TW493208B - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuit Download PDFInfo
- Publication number
- TW493208B TW493208B TW090105954A TW90105954A TW493208B TW 493208 B TW493208 B TW 493208B TW 090105954 A TW090105954 A TW 090105954A TW 90105954 A TW90105954 A TW 90105954A TW 493208 B TW493208 B TW 493208B
- Authority
- TW
- Taiwan
- Prior art keywords
- semiconductor integrated
- mos transistor
- channel mos
- integrated circuit
- power supply
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/811—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using FETs as protective elements
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00315—Modifications for increasing the reliability for protection in field-effect transistor circuits
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/911—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using passive elements as protective elements
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000176041A JP2001358300A (ja) | 2000-06-12 | 2000-06-12 | 半導体集積回路装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW493208B true TW493208B (en) | 2002-07-01 |
Family
ID=18677815
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW090105954A TW493208B (en) | 2000-06-12 | 2001-03-14 | Semiconductor integrated circuit |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6433407B2 (https=) |
| JP (1) | JP2001358300A (https=) |
| TW (1) | TW493208B (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5322758B2 (ja) | 2009-04-27 | 2013-10-23 | ルネサスエレクトロニクス株式会社 | 出力回路 |
| JP5288479B2 (ja) | 2009-04-27 | 2013-09-11 | ルネサスエレクトロニクス株式会社 | 表示パネルドライバ |
| KR102012925B1 (ko) * | 2012-01-26 | 2019-08-23 | 삼성디스플레이 주식회사 | 유기전계발광 표시장치 및 그의 구동방법 |
| JP2014103282A (ja) * | 2012-11-20 | 2014-06-05 | Toshiba Corp | 半導体装置 |
| JP5604602B2 (ja) * | 2014-01-07 | 2014-10-08 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置 |
| JP2023134064A (ja) | 2022-03-14 | 2023-09-27 | キオクシア株式会社 | 半導体装置、及び、半導体装置の製造方法 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5576557A (en) * | 1995-04-14 | 1996-11-19 | United Microelectronics Corp. | Complementary LVTSCR ESD protection circuit for sub-micron CMOS integrated circuits |
-
2000
- 2000-06-12 JP JP2000176041A patent/JP2001358300A/ja active Pending
-
2001
- 2001-03-09 US US09/801,669 patent/US6433407B2/en not_active Expired - Fee Related
- 2001-03-14 TW TW090105954A patent/TW493208B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| US20010050411A1 (en) | 2001-12-13 |
| US6433407B2 (en) | 2002-08-13 |
| JP2001358300A (ja) | 2001-12-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GD4A | Issue of patent certificate for granted invention patent | ||
| MM4A | Annulment or lapse of patent due to non-payment of fees |