TW328661B - The semiconductor apparatus - Google Patents

The semiconductor apparatus

Info

Publication number
TW328661B
TW328661B TW086110243A TW86110243A TW328661B TW 328661 B TW328661 B TW 328661B TW 086110243 A TW086110243 A TW 086110243A TW 86110243 A TW86110243 A TW 86110243A TW 328661 B TW328661 B TW 328661B
Authority
TW
Taiwan
Prior art keywords
output
interval
control circuit
semiconductor apparatus
read
Prior art date
Application number
TW086110243A
Other languages
English (en)
Inventor
Masaaki Kuroki
Original Assignee
Oki Electric Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Ind Co Ltd filed Critical Oki Electric Ind Co Ltd
Application granted granted Critical
Publication of TW328661B publication Critical patent/TW328661B/zh

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/1069I/O lines read out arrangements
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/16Modifications for eliminating interference voltages or currents
    • H03K17/161Modifications for eliminating interference voltages or currents in field-effect transistor switches
    • H03K17/162Modifications for eliminating interference voltages or currents in field-effect transistor switches without feedback from the output circuit to the control circuit
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K17/6871Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the output circuit comprising more than one controlled field-effect transistor

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Logic Circuits (AREA)
TW086110243A 1996-07-26 1997-07-19 The semiconductor apparatus TW328661B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19715096 1996-07-26

Publications (1)

Publication Number Publication Date
TW328661B true TW328661B (en) 1998-03-21

Family

ID=16369605

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086110243A TW328661B (en) 1996-07-26 1997-07-19 The semiconductor apparatus

Country Status (6)

Country Link
US (1) US6201743B1 (zh)
EP (1) EP0855719B1 (zh)
KR (1) KR100399110B1 (zh)
DE (1) DE69728850T2 (zh)
TW (1) TW328661B (zh)
WO (1) WO1998005036A1 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3425890B2 (ja) * 1999-04-08 2003-07-14 Necエレクトロニクス株式会社 バッファ回路
US6784647B2 (en) * 2002-07-15 2004-08-31 Intel Corporation Method and apparatus for operating a voltage regulator based on operation of a timer
KR100666484B1 (ko) * 2005-02-04 2007-01-09 삼성전자주식회사 반도체 메모리 장치의 입출력 회로 및 입출력 방법
US7714618B2 (en) * 2007-12-13 2010-05-11 Macronix International Co. Ltd Output driver circuit with output preset circuit and controlling method thereof having lower power consumption
US7948269B1 (en) * 2009-01-20 2011-05-24 Xilinx, Inc. System and method for open drain/open collector structures in an integrated circuit
JP5509123B2 (ja) * 2011-03-01 2014-06-04 ルネサスエレクトロニクス株式会社 半導体装置及びデータ取込方法
JP6811706B2 (ja) 2014-07-31 2021-01-13 ザ ホンコン ユニヴァーシティ オブ サイエンス アンド テクノロジー Epha4に対するヒトモノクローナル抗体及びそれらの使用
JP7422083B2 (ja) * 2018-10-24 2024-01-25 ソニーセミコンダクタソリューションズ株式会社 半導体回路および半導体システム

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5634186A (en) 1979-08-29 1981-04-06 Hitachi Ltd Bipolar memory circuit
JPS60115092A (ja) * 1983-11-28 1985-06-21 Nec Corp 半導体記憶回路
JPS6352513A (ja) * 1986-08-22 1988-03-05 Hitachi Micro Comput Eng Ltd 半導体集積回路
JPS6353513A (ja) 1986-08-25 1988-03-07 Hitachi Ltd 光偏向装置
JPH0474386A (ja) * 1990-07-17 1992-03-09 Hitachi Ltd 半導体記憶装置
JPH04214290A (ja) 1990-12-12 1992-08-05 Mitsubishi Electric Corp 半導体記憶装置
JPH0562467A (ja) * 1991-09-05 1993-03-12 Hitachi Ltd センスアンプ駆動回路
JPH0574174A (ja) 1991-09-13 1993-03-26 Seiko Epson Corp 半導体記憶装置
KR950012019B1 (ko) * 1992-10-02 1995-10-13 삼성전자주식회사 반도체메모리장치의 데이타출력버퍼
JPH07192470A (ja) 1993-03-08 1995-07-28 Nec Ic Microcomput Syst Ltd 半導体メモリの出力回路
US5488581A (en) * 1993-10-28 1996-01-30 Fujitsu Limited Semiconductor memory device
JPH07182864A (ja) 1993-12-21 1995-07-21 Mitsubishi Electric Corp 半導体記憶装置
US5585744A (en) * 1995-10-13 1996-12-17 Cirrus Logic, Inc. Circuits systems and methods for reducing power loss during transfer of data across a conductive line
KR100206922B1 (ko) * 1996-07-22 1999-07-01 구본준 라이트 제어회로

Also Published As

Publication number Publication date
EP0855719B1 (en) 2004-04-28
KR100399110B1 (ko) 2003-12-31
KR19990044616A (ko) 1999-06-25
WO1998005036A1 (fr) 1998-02-05
EP0855719A4 (en) 1998-10-28
DE69728850D1 (de) 2004-06-03
DE69728850T2 (de) 2005-04-21
US6201743B1 (en) 2001-03-13
EP0855719A1 (en) 1998-07-29

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