TW500841B - Controlled neck growth process for single crystal silicon - Google Patents

Controlled neck growth process for single crystal silicon Download PDF

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Publication number
TW500841B
TW500841B TW090104084A TW90104084A TW500841B TW 500841 B TW500841 B TW 500841B TW 090104084 A TW090104084 A TW 090104084A TW 90104084 A TW90104084 A TW 90104084A TW 500841 B TW500841 B TW 500841B
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Taiwan
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neck
rate
less
patent application
diameter
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TW090104084A
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Chinese (zh)
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Hiroyo Haga
Makoto Kojima
Shigemi Saga
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Memc Electronic Materials
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    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/20Controlling or regulating
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/20Controlling or regulating
    • C30B15/22Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

A process for preparing a single crystal silicon in accordance with the Czochralski method, is provided. More specifically, by quickly reducing the pull rate at least once during the growth of a neck portion of the single crystal silicon ingot, in order to change the melt/solid interface shape from a concave to a convex shape, the present process enables zero dislocation growth to be achieved in a large diameter neck within a comparably short neck length, such that large diameter ingots of substantial weight can be produced safely and at a high throughput.

Description

500841500841

本發明 準備相關。更 單晶矽鑄塊之 在鑄塊之頸部 達成無差排增 單晶矽,其 始材料,其係 多晶矽倒在坩 單晶藉由缓慢 子水晶與融化 非在種子水晶 送到整個增長 在單晶矽中 要以南水晶拉 小直徑(例如 之前,完全地 之後,在這些 排已經消除了 面斜度部分, 主體之後藉由 化溫度,增長 頸部,其係 可能折斷,導 衣 與T定用在電 特定地說, 程序相關’ 分增長期間 係為半導體 通常由柴式 塌裡融化, 萃取而增長 物接觸之熱 和水晶主體 的水晶且增 消除差排的 長速率(例 ,2到4毫米 消除差排。 小直徑的頸 ,水晶的直 直到達成圓 控制拉長速 至具有接近 為碎早晶之 致水晶的主 。當水 衝擊在 之間的 加0 傳統方 如,高 )的頸 通常, 中之差 徑會加 柱主體 率和當 常數直 袁弱的 體掉落 子元件製造之半導體級單晶矽之 本發明與用以準備具有大直徑之 其係根據柴氏法,其中拉長速率 變化,其係為了在減少軸長度時 電子元件製造之大多數程序之開 法 (“ Cz” )準備。在該法中, 一種子水晶與融化的矽接觸且一 晶增長啟動時》差排從種 水晶裡產生。這些差排除 頸區域被消除,否則會傳 式(稱為衝擊頸方法)需 到6毫米/分鐘)增長具有 ,以在水晶主體增長啟動 在接近100毫米的頸增長 排可以完全消除。一旦差 長,其係形成晶冠或是晶 的需要直徑。水晶的圓柱 補償減少融化層次時的融 徑。 部分,在水晶增長期間, 至坩堝。因此,具有衝擊The invention is prepared to be relevant. The single crystal silicon ingot achieves an inexhaustible increase in single crystal silicon on the neck of the ingot. The starting material, which is polycrystalline silicon, is poured into the crucible single crystal. The slow growth of the crystal and the melting of the non-seed crystal send the entire growth in In monocrystalline silicon, a small diameter should be drawn with the southern crystal (for example, before, completely after, the surface slope has been eliminated in these rows, and the neck can be broken by increasing the temperature after the main body. It is intended to be used in electricity. In particular, the process-related growth period is the semiconductor usually melted by chai-ta-ri, the heat of extraction and the contact of the growth substance with the crystal of the crystal body, and the long rate of eliminating the differential row (eg, 2 to 4 mm eliminates the difference. The neck of small diameter, the crystal straight until the circle is reached, controls the elongation speed to the main that has a crystal close to broken early crystals. When the water impact is in between, add 0 to the traditional square, high). In general, the difference in the diameter will increase the column main body rate and the semiconductor-level single-crystal silicon manufactured by the bulk drop element when the constant straight element is weak. Among them, the elongation rate change is prepared for the opening method (“Cz”) of most procedures of electronic component manufacturing when the shaft length is reduced. In this method, a daughter crystal is brought into contact with molten silicon and a crystal growth is started. The time difference is generated from the seed crystal. These differences exclude the neck area being eliminated, otherwise it will be passed (called the impact neck method) to 6 mm / min. The growth has to start at approximately 100 mm in the growth of the crystal body. Neck growth can be eliminated completely. Once the difference is long, it forms a crystal crown or the required diameter of the crystal. Crystal Cylinder Compensation reduces the melting diameter when melting levels. Partly, during the crystal growth, to the crucible. So with shock

第5頁 500841 五 頸 頸 、發明說明(2) 一 的傳統水晶通常增長至10 0公斤重或是更小 、 部的壓力。然而,在最近幾年,在半導體",以減少在 造出對高品質之較大矽晶圓持續增加之Ε卡工業的進展創 高整合的半導體裝置已經導致增加晶片面籍。特別地,更 2 0 0毫米(8吋)至3 0 0毫米(12吋)或更大石夕a、和對具有直捏 求。這導致對於更具有效率頸增長程序的Βθ^產能的需 ^的尚求,:a:鉍钬茶 排的消除且其防止頸折斷而可以支援番旦、去 /、双此差 更多的單晶石夕鑄塊的增長。 董罝達到300公斤或Page 5 500841 Five-necked neck, invention description (2) The traditional crystal of one usually grows to a weight of 100 kilograms or less. However, in recent years, in semiconductors, "to reduce the progress in the E-card industry that continues to increase the production of larger silicon wafers of high quality and to create highly integrated semiconductor devices has led to increased wafer denominations. In particular, more than 200 millimeters (8 inches) to 300 millimeters (12 inches) or larger, and the pair has a straight pinch requirement. This leads to the demand for a more efficient Nθ production capacity of the neck growth process: a: Elimination of bismuth tea row and its prevention of neck breakage can support Pandan, Go /, and more The growth of spar ingots. Dong Yan reached 300 kg or

在較大水晶防止頸折斷的通常解決古、1 B ▽ W乃法疋增L藤-古The conventional solution to prevent neck breakage in larger crystals is ancient, 1 B ▽ W Nafazawa increase L Fuji-ancient

徑。然而’大直徑的頸通常較不想要, U 的種子水晶,其之後當與石夕融化物接觸時合J二,,大 的滑動差排。因此,較大直徑的頸部分ς 軏间狁度 ! 5 0, , ^ ^ , ^ ^ ^ ^ 有效率地消除滑動差排。 夺間’以 ,了在較大直徑的衝擊頸中最小化滑動差 請序號4-1 04988提議使用頂端具 、㊁錐: 2于水阳之釭序。然而,獨特種子水晶處理 印貝。因為種子水晶是獨特的, ^设雜path. However, the 'large diameter' neck is usually less desirable, the seed crystal of U, which is then J2 when it comes in contact with Shi Xi melt, a large sliding difference. Therefore, the neck portion of the larger diameter can be effectively removed! 5 0,, ^ ^, ^ ^ ^ ^ effectively eliminates the slip difference. To win ’, to minimize the sliding difference in the impact neck with a larger diameter. Please serial number 4-1 04988 propose the use of a tip with a taper: 2 in the sequence of the water sun. However, the unique seed crystal handles Indian shellfish. Because seed crystals are unique,

此,改,而不管無差排增長是否達成。因 生產力。Ϊ: 需要過度處理之停工期’其不利地影塑 器。且右Γ 此程序利用内嵌在種子水晶支架的加埶 間的、ϋ;的加熱器使得欲形成在種子水晶和頸部:;之 :度梯度更形困難,其需要單水晶以極度Therefore, change, regardless of whether or not the growth of indiscriminate emissions is achieved. Because of productivity. Ϊ: A downtime period that requires over-treatment ', which adversely affects the mold. And the right Γ This program uses the built-in heater between the seed crystal bracket and the heater to make it to form on the seed crystal and the neck :; the degree gradient is more difficult, which requires a single crystal to be extremely

第6頁 五、發明說明 在較大 曰本開放 請揭露了 度藉由重 徑的交互 的至少兩 增長較大 增加和減 直徑必須 如前所 能大重量 登』〇高要 所以, 直控或是 程序,其 塊具有大 長度下消 直徑相當 水晶。 因此, 早晶發禱 括·( i ) 種子水晶 之差排; 擊頸中,另一用以消除差排 號(Kokai) 1卜 1 99384 中。 ,其中藉此程序需要消除滑 變頸直徑而縮短。頸因此有 該參考描述增加部分的直徑 而,當該程序宣稱提供較短 石夕單晶,该程序係複雜且難 之間直徑的巨大差距,並且 變。 於藉由具有較大直徑但較短 梭之鑄塊增長之程序,持續 在本發 大塊的 中輸出 直徑的 除頸中 的固定 簡短地 塊頸中 加熱掛 接觸融 (iii) 露在 此申 頸長 少直 部分 用以 因為 目標 ,致 (3) 直徑衝 申請序 一程序 複地改 區域, 倍。然 直徑的 少部分 時常改 述,對 的大直 明許多特點之中 单晶碎铸塊,和 率和良率都增加 頸;提供如此的 的滑動差排;提 •,且提供如此的 說,本發明指向 之差排’該增長 塥中的多晶石夕以 化物,直到種子 在成長速率R時 的程序揭 特定地, 動差排的 增加和減 具有減少 長度的頸 以控制, 因為頸的 長度之頸, 存在一需要 ’可以提到:提供具有大 產生其之程序;提供如此 ;提供如此程序,其中禱 程序’其中在相當地減少 供如此的程序,其中頸的 程序,其使用標準的種子 了程序,其係用以消除在 係根據柴氏法。本程序包 形成矽融化物;(i丨)使 開始融化,其形成在其中 ’從融化物撤回種子水Page 6 V. Description of the invention In the larger Japanese version, please disclose that the degree of increase by at least two of the interaction of the heavy path. The large increase and decrease in diameter must be as heavy as before. ”Therefore, direct control or Is the program, whose block has a large crystal with a large diameter. Therefore, the early crystals prayed. (I) The difference between the seed crystals; hit the neck, the other is used to eliminate the difference (Kokai) 1 bu 1 99384. In which the procedure needs to be shortened by eliminating the slip neck diameter. The neck therefore has an increase in the diameter of this reference description. However, when the procedure claims to provide shorter Shiyuki single crystals, the procedure is complicated and difficult. In the process of growing the ingot with a larger diameter but a shorter shuttle, the heating and contact melting in the fixed and short block neck that continues in the removal of the large and medium output diameter neck of the hair (iii) exposed here The straight part of the neck length is used to cause the target to cause (3) the diameter of the punching order to change the area again and again. However, a small part of the diameter is often rephrased. Among the many characteristics of the large straight Ming, the single crystal broken ingots, and the rate and yield are increased by the neck; provide such a sliding differential row; mention, and provide that, the present invention The difference in the direction of the row of the polycrystalline stone in the growth process is until the process of the seed at the growth rate R. Specifically, the increase and decrease of the dynamic difference row has a neck with a reduced length to control because the length of the neck There is a need for 'necks' that can be mentioned: provide procedures with a large production; provide so; provide such procedures where the prayer process' which considerably reduces the supply of such procedures where the neck procedure uses standard seeds Procedures for removing in-systems according to the Chai's method. This package forms a silicon melt; (i 丨) causes the melting to begin, which is formed in it ’withdraw seed water from the melt

$ 7頁 500841 五、發明說明(4) 一 —" 〜----—- 晶,以形成具有直徑至少約5毫米的頸之第一區段;(iv): 減少增長速率R眞增長速率R2,以形成具有直徑至少約5毫_ 米的頸之第二區段;和(V )增加增長速率R在增長速率 R 3’以开> 成具有直徑至少約5毫米的頸的額外區段;其中 速率R至少要比速率R要少至少約25%,且其中差排在軸長 度少於約1 5 〇毫米中的頸中消除。 , 本發明尚指向一程序,其係用以消除在單晶矽鑄塊頸中 之差排’其增長係根據柴氏法。本程序包括:(丨)加熱坩 塌中的多晶矽以形成矽融化物;(i i )使種子水晶接觸融 化物’直到種子開始融化,其形成在其中之差排;(丨丨i) 攸融化物撤回種子水晶以長成鑄塊的頸部分,該頸具有直 徑至少約5¾米且其長度少於約1 5 0毫米,以跟著頸長度改 變的速率’導致融化/固化介面形狀從凹面形狀到凸面形 狀至少改變一次,以消除在其中的差排;(iv)增長與鑄 塊的頸部相鄰之向外發光的種子圓錐;和(v)增長與向 外發光的種子圓錐相鄰的主體,該主體具有名義胃上直徑至 少約1 5 〇毫米、2 0 0毫米或3 0 0毫米。 本發明更尚指向一單水晶矽,复七紅·,·、 〇 ^ T/ 干 具包括·(〇—頸具有平 )與頸的下層部分相 義上直徑為至少約 均直徑約5毫米,長度少於約1 5 〇毫米 層部分和沒有差排的下層部分;(i i 鄰之種子圓錐;和,(i i i )與具有名 15 0毫米的種子圓錐相鄰之主體。 本發明,其他目的和特點一部分將會很明顯且其它部分$ 7 页 500841 Fifth, description of the invention (4) A — " ~ ----—- crystal to form a first section having a neck having a diameter of at least about 5 mm; (iv): decreasing the growth rate R 速率 growth Rate R2 to form a second section with a neck having a diameter of at least about 5 millimeters; and (V) increase the growth rate R at a growth rate R 3 'to open > additional to a neck having a diameter of at least about 5 mm Section; where the rate R is at least about 25% less than the rate R, and where the difference is eliminated in the neck in a shaft length of less than about 150 mm. The present invention is also directed to a procedure for eliminating the difference in the neck of a single crystal silicon ingot 'and its growth is based on the Chai's method. This procedure includes: (丨) heating the polycrystalline silicon in the crumble to form a silicon melt; (ii) bringing the seed crystal into contact with the melt 'until the seed begins to melt, which forms a differential row therein; (丨 丨 i) The seed crystal is withdrawn to grow into a neck portion of the ingot, the neck having a diameter of at least about 5¾ meters and a length of less than about 150 millimeters, at a rate that changes with the length of the neck, 'causing the shape of the melting / solidifying interface from concave to convex The shape is changed at least once to eliminate the difference between them; (iv) growing a seed cone that glows outwards adjacent to the neck of the ingot; and (v) growing a body that is adjacent to the seed cones glowing outward, The body has a nominal upper gastric diameter of at least about 150 mm, 200 mm, or 300 mm. The present invention is further directed to a single crystal silicon, the compound seven red, ..., 〇 ^ T / dry tools include · (〇-neck has a flat) and the lower part of the neck synonymously the diameter is at least about the average diameter of about 5 mm, A layer portion with a length of less than about 150 mm and a lower layer portion with no difference; (ii adjacent seed cones; and, (iii) a body adjacent to a seed cone having a name of 150 mm. The present invention, other objects, and Some features will be obvious and others

圖1係為一圖概括地說明當融化/固化介面的形狀 (例如’“平常S/L” )改變至凸面(例如,“低s凹面 時,滑動差排增長之方向。 ) 圖2為一垂直區域,其說明通常包含在本發明之 上層區域。 曰曰之 圖3為一圖表顯示依據本發明之具體實施例執行之 作期間之水晶增長速率(“S/L” )和頸直徑且進一 + f 例1中描述; 乂在 圖4 A和4 B為依據本發明之具體實施例增長之單晶秒 部分之X-射線測量圖之照片且進一步描述在例丨,@圖t §貝 4級大部分的照片; ^ 圖5為一圖表顯示在傳統長頸程序期間之水晶增長逮μ (“ S / L” )和頸直徑,如例2所述;和 、率 圖6 Α和6 Β為藉由傳統長頸程序如例2所述,增長之單曰 石夕之頸部分之X-射線測量圖之照片,圖6]5為6a放大部八曰曰 照片。 1刀的 fej圭具體眚施例之詳細說明 依據本發明之程序,已經發現,在較短長度或是距離之 下,甚至對於具有較大直徑和相當重量之鑄塊,滑動差排 可以在單晶矽鑄塊的頸部分被消除,其增長係依據柴氏 法。更特定地說,已經發現,相較用於增長大直徑和/或 大塊單晶石夕鑄塊之傳統方法,在滑動差排可以在單晶石夕鑄 塊的頸中消除,甚至頸具有較大直徑之下,其長度可以藉Figure 1 is a diagram that outlines the direction in which the sliding difference increases when the shape of the melting / solidification interface (for example, "" normal S / L ") is changed to a convex surface (for example," low s concave surface. ") The vertical region, whose description is usually included in the upper layer of the present invention. Figure 3 is a graph showing the crystal growth rate ("S / L") and neck diameter during the operation performed according to a specific embodiment of the present invention and further + f described in Example 1; 乂 Figures 4 A and 4 B are photographs of the X-ray measurement chart of the single crystal second part grown according to a specific embodiment of the present invention and are further described in Example 丨, @ 图 t § 贝 4 Photographs of most grades; ^ Figure 5 is a graph showing the crystal growth μ ("S / L") and neck diameter during the traditional long neck procedure, as described in Example 2; and, Figures 6 Α and 6 Β In order to use the traditional long-neck procedure as described in Example 2, a photo of the X-ray measurement chart of the neck part of the growing single Shi Xi, Figure 6] 5 is a photo of the 8-year enlarged part of the 6a.之 Detailed description of the embodiments According to the procedure of the present invention, it has been found that Below, even for ingots with larger diameters and considerable weights, sliding differential rows can be eliminated at the neck portion of single crystal silicon ingots, the growth of which is based on the Chai's method. More specifically, it has been found that compared to The traditional method for growing large diameter and / or large monocrystalline stone ingots can be eliminated in the neck of monocrystalline stone ingots, even if the neck has a larger diameter, its length can be borrowed.

500841 >發明說明(6) ____ 由快速地改變水晶杈長速率從古 即是,盖排可以藉由在= =低速而顯著地降低; 少一次而移除。 θ長肩間劇烈地減少拉長速率至 頸 現在參考圖1,通常相信,對於標準增長程序, _,,增長期間关使用普通高速拉長速率阜(例如,大於、中, 米/分鐘)^排會因為融化/固化介面的凹面特性,、以= 概往:以;的:心垂直增長。結果,$些差排持二 長度,其必須增長以移除這些差兄:員的 大約150毫米或是更多)。 係非吊大的(例如, 不需要舉出任何特別的理給 # 曰沾具产可以Μ由狀° 、吊相#藏要達成無差排 增長/二Λ 間短地說’且較偏好重複地,改變 融化/固化,丨面從凹面到凸面’藉由相當地減少拉 率,而相當地減少。藉由快速地改變融化/固化介面 狀從凹面到凸面,差排,其呈現在大體與如上所述介面之 垂直角度,更有效的集中在如圖i所示的頸的 其有利差排之消除。因& ’改變介面形狀導致對於透: 徑,重的鑄塊中較短軸距或是長度(例如,少於約i 5〇古 米)差排之消除。 、' ^ 因此,不像既存的衝擊頸程序,其中(丨)相對地直 程(:如A 上5f来或甚至10°毫米)其增長係 2、4毫米)序,其中在具有直徑少於約4毫米(例如,從約 、)和長度少於約100毫米之頸之增 五、發明說明(7) 速拉長速率(例如,約^ 輕大吉士 笔米/分鐘或是更多),或 (ii) 孕乂大直徑的鑄塊(例如去# ) 冬铲良 ^ ^ 』 大於約150毫米)其增長係藉由許 夕枉序,其中頸且右士 产大於的1 w丄,、有大直捏(例如,大於約5毫米)和長 度大於約1 5 0¾米,本絡Rn # fl e , 月猎由一程序,其中形成具有相 對地紐長度的大直徑頸 斂枭的祕且. 貝 致能大直徑單晶石夕鑄塊安全及有 夕文旱的增長。更特定地 巧 明的程序包括在頸增長:二如在此更進一步地描述’本發 一次,以形成無差排ΐϊ間’改變3戈是循環拉長速率毛少 , 的^丄 頌’其具有直徑大於約5毫米(例 如,約6¾米、8毫米、]卜 丰〜丨上 , 1 米或更多)和長度少於約1 5 0毫 木 C例如,少於約1 2 5奎也 e φ /lN , ^ Α 未、100毫米、90毫米、80毫米或 七话夕、h丄 又傻罕又大直徑(例如,約2 0 0、30 0毫米 承夕、々抑a W如,約100、 200、 300、 400公斤或 更多)之单晶矽鑄塊。 此事中要注意的是,a 頸(例如,分別約幸父偏好盡可能有最大直徑和最短 和減少處理時間,特別^米和1GG毫米)’為了增加強度 5>nn4 qnn八&、、別為了更大重量的鑄塊(例如,約 Ζ ϋ ϋ或3 0 〇公斤),在!止卜 ^ . 、,Α 社系些情況下當直徑增加時,長度也需 要增加以消除差挑 , 上々击夕、 排(例如,分別約10或12毫米和約125毫 米或更多)。然而,I ^ 士广 卜 要〉主意處理情況可以最佳化以達成大 直徑、無差排的頸 (u}. h M s i (例如,10毫米,12毫米或更多)而有 相對=的長度(例如,少於100毫米或是甚至80毫米)。 大上依據本程序和柴氏法且現在參考圖2,顯示單晶 1〇具有種子水晶121 14,種子圓錐16,肩部18和主體 2 〇 ° 一旦無差排種子水晶1 2與融化之半導體材料表面相接500841 > Description of the invention (6) ____ By changing the crystal branch length rate rapidly from ancient times, that is, the cover can be significantly reduced by == low speed; removed once less. θ The length of the shoulder sharply reduces the elongation rate to the neck. Referring now to Figure 1, it is generally believed that for a standard growth procedure, _, the normal growth rate is used during the growth period (e.g., greater than, medium, m / min) ^ Due to the concave nature of the melting / solidification interface, the == general: to; of: the heart grows vertically. As a result, the difference between the two ranks is two lengths, which must be increased to remove these differences: about 150 mm or more). It ’s non-relevant (for example, you do n’t need to cite any special reason for it) Ground, changing the melting / solidification, the surface from concave to convex surface is reduced by considerably reducing the pull rate. By rapidly changing the melting / solidification interface shape from concave to convex surface, the difference is shown in the general and As mentioned above, the vertical angle of the interface is more effectively concentrated on the elimination of the favorable difference of the neck as shown in Figure i. Because of the change in the shape of the interface, the shorter the wheelbase in the ingot, the larger the diameter Or the elimination of the difference in length (for example, less than about 50 gm)., '^ Therefore, unlike the existing impact neck procedure, where (丨) is relatively straight (such as A on 5f or even 10) ° mm) Its growth is 2, 4 mm) sequence, in which the neck has a diameter of less than about 4 mm (for example, from about,) and a length of less than about 100 mm. 5. Description of the invention (7) Speed elongation Rate (e.g., about ^ light dass pen meters / minute or more), or (ii)乂 Large-diameter ingots (eg, go to #) shovel Liang ^ ^ greater than about 150 mm) its growth is through Xu Xi's order, in which the neck and right-handed production is greater than 1 w 丄, there is a large straight ( For example, greater than about 5 millimeters) and a length greater than about 15 0 ¾ meters, Benluo Rn # fl e, moon hunting by a procedure in which a large-diameter neck constriction with a relatively large button length is formed and the shellfish can be large The diameter of monocrystalline stone ingots is safe and there is a growth of drought. A more specific and ingenious procedure includes growing at the neck: Second, as described further here, 'this hair once to form a non-difference row', the change of 3 Ge is the cyclic elongation rate of hair less, the Has a diameter greater than about 5 mm (for example, about 6¾ meters, 8 mm, 1 inch or more), and a length less than about 150 millimeters, for example, less than about 1 2 5 e φ / lN, ^ Α, 100 mm, 90 mm, 80 mm or Qixi, h 丄 is stupid and large diameter (for example, about 2000, 300 mm Cheng Xi, 々a) such as, About 100, 200, 300, 400 kg or more). It should be noted in this matter that a neck (for example, about the father ’s preference to have the largest diameter and the shortest as possible and reduce the processing time, especially ^ meters and 1GG mm) 'in order to increase strength 5 > nn4 qnn 八 & ,,, Don't order for heavier ingots (for example, about Z ϋ ϋ or 300 kg), in! In some cases, when the diameter is increased, the length of the A system needs to be increased to eliminate the difference, the upper and lower rows (for example, about 10 or 12 mm and about 125 mm or more, respectively). However, I ^ Shi Guangbuya> idea processing can be optimized to achieve a large diameter, non-difference neck (u). H M si (for example, 10 mm, 12 mm or more) with relative = Length (for example, less than 100 mm or even 80 mm). According to this procedure and the Cheshire method and referring now to FIG. 2, a single crystal 10 has a seed crystal 121 14, a seed cone 16, a shoulder 18, and a body. 2 〇 ° Once the seed crystal 1 2 is discharged, it will contact the surface of the melted semiconductor material.

第11頁 丄 五、發明說明(8) 觸時’例如石夕,藉由變 成,其通常具有:或增長速率,頸“於是形 有顯示)之種子水晶上$層;'分义’門增長在具有差排(沒 層部分之下,,有較少差(1:)中部々24’增長在上 妗县在中間邱八+ 的差排,和(1 1 1 )下層部分26, :: 。刀下,其沒有差排。概括來說,如進一步 在/此描,’頸的直徑對於長度來說是保持常數,即是,頸 直钇的變化^於目的或是想要的直徑於頸的長度約Η%, 10/。’甚至5/。(例如,多於大約頸長度的最後5〇%、6〇%、Page 11 丄 5. Description of the invention (8) When it touches, for example, Shi Xi, by changing it, it usually has: or the growth rate, the neck "then has a display" on top of the seed crystal; 'discrete' gate growth In the row with the difference (without the layer, there is less difference (1 :) in the middle 々24 'growing in Shangyu County in the middle Qiu Ba +, and (1 1 1) the lower layer part 26, :: Under the knife, there is no difference. In summary, as further described here, 'the diameter of the neck is constant for the length, that is, the change in the straight yttrium of the neck is different from the purpose or the desired diameter. The length of the neck is about Η%, 10 /. 'Or even 5 /. (For example, more than about the last 50%, 60%,

70%、 80%、 90%、 95%或更多)。 在第-具體實施例中,會建立起始拉長速率,其足夠形 、而ί ΐ徑的頸(該精確直徑至少部分是取決於增長鑄塊 f目私直徑和/或重量)。通常來說,該速率範圍從大於約 ,b〃於約6宅米/分鐘,和速率從約揦約5毫米/分鐘,或 ,至j約3到約4毫米/分鐘,其較偏好在某些具體實施例 =二二般來說,拉長速率之建立是為了導致融化/固化介 面具有凹面形狀。 長速率建立之後’ t維持_段足夠的時間以形成 η疋頸的長度。通常來說 維持70%, 80%, 90%, 95% or more). In the first embodiment, an initial elongation rate will be established, which is sufficiently shaped and has a diameter of the neck (the exact diameter depends at least in part on the diameter and / or weight of the growing ingot). In general, the rate ranges from greater than about, b to about 6 m / min, and the rate from about 5 to 5 mm / min, or to about 3 to about 4 mm / min. Some specific embodiments = In general, the elongation rate is established to cause the melting / solidification interface to have a concave shape. After the long rate is established, 't is maintained for a period of time sufficient to form the length of the neck. Generally speaking

\分鐘、5分鐘、Η分鐘或是更多,時間是約頸形成第 ,,二1〇%、m或是更多。換句話說,起始速率維持約 頌曰長約5、10、15、20或甚至25毫米的時間。 頸増長的起始期間完成之後’拉長速率快速降至一第 $几長速率,其足夠使融化/固化介面的形狀從凹面改變 主凸面形狀。通常來說,此牵涉重大地改變拉長速率至少\ Minutes, 5 minutes, Η minutes or more, the time is about neck formation, 20%, m or more. In other words, the initial rate is maintained for about 5, 10, 15, 20, or even 25 millimeters. After the completion of the initial period of the cervix length, the 'elongation rate is rapidly reduced to a first long rate, which is sufficient to change the shape of the melting / solidification interface from the concave surface to the shape of the main convex surface. In general, this involves a significant change in elongation rate at least

500841500841

bU% O U 7〇 2 5 %、 4 0 %、 米 或 長 或是“減少’,速率少於約丨毫米/分鐘、其速率約= ^分鐘、0.6毫米/分鐘、0.5毫米/分鐘、〇·3毫米/分^ 0.2毫米/分鐘,其用於某些情況下。因此鐘 分Ϊ =減少Γ!1毫分鐘、U毫米/分鐘、2毫米 =。里為了.墟V卡/分知、3宅米/分鐘、4毫米/分鐘或是更、 夕為了確保融化/固化介面從凹面拎忾Ζ; „ 更 長速率快速地減少是重要的。例如,在交凸面形狀,拉 長速率將被減少使得第二拉長速 6、:下,拉 如,約50、40、30、20或甚至1(^/或疋更少(例 然而,在此事中要注音上之内達成。 於用於給定水晶拉長“;長二率至少部分是取決 之種類和使用的拉長器種類,掸 =如,取決於形成矽 米/分鐘—樣高可以在起始時使9用、“如約8或甚至1 0亳 論f或低)都應該不要視為一吏種限因此,上面速率(不 旦建立之後,減少的抵 即是,為了最大化程序的輪2.率僅只維持一段短時間; 持一段足夠改變融化/固化平,’減少的拉長速率僅只維 滑動差排向外方向之增長。\ A形狀之時間以產生在頸中 約整個頸部形成時間約3%、,然而,此速率將會維持 0· 5%、〇· 2%或甚至〇· 1%)。込二、更少(例如,少於約 通常導致維持減少拉長速率义通常使用的拉長速率,此 ’甚至1分鐘,其少於頸部/於f 5分鐘、4分鐘、2分鐘 (例如,約0. 5毫米、〇 2奈^成5晕米、1毫米或是更少 •以、〇·1毫米或是更少)的時 3UU841 五、發明說明(10) 間。 f該減少拉長速率維持給定的一段時 後快速地增加,诵赍印“ + θ w t i 後’拉長速率 之 某 已 段 期 分 後快速地增加,通當= = = Γ姐=文間之後,拉長速率 些情況之下,拉長速率之後可以-直维持吉ί速率。在 次快速地減二述且之後速率又在 間之後,該速率心Hi:減少速率增長的 μ、_、二=鐘(例如,約2 成(例如,約頸長的5%、10%、20%或是更多)。頁於疋形 之後可以再次快速減少以改變融化/固化介面之^ 、率 進二步J,中3差排在頸的周圍邊緣,如上所描述。’且 二::數目,其中拉長速率從高拉長速率改變 到高拉長速,(其可以是相同或是不同於 之則的冋拉長速率),以快速地改變融化/固化、 可給:的水晶拉長程序作最佳化,·考慮因素例如 鑄塊直重量等等’以確保在最早可能的㈣(例如, 度)只有最小數目的循環用於達成無差排 增長,因此使輸出率最大化。在某些具體實施例中,循 的數目範圍將從約i至約10 (例如,約2、4、6或8), ^ 2至約8或從約4至約6。 ’ ^ 頸 如上所描述,本發明的程序致能大直徑、益差排之 塊,其:才:當之重量,可以藉由增長大直徑工相對短的 ’而有效且安全地生產。本發明對其特別地有利,因為 五、發明說明(11) __ (1 )短時間使增長速率維持 少拉長速率之間快速地改變',少速率和(i i )在高和減 的直徑基本上保持常數(其致 < 在整個增長程序期間,頸 =地說,儘管在鑄塊的頸部擗=形成更強壯的頸)。更特 這些減少速率下,頸的直押θ期間拉長速率的改變,在 5%、3%、2%或甚至1%;即Γ 轉變位置通常改變少於約 段之頸的直徑,相對於増=於些增長於減少速率之區 區段的直徑,大體上是“改或是通常的增長速率下 2%或甚至1%。 ’汉交的,增加少於約5%、3%、 依據本發明之較佳具體电 米以起始或是通常速率從二,其中頸範圍從約5到7毫 當拉長速率減少到約〇· 8毫H5毫米/分鐘增長,發現 物和種子水晶之介面從 + 知或是更少時,在矽融化 發明之操作中,為了辩改變至凸面形狀。因此,在本 頸以通常增長速惠…二,具有直徑從約5到約7毫米的頸, 時間足夠形成至少^ 到約5毫米/分鐘增長,増長一段 1 5毫米長,且么宅米長之頸部區段,較佳為至少約 之後,通常少於約f約20毫米長。在該區段已經增長 内,拉長速率快^地^ t較佳少於約2〇或是甚i 1〇秒之 至少約1. 5亳米/八於,乂。拉長速率從起始拉長速率減少 米/分鐘。現^的\"驗佳約2. 5毫米/分鐘且最佳約3毫 “高”拉長速率範圍從的4對於通/鑄塊的增長,其中 約5到7毫米, 、、、、2到约5宅米/分鐘和需要頸直徑 少,較佳〇· 5亳< /二j逮率應該約〇· 8毫米/分鐘或是更 ”刀、里或是更少且最佳〇· 3毫米/分鐘或是bU% OU 70% 5%, 40%, meters or length or "reduced", the rate is less than about 丨 mm / min, its rate is about ^ minutes, 0.6 mm / minute, 0.5 mm / minute, 〇 · 3mm / min ^ 0.2mm / min, which is used in some cases. Therefore, minutes min Ϊ = decrease Γ! 1mm / min, Umm / min, 2mm =. To order. V card / min know, 3 House meters / minute, 4 mm / minute or more, in order to ensure that the melting / solidification interface from the concave surface 拎 忾 Z; „It is important to decrease quickly at a longer rate. For example, in the shape of a convex surface, the elongation rate will be reduced such that the second elongation speed is 6 ,, and the elongation is about 50, 40, 30, 20, or even 1 (^ / or 疋 less (for example, in This matter must be achieved within the phonetic notation. For the lengthening of a given crystal; the length of the second rate depends at least in part on the type and type of stretcher used, 掸 = eg, depends on the formation of silicon meters / minute-like High can be used at the beginning, "such as about 8 or even 10, let alone f or low) should not be regarded as a kind of limit. Therefore, the above rate (after the establishment of Bhutan, the reduction is to, for The round of maximizing the procedure 2. The rate is only maintained for a short period of time; Hold a segment that is sufficient to change the melting / solidification level, and the 'reduced elongation rate will only increase the outward growth of the sliding difference row. A shape of time is generated in the neck Approximately 3% of the entire neck formation time, however, this rate will be maintained at 0.5%, 0.2%, or even 0.1%). Second, less (for example, less than about usually results in reduced maintenance Elongation rate means the commonly used elongation rate, this' even 1 minute, which is less than the neck / 5 minutes at f, 4 minutes Clock, 2 minutes (for example, about 0.5 millimeters, 〇2 nanometers into 5 halo meters, 1 millimeter or less •, 0.1 millimeters or less) V. Description of the invention (10) F. The decreasing elongation rate increases rapidly after maintaining a given period of time, and the "elongation rate after chanting" + θ wti increases rapidly after a certain period has elapsed. Tongdang = = = Γ 姐 = After the text, in some cases, the rate is stretched. After the rate is stretched, the rate can be maintained directly. After the second rate is quickly reduced and the rate is again after the rate, the rate center Hi: Reduce the rate increase μ, _, Two = bell (for example, about 20% (for example, about 5%, 10%, 20%, or more of the neck length). After the shape, the page can be quickly reduced again to change the melting / solidification interface ^, The rate is further two steps J, and the middle 3 difference is arranged at the peripheral edge of the neck, as described above. 'And two :: number, where the elongation rate is changed from the high elongation rate to the high elongation rate, (which can be the same or Different from the 冋 elongation rate) to quickly change the melting / solidification, it can optimize the crystal elongation process: · Consider factors such as ingot straight weight, etc. to ensure that only a minimum number of cycles are used to achieve undifferentiated row growth at the earliest possible grate (eg, degrees), thus maximizing output rate. In some specific embodiments The number of cycles will range from about i to about 10 (eg, about 2, 4, 6, or 8), ^ 2 to about 8 or from about 4 to about 6. '^ The neck is as described above, and the program of the present invention causes Large-diameter, profitable blocks can be produced efficiently and safely by increasing the relatively short diameter of large-diameter workers. The present invention is particularly advantageous because five, the invention description ( 11) __ (1) maintain the rapid growth rate between the growth rate and the elongation rate in a short period of time ', the less rate and (ii) the diameters of the high and reduced diameters remain substantially constant (which causes < throughout the growth process, Neck = Say, although in the neck of the ingot 擗 = to form a stronger neck). More specifically, under these reduction rates, the elongation rate of the neck during the straight pressing of θ changes at 5%, 3%, 2%, or even 1%; that is, the position of the Γ transition usually changes less than about the diameter of the neck, relative to増 = the diameter of the area that is growing at a decreasing rate, which is generally "2% or even 1% at the usual growth rate. 'For Han Jiao, the increase is less than about 5%, 3%, according to this The preferred specific electric meter of the invention starts at a normal or normal rate from two, where the neck range decreases from about 5 to 7 millimeters when the elongation rate is reduced to about 0.8 millimeters H5 mm / min. The interface between the discovery and the seed crystal From + or less, in the operation of the invention of silicon melting, the shape of the convex surface is changed for the sake of debate. Therefore, the neck is usually increased at a rapid rate ... Second, the neck has a diameter from about 5 to about 7 mm, time It is sufficient to form a growth of at least ^ to about 5 mm / minute, and the length of the neck section is 15 mm long, and the length of the neck is preferably at least about, usually less than about 20 mm in length. Within the growth rate, the elongation rate is faster ^ t is preferably less than about 20 or even at least about 1 in 10 seconds. 5 亳 m / 八 于 , 乂. The elongation rate is reduced by m / min from the initial elongation rate. The current quotient is about 2.5 mm / min and the best is about 3 millimeters of "high" elongation. The rate ranges from 4 for the growth of the pass / ingot, of which about 5 to 7 millimeters, 2 to about 5 m / min, and requires a small neck diameter, preferably 0.5 亳 < / 二 j 逮The rate should be about 0.8 mm / min or more ", knife or mile, and the best 0.3 mm / min or

第15頁 :)嗎 41 五、發明說明(12) 更少。在返回至高拉長速率之前, 到5分鐘,且較佳從約2到3分鐘(例如,回^先^維持約i 或是在”高”範圍内之某些速率)。 逮率, 根據本發明之增長程序可以應用於 氏增長法,和磁場應用柴氏(MCz):如仏準的柴 =1長期間,應用橫磁場或是磁尖在水 並不是很…例如,可以使丄Ϊ:水晶 <丄ϋ〇>或是<111 >)。 y阿 並且’在某些具體實施例中, 少於約7毫米的種子水晶可以使用直徑 水晶的尖端)Λ 由融化在融化物中種子 』大細之直徑不少於約7毫米。 部分可以依據‘::::::县使用之操作情況的剩餘 並且,應該注意參水:;增—長的普通^ 始”拉長速率不雍姑,田初* 、 通吊、起 序開始的拉長速率Y更正讀、只限制於使用在水晶增長程 :長:序期間使用的任何其“;如‘此的^ 任何拉長速率,甘】 良夕 拉長速率之 狀而特定地使用了 =:,融,/固化介面從凹面到凸面形 的程序利用在頸拇导湘二=說,—般而言,要注意本發明 化/固化介面形狀;長速率快速地改變,以改變融 4和減少從頸部之差排。通常當此方法牵Page 15 :)? 41 5. Invention description (12) Fewer. Before returning to the high elongation rate, to 5 minutes, and preferably from about 2 to 3 minutes (for example, back to first ^ to maintain about i or some rate in the "high" range). The catch rate, the growth program according to the present invention can be applied to the method of Shizuku's growth, and the magnetic field to apply Chai's (MCz): if the standard Chai = 1 long period, the application of transverse magnetic field or magnetic tip in water is not very ... For example, You can use 丄 Ϊ: crystal < gt〇 > or < 111 >). y Ah, and in some embodiments, seed crystals with a diameter of less than about 7 millimeters can use the diameter of the tip of the crystal) Λ by melting the seeds in the melt. The diameter of the large and small crystals is not less than about 7 millimeters. Part of it can be based on the remainder of the operating conditions used by the ":::::" county, and attention should be paid to water additions; "Increase-length of ordinary ^" "Elongation rate is not Yonggu, Tianchu *, Tonghang, start to start Correction of the elongation rate Y, only limited to use in the crystal growth range: long: any other used during the sequence; such as' this ^ any elongation rate, Gan] Liangxi elongation rate is specifically used The = :, melting, / curing interface from concave to convex shape of the program is used in the neck thumb. Xiang said =-In general, pay attention to the shape of the curing / curing interface of the present invention; long rate changes quickly to change the melting 4 and reduce the difference in row from the neck. Usually when this method is involved

第16頁 五、發明說明(13) 涉快速地減^長速率從高速率到低速率和回到 在某些具體貫施例巾,|| itp ** 、、 ^ . ^ , T硪。卩之增長起始可以在低速率,之 後快速地增加至高速率^ ^ IL例 下列範例說明一種方法 序。因此,這些不應該以 ’其可以用於實現本發明之程 限制之方法解釋。 範例1 此範例展示當依據本發明,增長單晶矽之頸部分時,消 5差排一的效果。在此範例中,單晶之增長之執行係使用直Page 16 V. Description of the invention (13) involves quickly reducing the rate from high rate to low rate and back. In some specific embodiments, || itp **,, ^. ^, T 硪. The growth of 卩 can start at a low rate and then quickly increase to a high rate. ^ ^ IL Example The following example illustrates a method sequence. Therefore, these should not be interpreted in a way that can be used to implement the process limitation of the present invention. Example 1 This example shows the effect of eliminating the difference of 5 when the neck portion of single crystal silicon is grown according to the present invention. In this example, the growth of the single crystal is performed using the direct

仫6 0 0毫米(2 4英吋)和具有1 4 0公斤起始材料容量之坩 堝。 頸部之增長開始是使用具有底部丨2毫米X丨2毫米之種子 水sa 直徑2 0 0¾米之单晶石夕以4毫米/分鐘之增長速率拉 長’其足夠形成直徑大於5 · 7毫米之頸部,如圖3所示。在 頸部已經增長到長度接近2 〇毫米之後,增長速率減少至 〇 · 2毫米/分鐘,維持1分鐘。該程序(以4毫米/分鐘增長 2 0¾:米之水晶’之後以〇 · 2毫米/分鐘之減少增長速率增長 頸’維持1分鐘)重複總共1 0次。坩 600 mm (24 inches) and crucible with a capacity of 140 kg of starting material. The growth of the neck begins with the use of a seed water with a bottom 丨 2 mm X 丨 2 mm in diameter, and a single crystal with a diameter of 0 0 ¾ meters is elongated at a growth rate of 4 mm / min. It is sufficient to form a diameter greater than 5.7 mm The neck, as shown in Figure 3. After the neck has grown to a length of nearly 20 mm, the growth rate is reduced to 0.2 mm / min, which is maintained for 1 minute. This procedure (the growth of 2 0¾ at 4 mm / min: the crystal of rice 'followed by the growth of the neck' at a decrease growth rate of 0.2 mm / min for 1 minute) was repeated a total of 10 times.

在藉由X -射線測量圖檢查頸部之後,決定在增長速率第 一次減少之後,大體上所有滑動差排在頸部立即地消除 (在約頸長度的20毫米),如圖4A和4B的X-射線測量圖所 示。因此,要注意從此例中,在某些情況下,在頸增長期 間’拉長速率可以從高到低到高循環多次,以消除差排, 可能在只有一循環之後(或融化/固化介面改變)基本上After examining the neck by X-ray measurement, it was decided that after the first decrease in the growth rate, substantially all the slip difference was immediately eliminated in the neck (at about 20 mm of the neck length), as shown in Figures 4A and 4B The X-ray measurement chart is shown. Therefore, it is important to note that from this example, in some cases, the 'elongation rate can be cycled from high to low to high multiple times during neck growth, to eliminate differential discharge, possibly after only one cycle (or melting / curing interface) Change) basically

第17頁 500841 __________^----- ----- 五、發明說明(14) 消除所有滑動差排。 §JL^L· 為了比較之目的,此範例顯示用以形成單晶石夕的頸部分 之傳統操作。此範例執行係使用直按6 0 0毫米(2 4英吋) 和具有140公斤起始材料容量之坩堝和具有底部12毫米X12 毫米之種子水晶,如範例1。直徑^00毫米之單晶矽以接近 4毫米/分鐘之增長速率增長,以形成具有直徑大於5 · 2毫 米之頸部,如圖5所示。如圖6A和6B頌部之X-射線測量圖 所示,在滑動差排消除前,頸部之長度需要在150到20 0毫 米之間。 %ΜΛ- —單晶矽長就如同上述範例,除了在水晶增長期間, 3, 0 0 0高斯的磁場側面應用炱坩堝=表面。在此範例中, 直徑2 0 0毫米之單晶石夕以增長速率範圍從2到5毫米/分鐘拉 長,其在種子水晶之尖端,足夠形成直徑接近6 · 5毫米之 頸部分。在頸部分已經增長到長度接近2 0毫米之後,增長 速率減少到〇 · 2毫米/分鐘,其時間2分鐘。該程序(以通 常增長速率從2到5毫米/分鐘增長頸20毫米,隨後以減少 =長速率0 · 2毫米/分鐘,時間2分鐘,增長頸部)重複總 減上;。善在二程序中’增長速率在通常或起始增長速率和 (曰長速率之間在1 5秒内或更少改變。獲得的結果如 Α ·在如上所述之磁場應用增長之單晶矽之中,只有3祕 邻,在離種子水晶尖端i 〇 〇毫米之距離,有差排真所有 500841 五、發明說明(15) 單晶石夕在離種子水晶尖端少於約15〇毫米之距 排。此比較較佳於藉由本發明之程序,其中沒有應用 (如範例1所描述),以增長單晶矽 甘士 σ 士 0。心 m 晶石夕在頸中1〇。毫米之距離,Γ;差;中長之單 從工 > 曰,丨、山, ,、有差排,而所有水晶在離 種子水晶尖端少於約150毫米之距離都無差排。 2 ·比較來說,對於以傳統長頸 甘士描e、土士 在2到5毫·/分鐘,增長之單晶石夕且在水晶增長1期二、隹從持 側面方向應用3, 0 0 0高斯之磁場,幾乎ι〇〇%之單晶矽 :磁=子水晶尖端1〇〇毫米之距離,都有差排。並且, 離種子水晶尖端1〇〇和2 0 0毫米之間之距離, 晶矽仍然有差排。 丁 早 3.另二比較,對於以傳統長頸程序,其中增長速率維 在。2到5¾米/分鐘,在水晶增長期間沒有應用磁場所增長 兮:晶矽’幾乎90%之矽單晶在頸部,離種子水晶尖端 =米之距離’都有差排。同樣的’離種子水晶尖端2〇〇毫 米之距離,只有4%之單晶矽在頸部仍然有差排。 =此,如上範例所顯示,本發明之程序可以從 之頸,消除差排,藉此產生具有大直徑且 差排單晶矽。 蝶 考慮到前文’可以知道在頸增長期帛,藉由快速減少拉 又速率至少一次,如上所描述,可以比在這之前可能早 更早期階段(即是,在較短頸長度之内)可以在大直秤 頸中達成無差排增長。結果,大直徑且高重量之鑄塊: 出率可以增加。 % 500841 圖式簡單說明 11Ε·ΙΙ 第20頁 O:\69\69375.ptdPage 17 500841 __________ ^ ----- ----- V. Description of the invention (14) Eliminate all sliding differences. §JL ^ L · For the purpose of comparison, this example shows the traditional operation for forming the neck portion of a monocrystalline stone. This example is performed using a crucible with a direct press of 600 mm (24 inches), a capacity of 140 kg of starting material, and a seed crystal with a bottom of 12 mm x 12 mm, as in Example 1. Single crystal silicon with a diameter of 00 mm grows at a growth rate close to 4 mm / min to form a neck having a diameter greater than 5.2 mm, as shown in FIG. 5. As shown in the X-ray measurements of the song section 6A and 6B, the length of the neck needs to be between 150 and 200 mm before the sliding difference is eliminated. % ΜΛ- —Single crystal silicon length is just like the above example, except that during the crystal growth period, a magnetic field of 3,0 0 0 Gauss is applied with crucible = surface. In this example, a single crystal with a diameter of 200 millimeters is elongated at a growth rate ranging from 2 to 5 millimeters per minute, which is at the tip of the seed crystal, enough to form a neck portion with a diameter of approximately 6.5 millimeters. After the neck portion has grown to a length of approximately 20 mm, the growth rate is reduced to 0.2 mm / minute for 2 minutes. This procedure (growing the neck by 20 mm at a usual growth rate from 2 to 5 mm / min, followed by a decrease = length rate of 0.2 mm / min, time of 2 minutes, growing the neck) is repeated; In the two programs, the 'growth rate is changed within 15 seconds or less between the normal or initial growth rate and the long growth rate. The results obtained are as follows: A. Single crystal silicon grown in the magnetic field application as described above Among them, there are only 3 secret neighbors, and there is a difference of 500841 from the tip of the seed crystal, i.e. 500841. 5. Description of the invention (15) The single crystal eve is less than about 15 mm from the tip of the seed crystal. This is better than using the procedure of the present invention, which has no application (as described in Example 1), to increase the single crystal silicon Ganz σ ± 0. Heart m Crystal stone in the neck 10 mm distance, Γ; Poor; Medium and long order from work > It means that 丨, mountain,, and have a row, and all crystals have no row at a distance of less than about 150 mm from the tip of the seed crystal. 2 · In comparison, For the traditional long-necked Ganzhuang e, the toast grows at 2 to 5 millimeters per minute, and the crystal grows in the first phase. The second, 应用 applies a 3, 0 0 0 Gauss magnetic field from the side, almost ι 〇 %% of single crystal silicon: magnetic = 100 mm distance from the tip of the crystal, there are differential rows. And, From the distance of 100 and 200 mm from the tip of the seed crystal, the crystal silicon still has a differential row. Ding Zao 3. Another comparison, for the traditional long-neck procedure, the growth rate is in the range of 2 to 5¾ m / Minutes, the magnetic field was not applied during the crystal growth period: the crystal silicon 'almost 90% of the silicon single crystal is on the neck, and there is a difference between the distance from the seed crystal tip = the distance of the meter'. The same 'from the seed crystal tip 2〇 With a distance of 0 mm, only 4% of the monocrystalline silicon still has a differential row in the neck. = As shown in the example above, the procedure of the present invention can eliminate the differential row from the neck, thereby generating a large-diameter and differential row. Monocrystalline silicon. Taking into account the previous paragraph, it can be known that during the neck growth phase, by rapidly reducing the pull rate again at least once, as described above, it may be earlier and earlier than before (that is, at shorter neck lengths). (Within) can achieve non-differenced row growth in the neck of large straight scales. As a result, large diameter and high weight ingots: the output rate can be increased.% 500841 Schematic illustration of 11EI · ΙΙ Page 20 O: \ 69 \ 69375 .ptd

Claims (1)

500841 牟#葶秈500841 Mou # 葶 籼 90104084 修正 1 . 一種用以在單晶矽鑄塊之頸中消除差排之方法,其增 長是依據柴氏法,該程序包括: 在J#塥中加熱多晶石夕,以形成石夕融化物; 使種子水晶與融化物接觸,一直到種子開始融化為止, 形成在裡面之差排; 以增長速率I ,從融化物撤回種子水晶,以形成具有直 徑至少5毫米之頸之一第一區段; 減少增長速率I 至增長速率R2 ,以形成具有直徑至少5 毫米之頸之一第二區段; 增加增長速率R2至增長速率R3 ,以形成具有直徑至少5 毫米之頸之一額外區段; 其中增長速率R2比增長速率I 少至少25%,且其中差排 在頸中,在少於1 5 0毫米之軸長度之内,消除。 2. 如申請專利範圍第1項之方法,進一步包括,在頸部 增長完成之後· 增長與頸部相鄰之向外發光的種子圓錐;以及, 增長與向外發光的種子圓錐相鄰的主體,該主體具有名 義上直徑至少1 5 0毫米。 3. 如申請專利範圍第2項之方法,其中該主體具有名義 上直徑至少200毫米或300毫米。 4. 如申請專利範圍第2或第3項之方法,其中該主體具有 重量至少1 0 0公斤、2 0 0公斤或3 0 0公斤。 5. 如申請專利範圍第1項之方法,其中差排在頸中,在 少於1 2 5毫米之轴長度之内,消除。90104084 Amendment 1. A method to eliminate the difference in discharge in the neck of single crystal silicon ingots, the growth of which is based on the Chai's method, the procedure includes: heating polycrystalline stone in J # 塥 to form stone melting ; Contact the seed crystal with the melt until the seed begins to melt, forming a differential row inside; at a growth rate I, withdraw the seed crystal from the melt to form a first section with a neck of at least 5 mm in diameter ; Reduce the growth rate I to the growth rate R2 to form a second section with a neck of at least 5 mm in diameter; increase the growth rate R2 to the growth rate R3 to form an additional section with a neck of at least 5 mm in diameter; The growth rate R2 is at least 25% less than the growth rate I, and the difference is arranged in the neck, which is eliminated within the axial length of less than 150 mm. 2. The method according to item 1 of the patent application scope, further comprising, after the neck growth is completed, growing a seed cone that emits light adjacent to the neck; and growing a body that is adjacent to the seed cone that emits light outward The body has a nominal diameter of at least 150 mm. 3. The method of claim 2 in which the subject has a nominal diameter of at least 200 mm or 300 mm. 4. The method of claim 2 or 3, wherein the subject has a weight of at least 100 kg, 200 kg, or 300 kg. 5. The method as described in the first item of the patent application, wherein the difference is arranged in the neck and eliminated within the length of the shaft less than 125 mm. O:\69\69375-910703.ptc 第21頁 500841 _案號90104084_f/年7月3日 修正_ 六、申請專利範圍 6 .如申請專利範圍第1項之方法,其中差排在頸中,在少 於1 00毫米之軸長度之内,消除。 7.如申請專利範圍第1項之方法,其中增長速率R2要比 增長速率I 少至少4 0 %。 8 ·如申請專利範圍第1項之方法,其中增長速率R2要比 增長速率1 少至少80%。 9 ·如申請專利範圍第1項之方法,其中速率R2要比& 少 至少1 . 5毫米/分鐘。 1 0.如申請專利範圍第1項之方法,其中速率R2要比& 少至少2. 5毫米/分鐘。 1 1.如申請專利範圍第1項之方法,其中速率R2要少至少 0. 8毫米/分鐘。 1 2.如申請專利範圍第1項之方法,其中速率R2要少至少 0. 5毫米/分鐘。 1 3.如申請專利範圍第1項之方法,其中速率& 範圍從2 到5毫米/分鐘。 14.如申請專利範圍第1項之方法,其中速率& 在少於60 秒内減少至速率。 1 5.如申請專利範圍第1項之方法,其中速率匕在少於2 0 秒内減少至速率R2 。 1 6.如申請專利範圍第1項之方法,其中速率R2維持範圍 從2到5分鐘之一段時間。 1 7.如申請專利範圍第1項之方法,其中速率r2維持少於 3分鐘。O: \ 69 \ 69375-910703.ptc Page 21, 500841 _Case No. 90104084_f / Amended on July 3, 2006_ 6. Application for Patent Scope 6. If the method of the first scope of patent application is applied, the difference is in the neck, Eliminate within axis lengths less than 100 mm. 7. The method according to item 1 of the patent application scope, wherein the growth rate R2 is at least 40% lower than the growth rate I. 8 · The method of the first scope of patent application, wherein the growth rate R2 is at least 80% lower than the growth rate 1. 9. The method according to item 1 of the patent application range, wherein the rate R2 is at least 1.5 mm / min less than &. 10. The method according to item 1 of the patent application range, wherein the rate R2 is at least 2.5 mm / min lower than &. 1 1. The method according to item 1 of the patent application range, wherein the rate R2 is at least 0.8 mm / minute less. 1 2. The method according to item 1 of the patent application range, wherein the rate R2 is at least 0.5 mm / minute less. 1 3. The method of claim 1 in the patent application range, wherein the rate & ranges from 2 to 5 mm / min. 14. The method of claim 1 in which the rate & is reduced to a rate in less than 60 seconds. 15. The method according to item 1 of the scope of patent application, wherein the rate dagger is reduced to the rate R2 in less than 20 seconds. 16. The method according to item 1 of the patent application range, wherein the rate R2 is maintained for a period ranging from 2 to 5 minutes. 1 7. The method according to item 1 of the patent application range, wherein the rate r2 is maintained for less than 3 minutes. O:\69\69375-910703.ptc 第22頁 500841 _案號90104084_//年7月 > 曰 修正_ 六、申請專利範圍 1 8.如申請專利範圍第1項之方法,其中速率& 和R3相 等。 1 9.如申請專利範圍第1項之方法,其中在相鄰頸之種子 圓錐形成前,改變增長速率之週期重複至少3次。 2 0.如申請專利範圍第1項之方法,其中磁場在增長期間 應用。 2 1.如申請專利範圍第1項之方法,其中頸具有直徑至少 1 0毫米。 2 2.如申請專利範圍第1項之方法,其中頸之第一區段和 第二區段之直徑差距不少於5%。 2 3.如申請專利範圍第1項之方法,其中頸直徑變化在頸 長度之最後75%,少於1 0%。 2 4.如申請專利範圍第1項之方法,其中頸直徑變化在頸 長度之最後75%,少於5%。 2 5. —種用以在單晶矽鑄塊之頸中消除差排之方法,其 增長是依據柴氏法,該方法包括: 在坩堝中加熱多晶矽,以形成矽融化物; 使種子水晶與融化物接觸,一直到種子開始融化為止, 形成在裡面之差排; 從融化物撤回種子水晶,以增長鑄塊之頸部分,該頸具 有直徑至少5毫米和長度少於1 5 0毫米; 改變水晶增長速率,在頸的長度下,使得融化/固化介 面形狀從凹面形狀改變至凸面形狀至少一次,以消除在其 中之差排;O: \ 69 \ 69375-910703.ptc Page 22, 500841 _Case No. 90104084 _ // July of the year > Revision_6. Application for patent scope 1 8. As for the method of applying for the scope of the first item of patent scope, where the rate & Equal to R3. 19. The method according to item 1 of the scope of patent application, wherein the cycle of changing the growth rate is repeated at least 3 times before the seed cone of the adjacent neck is formed. 2 0. The method of claim 1 in which the magnetic field is applied during growth. 2 1. The method of claim 1 in which the neck has a diameter of at least 10 mm. 2 2. The method according to item 1 of the patent application, wherein the diameter difference between the first section and the second section of the neck is not less than 5%. 2 3. The method according to item 1 of the scope of patent application, wherein the change in the neck diameter is at the last 75% of the neck length and less than 10%. 2 4. The method according to item 1 of the scope of patent application, wherein the change in the neck diameter is at the last 75% of the neck length and less than 5%. 2 5. — A method to eliminate the difference in discharge in the neck of single crystal silicon ingots, the growth of which is based on the Cheshire method, which method includes: heating polycrystalline silicon in a crucible to form a silicon melt; The melt contacts until the seed begins to melt, forming a differential row in it; withdrawing the seed crystal from the melt to grow the neck of the ingot, which has a diameter of at least 5 mm and a length of less than 150 mm; change The growth rate of the crystal, under the length of the neck, makes the melting / solidification interface shape change from the concave shape to the convex shape at least once to eliminate the difference between them; O:\69\69375-910703.ptc 第23頁 500841 _案號90104084_fV年7月彡日 修正_ 六、申請專利範圍 增長與鑄塊的頸部相鄰之向外發光的種子圓錐;以及, 增長與向外發光的種子圓錐相鄰的主體,該主體具有名 義上直徑至少1 5 0毫米、2 0 0毫米或3 0 0毫米。 2 6.如申請專利範圍第2 5項之方法,其中頸部具有直徑 至少1 0毫米。 2 7.如申請專利範圍第2 5項之方法,其中頸具有長度少 於1 2 5毫米。 2 8.如申請專利範圍第2 5項之方法,其中在少於6 0秒或 3 0秒之内,增長速率改變,使得從融化物撤回種子水晶之 增長速率從一第一速率I 減少,該介面為凹面,至第二速 率,該介面為凸面。 2 9.如申請專利範圍第2 8項之方法,其中速率R2比速率 I 至少少25%或是50%。 3 〇 .如申請專利範圍第2 8項之方法,其中速率R2維持1到 3分鐘。 31. 如申請專利範圍第25項之方法,其中增長速率,在 減少至導致介面形狀從凹面改變至凸面之後,增加以使介 面形狀從凸面改變至凹面。 32. 如申請專利範圍第31項之方法,其中使介面從凹面 改變至凸面至凹面之循環重複至少3次或是5次。 3 3.如申請專利範圍第3 1項之方法,其中凸面介面形狀 維持少於5分鐘或少於3分鐘。 3 4.如申請專利範圍第2 5項之方法,其中頸直徑範圍從5 毫米到7毫米。O: \ 69 \ 69375-910703.ptc Page 23, 500841 _Case No. 90104084_fV amended on July 20, 2006_ Sixth, the scope of the application for patents has increased and the seed cones that emit light adjacent to the neck of the ingot have grown; A body adjacent to the outwardly emitting seed cone, the body having a nominal diameter of at least 150 mm, 200 mm, or 300 mm. 26. The method of claim 25, wherein the neck has a diameter of at least 10 mm. 27. The method of claim 25, wherein the neck has a length of less than 125 mm. 2 8. The method according to item 25 of the scope of patent application, wherein the growth rate is changed in less than 60 seconds or 30 seconds, so that the growth rate of the seed crystal withdrawn from the melt is reduced from a first rate I, The interface is concave, and to a second rate, the interface is convex. 29. The method according to item 28 of the scope of patent application, wherein the rate R2 is at least 25% or 50% lower than the rate I. 30. The method of claim 28, wherein the rate R2 is maintained for 1 to 3 minutes. 31. The method of claim 25, wherein the growth rate is reduced to cause the interface shape to change from concave to convex, and then increased to change the interface shape from convex to concave. 32. The method of claim 31, wherein the cycle of changing the interface from concave to convex to concave is repeated at least 3 or 5 times. 3 3. The method according to item 31 of the scope of patent application, wherein the shape of the convex interface is maintained for less than 5 minutes or less than 3 minutes. 34. The method of claim 25, wherein the diameter of the neck ranges from 5 mm to 7 mm. O:\69\69375-910703.ptc 第24頁 500841 _ 案號 90104084_fV 年 7 月 3 日__ 六、申請專利範圍 3 5.如申請專利範圍第2 5項之方法,其中種子水晶具有不 少於12平方毫米之尖端。 3 6.如申請專利範圍第2 5項之方法,其中使介面具有凸 面形狀之速率為少於0. 8毫米/分鐘或0. 5毫米/分鐘。 3 7.如申請專利範圍第2 5項之方法,其中速率使得介面 具有凹面形狀和速率使得介面具有凸面形狀之間之差異至 少1毫米/分鐘或2毫米/分鐘。 3 8.如申請專利範圍第2 5項之方法,其中種子水晶具有 直徑至少7毫米。 3 9. —種單晶石夕,包括: 一頸具有平均直徑至少5毫米,長度少於150毫米,且包 括一具有差排之上層部分和無差排之下層部分; 一種子圓錐與頸下層部分相鄰;和 一主體與具有名義上直徑至少150毫米之種子圓錐相 鄰。 4 0.如申請專利範圍第3 9項之單晶矽,其中該主體具有 名義上直徑至少200毫米或300毫米。 4 1.如申請專利範圍第3 9項之單晶矽,其中頸具有平均 直徑至少7毫米。 4 2.如申請專利範圍第3 9項之單晶矽,其中頸具有長度 少於1 2 5毫米。 4 3.如申請專利範圍第3 9項之單晶矽,其中頸直徑的變 化少於最後頸的長度50°/。、75%或是85%中之1 5%。 4 4.如申請專利範圍第39項之單晶矽,其中頸具有平均O: \ 69 \ 69375-910703.ptc Page 24 500841 _ Case No. 90104084_fV July 3rd __ VI. Application for patent scope 3 5. If the method of applying for patent scope No. 25, the seed crystal has a lot of At the tip of 12 mm2. 36. The method of claim 25, wherein the rate at which the interface has a convex shape is less than 0.8 mm / minute or 0.5 mm / minute. 37. The method of claim 25, wherein the difference between the rate such that the interface has a concave shape and the rate such that the interface has a convex shape is at least 1 mm / minute or 2 mm / minute. 38. The method of claim 25, wherein the seed crystal has a diameter of at least 7 mm. 3 9. A kind of monocrystalline stone, including: a neck having an average diameter of at least 5 mm and a length of less than 150 mm, and including a portion with a difference upper layer and a portion without a difference lower layer; a sub-cone and a lower layer of the neck Partially adjacent; and a body adjacent to a seed cone having a nominal diameter of at least 150 mm. 40. The single crystal silicon according to item 39 of the patent application scope, wherein the body has a nominal diameter of at least 200 mm or 300 mm. 4 1. The monocrystalline silicon according to item 39 of the patent application, wherein the neck has an average diameter of at least 7 mm. 4 2. The monocrystalline silicon according to item 39 of the patent application, wherein the neck has a length of less than 125 mm. 4 3. According to the single crystal silicon of the 39th patent application scope, the change in the diameter of the neck is less than the length of the final neck by 50 ° /. , 75% or 15% of 85%. 4 4. If the single crystal silicon of the scope of patent application No. 39, the neck has an average O:\69\69375-910703.ptc 第25頁 500841 案號90104084_f/年7月3曰_修正 六、申請專利範圍O: \ 69 \ 69375-910703.ptc Page 25 500841 Case No. 90104084_f / July 3rd of the year_Amendment O:\69\69375-910703.ptc 第26頁O: \ 69 \ 69375-910703.ptc Page 26
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