TW539240U - Contactor for solder balls - Google Patents

Contactor for solder balls

Info

Publication number
TW539240U
TW539240U TW091221343U TW91221343U TW539240U TW 539240 U TW539240 U TW 539240U TW 091221343 U TW091221343 U TW 091221343U TW 91221343 U TW91221343 U TW 91221343U TW 539240 U TW539240 U TW 539240U
Authority
TW
Taiwan
Prior art keywords
contactor
solder balls
solder
balls
Prior art date
Application number
TW091221343U
Other languages
English (en)
Inventor
Chikahito Yamasaka
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW539240U publication Critical patent/TW539240U/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion

Landscapes

  • Physics & Mathematics (AREA)
  • Geometry (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW091221343U 1999-10-06 2000-10-05 Contactor for solder balls TW539240U (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28514099A JP2001108706A (ja) 1999-10-06 1999-10-06 ハンダボール用コンタクタ

Publications (1)

Publication Number Publication Date
TW539240U true TW539240U (en) 2003-06-21

Family

ID=17687628

Family Applications (1)

Application Number Title Priority Date Filing Date
TW091221343U TW539240U (en) 1999-10-06 2000-10-05 Contactor for solder balls

Country Status (3)

Country Link
JP (1) JP2001108706A (zh)
KR (1) KR100600230B1 (zh)
TW (1) TW539240U (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002202322A (ja) * 2000-12-28 2002-07-19 Yokowo Co Ltd コンタクトプローブ
JP2005136246A (ja) 2003-10-31 2005-05-26 Renesas Technology Corp 半導体集積回路装置の製造方法
JP4521611B2 (ja) 2004-04-09 2010-08-11 ルネサスエレクトロニクス株式会社 半導体集積回路装置の製造方法
JP2006184061A (ja) * 2004-12-27 2006-07-13 Fujitsu Ltd 電気的接続部品及びその製造方法
JP4486880B2 (ja) * 2004-12-27 2010-06-23 日本電子材料株式会社 コンタクトプローブ
JP5217063B2 (ja) * 2006-05-30 2013-06-19 日本電産リード株式会社 検査方法及び検査装置
JP4906429B2 (ja) * 2006-08-02 2012-03-28 中国電力株式会社 計器用測定端子及び計器用測定端子操作具
WO2012140925A1 (ja) * 2011-04-15 2012-10-18 株式会社村田製作所 バンプ電極検査方法およびバンプ電極検査システム

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02119155A (ja) * 1988-10-27 1990-05-07 Nec Corp 半導体集積回路用試験装置
KR100276101B1 (ko) * 1998-07-08 2001-01-15 이석행 웨이퍼 검사기의 포고 핀과 블록의 결합구조

Also Published As

Publication number Publication date
JP2001108706A (ja) 2001-04-20
KR100600230B1 (ko) 2006-07-13
KR20010039971A (ko) 2001-05-15

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004
MM4K Annulment or lapse of a utility model due to non-payment of fees