TW490509B - Metal and metal silicide nitridization in a high a density, low pressure plasma reactor - Google Patents
Metal and metal silicide nitridization in a high a density, low pressure plasma reactor Download PDFInfo
- Publication number
- TW490509B TW490509B TW087110020A TW87110020A TW490509B TW 490509 B TW490509 B TW 490509B TW 087110020 A TW087110020 A TW 087110020A TW 87110020 A TW87110020 A TW 87110020A TW 490509 B TW490509 B TW 490509B
- Authority
- TW
- Taiwan
- Prior art keywords
- metal
- nitride
- layer
- substrate
- patent application
- Prior art date
Links
- 229910052751 metal Inorganic materials 0.000 title claims abstract description 167
- 239000002184 metal Substances 0.000 title claims abstract description 167
- 229910021332 silicide Inorganic materials 0.000 title claims abstract description 50
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 title claims abstract description 48
- 239000000758 substrate Substances 0.000 claims abstract description 67
- 230000004888 barrier function Effects 0.000 claims abstract description 66
- 238000000034 method Methods 0.000 claims abstract description 58
- 239000007789 gas Substances 0.000 claims abstract description 44
- 239000000203 mixture Substances 0.000 claims abstract description 36
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 33
- 150000004767 nitrides Chemical class 0.000 claims abstract description 32
- 229910052581 Si3N4 Inorganic materials 0.000 claims abstract description 26
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 19
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims abstract description 18
- 238000000151 deposition Methods 0.000 claims abstract description 15
- 238000005121 nitriding Methods 0.000 claims description 35
- -1 giant Chemical compound 0.000 claims description 29
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 17
- 238000005229 chemical vapour deposition Methods 0.000 claims description 16
- 239000004576 sand Substances 0.000 claims description 12
- 239000010936 titanium Substances 0.000 claims description 12
- 229910052786 argon Inorganic materials 0.000 claims description 10
- 239000002245 particle Substances 0.000 claims description 10
- 229910052719 titanium Inorganic materials 0.000 claims description 10
- 229910052721 tungsten Inorganic materials 0.000 claims description 9
- 239000010937 tungsten Substances 0.000 claims description 9
- 238000004544 sputter deposition Methods 0.000 claims description 8
- 230000000694 effects Effects 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 6
- 230000002079 cooperative effect Effects 0.000 claims description 6
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 5
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 claims description 5
- 229910052758 niobium Inorganic materials 0.000 claims description 5
- 239000010955 niobium Substances 0.000 claims description 5
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 5
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 5
- 229910052782 aluminium Inorganic materials 0.000 claims description 4
- GPBUGPUPKAGMDK-UHFFFAOYSA-N azanylidynemolybdenum Chemical compound [Mo]#N GPBUGPUPKAGMDK-UHFFFAOYSA-N 0.000 claims description 4
- 230000001939 inductive effect Effects 0.000 claims description 4
- ZVWKZXLXHLZXLS-UHFFFAOYSA-N zirconium nitride Chemical compound [Zr]#N ZVWKZXLXHLZXLS-UHFFFAOYSA-N 0.000 claims description 4
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 3
- 229910052804 chromium Inorganic materials 0.000 claims description 3
- 239000011651 chromium Substances 0.000 claims description 3
- 238000009616 inductively coupled plasma Methods 0.000 claims description 3
- 229910052750 molybdenum Inorganic materials 0.000 claims description 3
- 239000011733 molybdenum Substances 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 2
- CFJRGWXELQQLSA-UHFFFAOYSA-N azanylidyneniobium Chemical compound [Nb]#N CFJRGWXELQQLSA-UHFFFAOYSA-N 0.000 claims description 2
- YXTPWUNVHCYOSP-UHFFFAOYSA-N bis($l^{2}-silanylidene)molybdenum Chemical compound [Si]=[Mo]=[Si] YXTPWUNVHCYOSP-UHFFFAOYSA-N 0.000 claims description 2
- 229910021357 chromium silicide Inorganic materials 0.000 claims description 2
- DYRBFMPPJATHRF-UHFFFAOYSA-N chromium silicon Chemical compound [Si].[Cr] DYRBFMPPJATHRF-UHFFFAOYSA-N 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- 230000008878 coupling Effects 0.000 claims description 2
- 238000010168 coupling process Methods 0.000 claims description 2
- 238000005859 coupling reaction Methods 0.000 claims description 2
- 229910021344 molybdenum silicide Inorganic materials 0.000 claims description 2
- GALOTNBSUVEISR-UHFFFAOYSA-N molybdenum;silicon Chemical compound [Mo]#[Si] GALOTNBSUVEISR-UHFFFAOYSA-N 0.000 claims description 2
- LIZIAPBBPRPPLV-UHFFFAOYSA-N niobium silicon Chemical compound [Si].[Nb] LIZIAPBBPRPPLV-UHFFFAOYSA-N 0.000 claims description 2
- 239000002002 slurry Substances 0.000 claims description 2
- 229910021341 titanium silicide Inorganic materials 0.000 claims description 2
- WQJQOUPTWCFRMM-UHFFFAOYSA-N tungsten disilicide Chemical compound [Si]#[W]#[Si] WQJQOUPTWCFRMM-UHFFFAOYSA-N 0.000 claims description 2
- 229910021342 tungsten silicide Inorganic materials 0.000 claims description 2
- SJKRCWUQJZIWQB-UHFFFAOYSA-N azane;chromium Chemical compound N.[Cr] SJKRCWUQJZIWQB-UHFFFAOYSA-N 0.000 claims 2
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims 1
- UGACIEPFGXRWCH-UHFFFAOYSA-N [Si].[Ti] Chemical compound [Si].[Ti] UGACIEPFGXRWCH-UHFFFAOYSA-N 0.000 claims 1
- 239000008186 active pharmaceutical agent Substances 0.000 claims 1
- CXOWYMLTGOFURZ-UHFFFAOYSA-N azanylidynechromium Chemical compound [Cr]#N CXOWYMLTGOFURZ-UHFFFAOYSA-N 0.000 claims 1
- VIKNJXKGJWUCNN-XGXHKTLJSA-N norethisterone Chemical compound O=C1CC[C@@H]2[C@H]3CC[C@](C)([C@](CC4)(O)C#C)[C@@H]4[C@@H]3CCC2=C1 VIKNJXKGJWUCNN-XGXHKTLJSA-N 0.000 claims 1
- 238000010248 power generation Methods 0.000 claims 1
- UVGLBOPDEUYYCS-UHFFFAOYSA-N silicon zirconium Chemical compound [Si].[Zr] UVGLBOPDEUYYCS-UHFFFAOYSA-N 0.000 claims 1
- 239000004575 stone Substances 0.000 claims 1
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 claims 1
- 229910052726 zirconium Inorganic materials 0.000 claims 1
- 230000008569 process Effects 0.000 abstract description 5
- 238000006243 chemical reaction Methods 0.000 description 15
- 238000005546 reactive sputtering Methods 0.000 description 11
- 238000004519 manufacturing process Methods 0.000 description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 5
- 238000005530 etching Methods 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 239000011149 active material Substances 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 239000004020 conductor Substances 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 230000005611 electricity Effects 0.000 description 3
- 239000001307 helium Substances 0.000 description 3
- 229910052734 helium Inorganic materials 0.000 description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 238000010899 nucleation Methods 0.000 description 3
- 230000006911 nucleation Effects 0.000 description 3
- 125000002524 organometallic group Chemical group 0.000 description 3
- 235000012239 silicon dioxide Nutrition 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 229910021529 ammonia Inorganic materials 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000006227 byproduct Substances 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 229910001092 metal group alloy Inorganic materials 0.000 description 2
- 239000000376 reactant Substances 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- BSYNRYMUTXBXSQ-UHFFFAOYSA-N Aspirin Chemical compound CC(=O)OC1=CC=CC=C1C(O)=O BSYNRYMUTXBXSQ-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 101710116852 Molybdenum cofactor sulfurase 1 Proteins 0.000 description 1
- 229910052778 Plutonium Inorganic materials 0.000 description 1
- 229910003074 TiCl4 Inorganic materials 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- IVHJCRXBQPGLOV-UHFFFAOYSA-N azanylidynetungsten Chemical compound [W]#N IVHJCRXBQPGLOV-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005281 excited state Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 238000001764 infiltration Methods 0.000 description 1
- 230000008595 infiltration Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 239000002923 metal particle Substances 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- OYEHPCDNVJXUIW-UHFFFAOYSA-N plutonium atom Chemical compound [Pu] OYEHPCDNVJXUIW-UHFFFAOYSA-N 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- VSZWPYCFIRKVQL-UHFFFAOYSA-N selanylidenegallium;selenium Chemical compound [Se].[Se]=[Ga].[Se]=[Ga] VSZWPYCFIRKVQL-UHFFFAOYSA-N 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- WNUPENMBHHEARK-UHFFFAOYSA-N silicon tungsten Chemical compound [Si].[W] WNUPENMBHHEARK-UHFFFAOYSA-N 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 239000013077 target material Substances 0.000 description 1
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76853—Barrier, adhesion or liner layers characterized by particular after-treatment steps
- H01L21/76855—After-treatment introducing at least one additional element into the layer
- H01L21/76856—After-treatment introducing at least one additional element into the layer by treatment in plasmas or gaseous environments, e.g. nitriding a refractory metal liner
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76843—Barrier, adhesion or liner layers formed in openings in a dielectric
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Plasma & Fusion (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Electrodes Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/881,710 US6221792B1 (en) | 1997-06-24 | 1997-06-24 | Metal and metal silicide nitridization in a high density, low pressure plasma reactor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW490509B true TW490509B (en) | 2002-06-11 |
Family
ID=25379039
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW087110020A TW490509B (en) | 1997-06-24 | 1998-06-22 | Metal and metal silicide nitridization in a high a density, low pressure plasma reactor |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US6221792B1 (enExample) |
| EP (1) | EP1016130A1 (enExample) |
| JP (1) | JP2002506568A (enExample) |
| KR (1) | KR20010013723A (enExample) |
| TW (1) | TW490509B (enExample) |
| WO (1) | WO1998059366A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108573942A (zh) * | 2017-03-09 | 2018-09-25 | 联华电子股份有限公司 | 内连线结构及其制作方法 |
Families Citing this family (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5856236A (en) * | 1996-06-14 | 1999-01-05 | Micron Technology, Inc. | Method of depositing a smooth conformal aluminum film on a refractory metal nitride layer |
| GB9710514D0 (en) * | 1996-09-21 | 1997-07-16 | Philips Electronics Nv | Electronic devices and their manufacture |
| US7858518B2 (en) * | 1998-04-07 | 2010-12-28 | Micron Technology, Inc. | Method for forming a selective contact and local interconnect in situ |
| US6559050B1 (en) * | 1998-09-29 | 2003-05-06 | Texas Instruments Incorporated | Process for high thermal stable contact formation in manufacturing sub-quarter-micron CMOS devices |
| JP2000208508A (ja) * | 1999-01-13 | 2000-07-28 | Texas Instr Inc <Ti> | 珪酸塩高誘電率材料の真空蒸着 |
| US6653222B2 (en) * | 1999-08-03 | 2003-11-25 | International Business Machines Corporation | Plasma enhanced liner |
| DE10010286A1 (de) | 2000-02-25 | 2001-09-13 | Infineon Technologies Ag | Verfahren zum Auffüllen von Vertiefungen in einer Oberfläche einer Halbleiterstruktur und eine auf diese Weise aufgefüllte Halbleiterstruktur |
| KR100379333B1 (ko) * | 2000-08-16 | 2003-04-10 | 주식회사 하이닉스반도체 | 티타늄 실리사이드막 제조방법 |
| US6455414B1 (en) * | 2000-11-28 | 2002-09-24 | Tokyo Electron Limited | Method for improving the adhesion of sputtered copper films to CVD transition metal based underlayers |
| KR20030001939A (ko) * | 2001-06-28 | 2003-01-08 | 동부전자 주식회사 | 반도체소자의 장벽층 형성 방법 및 장치 |
| US6426305B1 (en) * | 2001-07-03 | 2002-07-30 | International Business Machines Corporation | Patterned plasma nitridation for selective epi and silicide formation |
| US6593234B2 (en) * | 2001-07-24 | 2003-07-15 | Micron Technology, Inc. | Methods of utilizing metal rich silicide in forming semiconductor constructions |
| US9708707B2 (en) * | 2001-09-10 | 2017-07-18 | Asm International N.V. | Nanolayer deposition using bias power treatment |
| US7144806B1 (en) * | 2002-10-23 | 2006-12-05 | Novellus Systems, Inc. | ALD of tantalum using a hydride reducing agent |
| US7713592B2 (en) | 2003-02-04 | 2010-05-11 | Tegal Corporation | Nanolayer deposition process |
| US9121098B2 (en) | 2003-02-04 | 2015-09-01 | Asm International N.V. | NanoLayer Deposition process for composite films |
| US7856035B2 (en) * | 2004-05-05 | 2010-12-21 | Welch Allyn, Inc. | Method and apparatus for wireless transmission of data |
| US7164095B2 (en) * | 2004-07-07 | 2007-01-16 | Noritsu Koki Co., Ltd. | Microwave plasma nozzle with enhanced plume stability and heating efficiency |
| US7806077B2 (en) | 2004-07-30 | 2010-10-05 | Amarante Technologies, Inc. | Plasma nozzle array for providing uniform scalable microwave plasma generation |
| US20060021980A1 (en) * | 2004-07-30 | 2006-02-02 | Lee Sang H | System and method for controlling a power distribution within a microwave cavity |
| US7189939B2 (en) * | 2004-09-01 | 2007-03-13 | Noritsu Koki Co., Ltd. | Portable microwave plasma discharge unit |
| US7271363B2 (en) | 2004-09-01 | 2007-09-18 | Noritsu Koki Co., Ltd. | Portable microwave plasma systems including a supply line for gas and microwaves |
| US20060052883A1 (en) * | 2004-09-08 | 2006-03-09 | Lee Sang H | System and method for optimizing data acquisition of plasma using a feedback control module |
| US7749896B2 (en) * | 2005-08-23 | 2010-07-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor device and method for forming the same |
| JP5808623B2 (ja) * | 2011-09-07 | 2015-11-10 | 株式会社アルバック | バリアメタル層の形成方法 |
| CA2813159A1 (en) * | 2012-05-24 | 2013-11-24 | Sulzer Metco Ag | Method of modifying a boundary region of a substrate |
| US10573522B2 (en) | 2016-08-16 | 2020-02-25 | Lam Research Corporation | Method for preventing line bending during metal fill process |
| US10510851B2 (en) * | 2016-11-29 | 2019-12-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | Low resistance contact method and structure |
| KR102792797B1 (ko) | 2018-11-19 | 2025-04-07 | 램 리써치 코포레이션 | 텅스텐을 위한 몰리브덴 템플릿들 |
| JP7581213B2 (ja) | 2019-01-28 | 2024-11-12 | ラム リサーチ コーポレーション | 金属膜の蒸着 |
| WO2021046058A1 (en) | 2019-09-03 | 2021-03-11 | Lam Research Corporation | Molybdenum deposition |
| JP2022551965A (ja) | 2019-10-15 | 2022-12-14 | ラム リサーチ コーポレーション | モリブデン充填 |
| CN112159949B (zh) * | 2020-10-27 | 2023-03-10 | 广东省科学院新材料研究所 | 氮化钛涂层的制备方法、基材及应用 |
| CN112746320B (zh) * | 2020-12-22 | 2022-07-05 | 中国科学院半导体研究所 | 利用磁控溅射在硅衬底上制备氮化锆薄膜的方法 |
| TW202438705A (zh) * | 2022-10-28 | 2024-10-01 | 美商蘭姆研究公司 | 選擇性鉬填充 |
| US20240194527A1 (en) * | 2022-12-07 | 2024-06-13 | Applied Materials, Inc. | Interlayer for Resistivity Reduction in Metal Deposition Applications |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3221025B2 (ja) * | 1991-12-19 | 2001-10-22 | ソニー株式会社 | プラズマプロセス装置 |
| US5334264A (en) | 1992-06-30 | 1994-08-02 | Board Of Supervisors Of Louisiana State University And Agricultural And Mechanical College | Titanium plasma nitriding intensified by thermionic emission source |
| JPH0697111A (ja) | 1992-09-11 | 1994-04-08 | Sony Corp | バリアメタルの形成方法 |
| JP3401843B2 (ja) * | 1993-06-21 | 2003-04-28 | ソニー株式会社 | 半導体装置における多層配線の形成方法 |
| WO1995034092A1 (en) * | 1994-06-03 | 1995-12-14 | Materials Research Corporation | A method of nitridization of titanium thin films |
| JP2692590B2 (ja) * | 1994-06-29 | 1997-12-17 | 日本電気株式会社 | 半導体装置およびその製造方法 |
| JPH08176823A (ja) * | 1994-12-26 | 1996-07-09 | Sony Corp | 高融点金属薄膜の成膜方法 |
| US5702564A (en) * | 1995-01-03 | 1997-12-30 | Advanced Micro Devices, Inc. | Method of etching conductive lines without undercutting |
| US5545592A (en) * | 1995-02-24 | 1996-08-13 | Advanced Micro Devices, Inc. | Nitrogen treatment for metal-silicide contact |
| US5725740A (en) * | 1995-06-07 | 1998-03-10 | Applied Materials, Inc. | Adhesion layer for tungsten deposition |
| US5552340A (en) | 1995-10-27 | 1996-09-03 | Vanguard International Semiconductor Corp. | Nitridation of titanium, for use with tungsten filled contact holes |
| US5686796A (en) * | 1995-12-20 | 1997-11-11 | International Business Machines Corporation | Ion implantation helicon plasma source with magnetic dipoles |
-
1997
- 1997-06-24 US US08/881,710 patent/US6221792B1/en not_active Expired - Lifetime
-
1998
- 1998-06-22 KR KR1019997011738A patent/KR20010013723A/ko not_active Ceased
- 1998-06-22 WO PCT/US1998/012934 patent/WO1998059366A1/en not_active Ceased
- 1998-06-22 JP JP50493399A patent/JP2002506568A/ja not_active Withdrawn
- 1998-06-22 EP EP98931457A patent/EP1016130A1/en not_active Withdrawn
- 1998-06-22 TW TW087110020A patent/TW490509B/zh not_active IP Right Cessation
-
2001
- 2001-01-18 US US09/765,918 patent/US20010002326A1/en not_active Abandoned
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108573942A (zh) * | 2017-03-09 | 2018-09-25 | 联华电子股份有限公司 | 内连线结构及其制作方法 |
| CN108573942B (zh) * | 2017-03-09 | 2021-09-14 | 联华电子股份有限公司 | 内连线结构及其制作方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1016130A1 (en) | 2000-07-05 |
| US6221792B1 (en) | 2001-04-24 |
| JP2002506568A (ja) | 2002-02-26 |
| KR20010013723A (ko) | 2001-02-26 |
| US20010002326A1 (en) | 2001-05-31 |
| WO1998059366A1 (en) | 1998-12-30 |
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