TW267240B - - Google Patents

Info

Publication number
TW267240B
TW267240B TW082106943A TW82106943A TW267240B TW 267240 B TW267240 B TW 267240B TW 082106943 A TW082106943 A TW 082106943A TW 82106943 A TW82106943 A TW 82106943A TW 267240 B TW267240 B TW 267240B
Authority
TW
Taiwan
Application number
TW082106943A
Other languages
Chinese (zh)
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of TW267240B publication Critical patent/TW267240B/zh

Links

Classifications

    • H10P70/15
    • H10P52/00
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/10Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B7/00Cleaning by methods not provided for in a single other subclass or a single group in this subclass
    • B08B7/0035Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like
    • B08B7/0057Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like by ultraviolet radiation
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23FNON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
    • C23F4/00Processes for removing metallic material from surfaces, not provided for in group C23F1/00 or C23F3/00
    • H10P72/0416

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Weting (AREA)
TW082106943A 1992-05-29 1993-08-27 TW267240B (OSRAM)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US89041592A 1992-05-29 1992-05-29

Publications (1)

Publication Number Publication Date
TW267240B true TW267240B (OSRAM) 1996-01-01

Family

ID=25396646

Family Applications (1)

Application Number Title Priority Date Filing Date
TW082106943A TW267240B (OSRAM) 1992-05-29 1993-08-27

Country Status (4)

Country Link
EP (2) EP0702400A3 (OSRAM)
JP (1) JPH0661217A (OSRAM)
KR (1) KR930024112A (OSRAM)
TW (1) TW267240B (OSRAM)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6296714B1 (en) * 1997-01-16 2001-10-02 Mitsubishi Materials Silicon Corporation Washing solution of semiconductor substrate and washing method using the same
US6482269B1 (en) * 1997-05-29 2002-11-19 Memc Electronic Materials, Inc. Process for the removal of copper and other metallic impurities from silicon
JP3510562B2 (ja) 2000-04-28 2004-03-29 Necエレクトロニクス株式会社 半導体装置の製造方法及び処理装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61275200A (ja) * 1985-05-28 1986-12-05 Tokai Carbon Co Ltd SiCウイスカ−の精製方法
JPH0719764B2 (ja) * 1986-07-28 1995-03-06 大日本スクリ−ン製造株式会社 表面洗浄方法
EP0286233B1 (en) * 1987-03-11 1992-01-02 Omco Co. Ltd. Water electrolyzing apparatus
JP2540583B2 (ja) * 1988-03-07 1996-10-02 日本電信電話株式会社 基板の清浄化処理方法およびその装置
JPH02102529A (ja) * 1988-10-12 1990-04-16 Matsushita Electron Corp マスク洗浄方法
JPH069195B2 (ja) * 1989-05-06 1994-02-02 大日本スクリーン製造株式会社 基板の表面処理方法
JPH0382029A (ja) * 1989-08-24 1991-04-08 Nec Corp 湿式処理装置
JPH0475339A (ja) * 1990-07-17 1992-03-10 Seiko Epson Corp 電界洗浄法
EP0502356A3 (en) * 1991-02-28 1993-03-10 Texas Instruments Incorporated Photo-stimulated removal of trace metals
EP0567939A3 (en) * 1992-04-29 1993-12-15 Texas Instruments Inc Method of removing small particles from a surface

Also Published As

Publication number Publication date
EP0702400A2 (en) 1996-03-20
KR930024112A (ko) 1993-12-21
EP0571950A2 (en) 1993-12-01
EP0571950A3 (en) 1993-12-15
EP0702400A3 (en) 1996-05-15
JPH0661217A (ja) 1994-03-04

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