TW282544B - - Google Patents

Info

Publication number
TW282544B
TW282544B TW084113127A TW84113127A TW282544B TW 282544 B TW282544 B TW 282544B TW 084113127 A TW084113127 A TW 084113127A TW 84113127 A TW84113127 A TW 84113127A TW 282544 B TW282544 B TW 282544B
Authority
TW
Taiwan
Application number
TW084113127A
Original Assignee
Samsug Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsug Electronics Co Ltd filed Critical Samsug Electronics Co Ltd
Application granted granted Critical
Publication of TW282544B publication Critical patent/TW282544B/zh

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/408Address circuits
    • G11C11/4085Word line control circuits, e.g. word line drivers, - boosters, - pull-up, - pull-down, - precharge
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/143Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Dc-Dc Converters (AREA)
TW084113127A 1994-12-29 1995-12-09 TW282544B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019940038503A KR0137317B1 (ko) 1994-12-29 1994-12-29 반도체 메모리소자의 활성싸이클에서 사용되는 승압회로

Publications (1)

Publication Number Publication Date
TW282544B true TW282544B (zh) 1996-08-01

Family

ID=19404725

Family Applications (1)

Application Number Title Priority Date Filing Date
TW084113127A TW282544B (zh) 1994-12-29 1995-12-09

Country Status (7)

Country Link
JP (1) JP2828942B2 (zh)
KR (1) KR0137317B1 (zh)
CN (1) CN1045838C (zh)
DE (1) DE19547796C2 (zh)
FR (1) FR2729020B1 (zh)
GB (1) GB2296593B (zh)
TW (1) TW282544B (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0142963B1 (ko) * 1995-05-17 1998-08-17 김광호 외부제어신호에 적응 동작하는 승압회로를 갖는 반도체 메모리 장치
KR0172337B1 (ko) * 1995-11-13 1999-03-30 김광호 반도체 메모리장치의 내부승압전원 발생회로
US6094395A (en) * 1998-03-27 2000-07-25 Infineon Technologies North America Corp. Arrangement for controlling voltage generators in multi-voltage generator chips such as DRAMs
CN1299432C (zh) * 2001-10-29 2007-02-07 旺宏电子股份有限公司 减少工作电压与温度所造成的影响的推动电压产生器
KR100846484B1 (ko) 2002-03-14 2008-07-17 삼성전자주식회사 Rmim 전극 및 그 제조방법 및 이를 채용하는 스퍼터링장치
KR100741471B1 (ko) * 2006-09-29 2007-07-20 삼성전자주식회사 래치-업이 발생하지 않는 부스팅 스킴
JP5137545B2 (ja) * 2006-12-25 2013-02-06 株式会社半導体エネルギー研究所 半導体装置及びその駆動方法
US9502119B2 (en) * 2014-11-20 2016-11-22 Samsung Electronics Co., Ltd. Distributed capacitive delay tracking boost-assist circuit

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63153791A (ja) * 1986-12-17 1988-06-27 Mitsubishi Electric Corp ワ−ド線駆動信号発生回路
US4752699A (en) * 1986-12-19 1988-06-21 International Business Machines Corp. On chip multiple voltage generation using a charge pump and plural feedback sense circuits
KR920010749B1 (ko) * 1989-06-10 1992-12-14 삼성전자 주식회사 반도체 집적소자의 내부전압 변환회로
GB9007791D0 (en) * 1990-04-06 1990-06-06 Foss Richard C High voltage boosted wordline supply charge pump and regulator for dram
US5157278A (en) * 1990-10-30 1992-10-20 Samsung Electronics Co., Ltd. Substrate voltage generator for semiconductor device
US5272676A (en) * 1990-11-20 1993-12-21 Hitachi, Ltd. Semiconductor integrated circuit device
JPH04287418A (ja) * 1991-03-18 1992-10-13 Fujitsu Ltd 半導体集積回路
KR950002015B1 (ko) * 1991-12-23 1995-03-08 삼성전자주식회사 하나의 오실레이터에 의해 동작되는 정전원 발생회로
JPH05174591A (ja) * 1991-12-25 1993-07-13 Sharp Corp チャージポンプ回路
US5329168A (en) * 1991-12-27 1994-07-12 Nec Corporation Semiconductor integrated circuit device equipped with substrate biasing system selectively powered from internal and external power sources
JP3179848B2 (ja) * 1992-03-27 2001-06-25 三菱電機株式会社 半導体記憶装置
KR950002726B1 (ko) * 1992-03-30 1995-03-24 삼성전자주식회사 기판전압 발생기의 전하 펌프 회로
US5337284A (en) * 1993-01-11 1994-08-09 United Memories, Inc. High voltage generator having a self-timed clock circuit and charge pump, and a method therefor

Also Published As

Publication number Publication date
GB2296593B (en) 1997-07-23
GB2296593A (en) 1996-07-03
KR960025707A (ko) 1996-07-20
KR0137317B1 (ko) 1998-04-29
JPH08235859A (ja) 1996-09-13
DE19547796C2 (de) 1998-04-16
GB9526716D0 (en) 1996-02-28
DE19547796A1 (de) 1996-07-11
FR2729020B1 (fr) 1998-07-10
FR2729020A1 (fr) 1996-07-05
CN1127919A (zh) 1996-07-31
JP2828942B2 (ja) 1998-11-25
CN1045838C (zh) 1999-10-20

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Legal Events

Date Code Title Description
MK4A Expiration of patent term of an invention patent