TW202241688A - Resin-molding device and method for producing resin molded article - Google Patents
Resin-molding device and method for producing resin molded article Download PDFInfo
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- TW202241688A TW202241688A TW111114146A TW111114146A TW202241688A TW 202241688 A TW202241688 A TW 202241688A TW 111114146 A TW111114146 A TW 111114146A TW 111114146 A TW111114146 A TW 111114146A TW 202241688 A TW202241688 A TW 202241688A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/56—Coatings, e.g. enameled or galvanised; Releasing, lubricating or separating agents
- B29C33/68—Release sheets
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/02—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
- B29C43/18—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/32—Component parts, details or accessories; Auxiliary operations
- B29C43/34—Feeding the material to the mould or the compression means
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/32—Component parts, details or accessories; Auxiliary operations
- B29C43/58—Measuring, controlling or regulating
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
Abstract
Description
本發明關於一種樹脂成形裝置、及樹脂成形品的製造方法。The present invention relates to a resin molding device and a method for manufacturing a resin molded product.
近年來,希望將半導體封裝的厚度變薄,而在樹脂供給中謀求樹脂供應量的面內均勻性,以在廣面積中消除封裝厚度的偏差並使該封裝厚度一致。因此,例如專利文獻1中揭露一種技術,其將脫模薄膜配置在工作台上之後,將液狀樹脂供給到脫模薄膜上,並藉由相機來加以攝像(參照專利文獻1的第3圖等)。又,專利文獻2中揭露一種技術,其將脫模薄膜配置在移動台上之後,將顆粒狀樹脂供給到脫模薄膜上,並加以觀察(參照專利文獻2的說明書段落[0048]、[0049]、第1圖等)。任一專利文獻的技術中,都是對於積層在脫模薄膜上的樹脂材料進行觀察,藉此識別樹脂材料的面內均勻性。In recent years, it is desired to reduce the thickness of the semiconductor package, and to achieve in-plane uniformity in the amount of resin supply in order to eliminate variation in package thickness over a wide area and to make the package thickness uniform. Therefore, for example,
[先前技術文獻] (專利文獻) 專利文獻1:日本專利6218891號公報 專利文獻2:日本特開2020-82534號公報 [Prior Art Literature] (patent documents) Patent Document 1: Japanese Patent No. 6218891 Patent Document 2: Japanese Patent Laid-Open No. 2020-82534
[發明所欲解決的問題] 然而,雖然在上述各公報中沒有明確表示,在先前技術中是將相機配置在樹脂材料的上方,並且將照明也配置在上方。因此,照明的照明方向相對於攝像方向傾斜。其結果,可能造成在樹脂材料上出現陰影並產生明暗,而成為誤認面內均勻性的主要原因。 [Problem to be solved by the invention] However, although it is not clearly stated in each of the above publications, in the prior art, the camera is arranged above the resin material, and the lighting is also arranged above. Therefore, the illumination direction of the illumination is inclined with respect to the imaging direction. As a result, shading may occur on the resin material and light and shade may be generated, which may be a cause of misunderstanding of in-plane uniformity.
本發明為了解決此問題而完成,目的是提供一種樹脂成形裝置及樹脂成形品的製造方法,該樹脂成形裝置可檢測出在1個樹脂成形品內的厚度偏差的發生The present invention was made to solve this problem, and an object of the present invention is to provide a resin molding device and a method of manufacturing a resin molded product that can detect the occurrence of thickness variation within a single resin molded product
[解決問題的技術手段] 關於本發明的樹脂成形裝置,具備:工作台,其至少一部分具有透光性;照明部,其可自前述工作台的下方進行照明;樹脂材料供給部,其將樹脂材料供給到前述工作台上;攝像部,其可自上方對於已供給到前述工作台上的前述樹脂材料進行攝像;及,樹脂成形部,其使用已供給到前述工作台上的前述樹脂材料來實行樹脂成形。 [Technical means to solve the problem] The resin molding apparatus of the present invention includes: a workbench at least a part of which is translucent; an illuminating unit capable of illuminating the workbench from below; and a resin material supply unit that supplies resin material to the workbench. an imaging unit capable of imaging the resin material supplied on the table from above; and a resin molding unit performing resin molding using the resin material supplied on the table.
關於本發明的樹脂成形品的製造方法,具備:將樹脂材料供給到至少一部分具有透光性的工作台上的步驟;在自前述工作台的下方實行照明的狀態下,自上方對於已供給的前述樹脂材料進行攝像的步驟;及,使用已供給到前述工作台上的前述樹脂材料來實行樹脂成形的步驟。The manufacturing method of the resin molded article of the present invention comprises: the step of supplying the resin material onto at least a partially light-transmitting workbench; a step of imaging the resin material; and a step of resin molding using the resin material supplied to the stage.
[發明的效果] 依據本發明,能夠檢測出在1個樹脂成形品內的厚度偏差的發生。 [Effect of the invention] According to the present invention, it is possible to detect the occurrence of thickness variation within one resin molded product.
以下,使用圖式來詳細說明關於本發明的樹脂成形裝置的一實施形態。又,為了容易理解,各圖式中有省略或誇張且示意地描繪適當對象的情況。Hereinafter, one embodiment of the resin molding apparatus according to the present invention will be described in detail using the drawings. In addition, for easy understanding, appropriate objects may be omitted or exaggerated and schematically drawn in each drawing.
<1.樹脂成形裝置的構成>
第1圖是關於本實施形態的樹脂成形裝置100的概略平面圖。樹脂成形裝置100,構成為在連接有半導體晶片、電阻元件、電容元件等的電子元件之基板W上施加樹脂密封,以製造樹脂成形品。在此樹脂成形裝置100中,對於基板W之中的搭載有電子零件之零件搭載面施加樹脂密封。
<1. Configuration of resin molding equipment>
Fig. 1 is a schematic plan view of a
作為此處使用的基板W的一例,能夠舉例有矽晶圓等的半導體基板,導線架、印刷配線基板、金屬製基板、樹脂製基板、玻璃製基板、陶瓷製基板等。基板W,也可以是在FOWLP(Fan Out Wafer Level Packaging,扇出型晶圓級封裝)、FOPLP(Fan Out Panel Level Packaging,扇出型面板級封裝)中使用的載體。在基板W中,也可以事先施加了配線,也可以不施加配線。Examples of the substrate W used here include semiconductor substrates such as silicon wafers, lead frames, printed wiring boards, metal substrates, resin substrates, glass substrates, ceramic substrates, and the like. The substrate W may also be a carrier used in FOWLP (Fan Out Wafer Level Packaging) or FOPLP (Fan Out Panel Level Packaging). In the substrate W, wiring may be provided in advance, or no wiring may be provided.
如第1圖所示,樹脂成形裝置100,具有基板供給和收納模組A(以下也簡稱為「模組A」)、2個樹脂成形模組B(以下也簡稱為「模組B」)、樹脂材料供給模組C(以下也簡稱為「模組C」)、及第一控制部14。作為第一控制部,能夠使用例如PLC(Programmable Logic Controller,可程式化邏輯控制器)、PC(Personal Computer,個人電腦)等。第一控制部14,構成為包含CPU(Central Processing Unit,中央處理單元)、RAM(Random Access Memory,隨機存取記憶體)及ROM(Read Only Memory,唯讀記憶體)等,以對應於資訊處理來實行各模組A~C的控制。以下,詳細說明各模組A~C。另外,可將各模組A~C,裝拆於其他模組上且可進行交換。又,在樹脂成形裝置100中,對於各模組A~C可進行增加和減少。As shown in FIG. 1, the
<1-1.模組A>
模組A是供給密封前的基板W並收納密封完成後的基板W之模組,其具有基板供給部1、基板收納部2、基板載置部3、及基板搬送機構4。基板供給部1,構成為將密封前的基板W供給到基板載置部3上。基板收納部2,構成為收納密封完成後的基板W(樹脂成形品)。基板載置部3,構成為在基板供給部1的對應位置與基板收納部2的對應位置之間於箭頭Y方向上移動。基板搬送機構4,構成為橫越模組A和模組B於箭頭X方向和箭頭Y方向上移動,例如在模組A中將在基板載置部3上的密封前的基板W,保持並搬送到模組B。或者,在模組B中將製造了的密封完成後的基板W,載置在模組A的基板載置部3上。
<1-1. Module A>
Module A is a module that supplies substrates W before sealing and stores substrates W after sealing, and includes a
<1-2.模組B>
各模組B是實行樹脂材料的成形之模組,其具有壓縮成形部5,以藉由壓縮成形來製造密封完成後的基板W(樹脂成形品)。此壓縮成形中,例如使用黑色顆粒狀的樹脂材料P。壓縮成形部5,具有上模具52、與上模具52對向的下模具51、及模具緊固機構53。上模具52,構成為將基板W保持於其底面。另一方面,下模具51具有用以形成凹狀的腔室51C的底面構件和側面構件。亦即,由底面構件來構成腔室51C的底面,由側面構件來構成腔室51C的側面。如後述,在腔室51C中配置有由模組C準備的樹脂材料P。再者,模具緊固機構53,構成為對於上模具52、及配置有樹脂材料P之下模具51加以模具緊固。
<1-2. Module B>
Each die set B is a die set for molding a resin material, has a
<1-3.模組C>
模組C是用以供給樹脂材料之模組。如第1圖所示,模組C具有移動台6、樹脂材料收容部7、樹脂材料供給部8、脫模薄膜供給部9、攝像部300、及樹脂材料搬送機構90。進一步,在此模組C中,設置有HDD(Hard Disc Drive,硬碟驅動器)200、及第二控制部150。此第二控制部150相當於本發明的控制部。以下,詳細說明各構成。
<1-3. Module C>
Module C is a module for supplying resin materials. As shown in FIG. 1 , the module C has a moving table 6 , a resin
<1-3-1.移動台>
第2圖是移動台的平面圖,第3圖是第2圖的剖面圖。如第1圖所示,移動台6,構成為在模組C中於箭頭X方向和箭頭Y方向上移動。如第2圖和第3圖所示,在移動台6的頂面上形成有凹部61,並在此凹部61中配置有導光板62。又,在導光板62的側端面上配置有LED模組63以作為照明部。成為自此LED模組63照射出來的光,射入導光板62中並在導光板62內擴散,藉此使導光板62的頂面發光。導光板62,能夠適當地使用由丙烯酸樹脂等形成的習知的板材,對應於需要也能夠設置有反射薄膜和擴散薄膜。
<1-3-1. Mobile station>
Fig. 2 is a plan view of the mobile station, and Fig. 3 is a sectional view of Fig. 2 . As shown in FIG. 1 , the moving table 6 is configured to move in the arrow X direction and the arrow Y direction in the module C. As shown in FIG. As shown in FIGS. 2 and 3 , a
在移動台6的頂面上,在導光板62的周圍形成有吸附口(省略圖示),並構成為藉由吸附而保持以下說明的脫模薄膜73。On the top surface of the moving table 6, a suction opening (not shown) is formed around the
<1-3-2.脫模薄膜供給部>
第4圖是說明脫模薄膜供給部的動作的側面圖。如第4圖(a)所示,在移動台6的一端部側設置有脫模薄膜供給部9,用以將脫模薄膜73配置在移動台6的頂面上。脫模薄膜供給部9,具有捲繞有脫模薄膜73之滾筒91、使脫模薄膜73自此滾筒91捲出並配置在移動台6上之捲出部92、及將脫模薄膜73切斷之切斷部93。
<1-3-2. Release film supply part>
Fig. 4 is a side view illustrating the operation of the release film supply unit. As shown in FIG. 4( a ), a release
如第4圖(b)所示,捲出部92,構成為把持已捲繞在滾筒91上的脫模薄膜73的端部,並使脫模薄膜73藉由自此滾筒91遠離而捲出。此時,捲出部92自移動台6的一端部到另一端部在該移動台6的上方移動。藉此,將脫模薄膜73配置在移動台6上。在移動台6上的脫模薄膜73,被上述吸附口吸引並並保持在移動台6上。又,如第4圖(c)所示,藉由切斷部93來切斷脫模薄膜73中的滾筒91側的端部。藉此將片狀的脫模薄膜73配置在移動台6上。As shown in FIG. 4 (b), the unwinding
<1-3-3.樹脂材料收容部>
接著說明樹脂材料收容部7。如第5圖(a)所示,樹脂材料收容部7,具有框狀構件72、及使該框狀構件72移動的移動機構(省略圖示)。框狀構件72,形成為矩形狀且藉由移動機構而被配置在已配置有脫模薄膜73之移動台6上。藉此形成為凹部71,其中供給有樹脂材料。亦即,由脫模薄膜73來構成此凹部71的底面,由框狀構件72來構成此凹部71的側面。另外,此凹部71具有對應於模組B的下模具51的腔室51C的尺寸的空間。
<1-3-3. Resin material container>
Next, the resin
<1-3-4.樹脂材料供給部>
接下來說明樹脂材料供給部8。第6圖是示意地表示樹脂材料供給部的剖面圖。樹脂材料供給部8,構成為將預先設定重量的樹脂材料P供給到框狀構件72的凹部71中,並具有儲藏部11、搬送路徑12、振動部13、及計量部16。儲藏部11,暫時儲藏顆粒狀的樹脂材料P並將此樹脂材料P供給到搬送路徑12中。已供給到搬送路徑12中的樹脂材料,自該搬送路徑12的端部的吐出口121排出並供給到框狀構件72的凹部71中。此時,構成為由振動部13來振動搬送路徑12,藉此將樹脂材料P搬送到吐出口側。
<1-3-4. Resin material supply part>
Next, the resin material supply unit 8 will be described. Fig. 6 is a cross-sectional view schematically showing a resin material supply unit. The resin material supply unit 8 is configured to supply a predetermined weight of the resin material P into the
計量部16,構成為計測樹脂材料供給部8內的樹脂材料P的重量。第一控制部14,基於由計量部16得到的計量結果來控制振動部13,以使朝向樹脂材料收容部7的樹脂材料P的供給量成為目標值。The measuring
自樹脂材料供給部8的吐出口121落下的樹脂材料P,藉由移動台6的相對於樹脂材料供給部8的吐出口的相對移動,而毫無缺漏地全面鋪滿在凹部71中。The resin material P falling from the
<1-3-5.攝像部>
第7圖是用以說明由攝像部得到的攝像狀態的圖。如第7圖所示,攝像部300,構成為可自上方對於已供給到框狀構件72的凹部71中的樹脂材料P進行攝像並產生畫像資料。攝像部300,例如在移動台6位於攝像部300的下方的狀態下對於凹部71中的樹脂材料P進行攝像。攝像部300,例如以相機模組來構成,該相機模組包含CCD(Charge Coupled Device,電荷耦合元件)影像感測器或CMOS(Complementary Metal Oxide Semiconductor,互補金氧半導體)影像感測器等的影像感測器。當進行此攝像時,藉由上述導光板62自樹脂材料P的下方隔著脫模薄膜73進行光的照射。
<1-3-5. Camera Department>
Fig. 7 is a diagram for explaining an imaging state obtained by an imaging unit. As shown in FIG. 7, the
上述HDD200,構成為可記憶由攝像部300產生的畫像資料。另外,HDD200也可以替換成固態驅動器等其他的記憶媒體。The
第二控制部150,包含CPU、RAM及ROM等,並構成為可對應於資訊處理來實行攝像部300等的控制。關於由第一控制部14和第二控制部150來實行的各種控制,詳述於後。The
<1-3-6.樹脂材料搬送機構>
如第1圖所示,樹脂材料搬送機構90,構成為在模組B和模組C中於箭頭X方向和箭頭Y方向上移動。如第5圖(b)所示,樹脂材料搬送機構90,使收容有樹脂材料P之框狀構件72和脫模薄膜73自移動台6上離開。再者,構成為將這些搬送到模組B的下模具51上,以將樹脂材料P供給到下模具51的的腔室51C中。
<1-3-6. Resin material transfer mechanism>
As shown in FIG. 1 , the resin
<2.抑制樹脂成形品的厚度偏差> 接下來,說明在上述構成的模組C中的樹脂成形品的厚度的抑制方法。 <2. Suppression of thickness variation of resin molded products> Next, a method for suppressing the thickness of the resin molded product in the module C having the above configuration will be described.
近年來,半導體封裝(樹脂成形品的一例)的薄型化有進展,例如在市場中謀求厚度為0.38mm或0.43mm的產品。另一方面,依存於成形製程的品質,會有在1個樹脂成形品內產生厚度偏差的情況。在厚度薄的樹脂成形品中,少量的厚度偏差就會對樹脂成形品的品質帶來很大的影響。在1個樹脂成形品內的厚度偏差,是在1個樹脂成形品的面內的厚度偏差,是指在該個樹脂成形品內的複數個部分中的厚度偏差,而不是當對於複數個樹脂成形品的厚度進行比較時的厚度偏差。In recent years, thinning of semiconductor packages (an example of resin molded products) has progressed, and for example, products with a thickness of 0.38 mm or 0.43 mm have been sought in the market. On the other hand, thickness variation may occur within one resin molded product depending on the quality of the molding process. In a thin resin molded product, a small amount of thickness deviation will have a great influence on the quality of the resin molded product. The thickness deviation in one resin molded product is the thickness deviation in the plane of one resin molded product, and refers to the thickness deviation in a plurality of parts in the resin molded product, not when referring to a plurality of resins Thickness variation when comparing the thickness of molded products.
例如,在沒有將樹脂材料P毫無缺漏地供給到框狀構件72的凹部71中的情況下,這種問題變得顯著。亦即,若在凹部71的一部分的區域中有樹脂材料P不足的狀態下實行樹脂成形,則完成後的樹脂成形品的每個區域中的厚度會產生偏差。Such a problem becomes conspicuous, for example, in a case where the resin material P is not completely supplied into the
第8圖是表示在供給了樹脂材料P的狀態下的凹部71的一例的圖。如第8圖所示,凹部71包含區域T30和區域T40。在區域T30中充分地供給有樹脂材料P,但是在區域T40中樹脂材料P不足。在樹脂材料P不足的區域中,凹部71的底面露出。凹部71的底面的顏色,是比樹脂材料P更接近白色的顏色。FIG. 8 is a diagram showing an example of the
在此樹脂成形裝置100中,在實行樹脂成形前,由攝像部300來對已供給到框狀構件72中的樹脂材料P進行攝像。第二控制部150,解析由攝像部300產生的畫像資料,並基於解析結果來控制樹脂材料供給部8。在樹脂成形裝置100中,基於在凹部71中的樹脂材料P的供給狀態的解析結果來控制樹脂材料供給部8,所以可改善在凹部71中的樹脂材料P的供給狀態。其結果,依據樹脂成形裝置100,能夠抑制所製造的樹脂成形品在1個樹脂成形品內的厚度產生偏差的事態。以下,詳細說明樹脂成形裝置100的動作。In this
<3.樹脂成形裝置的動作例>
第9圖是表示在樹脂成形裝置100中的一部分的動作程序的流程圖。此流程圖所示的處理,在框狀構件72的凹部71位於樹脂材料供給部8的吐出口121的下方的狀態下實行。左側的流程圖所示的處理是由第一控制部14來實行,右側的流程圖所示的處理是由第二控制部150來實行。
<3. Operation example of resin molding device>
FIG. 9 is a flowchart showing a part of the operation program in the
參照第9圖的左側,第一控制部14控制樹脂材料供給部8朝向凹部71吐出樹脂材料P(步驟S100)。第一控制部14判定樹脂材料P的吐出是否完成了(步驟S110)。當判定為樹脂材料P的吐出尚未完成(步驟S110中的否),則第一控制部14會繼續實行樹脂材料P的吐出中必要的處理。例如,第一控制部14使移動台6移動,以將樹脂材料P毫無缺漏地供給到凹部71中。Referring to the left side of FIG. 9 , the
另一方面,當判定為樹脂材料P的吐出完成了(步驟S110中的是),則第一控制部14將指示由攝像部300進行攝像的信號(攝像指示信號)傳送到第二控制部150(步驟S120)。On the other hand, when it is determined that the discharge of the resin material P is completed (Yes in step S110), the
參照第9圖的右側,第二控制部150判定是否接收了來自第一控制部14的攝像指示信號(步驟S200)。當判定為尚未接收到攝像指示信號(步驟S200中的否),則第二控制部150待機直到接收到攝像指示信號。Referring to the right side of FIG. 9 , the
另一方面,當判定為接收了攝像指示信號(步驟S200中的是),則第二控制部150控制攝像部300自上方對凹部71內的樹脂材料P進行攝像並產生畫像資料(步驟S210)。第二控制部150,控制攝像部300將由攝像部300產生的畫像資料保存在HDD200中(步驟S220)。第二控制部150實行畫像資料的解析處理(步驟S230)。On the other hand, when it is determined that the imaging instruction signal is received (Yes in step S200), the
第10圖是表示在第9圖的步驟S230中實行的解析處理的程序的流程圖。參照第10圖,第二控制部150讀入在HDD200中保存的畫像資料(步驟S300)。第二控制部150對於讀入了的畫像資料實施灰階化處理和二值化處理(步驟S310)。Fig. 10 is a flowchart showing the procedure of the analysis process executed in step S230 of Fig. 9 . Referring to FIG. 10, the
在灰階化處理中,將畫像資料的各畫素分類為256階段[0(暗)-255(亮)]。例如,將白色的像素中分配有「255」,在黑色的像素中分配有「0」。在二值化處理中,將畫像資料的各畫素分類為「白」或「黑」。例如,將由灰階化處理所分配的值是在閥值X1(例如200)以上的畫素分類為「白」,將由灰階化處理所分配的值是未滿閥值X1的畫素分類為「黑」。In the grayscale processing, each pixel of the image data is classified into 256 levels [0 (dark)-255 (bright)]. For example, "255" is assigned to a white pixel, and "0" is assigned to a black pixel. In the binarization process, each pixel of the image data is classified as "white" or "black". For example, pixels whose values assigned by the grayscale processing are above the threshold X1 (for example, 200) are classified as "white", and pixels whose values assigned by the grayscale processing are less than the threshold X1 are classified as "black".
第11圖是用以說明在表示凹部71之畫像資料中包含的區域的圖。如第11圖所示,畫像資料包含區域T1-T18。FIG. 11 is a diagram for explaining the area included in the image data representing the
再次參照第10圖,第二控制部150,算出與在畫像資料所包含的各區域T1-T18對應的數值資料(步驟S320)。本實施形態中,此數值資料是在各區域中被分類為「白」的畫素的數目。亦即,在步驟S320中算出在各區域T1-T18中被分類為「白」的畫素的數目。被分類為「白」的畫素的數目越多,是指沒有將樹脂材料P毫無缺漏地供給而造成凹部71的表面露出的範圍廣。Referring to FIG. 10 again, the
第二控制部150,比較在步驟S320中算出的各數值資料與閥值X2(例如,10),以判斷在各區域T1-T18中是否發生問題(步驟S330)。第二控制部150,例如將數值資料超過閥值X2的區域判定為「不良(NG)」,將數值資料在閥值X2以下的區域判定為「良好(OK)」。亦即,在步驟S330中,判定在與各區域T1-T18對應的凹部71的各區域中是否有發生樹脂材料P的不足(「白」的數目是否比閥值X2更大)。第二控制部150,基於在步驟S330中的比較結果來產生解析資料(步驟S340)。The
第12圖是表示解析資料的一例的圖。如第12圖所示,解析資料D1包含在畫像資料的各區域中關於OK/NG的判定結果、及在畫像資料的各區域中被分類為「白」的畫素的數目。Fig. 12 is a diagram showing an example of analysis data. As shown in FIG. 12, the analysis data D1 includes the determination result of OK/NG in each area of the image data and the number of pixels classified as "white" in each area of the image data.
再次參照第9圖的右側,若在步驟S230中的畫面解析結束之後,則第二控制部150將解析資料D1傳送到第一控制部14(步驟S240)。Referring to the right side of FIG. 9 again, after the screen analysis in step S230 is completed, the
再次參照第9圖的左側,第一控制部14判定是否接收了來自第二控制部150的解析資料D1(步驟S130)。若判定為尚未接收到解析資料D1(步驟S130中的否),則第一控制部14待機直到接收到解析資料D1。Referring again to the left side of FIG. 9 , the
另一方面,當判定為接收了解析資料D1(步驟S130中的是),則第一控制部14基於解析資料D1來判定凹部71的樹脂材料P的狀態是否有問題(步驟S140)。第一控制部14,例如當區域T1-T18的任一區域被判定為「NG」時,則判定為凹部71的樹脂材料P的狀態有問題(NG);當區域T1-T18的任一區域都沒有被判定為「NG」時,則判定為凹部71的樹脂材料P的狀態沒有問題(OK)。On the other hand, when it is determined that the analysis data D1 has been received (Yes in step S130), the
若凹部71的樹脂材料P的狀態被判定為沒有問題(步驟S140中的OK),則第一控制部14控制各構成轉移到實行樹脂成形的步驟(步驟S150)。亦即,即使當要對於樹脂材料供給部8進行下次控制時,第一控制部14也不需要特別改變樹脂材料供給部8的動作狀態而維持樹脂材料供給部8的動作狀態。When the state of the resin material P of the
另一方面,若凹部71的樹脂材料P的狀態被判定為有問題(步驟S140中的NG),則第一控制部14實行被判定為NG情況的處理(步驟S160)。亦即,第一控制部14要改變當對於樹脂材料供給部8進行下次控制時的控制內容且記憶改變內容,並且使樹脂成形裝置100停止。例如,當要對於樹脂材料供給部8進行下次控制時,第一控制部14控制樹脂材料供給部8,以消除在被判定為樹脂材料P的不足的區域(T1-T18)中的樹脂材料P的不足。更詳細來說,第一控制部14,減少供給到沒有發生樹脂材料P的不足之區域中的樹脂材料P的量,並增加供給到發生了樹脂材料P的不足之區域中的樹脂材料P的量。藉此,將樹脂材料P毫無缺漏地供給到凹部71中。On the other hand, if the state of the resin material P of the
<4.特徵>
依據關於本實施形態的樹脂成形裝置100,能夠得到下述效果。
<4. Features>
According to the
在模組C中,如上述自移動台6的下方對於樹脂材料P進行光的照射,並利用攝像部300自上方對於該樹脂材料P進行攝像。因此,例如第13圖所示,來自導光板62之光,透過樹脂材料P沒有緊密積層而產生空隙的部位(不能夠形成為規定厚度之較薄的部位),並由攝像部300能夠拍攝到此部位。第14圖是拍攝到的畫像的一例,白色部位是光透過的部分(樹脂材料P的厚度大致為1.0mm)。亦即,認為在此白色部位中,樹脂材料P沒有緊密積層而在內部產生有空隙。In the module C, the resin material P is irradiated with light from the lower side of the moving table 6 as described above, and the resin material P is imaged from above by the
相對於此,例如當自移動台6的上方斜向地進行光的照射並利用攝像部300進行攝像時,得到如第15圖的畫像。第14圖和第15圖都對於相同的樹脂材料P進行攝像。在第15圖中看見樹脂材料的中央部分(虛線部位)為緊密積層,但是在第14圖中可知在此部位產生白色部分並在內部形成有間隙。例如,即便在顆粒狀的樹脂材料P的重疊較薄的部分,若自上方斜向地進行光的照射也會因為樹脂材料P的陰影而被看成樹脂材料P為緊密積層。因此,若藉由自上方的照射來實行攝像,則即便樹脂材料P沒有緊密積層,此也可能被誤認而被認為是緊密積層。相對於此,如本實施形態般自移動台6的下方進行光的照明,就能夠正確地檢測出樹脂材料P沒有緊密積層的部位,而能夠防止誤認。On the other hand, for example, when light is irradiated obliquely from above the
另外,具有下述優點:若自樹脂材料P的下側進行這樣的光的照射,則不僅容易進行以相機進行的檢查,也容易進行目視中的觀看。In addition, there is an advantage that when such light is irradiated from the lower side of the resin material P, not only inspection with a camera but also visual inspection becomes easy.
<5.變化例> 以上,說明本發明的一實施形態,但是本發明不限定於上述實施形態,只要不脫離其概要,也可進行各種改變。例如,可進行以下的改變。又,能夠適當地組合以下變化例的主旨。 <5. Variations> An embodiment of the present invention has been described above, but the present invention is not limited to the above-described embodiment, and various changes can be made without departing from the summary thereof. For example, the following changes can be made. In addition, the gist of the following modified examples can be appropriately combined.
(1)移動台6的構成沒有特別限定,只要能夠自樹脂材料P的下方進行光的照射,也可以是各種態樣。例如,上述實施形態中是使用導光板62來進行光的照射,但是只要在移動台6上配置具有透光性的材料並在其下側配置光源(照明部),也能夠自下方對於樹脂材料P進行光的照射。此時的光源的種類沒有特別限定,除了LED以外,例如也能夠使用有機EL(Electro-Luminescence,電致發光)、無機EL等。又,在移動台6上的具有透光性的材料的配置範圍,能夠對應於框狀構件72的凹部71的尺寸、或攝像範圍來適當地改變。(1) The configuration of the moving table 6 is not particularly limited, and as long as light can be irradiated from below the resin material P, various configurations are possible. For example, in the above-mentioned embodiment, the
又,也可以對應於所使用的樹脂材料的種類來改變來自光源的光的波長。亦即,樹脂材料的種類會對應地吸收光,所以也能夠配合樹脂材料的種類來選擇光的波長,以使光能夠充分地透過樹脂材料中的不緊密的部位。Also, the wavelength of light from the light source may be changed according to the type of resin material used. That is, the type of resin material absorbs light correspondingly, so the wavelength of light can also be selected according to the type of resin material, so that the light can fully pass through the loose parts of the resin material.
(2)上述實施形態中,使用顆粒狀的樹脂材料P,但即便是膏(paste)狀等的液狀樹脂也能夠適用本發明。即便是這種樹脂材料,光也會透過其中的沒有緊密積層的部位,所以能夠識別該部位。(2) In the above-mentioned embodiment, the granular resin material P is used, but the present invention can also be applied to a liquid resin such as a paste. Even with such a resin material, light passes through parts that are not tightly laminated, so that part can be identified.
(3)本發明的樹脂成形部相當於上述實施形態所示的模組B,但是模組B的構成是一個例子而可作成各種態樣。亦即,只要可使用供給到移動台6上的樹脂材料來實行樹脂成形,其構成沒有特別限定。(3) The resin molded part of the present invention corresponds to the die set B shown in the above embodiment, but the structure of the die set B is an example and various forms can be made. That is, the configuration is not particularly limited as long as resin molding can be performed using the resin material supplied to the moving table 6 .
(4)上述實施形態中,在完成樹脂材料P的吐出之後才由攝像部300實行攝像。然而,由攝像部300來實行攝像的時機不限定於此。例如,也可以是將攝像部300配置在樹脂材料供給部8的吐出口附近,且在由樹脂材料供給部8進行樹脂材料P的供給中,由攝像部300進行常時攝像來得到凹部71的動畫。此時,第二控制部150,也可以基於攝像中的動畫資料來即時地實行凹部71的樹脂材料P的狀態是否有問題的判定,並即時地改變樹脂材料供給部8的控制內容。(4) In the above-described embodiment, imaging is performed by the
(5)上述實施形態中,畫面解析是藉由灰階化處理和二值化處理來實行。然而,在畫面解析中使用的技術不限定於此。例如,也可以基於凹部71的3D畫像的凹凸計測的結果來檢測出在凹部71中的樹脂材料P不足的區域,也可以使用圖案匹配、統計手法或AI(Artificial Intelligence,人工智能)等來檢測出在凹部71中的樹脂材料P不足的區域。(5) In the above-mentioned embodiment, the screen analysis is performed by grayscale processing and binarization processing. However, the technique used for screen analysis is not limited to this. For example, the area where the resin material P in the
(6)上述實施形態中,若凹部71的樹脂材料P的狀態被判定為有問題(第9圖的步驟S140中的NG),則第一控制部14從下次開始,減少供給到沒有發生樹脂材料P的不足之區域中的樹脂材料P的量,並增加供給到發生了樹脂材料P的不足之區域中的樹脂材料P的量。然而,從下次開始的由第一控制部14進行的控制內容不限定於此。例如,也可以是第一控制部14參照解析資料D1,對於被分類為「白」的畫素的數目越少的區域越大幅減少供給的樹脂材料P的量,對於被分類為「白」的畫素的數目越多的區域越大幅增加供給的樹脂材料P的量。(6) In the above-mentioned embodiment, if the state of the resin material P of the
(7)上述實施形態中,樹脂成形裝置100的控制是由第一控制部14和第二控制部150來實行。然而,由第一控制部14和第二控制部150來實行的控制,也可以利用共通的控制部來構成,又例如也可以由1台電腦來實現,也可以由3台以上的電腦來實現。(7) In the above embodiment, the control of the
(8)上述實施形態中,樹脂成形裝置100包含HDD200。然而,樹脂成形裝置100也不一定要包含HDD200。HDD200也可存在於雲端伺服器上。此時,第二控制部150經由未圖示的通信部來存取雲端伺服器。(8) In the above embodiment, the
1:基板供給部
2:基板收納部
3:基板載置部
4:基板搬送機構
5:壓縮成形部
6:移動台(工作台)
7:樹脂材料收容部
8:樹脂材料供給部
9:脫模薄膜供給部
11:儲藏部
12:搬送路徑
13:振動部
16:計量部
14:第一控制部
51:下模具
51C:腔室
52:上模具
53:模具緊固機構
61:凹部
62:導光板
63:LED模組(照明部)
71:凹部
72:框狀構件
73:脫模薄膜
90:樹脂材料搬送機構
91:滾筒
92:捲出部
93:切斷部
100:樹脂成形裝置
121:吐出口
150:第二控制部
200:HDD(硬碟驅動器)
300:攝像部
A:基板供給和收納模組
B:樹脂成形模組
C:樹脂材料供給模組
P:樹脂材料
T1-T18,T30,T40:區域
W:封裝完成基板
1: Substrate supply part
2: Substrate storage part
3: Substrate loading part
4: Substrate transfer mechanism
5: Compression molding department
6: Mobile platform (workbench)
7: Resin Material Storage Department
8: Resin material supply department
9: Release film supply part
11: storage department
12: Transport path
13: Vibration Department
16: Metrology department
14: First Control Division
51:
第1圖是示意地表示樹脂成形裝置的平面圖。 第2圖是移動台的平面圖。 第3圖是移動台的剖面圖。 第4圖是說明脫模薄膜供給部的動作的圖。 第5圖是說明樹脂材料收容部的剖面圖。 第6圖是示意地表示樹脂材料供給部的剖面圖。 第7圖是用以說明由攝像部得到的攝像狀態的圖。 第8圖是表示在供給了樹脂材料的狀態下的凹部的一例的圖。 第9圖是表示在樹脂成形裝置中的一部分的動作程序的流程圖。 第10圖是表示在第9圖的步驟S230中實行的解析處理的程序的流程圖。 第11圖是用以說明在表示凹部之畫像資料中包含的區域的圖。 第12圖是表示解析資料的一例的圖。 第13圖是說明對於樹脂材料進行光的照射的剖面圖。 第14圖是在適用了本發明的樹脂成形裝置中進行攝像而得到的樹脂材料的照片。 第15圖是在先前的樹脂成形裝置中進行攝像而得到的樹脂材料的照片。 Fig. 1 is a plan view schematically showing a resin molding apparatus. Fig. 2 is a plan view of the mobile station. Fig. 3 is a sectional view of the mobile station. Fig. 4 is a diagram illustrating the operation of the release film supply unit. Fig. 5 is a cross-sectional view illustrating a resin material container. Fig. 6 is a cross-sectional view schematically showing a resin material supply unit. Fig. 7 is a diagram for explaining an imaging state obtained by an imaging unit. Fig. 8 is a diagram showing an example of a concave portion in a state where a resin material is supplied. Fig. 9 is a flowchart showing a part of the operation program in the resin molding device. Fig. 10 is a flowchart showing the procedure of the analysis process executed in step S230 of Fig. 9 . Fig. 11 is a diagram for explaining the regions included in the image data representing the concave portion. Fig. 12 is a diagram showing an example of analysis data. Fig. 13 is a cross-sectional view illustrating light irradiation on a resin material. Fig. 14 is a photograph of a resin material obtained by imaging in a resin molding apparatus to which the present invention is applied. Fig. 15 is a photograph of a resin material obtained by imaging in a conventional resin molding apparatus.
國內寄存資訊 (請依寄存機構、日期、號碼順序註記) 無 Domestic deposit information (please note in order of depositor, date, and number) none
國外寄存資訊 (請依寄存國家、機構、日期、號碼順序註記) 無 Overseas storage information (please note in order of storage country, organization, date, and number) none
1:基板供給部 1: Substrate supply part
2:基板收納部 2: Substrate storage part
3:基板載置部 3: Substrate loading part
4:基板搬送機構 4: Substrate transfer mechanism
5:壓縮成形部 5: Compression molding department
6:移動台(工作台) 6: Mobile platform (workbench)
7:樹脂材料收容部 7: Resin Material Storage Department
8:樹脂材料供給部 8: Resin material supply department
14:第一控制部 14: First Control Division
51:下模具 51: Lower mold
52:上模具 52: upper mold
53:模具緊固機構 53: Mold fastening mechanism
53C:腔室 53C: chamber
71:凹部 71: Concave
90:樹脂材料搬送機構 90: Resin material transfer mechanism
100:樹脂成形裝置 100: Resin molding device
150:第二控制部 150:Second control department
200:HDD(硬碟驅動器) 200: HDD (hard disk drive)
300:攝像部 300: Camera Department
A:基板供給和收納模組 A: Substrate supply and storage module
B:樹脂成形模組 B: Resin molding module
C:樹脂材料供給模組 C: Resin material supply module
P:樹脂材料 P: resin material
T:區域 T: area
W:封裝完成基板 W: Encapsulation completed substrate
Claims (9)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021069371A JP7482824B2 (en) | 2021-04-15 | Resin molding device and method for manufacturing resin molded product | |
JP2021-069371 | 2021-04-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW202241688A true TW202241688A (en) | 2022-11-01 |
Family
ID=83639548
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW111114146A TW202241688A (en) | 2021-04-15 | 2022-04-14 | Resin-molding device and method for producing resin molded article |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR20230128088A (en) |
CN (1) | CN116981554A (en) |
TW (1) | TW202241688A (en) |
WO (1) | WO2022219851A1 (en) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6218891U (en) | 1985-07-16 | 1987-02-04 | ||
TWI610782B (en) * | 2012-01-30 | 2018-01-11 | 旭硝子股份有限公司 | Release film and method of manufacturing semiconductor device using same |
JP2017209157A (en) * | 2016-05-23 | 2017-11-30 | 富士フイルム株式会社 | Mold, mold manufacturing method, and patterned sheet manufacturing method |
JP6923503B2 (en) | 2018-11-27 | 2021-08-18 | Towa株式会社 | Resin molding equipment and manufacturing method of resin molded products |
CN110027217B (en) * | 2019-05-06 | 2023-12-26 | 南京铖联激光科技有限公司 | Active monitoring type laser 3D printing device and monitoring method |
-
2021
- 2021-12-24 KR KR1020237026114A patent/KR20230128088A/en unknown
- 2021-12-24 WO PCT/JP2021/048395 patent/WO2022219851A1/en active Application Filing
- 2021-12-24 CN CN202180095712.4A patent/CN116981554A/en active Pending
-
2022
- 2022-04-14 TW TW111114146A patent/TW202241688A/en unknown
Also Published As
Publication number | Publication date |
---|---|
JP2022164095A (en) | 2022-10-27 |
KR20230128088A (en) | 2023-09-01 |
CN116981554A (en) | 2023-10-31 |
WO2022219851A1 (en) | 2022-10-20 |
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