TW367518B - Method and apparatus for ion beam formation in an ion implanter - Google Patents

Method and apparatus for ion beam formation in an ion implanter

Info

Publication number
TW367518B
TW367518B TW085110453A TW85110453A TW367518B TW 367518 B TW367518 B TW 367518B TW 085110453 A TW085110453 A TW 085110453A TW 85110453 A TW85110453 A TW 85110453A TW 367518 B TW367518 B TW 367518B
Authority
TW
Taiwan
Prior art keywords
ion
ions
source
deflection region
implantation chamber
Prior art date
Application number
TW085110453A
Other languages
English (en)
Inventor
Victor Maurice Benveniste
Original Assignee
Axcelis Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Axcelis Tech Inc filed Critical Axcelis Tech Inc
Application granted granted Critical
Publication of TW367518B publication Critical patent/TW367518B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/26—Bombardment with radiation
    • H01L21/263—Bombardment with radiation with high-energy radiation
    • H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/05—Electron or ion-optical arrangements for separating electrons or ions according to their energy or mass
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/10—Lenses
    • H01J2237/14—Lenses magnetic

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physical Vapour Deposition (AREA)
TW085110453A 1995-10-19 1996-08-28 Method and apparatus for ion beam formation in an ion implanter TW367518B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/545,135 US5554857A (en) 1995-10-19 1995-10-19 Method and apparatus for ion beam formation in an ion implanter

Publications (1)

Publication Number Publication Date
TW367518B true TW367518B (en) 1999-08-21

Family

ID=24175020

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085110453A TW367518B (en) 1995-10-19 1996-08-28 Method and apparatus for ion beam formation in an ion implanter

Country Status (9)

Country Link
US (2) US5554857A (zh)
EP (1) EP0769798B1 (zh)
JP (1) JP3721462B2 (zh)
KR (1) KR100295627B1 (zh)
CN (1) CN1101593C (zh)
CA (1) CA2184629A1 (zh)
DE (1) DE69611024T2 (zh)
SG (1) SG44054A1 (zh)
TW (1) TW367518B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI420562B (zh) * 2009-05-27 2013-12-21 Advanced Ion Beam Tech Inc 離子佈植機與調整離子束的方法
US9852882B2 (en) 2013-06-14 2017-12-26 Varian Semiconductor Equipment Associates, Inc. Annular cooling fluid passage for magnets

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9503305D0 (en) * 1995-02-20 1995-04-12 Univ Nanyang Filtered cathodic arc source
US5554857A (en) * 1995-10-19 1996-09-10 Eaton Corporation Method and apparatus for ion beam formation in an ion implanter
US5780863A (en) * 1997-04-29 1998-07-14 Eaton Corporation Accelerator-decelerator electrostatic lens for variably focusing and mass resolving an ion beam in an ion implanter
JP3376857B2 (ja) * 1997-05-07 2003-02-10 日新電機株式会社 イオン注入装置
JP3449198B2 (ja) * 1997-10-22 2003-09-22 日新電機株式会社 イオン注入装置
US6207963B1 (en) 1998-12-23 2001-03-27 Axcelis Technologies, Inc. Ion beam implantation using conical magnetic scanning
US6403967B1 (en) 1999-10-15 2002-06-11 Advanced Ion Beam Technology, Inc. Magnet system for an ion beam implantation system using high perveance beams
US6541781B1 (en) 2000-07-25 2003-04-01 Axcelis Technologies, Inc. Waveguide for microwave excitation of plasma in an ion beam guide
US6703628B2 (en) 2000-07-25 2004-03-09 Axceliss Technologies, Inc Method and system for ion beam containment in an ion beam guide
US6414329B1 (en) 2000-07-25 2002-07-02 Axcelis Technologies, Inc. Method and system for microwave excitation of plasma in an ion beam guide
US6583429B2 (en) 2001-08-23 2003-06-24 Axcelis Technologies, Inc. Method and apparatus for improved ion bunching in an ion implantation system
US6635890B2 (en) 2001-08-23 2003-10-21 Axcelis Technologies, Inc. Slit double gap buncher and method for improved ion bunching in an ion implantation system
AU2002321806A1 (en) * 2001-12-10 2003-06-23 Inolase 2002 Ltd. Method and apparatus for improving safety during exposure to a monochromatic light source
US20040227106A1 (en) * 2003-05-13 2004-11-18 Halling Alfred M. System and methods for ion beam containment using localized electrostatic fields in an ion beam passageway
US6770888B1 (en) * 2003-05-15 2004-08-03 Axcelis Technologies, Inc. High mass resolution magnet for ribbon beam ion implanters
US6891174B2 (en) * 2003-07-31 2005-05-10 Axcelis Technologies, Inc. Method and system for ion beam containment using photoelectrons in an ion beam guide
US20050061997A1 (en) * 2003-09-24 2005-03-24 Benveniste Victor M. Ion beam slit extraction with mass separation
US6870170B1 (en) * 2004-03-04 2005-03-22 Applied Materials, Inc. Ion implant dose control
US7675050B2 (en) * 2006-06-12 2010-03-09 Advanced Ion Beam Technology, Inc. Apparatus and method for ion beam implantation using ribbon and spot beams
US7462843B2 (en) * 2004-05-18 2008-12-09 Advanced Ion Bean Technology Inc. Apparatus and methods for ion beam implantation
US7019314B1 (en) 2004-10-18 2006-03-28 Axcelis Technologies, Inc. Systems and methods for ion beam focusing
US7414249B2 (en) * 2004-11-30 2008-08-19 Purser Kenneth H Broad energy-range ribbon ion beam collimation using a variable-gradient dipole
US7488958B2 (en) * 2005-03-08 2009-02-10 Axcelis Technologies, Inc. High conductance ion source
JP4875400B2 (ja) * 2005-05-06 2012-02-15 アドバンスト イオン ビーム テクノロジー インク リボンイオンビーム用高アスペクト比、高質量分解能アナライザマグネット及びシステム
KR100671158B1 (ko) * 2005-08-11 2007-01-17 동부일렉트로닉스 주식회사 파티클 제거 장치 및 이를 포함하는 이온 주입 장치
US7446326B2 (en) * 2005-08-31 2008-11-04 Varian Semiconductor Equipment Associates, Inc. Technique for improving ion implanter productivity
WO2007146985A2 (en) * 2006-06-13 2007-12-21 Semequip, Inc. Magnetic analyzer apparatus and method for ion implantation
US8124946B2 (en) * 2008-06-25 2012-02-28 Axcelis Technologies Inc. Post-decel magnetic energy filter for ion implantation systems
DE102008062888B4 (de) * 2008-12-23 2010-12-16 Carl Zeiss Nts Gmbh Teilchenoptische Vorrichtung mit Magnetanordnung
CN101692369B (zh) * 2009-07-23 2012-05-16 胡新平 用于宽带离子束的质量分析磁铁
US8604443B2 (en) * 2009-11-13 2013-12-10 Varian Semiconductor Equipment Associates, Inc. System and method for manipulating an ion beam
US8227773B2 (en) 2010-07-29 2012-07-24 Axcelis Technologies, Inc. Versatile beam glitch detection system
CN102523673A (zh) * 2011-12-19 2012-06-27 北京大学 一种采用磁镜场约束的等离子体密封窗及其密封方法
US8723135B2 (en) * 2012-04-03 2014-05-13 Nissin Ion Equipment Co., Ltd. Ion beam bending magnet for a ribbon-shaped ion beam
JP6500009B2 (ja) 2013-03-15 2019-04-10 グレン レイン ファミリー リミテッド ライアビリティ リミテッド パートナーシップ 調節可能な質量分析アパーチャ
US9620327B2 (en) * 2014-12-26 2017-04-11 Axcelis Technologies, Inc. Combined multipole magnet and dipole scanning magnet
JP6098846B2 (ja) * 2015-06-16 2017-03-22 日新イオン機器株式会社 真空チャンバ及び質量分析電磁石
CN104979156B (zh) * 2015-07-14 2017-03-01 东莞帕萨电子装备有限公司 束流调节装置
US9793087B2 (en) * 2015-09-10 2017-10-17 Varian Semiconductor Equipment Associates, Inc. Techniques and apparatus for manipulating an ion beam
CN109521461B (zh) * 2019-01-08 2023-10-27 中国工程物理研究院核物理与化学研究所 一种用于控制中子自旋的翻转线圈
CN117080039B (zh) * 2023-09-05 2024-05-31 广东省新兴激光等离子体技术研究院 分析磁场装置及离子注入机
CN117080038B (zh) * 2023-09-05 2024-08-23 广东省新兴激光等离子体技术研究院 离子束分析磁铁结构及离子注入设备

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2932738A (en) * 1955-09-15 1960-04-12 Commissariat Energie Atomique Magnetic prisms for separating ionized particles
US3356976A (en) * 1965-11-10 1967-12-05 William B Sampson Quadrupole magnet
US5389793A (en) * 1983-08-15 1995-02-14 Applied Materials, Inc. Apparatus and methods for ion implantation
US5164599A (en) * 1991-07-19 1992-11-17 Eaton Corporation Ion beam neutralization means generating diffuse secondary emission electron shower
US5282899A (en) * 1992-06-10 1994-02-01 Ruxam, Inc. Apparatus for the production of a dissociated atomic particle flow
US5350926A (en) * 1993-03-11 1994-09-27 Diamond Semiconductor Group, Inc. Compact high current broad beam ion implanter
US5523652A (en) * 1994-09-26 1996-06-04 Eaton Corporation Microwave energized ion source for ion implantation
US5554857A (en) * 1995-10-19 1996-09-10 Eaton Corporation Method and apparatus for ion beam formation in an ion implanter

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI420562B (zh) * 2009-05-27 2013-12-21 Advanced Ion Beam Tech Inc 離子佈植機與調整離子束的方法
US9852882B2 (en) 2013-06-14 2017-12-26 Varian Semiconductor Equipment Associates, Inc. Annular cooling fluid passage for magnets
TWI624856B (zh) * 2013-06-14 2018-05-21 瓦里安半導體設備公司 用於離子裝置的磁鐵以及離子裝置

Also Published As

Publication number Publication date
SG44054A1 (en) 1997-11-14
JP3721462B2 (ja) 2005-11-30
US5736743A (en) 1998-04-07
KR970023702A (ko) 1997-05-30
EP0769798A1 (en) 1997-04-23
CN1160287A (zh) 1997-09-24
JPH09129173A (ja) 1997-05-16
DE69611024T2 (de) 2001-06-21
EP0769798B1 (en) 2000-11-22
CA2184629A1 (en) 1997-04-20
CN1101593C (zh) 2003-02-12
KR100295627B1 (ko) 2001-10-24
US5554857A (en) 1996-09-10
DE69611024D1 (de) 2000-12-28

Similar Documents

Publication Publication Date Title
TW367518B (en) Method and apparatus for ion beam formation in an ion implanter
US6770888B1 (en) High mass resolution magnet for ribbon beam ion implanters
US5132544A (en) System for irradiating a surface with atomic and molecular ions using two dimensional magnetic scanning
JP3869680B2 (ja) イオン注入装置
KR100442990B1 (ko) 중첩정적및시변자계를생성하는시스템및방법
US6207963B1 (en) Ion beam implantation using conical magnetic scanning
WO1995034908A1 (en) Magnetic scanning of heavy ion beams
WO2002023582A3 (en) Faraday system for ion implanters
US9443698B2 (en) Hybrid scanning for ion implantation
TWI679669B (zh) 結合的多極磁鐵和雙極掃描磁鐵
WO2002093987A3 (en) Ion sorces
US3394217A (en) Method and apparatus for controlling plural electron beams
CA2129403C (en) Ion implanting apparatus and ion implanting method
CN111741590A (zh) 偏转磁铁及具有其的偏转装置
JPS56156662A (en) Device for ion implantation
EP1180783A3 (en) Magnet for generating a magnetic field in an ion source
JP2644958B2 (ja) イオン源装置およびそのイオン源装置を備えたイオン打ち込み装置
US11114270B2 (en) Scanning magnet design with enhanced efficiency
JP3206506B2 (ja) 永久磁石により磁界にオフセットを付けた分析磁石を有するイオン注入装置
JPS598949B2 (ja) イオン源装置
TW463245B (en) Ion beam focus adjustment device
JPH0448544A (ja) イオン注入装置
JPS5697952A (en) Microwave ion source
JPH04123754A (ja) イオン注入装置
JPH06162980A (ja) イオン源

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees