TW373328B - Method to produce an electronic writable and erasable read-only-memory cell arrangement - Google Patents

Method to produce an electronic writable and erasable read-only-memory cell arrangement

Info

Publication number
TW373328B
TW373328B TW086116333A TW86116333A TW373328B TW 373328 B TW373328 B TW 373328B TW 086116333 A TW086116333 A TW 086116333A TW 86116333 A TW86116333 A TW 86116333A TW 373328 B TW373328 B TW 373328B
Authority
TW
Taiwan
Prior art keywords
memory
cell
memory cell
cell arrangement
produce
Prior art date
Application number
TW086116333A
Other languages
English (en)
Inventor
Josef Willer
Hans Reisinger
Franz Hofmann
Wolfgang Krautschneider
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Application granted granted Critical
Publication of TW373328B publication Critical patent/TW373328B/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/822Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
    • H01L21/8221Three dimensional integrated circuits stacked in different levels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B41/00Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/20Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by three-dimensional arrangements, e.g. with cells on different height levels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B41/00Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/30Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the memory core region

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
TW086116333A 1996-11-11 1997-11-04 Method to produce an electronic writable and erasable read-only-memory cell arrangement TW373328B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19646419A DE19646419C1 (de) 1996-11-11 1996-11-11 Verfahren zur Herstellung einer elektrisch schreib- und löschbaren Festwertspeicherzellenanordnung

Publications (1)

Publication Number Publication Date
TW373328B true TW373328B (en) 1999-11-01

Family

ID=7811228

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086116333A TW373328B (en) 1996-11-11 1997-11-04 Method to produce an electronic writable and erasable read-only-memory cell arrangement

Country Status (6)

Country Link
US (1) US5882969A (zh)
EP (1) EP0843353A1 (zh)
JP (1) JPH10150174A (zh)
KR (1) KR19980042259A (zh)
DE (1) DE19646419C1 (zh)
TW (1) TW373328B (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0396786B1 (de) * 1989-05-08 1994-01-26 Siemens Aktiengesellschaft Integrierbarer Sigma-Delta-Modulator in Switched-Capacitor-Technik
DE19603810C1 (de) * 1996-02-02 1997-08-28 Siemens Ag Speicherzellenanordnung und Verfahren zu deren Herstellung
US6326263B1 (en) * 2000-08-11 2001-12-04 United Microelectronics Corp. Method of fabricating a flash memory cell
GB0101695D0 (en) * 2001-01-23 2001-03-07 Koninkl Philips Electronics Nv Manufacture of trench-gate semiconductor devices
US6599813B2 (en) * 2001-06-29 2003-07-29 International Business Machines Corporation Method of forming shallow trench isolation for thin silicon-on-insulator substrates
TW527652B (en) * 2002-02-06 2003-04-11 Taiwan Semiconductor Mfg Manufacturing method of selection gate for the split gate flash memory cell and its structure
DE10220923B4 (de) * 2002-05-10 2006-10-26 Infineon Technologies Ag Verfahren zur Herstellung eines nicht-flüchtigen Flash-Halbleiterspeichers
KR101044773B1 (ko) * 2003-07-16 2011-06-27 매그나칩 반도체 유한회사 증가된 채널 폭을 갖는 mos 트랜지스터 및 제조 방법
KR101004814B1 (ko) * 2003-10-22 2011-01-04 매그나칩 반도체 유한회사 비휘발성 메모리 소자의 제조 방법
TWI701770B (zh) * 2018-07-24 2020-08-11 華邦電子股份有限公司 非揮發性記憶體裝置及其製造方法
CN110828465B (zh) * 2018-08-10 2023-04-07 华邦电子股份有限公司 非易失性存储器装置及其制造方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07254651A (ja) * 1994-03-16 1995-10-03 Toshiba Corp 半導体集積回路装置
US5498560A (en) * 1994-09-16 1996-03-12 Motorola, Inc. Process for forming an electrically programmable read-only memory cell

Also Published As

Publication number Publication date
US5882969A (en) 1999-03-16
KR19980042259A (ko) 1998-08-17
EP0843353A1 (de) 1998-05-20
JPH10150174A (ja) 1998-06-02
DE19646419C1 (de) 1998-04-30

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