽形天線直徑為小至約3 0 0公 釐,惟供電頻率為約1 0 0 Μ Η以下時因所需槽開口部長度大 而裝置全部大型化,故有希望改善之要求。 又因約1 0 0 Μ Η ζ以上之振盪器及同步相位之匹配箱成本 高,故為了減低裝置之製造成本,有希望使用規格品之工 業用頻率13.56 MHz、或27.12 MHz、40.68 MHz之振盪器 及對應之匹配箱之要求,惟此時因產生之電磁場波長大, 若使槽形天線具有必要之長度時,有裝置龐大至約1 3公尺 而不實用之問題。 此外,上述特開平1 0 - 0 7 4 5 9 7號公報所載技藝,為了增 加電漿之產生面積及產生密度,於前述導體上形成多數槽 開口部並設置控制各槽間之供電相位用之相位校正器等,Page 7 579661 V. Description of the invention (5) The slot antenna adopting this power supply method does not only need a waveguide but also eliminates the situation that the shape of the slot opening is restricted by the electromagnetic wave attitude at that time. Since lower frequency electromagnetic waves can be used, fluctuations in the vacuum container can be prevented. Since the shape configuration of the slot antenna can also be designed according to the necessity of the generated plasma state, etc., it is a better method for uniformly generating plasma with a large aperture. The plasma generating device to which the aforementioned slot antenna is applied, in order to reduce the energy required to generate the plasma, it is required to use a lower frequency below about 100 MHz. However, when a slot antenna uses a lower frequency to generate a plasma, the slot antenna is prone to short circuit due to insufficient impedance, and because of the weak magnetic combination with the plasma, there is a problem that a large-sized slot antenna is required. More specifically, the above-mentioned Japanese Patent Application Publication No. 10-0 74 5 9 7 provides a power supply frequency of 3 0 Μ Η z. The length of the folded slot antenna can be designed to be about 200 mm, and the power supply frequency is 5 0 Μ. Η ζ can be designed to have a circular slot antenna diameter as small as about 300 mm, but the power supply frequency is about 100 Μ Μ below Η because the required slot opening length is large and the device is large, so Hope for improvement. In addition, because the cost of the oscillator and synchronization phase matching box above about 100 Η ζ ζ is high, in order to reduce the manufacturing cost of the device, it is expected to use the industrial frequency of 13.56 MHz, or 27.12 MHz, and 40.68 MHz. Device and the corresponding matching box, but because the wavelength of the electromagnetic field generated is large at this time, if the slot antenna has the necessary length, there is a problem that the device is bulky to about 13 meters, which is not practical. In addition, in the technique described in Japanese Patent Application Laid-Open No. 10-0 7 4 5 9 7, in order to increase the generation area and density of the plasma, a plurality of slot openings are formed on the conductor and provided to control the power supply phase between the slots. Phase corrector, etc.

第8頁 579661 五、發明說明(6) 惟此時有招致對多數槽之供電頻率之同步控制困難之問 題,又因於前述導體上形成多數槽開口部致有天線之阻抗 降低而易短路之問題,又因相位校正器之成本高,為減低 裝置之製造成本,有希望採取對策之要求。 此外,槽形天線與真空容器之配置關係為先前如圖34所 示,將槽形天線C 1配置於裝在其下側之真空容器C 2外側、 即大氣中,而真空容器C2於槽C 1 1下側附近設有開口部 C21 ,並配置杜塞開口部C21之石英等電介質C3。此處,電 介質C3係從開口部C21將從槽形天線C1產生之交流電磁場 導至真空容器C2内部,並將真空容器C2與0環C22等一同密 封,為維持真空容器C 2内部之真空而設者。 但此種配置,欲加大設定經開口部C 2 1確保真空容器C 2 内部之槽形天線C 1之面積而擴大開口部C 2 1之面積時,為 了保持對抗真空容器C 2外部大氣壓之構造強度維持真空, 有加大電介質C3厚度之必要。此種電介質C3厚度之加大不 但降低供電於天線供電部之滲透電位並降低與電漿P交叉 之磁力線密度。結果,將招致電漿P之點燈開始電力之上 昇及與電漿P之磁性結合性之下降。即無法減薄前述電介 質C 3厚度,電介質C 3厚度受到限制,因槽形天線C 1與真空 容器C 2内部之間隔無法任意調整,而有滲透電壓(供電給 天線電壓之滲入)控制困難之問題。 此外,因經真空容器C 2之開口部C 2 1確保於真空容器C 2 之槽形天線C 1之金屬導體面受其電介質C 3大小之限制,故 即限制槽形天線C 1之電磁場發射面開口面積,而降低能量P.579661 V. Description of the invention (6) However, at this time, there is a problem that it is difficult to control the synchronization of the power supply frequency of the majority of slots, and the impedance of the antenna is reduced due to the formation of the majority of slot openings on the conductor, which is easy to short However, due to the high cost of the phase corrector, in order to reduce the manufacturing cost of the device, it is expected to take countermeasures. In addition, the arrangement relationship between the slot antenna and the vacuum container is as shown in FIG. 34. The slot antenna C1 is disposed outside the vacuum container C2 installed on the lower side thereof, that is, in the atmosphere, and the vacuum container C2 is disposed in the slot C. An opening portion C21 is provided near the lower side, and a dielectric C3 such as quartz is arranged in the Duse opening portion C21. Here, the dielectric C3 guides the AC electromagnetic field generated from the slot antenna C1 into the vacuum container C2 through the opening C21, and seals the vacuum container C2 with the 0 ring C22 and the like. In order to maintain the vacuum inside the vacuum container C2, Set by. However, in this configuration, when the area of the slot antenna C 1 inside the vacuum container C 2 is ensured through the opening portion C 2 1 and the area of the opening portion C 2 1 is enlarged, in order to maintain a resistance against the external atmospheric pressure of the vacuum container C 2 The structural strength maintains the vacuum, and it is necessary to increase the thickness of the dielectric C3. Such an increase in the thickness of the dielectric C3 not only reduces the penetration potential supplied to the antenna power supply portion, but also reduces the density of magnetic lines of force crossing the plasma P. As a result, the lighting of the plasma P will be started to increase the electric power and decrease the magnetic coupling with the plasma P. That is, the thickness of the dielectric C 3 cannot be reduced, and the thickness of the dielectric C 3 is limited. Because the interval between the slot antenna C 1 and the vacuum container C 2 cannot be arbitrarily adjusted, it is difficult to control the penetration voltage (the penetration of the power supply to the antenna voltage). problem. In addition, since the metal conductor surface of the slot antenna C 1 in the vacuum container C 2 is ensured by the size of the dielectric C 3 through the opening C 2 1 of the vacuum container C 2, the electromagnetic field emission of the slot antenna C 1 is limited. Face opening area while reducing energy

第9頁 579661 五、發明說明(7) 效率,及妨礙 又槽形天線 緣,有時要兼 故本 1 ·謀 提高, 性之提 2. 無 低頻率 3. 謀 本發 力;氣 機構, 漿;前 槽形成 天線為 解決上 在此 寸波長 之縱、 個尺寸 本發 線,利 發明有 求電漿 電漿點 高等, 需力口大 產生電 求製造 明之電 體供應 向導入 述電漿 於導體 具有低 述課題 ,本發 之電磁 橫、南 相專波 明之電 用依據 電漿P之大口徑化。 之供電點需要連接接地之點,惟其餘需予絕 顧真空容器之密封條件將發生困難。 發明之概述 鑑於上述情形,欲達成以下目的。 產生面積之擴大,電漿產生濃度之均勻化及 燈開始電力之上昇防止,與電漿之磁性結合 電漿狀態之增進。 槽形天線尺寸即可防止阻抗之下降,能以較 漿。 成本,運轉成本之減低。 漿產生裝置包含:真空容器,可控制内部壓 機構,將氣體供給真空容器内;及電漿產生 氣體之前述真空容器内發射電磁波以產生電 產生機構包含:槽形天線,將發射電磁波之 :及交流電源,供電於槽形天線;前述槽形 供電頻率時亦可產生電漿之阻抗之形狀,以 〇 明中低供電頻率即指具有大於真空容器内尺 波頻率,即比與從導入真空容器内氣體部分 、對角、半徑、1邊長度等中之尺寸選擇之1 長之電磁波頻率為小之頻率。 漿產生裝置,其中磁流源天線之前述槽形天 巴比奈特(B a b i n e t)原理之線狀天線間之電Page 99579661 V. Description of the invention (7) Efficiency and obstruction of slot antennas, sometimes it is necessary to combine the problems 1. Improve the performance, improve the nature 2. No low frequency 3. Strive for strength; In order to solve the problem of the length and length of the antenna at this inch wavelength, it is necessary to obtain a high plasma plasma point, etc., which requires a large amount of electricity to produce electricity. As the conductor has a low-level subject, the electric power of the electromagnetic horizontal and southern phases of this issue is based on the large diameter of the plasma P. The power supply point needs to be connected to the ground point, but the rest needs to be sealed without regard to the sealing conditions of the vacuum container, which will cause difficulties. SUMMARY OF THE INVENTION In view of the above circumstances, it is desirable to achieve the following objects. The expansion of the generated area, the uniformity of the plasma concentration and the prevention of the rise of the lamp starting power, combined with the magnetic properties of the plasma, the improvement of the plasma state. The size of the slot antenna can prevent the decrease of the impedance, and it can be more compact. Cost, reduction of operating costs. The plasma generating device includes: a vacuum container that can control an internal pressure mechanism to supply gas into the vacuum container; and the aforementioned vacuum container that generates plasma gas to emit electromagnetic waves to generate an electric generating mechanism including: a slot antenna that will emit electromagnetic waves: and The AC power supply is used to feed the slot antenna. The aforementioned slot-shaped power supply frequency can also generate the impedance shape of the plasma. With a low power supply frequency of 0, it means that it has a frequency greater than the ruler wave frequency of the vacuum container, that is, compared with the imported vacuum container. The frequency of one long electromagnetic wave selected in the size of the inner gas part, diagonal, radius, length of one side, etc. is a small frequency. Plasma generating device, in which the aforementioned slot-shaped antenna of the magnetic current source antenna is electrically connected between the linear antennas of the B a b i n e t principle

第10頁 579661 五、發明說明(8) 磁場之對偶性將前述導體形狀及前述槽形狀設定為2次元 構造或3次元構造為宜。 本發明之電漿產生裝置,最好將作為磁流源天線之前述 槽形天線中之前述導體形狀以及前述槽形形狀,設計成形 狀構造上圓筒面狀構造,球面狀構造,屈折面等,以便基 於巴比奈特原理而利用與線狀天線間之電磁界雙對性,而 增加發生於内部之電漿密度。 本發明之電漿產生裝置,其中前述槽形天線之導體可做 為前述真空容器之一部分或全部構成。 本發明之電漿產生裝置,其中向前述槽形天線之供電點 可被設定於2處、3處、4處’或供電點為1處將前述導體設 定於接地電位,此外,前述供電點被設定於槽形天線之發 射狀態最佳位置。 本發明之電漿產生裝置,其中前述槽可被連接為1處, 或並聯或串聯設有2處以上。 本發明之電漿產生裝置包含:處理室,内部收容基板並 用電漿處理該基板:氣體供應機構,將處理氣體供給處理 室内;電漿產生機構,向導入處理氣體之前述處理室内發 射電磁波以產生電漿;及排氣機構,將前述處理室内排氣 為所需壓力:前述電漿產生機構包含:槽形天線,將發射電 磁波之槽形成於導體;及交流電源,供電於槽形天線;前 述槽形天線為具有低供電頻率時亦可產生電漿之阻抗之形 狀,以解決上述課題。在此,電漿產生機構具有與前述電 漿產生裝置記載者略相同之構造。Page 10 579661 V. Description of the invention (8) Duality of the magnetic field It is appropriate to set the aforementioned conductor shape and the aforementioned slot shape to a two-dimensional structure or a three-dimensional structure. In the plasma generating device of the present invention, it is preferable to design the conductor shape and the slot shape of the slot antenna as the magnetic current source antenna into a cylindrical structure, a spherical structure, a flexion surface, etc. In order to use the dual pairing of the electromagnetic boundary with the linear antenna based on the Barbinite principle, and increase the plasma density occurring inside. In the plasma generating device of the present invention, the conductor of the slot antenna may be formed as a part or all of the vacuum container. In the plasma generating device of the present invention, the power supply point to the slot antenna can be set at two, three, or four points, or the power supply point is set at one point to set the conductor to a ground potential. In addition, the power supply point is Set at the best position for the slot antenna's emission status. In the plasma generating device of the present invention, the grooves may be connected at one place, or two or more places may be provided in parallel or in series. The plasma generating device of the present invention includes: a processing chamber that contains a substrate therein and processes the substrate with a plasma: a gas supply mechanism that supplies processing gas to the processing chamber; a plasma generating mechanism that emits electromagnetic waves into the processing chamber into which the processing gas is introduced to Generating a plasma; and an exhaust mechanism for exhausting the aforementioned processing chamber to a required pressure: the aforementioned plasma generating mechanism includes: a slot antenna, which forms a slot that emits electromagnetic waves in a conductor; and an AC power source, which supplies power to the slot antenna; The aforementioned slot antenna has a shape that can also generate the impedance of the plasma when it has a low power supply frequency to solve the above-mentioned problems. Here, the plasma generating mechanism has a structure that is slightly the same as that described in the aforementioned plasma generating device.

第11頁 579661 五、發明說明(9) 槽形天線被定義為金屬導體面上所開細長溝,即由槽構 成之發射元件。槽形天線又稱磁流天線,將磁流視為電磁 波動源,與線狀天線不同,具有於槽開口部平行於開口面 之磁場於表背面相抵消成零之物理特徵。又由依據電磁場 之對偶性之巴比奈特(Bab i ne t)原理,槽形天線存在具有 電磁場之對偶性(電場與磁場更替之性質)之對應之線狀天 線,雖容易實施特性解析,惟槽形天線之特徵為未具有線 狀天線具有之鄰近場重要距離之反3方成比例之靜電場效 果。 以槽形天線產生電漿之方法,使用通常金屬板上開細長 切溝者,惟將此溝形狀依上述線狀天線之解析,具有相位 幾何學之聯合性,且成為仍舊保持磁流源天線之特性變形 之形態,或成為旋進之形態,以提高槽形天線之阻抗及與 電漿之磁性結合性。此時由於使前述槽形天線成為低供電 頻率時亦可無需加大槽形天線之尺寸,具有可產生電漿之 阻抗之形狀,即可防止真空容器中波動之干擾。 又活用槽形天線為面狀天線之性質,使槽形天線為真空 容器之一部分或全部,同時使天線導體為圓筒狀構造、半 球面狀構造、折面等,以增大内部產生之電漿密度,並適 切選擇槽形狀,即可使對槽形天線之供電點為1處使前述 導體為接地電位。又由此,無需兼真空維持密封之目的於 槽形天線與真空容器間設置電介質,可自由設定電漿與天 線之間隔、天線之表面積,增進磁性或靜電結合之控制 性。結果,電磁發射面增大,天線與電漿之結合變密,而 579661 五、發明說明(ίο) 可謀求供電效率之提高與電漿之大口徑化。 此外,可對應前述槽之形狀設定2處、3處、4處向前述 槽形天線之供電點,有效供電於槽形天線。又由於將槽形 天線做為真空容器之一部分或全部,從1處供電點供電於 浮島型槽,即無需將前述導體設定於接地電位、即無絕緣 前述導體之必要。更由於將供電給槽形天線之頻率設定為 可變,並對應此頻率改變前述供電點對槽之設定位置,即 可謀求前述供電點於前述槽形天線之發射狀態最佳化。又 可將前述槽連接1處,或並聯或串聯設2處以上,謀求供電 效率之提高與電漿之大口徑化。 如上述依本發明之電漿產生裝置及電漿處理裝置可奏效 如下。 (1 )由於前述槽形天線,具有於低供電頻率時亦無需加 大槽形天線尺寸可產生電漿之阻抗之形狀,即可謀求電漿 產生面積之擴大,電漿產生濃度之均勻化及提高,電漿點 燈開始電力之上昇防止,與電漿之磁性結合性之提高等, 電漿狀態之增進,並可抑制因真空容器中電磁波動干擾之 電漿產生之不均勻性。 (2 )磁流源天線之前述槽形天線之前述導體形狀及前述 槽之形狀為圓筒面狀構造,球面狀構造,折面等依利用依 據巴比奈特(B a b i n e t)原理之線狀天線間之電磁場之對偶 性設定為增加内部產生之電漿密度之形狀構造,即可無需 加大槽形天線尺寸防止阻抗之下降,以較低頻率產生電 漿。Page 11 579661 V. Description of the invention (9) A slot antenna is defined as an elongated groove formed on the surface of a metal conductor, that is, a transmitting element formed by a slot. Slot antennas are also called magnetic current antennas. They treat magnetic current as a source of electromagnetic waves. Unlike linear antennas, they have the physical characteristic that the magnetic field parallel to the opening surface of the slot's opening is canceled to zero on the surface and back. According to the Babinite principle of duality of electromagnetic fields, slot antennas have corresponding linear antennas that have duality of electromagnetic fields (the property of the replacement of electric and magnetic fields). Although the characteristics are easy to analyze, The characteristic of the slot antenna is that it does not have the electrostatic field effect proportional to the inverse 3 of the significant distance of the adjacent field that the linear antenna has. The method of generating a plasma with a slot antenna uses an elongated cut groove usually on a metal plate. However, the shape of the groove is analyzed according to the above linear antenna, which has the union of phase geometry and becomes a magnetic current source antenna. The characteristics of the deformed form, or into the form of precession, to improve the impedance of the slot antenna and magnetic binding with the plasma. At this time, it is not necessary to increase the size of the slot antenna when the slot antenna is set to a low power supply frequency, and it has a shape that can generate the impedance of the plasma, which can prevent the interference of fluctuations in the vacuum container. It also makes use of the nature of the slot antenna as a planar antenna, making the slot antenna part or all of a vacuum container, and making the antenna conductor a cylindrical structure, a hemispherical structure, a folded surface, etc. to increase the electricity generated inside. The density of the slurry, and the slot shape is appropriately selected, so that the power supply point to the slot antenna is 1 and the aforementioned conductor is at the ground potential. Therefore, it is not necessary to set a dielectric between the slot antenna and the vacuum container for the purpose of maintaining the vacuum, and the gap between the plasma and the antenna, the surface area of the antenna can be set freely, and the controllability of magnetic or electrostatic binding can be improved. As a result, the electromagnetic emission surface increases, and the combination of the antenna and the plasma becomes denser, and 579661 V. Description of Invention (ίο) The power supply efficiency can be improved and the diameter of the plasma can be increased. In addition, two, three, and four points of power supply points to the slot antenna can be set according to the shape of the slot, and the slot antenna can be effectively powered. Because the slot antenna is used as part or all of the vacuum container, and power is supplied to the floating island slot from one power supply point, there is no need to set the aforementioned conductor to the ground potential, that is, it is not necessary to insulate the aforementioned conductor. Furthermore, the frequency of the power supply to the slot antenna is set to be variable, and the setting position of the power supply point to the slot is changed according to the frequency, so that the transmission state of the power supply point to the slot antenna can be optimized. The slot can be connected at one point, or two or more can be connected in parallel or in series to improve the power supply efficiency and increase the diameter of the plasma. As described above, the plasma generating device and the plasma processing device according to the present invention can work as follows. (1) Due to the aforementioned slot antenna, the shape of the impedance of the plasma can be increased without increasing the size of the slot antenna at low power supply frequency, so that the area of plasma generation can be expanded, the concentration of plasma generation can be uniformized and To improve, to prevent the rise of electric power from the start of plasma lighting, to improve the magnetic coupling with the plasma, etc., to improve the state of the plasma, and to suppress the non-uniformity of the plasma caused by the electromagnetic wave interference in the vacuum container. (2) The above-mentioned conductor shape of the aforementioned slot antenna of the magnetic current source antenna and the shape of the aforementioned slot are a cylindrical surface structure, a spherical structure, a folded surface, etc. according to the use of a linear antenna based on the principle of Babinet The duality of the electromagnetic field is set to a shape structure that increases the density of the plasma generated internally, so that it is not necessary to increase the size of the slot antenna to prevent the impedance from decreasing, and the plasma is generated at a lower frequency.

第13頁 579661 五、發明說明(11) (3 )因前述槽形天線之導體以前述真空容器之一部分或 全部構成,及由低供電頻率可產生電漿,故無需價昂之高 頻率用振盪器,匹配箱等,而可謀求製造成本,運轉成本 之減低。 (4 )因前述槽形天線之導體以前述真空容器之一部分或 全部構成,為了密閉真空容器無需於電漿與槽形天線間設 電介質,故可任意設定電漿與槽形天線之間隔,抑制關連 電漿點燈之滲透電位之控制性,謀求電漿與天線之磁性結 合之提高,結合面積之加大,供電效率之提高,而可謀取 電漿之大口徑化。 較佳實施例之詳細說明 以下依圖說明本發明有關之電漿產生裝置及電漿處理裝 置之一實施形態。 第1實施形態 圖1係本實施形態之電漿產生裝置之構造圖,具體而言 為半導體裝置製造過程中使用於去除光蝕劑之I C P研磨加 工裝置之例。圖中圖號1係真空室(處理室)、2係02氣供應 源(氣體供應機構)、3係真空泵(排氣機構)、4係槽形天線 (電漿產生機構)、5係R F振盪器(高頻電源、電漿產生機 構)、W係半導體晶圓(基板)。 如圖1所示,本電漿處理裝置包括:真空室1 (可控制内部 壓力之真空容器)、02氣供應源2 (氣體供應機構)、槽形天 線4 (電漿產生機構)、R F振盪器5 (高頻電源、電漿產生機 構)而成之電漿產生裝置。Page 13 579661 V. Description of the invention (11) (3) Because the conductor of the aforementioned slot antenna is composed of part or all of the aforementioned vacuum container, and the plasma can be generated from a low power supply frequency, it does not require expensive high frequency oscillations Devices, matching boxes, etc., while reducing manufacturing costs and operating costs. (4) Because the conductor of the slot antenna is part or all of the foregoing vacuum container, in order to seal the vacuum container, there is no need to set a dielectric between the plasma and the slot antenna, so the interval between the plasma and the slot antenna can be arbitrarily set to suppress Related to the control of the penetration potential of the plasma lighting, the magnetic combination of the plasma and the antenna is improved, the combined area is increased, the power supply efficiency is improved, and the large diameter of the plasma can be achieved. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of a plasma generating device and a plasma processing device according to the present invention will be described below with reference to the drawings. First Embodiment FIG. 1 is a structural diagram of a plasma generating device according to this embodiment, and specifically an example of an I C P polishing processing device for removing a photoresist during a semiconductor device manufacturing process. In the figure, the number 1 vacuum chamber (processing chamber), 2 series 02 gas supply source (gas supply mechanism), 3 series vacuum pump (exhaust mechanism), 4 series slot antenna (plasma generation mechanism), 5 series RF oscillation (High-frequency power supply, plasma generating mechanism), W series semiconductor wafer (substrate). As shown in Fig. 1, the plasma processing device includes: a vacuum chamber 1 (a vacuum container capable of controlling internal pressure), 02 gas supply source 2 (gas supply mechanism), slot antenna 4 (plasma generation mechanism), and RF oscillation Generator (high frequency power supply, plasma generator).

第14頁 579661 五、發明說明(12) 金屬製真空室1下部設置排氣口 8,藉具有閥9之排氣管 1 0將真空泵3連接於排氣口 8。而構成由真空泵3之工作經 排氣口 8使真空室1内排氣為約數P a〜數百P a之構造。又真 空室1下部設置保持待處理半導體晶圓W用之加工處理載物 台1 1 ,並設置真空室1内調整加工處理載物台1 1位置(高 度)用之載物台昇降器12。 在此,真空室1導入氣體之内部形狀,可選擇立方體形 狀,圓柱體形狀,半球體形狀,具有折面之構造等者,將 此等導入真空容器内氣體部分之縱、橫、高、對角、半 徑、1邊長度等尺寸設定為數公分至數十公尺範圍程度之 值。 真空室1上部設置氣體導入口 13 ,藉具有閥14、15之氣 體導入管1 6連接02氣瓶等而成之02氣供應源2。而構成從02 氣供應源2將光蝕劑去除用處理氣之02氣導入真空室1内之 構造。更於氣體導入管1 6中間連接清除氣體導入管1 7,經 此導入清除真空室1内用之例如N2氣等。 又真空室1上部設置將電磁波發射於真空室1内激發、產 生電漿P用之槽形天線4,並設置透射槽形天線4發射之電 磁波之開口部1 a。 槽形天線4係例如平面狀鋁等製導體,如圖1 、圖2所示 覆蓋真空室1之開口部1 a,構成可控制内部壓力之真空容 器1之一部分。於開口部1 a周圍槽形天線4與真空室1之間 設置0環1 b等密閉機構,開口部1 a設置滲透電位調整及槽 形天線4表面被電漿敲出雜質之天線污染之雜質擴散防止Page 14 579661 V. Description of the invention (12) An exhaust port 8 is provided in the lower part of the metal vacuum chamber 1, and a vacuum pump 3 is connected to the exhaust port 8 by an exhaust pipe 10 having a valve 9. A structure in which the exhaust of the vacuum chamber 1 by the operation of the vacuum pump 3 through the exhaust port 8 is approximately P a to several hundred P a is formed. A processing stage 11 for holding the semiconductor wafer W to be processed is provided in the lower part of the vacuum chamber 1, and a stage lifter 12 for adjusting the position (height) of the processing stage 11 in the vacuum chamber 1 is provided. Here, the internal shape of the gas introduced into the vacuum chamber 1 can be selected from cube shape, cylindrical shape, hemispherical shape, structure with folded surface, etc., which is introduced into the vertical, horizontal, high, and Dimensions such as angle, radius, and length of one side are set to values ranging from a few centimeters to tens of meters. A gas introduction port 13 is provided in the upper part of the vacuum chamber 1, and a 02 gas supply source 2 formed by connecting a 02 gas bottle and the like through a gas introduction pipe 16 having valves 14 and 15 is provided. The structure in which the 02 gas of the photoresist removal processing gas is introduced into the vacuum chamber 1 from the 02 gas supply source 2 is constructed. Further, a purge gas introduction pipe 17 is connected to the gas introduction pipe 16 in the middle, and N2 gas and the like used in the vacuum chamber 1 are introduced therethrough. A slot antenna 4 for exciting electromagnetic waves in the vacuum chamber 1 to generate plasma P is provided in the upper part of the vacuum chamber 1, and an opening 1a for transmitting electromagnetic waves transmitted from the slot antenna 4 is provided. The slot antenna 4 is a conductor made of, for example, flat aluminum. As shown in Figs. 1 and 2, the opening 1a of the vacuum chamber 1 is covered to form a part of the vacuum container 1 capable of controlling the internal pressure. A closed mechanism such as a 0 ring 1 b is provided between the slot antenna 4 and the vacuum chamber 1 around the opening 1 a, and the opening 1 a is provided with a penetrating potential adjustment and an impurity contaminated by the antenna on the surface of the slot antenna 4 which is knocked out by the plasma. Proliferation prevention

第15頁 579661 五、發明說明(13) 用石英、陶瓷而成之電介質1 8。又槽形天線4上側於覆蓋 槽形天線4位置設置鋁屏蔽4a。 槽形天線4平面視之中央部分設置槽4 1 ,槽4 1附近設置 對槽形天線4之供電點4 3、4 4。 - 槽4 1係如後述,形成具有低供電頻率時亦可產生電漿之 / 阻抗之形狀,槽4 1開口部分如圖2所示,設置真空室1外側 : 位置平面視覆蓋槽4 1位置至槽4 1内部連續配置之密封電介 : 質(電介質)2 5 。由石英、陶瓷而成之電介質,密封電介質 2 5與平面視設於槽4 1外側之槽形天線4表面之0環4 b等密閉 機構,一同成為維持密閉真空室1真空之密閉機構。 又如圖2所示可於槽4 1内部設置供電點4 3、4 4,例如可 ® 從槽4 1内部供電於槽形天線4。由此,從槽形天線4產生電 漿P側看,表面側分布高頻電流,而可得有效將供給槽形 天線4之電力傳給電漿P之效果。 如圖1所示槽形天線4,以由裝有0環1 b之真空室1之絕緣 部分1 c與真空室1絕緣之狀態裝於真空室1 。而槽4 1之供電 點4 3依序連接匹配箱2 6、R F振盪器5,供電點4 4被接地成 為接地電位。 如圖1所示槽形天線4上方,配置箱狀導體之鋁屏蔽4a, 而鋁屏蔽4a藉石英、陶瓷等而成之電介質4c與槽形天線4 絕緣之狀態配置。依此構造,由槽4 1發射之電磁場無法達φ 到上方僅傳至下方,能有效將電磁波送進真空室1,並可 絕緣槽形天線4。此外,鋁屏蔽4a與真空室1互相連接以避 免此等内部電磁波洩至外部。又絕緣體4c若鋁屏蔽4a與槽Page 15 579661 V. Description of the invention (13) Dielectric material 18 made of quartz and ceramic. An aluminum shield 4a is provided on the upper side of the slot antenna 4 to cover the slot antenna 4. A slot 41 is provided in the central portion of the slot antenna 4 in plan view, and a power supply point 4 3, 4 4 for the slot antenna 4 is provided near the slot 41. -The groove 4 1 is as described later, and can form a plasma / impedance shape even at a low power supply frequency. The opening of the groove 4 1 is shown in Figure 2 and the outside of the vacuum chamber 1 is located: The position covers the groove 4 1 as viewed from the plane. Continuously arranged sealed dielectric to slot 41: mass (dielectric) 2 5. Dielectrics made of quartz and ceramics, hermetically sealed dielectrics 25, and 0-rings 4b, such as 0-rings 4b, are located on the surface of the slot antenna 4 outside the slot 41 as viewed in plan, and together they become a sealing mechanism for maintaining the vacuum of the sealed vacuum chamber 1. As shown in FIG. 2, a power supply point 4 3, 4 4 can be set inside the slot 41, for example, the slot antenna 4 can be powered from the inside of the slot 41. Therefore, when the plasma P is generated from the slot antenna 4 and a high-frequency current is distributed on the surface side, the effect of effectively transmitting the power supplied to the slot antenna 4 to the plasma P can be obtained. As shown in FIG. 1, the slot antenna 4 is installed in the vacuum chamber 1 in a state where the insulating portion 1c of the vacuum chamber 1 equipped with the 0 ring 1b is insulated from the vacuum chamber 1. The power supply point 4 3 of the slot 41 is sequentially connected to the matching box 2 6 and the RF oscillator 5, and the power supply point 4 4 is grounded to a ground potential. As shown in FIG. 1, an aluminum shield 4 a of a box conductor is arranged above the slot antenna 4, and a dielectric 4 c made of quartz, ceramic, or the like for the aluminum shield 4 a is arranged in a state of being insulated from the slot antenna 4. According to this structure, the electromagnetic field emitted by the slot 41 cannot reach φ to the top and only to the bottom, which can effectively send electromagnetic waves into the vacuum chamber 1 and can insulate the slot antenna 4. In addition, the aluminum shield 4a and the vacuum chamber 1 are connected to each other to prevent these internal electromagnetic waves from leaking to the outside. Insulator 4c if aluminum shield 4a and slot

第16頁 579661 五、發明說明(14) 形天線4成絕緣狀態,亦可不設。 而槽4 1内部之供電點43 ,以絕緣狀態貫穿鋁屏蔽4a,由 匹配箱2 6、RF振盪器5後續之同軸管供電。 又加工處理載物台1 1亦依序連接載物台偏壓用匹配箱 - 27、RF振盪器28。又此等RF振盪器5、28能振盪數KHz〜100 : Κ Η z程度之低供電頻率,最好能振盪工業用頻率1 3 . 5 6 Κ Η z : ,或其整數倍之27.12 KHz、或40.68 KHz中選擇之頻率 : 者。 將上述構造之電漿處理裝置使用於例如實施光致抗蝕之 研磨處理時,用真空泵3將真空室1内排氣為約數MTorr·〜數 Torr後,導入02氣並從RF振盪器5將高頻施加於槽形天線 ® 4。則從槽形天線4之槽4 1發射電磁波於真空室1内產生電 漿P,〇2氣與電漿P中離解產生之氧基與半導體晶圓W上之 光蝕劑引起化學反應,分解,氣化去除光蝕劑。 本實施形態之電漿處理裝置係於1片導體板(槽形天線)4 上,如後述將槽4 1形成具有低供電頻率時亦可產生電漿之 阻抗之形狀,且與並聯配置多數槽形天線時同樣增加電磁 發射面之形態。由於可使真空室1内電磁場強度分布均勻 化,故容易控制電漿密度之均勻性,並能仍舊維持電漿密 度之均勻性謀求電漿之大口徑化。結果,依本實施形態之 電漿處理裝置,可均勻處理大口徑之半導體晶圓,可成為 φ 對大口徑化良好之電漿處理裝置。 又因槽形天線4為面狀天線,故使槽形天線4為真空室1 之一部分,同時使天線導體為圓筒面狀構造,半球面狀構Page 16 579661 V. Description of the invention (14) The antenna 4 can be insulated, or it can be omitted. The power supply point 43 inside the slot 41 penetrates the aluminum shield 4a in an insulated state, and is powered by the coaxial tube subsequent to the matching box 26 and the RF oscillator 5. The processing stage 11 is also connected to the stage bias matching box-27 and RF oscillator 28 in order. These RF oscillators 5 and 28 can oscillate a number of KHz ~ 100: a low power supply frequency of κ Η z, preferably industrial frequency 1 3. 5 6 Κ Η z:, or an integral multiple of 27.12 KHz, Or the frequency selected from 40.68 KHz: When the plasma processing apparatus having the above structure is used, for example, to perform a polishing process of photoresist, the vacuum chamber 1 is evacuated to a number of MTorr · ~ Torr with a vacuum pump 3, and then 02 gas is introduced and the RF oscillator 5 High frequencies are applied to the slot antenna® 4. Then, electromagnetic waves are emitted from the slot 41 of the slot antenna 4 and the plasma P is generated in the vacuum chamber 1. The oxygen generated from the dissociation of the 02 gas and the plasma P and the photoresist on the semiconductor wafer W cause a chemical reaction and decomposition. , Gasification to remove photoresist. The plasma processing device of this embodiment is provided on a single conductor plate (slot antenna) 4. As will be described later, the slot 41 is formed into a shape that can generate plasma impedance even at a low power supply frequency, and a plurality of slots are arranged in parallel When the antenna is shaped, the form of the electromagnetic emission surface is also increased. Since the electromagnetic field intensity distribution in the vacuum chamber 1 can be made uniform, it is easy to control the uniformity of the plasma density, and it is possible to maintain the uniformity of the plasma density to achieve a larger diameter of the plasma. As a result, according to the plasma processing apparatus of this embodiment, a large-diameter semiconductor wafer can be uniformly processed, and it can be a plasma processing apparatus with a good φ-to-large-caliber conversion. Since the slot antenna 4 is a planar antenna, the slot antenna 4 is a part of the vacuum chamber 1, and the antenna conductor is a cylindrical surface structure and a hemispherical structure.

第17頁 579661 五、發明說明(15) 造,折面等,增加内部產生之電漿P之密度,並適切選擇 槽4 1之形狀,即可使對槽形天線4之供電點4 3為1處,並使 前述導體為接地電位。又因此,無需兼真空維持密封之目 的於槽形天線4與真空容器1間設置電介質,可自由設定電 -漿P與槽形天線4之間隔,槽形天線4之表面積,增進電漿P * 與槽形天線4之磁性或靜電結合之控制性。結果,電磁發 . 射面增大,槽形天線4與電漿P之結合變密,而可謀求供電 _ 效率之提高與電漿P之大口徑化。 圖3至圖3 3分別表示成對立槽形天線(a )與具有其對偶性 之線狀天線(b )。 槽4 1係將圖3 ( a )所示平面狀槽形天線4之導體所設矩形 ® 狀基本槽4 1形狀,利用依據巴比奈特(B a b i n e t)原理之線 狀天線間之電磁場之對偶性,依據圖3 ( b )所示線狀天線 4 Γ之解析,具有相位幾何學之聯合性,且仍舊保持磁流 源天線之特性,如圖4至圖3 3所示變形為2次元構造或3次 元構造,並成為具有低供電頻率時亦能產生電漿之阻抗之 形狀。在此,由分別設定之槽4 1之形狀,對前述槽形天線 4之供電點23、24設定為2處至4處,或供電點23為1處將前 述導體設定於接地電位。由此,增進槽形天線4之阻抗及 與電聚之磁性結合性。 構成例 _ 以下說明各構造例。 圖4所示構造例係槽4 1形成橫長之略匚字狀,其底部附 近内側設置供電點4 3,又外側設有供電點4 4。此構造例與Page 17577966 V. Description of the invention (15) Fabrication, folding surface, etc., increase the density of the plasma P generated internally, and appropriately select the shape of the slot 41, so that the power supply point 4 3 of the slot antenna 4 is At one place, and the conductor is made to ground potential. Therefore, it is not necessary to set a dielectric between the slot antenna 4 and the vacuum container 1 for the purpose of maintaining the vacuum, and the gap between the electro-plasma P and the slot antenna 4 can be set freely. The surface area of the slot antenna 4 can improve the plasma P * Controllability in combination with the magnetic or electrostatic of the slot antenna 4. As a result, the electromagnetic emission surface is increased, and the combination of the slot antenna 4 and the plasma P is dense, so that the power supply efficiency can be improved and the diameter of the plasma P can be increased. Figures 3 to 33 show the paired slot antenna (a) and the linear antenna (b) with duality. Slot 4 1 is a pair of rectangular ® shaped basic grooves 4 1 formed by the conductors of the planar slot antenna 4 shown in FIG. 3 (a), using the electromagnetic field between linear antennas based on the principle of Babinet According to the analysis of the linear antenna 4 Γ shown in FIG. 3 (b), it has the unity of phase geometry and still maintains the characteristics of the magnetic current source antenna. As shown in FIGS. 4 to 33, it is transformed into a two-dimensional structure. Or it has a three-dimensional structure and has a shape that can generate plasma impedance even at a low power supply frequency. Here, the power supply points 23, 24 of the slot antenna 4 are set to two to four, or the power supply point 23 is set to the ground potential by the shape of the slot 41 set separately. Thereby, the impedance of the slot antenna 4 and the magnetic binding property with the electrocondensation are improved. Configuration Examples _ Each configuration example is described below. In the structural example shown in Fig. 4, the trough 41 is formed in a horizontally long, slightly sloping shape. A power supply point 4 3 is provided near the bottom of the bottom, and a power supply point 4 4 is provided on the outside. This construction example is related to

第18頁 579661 五、 發明說明(16) 圖 3所示基本形狀比較 ,可將其長度尺寸 設 定 為略一半以 下 〇 圖5所示構造例係槽4 1形成橫長之略Η字狀: ,其中央位置 士iL δ又 置供 電點4 3 '44 〇 此 構造例亦與圖4者 同 樣 與圖3所示基 本 形狀 比較, 可將其長 度尺寸設定為略- -半以下。 圖6所示構造例係槽4 1形成方形旋渦略 雷 紋 狀,其中央 位 恶孑fL 直δ又 置供電 點 2 3、2 4 。此構造例由設定1 條 槽4 1之管曲 部 分個 數,可 得所需槽 4 1之長度增加電磁發射面,並可增 加 槽4 1 之平面 密度,可 增加產生之電漿Ρ 之 密 度,且可得 平 面視 矩形狀 略均勻產 生之電漿Ρ。因此 真 空室1之平面 形 狀為 矩形狀 時,可使 真空室1内部之電 漿Ρ之密度均勻 化 〇 圖7所示構造例係槽4 1形成將4分之3圓 弧 互 相逆向連接 成 略S字狀,其中央位置設置供電點2 3、 24 〇 此構造例因 無 彎曲 部分, 故可增進 發射電波之強度密度均勻性,並與 圖 3所示基本形狀比較 ,可將其長度尺寸 — ά又 定 為略一半以 下 〇 圖8 ' 、圖9所 示構造例 係槽4 1形成從圖7 所 示 構造例向供 電 點4 3 、44周 圍旋進之 形狀。在此,圖8 之 構 造例係形成 半 圓弧 與以此 半圓弧之 直徑為半徑之4分 圓 弧 連接之形 狀 ,而 圖9之構造例係形成圖8之構造例連接同形4分圓, 並 連接 以此4分圓弧之直徑為半徑之半圓 弧 之 形狀。此等 構 造例 呈現與 圖7所示構造例相同性能, 更 可 增加槽4 1之 平 面密 度,發 射電波之 強度密度均勻性之增進,可謀求強Page 18579661 V. Description of the invention (16) In comparison with the basic shape shown in FIG. 3, the length dimension can be set to be slightly less than half. The structural example 4 shown in FIG. 5 is formed in a horizontally long shape:, The central position iL δ is also set to the power supply point 4 3 '44. This structural example is also the same as that shown in Fig. 4 and compared with the basic shape shown in Fig. 3, and its length can be set to slightly--half or less. In the structural example shown in Fig. 6, the groove 41 is formed into a square vortex with a slightly thunder-like pattern, and its central position is fL, and δ is also provided with a power supply point 2 3, 2 4. In this structural example, by setting the number of curved parts of one slot 41, the required length of slot 41 can be increased to increase the electromagnetic emission surface, and the planar density of slot 41 can be increased, which can increase the density of the generated plasma P. , And can be obtained in a plane view of the rectangular shape of a slightly uniform plasma P. Therefore, when the planar shape of the vacuum chamber 1 is rectangular, the density of the plasma P inside the vacuum chamber 1 can be made uniform. The structural example shown in FIG. 7 is that the groove 4 1 is formed to connect three-quarters of the arcs in reverse to each other. S-shaped, with a power supply point 2 3, 24 in the center. This structure example has no curved parts, so it can improve the uniformity of the intensity density of the emitted radio waves. Compared with the basic shape shown in Figure 3, its length can be measured— It is determined to be slightly less than half. Fig. 8 'and Fig. 9 show that the groove 41 in the structural example shown in Fig. 7 is formed in a shape that rotates around the power supply points 4 3 and 44 from the structural example shown in Fig. 7. Here, the structural example of FIG. 8 is formed into a shape connecting a semi-circular arc and a four-point circular arc with the diameter of the semi-circular arc as a radius, and the structural example of FIG. 9 is formed into a structural example of FIG. And connect the shape of the semi-circular arc with the diameter of the 4-point arc as the radius. These construction examples exhibit the same performance as that of the construction example shown in FIG. 7, and can further increase the planar density of the groove 41, and improve the uniformity of the intensity density of the transmitted radio waves.

第19頁 579661 五、發明說明(17) 度密度均勻性之增進。 上述圖4至圖9所示構造例,依靠阻抗之增加及與電漿之 磁性結合之增進,槽形天線4之代表長度為數1 0公分之級 數(〇 r d e r )時,可利用於R F數1 Ο Μ Η z級數之較低R F頻率之 電漿產生之應用。 圖1 0所示構造例係槽4 1形成十字狀,其中央位置設置4 處供電點43、43、44、44。在此,供電點43、43被連接於 匹配箱2 6、RF振盪器5。本構造例具有並聯2個圖3所示直 線狀槽4 1之構造,因輸出加大且比並聯2個之槽4 1各供電 點4 3、4 3、4 4、4 4之位置接近,故無需設置相位校正器 等。 圖1 1至圖1 3所示構造例,與圖1 0所示構造例同樣,將槽 4 1形成十字狀,且與圖6至圖9所示構造例同樣,形成以略 雷紋狀或旋渦狀旋進供電點4 3、4 4周圍之形狀。本構造例 與圖1 0所示構造例同樣,具有並聯2個圖3所示直線狀槽4 1 之構造,輸出加大且與圖6至圖9所示槽造例同樣,可增加 槽4 1之平面密度,發射電波之強度密度均句性之增進,可 謀求強度密度均勻性之增進。 圖1 4、圖1 5所示構造例,與圖7、圖1 2所示構造例同樣 由圓弧構成,惟延長其前端部,並連接以供電點4 3、4 4附 近半圓弧直徑為半徑之圓弧者。此構造例因無彎曲部分, 故可增進發射電波之強度密度均勻性,並因外形為圓形, 故真空室1之平面形狀為圓形時,可將真空室1内部之電漿 Ρ之密度均勻化至其周邊部。Page 19 579661 V. Description of the invention (17) The uniformity of degree density is improved. The structural examples shown in Fig. 4 to Fig. 9 described above can be used for the RF number when the representative length of the slot antenna 4 is a series of number 10 cm (〇rder) depending on the increase in impedance and the magnetic combination with the plasma. Application of plasma generation at lower RF frequency of 10 Μ Η z series. In the structural example shown in FIG. 10, the trough 41 is formed in a cross shape, and four power supply points 43, 43, 44, 44 are provided at the center position. Here, the power supply points 43 and 43 are connected to the matching box 26 and the RF oscillator 5. This structural example has a structure in which two linear grooves 4 1 shown in FIG. 3 are connected in parallel, because the output is larger and closer to each of the power supply points 4 3, 4 3, 4 4, 4 4 than in parallel to the two grooves 4 1 in parallel, Therefore, there is no need to install a phase corrector or the like. The structural examples shown in FIGS. 11 to 13 are the same as the structural example shown in FIG. 10, and the grooves 41 are formed into a cross shape, and similar to the structural examples shown in FIGS. 6 to 9, the grooves 1 are formed in a slightly thunder pattern or Swirl into the shape around the power points 4 3, 4 4. This structural example is the same as the structural example shown in FIG. 10, and has a structure in which two linear grooves 4 1 shown in FIG. 3 are connected in parallel. The output is increased and the groove 4 can be increased in the same way as the groove shown in FIGS. 6 to 9. The planar density of 1 and the intensity density of the transmitted radio waves are both improved, and the uniformity of the intensity density can be improved. The structural examples shown in Figures 1 and 15 are similar to the structural examples shown in Figures 7 and 12 in the form of a circular arc, but the front end is extended and connected to the diameter of the semicircular arc near the power supply points 4 3, 4 4 It is the arc of the radius. In this structural example, since there is no curved portion, the uniformity of the intensity and density of the emitted radio waves can be improved, and because the shape is circular, so when the planar shape of the vacuum chamber 1 is circular, the density of the plasma P inside the vacuum chamber 1 can be increased. Homogenize to the periphery.

第20頁 579661Page 579661

五、 發明說明(18) 圖1 6 係 先前 之 折 疊 式 槽 形天 線’為設 定圖1 4 ’圖1 5 ’ 圖 17 至 圖 19 之構 造 例 之 形 狀 時成 為其基本 之形狀。此形成 溝 之 端 部 間 連接 之 長 方 形 環 狀, 有槽外側 導體與槽内側導 體 存 在 〇 圖 14 所 示構 造 例 j 係 1個外導體與2個 中導體藉槽4 1配 置 成 如 太 極 花樣 之 構 造 〇 因 導體 分為3部故供電點可為2處2 極 供 電 或3極供電 0 圖 17 、 圖18 所 示 構 造 例 ,與 圖1 6構造 例同樣,為槽4 1 外 側 導 體 與 槽41 内 側 導 體 存 在之 浮島型, 圖1 7具有圓形、 圖 18 具 有 方 形之 外 形 〇 此 構 造例 與圖9、圖1 1之構造例同 樣 > 可 增 力口才曹4 1 之 平 面 密 度, 發射電波 之強度密度均勻 性 之 增 進 可謀 求 強 度 密 度 均勻 性之增進 ,且雖供電點4 3 被 連 接 於 匹 配箱 26 \ RF 振 盪 器5 ,惟亦可不設供電點4 4,此 時 槽 形 天 線4最外側設定於接地電位即可。故構成真空室1 一 部 分 之 槽形 天 線4, 無需考慮絕緣性, 構造可更簡化, 而 可 謀 求 製造 成 本 之 削 減 〇此 外,圖1 7 、圖1 8之構造例 係 將 槽4 1 配 置成 如 套 匣 式 迷 宮, 此構造能 以小面積賺取大 阻 抗 0 圖 19 之 構造 例 亦 將 圖 7所示構造例形成上述浮島型者, > 具 有 與 上 述同 樣 特 徵 〇 圖 14 至 圖19 所 示 構 造 例 ,能 以自行諧 振狀態利用槽形 天 線4 ,若槽形天線4 之 代 表 長度 為數1 0公 分級數時,即適 於 RF 數1 0 0 Μ Η z級數之較高頻率之槽形天線之利用。 圖 20 至 圖25 所 示 構 造 例 ,係 將構成槽 形天線4之導體形 第21頁 579661 五、發明說明(19) 成為3次元圓筒狀者。 圖2 0所示構造例係圖3所示構造例之變形例,圖2 1所示 構造例係圖1 6所示構造例之變形例,圖2 2所示構造例係圖 6所示構造例之變形例,圖2 3所示構造例係圖9所示構造例 之變形例,圖2 4所示構造例係圖1 0所示構造例之變形例, 圖2 5所示構造例係圖1 1所示構造例之變形例。 圖2 0至圖2 5所示構造例,具有與圖3至圖1 9所示變形之 基本之構造例同樣特徵,並由於於此圓筒内部產生電漿, 可使電漿產生密度在空間上比圖3至圖1 9所示平面形狀(2 次元構造)增加。 圖2 6至圖2 9所示構造例,係將構成槽形天線4之導體形 成為3次元球面形狀者。 圖2 6所示構造例係圖9所示構造例之變形例,圖2 7所示 構造例係圖1 0所示構造例之變形例,圖2 8所示構造例係圖 1 2所示構造例之變形例,圖2 9所示構造例係圖1 7所示構造 例之變形例。 圖2 6至圖2 9所示構造例,具有與圖3至圖1 9所示變形之 基本之構造例同樣特徵,並由於於此圓筒内部產生電漿, 可使電漿產生密度在空間上比圖3至圖1 9所示平面形狀(2 次元構造)增加,更可使電漿產生密度在空間上比圖2 0至 圖2 5所示構造例增加。 尤其於圖2 8 ,圖2 9所示構造例,可使電漿P產生密度之 增加,槽形天線4絕緣性之增進,及真空室1之構造材料之 構造特性極為優異。V. Description of the Invention (18) Figure 16 is the basic shape of the previous folding groove-shaped antenna. This rectangular ring connecting the ends of the grooves has a groove outer conductor and a groove inner conductor. The structural example j shown in FIG. 14 is an outer conductor and two middle conductors. The grooves 41 are arranged as a Tai Chi pattern. Structure 〇 Because the conductor is divided into three parts, the power supply point can be two-pole power supply or three-pole power supply. The structural examples shown in Figure 17 and Figure 18 are the same as the structural examples in Figure 16 and are the groove 4 1 and the outer conductor 41 The floating island type in which the inner conductor exists has a round shape in FIG. 17 and a square shape in FIG. 18. This structural example is the same as the structural example of FIG. 9 and FIG. 1. The improvement of the intensity density uniformity can be achieved, and although the power supply point 4 3 is connected to the matching box 26 \ RF oscillator 5, the power supply point 4 4 may not be set. At this time, the slot antenna 4 is the most The outside can be set to the ground potential. Therefore, the slot antenna 4 constituting a part of the vacuum chamber 1 does not need to consider the insulation property, and the structure can be simplified, and the manufacturing cost can be reduced. In addition, the configuration examples of FIG. 17 and FIG. Box-type labyrinth, this structure can earn large impedance in a small area. The structure example of FIG. 19 also forms the structure example shown in FIG. 7 into the above floating island type. ≫ Has the same characteristics as above. Figures 14 to 19 In the structure example, the slot antenna 4 can be used in a self-resonant state. If the representative length of the slot antenna 4 is a number of 10 common steps, it is suitable for a slot with a higher frequency of the RF number 10 0 Μ Η z series. Use of antennas. The construction examples shown in Figs. 20 to 25 are those in which the conductor shape of the slot antenna 4 is formed. Page 21 579661 V. Description of the invention (19) is a three-dimensional cylindrical shape. The structural example shown in FIG. 20 is a modified example of the structural example shown in FIG. 3, the structural example shown in FIG. 21 is a modified example of the structural example shown in FIG. 16, and the structural example shown in FIG. 22 is a structure shown in FIG. The structural example shown in FIG. 23 is a modified example of the structural example shown in FIG. 9, the structural example shown in FIG. 24 is a modified example of the structural example shown in FIG. 10, and the structural example shown in FIG. FIG. 11 is a modification of the structural example. The structural examples shown in Figs. 20 to 25 have the same characteristics as the basic structural examples of the deformation shown in Figs. 3 to 19, and because the plasma is generated in this cylinder, the density of the plasma can be generated in the space. This is more than the planar shape (2-dimensional structure) shown in Fig. 3 to Fig. 19. The structural examples shown in Figs. 26 to 29 are those in which the conductors constituting the slot antenna 4 are formed into a three-dimensional spherical shape. The structural example shown in FIG. 2 is a modified example of the structural example shown in FIG. 9, the structural example shown in FIG. 7 is a modified example of the structural example shown in FIG. 10, and the structural example shown in FIG. 2 is shown in FIG. 12. A modification of the structure example, the structure example shown in FIG. 2 to 9 is a modification example of the structure example shown in FIG. 17. The structural examples shown in FIG. 2 to FIG. 29 have the same characteristics as the basic structural examples of the deformation shown in FIG. 3 to FIG. 19, and because the plasma is generated in this cylinder, the density of the plasma can be generated in the space. The increase in the planar shape (two-dimensional structure) shown in Figs. 3 to 19 can increase the density of plasma generation in space more than the structural examples shown in Figs. 20 to 25. In particular, the structural examples shown in FIGS. 28 and 29 can increase the density of the plasma P, improve the insulation of the slot antenna 4, and the structural characteristics of the construction material of the vacuum chamber 1 are extremely excellent.

第22頁 579661 五、發明說明(20) 圖3 0至圖3 3所示構造例,係將構成槽形天線4之導體形 成為2次元構造之平面組合成3次元折曲平面形狀者。 圖3 0所示構造例係圖3所示構造之變形例,於折線L折成 2平面之槽形天線4導體配置跨折線L之槽4 1,並於折線L上 配置供電點4 3、4 4者。本構造例具有與圖3所示變形之基 本之構造同樣特徵,並可使電漿產生密度在空間上比圖3 所示平面形狀(2次元構造)增加。 圖3 1所示構造例係圖5所示構造之變形例,於折線L折成 2平面之槽形天線4導體配置跨折線L之槽4 1,並於折線L上 配置供電點4 3、4 4者。本構造例具有與圖5所示變形之基 本之構造例同樣特徵,並可使電漿產生密度在空間上比圖 5所示平面形狀(2次元構造)增加。 圖3 2所示構造例係圖1 4所示構造之變形例,將槽4 1之外 形形成方形,於折線L折成2平面之槽形天線4導體配置跨 折線L,並於折線L上配置供電點4 3、4 4者。本構造例具有 與圖1 4所示變形之基本之構造例同樣特徵,且具有與外形 為方形者同樣特徵,並可使電漿產生密度在空間上比圖1 4 所示平面形狀(2次元構造)增加。 圖3 0至圖3 2所示構造例,例如可於立方體狀真空室1 , 與設於其中央部之其他構造構成之槽形天線4組合配置於 周緣部使用,此時更可謀求產生電漿大口徑化與電漿密度 之均勻化。 圖3 3所示構造例係圖1 0所示構造之變形例,於折線L 2折 成錐形4平面之槽形天線4導體配置槽4 1中心部分位於頂點Page 22 579661 V. Description of the invention (20) The structural examples shown in FIGS. 30 to 33 are those in which the conductors constituting the slot antenna 4 have a two-dimensional structure and are combined into a three-dimensionally bent plane shape. The structural example shown in FIG. 3 is a modified example of the structure shown in FIG. 3. The slot antenna 4 that is folded into two planes on the fold line L is provided with a slot 41 that crosses the fold line L, and a power point 4 is provided on the fold line L 3. 4 4 of them. This structural example has the same characteristics as the basic structure deformed as shown in FIG. 3, and can increase the density of plasma generation spatially than the planar shape (two-dimensional structure) shown in FIG. The structural example shown in FIG. 3 is a modified example of the structure shown in FIG. 5. The conductor 4 of the slot antenna 4 folded into two planes on the fold line L is provided with a groove 41 across the fold line L, and a power supply point 4 is provided on the fold line L 3. 4 4 of them. This structural example has the same characteristics as the modified basic structural example shown in FIG. 5, and can increase the plasma generation density in space than the planar shape (two-dimensional structure) shown in FIG. 5. The structural example shown in FIG. 3 is a modified example of the structure shown in FIG. 14. The groove 41 is formed in a square shape, and the slot antenna 4 folded into two planes on the fold line L is arranged across the fold line L and on the fold line L. Configure power supply points 4 3, 4 and 4. This structural example has the same characteristics as the basic structural example of the deformation shown in FIG. 14, and has the same characteristics as those with a square shape, and can make the plasma generation density spatially larger than the planar shape shown in FIG. Construction) increase. Examples of the structure shown in FIGS. 30 to 32 can be used in a cube-shaped vacuum chamber 1 in combination with a slot antenna 4 of another structure provided in the central portion of the cube-shaped vacuum chamber 1 to generate electricity. Large diameter of plasma and uniform plasma density. The structural example shown in FIG. 3 is a modified example of the structure shown in FIG. 10. The slot antenna is folded at the fold line L 2 into a tapered 4 plane. The conductor arrangement groove 41 is located at the vertex.

579661 五、發明說明(21) 部位置者。本構造例具有與圖1 0所示變形之基本之構造同 樣特徵,並可使電漿產生密度在空間上比圖1 0所示平面形 狀(2次元構造)增加。 圖4至圖3 3所示構造例,係本發明有關之槽形天線形態 變化之一例,磁流源天線之前述槽形天線之前述導體形狀 及前述槽之形狀,利用依據巴比奈特原理之線狀天線間之 電磁場之對偶性,設定為增加内部產生之電漿密度之形狀 構造,若形成具有低供電頻率時亦可產生電漿之阻抗之形 狀,則其他構造亦可,槽形天線之變形亦可適用於其他各 種形態。 依本實施形態,可提供即使低頻率亦無需加大槽形天線 之尺寸而可防止阻抗之下降,且能增進電漿與磁性結合之 槽形天線之形態。由此,可使用產生波長較長之電磁波動 之發送器,又亦可抑制因真空容器中電磁波動干擾之電漿 產生之不均勻性。 又因無需為了密閉真空容器而於電漿與槽形天線間設置 電介質,故可任意設定電漿與槽形天線間隔,抑制電漿點 燈關連之滲透電位之控制性,可謀求電漿與槽形天線之磁 性結合之增進,結合面積之加大,供電效率之提高,並可 謀求電漿之大口徑化。 又本實施形態之對槽形天線4之供電頻率為約1 0 0 MHz以 下,惟並不限於此範圍,發生之電磁波為U H F帶之高頻亦 可,此時,前述浮島型槽形天線4,可構成將供電點4 3之 未連接部分為接地電位,無絕緣槽形天線4用電介質1 c、579661 V. Description of the invention (21) This structural example has the same characteristics as the basic structure of the deformation shown in Fig. 10, and can increase the density of plasma generation in space than the planar shape (two-dimensional structure) shown in Fig. 10. The structural examples shown in FIG. 4 to FIG. 3 are examples of changes in the shape of the slot antenna related to the present invention. The shape of the aforementioned conductor and the shape of the aforementioned slot antenna of the magnetic current source antenna are based on the Barbinite principle. The duality of the electromagnetic field between the linear antennas is set to a shape structure that increases the density of the plasma generated internally. If it has a shape that can also generate the impedance of the plasma at a low power supply frequency, other structures are also possible. Deformation can also be applied to various other forms. According to this embodiment, it is possible to provide a form of a slot antenna that can prevent a drop in impedance without increasing the size of the slot antenna even at a low frequency, and can improve the combination of plasma and magnetic. Therefore, it is possible to use a transmitter that generates a long-wave electromagnetic wave, and also suppress the non-uniformity caused by the plasma interference caused by the electromagnetic wave in the vacuum container. Since there is no need to set a dielectric between the plasma and the slot antenna in order to seal the vacuum container, the interval between the plasma and the slot antenna can be set arbitrarily, and the controllability of the penetration potential related to the plasma lighting can be suppressed. The magnetic combination of the antenna is improved, the combined area is increased, the power supply efficiency is improved, and the diameter of the plasma can be increased. The power supply frequency of the slot antenna 4 in this embodiment is below 100 MHz, but it is not limited to this range. The electromagnetic wave generated may be a high frequency of the UHF band. At this time, the floating island slot antenna 4 described above , Can constitute the unconnected part of the power supply point 43 to the ground potential, the dielectric 1 c,

第24頁 579661 五、發明說明(22) 4 c等構造。 又使RF振盪器5為可變振盪頻率,並將供電於槽形天線4 之頻率為可變加以設定,此時,隨著供電頻率之變化,移 動槽形天線4之供電點4 3、4 4之設置位置加以設定,即可 使槽形天線4發射之電磁波強度等狀態最佳化,謀求產生 電漿之大口徑化,並謀求密度等,電漿產生狀態之增進。 又上述構造外,於本發明之主旨範圍内亦可改變構造, 而可適用由電介質1 8密閉真空容器之構造,於槽形天線形 成2處以上之槽4 1並以串聯或並聯連接此等之構造,將鋁 屏蔽4a與槽形天線4 一體形成之構造等。 圖式之簡單說明 圖1係依照本發明之電漿產生裝置及電漿處理裝置之一 實施形態正面圖。 圖2係圖1之槽渠附近平面圖。 圖3係槽形天線之平面圖。 圖4係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖5係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖6係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖7係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖8係本發明有關之電漿產生裝置及電漿處理裝置之槽Page 24 579661 V. Description of the invention (22) 4 c and other structures. The RF oscillator 5 is set to a variable oscillation frequency, and the frequency of the power supplied to the slot antenna 4 is set to be variable. At this time, as the power supply frequency changes, the power supply points 4 3 and 4 of the slot antenna 4 are moved. Setting the setting position of 4 can optimize the electromagnetic wave intensity and other states emitted by the slot antenna 4, and seek to increase the diameter of the plasma generation, and to increase the density, etc., to improve the generation state of the plasma. In addition to the above structure, the structure can be changed within the scope of the subject matter of the present invention, and a structure in which a vacuum container is sealed by a dielectric 18 can be applied. Two or more slots 41 can be formed in a slot antenna and connected in series or parallel. The structure is a structure in which the aluminum shield 4a and the slot antenna 4 are integrally formed. Brief Description of the Drawings Figure 1 is a front view of one embodiment of a plasma generating device and a plasma processing device according to the present invention. FIG. 2 is a plan view near the trench of FIG. 1. Figure 3 is a plan view of a slot antenna. Fig. 4 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. Fig. 5 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. Fig. 6 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. Fig. 7 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. FIG. 8 is a tank of a plasma generating device and a plasma processing device related to the present invention.

579661 五、發明說明(23) 形天線構造例平面圖。 圖9係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖1 0係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖1 1係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖1 2係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖1 3係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖1 4係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖1 5係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖1 6係折疊式槽形天線例平面圖。 圖1 7係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖1 8係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖1 9係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例平面圖。 圖2 0係本發明有關之電漿產生裝置及電漿處理裝置之槽 形天線構造例透視圖。579661 V. Explanation of the invention (23) Plane structure example. Fig. 9 is a plan view showing a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. FIG. 10 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. FIG. 11 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. Fig. 12 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. Fig. 13 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. Fig. 14 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. Fig. 15 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. Figure 16 is a plan view of an example of a 6-series folded slot antenna. Fig. 17 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. FIG. 18 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. Fig. 19 is a plan view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention. Fig. 20 is a perspective view of a structural example of a slot antenna of a plasma generating device and a plasma processing device according to the present invention.

579661 五、發明說明(24) 圖2 1係本發明有關之電 形天線構造例透視圖。 圖2 2係本發明有關之電 形天線構造例透視圖。 圖2 3係本發明有關之電 形天線構造例透視圖。 圖2 4係本發明有關之電 形天線構造例透視圖。 圖2 5係本發明有關之電 形天線構造例透視圖。 圖2 6係本發明有關之電 形天線構造例透視圖。 圖2 7係本發明有關之電 形天線構造例透視圖。 圖2 8係本發明有關之電 形天線構造例透視圖。 圖2 9係本發明有關之電 形天線構造例透視圖。 圖3 0係本發明有關之電 形天線構造例透視圖。 圖3 1係本發明有關之電 形天線構造例透視圖。 圖3 2係本發明有關之電 形天線構造例透視圖。 漿產生裝置及電漿處理裝置之槽 漿產生裝置及電漿處理裝置之槽 漿產生裝置及電漿處理裝置之槽 漿產生裝置及電漿處理裝置之槽 漿產生裝置及電漿處理裝置之槽 漿產生裝置及電漿處理裝置之槽 漿產生裝置及電漿處理裝置之槽 漿產生裝置及電漿處理裝置之槽 漿產生裝置及電漿處理裝置之槽 漿產生裝置及電漿處理裝置之槽 漿產生裝置及電漿處理裝置之槽 漿產生裝置及電漿處理裝置之槽579661 V. Description of the invention (24) Fig. 21 is a perspective view of a structural example of an electric antenna according to the present invention. Fig. 22 is a perspective view of an example of the construction of an electrical antenna according to the present invention. Fig. 23 is a perspective view showing an example of the construction of the electrical antenna according to the present invention. Fig. 24 is a perspective view of a structural example of the electric antenna according to the present invention. Fig. 25 is a perspective view showing an example of the construction of an electric antenna according to the present invention. Fig. 26 is a perspective view showing an example of the construction of an electric antenna according to the present invention. Fig. 27 is a perspective view showing an example of the construction of an electric antenna according to the present invention. Fig. 28 is a perspective view showing an example of the construction of the electrical antenna according to the present invention. Fig. 29 is a perspective view of a structural example of the electric antenna according to the present invention. Fig. 30 is a perspective view of a structural example of the electric antenna according to the present invention. Fig. 31 is a perspective view of a structural example of the electric antenna according to the present invention. Fig. 32 is a perspective view of a structural example of the electric antenna according to the present invention. Trough plasma generating device and plasma processing device, Trough plasma generating device and plasma processing device, Trough plasma generating device and plasma processing device, Trough plasma generating device and Plasma processing device, Trough plasma generating device, and Plasma processing device slot. Trough plasma generating device and plasma processing device, Trough plasma generating device and plasma processing device, Trough plasma generating device and plasma processing device, Trough plasma generating device and Plasma processing device, Trough plasma generating device, and Plasma processing device slot. Trough of pulp generating device and plasma processing device Trough of plasma generating device and plasma processing device

第27頁 579661 五、發明說明(25) 圖3 3係本發明有關之電漿產生裝置及電漿處理裝 置之槽 形天 圖 圖號 W. 線構造例透視圖。 34係先前之電漿產生裝置正面圖。 說明: •真空室(處理室) • 02氣供應源(氣體供應機構) .真空泵(排氣機構) .槽形天線(電漿產生機構) 2 8 ··· RF振盪器(高頻電源、電漿產生機構) •半導體晶圓(基板) .排氣口 14、1 5…閥 10. …排 氣 管 1 1 . • •加 工 處 理 載 物台 12. • •載 物 台 昇 降 器 13. • •氣 體 導 入 a 16· • •氣 體 導 入 管 17· • •清 除 氣 體 導 入管 18. • •電 介 質 25. • •密 封 電 介 質 (電介質) 26. …匹 配 箱 41 . • •槽 23 、24 、 、43 ' 、44. ..供電點Page 27 579661 V. Description of the invention (25) Fig. 3 3 is the groove shape of the plasma generating device and the plasma processing device related to the present invention. 34 is a front view of a previous plasma generating device. Description: • Vacuum chamber (processing chamber) • 02 Gas supply source (gas supply mechanism). Vacuum pump (exhaust mechanism). Slot antenna (plasma generation mechanism) 2 8 ··· RF oscillator (high frequency power supply, electricity (Plasma generation mechanism) • Semiconductor wafer (substrate). Exhaust ports 14, 1 5… valve 10.… exhaust pipe 1 1. • • Processing stage 12. • • Stage lifter 13. • • Gas introduction a 16 · • • Gas introduction pipe 17 · • • Clear gas introduction pipe 18. • • Dielectric 25. • • Sealed dielectric (dielectric) 26.… Matching box 41. • • Slots 23, 24, 43 ', 44 .. Power point

Claims (1)

579661 案號 89106543 曰 修正丰 六、申請專利範圍 1. 一種電漿產生裝置,其係包含:真空容器,可控制内 部壓力;氣體供應機構,將氣體供給真空容器内;及電漿 產生機構,向經導入氣體之前述真空容器内發射電磁波以 產生電漿;其特徵在於: 前述電漿產生機構包含:槽形天線,發射電磁波之槽 形成於導體,其槽形開口部處與開口面平行之磁場係在表 裏面抵消成為零;及交流電源,供電於槽形天線; 前述槽形天線為具有低供電頻率時亦可產生電漿之阻 抗之形狀,較之具有與上述真空容器代表長度相等之波長 的電磁波之頻率,該低供電頻率較小。 2. 如申請專利範圍第1項之電漿產生裝置,其中磁流源 天線之前述槽形天線,利用依據巴比奈特(Babinet)原理 之線狀天線間之電磁場之對偶性將前述導體形狀及前述槽 形狀設定為2次元構造或3次元構造。 3. 如申請專利範圍第1項之電漿產生裝置,其中磁流源 天線之前述槽形天線之前述導體形狀及前述槽形狀,利用 依據巴比奈特原理之線狀天線間之電磁場之對偶性設定為 增加内部產生之電漿密度之形狀。 4. 如申請專利範圍第2項之電漿產生裝置,其中磁流源 天線之前述槽形天線之前述導體形狀及前述槽形狀,利用 依據巴比奈特原理之線狀天線間之電磁場之對偶性設定為 增加内部產生之電漿密度之形狀。 5. 如申請專利範圍第1項之電漿產生裝置,其中前述槽 形天線之導體做為前述真空容器之一部分或全部構成。579661 Case No. 89106543 said amended Fengliu, patent application scope 1. A plasma generating device, which includes: a vacuum container, which can control the internal pressure; a gas supply mechanism to supply gas to the vacuum container; and a plasma generation mechanism, to An electromagnetic wave is emitted in the aforementioned vacuum container through which gas is introduced to generate a plasma; the plasma generating mechanism includes: a slot antenna; a slot for emitting electromagnetic waves is formed in the conductor; and a slot-shaped opening at a magnetic field parallel to the opening surface It is offset to zero in the table; and AC power is supplied to the slot antenna; the slot antenna is a shape that can generate plasma impedance when it has a low power supply frequency, compared with a wavelength equal to the length of the vacuum container representative The frequency of the electromagnetic wave, the low power supply frequency is small. 2. For example, the plasma generating device of the scope of application for the patent, wherein the aforementioned slot antenna of the magnetic current source antenna uses the duality of the electromagnetic field between the linear antennas according to the principle of Babinet to change the aforementioned conductor shape and The groove shape is set to a two-dimensional structure or a three-dimensional structure. 3. For example, the plasma generating device of the scope of patent application, in which the aforementioned conductor shape and the aforementioned slot shape of the aforementioned slot antenna of the magnetic current source antenna use the duality of the electromagnetic field between the linear antennas based on the Barbinite principle. The shape is set to increase the density of plasma generated inside. 4. For the plasma generating device in the second item of the patent application, wherein the aforementioned conductor shape and the aforementioned slot shape of the aforementioned slot antenna of the magnetic current source antenna use the duality of the electromagnetic field between the linear antennas based on the Barbinite principle. The shape is set to increase the density of plasma generated inside. 5. As for the plasma generating device in the scope of application for patent item 1, wherein the conductor of the aforementioned slot antenna is part or all of the aforementioned vacuum container. O:\63\63586-920509.ptc 第30頁 579661 _案號89106543_年月曰 修正_ 六、申請專利範圍 6 .如申請專利範圍第2項之電漿產生裝置,其中前述槽 形天線之導體做為前述真空容器之一部分或全部構成。 7 .如申請專利範圍第3項之電漿產生裝置,其中前述槽 形天線之導體做為前述真空容器之一部分或全部構成。 8 .如申請專利範圍第4項之電漿產生裝置,其中前述槽 形天線之導體做為前述真空容器之一部分或全部構成。 9 .如申請專利範圍第1項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於2處、3處、4處,此外,前述 供電點被設定於前述槽形天線之發射狀態最佳位置。 10.如申請專利範圍第2項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於2處、3處、4處,此外,前述 供電點被設定於前述槽形天線之發射狀態最佳位置。 1 1 .如申請專利範圍第3項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於2處、3處、4處’此外’前述 供電點被設定於前述槽形天線之發射狀態最佳位置。 1 2.如申請專利範圍第4項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於2處、3處、4處,此外,前述 供電點被設定於前述槽形天線之發射狀態最佳位置。 1 3.如申請專利範圍第5項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於2處、3處、4處,此外,前述 供電點被設定於前述槽形天線之發射狀態最佳位置。 1 4.如申請專利範圍第6項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於2處、3處、4處,此外,前述 供電點被設定於前述槽形天線之發射狀態最佳位置。O: \ 63 \ 63586-920509.ptc P.30 579661 _Case No. 89106543_ Years and months Amendment_ VI. Application for patent scope 6. For example, the plasma generation device of the second scope of patent application, where the aforementioned slot antenna The conductor is constructed as part or all of the aforementioned vacuum container. 7. The plasma generating device according to item 3 of the scope of patent application, wherein the conductor of the aforementioned slot antenna is formed as part or all of the aforementioned vacuum container. 8. The plasma generating device according to item 4 of the scope of patent application, wherein the conductor of the aforementioned slot antenna is formed as part or all of the aforementioned vacuum container. 9. The plasma generating device according to item 1 of the scope of patent application, wherein the power supply points to the aforementioned slot antenna are set at 2, 3, and 4; in addition, the aforementioned power supply point is set to the emission of the aforementioned slot antenna. Best position. 10. The plasma generating device according to item 2 of the scope of patent application, wherein the power supply points to the aforementioned slot antennas are set at two, three, and four locations, and in addition, the aforementioned power supply points are set to the emission of the aforementioned slot antennas. Best position. 1 1. The plasma generating device according to item 3 of the scope of patent application, wherein the power supply points to the aforementioned slot antenna are set at 2, 3, and 4 'in addition' the aforementioned power supply points are set to the aforementioned slot antenna The best position for launching. 1 2. The plasma generating device according to item 4 of the scope of patent application, wherein the power supply points to the aforementioned slot antennas are set at 2, 3, and 4; furthermore, the aforementioned power supply points are set to the aforementioned slot antennas. The best position for launching. 1 3. The plasma generating device according to item 5 of the scope of patent application, wherein the power supply points to the aforementioned slot antennas are set at 2, 3, and 4; in addition, the aforementioned power supply points are set to the aforementioned slot antennas. The best position for launching. 1 4. The plasma generating device according to item 6 of the patent application scope, wherein the power supply points to the aforementioned slot antennas are set at 2, 3, and 4; in addition, the aforementioned power supply points are set to the aforementioned slot antennas. The best position for launching. O:\63\63586-920509.ptc 第31頁 579661 _案號89106543_年月日__ 六、申請專利範圍 1 5 .如申請專利範圍第7項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於2處、3處、4處,此外,前述 供電點被設定於前述槽形天線之發射狀態最佳位置。 1 6 .如申請專利範圍第8項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於2處、3處、4處,此外,前述 供電點被設定於前述槽形天線之發射狀態最佳位置。 1 7.如申請專利範圍第1項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於1處又前述導體被設定於接地 電位,此外,前述供電點被設定於前述槽形天線之發射狀 態最佳位置。 1 8.如申請專利範圍第2項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於1處又前述導體被設定於接地 電位,此外,前述供電點被設定於前述槽形天線之發射狀 態最佳位置。 1 9.如申請專利範圍第3項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於1處又前述導體被設定於接地 電位,此外,前述供電點被設定於前述槽形天線之發射狀 態最佳位置。 20.如申請專利範圍第4項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於1處又前述導體被設定於接地 電位,此外,前述供電點被設定於前述槽形天線之發射狀 態最佳位置。 2 1 .如申請專利範圍第5項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於1處又前述導體被設定於接地O: \ 63 \ 63586-920509.ptc Page 31 579661 _Case No. 89106543_ Year Month__ VI. Application for patent scope 1 5. For example, for the plasma generator of item 7 of the patent scope, which is directed to the aforementioned groove shape The power supply points of the antennas are set at two, three, and four locations. In addition, the power supply points are set at the optimal positions for the transmission status of the slot antenna. 16. The plasma generating device according to item 8 of the scope of patent application, wherein the power supply points to the aforementioned slot antennas are set at two, three, and four locations. In addition, the aforementioned power supply points are set to the aforementioned slot antennas. The best position for launching. 1 7. The plasma generating device according to item 1 of the scope of the patent application, wherein the power supply point to the slot antenna is set at 1 and the conductor is set to the ground potential. In addition, the power supply point is set to the slot shape. The best position for the antenna's emission status. 1 8. The plasma generating device according to item 2 of the scope of the patent application, wherein the power supply point to the slot antenna is set at 1 and the conductor is set to the ground potential. In addition, the power supply point is set to the slot shape. The best position for the antenna's emission status. 1 9. The plasma generating device according to item 3 of the scope of the patent application, wherein the power supply point to the slot antenna is set at 1 and the conductor is set to the ground potential. In addition, the power supply point is set to the slot shape. The best position for the antenna's emission status. 20. The plasma generating device according to item 4 of the scope of patent application, wherein the power supply point to the slot antenna is set at 1 and the conductor is set to the ground potential. In addition, the power supply point is set to the slot antenna. The best position for launching. 2 1. The plasma generating device according to item 5 of the scope of patent application, wherein the power supply point to the aforementioned slot antenna is set at 1 and the aforementioned conductor is set to ground O:\63\63586-920509.ptc 第32頁 579661 _案號89106543_年月日__ 六、申請專利範圍 電位,此外,前述供電點被設定於前述槽形天線之發射狀 態最佳位置。 2 2.如申請專利範圍第6項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於1處又前述導體被設定於接地 電位,此外,前述供電點被設定於前述槽形天線之發射狀 態最佳位置。 2 3.如申請專利範圍第7項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於1處又前述導體被設定於接地 電位,此外,前述供電點被設定於前述槽形天線之發射狀 態最佳位置。 2 4.如申請專利範圍第8項之電漿產生裝置,其中向前述 槽形天線之供電點被設定於1處又前述導體被設定於接地 電位,此外,前述供電點被設定於前述槽形天線之發射狀 態最佳位置。 2 5 .如申請專利範圍第1至2 4項中任何一項之電漿產生裝 置,其中前述槽設1處。 2 6 .如申請專利範圍第1至2 4項中任何一項之電漿產生裝 置,其中前述槽被連接為並聯或串聯設有2處以上。 2 7. —種電漿處理裝置,其係包含:處理室,内部收容基 板並用電漿處理該基板;氣體供應機構,將處理氣體供給 處理室内;電漿產生機構,向經導入處理氣體之前述處理 室内發射電磁波以產生電漿;及排氣機構,將前述處理室 内排氣成為所需壓力;其特徵在於: 前述電漿產生機構包含:槽形天線,將發射電磁波之O: \ 63 \ 63586-920509.ptc Page 32 579661 _Case No. 89106543_Year_Month__ VI. Patent Application Potential. In addition, the aforementioned power supply point is set to the optimal position of the aforementioned slot antenna's emission state. 2 2. The plasma generating device according to item 6 of the scope of the patent application, wherein the power supply point to the slot antenna is set at one point and the conductor is set to the ground potential. In addition, the power supply point is set to the slot shape. The best position for the antenna's emission status. 2 3. The plasma generating device according to item 7 of the scope of the patent application, wherein the power supply point to the slot antenna is set at one point and the conductor is set to the ground potential. In addition, the power supply point is set to the slot shape. The best position for the antenna's emission status. 2 4. The plasma generating device according to item 8 of the scope of the patent application, wherein the power supply point to the slot antenna is set at one point and the conductor is set to the ground potential. In addition, the power supply point is set to the slot shape. The best position for the antenna's emission status. 25. The plasma generating device according to any one of claims 1 to 24 in the scope of patent application, wherein the aforementioned groove is provided at one place. 2 6. The plasma generating device according to any one of claims 1 to 24 of the scope of patent application, wherein the aforementioned tanks are connected in parallel or in series at two or more places. 2 7. A plasma processing device, comprising: a processing chamber, which contains a substrate therein and processes the substrate with a plasma; a gas supply mechanism that supplies a processing gas to the processing chamber; a plasma generation mechanism that supplies a processing gas to the The aforementioned processing chamber emits electromagnetic waves to generate a plasma; and an exhaust mechanism for exhausting the aforementioned exhaust in the processing chamber to a required pressure; characterized in that the aforementioned plasma generating mechanism includes: a slot antenna that emits electromagnetic waves; O:\63\63586-920509.ptc 第33頁 579661 _案號89106543_年月日__ 六、申請專利範圍 槽形成於導體,其槽形開口部處與開口面平行之磁場係在 表裏面抵消成為零;及交流電源,供電於槽形天線; 前述槽形天線為具有低供電頻率時亦可產生電漿之阻 抗之形狀,較之具有與上述真空容器代表長度相等之波長 的電磁波之頻率,該低供電頻率較小。O: \ 63 \ 63586-920509.ptc Page 33 579661 _Case No. 89106543_Year_Month__ Sixth, the scope of the patent application slot is formed in the conductor, the magnetic field parallel to the opening at the slot-shaped opening is inside the watch The offset becomes zero; and the AC power is supplied to the slot antenna; the slot antenna has a shape that can generate the impedance of the plasma when it has a low power supply frequency, compared with the frequency of an electromagnetic wave having a wavelength equal to the representative length of the vacuum container The low power supply frequency is small. O:\63\63586-920509.ptc 第34頁O: \ 63 \ 63586-920509.ptc Page 34
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