TW554244B - Positive type photosensitive resin composition, process for producing pattern and electronic parts - Google Patents
Positive type photosensitive resin composition, process for producing pattern and electronic parts Download PDFInfo
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- TW554244B TW554244B TW089119574A TW89119574A TW554244B TW 554244 B TW554244 B TW 554244B TW 089119574 A TW089119574 A TW 089119574A TW 89119574 A TW89119574 A TW 89119574A TW 554244 B TW554244 B TW 554244B
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- resin composition
- photosensitive resin
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0387—Polyamides or polyimides
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0023—Etching of the substrate by chemical or physical means by exposure and development of a photosensitive insulating layer
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4644—Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/106—Binder containing
- Y10S430/107—Polyamide or polyurethane
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Materials For Photolithography (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Formation Of Insulating Films (AREA)
Abstract
Description
經濟部智慧財產局員工消費合作社印製 554244 五、發明說明(1 ) [發明領域] 本發明係有關一種含有具感光性之聚醯亞胺前驅物或 聚噁唑前驅物之耐熱性正型感光性樹脂組成物,製造圖案 之方法及使用此組成物之電子組件。 [背景技藝] 對半導體裝置的表面保護膜或層間絕緣膜而言,迄今 使用具有優異耐熱性、電特性、機械特性等之聚醯亞胺樹 脂。然而,近年來半導體元件目前需要高度積體及大尺寸, 但包封樹脂包裝需要薄及小尺寸。因此,已使用如藉由 LOC(晶片上導線)之表面塗敷或焊劑回流系統,以至於熱 切地想要比以前具有更優異之機械特性,耐熱性等的聚醯 亞胺樹脂。 另一方面,已使用聚醯亞胺樹脂本身具備感光特性之 感光性聚醯亞胺。當使用此材料時,有能簡化圖案形成步 驟及能縮短複雜製備方法的特性。 包括感光性聚醯亞胺或其前驅物之耐熱性光阻劑及其 用途為本技藝所熟知者。例如,對於負型材料,已提出經 由酯鍵或離子鍵將甲基丙烯醯基導入聚醯亞胺前驅物中的 方法(日本暫時專利公開案第11541/1974,4〇922/1975, 145 7 94/1979,3 803 8/1981號等)、具有光可聚合烯烴之可 溶性聚醯亞胺(曰本暫時專利公開案第108031/1984, 220730/1984 ’ 232122/1984 ’ 6729/1985 , 72925/1985 , 57620/1986號等)、具有二苯甲酮骨架及在氮原子欲鍵結之 芳香環的鄰位上具有烷基的自身敏化型聚醯亞胺(日本暫 ^紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) ---------1---裝--------訂----.Ϊ (請先閱讀背面之注意事項再填寫本頁)Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 554244 5. Description of the Invention (1) [Field of Invention] The present invention relates to a heat-resistant positive-type photosensitive agent containing a photosensitive polyimide precursor or a polyoxazole precursor. Resin composition, method for manufacturing pattern, and electronic component using the same. [Background Art] For the surface protective film or interlayer insulating film of a semiconductor device, a polyimide resin having excellent heat resistance, electrical characteristics, mechanical characteristics, and the like has been used hitherto. However, in recent years, semiconductor devices currently require high integration and large size, but encapsulation resin packaging requires thin and small size. Therefore, a surface coating or flux reflow system such as by a LOC (Wire on Chip) has been used so that a polyimide resin having more excellent mechanical properties, heat resistance, etc. than before is eagerly desired. On the other hand, a polyimide resin having a photosensitive property by itself is used. When this material is used, there are characteristics that can simplify the pattern forming step and shorten the complicated manufacturing method. A heat-resistant photoresist including a photosensitive polyimide or a precursor thereof and uses thereof are well known in the art. For example, for negative materials, a method for introducing a methacrylfluorene group into a polyfluorene imide precursor via an ester bond or an ionic bond has been proposed (Japanese Provisional Patent Publication No. 11541/1974, 4922/1975, 145 7 94/1979, 3 803 8/1981, etc.), soluble polyfluorene imine with photopolymerizable olefins (Japanese Provisional Patent Publication Nos. 108031/1984, 220730/1984 '232122/1984' 6729/1985, 72925 / 1985, 57620/1986, etc.), self-sensitized polyimide with a benzophenone skeleton and an alkyl group at the ortho position of the aromatic ring to be bonded to the nitrogen atom (Japanese paper size is applicable to China) Standard (CNS) A4 specification (210 X 297 public love) --------- 1 --- install -------- order ----. Ϊ (Please read the precautions on the back first (Fill in this page again)
ϋ l·— I 經濟部智慧財產局員工消費合作社印製 554244 A7 __________B7__________ 五、發明說明(2 ) 時專利公開案第219330/1984,231533/1984號)等。 上述負型材料中,在顯影時需要有機溶劑如N_甲基哦 咯烷_等,由而近年來,目前已提出能藉由鹼性水溶液予 以顯影之正型感光性樹脂。對於正型材料,已提出一種經 由酯鍵將鄰-硝基苯甲基導入聚醯亞胺前驅物中的方法(大 分子科學化學期刊,A24, 10, 1407, 1987)、混合萘醌疊氮化 合物與可溶性羥基醯亞胺或聚噁唑前驅物的方法(日本專 利公告案第60630/1989號,美國專利第4,395,482號)、經 由酉曰鍵將萘艦二疊氮化合物導入可溶性聚醯亞胺中的方法 (大分子,23, 1990)、化學放大型聚醯亞胺(日本暫時專利 公開案第763/1995號)、混合萘醌二疊氮化物與聚醯亞胺 前驅物的材料(日本暫時專利公開案第13315/1977號)、使 用酸產生劑與聚醯胺酸酯或聚醯胺酚(其中由烷氧基羰基 保護盼經基)的方法(日本暫時專利公開案第2〇2489/1999 號)等。 然而’上述負型材料中,有在其功能或解析度,或視 用途而發生裝ie產率降低的問題。而且上述材料中,欲使 用之聚合物的結構受侷限使得最終獲得之膜材的物理性質 亦受侷限而使其不適合於多目的之應用。另一方面,正型 材料中,有由於如上述之感光劑的吸收波長所伴生的問 題,或其結構受侷限而使靈敏度或解析度低的類似問題。 並且’上述材料中,由於膜材厚度因影像形成後之高溫處 理而滅小,或圖案形狀因以微小量存在於空氣中之基本成 分的作用而劣化,而存在著問題。 -* ^ ^ --------^-------r _(請先閱讀背面之注意事項再填寫本頁) 本紙張尺度綱巾關家標準(CNS)A4規格(210 X 297公髮^ 2 311837 554244 A7 -------- B7____ 五、發明說明(3 ) ~ ' 、, 有此5重氮萘醌化合物與聚苯并喔嗤前驅物的材 料(日本暫時專利公開案第46則簡幻或導入酴羥基取 代叛酸如那些經由酿鍵將盼部份導入聚酿胺酸者,但這些 材料顯衫不足且在未曝光部份的膜材厚度減少或發生樹脂 自基材剝離的情形。又,為了改良材料的顯影性或黏著性 質,已提出聚合物骨架中具有石夕氧烧結構之聚醯胺酸的材 料(日本暫時專利公開案第31861/1992及46345/1992號), 仁其3有聚醯胺酸,由而如上所述保存安定性變差。又, 适些材料使用含有許多芳香環之重氮醒化合物作為酸產生 劑,由而有熱固化後機械性質顯著下降而使其無法使用作 為實際可應用之材料的問題。 因此’任一材料均無法實際應用。 [發明概述] 本發明係藉由調配能引發聚醯亞胺前驅物或聚苯并噁 唑前驅物中之保護基(其中鹼可溶基藉由對聚醯亞胺前驅 物或聚苯并噁唑前驅物照射輻射在酸性條件下由可消去基 予以保護)之消去反應的化合物,而提供一種能解決習知光 阻劑所持有之上述問題的耐熱性正型感光性樹脂組成物, 其即使在提供感光性之聚醯亞胺前驅物或聚苯并噁唑前驅 物具有任何結構時亦能充分地承受,且具有良好的感光性 及解析度,並極少受以微小量存在於空氣中之基礎成分的 影響。 又’本發明係提供一種能得到能夠以鹼性水溶液予以 顯影’且具有優異之感光性,解析度及耐熱性的圖案,且 (請先閱讀背面之注意事項再填寫本頁) 裝--------訂----*---丨線隊 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS)A4規格(210 x 297公釐) 3 311837 554244ϋ l · —I Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 554244 A7 __________B7__________ V. Description of the Invention (2) Patent Publication No. 219330/1984, 231533/1984), etc.). Among the above-mentioned negative materials, an organic solvent such as N-methyl oxolidine and the like is required during development, and in recent years, a positive-type photosensitive resin capable of being developed by an alkaline aqueous solution has been proposed so far. For positive materials, a method for introducing o-nitrobenzyl into a polyimide precursor via an ester bond has been proposed (Journal of Macromolecular Science and Chemistry, A24, 10, 1407, 1987), mixed naphthoquinone azide Method for compound and soluble hydroxyimide or polyoxazole precursor (Japanese Patent Publication No. 60630/1989, U.S. Patent No. 4,395,482), introducing naphthalene diazide compound into soluble polyfluorene imide via a bond Method (macromolecule, 23, 1990), chemically amplified polyfluorene imide (Japanese Provisional Patent Publication No. 763/1995), a material in which naphthoquinone diazide and polyfluorene imide precursor are mixed (Japan Provisional Patent Publication No. 13315/1977), a method using an acid generator and a polyamidate or a polyphenol (in which the pendant group is protected by an alkoxycarbonyl group) (Japanese Provisional Patent Publication No. 02489 / 1999) and so on. However, in the above-mentioned negative materials, there is a problem in that the function and resolution of the negative materials and the yield of the negative materials decrease. Moreover, among the above materials, the structure of the polymer to be used is limited, so that the physical properties of the finally obtained film material are also limited, making it unsuitable for multi-purpose applications. On the other hand, in the positive type material, there is a similar problem that the sensitivity or resolution is low due to problems associated with the absorption wavelength of the photosensitizer as described above, or its structure is limited. In addition, among the above-mentioned materials, there are problems because the thickness of the film material is reduced due to the high-temperature processing after the image formation, or the shape of the pattern is deteriorated due to the action of the basic components present in a small amount in the air. -* ^ ^ -------- ^ ------- r _ (Please read the precautions on the back before filling in this page) This paper standard outlines the family standard (CNS) A4 specification (210 X 297 public hair ^ 2 311837 554244 A7 -------- B7____ V. Description of the invention (3) ~ ', there is this 5 diazonaphthoquinone compound and polybenzoxazone precursor material (Japan temporarily Patent Publication No. 46: Simplified or introduced 酴 hydroxyl instead of acid, such as those who introduce the desired part into the polyamino acid through the bond, but these materials are insufficient and the thickness of the film in the unexposed part is reduced or occurs. The case where the resin is peeled from the substrate. In order to improve the developability or adhesive properties of the material, a polyamic acid material having a sintering structure in the polymer skeleton has been proposed (Japanese Provisional Patent Publication No. 31861/1992 and No. 46345/1992), Renqi 3 has polyamidic acid, which results in poor storage stability as described above. In addition, suitable materials use diazonium compounds containing many aromatic rings as acid generators, which causes heat. The problem that the mechanical properties deteriorate significantly after curing, making it unusable as a practically applicable material. None of the materials can be practically used. [Summary of the Invention] The present invention is based on the preparation of protective groups in polyimide precursors or polybenzoxazole precursors (wherein alkali-soluble groups The precursor or polybenzoxazole precursor is irradiated with radiation to protect the compound from the elimination reaction under acidic conditions), and provides a heat-resistant positive photosensitivity that can solve the above problems held by conventional photoresists. Resin composition, which can fully withstand any polyimide precursor or polybenzoxazole precursor that provides photosensitivity, and has good photosensitivity and resolution, and is rarely affected by small amounts. The effect of the amount of the basic components present in the air. 'The present invention provides a pattern which can be developed in an alkaline aqueous solution' and has excellent photosensitivity, resolution and heat resistance, and (Please read the Please fill in this page for the matters needing attention) Packing -------- Order ---- * --- 丨 Printed by the Intellectual Property Bureau Staff Consumption Cooperative of the Ministry of Economics This paper is in accordance with China National Standard (CNS) A4 (210 x 297 mm) 3 311837 554244
經濟部智慧財產局員工消費合作社印製 能獲得具有良好形狀之圖案之製造圖案的方法。 又,本發明係提供藉由具有具備良好的形狀及特性之 圖案而具有高可靠度之電子組件。 本發明係有關下列者。 1) 一種正型感光性樹脂組成物,其包括 (A)刀子中具有鍵結於芳香環之以_〇R所示之基團之 聚醢亞胺刖驅物或聚嘴嗤前驅物, [式中示構成縮醛或縮酮之單價基、烷氧基烷基或 烧基石夕燒基’其可藉由酸的作用分解而轉化成氫原子],以 及 (B)藉由照射輻射產生酸之化合物。 2) 如上疋義之正型感光性樹脂組成物,其中成分(A) 為具有式(1)所示之結構單元之聚醢亞胺前驅物:Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs. The present invention also provides an electronic component having high reliability by having a pattern having a good shape and characteristics. The present invention relates to the following. 1) A positive-type photosensitive resin composition comprising (A) a polyimide precursor or a polymouth precursor having a group represented by _0R bonded to an aromatic ring in a knife, [ In the formula, a monovalent group, an alkoxyalkyl group, or an alkynyl group constituting an acetal or a ketal is shown, which can be decomposed by an acid to be converted into a hydrogen atom], and (B) an acid is generated by irradiation of radiation Of compounds. 2) The positive-type photosensitive resin composition as described above, wherein the component (A) is a polyimide precursor having a structural unit represented by the formula (1):
[式中’ R1及R2各分別表示四價有機基;各R3分別表示單 價有機基;各R4分別表示構成縮醛或縮酮之單價基,烷氧 基烧基或烷基矽烷基,其可藉由酸的作用分解而轉化成氫 原子]。 3)如上定義之正型感光性樹脂組成物,其中以100重 量份(A)聚醯亞胺前驅物計,(B)藉由照射輻射產生酸之化 合物的含量為〇.〇1至50重量份。 ---------i---裝--------訂-----------線 (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 4 311837 311837 554244 A7 五、發明說明( 1 4)如上定義之正型感光性樹脂組成物,其中式[Wherein R1 and R2 each represent a tetravalent organic group; each R3 represents a monovalent organic group; each R4 represents a monovalent group constituting an acetal or ketal, an alkoxyalkyl group or an alkylsilyl group, which may be Decomposed by the action of acid and converted into hydrogen atom]. 3) The positive-type photosensitive resin composition as defined above, wherein the content of (B) the compound that generates an acid by irradiation with radiation is from 0.01 to 50% by weight based on 100 parts by weight of (A) a polyimide precursor. Serving. --------- i --- install -------- order ----------- line (please read the precautions on the back before filling this page) Standards apply to China National Standard (CNS) A4 specifications (210 X 297 mm) 4 311837 311837 554244 A7 V. Description of the invention (1 4) Positive photosensitive resin composition as defined above, where
Rl係,在具有四隻鍵結手臂的芳香基中,具有由 2之 子*仏^ ^ ”卜貞子雷 、、、Ό予土或氟化烷基予以取代之芳香基之化學 基。 于、〇耩的四價 2 5)如上定義之正型感光性樹脂組成物,其中式^)中 R係,在具有四隻鍵結手臂之芳香基或具有鍵結手 = 由醚鍵彼此相鄰之芳香基中,具有由非質子電子給予美: 从取代之芳香基之化學結構的四價基。 土 、6)如上定義之正型感光性樹脂組成物,其中成分 為具有下式(2)所示之結構單元之聚噁唑前驅物·· (2) [式中,R5不二價有機基;R6示四價有機基,及各R7分別 表示構成縮醛或縮軻之單價基、烷氧基烷基或烷基; 基,其可藉由酸的作用分解而轉化成氫原子卜 7) 如上定義之正型感光性樹脂組成物,其中以】⑼重 量份⑷聚鳴峻前驅物計,(B)藉由照射輕射產生酸之化合 物的含量為0.01至50重量份。 口 8) -種製造圖案的方法,包括下列步驟:在支撐體上 塗覆如上定義之正型感光性樹脂組成物並予以乾燥之步 驟,予以曝光之步驟,使用鹼松士、々& ^ 用鹼性水溶液使所曝光之材料顯 影之步驟及予以加熱處理之步驟。 9)具有由如上述方法所製備之圖案作為表面保護膜或 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公髮)R1 is a chemical group having an aromatic group substituted by the son of 2 * 仏 ^ ^ "Bu Zhenzi Lei,", Ό 土 土, or a fluorinated alkyl group in the aromatic group having four bonded arms. 5) Positive photosensitive resin composition as defined above, wherein in formula ^), R is an aromatic group having four bonding arms or a bonding hand = an aromatic group adjacent to each other by an ether bond In the invention, a tetravalent group having a chemical structure given by an aprotic electron is substituted: a tetravalent group derived from a chemical structure of a substituted aromatic group. 6) A positive-type photosensitive resin composition as defined above, wherein the component has the following formula (2): Polyoxazole precursor of the structural unit ... (2) [wherein R5 is not a divalent organic group; R6 is a tetravalent organic group, and each R7 represents a monovalent group or an alkoxyalkane constituting an acetal or a fluorene. Radical or radical; radical which can be decomposed into hydrogen atoms by decomposition by the action of acid. 7) A positive photosensitive resin composition as defined above, in which the content is based on ⑼ wt. ) The content of the compound that generates an acid by light irradiation is 0.01 to 50 parts by weight. Mouth 8)-A kind of manufacturing pattern The method includes the following steps: a step of applying a positive photosensitive resin composition as defined above on a support and drying it, and a step of exposing, using alkali pine, 々 & ^ using an alkaline aqueous solution to expose the exposed material Steps of development and steps of heat treatment. 9) It has a pattern prepared by the above method as a surface protection film or the paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297)
^ ^ M -------β--------- (請先閱讀背面之注意事項再填寫本頁) 線0-·^ ^ M ------- β --------- (Please read the precautions on the back before filling this page) Line 0- ·
554244 五、發明說明u ) 中間層絕緣臈之電子組件 [圖式之簡單說明] 第1(a)圖至第J(e)圖為顯示具有多層配線結構之半導 體裝置之製備步驟的圖式。 [較佳具體實例之說明] 以下詳細說明本發明。 本發明中,成分(A)為聚醯亞胺前驅物或聚噁唑前驅物 且其基本上須具有中鍵結於芳香所示之 —團(其中R示構成縮搭或縮酮之單價基、燒氧基烧基或 烧基石夕烧基’其可藉由酸的作用分解而轉化成氫原子)。 右上述R藉由酸的作用分解而轉化成氫原子,則產生 酚羥基,由而對本發明之組成物提供適合之鹼溶解度。 此基團可存在於聚醯亞胺前驅物、四羧酸殘基、二胺 殘基或側鏈等中,且每個聚醯亞胺前驅物之結構單元(亦 即,含有一個四羧酸殘基及一個二胺殘基之重複單元),所 含此基團的數目較佳為2個或更多個,更佳為2至4個。 又’此基團可存在於聚噁唑前驅物、二羧酸殘基、二 胺殘基或側鍵等中,且每個聚噁唑前驅物之結構單元(亦 即,含有一個二羧酸殘基及一個二羥基二胺殘基之重複單 元),所含此基團的數目較佳為2個或更多個,更佳為2至 4個。 至於可藉由酸的作用分解而轉化成氫原子之構成縮酿 或縮酮之單價基,可述及例如具有下述結構者: (請先閱讀背面之注意事項再填寫本頁)554244 V. Description of the invention u) Electronic components of interlayer insulation pimple [Simplified description of drawings] Figures 1 (a) to J (e) are diagrams showing the manufacturing steps of a semiconductor device with a multilayer wiring structure. [Description of Preferred Specific Examples] The present invention will be described in detail below. In the present invention, the component (A) is a polyfluorene imide precursor or a polyoxazole precursor and it must basically have a middle group bonded to an aromatic group (where R represents a monovalent group constituting a condensation or a ketal). , Alkoxy group or alkoxide group (which can be converted into hydrogen atoms by decomposition by the action of acid). The above-mentioned R is decomposed by the action of an acid to be converted into a hydrogen atom, thereby generating a phenolic hydroxyl group, thereby providing a suitable alkali solubility to the composition of the present invention. This group may exist in polyimide precursors, tetracarboxylic acid residues, diamine residues, or side chains, etc., and each structural unit of polyimide precursors (that is, contains a tetracarboxylic acid Residue and a repeating unit of a diamine residue), the number of the group contained is preferably 2 or more, more preferably 2 to 4. Also, this group may exist in a polyoxazole precursor, a dicarboxylic acid residue, a diamine residue, or a side bond, and the structural unit of each polyoxazole precursor (that is, contains a dicarboxylic acid Residues and a repeating unit of a dihydroxydiamine residue), the number of this group is preferably 2 or more, more preferably 2 to 4. As for the monovalent group constituting the condensation or ketal which can be converted into hydrogen atoms by decomposition by the action of acid, for example, those with the following structure can be mentioned: (Please read the precautions on the back before filling this page)
---I I I I 訂--— —-— — III 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 6 311837 554244 A7 Β7 五、發明說明(7 ) g0R,!r' 义卢and 式中’R、R及R各自表不具有5個或更少個碳原子之 烷基,X示具有3個或更多個碳原子(較佳為2〇個或更少 個碳原子)之二價烷撐基(其可具有側鏈)。 更明確地說,通常可述及四氫吡喃基、四氫呋喃基、 經烷基取代之四氫吡喃基、經烷基取代之四氫呋喃基、經 烷氧基取代之四氫吡喃基、經烷氧基取代之四氫呋喃基 等’但本發明不偈限於這些。 最佳基團為四氫卩比喃基。 可藉由酸的作用分解而轉化成氫原子之單價烷氧基烷 基或烷基矽烷基並無特別限制,而烷氧基烷基之較佳碳數 為2至5,烷基矽烷基之較佳碳數為1至20。 更明確地說,通常可述及甲氧基甲基、乙氧基甲基、 異丙氧基甲基、第三丁氧基甲基、乙氧基乙基、甲基矽烷 基、乙基矽烷基、第三丁基二甲基矽烷基等,但本發明不 侷限於這些。 最佳基團為乙氧基甲基及第三丁基二甲基矽烷基。 當成分(Α)為聚醯亞胺前驅物時,其結構並無特別限 制,而較佳為具有上式(1)所示之結構單元之聚醢亞胺前驅 物,此乃由於其於i-線區域之透明性,當R4所示之基團轉 化成Η時於鹼顯影劑中之溶解度,及對基材之黏著性均十 分優異之故。 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 χ 297公髮) 7 311837 (請先閱讀背面之注意事項再填寫本頁) 裝--------訂----------線j 經濟部智慧財產局員工消費合作社印製 經濟部智慧財產局員工消費合作社印製 554244 A7 -----------B7___ 五、發明綱“) ~ ""-- 又,當成分(A)為聚噁唑前驅物時,結構並無特別限 制’而較佳為具有上式⑺所示之結構單元之聚㈣前驅 物’此乃由於其於i'線區域之透明性,當r3所示之基團轉 化成Η時於驗顯影劑中之溶解度,及對基材之黏著性均十 分優異之故。 以下首先詳細說明聚醯亞胺前驅物。 聚醯亞胺前驅物中,式(1)所示之結構單元中之…可 明確地述及’例如具有骨架如苯、萘、茈、聯苯、二苯醚、 二苯楓、二苯基丙烷、二苯基六氟丙烷、二苯甲酮等之四 價芳香族烴殘基,具有骨架如丁院、環丁燒等之四價㈣ 族烴殘基,但本發明不侷限於這些。其碳數較佳為4至30。 其較佳實例為苯基、聯苯、二苯鍵及二苯基六敗丙烧。附 帶知:若有需要可含有兩種或更多種上述示例之基團作 為聚酿胺酸衍生物分子中之Rl。 式(1)所示之結構單元中之R2可明確地述及例如具有 骨架如二苯醚、二苯硫醚、二苯甲酮、二苯基甲烷、二苯 基丙烷、二苯基六氟丙烷、二苯亞碉、二苯楓、聯苯、苯 等之四價芳香族烴殘基,但本發明不侷限於這些。其碳數 較佳為6至30。其較佳實例為二苯基六氟丙烷、二苯醚及 聯苯。附帶一提,若有需要可含有兩種或更多種上述示例 之基團作為R2。 式(1 )所示之結構單元中之R3可明確地述及例如具有 1至10個碳原子之脂肪族或芳香族烴基如甲基、乙基、異 丙基、第三丁基、苯基、苯甲基等;具有2至10個碳原子 (請先閱讀背面之注意事項再填寫本頁)--- IIII Order --- ------III Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs, Consumer Cooperatives This paper is printed in accordance with China National Standard (CNS) A4 (210 X 297 mm) 6 311837 554244 A7 B7 V. Invention Note (7) g0R,! R 'means Lu and where' R, R, and R each represent an alkyl group having 5 or fewer carbon atoms, and X represents 3 or more carbon atoms (preferably A divalent alkylene group (which may have a side chain) of 20 or less carbon atoms). More specifically, tetrahydropyranyl, tetrahydrofuranyl, alkyl-substituted tetrahydropyranyl, alkyl-substituted tetrahydrofuranyl, alkoxy-substituted tetrahydropyranyl, Alkoxy-substituted tetrahydrofuranyl and the like, but the present invention is not limited to these. The most preferred group is tetrahydropyranyl. The monovalent alkoxyalkyl group or alkylsilyl group which can be converted into a hydrogen atom by decomposition by the action of an acid is not particularly limited, and the preferred carbon number of the alkoxyalkyl group is 2 to 5. The preferred carbon number is 1 to 20. More specifically, methoxymethyl, ethoxymethyl, isopropoxymethyl, tertiary butoxymethyl, ethoxyethyl, methylsilyl, ethylsilane And the like, but the present invention is not limited to these. The most preferred groups are ethoxymethyl and third butyldimethylsilyl. When the component (A) is a polyimide precursor, its structure is not particularly limited, but a polyimide precursor having a structural unit represented by the above formula (1) is preferred because it is in i -The transparency of the line region, the solubility in the alkali developer when the group shown by R4 is converted into rhenium, and the adhesion to the substrate are very excellent. This paper size applies to China National Standard (CNS) A4 specifications (21〇χ 297 issued) 7 311837 (Please read the precautions on the back before filling out this page) Loading -------- Order ----- ----- Line j Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs Printed by 554244 A7 ----------- B7___ V. Outline of Invention ") ~ " "-Also, when the component (A) is a polyoxazole precursor, the structure is not particularly limited, and a polyfluorene precursor having a structural unit shown in the above formula (i) is preferred. This is because it is in i 'The transparency of the line region, when the group shown by r3 is converted into rhenium, is excellent in the solubility in the developer, and the adhesion to the substrate is very good. The polyimide precursor is explained in detail below first. In the polyfluorene imide precursor, in the structural unit represented by the formula (1), ... can be explicitly mentioned, for example, having a skeleton such as benzene, naphthalene, fluorene, biphenyl, diphenyl ether, diphenyl maple, and diphenyl. Tetravalent aromatic hydrocarbon residues such as propane, diphenylhexafluoropropane, benzophenone, etc., tetravalent fluorene group hydrocarbon residues with skeletons such as butane, cyclobutane However, the present invention is not limited to these. Its carbon number is preferably 4 to 30. Its preferred examples are phenyl, biphenyl, diphenyl bond, and diphenyl hexadecane. Incidentally: if necessary A group containing two or more of the above examples is used as R1 in the polyamino acid derivative molecule. R2 in the structural unit represented by the formula (1) can be explicitly mentioned as having, for example, a skeleton such as diphenyl ether, diphenyl ether, or diphenyl ether. Tetravalent aromatic hydrocarbon residues of phenylsulfide, benzophenone, diphenylmethane, diphenylpropane, diphenylhexafluoropropane, diphenylarsine, diphenyl maple, biphenyl, benzene, etc., but The present invention is not limited to these. Its carbon number is preferably 6 to 30. Its preferred examples are diphenylhexafluoropropane, diphenyl ether, and biphenyl. Incidentally, it may contain two or more if necessary One of the above-exemplified groups is R2. R3 in the structural unit represented by the formula (1) can explicitly mention, for example, an aliphatic or aromatic hydrocarbon group having 1 to 10 carbon atoms such as methyl, ethyl, isopropyl Base, third butyl, phenyl, benzyl, etc .; have 2 to 10 carbon atoms (please read the precautions on the back before filling this page)
本紙張尺度翻中國國家標準(CNS)A4規格(210 X 297公髮) 8 311837 D4244The size of this paper is based on Chinese National Standard (CNS) A4 (210 X 297) 8 311837 D4244
五、發明說明(9 'V. Description of the invention (9 '
(4) 經 濟 部 智 慧 財 產 局 、元氧基烷基如甲氧基乙基等,但本發明不侷限於這些。 一中,較佳為異丙基及苯甲基。 ~ 俨夷式所不之結構單元中之R4為構成縮醛或縮_之單 、兀氧基燒基或燒基石夕燒基,其能藉由酸的作用分解 而轉化成氫原子,與上述R相同。 一本發明中’式(1)所示之聚醯亞胺前驅物能以下式(3) 厂、之四缓酸一酸軒與下式(4)所示之二胺基化合物作為 部份起始材料製造之。 · (3) [式中’R1具有如式中定義之相同意義](4) The Ministry of Economic Affairs and Intellectual Property Bureau, a hydroxyalkyl group such as methoxyethyl, etc., but the present invention is not limited to these. Among them, isopropyl and benzyl are preferred. ~ R4 in the structural unit not included in the Yiyi formula is a mono-, oxy-, or thio-alkynyl group constituting an acetal or acetal, which can be decomposed by the action of an acid to be converted into a hydrogen atom. R is the same. A polyimide precursor represented by the formula (1) in the present invention can be obtained as a part of the following formula (3), a tetrahydroacid monoacid and a diamine compound represented by the following formula (4). Made of starting materials. · (3) [wherein 'R1 has the same meaning as defined in the formula]
HVOH H2〆、ΝΗ2 [式中’ R2具有如式⑴中定義之相同意義]。 聚醯亞胺前驅物能依據例如下述方法獲得之。亦即, 在適合之觸媒如^定等之存在下,*上式(3)所*之四叛s 二酸酐與下式(5)所示之醇或酚在有機溶劑如N-甲基吡咯 烷酮、r-丁内酯、N,N-二甲基乙醯胺、二曱亞楓等中反應 I----l·---^------I I 訂 --------— 匯線 (請先閱讀背面之注意事項再填寫本頁} 消 費 合 作 社 印 製HVOH H2〆, ΝΗ2 [wherein 'R2 has the same meaning as defined in formula]]. The polyfluorene imide precursor can be obtained according to, for example, the following method. That is, in the presence of a suitable catalyst, such as hydrazine, etc., the tetra-s-dicarboxylic anhydride represented by the above formula (3) and the alcohol or phenol represented by the following formula (5) in an organic solvent such as N-methyl Reactions in pyrrolidone, r-butyrolactone, N, N-dimethylacetamidine, diazepam, etc. I ---- l · --- ^ ------ II Order ----- ---— Huihui (Please read the notes on the back before filling out this page} Printed by Consumer Cooperative
經濟部智慧財產局員工消費合作社印製 W4244 五、發明說明(10 ) :基:第三丁基、苯基、苯甲基等;具有2至10個碳原子 占氧基燒基如甲氧基乙基等,但本發明不褐限於這些。 八,較佳為異丙基及苯甲基。 然後,使用齒化劑如氯化亞硫醯齒化酸的部份,然後 ;上述之有機溶劑中,在適合之觸媒如㈣等之存在下, 使所得之化合物盥式W ^ 初/、式(4)所不之二胺基化合物反應。 使藉由上述方法所獲得之聚酿亞胺前驅物在不良溶劑 如水、甲醇、乙醇、丙醇、丙剩等中結晶,藉由過遽收集 之再乾燥之。然後’在非質子性有機溶劑如四氫呋喃、N_ 甲«洛該、卜丁内醋、N,N_二甲基乙酿胺、二甲亞楓 等中,對所得之材料添加具有R4之經基的保護劑及若有需 要,反應觸媒進行保護反應,以獲得具有上述式⑴所示之 結構單元之聚醯亞胺前驅物。 本發明之組成物中,為了使其適合於目前經常使用之 卜線曝光,較佳為改良樹脂於仁線區域的透明性。 為了上述目❸’式(3)所示之結構單元中之Rl較佳為 在具有四隻鍵結手臂之芳香基中具有由非質子電子給予基 或氟化烷基予以取代之芳香基之化學結構的四價基。 又,式(4)所示之結構單元中之R2較佳為在具有四隻 鍵結手臂之芳香基或具有四隻鍵結手臂且經由鍵鍵彼此相 鄰之芳香I中具有由#質子電子給予I予以取代之芳香基 之化學結構的四價基。 至於具有由非質子電子給予基取代之芳香基之化學結 構之上述羧酸二酸酐的特定實例,可明確地述及例如 ^ --------訂———丨1 線. (請先閱讀背面之注意事項再填寫本頁) 554244 經濟部智慧財產局員工消費合作社印製 A7 五、發明說明(U ) 3,3’,4,4’,_二苯醚四羧酸二酸酐、1,4-二甲氧基-2,3,5,6_苯四 羧酸二酸酐、1,4-二(三甲基矽烷基)-2,3,5,6-苯四羧酸二酸 酐、1,4·雙(3,4-二羧基苯氧基)苯二酸酐、込弘雙㈠,‘二竣 基苯氧基)苯二酸酐、3,3’,4,4,,_二苯基甲烷四羧酸二酸酐、 雙(3,4-二羧基苯氧基)二甲基矽烷二酸酐、雙(3,4_二羧基苯 氧基)甲基胺二酸酐、4,4’-雙(3,4-二羧基苯氧基)二苯楓二 酸酐等、特佳為3,3’,4,4’,-二苯_四敌酸二酸酐。此處,電 子給予基係指在Hammett相關規則之σρ或crm值中帶有 負值之取代基。該規則及數值係熟知者,例如化學手冊, 基本版II,項目365(曰本化學會誌所編輯’Maruzen發行, 曰本,1984) 〇 又,至於具有由氟化烷基取代之化學結構之羧酸二酸 酐的較佳特定實例,可述及例如2,2-雙(3,4_二羧基苯基) 六氟丙烷二酸酐、2,2-雙(3,4-二羧基苯基)•三氟 二酸酐等,特佳為2,2-雙(3,4-二羧基苯基)六氟丙烷二酸 肝。 又,至於具有由非質子電子給予基取代之芳香基之化 學結構之二胺基化合物的較佳特定實例,可述及例如其中 上述R2為二苯甲酮、二苯碉、二苯亞碉、二苯基六氟丙烷、 雙(三氟甲基)聯苯等之化合物。 本發明之具有上式⑴所示結構單元之㈣亞胺_ 物中,在不損及本發明之效果的範圍内可含有式(1)所示之 結構單元以外之其他結構單元。 不 成分(A)之聚醯亞胺前驅物的分子量並無特別限制,齡 ‘紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) 11 311837 ---------r---裝--------訂---------- (請先閱讀背面之注意事項再填寫本頁) 554244 A7 五、發明說明(u) 佳為10,000至20〇,〇〇〇重量平均分子量。附帶〆提,此分 子量係藉由GPC(凝膠滲透層析術)測量再基於具有標準分 子量之聚苯乙、歸計算之。 其次,詳細說明聚噁唑前驅物。 聚噁唑前驅物中,式(2)所示之結構單元中之R5可明 確地述及例如具有骨架如笨、萘、茈、聯苯、二苯醚、二 苯礪、二苯基丙烷、二笨基六氟丙烷、二苯甲嗣等之二償 芳香族烴殘基,或具有骨架如丁烷、環丁烷等之二價脂肪 族烴殘基,但本發明不侷限於這些。 其碳數較佳為4至30。其較佳實例為苯基、聯苯、二 苯醚及二苯基六氟丙烷。附帶一提,若有需要可含有兩種 或更多種上述示例之基團作為聚醯胺衍生物之分子中的 R5。 式(2)所示之結構單元中之R6可明確地述及例如具有 骨架如二笨醚、二苯硫醚、二苯甲酮、二苯基甲烷、二苯 基丙烷、二苯基六氟丙烷、二苯碾、二苯亞碉、聯苯、苯 等之四價芳香族烴殘基,但本發明不侷限於這些。其碳數 較佳為6至30。其較佳實例為二苯基六氟丙烷、二苯醚及 聯苯。附帶-提,若有需要可含有兩種或更多種上述示例 之基團作為R6。 式(2)所示之結構單元中之R7為構成縮醛或縮_之單 價基、燒氧基燒基或炫基梦燒基,其彳藉由酸的 而轉化成氫原子,且與上述R相同。 氫原子之R7所示保護基的取代比率較佳為i 〇至 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 12 311837 (請先閱讀背面之注意事項再填寫本頁) 裝--------訂----.------線· 經 濟 部 智 慧 財 產 局 員 工 消 費 合 作 社 印 製 554244 A7 B7 五、發明說明(13 80%,更佳為30至60%。若取代比率高於上 材的黏著性有時會降低,而若低於上述者,龙則對基 會發生不良影響如在未曝光之部份之膜材厚度 本發明中,聚噁唑前驅物能藉由使用下 羧酸;5 nr斗/α、 八(6)所示之二 造^及下式⑺所示之二胺基化合物作為部份起始材料製 (6)Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs, W4244 5. Description of the Invention (10): Base: tertiary butyl, phenyl, benzyl, etc .; has 2 to 10 carbon atoms, such as methoxy. Ethyl and the like, but the present invention is not limited to these. Eight, preferably isopropyl and benzyl. Then, using a toothing agent such as a part of thionyl chloride and a toothing acid, and then; in the above-mentioned organic solvent, in the presence of a suitable catalyst such as osmium, etc., the resulting compound is formulated W ^ The diamine-based compound of formula (4) reacts. The polyimide precursor obtained by the above method is crystallized in a poor solvent such as water, methanol, ethanol, propanol, propylene residue, etc., and is collected by drying and then dried. Then, in an aprotic organic solvent such as tetrahydrofuran, N-methyl «Luoge, pudding vinegar, N, N-dimethyl ethyl amine, dimethyl isocyanate, etc., the obtained material is added with a radical having R4. If necessary, the reaction catalyst performs a protective reaction to obtain a polyimide precursor having a structural unit represented by the formula (I). In the composition of the present invention, in order to make it suitable for the conventional line exposure, it is preferable to improve the transparency of the resin in the kernel line area. For the purpose of the above formula (3), R1 in the structural unit is preferably a chemical having an aromatic group substituted with an aproton-donating group or a fluorinated alkyl group in an aromatic group having four bonded arms. Structure of the quadrivalent base. In addition, R2 in the structural unit represented by formula (4) is preferably an aromatic group having four bonding arms or an aromatic group I having four bonding arms and being adjacent to each other via a bond. A tetravalent group giving the chemical structure of the aromatic group to which I is substituted. As for the specific example of the above-mentioned carboxylic acid dianhydride having a chemical structure of an aromatic group substituted with an aprotic electron donating group, it can be explicitly mentioned, for example, ^ -------- order ----- 丨 1 line. (Please (Please read the notes on the back before filling this page) 554244 Printed by A7, Consumer Cooperatives, Intellectual Property Bureau, Ministry of Economic Affairs V. Invention Description (U) 3,3 ', 4,4', _ diphenyl ether tetracarboxylic acid anhydride, 1,4-dimethoxy-2,3,5,6_benzenetetracarboxylic acid dianhydride, 1,4-bis (trimethylsilyl) -2,3,5,6-benzenetetracarboxylic acid di Acid anhydride, 1,4 · bis (3,4-dicarboxyphenoxy) phthalic anhydride, Hiromi bispyrene, 'di-undylphenoxy) phthalic anhydride, 3,3', 4,4 ,, _ Diphenylmethanetetracarboxylic dianhydride, bis (3,4-dicarboxyphenoxy) dimethylsilanic anhydride, bis (3,4-dicarboxyphenoxy) methylamine dianhydride, 4,4 '-Bis (3,4-dicarboxyphenoxy) diphenylsalfinic anhydride and the like are particularly preferably 3,3', 4,4 ',-diphenyl-tetraene dicarboxylic anhydride. Here, the electron donating group refers to a substituent having a negative value in the σρ or crm value of the Hammett-related rule. The rules and values are well known, for example, the Handbook of Chemistry, Basic Edition II, item 365 (edited by the Chemical Society of Japan, published by Maruzen, Japanese, 1984). Also, as for the chemical structure with a fluorinated alkyl group, Preferred specific examples of the carboxylic acid dianhydride include, for example, 2,2-bis (3,4-dicarboxyphenyl) hexafluoropropane dianhydride, 2,2-bis (3,4-dicarboxyphenyl) • Trifluoroanhydride and the like, particularly preferred is 2,2-bis (3,4-dicarboxyphenyl) hexafluoropropane diacid liver. Further, as a preferable specific example of the diamine-based compound having a chemical structure of an aromatic group substituted with an aprotic electron donating group, for example, the above-mentioned R2 is benzophenone, diphenylhydrazone, diphenylarylene, Diphenylhexafluoropropane, bis (trifluoromethyl) biphenyl and other compounds. In the sulfonium imine of the present invention having the structural unit represented by the formula (1), other structural units than the structural unit represented by the formula (1) may be contained within a range that does not impair the effect of the present invention. There is no particular restriction on the molecular weight of the polyimide precursors that do not contain (A). The size of the paper is applicable to China National Standard (CNS) A4 (210 X 297). 11 311837 --------- r --- install -------- order ---------- (Please read the precautions on the back before filling this page) 554244 A7 V. Description of the invention (u) It is preferably 10,000 to 20,000 weight average molecular weight. Incidentally, this molecular weight is measured by GPC (gel permeation chromatography) and then calculated based on polystyrene having a standard molecular weight. Next, the polyoxazole precursor is explained in detail. In the polyoxazole precursor, R5 in the structural unit represented by the formula (2) can explicitly mention, for example, that it has a skeleton such as benzyl, naphthalene, fluorene, biphenyl, diphenyl ether, diphenylene, diphenylpropane, Dibenzyl hexafluoropropane, dibenzidine, and the like are dicompensated aromatic hydrocarbon residues, or divalent aliphatic hydrocarbon residues having a skeleton such as butane, cyclobutane, and the like, but the present invention is not limited to these. Its carbon number is preferably 4 to 30. Preferred examples are phenyl, biphenyl, diphenyl ether and diphenyl hexafluoropropane. Incidentally, R5 in a molecule which may contain two or more of the above-exemplified groups as a polyamine derivative if necessary. R6 in the structural unit represented by the formula (2) can explicitly mention, for example, that it has a skeleton such as dibenzyl ether, diphenyl sulfide, benzophenone, diphenylmethane, diphenylpropane, diphenylhexafluoro Tetravalent aromatic hydrocarbon residues such as propane, diphenylamidine, diphenylarsine, biphenyl, benzene, etc., but the present invention is not limited to these. Its carbon number is preferably from 6 to 30. Preferred examples thereof are diphenylhexafluoropropane, diphenyl ether and biphenyl. Incidentally, it is possible to contain two or more of the above-exemplified groups as R6 if necessary. R7 in the structural unit represented by the formula (2) is a monovalent group, an alkoxy group, or a xylyl group, which constitutes an acetal or an acetal, and its hydrazone is converted into a hydrogen atom by an acid, and is the same as the above R is the same. The substitution ratio of the protective group represented by R7 of the hydrogen atom is preferably i 〇 to the paper size. Applicable to China National Standard (CNS) A4 (210 X 297 mm) 12 311837 (Please read the precautions on the back before filling this page ) Packing -------- Order ----.------ Line · Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 554244 A7 B7 V. Invention Description (13 80%, preferably 30) To 60%. If the substitution ratio is higher than that of the upper material, the adhesiveness will sometimes decrease, and if lower than the above, the dragon will adversely affect the substrate. For example, in the present invention, the The oxazole precursor can be made by using the following carboxylic acid; 5 nr bucket / α, two made by eight (6) ^ and a diamine compound shown by the following formula 作为 as a partial starting material (6)
HO^^R5y/^〇HHO ^^ R5y / ^ 〇H
[式中’ R5與式(2)中之r5具有相同意義]。 式(6)所示之二羧酸的特定實例可包含例如44,二羧 基二苯醚、苯二甲酸、間苯二甲酸、對苯二甲酸等,其a 合物及至少兩種上述化合物之共聚物。 、& (7) (請先閱讀背面之注意事項再填寫本頁)[In the formula, 'R5 has the same meaning as r5 in formula (2)]. Specific examples of the dicarboxylic acid represented by the formula (6) may include, for example, 44, dicarboxydiphenyl ether, phthalic acid, isophthalic acid, terephthalic acid, etc., a compound thereof, and at least two of the above compounds Copolymer. , &Amp; (7) (Please read the notes on the back before filling this page)
HO OH \ϊβ η2ν〆 'νη2 經濟部智慧財產局員工消費合作社印製 [式中,R6與式(2)中之R6具有相同意義]。 式(7)所示之二胺基化合物的特定實例可包含例如 2,2f-雙(3-胺基_4_羥基苯基)六氟丙烷、4,4,_二胺基_3 3,_二 羥基聯笨等。 ’ 上述聚噁唑前驅物可依據例如下述方法獲得之。 亦即,式(6)所示之二羧酸在有機溶劑如甲基哦洛 烧嗣、r·丁内醋、N,N_二甲基乙醯胺、二甲亞楓等中使用 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 13 311837 554244 經濟部智慧財產局員工消費合作社印製 A7 五、發明說明(14 齒化劑如亞硫醯氯予以鹵化, #、、、後於與上述相同之有機溶 劑中,在適合之觸媒如吡啶等 一 寻之存在下使所得之化合物與 式(7)所示之二胺基化合物反應。 藉由上述方法所獲得之聚嚼嗤前驅物在不良溶劑如 ^甲醇、乙醇、丙醇、丙,等中結晶,藉由過濾收集再 乾燦之。然後,在非質子性有機溶劑如四氣咲喊、n_甲芙 哦略燒嗣、卜丁内醋、N,N_二甲基乙酿胺、二甲亞楓等中, 藉由對所得材料添加具有R7之經基之保護劑及若有需 要,反應觸媒,以獲得具有上述式⑺所示之結構單元之聚 醢亞胺前驅物。 本發明之具有上述式(2)所示結構單元之聚噪唾前驅 物中,可含有式⑺所示之結構單元以外之其他結構單元。 於此情形下,此比率較佳為全部構成單^之%莫耳。/❶或更 少。 成分(A)之聚噁唑前驅物的分子量並無特別限制,較佳 為10,000至200,000重量平均分子量。附帶一提分子量 係藉由GPC(凝膠滲透層析術)測量再基於具有標準分子量 之聚苯乙烯計算之。 刀 附帶-提,可使用聚醯亞胺前驅物與聚嚼嗤前驅物之 混合物作為成分(A)。 本發明之組成物中,與用作為成分⑷之聚醯亞胺前驅 物或聚噁唑前驅物合併者,係使用作為成分(B)之藉由照射 輻射產生酸之化合物(以下稱為"酸產生劑")。為了改良曝 光時對光的感光性及解析度,以100重量份成分(a)計'" ^紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) (請先閱讀背面之注意事項再填寫本頁)HO OH \ ϊβ η2ν〆 'νη2 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs [where, R6 has the same meaning as R6 in (2)]. Specific examples of the diamine-based compound represented by the formula (7) may include, for example, 2,2f-bis (3-amino_4-hydroxyphenyl) hexafluoropropane, 4,4, _diamino_3 3, _Dihydroxy dibenzyl and the like. The polyoxazole precursor can be obtained according to the following method, for example. That is, the dicarboxylic acid represented by the formula (6) is used in an organic solvent such as methyl holodamine, r.butyrolactone, N, N-dimethylacetamide, dimethyl acer, etc. Standards are applicable to China National Standard (CNS) A4 specifications (210 X 297 mm) 13 311837 554244 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs A7 V. Description of the invention (14 Halogenating agents such as thionyl chloride, #, Then, in the same organic solvent as above, the obtained compound is reacted with a diamine compound represented by the formula (7) in the presence of a suitable catalyst such as pyridine and the like. Obtained by the above method The precursors of polyammonium chloride are crystallized in poor solvents such as methanol, ethanol, propanol, propane, etc., collected by filtration, and dried again. Then, in an aprotic organic solvent such as Siqifu, n_ Jiafu Oh, slightly burned ravioli, pudding vinegar, N, N-dimethyl ethyl amine, dimethyl isocyanate, etc., by adding a protective agent having a radical of R7 to the obtained material, and if necessary, a reaction catalyst To obtain a polyimide precursor having a structural unit represented by the above formula (I). The noise-cancelling precursor having the structural unit represented by the above formula (2) may contain structural units other than the structural unit represented by the formula (⑺). In this case, the ratio is preferably %% of all constituent units. Ear. / ❶ or less. The molecular weight of the polyoxazole precursor of the component (A) is not particularly limited, but preferably 10,000 to 200,000 weight average molecular weight. Incidentally, the molecular weight is determined by GPC (gel permeation chromatography) ) The measurement is based on polystyrene with a standard molecular weight. The knife is attached and lifted. A mixture of a polyimide precursor and a polychrysene precursor can be used as the component (A). In the composition of the present invention, the As a component of a polyimide precursor or a polyoxazole precursor, a compound that generates an acid by irradiating radiation as a component (B) (hereinafter referred to as "acid generator") is used. Photosensitivity and resolution during exposure, based on 100 parts by weight of component (a) '" ^ Paper size applies Chinese National Standard (CNS) A4 specification (210 X 297 public love) (Please read the precautions on the back first (Fill in this page again)
經濟部智慧財產局員工消費合作社印製 554244 -------— R7_ 五、發明說明(l5 ) 刀(B)的用量較佳為〇01至5〇重量份,更佳為〇〇1至2〇 重量份’特佳為5至15重量份。 用於本發明之酸產生劑(B)藉由照射活性光如UV光時 顯不酸性質,且具有消去成分之聚醯亞胺前驅物或聚嗔 唑刖驅物中之保護基的功能。至於成分之化合物,可明 確地述及例如二芳基鎏鹽、三芳基鎏鹽、二烷基苯乙_基 鎏鹽、一芳基碘鏺鹽、芳基重氮鏺鹽、芳香族四羧酸鹽、 芳香族磺酸鹽、硝基苯甲基酯、芳香族N-氧亞胺基磺酸 鹽、芳香族磺醯胺、萘醌二疊氮-4_磺酸鹽等。這些化合物 可視需求單獨或合併兩種或更多種,或與其他敏化劑合併 使用。 其中,較佳為芳香族]氧亞胺基磺酸鹽,此乃由於可 預期之咼感光性之故,二芳基碘鎗鹽亦較佳,此乃由於可 預期在未曝光部份具有適合之溶解防止效果之故。 若有需要,可對本發明之正型感光性樹脂組成物添加 賦與黏著性質之黏著性質賦與劑如有機矽化合物、矽烷偶 合劑、均染劑等。該種試劑可述及例如卜胺基丙基三甲氧 基矽烷、r-胺基丙基三乙氧基矽烷、乙烯基三乙氧基矽烷、 r-環氧丙氧基丙基三乙氧基矽烷、卜甲基丙烯氧基丙基三甲 氧基矽烷、尿素丙基三乙氧基矽烷、參(乙醯丙酮)鋁、乙 醯乙酸鋁二異丙醇鹽等。 當使用黏著性質賦與劑時,以丨00重量份聚醯亞胺前 驅物及/或聚噁唑前驅物計,其用量較佳為〇1至2〇重量 份,更佳為0.5至10重量份。 ---------i----裝--------訂-----------· (請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 15 311837 554244 A7 B7 五、發明說明(16 ) 本發明中,將這些成分溶於溶劑中再以清漆狀態使用 之。至於溶劑,可述及例如N_甲基_24比咯烷酮、卜丁内酯、 (請先閱讀背面之注意事項再填寫本頁) N,N_ 一甲基乙醯胺、二甲亞楓、2_甲氧基乙醇、二乙二醇 二乙醚、二乙二醇二丁醚、丙二醇單甲醚、二丙二醇單甲 醚、丙二醇單甲醚乙酸酯、乳酸甲酯、乳酸乙酯、乳酸丁 醋、甲基-1,3-丁二醇乙酸酯、ι,3-丁二醇乙酸酯、環己酮、 壞戊_、四氳呋喃等,且可單獨或合併兩種或更多種使用 之。 溶劑的用量並無特別限制,其用量通常可為以組成物 之總重量計之40至75重量%。 經濟部智慧財產局員工消費合作社印製 使用本發明之正型感光性樹脂組成物製造圖案的方 法’首先藉由在適合之支撐體如矽晶圓、陶瓷、鋁基材等 上塗覆該組成物。至於塗覆方法,可述及例如旋轉塗覆、 使用嘴霧塗覆機之喷霧塗覆、浸潰、印刷、滾筒塗覆等。 其次’藉由於60至120°C之預烘培乾燥塗覆膜,然後以具 有所要形狀之圖案的輻射或光化輻射予以照射。至於輻射 或光化輻射,可使用X光、電子光、UV光、可見光等而 較佳為那些具有200奈米至500奈米之波長者。亦可使用 單色光如卜線、i_線等。其次,較佳為將曝光材料加熱至 50至15〇°c以將在照射部份表面層上產生之酸擴散至底部 部份。然後’使曝光材料顯影以溶解及移除曝光部份,由 而能獲得圖案。 至於顯影劑,可述及例如含有無機鹼如氫氧化鈉、氫 氧化卸、碳酸鈉、矽酸鈉、偏矽酸鈉、氨等之鹼性水溶液; 本紙張尺度適用中關家標準(CNS)A4規格(21G X 297公爱) 16 311837 554244 A7 __________ B7 五、發明說明(17 ) (請先閱讀背面之注意事項再填寫本頁) 一級胺如乙胺、正丙胺等;二級胺如二乙胺、二正丙胺等; 三級胺如三乙胺、甲基二乙胺等;醇胺如二甲基乙醇胺、 三乙醇胺等;四級銨鹽如氫氧化四甲基銨、氫氧化四乙基 銨等;及含有以適合用量添加至上述鹼性水溶液之水可溶 有機溶劑或界面活性劑的水溶液。 至於顯影方法,可使用喷霧、槳葉、浸潰、超音波等 系統。其次,可沖洗藉由顯影所形成之圖案。至於沖洗溶 液可使用蒸餾水。其次,進行熱處理以獲得具有優異耐熱 性之最終圖案。熱處理溫度通常為15〇至45(rc。 本發明之感光性樹脂組成物可使用於電子組件如半導 體裝置或多層配線板等,更明確地說,其可使用於形成半 導體裝置之表面保護膜或中間層絕緣膜,或多層配線板之 中間層絕緣膜等。依據本發明之半導體裝置並無特別限 制,只要使用本發明之上述組成物提供表面保護膜或中間 層絕緣膜即可,且能採用各種結構。 以下將說明依據本發明之半導體裝置之製備方法的一 個實例。 經濟部智慧財產局員工消費合作社印製 第1圖為顯示具有多層配線結構之半導體裝置之製備 步驟的圖式。圖式中,將保護膜2如氧化矽膜塗覆於半導 體基材1如具有電路元件之Si基材,除電路元件之預定部 份以外,再在曝露之電路元件上形成第一導電層3。在上 述半導體基材上’藉由旋轉塗覆法形成中間層絕緣膜4(步 驟⑷)。 其次’在上述中間層絕緣膜4上形成感光性樹脂層5 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公餐) 17 311837 經濟部智慧財產局員工消費合作社印製 554244 A7 - B7 五、發明說明(l8 ) 如氣化物橡膠型、酚醛清漆型等,再藉由習知蝕刻技術形 成視窗6A由而曝露出中間層絕緣膜4的預定部份(步驟y (b))。 使用氣體如氧、四氟化碳等藉由乾式飿刻手段選擇性 地蝕刻視窗6A之中間層絕緣膜4,以開啟視窗6B。然後, 使用僅姓刻感光性樹脂層5而不會蝕刻自視窗6B曝露出 之第一導電層3的蝕刻溶液完全地移除感光性樹脂層5(步 驟(c)) 〇 又’使用習知技術形成第二導電層7以完全地進行與 第一導電層3之電氣連接(步驟(d))。 當欲形成三層或更多層之多層配線結構時,重複地進 行上述步驟以形成個別層。 其次’形成表面保護膜8。此圖式之實例中,係以旋 轉塗覆法塗覆上述感光性樹脂組成物,乾燥再以光照射緣 製形成視窗6C預定部份之圖案的光罩,然後藉由鹼性水 溶液予以顯影以形成圖案,再加熱以形成樹脂膜而形成表 面保護臈8。此樹脂膜係用於保護導電層免於來自外界之 應力,α射線等,而使所得之半導體裝置具有優異之可靠 度。 附帶一提,上述實例中亦可能使用本發明之感光性樹 脂組成物形成中間層絕緣膜。 [實施例] 以下,將參照實施例更詳細說明本發明。 f施例1辛醯胺酸醋的合成 (請先閱讀背面之注咅?事項再填寫本頁}Printed by the Employees' Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 554244 --------- R7_ V. Description of the invention (l5) The amount of knife (B) is preferably 0.001 to 50 parts by weight, more preferably 〇01 It is particularly preferably 5 to 15 parts by weight to 20 parts by weight. The acid generator (B) used in the present invention exhibits no acidic properties when irradiated with active light such as UV light, and has a function of eliminating a protective group of a polyimide precursor or a polyoxazole hydrazone. As for the compounds of the components, for example, diarylsulfonium salts, triarylsulfonium salts, dialkylphenethylsulfonium salts, monoaryliodophosphonium salts, aryldiazophosphonium salts, aromatic tetracarboxylic acids can be explicitly mentioned. Acid salts, aromatic sulfonates, nitrobenzyl esters, aromatic N-oxyiminosulfonates, aromatic sulfonamides, naphthoquinonediazide-4-sulfonates, and the like. These compounds may be used alone or in combination of two or more kinds, or in combination with other sensitizers, as required. Among them, aromatic] oxyimino sulfonate is preferred because of the expected photosensitivity, and diaryl iodogun salts are also preferred because it is expected to have suitable properties in unexposed areas. Its dissolution prevention effect. If necessary, a tackifier such as an organosilicon compound, a silane coupling agent, a leveling agent, and the like can be added to the positive photosensitive resin composition of the present invention to impart tacky properties. Such reagents can be mentioned, for example, aminopropyltrimethoxysilane, r-aminopropyltriethoxysilane, vinyltriethoxysilane, r-glycidoxypropyltriethoxy Silane, dimethacryloxypropyltrimethoxysilane, urea propyltriethoxysilane, ginseng (acetamidine) aluminum, aluminum acetate diisopropoxide and the like. When an adhesive property imparting agent is used, the amount thereof is preferably from 0.01 to 20 parts by weight, more preferably from 0.5 to 10 parts by weight based on 00 parts by weight of the polyimide precursor and / or the polyoxazole precursor. Serving. --------- i ---- install -------- order ----------- (Please read the precautions on the back before filling this page) Paper size applies Chinese National Standard (CNS) A4 specification (210 X 297 mm) 15 311837 554244 A7 B7 V. Description of the invention (16) In the present invention, these ingredients are dissolved in a solvent and then used in a varnished state. As for the solvent, there can be mentioned, for example, N_methyl_24-pyrrolidone, bupropionone, (please read the precautions on the back before filling this page) N, N_ monomethylacetamide, dimethylalanine , 2-methoxyethanol, diethylene glycol diethyl ether, diethylene glycol dibutyl ether, propylene glycol monomethyl ether, dipropylene glycol monomethyl ether, propylene glycol monomethyl ether acetate, methyl lactate, ethyl lactate, Butyl lactate, methyl-1,3-butanediol acetate, ι, 3-butanediol acetate, cyclohexanone, pentamidine, tetramethylfuran, etc., and they can be used alone or in combination of two or Use more. The amount of the solvent to be used is not particularly limited, and the amount may be generally 40 to 75% by weight based on the total weight of the composition. Method for printing a pattern using the positive photosensitive resin composition of the present invention by an employee consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs' by first coating the composition on a suitable support such as silicon wafer, ceramic, aluminum substrate, etc. . As for the coating method, for example, spin coating, spray coating using a mouth spray coater, dipping, printing, cylinder coating, and the like can be mentioned. Secondly, the coating film is dried by pre-baking at 60 to 120 ° C, and then irradiated with radiation or actinic radiation having a pattern having a desired shape. As for radiation or actinic radiation, X-ray, electron light, UV light, visible light, etc. can be used, and those having a wavelength of 200 nm to 500 nm are preferred. Can also use monochromatic light such as Bu line, i_ line and so on. Secondly, it is preferable to heat the exposure material to 50 to 150 ° C to diffuse the acid generated on the surface layer of the irradiated portion to the bottom portion. Then, the developing material is developed to dissolve and remove the exposed portion, so that a pattern can be obtained. As for the developer, an alkaline aqueous solution containing, for example, an inorganic base such as sodium hydroxide, sodium hydroxide, sodium carbonate, sodium silicate, sodium metasilicate, ammonia, etc. can be mentioned; this paper standard applies to the Zhongguanjia Standard (CNS) A4 specifications (21G X 297 public love) 16 311837 554244 A7 __________ B7 V. Description of the invention (17) (Please read the notes on the back before filling this page) Primary amines such as ethylamine and n-propylamine; secondary amines such as two Ethylamine, di-n-propylamine, etc .; tertiary amines such as triethylamine, methyldiethylamine, etc .; alcohol amines such as dimethylethanolamine, triethanolamine, etc .; quaternary ammonium salts such as tetramethylammonium hydroxide, tetrahydroxide Ethyl ammonium, etc .; and an aqueous solution containing a water-soluble organic solvent or a surfactant added to the above-mentioned alkaline aqueous solution in a suitable amount. As for the development method, a spray, paddle, impregnation, ultrasonic, etc. system can be used. Second, the pattern formed by development can be developed. As the rinse solution, distilled water can be used. Next, heat treatment is performed to obtain a final pattern having excellent heat resistance. The heat treatment temperature is usually 150 to 45 ° C. The photosensitive resin composition of the present invention can be used for electronic components such as semiconductor devices or multilayer wiring boards, and more specifically, it can be used for forming a surface protective film of a semiconductor device or Interlayer insulating film, or interlayer insulating film of multilayer wiring board, etc. The semiconductor device according to the present invention is not particularly limited, as long as a surface protective film or an interlayer insulating film is provided by using the above composition of the present invention, and can be used Various structures. An example of a method for manufacturing a semiconductor device according to the present invention will be described below. Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs. Figure 1 is a diagram showing the manufacturing steps of a semiconductor device with a multilayer wiring structure. In the invention, a protective film 2 such as a silicon oxide film is coated on a semiconductor substrate 1 such as a Si substrate having a circuit element, and a first conductive layer 3 is formed on the exposed circuit element in addition to a predetermined portion of the circuit element. On the semiconductor substrate, an intermediate layer insulating film 4 is formed by a spin coating method (step ⑷). Next, the intermediate layer is formed on the intermediate layer. A photosensitive resin layer is formed on the insulating film 4 The paper size is in accordance with Chinese National Standard (CNS) A4 (210 X 297 meals) 17 311837 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 554244 A7-B7 V. Description of the invention ( 18) Such as a gaseous rubber type, a novolac type, etc., and then a window 6A is formed by a conventional etching technique to expose a predetermined portion of the interlayer insulating film 4 (step y (b)). Use a gas such as oxygen, Carbon fluoride or the like selectively etches the interlayer insulating film 4 of the window 6A by dry etching to open the window 6B. Then, only the photosensitive resin layer 5 is engraved without etching the first exposed portion of the window 6B. The etching solution of a conductive layer 3 completely removes the photosensitive resin layer 5 (step (c)). Then, the second conductive layer 7 is formed using a conventional technique to completely perform the electrical connection with the first conductive layer 3 (step (D)). When it is desired to form a multilayer wiring structure of three or more layers, the above steps are repeatedly performed to form individual layers. Next, 'the surface protection film 8 is formed. In the example of this figure, spin coating is used. Method for coating the above photosensitive tree The composition is dried and then irradiated with light to form a photomask forming a pattern of a predetermined portion of the window 6C, and then developed by an alkaline aqueous solution to form a pattern, and then heated to form a resin film to form a surface protective film 8. This resin film It is used to protect the conductive layer from external stress, alpha rays, etc., so that the obtained semiconductor device has excellent reliability. Incidentally, in the above examples, it is also possible to use the photosensitive resin composition of the present invention to form an intermediate layer. Insulating film. [Examples] Hereinafter, the present invention will be described in more detail with reference to examples. FExample 1 Synthesis of Caprylic Acid Vinegar (Please read the note on the back? Matters before filling out this page}
本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 18 311837 554244 A7 _____B7____ 五、發明說明(1S> ) 使10克3,3’,4,4’-二苯醚四羧酸二酸酐(〇dpa)及3.87 克異丙醇溶解於45克Ν’Ν·二甲基乙醯胺(DMAc)中,之後 添加催化量之1,8-二氮雜雙環[5·4·0]十一碳烯,使此混合 物於60°C加熱2小時,再於室溫攪拌1 5小時以進行酯化 反應。 之後’在冰冷卻下將7 · 1克氣化亞硫醯添加至混合物 中,使所得之混合物回到室溫並使之反應2小時。然後, 在冰冷卻下將溶解於45克DMAc中之10.6克2,2-雙(3-胺 基_4_羥基苯基)六氟丙烷及4 67克吡啶添加至上述混合物 中’使此混合物於室溫攪拌30分鐘。將此反應混合物滴加 至蒸顧水中’再藉由過濾收集沈殿物,在減壓下乾燥之以 獲得聚釀胺酸酯。此材料的重量平均分子量為24,〇〇〇及數 目平均分子量為17,〇〇〇。 验羥基的保譜 使10克上述獲得之聚醯胺酸酯溶解於5〇克四氫呋喃 中’再添加26克2,3-二氫吡喃及催化量之對-甲苯磺酸至 此溶液中’所得之混合物於室溫攪拌1小時。將此反應混 合物滴加至蒸餘水中再藉由過濾收集沈澱物,在減壓下乾 燥之以獲得式(1)所示之聚醯亞胺前驅物。四氫吡喃基對所 得材料之經基的取代比率為54%。 感光特性的評免 對100重量份上述聚醯亞胺前驅物添加15重量份作為 藉由照射輕射產生酸之化合物之二甲氧基蒽磺酸二苯基碘 錄’再使此混合物溶解於2 _甲氧基乙醇中。 (請先閱讀背面之注意事項再填寫本頁) 裝--------訂----------線- 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中關家標準(CNS)A4規格(210 X 297公爱) 19 311837 經濟部智慧財產局員工消費合作社印製 554244 A7 ----- B7 五、發明說明(2〇 ) 在矽晶圓上對上述溶液施加旋轉塗覆以形成乾膜厚度 為2至3微米之塗覆膜,然後使用超高壓汞燈經由干擾濾 波器進行i-線(365奈米)曝光。 曝光後,使曝光材料於90°C加熱5分鐘,藉由2.38 重量%氫氧化四甲基銨水溶液與甲醇的混合溶液(體積比 5: 1)予以顯影直至於曝光部份之矽晶圓曝光。結果能獲得 具有10微米之解析度及90%之於未曝光部份之膜殘留率 的良好圖案。此時的曝光劑量為2〇〇微焦耳/平方毫米。附 帶一提’曝光後’即使在加熱步驟前使此材料靜置3()分鐘 至2小時亦無觀察到圖案形狀的劣化。 實施例2 以與實施例1相同之方式,但實施例1所使用之四羧 酸二酸酐改變為2,2-雙(3,4-二羧基苯基)六氟丙烷二酸 酐’合成聚醯亞胺前驅物(重量平均分子量:14,5〇〇,數目 平均分子量:11,000),再以與實施例i相同之方式進行感 光特性的评估。結果能獲得具有6微米之解析度及92%之 於未曝光部份之膜殘留率的良好圖案。此時的曝光劑量為 200微焦耳/平方毫米。附帶一提,曝光後,即使在加熱步 驟前使此材料靜置30分鐘至2小時亦無觀察到圖案形狀的 劣化。 實施例3 實施例1中,藉由照射輻射產生酸之化合物改變為萘 二甲醯亞胺基三氟甲烷磺酸並使用2 重量0/〇氫氧化四甲 基銨水溶液作為顯影劑,以與實施例丨相同之方式進行感 --------r---裝--------訂----- (請先閱讀背面之注意事項再填寫本頁) 0 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 20 311837 554244 A7 -----— B7 五、發明說明(21 ) 光性特性的評估。結果能獲得具有8微米之解析度及92〇/〇 之於未曝光部份之膜殘留率的良好圖案。此時的曝光劑量 (請先閱讀背面之注意事項再填寫本頁) 為150微焦耳/平方毫米。附帶一提,曝光後,即使在加熱 步驟前使此材料靜置30分鐘至2小時亦無觀察到圖案形狀 的劣化。 實施例4 實施例2中,藉由照射輻射產生酸之化合物改變為萘 二甲酿亞胺基三氟甲烷磺酸並使用2 38重量0/〇氳氧化四甲 基錢水溶液作為顯影劑,以與實施例1相同之方式進行感 光性特性的評估。結果,能獲得具有8微米之解析度及90〇/〇 之於未曝光部份之膜殘留率的良好圖案。此時的曝光劑量 為1〇〇微焦耳/平方毫米。附帶一提,曝光後,即使在加熱 步驟前使此材料靜置30分鐘至2小時亦無觀察到圖案形狀 的劣化。 复雇例5聚醯胺酴酯的奋# 於45克N,N-二甲基乙醯胺(DmAc)中溶解10克之 3,3’,4,4’-二苯醚四羧酸二酸酐(〇dPa)及3·87克異丙醇,在 經濟部智慧財產局員工消費合作社印製 添加催化量之1,8-二氮雜雙環[5·40]十一碳烯後,使此混 合物於60°C加熱2小時,再於室溫攪拌1 5小時以進行酯 化反應。 之後’在冰冷卻下將7 · 1克氣化亞硫醯添加至此混合 物中,使所得之混合物回到室溫並使之反應2小時。然後, 在冰冷卻下將溶解於45克DM Ac中之10.6克之2,2-雙(3_ 胺基-4-羥基苯基)六氟丙烷及4 67克吡啶添加至上述混 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公餐) 21 311837 554244 A7 五、發明說明(22 ) (請先閱讀背面之注音?事項再填寫本頁) 物中再於室溫攪拌此混合物3〇分鐘。將此反應混合物滴加 至蒸餾水中再藉由過濾收集沈澱物,在減壓下予以乾燥以 獲得聚酿胺酸酯。此材料的重量平均分子量為24,〇〇〇及其 數目平均分子量為17,〇〇〇。 聆貌棊的保護反鹿 於50克卜丁内酯中溶解1〇克上述獲得之聚醯胺酸 醋’然後,將1.96克第三丁基二甲基氣矽烷至此溶液中, 在冰冷卻下攪拌此混合物3小時。將此反應混合物滴加至 蒸顧水中’藉由過濾收集所形成之沈澱物,在減壓下乾燥 以獲得式(1)所示之聚醯亞胺前驅物。第三丁基二甲基氣石夕 烧基對所得材料之羥基的取代比率為46%。 感光特性的評任 對100重量份上述聚醢亞胺前驅物添加15重量份作為 藉由照射輻射產生酸之化合物之二甲氧基蒽磺酸二苯基碘 鎗,再將此混合物溶解於2-甲氧基乙醇中。 經濟部智慧財產局員工消費合作社印製 在石夕晶圓上對上述溶液施加旋轉塗覆以形成乾膜厚度 為2至3微米之塗覆膜,然後,使用超高壓汞燈經由干擾 濾波器進行i-線(365奈米)曝光。 曝光後,使曝光材料於10CTC加熱5分鐘,藉由2.38 重量%复氧化四甲基銨水溶液與甲醇的混合溶液(體積比 5 : 1)予以顯影直至於曝光部份之矽晶圓曝光,再以水沖洗 之。結果可獲得具有15微米之解析度及88%之於未曝光 部份之膜殘留率的良好圖案。此時的曝光劑量為25〇微焦 耳/平方毫米。附帶一提,曝光後,即使在加熱步驟前使此 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 22 311837 554244 A7 ------B7 五、發明說明(23 ) 材料靜置30分鐘至2小時亦無觀察到圖案形狀的劣化。 實施例6 (請先閱讀背面之注意事項再填寫本頁) 以與實施例5相同之方式,但實施例5所使用之四繞 酸二酸酐改變為2,2-雙(3,4-二羧基苯基)六氟丙烷二酸酐 ’合成聚醯亞胺前驅物(重量平均分子量·· 14,5〇〇,數目平 均分子量:11,〇〇〇),再以與實施例5相同之方式進行感光 特性的評估。結果,能獲得具有1〇微米之解析度及92〇/〇 之於未曝光部份之膜殘留率的良好圖案。此時的曝光劑量 為300微焦耳/平方毫米。附帶一提,曝光後,即使在加熱 步驟前使此材料靜置30分鐘至2小時亦無觀察到圖案形狀 的劣化。 實施例7 實施例5中,羥基的保護基改變為乙氧基甲基再合成 聚醯亞胺前驅物,以與實施例5相同之方式進行感光特性 的评估。結果,能獲得具有15微米之解析度及9〇%之於 未曝光部份之膜殘留率的良好圖案。此時的曝光劑量為 250微焦耳/平方毫米。附帶一提,曝光後,即使在加熱步 經濟部智慧財產局員工消費合作社印製 驟前使此材料靜置30分鐘至2小時亦無觀察到圖案形狀的 劣化。 實施例8 實施例5中,藉由照射輻射產生酸之化合物改變為萘 二甲醯亞胺基三氟甲烷磺酸並使用2 38重量%氫氧化四甲 基銨水溶液作為顯影劑,以與實施例5相同之方式進行感 光特性的評估。結果,能獲得具有1〇微米之解析度及9〇% 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 23 311837 554244 A7 五、發明說明(24 ) 之於未曝光部份之臈殘留率的良好圖案。此時的曝光劑量 為 微“、、耳/平方毫米。附帶一提,曝光後,即使在加熱 (請先閱讀背面之注意事項再填寫本頁) 步驟刖使此材料靜置3〇分鐘至2小時亦無觀察到圖案形狀 的劣化。 實施例9 實施例7中,藉由照射輻射產生酸之化合物改變為萘 二甲醯亞胺基三氟甲烷磺酸並使用2.38重量%氫氧化四甲 基銨作為顯影劑,以與實施例5相同之方式進行感光特性 的評估。結果,能獲得具有15微米之解析度及88%之於 未曝光部份之膜殘留率的良好圖案。此時的曝光劑量為 200微焦耳/平方毫米。附帶一提,曝光後,即使在加熱步 驟前使此材料靜置30分鐘至2小時亦無觀察到圖案形狀的 劣化。 比較例1 以與實施例1相同之方式進行程序但不對合成中間體 之聚醯胺酸醋的經基進行保護,再以與實施例!相同之方 式進行感光特性的評估。 經 濟 部 智 慧 財 產 局 員 工 消 費 合 作 社 印 製This paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 18 311837 554244 A7 _____B7____ V. Description of the invention (1S >) 10 grams of 3,3 ', 4,4'-diphenyl ether tetracarboxylate Acid diacid anhydride (〇dpa) and 3.87 g of isopropanol were dissolved in 45 g of N'N · dimethylacetamide (DMAc), and then a catalytic amount of 1,8-diazabicyclo [5 · 4 · 0] Undecene, the mixture was heated at 60 ° C. for 2 hours, and then stirred at room temperature for 15 hours to carry out the esterification reaction. After that, 7.1 g of vaporized thionine was added to the mixture under ice-cooling, and the resulting mixture was returned to room temperature and allowed to react for 2 hours. Then, 10.6 g of 2,2-bis (3-amino_4-hydroxyphenyl) hexafluoropropane and 4 67 g of pyridine dissolved in 45 g of DMAc were added to the above mixture under ice-cooling to make the mixture Stir at room temperature for 30 minutes. This reaction mixture was added dropwise to distilled water, and then Shen Dianwu was collected by filtration, and dried under reduced pressure to obtain polyurethane. This material has a weight average molecular weight of 24,000 and a number average molecular weight of 17,000. The spectrum of the hydroxyl group was tested, and 10 g of the polyamidate obtained above was dissolved in 50 g of tetrahydrofuran, and 26 g of 2,3-dihydropyran and a catalytic amount of p-toluenesulfonic acid were added to the solution. The mixture was stirred at room temperature for 1 hour. This reaction mixture was added dropwise to distilled water, and the precipitate was collected by filtration, and dried under reduced pressure to obtain a polyimide precursor represented by the formula (1). The substitution ratio of the tetrahydropyranyl group to the vial of the obtained material was 54%. Evaluation of photosensitive characteristics: 100 parts by weight of the foregoing polyimide precursor was added with 15 parts by weight of dimethoxyanthracenesulfonate diphenyliodide as a compound that generates an acid by light irradiation, and the mixture was dissolved in 2 _ methoxyethanol. (Please read the precautions on the back before filling out this page.) -------- Order ---------- Line-Printed by the Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs Guan Family Standard (CNS) A4 specification (210 X 297 public love) 19 311837 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 554244 A7 ----- B7 V. Description of the invention (2) The above on a silicon wafer The solution was spin-coated to form a coating film with a dry film thickness of 2 to 3 microns, and then subjected to i-line (365 nm) exposure through an interference filter using an ultra-high pressure mercury lamp. After the exposure, the exposed material was heated at 90 ° C for 5 minutes, and developed with a mixed solution (volume ratio 5: 1) of 2.38 wt% tetramethylammonium hydroxide aqueous solution and methanol until the silicon wafer was exposed at the exposed portion. . As a result, a good pattern having a resolution of 10 m and a film residual rate of 90% on the unexposed portion was obtained. The exposure dose at this time was 200 microjoules per square millimeter. Note that even after 'exposure', even if the material is left to stand for 3 () minutes to 2 hours before the heating step, no deterioration in the shape of the pattern is observed. Example 2 In the same manner as in Example 1, except that the tetracarboxylic dianhydride used in Example 1 was changed to 2,2-bis (3,4-dicarboxyphenyl) hexafluoropropane dianhydride 'to synthesize polyfluorene The imine precursor (weight-average molecular weight: 14,500, number-average molecular weight: 11,000) was subjected to evaluation of photosensitivity characteristics in the same manner as in Example i. As a result, a good pattern having a resolution of 6 micrometers and a film residual rate of 92% in the unexposed portion was obtained. The exposure dose at this time was 200 microjoules per square millimeter. Incidentally, even after the material was left to stand for 30 minutes to 2 hours after the exposure, no deterioration in the shape of the pattern was observed. Example 3 In Example 1, a compound that generates an acid by irradiation with radiation was changed to naphthalenedimethyliminotrifluoromethanesulfonic acid and a 2 wt% 0/0 tetramethylammonium hydroxide aqueous solution was used as a developer to Example 丨 Feel the same way -------- r --- install -------- order ----- (Please read the precautions on the back before filling this page) 0 copies The paper size applies the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 20 311837 554244 A7 ------ B7 V. Description of the invention (21) Evaluation of optical properties. As a result, a good pattern having a resolution of 8 micrometers and a film residual rate of 92.0 / 0 in the unexposed portion can be obtained. The exposure dose at this time (please read the precautions on the back before filling this page) is 150 microjoules per square millimeter. Incidentally, even after the material was left to stand for 30 minutes to 2 hours after the exposure, no deterioration in the shape of the pattern was observed. Example 4 In Example 2, the compound that generates an acid by irradiating was changed to naphthalene dimethyl iminotrifluoromethanesulfonic acid and a 2 38 wt% 0 / 〇 氲 aqueous solution of tetramethyl money was used as a developer. Evaluation of photosensitivity characteristics was performed in the same manner as in Example 1. As a result, a good pattern having a resolution of 8 micrometers and a film residual ratio of 90/0 to the unexposed portion can be obtained. The exposure dose at this time was 100 microjoules per square millimeter. Incidentally, even after the material was left to stand for 30 minutes to 2 hours after the exposure, no deterioration in the shape of the pattern was observed. Reemployment Example 5 Polyammonium Ethyl Essence of Fen # Dissolve 10 g of 3,3 ', 4,4'-diphenyl ether tetracarboxylic dianhydride in 45 g of N, N-dimethylacetamide (DmAc) (〇dPa) and 3.87 grams of isopropyl alcohol, printed in the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs, added a catalytic amount of 1,8-diazabicyclo [5 · 40] undecene, and made this mixture It was heated at 60 ° C for 2 hours, and then stirred at room temperature for 15 hours to carry out the esterification reaction. Thereafter, 7.1 g of vaporized thionine was added to the mixture under ice-cooling, and the resulting mixture was returned to room temperature and allowed to react for 2 hours. Then, under ice cooling, 10.6 g of 2,2-bis (3-amino-4-hydroxyphenyl) hexafluoropropane and 4 67 g of pyridine dissolved in 45 g of DM Ac were added to the above mixed paper. National Standard (CNS) A4 Specification (210 X 297 Meals) 21 311837 554244 A7 V. Description of Invention (22) (Please read the note on the back? Matters before filling out this page) and then stir the mixture at room temperature. minute. This reaction mixture was added dropwise to distilled water, and the precipitate was collected by filtration, and dried under reduced pressure to obtain a polyurethane. This material has a weight average molecular weight of 24,000 and a number average molecular weight of 17,000. Dissolve 10% of the polyamic acid vinegar obtained above in 50 g of butyrolactone. Then, put 1.96 g of tert-butyldimethylsilyl silane into this solution, and cool under ice This mixture was stirred for 3 hours. This reaction mixture was added dropwise to distilled water, and the formed precipitate was collected by filtration, and dried under reduced pressure to obtain a polyimide precursor represented by the formula (1). The substitution ratio of the third butyl dimethyl apatite group to the hydroxyl group of the obtained material was 46%. Evaluation of photosensitivity characteristics: 100 parts by weight of the foregoing polyimide precursor was added with 15 parts by weight of a dimethoxyanthracenesulfonic acid diphenyliodine gun as a compound that generates an acid by irradiation with radiation, and this mixture was dissolved in 2 -Methoxyethanol. The Consumer Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs printed on the Xixi wafer to apply spin coating to the above solution to form a coating film with a dry film thickness of 2 to 3 microns, and then performed the interference filter using an ultra-high pressure mercury lamp. i-line (365 nm) exposure. After exposure, the exposed material was heated at 10 CTC for 5 minutes, and developed with a mixed solution (volume ratio 5: 1) of 2.38 wt% tetramethylammonium hydroxide aqueous solution and methanol until exposed on the exposed silicon wafer. Rinse it with water. As a result, a good pattern having a resolution of 15 micrometers and a film residual ratio of 88% on the unexposed portion was obtained. The exposure dose at this time was 25 microjoules per square millimeter. Incidentally, after exposure, even before the heating step, make this paper size applicable to the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 22 311837 554244 A7 ------ B7 V. Description of the invention (23 ) No deterioration in pattern shape was observed even after the material was left to stand for 30 minutes to 2 hours. Example 6 (Please read the precautions on the back before filling this page) In the same way as in Example 5, but the tetracarboxylic acid dianhydride used in Example 5 was changed to 2,2-bis (3,4-di Carboxyphenyl) hexafluoropropane diacid anhydride 'to synthesize a polyimide precursor (weight average molecular weight · 14.50, number average molecular weight: 11,000), and then proceeded in the same manner as in Example 5. Evaluation of Photographic Characteristics. As a result, a good pattern having a resolution of 10 μm and a film residual rate of 92.0 / 0 in the unexposed portion can be obtained. The exposure dose at this time was 300 microjoules per square millimeter. Incidentally, even after the material was left to stand for 30 minutes to 2 hours after the exposure, no deterioration in the shape of the pattern was observed. Example 7 In Example 5, the protective group of a hydroxyl group was changed to an ethoxymethyl group to resynthesize a polyimide precursor, and evaluation of the light-sensitive properties was performed in the same manner as in Example 5. As a result, a good pattern having a resolution of 15 m and a film residual ratio of 90% on the unexposed portion can be obtained. The exposure dose at this time was 250 microjoules per square millimeter. Incidentally, after the exposure, even if the material is left to stand for 30 minutes to 2 hours before the printing step of the employee's consumer cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs, no deterioration in the shape of the pattern is observed. Example 8 In Example 5, the compound that generates an acid by irradiating was changed to naphthalenedimethyliminotrifluoromethanesulfonic acid and a 238 wt% aqueous solution of tetramethylammonium hydroxide was used as a developer. Example 5 was evaluated in the same manner as in the photosensitivity characteristics. As a result, a resolution of 10 micrometers and 90% can be obtained. The paper size is applicable to the Chinese National Standard (CNS) A4 specification (210 X 297 mm) 23 311837 554244 A7 V. Description of the invention (24) on the unexposed part A good pattern for the residual ratio of cyanide. The exposure dose at this time is micro-, ears / square millimeter. Incidentally, even after heating, even after heating (please read the precautions on the back before filling this page). Step 刖 Allow the material to stand for 30 minutes to 2 No deterioration in the shape of the pattern was observed even after 1 hour. Example 9 In Example 7, the compound that generates an acid by irradiation with radiation was changed to naphthalenedimethyliminotrifluoromethanesulfonic acid and 2.38% by weight of tetramethyl hydroxide was used. As a developer, ammonium was evaluated in the same manner as in Example 5. As a result, a good pattern having a resolution of 15 μm and a film residual ratio of 88% on the unexposed portion was obtained. The exposure at this time The dose was 200 microjoules per square millimeter. Incidentally, after exposure, even if the material was left to stand for 30 minutes to 2 hours before the heating step, no deterioration in the shape of the pattern was observed. Comparative Example 1 Same as Example 1 The procedure is carried out in a manner that does not protect the warp groups of the synthetic intermediates, and the evaluation of the photosensitivity characteristics is performed in the same manner as in the Example! Cooperatives PRINTED
結果,在顯影後於塗覆膜中無法得到清晰對比由而A 法獲得圖案。 …、 比較例7 以與實㈣1相1¾之方式進行程序但不添加藉由照射 輻射產生酸之化合物,再以與實施例同之方 : 光特性的評估。 π执 I 結果,即使當曝光材料浸潰於顯影劑中歷經長時間曰 本紙張尺從過用中關家標準(CNS)A4規格(210 X 297公髮)_ 554244 A7 五、發明說明(25 ) 亦無法溶解曝光部份並且自 曰 刀亚1目矽曰日圓發生剝離由而無法獲得 圃累。 比較例3 (請先閱讀背面之注意事項再填寫本頁) *以與實施例!相同之方式進行程序,但以第三丁氧基 羰基取代每基的保護基以合成聚酿亞胺前驅物,再以與實 施例1相同之方式進行感光特性的評估。當於曝光Η分鐘 内進行加熱步驟時’能獲得具有1〇微米之解析度及 之於未曝光部份之臈殘留率的良好圖案。然而,在加熱步 驟前使曝光材料靜置20分鐘或更久,其表面幾乎不溶於顯 影劑中由而無法獲得圖案。 t典例10聚-遂Α噁唑前驅物的合成 經濟部智慧財產局員工消費合作社印製 於50克Ν,Ν-二甲基乙醯胺(dmAc)中溶解ι〇·3克之 4,4 -二羧基二苯醚(〇BBA),在冰冷卻下添加8 6克氣化亞 硫醯後,使所得之混合物回到室溫並使之反應2小時。然 後,在冰冷卻下將溶解於50克DMAc中之14.6克2,2-雙 (3-胺基-4-羥基苯基)六氟丙烷及5 7克吡啶添加至上述混 合物中,再使此混合物於室溫攪拌3〇分鐘。將此反應混合 物滴加至蒸餾水中再藉由過濾收集沈澱物,在減壓下予以 乾燥以獲得聚醯胺。此材料的重量平均分子量為14,5 〇〇。 酚幾基的保讅及廄 於50克四氫呋喃中溶解1〇克上述獲得之聚醯胺,然 後將28克之2,3-二氫吡喃及催化量之對-甲苯磺酸添加至 溶液中,再使此混合物於室溫攪拌1小時。將此反應混合 物滴加至蒸餾水中,藉由過濾收集所形成之沈澱物,在減 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 25 311837 經濟部智慧財產局員工消費合作社印製 554244 Α7 -- Β7 五、發明說明(%) 壓下乾燥以獲得式(2)所示之聚苯并噁唑前驅物。四氫吡喃 基對所得材料之羥基的取代比率為58%。 感光特性的詳仕 對100重量伤上述之聚苯并鳴嗤前驅物添加重量份 作為藉由照射輻射產生酸之化合物之二甲氧基蒽磺酸二苯 基蛾鎗,再使此混合物溶解於2-甲氧基乙醇中。 在矽晶圓上對上述溶液施加旋轉塗覆以形成乾膜厚度 為2至3微米之塗覆膜,然後使用超高壓汞燈經由干擾濾 波器進行i-線(365奈米)曝光。 曝光後,使曝光材料於120°C加熱5分鐘,藉由238 重量%氫氧化四甲基銨水溶液予以顯影直至於曝光部份之 石夕晶圓曝光,再以水沖洗之。結果,能獲得具有5微米之 解析度及95%之於未曝光部份之膜殘留率的良好圖案。此 時的曝光劑里為200微焦耳/平方亳米。附帶一提,曝光 後,即使在加熱步驟前使此材料靜置30分鐘至2小時亦無 觀察到圖案形狀的劣化。 實施例11 以與實施例10相同之方式,但二魏酸改變為間笨二甲 酸’進行相同的程序以獲得聚苯并嗔唾前驅物,再以與實 施例1 0相同之方式進行感光特性的評估。結果,能獲得具 有6微米之解析度及92%之於未曝光部份之膜殘留率的良 好圖案。此時的曝光劑量為400微焦耳/平方毫米。附帶一 提,曝光後,即使在加熱步驟前使此材料靜置3〇分鐘至2 小時亦無觀察到圖案形狀的劣化。聚苯并噁唑前驅物的重 裝--------訂----.------ f請先閱讀背面之注意事項再填寫本頁) 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 26 311837 554244As a result, a clear contrast could not be obtained in the coating film after development and the pattern was obtained by method A. …, Comparative Example 7 The procedure was performed in the same manner as in Example 1 but without adding a compound that generates an acid by irradiation and radiation, and then the same method as in the Example: Evaluation of light characteristics. As a result, even when the exposure material is immersed in the developer over a long period of time, the paper ruler has been used in the CNS A4 specification (210 X 297) _554244 A7 V. Description of the invention (25 ) It was also unable to dissolve the exposed part and the Japanese yen had peeled off due to the knife 1 mesh, so it was not possible to get tired. Comparative Example 3 (Please read the precautions on the back before filling out this page) * In accordance with the examples! The procedure was performed in the same manner, except that the protective group of each group was substituted with a third butoxycarbonyl group to synthesize a polyimide precursor, and then the evaluation of the photosensitive properties was performed in the same manner as in Example 1. When the heating step is performed within one minute of exposure, a good pattern having a resolution of 10 micrometers and a residual ratio of rhenium to the unexposed portion can be obtained. However, if the exposure material is left to stand for 20 minutes or more before the heating step, its surface is hardly dissolved in the developer, and a pattern cannot be obtained. Example 10 Poly-synthesis of oxazole precursor synthesis of the Intellectual Property Bureau of the Ministry of Economic Affairs Employee Co-operative Society Printed in 50 g of Ν, Ν-dimethylacetamide (dmAc) Dissolved in 0.3 g of 4,4 -Dicarboxydiphenyl ether (OBBA). After adding 86 g of vaporized thionine under ice cooling, the resulting mixture is returned to room temperature and allowed to react for 2 hours. Then, 14.6 g of 2,2-bis (3-amino-4-hydroxyphenyl) hexafluoropropane and 57 g of pyridine dissolved in 50 g of DMAc were added to the above mixture under ice-cooling, and this was further added. The mixture was stirred at room temperature for 30 minutes. This reaction mixture was added dropwise to distilled water, and the precipitate was collected by filtration, and dried under reduced pressure to obtain polyamide. The weight average molecular weight of this material was 14,500. Dissolve 10 grams of polyamidoamine in 50 grams of tetrahydrofuran, and add 28 grams of 2,3-dihydropyran and a catalytic amount of p-toluenesulfonic acid to the solution. The mixture was allowed to stir for an additional hour at room temperature. This reaction mixture was added dropwise to distilled water, and the precipitates formed were collected by filtration. The paper size was reduced to the Chinese National Standard (CNS) A4 (210 X 297 mm). 25 311837 Employees of the Intellectual Property Bureau, Ministry of Economic Affairs Printed by the cooperative 554244 Α7-Β7 5. Description of the invention (%) Drying under pressure to obtain the polybenzoxazole precursor represented by formula (2). The substitution ratio of the tetrahydropyranyl group to the hydroxyl group of the obtained material was 58%. For details of the photosensitivity, add 100 parts by weight of the above-mentioned polybenzopyrene precursor to dimethoxyanthracene diphenyl moth gun as a compound that generates an acid by irradiation with radiation, and then dissolve the mixture in In 2-methoxyethanol. The above solution was spin-coated on a silicon wafer to form a coating film having a dry film thickness of 2 to 3 microns, and then subjected to i-line (365 nm) exposure through an interference filter using an ultra-high pressure mercury lamp. After the exposure, the exposed material was heated at 120 ° C for 5 minutes, and developed with a 238 wt% aqueous solution of tetramethylammonium hydroxide until the exposed Shi Xi wafer was exposed, and then washed with water. As a result, a good pattern having a resolution of 5 m and a film residual rate of 95% on the unexposed portion can be obtained. The exposure agent at this time was 200 microjoules per square meter. Incidentally, even after the material was left to stand for 30 minutes to 2 hours after the exposure, no deterioration in the shape of the pattern was observed. Example 11 In the same manner as in Example 10, except that the diferulic acid was changed to m-benzyl dicarboxylic acid, the same procedure was performed to obtain a polybenzopyrene salivary precursor, and the photosensitivity characteristics were performed in the same manner as in Example 10. evaluation of. As a result, a good pattern having a resolution of 6 m and a film residual rate of 92% on the unexposed portion can be obtained. The exposure dose at this time was 400 microjoules per square millimeter. Incidentally, even after the material was left to stand for 30 minutes to 2 hours after the exposure, no deterioration in the shape of the pattern was observed. Reinstallation of Polybenzoxazole Precursor -------- Order ----.------ f Please read the notes on the back before filling this page) This paper size applies to Chinese national standards (CNS) A4 size (210 X 297 mm) 26 311837 554244
五、發明說明(27) 量平均分子量為15,000。 實施你丨1 2 以與實施例10相同之方式,但二羧酸改變為對苯二甲 酸與間苯二甲酸(莫耳比;i: υ之混合物並予以共聚合, 進行相同程序以獲得聚苯并嚼嗤前驅物再以實施例10相 同之方式進行感光特性評估。結果’獲得具有6微米之解 析度及93%之於未曝光部份之膜殘留率的良好圖案。此時 的曝光劑量為300微焦耳/平方毫米。附帶一提,曝光後, 即使在加熱步驟前使此材料靜置3〇分鐘至2小時亦無觀察 到圖案形狀的劣化。聚苯并噁唑前驅物的重量平均分子量 為 14,000 〇 實施例13 以與實施例10相同之方式,但二胺改變為4,4,_二胺 基_3,3’-二羥基聯苯,進行相同程序以獲得聚苯并噁唑前驅 物再以與實施例10相同之方式進行感光特性的評估。結 果,能獲得具有8微米之解析度及9〇%之於未曝光部份之 膜殘留率的良好圖案。此時的曝光劑量為4〇〇微焦耳/平方 毫米。附帶一提,曝光後,即使在加熱步驟前使此材料靜 置30分鐘至2小時亦無觀察到圖案形狀的劣化。聚苯并噁 唑前驅物的重量平均分子量為2〇〇〇()。 實施例14 以與實施例10相同之方式,但藉由照射輻射產生酸之 化合物改變為萘二甲醯亞胺基三氟甲烷磺酸,進行相同程 序以獲得聚苯并噁唑前驅物再以與實施例1〇相同之方式 (請先閱讀背面之注意事項再填寫本頁) 裝--------訂----.---1|線1 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 27 311837 5542445. Description of the invention (27) The weight average molecular weight is 15,000. Perform the same procedure as in Example 10 except that the dicarboxylic acid was changed to a mixture of terephthalic acid and isophthalic acid (molar ratio; i: υ) and copolymerized, and the same procedure was performed to obtain a polymer. The benzochrysene precursor was subjected to photosensitivity evaluation in the same manner as in Example 10. As a result, a good pattern having a resolution of 6 microns and a film residual rate of 93% on the unexposed portion was obtained. The exposure dose at this time 300 microjoules per square millimeter. Incidentally, after exposure, even if the material is left to stand for 30 minutes to 2 hours before the heating step, no deterioration in pattern shape is observed. The weight average of the polybenzoxazole precursor The molecular weight is 14,000. Example 13 In the same manner as in Example 10 except that the diamine was changed to 4,4, _diamino_3,3'-dihydroxybiphenyl, the same procedure was performed to obtain polybenzoxazole The precursor was evaluated in the same manner as in Example 10. As a result, a good pattern having a resolution of 8 μm and a film residual rate of 90% on the unexposed portion was obtained. The exposure dose at this time 400 microjoules / square Incidentally, no pattern shape deterioration was observed even after the material was left to stand for 30 minutes to 2 hours after the exposure after the exposure. The weight average molecular weight of the polybenzoxazole precursor was 2000 ( ). Example 14 In the same manner as in Example 10, but the compound that generates an acid by irradiation with radiation was changed to naphthalenedimethyliminotrifluoromethanesulfonic acid, and the same procedure was performed to obtain a polybenzoxazole precursor Then in the same way as in Example 10 (please read the notes on the back before filling this page). -------- Order ----.--- 1 | Line 1 Intellectual Property Bureau, Ministry of Economic Affairs The paper size printed by the employee consumer cooperative is applicable to the Chinese National Standard (CNS) A4 (210 X 297 mm) 27 311837 554244
經濟部智慧財產局員工消費合作社印製 五、發明說明(28) 進行感光特性的評估。結果,能獲得具有6微米之解析度 及95 /〇之於未曝光部份之膜殘留率的良好圖案。此時的曝 光劑量為150微焦耳/平方毫米。附帶一提,曝光後,即使 在加熱步驟前使此材料靜置30分鐘至2小時亦無觀察到圖 案形狀的劣化。 宜Jfe例1 5聚茉并噁唑前驅物的合成 ;50克N,N-二甲基乙醯胺(DMAc)中溶解ΐ〇·3克之 4,4 -一羧基二苯醚⑴ΒΒΑ),在冰冷卻下添加8 6克氣化亞 硫醯後,使所得之混合物回到室溫並使之反應2小時。然 後’在冰冷卻下將溶解於5〇克DMAc中之14.6克2,2_雙 (3-胺基-4-羥基苯基)六氟丙烷及5 7克吡啶添加至上述混 σ物中再於室溫攪拌此混合物3 〇分鐘。將此反應混合物滴 加至蒸餾水中再藉由過濾收集沈澱物,在減壓下予以乾燥 以獲得聚醯胺。此材料的重量平均分子量為14,5〇〇。 验羥基的保謹施 於50克r·丁内酯中溶解1〇克上述獲得之聚醯胺,然 後將1.96克第二丁基一甲基氣梦烧添加至此溶液中,在冰 冷卻下攪拌此混合物3小時。將此反應混合物滴加至蒸餾 水中,藉由過濾收集所形成之沈澱物,在減壓下乾燥以獲 得式(2)所示之聚苯并噁唑前驅物。第三丁基二甲基氣矽烧 基對所得材料之羥基的取代比率為48〇/〇。 1光特性的評仕 對100重量份上述之聚苯并噁唑前驅物添加15重量份 作為藉由照射輻射產生酸之化合物之二甲氧基蒽績酸二苯 (請先閱讀背面之注意事項再填寫本頁) "^^裝--------訂----*---1|線‘ 本紙張尺度適用中國國家標準(CNS)A4規格⑵G x 297公髮) 28 311837 554244 經濟部智慧財產局員工消費合作社印製 311837 A7 五、發明說明(29 ) 基碘錄,再使此混合物溶解於2_甲氧基乙醇中。 、在矽晶圓上對上述溶液施加旋轉塗覆以形成乾臈厚度 為2至3微米之塗覆臈,然後使用超高壓汞燈經由干擾滤 波器進行“線(365奈米)曝光。 ~ 曝光後,使此曝光材料於12(rc加熱5分鐘,藉由2 % 重里%虱氧化四甲基銨水溶液予以顯影直至於曝光部份之 梦晶圓曝光,再以水沖洗之。結果,能獲得具有8微米之 解析度及90 /〇之於未曝光部份之膜殘留率的良好圖案。此 時的曝光劑量為250微焦耳/平方毫米。附帶一提,曝光 後’即使在加熱步驟前使此材料靜置3〇分鐘至2小時亦無 觀察到圖案形狀的劣化。 μ 實施例16 以與實施例15相同之方式,但二羧酸改變為對苯二甲 酸與間苯二甲酸(莫耳比;1 : υ之混合物並將之共聚合, 進行相同程序以獲知聚苯并噁唑前驅物再以與實施例Β 相同之方式進行感光特性的評估。結果,能獲得具有工〇 微米之解析度及88%之於未曝光部份之膜殘留率的良好圖 案此時的曝光劑量為300微焦耳/平方毫米。附帶一提, 曝光後,即使在加熱步驟前使此材料靜置分鐘至2小時 亦無觀察到圖案形狀的劣化。聚苯并嚼嗤前驅物的重量平 均分子量為14,〇〇〇。 膏施例17 以與實施例15相同之方式,但羥基的保護基改變為乙 氧土甲土進行相同程序以獲得聚苯并嚼tr坐前驅物再以實 辑張尺度適用帽國家標準(C_NS)A4規格咖x 297公髮) --------^-------1 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 554244 A7 --- B7 五、發明說明(3〇 ) 施例1 5相同方式進行感光特性評估。結果,獲得具有6 微米之解析度及90%之於未曝光部份之膜殘留率的良妤圖 案。此時的曝光劑量為3〇〇微焦耳/平方毫米。附帶一提, 曝光後’即使在加熱步驟前使此材料靜置3()分鐘至2小時 亦無觀察到圖案形狀的劣化。 實施例18 以與實施例1 5相同之方式,但藉由照射輻射產生酸之 化合物改變為萘二甲醯亞胺基三氟甲烷磺酸,進行相同程 序以獲得聚苯并噁唑前驅物再以與實施例丨5相同之方式 進行感光特性的評估。結果,能獲得具有8微米之解析度 及90〇/〇之於未曝光部份之膜殘留率的良好圖案。此時的曝 光劑量為150微焦耳/平方毫米。附帶一提,曝光後,即使 在加熱步驟前使此材料靜置30分鐘至2小時亦無觀察到圖 案形狀的劣化。 實施例19 以與實施例17相同之方式,但藉由照射輻射產生酸之 化合物改變為萘二甲醯亞胺基三氟甲烷磺酸,進行相同程 序以獲得聚苯并噁唑前驅物再以與實施例Η相同之方式 進行感光特性的評估。結果,能獲得具有6微米之解析度 及92〇/〇之於未曝光部份之膜殘留率的良好圖案。此時的曝 光劑量為150微焦耳/平方毫米。附帶一提,曝光後,即使 在加熱步驟前使此材料靜置30分鐘至2小時亦無觀察到圖 案形狀的劣化。 比较例4 (請先閱讀背面之注音?事項再填寫本頁)Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 5. Description of the invention (28) Evaluation of the photosensitivity characteristics. As a result, a good pattern having a resolution of 6 m and a film residual rate of 95/0 in the unexposed portion can be obtained. The exposure dose at this time was 150 microjoules per square millimeter. Incidentally, even after the material was left to stand for 30 minutes to 2 hours after the exposure, no deterioration of the pattern shape was observed. Jfe Example 15 Synthesis of 5 polymoxazoxazole precursors; 50 g of N, N-dimethylacetamide (DMAc) was dissolved in 0.3 g of 4,4-monocarboxydiphenyl ether (BBA). After adding 86 g of vaporized thionine under ice cooling, the resulting mixture was returned to room temperature and allowed to react for 2 hours. Then 14.6 grams of 2,2-bis (3-amino-4-hydroxyphenyl) hexafluoropropane and 57 grams of pyridine dissolved in 50 grams of DMAc were added to the above mixture under ice cooling. The mixture was stirred at room temperature for 30 minutes. This reaction mixture was added dropwise to distilled water, and the precipitate was collected by filtration, and dried under reduced pressure to obtain polyamide. The weight average molecular weight of this material was 14,500. Dissolve 10 g of the polyamine obtained above in 50 g of r.butyrolactone, and then add 1.96 g of second butyl monomethyl aerosol to this solution, and stir under ice cooling This mixture was for 3 hours. This reaction mixture was added dropwise to distilled water, and the formed precipitate was collected by filtration, and dried under reduced pressure to obtain a polybenzoxazole precursor represented by the formula (2). The substitution ratio of the third butyldimethylsilyl group to the hydroxyl group of the obtained material was 48/0. 1 Evaluation of light characteristics: Add 100 parts by weight of the aforementioned polybenzoxazole precursor to 15 parts by weight of dimethoxyanthracene diphenyl as a compound that generates an acid by irradiation of radiation (please read the precautions on the back first) (Fill in this page again) " ^^ 装 -------- Order ---- * --- 1 | line 'This paper size is applicable to China National Standard (CNS) A4 size ⑵G x 297 public) 28 311837 554244 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 311837 A7 V. Description of the invention (29) Basic iodine records, and then the mixture is dissolved in 2-methoxyethanol. 1. Apply spin coating to the above solution on a silicon wafer to form a coating layer with a dry thickness of 2 to 3 microns, and then use an ultra-high pressure mercury lamp to perform "line (365 nm) exposure through an interference filter. ~ Exposure Then, the exposed material was heated at 12 ° C for 5 minutes, and developed with a 2% tween% tetramethylammonium oxide aqueous solution until it was exposed on the exposed part of the dream wafer, and then washed with water. As a result, it was obtained Good pattern with a resolution of 8 microns and a film residual rate of 90 / 〇 on the unexposed parts. The exposure dose at this time is 250 microjoules per square millimeter. By the way, even after exposure, even before the heating step, This material was left to stand for 30 minutes to 2 hours without deterioration of the pattern shape. Μ Example 16 In the same manner as in Example 15 except that the dicarboxylic acid was changed to terephthalic acid and isophthalic acid (Mole Ratio: 1: mixture of υ and copolymerization, the same procedure was performed to obtain the polybenzoxazole precursor, and then the evaluation of the photosensitivity characteristics was performed in the same manner as in Example B. As a result, a resolution of 0 μm was obtained. Degrees and 88% of A good pattern of the film residual ratio of the exposed part at this time was an exposure dose of 300 microjoules per square millimeter. Incidentally, after the exposure, the pattern shape was not observed even after the material was allowed to stand for minutes to 2 hours before the heating step. The weight average molecular weight of the polybenzyl chelate precursor was 14.00. Paste Example 17 In the same manner as in Example 15 except that the protecting group of the hydroxyl group was changed to ethoxycene, and the same procedure was performed to Obtained the polybenzone chew precursor and then applied the cap national standard (C_NS) A4 size coffee x 297 publicly according to the actual scale. -------- ^ ------- 1 (please first Read the notes on the back and fill in this page) Printed by the Consumers ’Cooperative of the Intellectual Property Bureau of the Ministry of Economic Affairs 554244 A7 --- B7 V. Description of the invention (3〇) Example 15 The photosensitivity characteristics were evaluated in the same manner. Good resolution with micron resolution and 90% film residual rate in unexposed areas. The exposure dose at this time is 300 microjoules per square millimeter. Incidentally, after exposure, 'even before the heating step, No pattern was observed in this material after standing for 3 () minutes to 2 hours Example 18 In the same manner as in Example 15 except that the compound that generates an acid by irradiation with radiation was changed to naphthalenedimethyliminotrifluoromethanesulfonic acid, and the same procedure was performed to obtain polybenzoxamine The azole precursor was evaluated for photosensitivity in the same manner as in Example 5. As a result, a good pattern with a resolution of 8 microns and a film residual ratio of 90/0 on the unexposed portion was obtained. At this time The exposure dose was 150 microjoules per square millimeter. Incidentally, after the exposure, even if the material was left to stand for 30 minutes to 2 hours before the heating step, no deterioration in the shape of the pattern was observed. Example 19 Example 17 In the same way, but changing the compound that generates an acid by irradiation to naphthalenedimethyliminotrifluoromethanesulfonic acid, the same procedure is performed to obtain the polybenzoxazole precursor and then it is performed in the same manner as in Example IX. Evaluation of Photographic Characteristics. As a result, a good pattern having a resolution of 6 m and a film residual ratio of 92.0 / 0 in the unexposed portion can be obtained. The exposure dose at this time was 150 microjoules per square millimeter. Incidentally, even after the material was left to stand for 30 minutes to 2 hours after the exposure, no deterioration of the pattern shape was observed. Comparative Example 4 (Please read the Zhuyin on the back? Matters before filling out this page)
裝--------訂----*----線IInstall -------- Order ---- * ---- Line I
30 311837 554244 A7 五、發明說明(31 ) 以與實施例10相同之方式進行程序但不對合成中間 體之聚醯胺酸醋的經基進行保護,再以與實施例10相同之 方式進行感光特性的評估。 結果,在顯影後於塗覆膜中無法得到清晰對比 法獲得圖案。 比較例5 以與實施例10相同之方式進行程序但不添加藉由两 射輪射產生酸之化合物,再以與實施例1G相同之方式 感光特性的評估。 結果,即使當曝光材料浸潰於顯影劑中歷經長時間時 亦無法溶解曝光部份並且自妙晶圓發生剝離由而無法 圖案。 比較例6 以與實施例10相同之方式進行程序但以第三丁氧夷 幾基取代經基的保護基以合成聚苯并噪峻前驅物,再以土實 施例10相同方式進行感光特性評估。當於曝光15分鐘内 進行加熱步驟時,獲得具有10微米之解析度及88%之於 未曝光部份之膜殘留率的良好圖案。然而,在加熱步驟前 使曝光材料靜置20分鐘或更久,其表面幾乎不溶於顯影劑 中由而無法獲得圖案。 本發明之正型感光性樹脂組成物具有優異之感光性、 解析度及耐熱性。 又,依據本發明之製造圖案之方法,藉由使用上述之 樹脂組成物,能獲得感光性、解析度及耐熱性優異之具4 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公髮) (請先閱讀背面之注咅?事項再填寫本頁) -裝 經濟部智慧財產局員工消費合作社印製 554244 A7 _B7 五、發明說明(32 ) 良好形狀的圖案。 又,本發明之電子組件具有高可靠度,此乃由於其具 有良好形狀及優異特性之故。 (請先閱讀背面之注意事項再填寫本頁) '3^ 裝--------訂----·1 經濟部智慧財產局員工消費合作社印製 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 32 31183730 311837 554244 A7 V. Description of the invention (31) The procedure is performed in the same manner as in Example 10, but the warp group of the synthetic intermediate acetic acid vinegar is not protected, and then the photosensitive characteristics are performed in the same manner as in Example 10. evaluation of. As a result, a pattern obtained by a clear contrast method cannot be obtained in the coating film after development. Comparative Example 5 The procedure was performed in the same manner as in Example 10, but without adding a compound that generates an acid by two shots, and then the evaluation of the photosensitive characteristics was performed in the same manner as in Example 1G. As a result, even when the exposure material is immersed in the developer for a long time, the exposed portion cannot be dissolved and peeling occurs from the wafer to prevent patterning. Comparative Example 6 A procedure was performed in the same manner as in Example 10, except that the protective group was substituted with a third butoxy group to synthesize a polybenzonosaurus precursor, and the photosensitivity characteristics were evaluated in the same manner as in Example 10. . When the heating step was performed within 15 minutes of exposure, a good pattern having a resolution of 10 m and a film residual rate of 88% on the unexposed portion was obtained. However, if the exposure material is left to stand for 20 minutes or more before the heating step, its surface is hardly dissolved in the developer and a pattern cannot be obtained. The positive-type photosensitive resin composition of the present invention has excellent photosensitivity, resolution, and heat resistance. In addition, according to the method for producing a pattern according to the present invention, by using the above-mentioned resin composition, it is possible to obtain a paper with excellent sensitivity, resolution, and heat resistance. The paper size is in accordance with Chinese National Standard (CNS) A4 (210 X 297). (Published) (Please read the note on the back? Matters before filling out this page)-Installed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs and printed 554244 A7 _B7 V. Description of the invention (32) Good shape pattern. In addition, the electronic component of the present invention has high reliability because of its good shape and excellent characteristics. (Please read the precautions on the back before filling this page) '3 ^ Packing -------- Order ---- · 1 The paper size printed by the Employees' Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs applies the Chinese national standard ( CNS) A4 size (210 X 297 mm) 32 311837
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JP4529252B2 (en) * | 1999-09-28 | 2010-08-25 | 日立化成デュポンマイクロシステムズ株式会社 | Positive photosensitive resin composition, pattern manufacturing method, and electronic component |
KR100801785B1 (en) * | 2002-01-31 | 2008-02-05 | 스미토모 베이클리트 컴퍼니 리미티드 | Positive photosensitive resin composition |
JP3773845B2 (en) * | 2000-12-29 | 2006-05-10 | 三星電子株式会社 | Positive photosensitive polyimide precursor and composition containing the same |
JP4798851B2 (en) * | 2001-01-23 | 2011-10-19 | 旭化成イーマテリアルズ株式会社 | Alkoxysilane compound and composition thereof |
DE10120660B8 (en) * | 2001-04-27 | 2006-09-28 | Infineon Technologies Ag | Process for structuring a photoresist layer |
DE10120676B4 (en) * | 2001-04-27 | 2005-06-16 | Infineon Technologies Ag | Process for structuring a photoresist layer |
DE10135246B4 (en) * | 2001-07-19 | 2005-10-20 | Infineon Technologies Ag | New, polycondensate-based resists with increased resolution for use in 157 nm lithography |
JP3832572B2 (en) * | 2001-10-09 | 2006-10-11 | 信越化学工業株式会社 | Photocurable resin composition, pattern forming method, and film for protecting substrate |
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2000
- 2000-08-04 JP JP2000237798A patent/JP4529252B2/en not_active Expired - Fee Related
- 2000-09-21 US US09/666,541 patent/US6436593B1/en not_active Expired - Fee Related
- 2000-09-22 TW TW089119574A patent/TW554244B/en not_active IP Right Cessation
- 2000-09-22 EP EP00120169A patent/EP1089129B1/en not_active Expired - Lifetime
- 2000-09-22 DE DE60035158T patent/DE60035158T2/en not_active Expired - Lifetime
- 2000-09-27 KR KR1020000056629A patent/KR100677814B1/en active IP Right Grant
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EP1089129B1 (en) | 2007-06-13 |
JP4529252B2 (en) | 2010-08-25 |
DE60035158D1 (en) | 2007-07-26 |
US6436593B1 (en) | 2002-08-20 |
KR20010030497A (en) | 2001-04-16 |
JP2001166484A (en) | 2001-06-22 |
EP1089129A1 (en) | 2001-04-04 |
KR100677814B1 (en) | 2007-02-05 |
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