TW369621B - Mask protective device - Google Patents
Mask protective deviceInfo
- Publication number
- TW369621B TW369621B TW086110064A TW86110064A TW369621B TW 369621 B TW369621 B TW 369621B TW 086110064 A TW086110064 A TW 086110064A TW 86110064 A TW86110064 A TW 86110064A TW 369621 B TW369621 B TW 369621B
- Authority
- TW
- Taiwan
- Prior art keywords
- frame
- mask
- face
- protective device
- opening
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
- G03F1/64—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof characterised by the frames, e.g. structure or material, including bonding means therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/62—Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70983—Optical system protection, e.g. pellicles or removable covers for protection of mask
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24777—Edge feature
- Y10T428/24793—Comprising discontinuous or differential impregnation or bond
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
- Y10T428/24851—Intermediate layer is discontinuous or differential
- Y10T428/24868—Translucent outer layer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Adhesive Tapes (AREA)
- Details Or Accessories Of Spraying Plant Or Apparatus (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18714596 | 1996-07-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW369621B true TW369621B (en) | 1999-09-11 |
Family
ID=16200918
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW086110064A TW369621B (en) | 1996-07-17 | 1997-07-16 | Mask protective device |
Country Status (9)
Country | Link |
---|---|
US (1) | US6083577A (zh) |
EP (1) | EP0851294B1 (zh) |
JP (1) | JP3606880B2 (zh) |
KR (1) | KR19990045743A (zh) |
CA (1) | CA2231175A1 (zh) |
DE (1) | DE69727782T2 (zh) |
MY (1) | MY120124A (zh) |
TW (1) | TW369621B (zh) |
WO (1) | WO1998002783A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI669565B (zh) * | 2018-09-26 | 2019-08-21 | 美商微相科技股份有限公司 | Photomask protection component structure |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002182373A (ja) * | 2000-12-18 | 2002-06-26 | Shin Etsu Chem Co Ltd | ペリクル及びその製造方法及びフォトマスク |
US7008487B1 (en) * | 2002-03-04 | 2006-03-07 | Micron Technology, Inc. | Method and system for removal of contaminates from phaseshift photomasks |
DE10246788B4 (de) * | 2002-10-08 | 2007-08-30 | Infineon Technologies Ag | Schutzvorrichtung für Reflexionsmasken und Verfahren zur Verwendung einer geschützten Reflexionsmaske |
US7094505B2 (en) * | 2002-10-29 | 2006-08-22 | Toppan Photomasks, Inc. | Photomask assembly and method for protecting the same from contaminants generated during a lithography process |
US7316869B2 (en) * | 2003-08-26 | 2008-01-08 | Intel Corporation | Mounting a pellicle to a frame |
US7264853B2 (en) * | 2003-08-26 | 2007-09-04 | Intel Corporation | Attaching a pellicle frame to a reticle |
US20050202252A1 (en) * | 2004-03-12 | 2005-09-15 | Alexander Tregub | Use of alternative polymer materials for "soft" polymer pellicles |
US7314667B2 (en) * | 2004-03-12 | 2008-01-01 | Intel Corporation | Process to optimize properties of polymer pellicles and resist for lithography applications |
US8087296B2 (en) | 2006-03-15 | 2012-01-03 | Panasonic Corporation | Angular velocity sensor |
JP2016139103A (ja) * | 2015-01-29 | 2016-08-04 | 日本軽金属株式会社 | ペリクル用支持枠 |
CN109814333A (zh) * | 2019-01-25 | 2019-05-28 | 上海微择科技有限公司 | 一种高性能的防污染颗粒的光罩膜 |
TWI687760B (zh) * | 2019-04-16 | 2020-03-11 | 家登精密工業股份有限公司 | 具有擾流結構的光罩盒 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2439418A1 (fr) * | 1978-10-17 | 1980-05-16 | Censor Patent Versuch | Masque pour projeter une image sur un substrat semi-conducteur |
JPH0123137Y2 (zh) * | 1985-04-05 | 1989-07-17 | ||
JPH0772793B2 (ja) * | 1986-09-05 | 1995-08-02 | 三井石油化学工業株式会社 | ペリクル |
JPH02250055A (ja) * | 1988-12-09 | 1990-10-05 | Seiko Epson Corp | フォトマスク及び半導体装置の製造方法 |
JPH02302757A (ja) * | 1989-05-17 | 1990-12-14 | Fujitsu Ltd | 冷却機能付ペリクル |
WO1992021066A1 (en) * | 1991-05-17 | 1992-11-26 | E.I. Du Pont De Nemours And Company | Pressure relieving pellicle |
US5529819A (en) * | 1995-04-17 | 1996-06-25 | Inko Industrial Corporation | Pellicle assembly with vent structure |
-
1997
- 1997-07-08 KR KR1019980701985A patent/KR19990045743A/ko not_active Application Discontinuation
- 1997-07-08 CA CA002231175A patent/CA2231175A1/en not_active Abandoned
- 1997-07-08 JP JP50583298A patent/JP3606880B2/ja not_active Expired - Fee Related
- 1997-07-08 WO PCT/JP1997/002368 patent/WO1998002783A1/ja not_active Application Discontinuation
- 1997-07-08 EP EP97929565A patent/EP0851294B1/en not_active Expired - Lifetime
- 1997-07-08 DE DE69727782T patent/DE69727782T2/de not_active Expired - Fee Related
- 1997-07-08 US US09/043,272 patent/US6083577A/en not_active Expired - Fee Related
- 1997-07-16 MY MYPI97003240A patent/MY120124A/en unknown
- 1997-07-16 TW TW086110064A patent/TW369621B/zh active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI669565B (zh) * | 2018-09-26 | 2019-08-21 | 美商微相科技股份有限公司 | Photomask protection component structure |
Also Published As
Publication number | Publication date |
---|---|
EP0851294A4 (en) | 2000-04-05 |
EP0851294A1 (en) | 1998-07-01 |
JP3606880B2 (ja) | 2005-01-05 |
WO1998002783A1 (fr) | 1998-01-22 |
US6083577A (en) | 2000-07-04 |
EP0851294B1 (en) | 2004-02-25 |
MY120124A (en) | 2005-09-30 |
DE69727782T2 (de) | 2004-12-09 |
CA2231175A1 (en) | 1998-01-22 |
DE69727782D1 (de) | 2004-04-01 |
KR19990045743A (ko) | 1999-06-25 |
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