TW202300929A - 導電接觸針 - Google Patents

導電接觸針 Download PDF

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Publication number
TW202300929A
TW202300929A TW111123044A TW111123044A TW202300929A TW 202300929 A TW202300929 A TW 202300929A TW 111123044 A TW111123044 A TW 111123044A TW 111123044 A TW111123044 A TW 111123044A TW 202300929 A TW202300929 A TW 202300929A
Authority
TW
Taiwan
Prior art keywords
metal layer
conductive contact
contact pin
metal
contact
Prior art date
Application number
TW111123044A
Other languages
English (en)
Chinese (zh)
Inventor
安範模
朴勝浩
洪昌熙
Original Assignee
南韓商普因特工程有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 南韓商普因特工程有限公司 filed Critical 南韓商普因特工程有限公司
Publication of TW202300929A publication Critical patent/TW202300929A/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G01R1/06761—Material aspects related to layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
TW111123044A 2021-06-28 2022-06-21 導電接觸針 TW202300929A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020210083814A KR20230001190A (ko) 2021-06-28 2021-06-28 전기 전도성 접촉핀
KR10-2021-0083814 2021-06-28

Publications (1)

Publication Number Publication Date
TW202300929A true TW202300929A (zh) 2023-01-01

Family

ID=84692894

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111123044A TW202300929A (zh) 2021-06-28 2022-06-21 導電接觸針

Country Status (3)

Country Link
KR (1) KR20230001190A (ko)
TW (1) TW202300929A (ko)
WO (1) WO2023277407A1 (ko)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG75186A1 (en) 1998-11-30 2000-09-19 Advantest Corp Method for producing contact structures
JP4684855B2 (ja) * 2005-11-08 2011-05-18 株式会社日本マイクロニクス プローブおよびその製造方法
JP4783265B2 (ja) * 2006-11-02 2011-09-28 健 金子 コンタクトプローブ、及びコンタクトプローブの製造方法
JP5643477B2 (ja) * 2008-06-18 2014-12-17 日本電子材料株式会社 コンタクトプローブ
JP2017181477A (ja) * 2016-03-28 2017-10-05 金子　健 コンタクトプローブ装置
KR101962644B1 (ko) * 2017-08-23 2019-03-28 리노공업주식회사 검사프로브 및 이를 사용한 검사장치

Also Published As

Publication number Publication date
KR20230001190A (ko) 2023-01-04
WO2023277407A1 (ko) 2023-01-05

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