TW202233898A - Surface-treated copper foil, copper-cladded laminate plate, and printed wiring board - Google Patents

Surface-treated copper foil, copper-cladded laminate plate, and printed wiring board Download PDF

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TW202233898A
TW202233898A TW110147726A TW110147726A TW202233898A TW 202233898 A TW202233898 A TW 202233898A TW 110147726 A TW110147726 A TW 110147726A TW 110147726 A TW110147726 A TW 110147726A TW 202233898 A TW202233898 A TW 202233898A
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copper foil
treated
layer
treatment layer
treated copper
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TWI806296B (en
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石野裕士
坂東慎介
宮本宣明
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日商Jx金屬股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/12Electroplating: Baths therefor from solutions of nickel or cobalt
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/01Layered products comprising a layer of metal all layers being exclusively metallic
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/22Electroplating: Baths therefor from solutions of zinc
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • C25D5/12Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/16Electroplating with layers of varying thickness
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/06Wires; Strips; Foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/03Metal processing
    • H05K2203/0369Etching selective parts of a metal substrate through part of its thickness, e.g. using etch resist

Abstract

The purpose of the present invention is to provide a surface-treated copper foil with which it is possible to reduce peeling from a substrate and to form a fine-pitched circuit pattern. This surface-treated copper foil has a copper coil, a first surface treatment layer formed on one surface of the copper coil, and a second surface treatment layer formed on the other surface of the copper coil. The ratio of the amount of Ni adhering to the first surface treatment layer relative to the amount of Ni adhering to the second surface treatment layer is 0.01-2.0. The surface-treated copper foil has a tensile strength of 235-290 MPa. The copper coil is made of at least 99.0 mass% of Cu, the balance being unavoidable impurities.

Description

表面處理銅箔、覆銅積層板及印刷配線板Surface treated copper foil, copper clad laminate and printed wiring board

本發明係關於一種表面處理銅箔、覆銅積層板及印刷配線板。The present invention relates to a surface-treated copper foil, a copper-clad laminate and a printed wiring board.

近年來,隨著電子機器之小型化、高性能化等需求之增加,而對搭載於電子機器之印刷配線板要求電路圖案(亦稱為「導體圖案」)之細間距化(微細化)。In recent years, with increasing demands for miniaturization and higher performance of electronic equipment, fine pitch (miniaturization) of circuit patterns (also referred to as "conductor patterns") is required for printed wiring boards mounted on electronic equipment.

針對上述細間距化之要求,例如,於專利文獻1,揭示有「一種表面處理銅箔,其具有銅箔、形成於上述銅箔之一面的第1表面處理層及形成於上述銅箔之另一面的第2表面處理層,上述第1表面處理層之Ni附著量相對於上述第2表面處理層之Ni附著量的比為0.01~2」,並記載有藉由該表面處理銅箔,能夠形成適於細間距化之高蝕刻因子的電路圖案。 [先前技術文獻] [專利文獻] In response to the requirement of the above-mentioned fine pitch, for example, Patent Document 1 discloses "a surface-treated copper foil comprising a copper foil, a first surface-treated layer formed on one side of the copper foil, and another surface formed on the copper foil. For the second surface treatment layer on one side, the ratio of the Ni adhesion amount of the first surface treatment layer to the Ni adhesion amount of the second surface treatment layer is 0.01 to 2", and it is described that by the surface treatment copper foil, it is possible to A circuit pattern with a high etch factor suitable for fine pitching is formed. [Prior Art Literature] [Patent Literature]

[專利文獻1]日本特開2019-81913號公報[Patent Document 1] Japanese Patent Laid-Open No. 2019-81913

且說,於如上述般電路圖案已細間距化之印刷配線板中,由於該電路圖案為細間距,故可知所形成之電路與細間距化前之電路相比會變得容易自基材剝離。尤其是具有可撓性之撓性印刷配線板(以下,亦稱為「FPC」),由於在其製造時及使用時等會伴有印刷配線板之變形,故會變得更加容易剝離。因此,對於印刷配線板,需要電路圖案之細間距化之同時,亦需要提升耐剝離性。In addition, in the printed wiring board with the fine pitch of the circuit pattern as mentioned above, since the circuit pattern has a fine pitch, it turns out that the circuit formed is easier to peel from the base material than the circuit before the fine pitch. In particular, a flexible printed wiring board (hereinafter, also referred to as "FPC") having flexibility is more likely to be peeled off due to the deformation of the printed wiring board during its manufacture and use. Therefore, in the printed wiring board, it is necessary to improve the peeling resistance as well as the fine pitch of the circuit pattern.

因此,本發明係為了解決如上述之問題而完成者,目的在於提供一種能夠減少自基板之剝離並形成細間距化之電路圖案的表面處理銅箔及覆銅積層板。 又,本發明之目的在於提供一種減少自基板之剝離且具有細間距化之電路圖案的印刷配線板。 Therefore, this invention was made in order to solve the above-mentioned problem, and an object is to provide the surface-treated copper foil and copper clad laminated board which can reduce peeling from a board|substrate and can form the circuit pattern of the fine pitch. Moreover, the objective of this invention is to reduce the peeling from a board|substrate and to provide the printed wiring board which has a circuit pattern with a fine pitch.

本發明人等為了解決上述問題,經進行潛心研究後,結果發現於電路圖案已細間距化之印刷配線板中,藉由提高銅箔之強度,可減少所形成之電路自基材之剝離,從而完成本發明。 即,本發明如下。 In order to solve the above problems, the inventors of the present invention have conducted intensive research and found that in a printed wiring board with a fine-pitch circuit pattern, by increasing the strength of the copper foil, the peeling of the formed circuit from the substrate can be reduced. Thus, the present invention has been completed. That is, the present invention is as follows.

本發明之表面處理銅箔於一實施態樣中,具有銅箔、形成於上述銅箔之一面的第1表面處理層及形成於上述銅箔之另一面的第2表面處理層;上述第1表面處理層之Ni附著量相對於上述第2表面處理層之Ni附著量的比為0.01~2.0,上述表面處理銅箔之拉伸強度為235~290 MPa, 上述銅箔由99.0質量%以上之Cu及其餘不可避免之雜質所構成。 In one embodiment, the surface-treated copper foil of the present invention includes a copper foil, a first surface-treated layer formed on one side of the copper foil, and a second surface-treated layer formed on the other side of the copper foil; the first The ratio of the Ni adhesion amount of the surface treatment layer to the Ni adhesion amount of the second surface treatment layer is 0.01 to 2.0, the tensile strength of the surface treatment copper foil is 235 to 290 MPa, The said copper foil consists of 99.0 mass % or more of Cu and other unavoidable impurities.

本發明之覆銅積層板於一實施態樣中,具備上述表面處理銅箔及接著於上述表面處理銅箔之上述第1表面處理層的基材。In one embodiment, the copper-clad laminate of the present invention includes the above-mentioned surface-treated copper foil and a base material of the above-mentioned first surface-treated layer followed by the above-mentioned surface-treated copper foil.

本發明之印刷配線板於一實施態樣中,具備對上述覆銅積層板之上述表面處理銅箔進行蝕刻而形成之電路圖案。The printed wiring board of this invention is provided with the circuit pattern formed by etching the said surface-treated copper foil of the said copper clad laminated board in one form.

若根據本發明,可提供一種能夠減少自基板之剝離並形成細間距化之電路圖案的表面處理銅箔及覆銅積層板。 又,若根據本發明,可提供一種減少自基板之剝離且具有細間距化之電路圖案的印刷配線板。 According to the present invention, it is possible to provide a surface-treated copper foil and a copper-clad laminate capable of reducing peeling from a substrate and forming a fine-pitch circuit pattern. Moreover, according to this invention, the peeling from a board|substrate is reduced, and the printed wiring board which has a fine-pitch circuit pattern can be provided.

以下,對本發明之實施形態(以下,稱為「本實施形態」)詳細地進行說明,但本發明並不限定於本實施形態。 <表面處理銅箔> 圖1係表示已將本實施形態之表面處理銅箔接著於基材之狀態的剖視圖(覆銅積層板10之剖視圖)。 本實施形態之表面處理銅箔1具有銅箔2、形成於銅箔2之一面的第1表面處理層3及形成於銅箔2之另一面的第2表面處理層4。又,覆銅積層板10具有表面處理銅箔1及接著於表面處理銅箔1之第1表面處理層3的基材11。 本實施形態之表面處理銅箔1可用作搭載於電子機器等之印刷配線板,尤其是撓性印刷配線板用之銅箔,並無特別限定。 Hereinafter, an embodiment of the present invention (hereinafter, referred to as "the present embodiment") will be described in detail, but the present invention is not limited to this embodiment. <Surface treated copper foil> FIG. 1 is a cross-sectional view (a cross-sectional view of a copper-clad laminate 10 ) showing a state in which the surface-treated copper foil of the present embodiment has been bonded to a substrate. The surface-treated copper foil 1 of the present embodiment includes a copper foil 2 , a first surface-treated layer 3 formed on one surface of the copper foil 2 , and a second surface-treated layer 4 formed on the other surface of the copper foil 2 . Moreover, the copper clad laminated board 10 has the base material 11 of the surface-treated copper foil 1 and the 1st surface-treated layer 3 next to the surface-treated copper foil 1. The surface-treated copper foil 1 of the present embodiment can be used as a printed wiring board mounted on an electronic device or the like, especially a copper foil for a flexible printed wiring board, and is not particularly limited.

第1表面處理層3及第2表面處理層4至少含有Ni作為附著元素。於表面處理銅箔1中,第1表面處理層3之Ni附著量相對於第2表面處理層4之Ni附著量的比為0.01~2.0,較佳為0.8~1.5。由於Ni係難以溶解於蝕刻液之成分,故藉由使Ni附著量之比為上述範圍內,可於對覆銅積層板10進行蝕刻時,促進成為電路圖案底側之第1表面處理層3的溶解,且減緩成為電路圖案頂側之第2表面處理層4的溶解。因此,能夠獲得頂部寬與底部寬之差小,蝕刻因子高的電路圖案。The first surface treatment layer 3 and the second surface treatment layer 4 contain at least Ni as an adhesion element. In the surface-treated copper foil 1, the ratio of the Ni adhesion amount of the 1st surface treatment layer 3 with respect to the Ni adhesion amount of the 2nd surface treatment layer 4 is 0.01-2.0, Preferably it is 0.8-1.5. Since Ni is a component that is difficult to dissolve in the etching solution, by setting the ratio of the Ni adhesion amount within the above-mentioned range, when the copper clad laminate 10 is etched, the formation of the first surface treatment layer 3 on the bottom side of the circuit pattern can be promoted. It dissolves and slows down the dissolution of the second surface treatment layer 4 that becomes the top side of the circuit pattern. Therefore, a circuit pattern with a small difference between the top width and the bottom width and a high etching factor can be obtained.

關於第1表面處理層3之Ni附著量,若Ni附著量之比為上述範圍內,則無特別限定,較佳為20~200 μg/dm 2,更佳為20~100 μg/dm 2。藉由使第1表面處理層3之Ni附著量為上述範圍內,可穩定地提高電路圖案之蝕刻因子。 The Ni deposition amount of the first surface treatment layer 3 is not particularly limited as long as the Ni deposition amount ratio is within the above range, but is preferably 20 to 200 μg/dm 2 , more preferably 20 to 100 μg/dm 2 . The etching factor of a circuit pattern can be stably improved by making the Ni adhesion amount of the 1st surface treatment layer 3 into the said range.

第1表面處理層3除Ni以外,還可含有Zn、Co、Cr等元素作為附著元素。關於第1表面處理層3之Zn附著量,由於取決於第1表面處理層3之種類,故無特別限定,但於第1表面處理層3含有Zn之情形時,較佳為20~1000 μg/dm 2,更佳為400~500 μg/dm 2。藉由使第1表面處理層3之Zn附著量為上述範圍內,可穩定地提高電路圖案之蝕刻因子。 The first surface-treated layer 3 may contain elements such as Zn, Co, and Cr as adhesion elements in addition to Ni. The Zn adhesion amount of the first surface treatment layer 3 is not particularly limited because it depends on the type of the first surface treatment layer 3, but when the first surface treatment layer 3 contains Zn, it is preferably 20 to 1000 μg /dm 2 , more preferably 400 to 500 μg/dm 2 . By making the Zn adhesion amount of the 1st surface treatment layer 3 into the said range, the etching factor of a circuit pattern can be raised stably.

關於第1表面處理層3之Co附著量,由於取決於第1表面處理層3之種類,故無特別限定,較佳為1500 μg/dm 2以下,更佳為0.1~500 μg/dm 2,進而較佳為0.5~100 μg/dm 2。藉由使第1表面處理層3之Co附著量為上述範圍內,可穩定地提高電路圖案之蝕刻因子。又,由於Co係磁性金屬,故藉由將第1表面處理層3之Co附著量控制在尤其是100 μg/dm 2以下,較佳為0.5~100 μg/dm 2,可獲得能夠製作高頻特性優異之印刷配線板的表面處理銅箔1。 The Co adhesion amount of the first surface treatment layer 3 is not particularly limited since it depends on the type of the first surface treatment layer 3, but is preferably 1500 μg/dm 2 or less, more preferably 0.1 to 500 μg/dm 2 , More preferably, it is 0.5 to 100 μg/dm 2 . The etching factor of a circuit pattern can be improved stably by making the Co adhesion amount of the 1st surface treatment layer 3 into the said range. In addition, since Co is a magnetic metal, by controlling the adhesion amount of Co in the first surface treatment layer 3 to be 100 μg/dm 2 or less, preferably 0.5 to 100 μg/dm 2 , it is possible to obtain a high frequency Surface-treated copper foil 1 for printed wiring boards with excellent properties.

關於第1表面處理層3之Cr附著量,由於取決於第1表面處理層3之種類,故無特別限定,較佳為500 μg/dm 2以下,更佳為0.5~300 μg/dm 2,進而較佳為1~100 μg/dm 2。藉由使第1表面處理層3之Cr附著量為上述範圍內,可穩定地提高電路圖案之蝕刻因子。 The Cr adhesion amount of the first surface treatment layer 3 is not particularly limited since it depends on the type of the first surface treatment layer 3, but is preferably 500 μg/dm 2 or less, more preferably 0.5 to 300 μg/dm 2 , More preferably, it is 1 to 100 μg/dm 2 . By making the Cr adhesion amount of the 1st surface treatment layer 3 into the said range, the etching factor of a circuit pattern can be raised stably.

第1表面處理層3之Rzjis並無特別限定,較佳為0.3~1.5,更佳為0.5~0.8。藉由使第1表面處理層3之Rzjis為上述範圍內,可提升與基材11之接著性。此處,於本說明書中,「Rzjis」係指JIS B 0601:2001所規定之十點平均粗糙度。The Rzjis of the first surface treatment layer 3 is not particularly limited, but is preferably 0.3 to 1.5, more preferably 0.5 to 0.8. By making the Rzjis of the 1st surface treatment layer 3 into the said range, the adhesiveness with the base material 11 can be improved. Here, in this specification, "Rzjis" means the ten-point average roughness specified in JIS B 0601:2001.

關於第1表面處理層3之種類,若Ni附著量之比為上述範圍內,則無特別限定,可使用該技術領域中周知之各種表面處理層。作為表面處理層之例,可舉粗化處理層、耐熱層、防銹層、鉻酸鹽處理層、矽烷偶合處理層等。該等層可使用單獨一種,或將2種以上組合而使用。於其中,就與基材11之接著性的觀點,第1表面處理層3較佳具有粗化處理層。此處,於本說明書中,「粗化處理層」係指藉由粗化處理而形成之層,包含粗化粒子層。又,於粗化處理,有時會進行通常之鍍銅等作為前處理,或為了防止粗化粒子脫落而進行通常之鍍銅等作為完工處理,本說明書中之「粗化處理層」包含藉由該等前處理及完工處理而形成之層。The type of the first surface treatment layer 3 is not particularly limited as long as the ratio of the Ni adhesion amount is within the above range, and various surface treatment layers known in the technical field can be used. As an example of the surface treatment layer, a roughening treatment layer, a heat-resistant layer, a rust preventive layer, a chromate treatment layer, a silane coupling treatment layer, etc. are mentioned. These layers may be used alone or in combination of two or more. Among them, it is preferable that the first surface treatment layer 3 has a roughening treatment layer from the viewpoint of the adhesiveness with the base material 11 . Here, in this specification, the "roughening treatment layer" refers to a layer formed by a roughening treatment, and includes a roughened particle layer. In addition, in the roughening treatment, ordinary copper plating or the like may be performed as a pretreatment, or in order to prevent the peeling of the roughened particles, ordinary copper plating or the like may be performed as a finishing treatment, and the "roughening treatment layer" in this specification includes Layers formed from these pretreatments and finishing treatments.

作為粗化粒子,並無特別限定,可由選自由銅、鎳、鈷、磷、鎢、砷、鉬、鉻及鋅所組成之群中之任一單質或含有其中任1種以上之合金形成。又,形成粗化粒子後,亦可進而進行用鎳、鈷、銅、鋅之單質或合金等設置二次粒子或三次粒子的粗化處理。The roughened particles are not particularly limited, and can be formed of any element selected from the group consisting of copper, nickel, cobalt, phosphorus, tungsten, arsenic, molybdenum, chromium, and zinc, or an alloy containing any one or more of them. In addition, after forming the roughened particles, a roughening treatment in which secondary particles or tertiary particles are provided with a simple substance or an alloy of nickel, cobalt, copper, and zinc may be further performed.

作為耐熱層及防銹層,並無特別限定,可由該技術領域中周知之材料形成。再者,由於耐熱層有時亦作為防銹層發揮功能,故亦可形成具有耐熱層及防銹層兩者之功能的1個層作為耐熱層及防銹層。作為耐熱層及/或防銹層,可為含有選自鎳、鋅、錫、鈷、鉬、銅、鎢、磷、砷、鉻、釩、鈦、鋁、金、銀、鉑系元素、鐵、鉭之群中1種以上元素(亦可為金屬、合金、氧化物、氮化物、硫化物等任一形態)之層。作為耐熱層及/或防銹層之例,可舉含有鎳-鋅合金之層。It does not specifically limit as a heat-resistant layer and a rust-proof layer, It can be formed from the material well-known in this technical field. Furthermore, since the heat-resistant layer may also function as a rust-proof layer, a single layer having both functions of the heat-resistant layer and the rust-proof layer may be formed as the heat-resistant layer and the rust-proof layer. The heat-resistant layer and/or the anti-rust layer may contain elements selected from the group consisting of nickel, zinc, tin, cobalt, molybdenum, copper, tungsten, phosphorus, arsenic, chromium, vanadium, titanium, aluminum, gold, silver, platinum group elements, iron , A layer of one or more elements in the tantalum group (which can also be in any form such as metal, alloy, oxide, nitride, sulfide, etc.). As an example of a heat-resistant layer and/or a rust-proof layer, the layer containing a nickel-zinc alloy is mentioned.

作為鉻酸鹽處理層,並無特別限定,可由該技術領域中周知之材料形成。此處,於本說明書中,「鉻酸鹽處理層」係指使用含有鉻酸酐、鉻酸、重鉻酸、鉻酸鹽或重鉻酸鹽之液體而形成之層。鉻酸鹽處理層可為含有鈷、鐵、鎳、鉬、鋅、鉭、銅、鋁、磷、鎢、錫、砷、鈦等元素(亦可為金屬、合金、氧化物、氮化物、硫化物等任一形態)之層。作為鉻酸鹽處理層之例,可舉經鉻酸酐或重鉻酸鉀水溶液處理之鉻酸鹽處理層、經含有鉻酸酐或重鉻酸鉀及鋅之處理液處理之鉻酸鹽處理層等。It does not specifically limit as a chromate treatment layer, It can be formed from the material well-known in this technical field. Here, in this specification, the "chromate treatment layer" refers to a layer formed using a liquid containing chromic anhydride, chromic acid, dichromic acid, chromate or dichromate. The chromate treatment layer may contain elements such as cobalt, iron, nickel, molybdenum, zinc, tantalum, copper, aluminum, phosphorus, tungsten, tin, arsenic, titanium, etc. any form of things, etc.) layer. Examples of the chromate-treated layer include a chromate-treated layer treated with an aqueous solution of chromic anhydride or potassium dichromate, a chromate-treated layer treated with a treatment solution containing chromic anhydride or potassium dichromate and zinc, and the like. .

作為矽烷偶合處理層,並無特別限定,可由該技術領域中周知之材料形成。此處,於本說明書中,「矽烷偶合處理層」係指由矽烷偶合劑形成之層。作為矽烷偶合劑,並無特別限定,可使用該技術領域中周知者。作為矽烷偶合劑之例,可舉胺基系矽烷偶合劑、環氧系矽烷偶合劑、巰基系矽烷偶合劑等。該等可使用單獨一種,或將2種以上組合而使用。It does not specifically limit as a silane coupling process layer, It can be formed from the material well-known in this technical field. Here, in this specification, the "silane coupling treatment layer" refers to a layer formed of a silane coupling agent. It does not specifically limit as a silane coupling agent, A well-known thing in this technical field can be used. As an example of a silane coupling agent, an amino-type silane coupling agent, an epoxy-type silane coupling agent, a mercapto-type silane coupling agent, etc. are mentioned. These can be used alone or in combination of two or more.

關於第2表面處理層4之種類,若Ni附著量之比為上述範圍內,則無特別限定,可與第1表面處理層3同樣地使用該技術領域中周知之各種表面處理層。又,第2表面處理層4之種類與第1表面處理層3可相同,亦可不同。The type of the second surface treatment layer 4 is not particularly limited as long as the ratio of the Ni adhesion amount is within the above range, and various surface treatment layers known in the technical field can be used similarly to the first surface treatment layer 3 . In addition, the type of the second surface treatment layer 4 and the first surface treatment layer 3 may be the same or different.

關於第2表面處理層4之Ni附著量,若Ni附著量之比為上述之範圍內,則無特別限定,較佳為0.1~500 μg/dm 2,更佳為0.5~200 μg/dm 2,進而較佳為1.0~100 μg/dm 2。藉由使第2表面處理層4之Ni附著量為上述範圍內,可穩定地提高電路圖案之蝕刻因子。 The Ni deposition amount of the second surface treatment layer 4 is not particularly limited as long as the ratio of the Ni deposition amount is within the above-mentioned range, but is preferably 0.1 to 500 μg/dm 2 , more preferably 0.5 to 200 μg/dm 2 , and more preferably 1.0 to 100 μg/dm 2 . By making the Ni adhesion amount of the second surface treatment layer 4 within the above-mentioned range, the etching factor of the circuit pattern can be stably improved.

第2表面處理層4除Ni以外,還可含有Zn、Cr等元素作為附著元素。關於第2表面處理層4之Zn附著量,由於取決於第2表面處理層4之種類,故無特別限定,但於第2表面處理層4含有Zn之情形時,較佳為10~1000 μg/dm 2,更佳為50~500 μg/dm 2,進而較佳為100~300 μg/dm 2。藉由使第2表面處理層4之Zn附著量為上述範圍內,可穩定地提高電路圖案之蝕刻因子。 The second surface treatment layer 4 may contain elements such as Zn and Cr as adhesion elements in addition to Ni. The Zn adhesion amount of the second surface treatment layer 4 is not particularly limited since it depends on the type of the second surface treatment layer 4, but when the second surface treatment layer 4 contains Zn, it is preferably 10 to 1000 μg /dm 2 , more preferably 50 to 500 μg/dm 2 , still more preferably 100 to 300 μg/dm 2 . By making the Zn adhesion amount of the 2nd surface treatment layer 4 into the said range, the etching factor of a circuit pattern can be improved stably.

關於第2表面處理層4之Cr附著量,由於取決於第2表面處理層4之種類,故無特別限定,但於第2表面處理層4含有Cr之情形時,較佳超過0 μg/dm 2但在500 μg/dm 2以下,更佳為0.1~100 μg/dm 2,進而較佳為1~50 μg/dm 2。藉由使第2表面處理層4之Cr附著量為上述範圍內,可穩定地提高電路圖案之蝕刻因子。 The adhesion amount of Cr in the second surface treatment layer 4 is not particularly limited since it depends on the type of the second surface treatment layer 4, but when the second surface treatment layer 4 contains Cr, it is preferably more than 0 μg/dm 2 However, it is 500 μg/dm 2 or less, more preferably 0.1 to 100 μg/dm 2 , still more preferably 1 to 50 μg/dm 2 . By making the Cr adhesion amount of the second surface treatment layer 4 within the above-mentioned range, the etching factor of the circuit pattern can be stably improved.

銅箔2由99.0質量%以上之Cu及其餘不可避免之雜質所構成,製成表面處理銅箔時之拉伸強度為235~290 MPa。藉由銅箔2具有此種構成,可於電路圖案已細間距化之印刷配線板中,減少所形成之電路自基材的剝離。更具體而言,於提升電路圖案之耐久性(進行防剝離)的情形時,一般為調整鍍覆組成或表面粗糙度來探討與樹脂之接著性提升。然而,於本實施形態中,藉由使銅箔2為如上述之組成,且使製成表面處理銅箔時之拉伸強度為特定範圍,即便是細間距化之印刷配線板,亦可減少電路圖案之剝離。The copper foil 2 is composed of 99.0 mass % or more of Cu and other unavoidable impurities, and the tensile strength of the surface-treated copper foil is 235 to 290 MPa. When the copper foil 2 has such a configuration, in the printed wiring board in which the circuit pattern has been finely pitched, peeling of the formed circuit from the base material can be reduced. More specifically, in the case of improving the durability of the circuit pattern (preventing peeling), generally, the improvement of the adhesion to the resin is investigated by adjusting the plating composition or the surface roughness. However, in this embodiment, by setting the copper foil 2 to have the above-mentioned composition, and making the tensile strength of the surface-treated copper foil within a specific range, even in a printed wiring board with finer pitch, it is possible to reduce the Stripping of circuit patterns.

更詳而言,於本實施形態中,作為提升銅箔(進而為表面處理銅箔)之拉伸強度的方法,並無限定,可舉使銅箔再結晶後之晶粒微細化的方法。 於如銅箔2般之純銅系之組成的情形時,晶粒難以微細化,但在冷軋時之初期進行再結晶退火,之後不進行再結晶退火,藉此利用冷軋大量導入加工應變而產生動態再結晶,而可實現晶粒之微細化。 More specifically, in the present embodiment, the method of increasing the tensile strength of the copper foil (furthermore, the surface-treated copper foil) is not limited, and the method of refining the crystal grains after recrystallization of the copper foil is exemplified. In the case of a pure copper-based composition such as copper foil 2, it is difficult to refine the crystal grains, but recrystallization annealing is performed at the initial stage of cold rolling, and recrystallization annealing is not performed after that, so that a large amount of processing strain is introduced by cold rolling. Dynamic recrystallization occurs, and grain refinement can be achieved.

又,相對於上述組成,若銅箔含有總計0.002~0.825質量%之選自P、Ti、Sn、Ni、Be、Zn、In及Mg之群中之1種以上添加元素作為使晶粒微細化的添加元素,則可更容易地實現晶粒之微細化。由於該等添加元素會於冷軋時增加差排密度,故可更容易地實現晶粒之微細化。Moreover, with respect to the above-mentioned composition, if the copper foil contains 0.002 to 0.825 mass % in total of one or more additional elements selected from the group consisting of P, Ti, Sn, Ni, Be, Zn, In, and Mg as a refinement of crystal grains The addition of elements makes it easier to realize the miniaturization of the crystal grains. Since these additive elements increase the dislocation density during cold rolling, the grain refinement can be more easily achieved.

再者,作為使銅箔再結晶後之晶粒微細化的方法,除加入添加元素之方法以外,還可舉進行疊軋之方法、利用電解銅箔進行電沉積時使用脈衝電流之方法或利用電解銅箔適量添加硫脲或膠等於電解液之方法。Furthermore, as a method for refining the crystal grains after recrystallization of the copper foil, in addition to the method of adding an additive element, a method of lamination, a method of using a pulse current for electrodeposition with an electrolytic copper foil, or a method using The method of adding an appropriate amount of thiourea or glue to the electrolytic copper foil equal to the electrolyte.

本實施形態之銅箔,亦可為由符合JIS-H3100(C1100)標準之精銅(TPC)或JIS-H3100(C1011)之無氧銅(OFC)所構成的組成。又,亦可為使上述TPC或OFC含有上述添加元素而成之組成。The copper foil of the present embodiment may be composed of pure copper (TPC) conforming to JIS-H3100 (C1100) or oxygen-free copper (OFC) conforming to JIS-H3100 (C1011). Moreover, the composition which made the said TPC or OFC contain the said additive element may be sufficient.

於本實施形態中,銅箔之平均晶粒徑較佳為0.5~4.0 μm。若平均晶粒徑未達0.5 μm,則拉伸強度會變得大於期望之值。具體而言,由於強度變得過高,則抗彎剛度會變大,故尤其是於將表面處理銅箔用於撓性印刷配線板之情形時,具有彈回量變大而不適於撓性印刷配線板用途之傾向。若平均晶粒徑超過4.0 μm,則無法實現晶粒之微細化,拉伸強度會變得小於期望之值。具體而言,變得難以充分提高強度,且蝕刻因子及電路直線性劣化,蝕刻性降低。為了避免誤差,平均晶粒徑之測定係以15 μm×15 μm之視域對箔表面觀察10視域以上而進行。箔表面之觀察可使用SIM(Scanning Ion Microscope)或SEM(Scanning Electron Microscope),並根據JIS H 0501所記載之切斷法求得平均晶粒徑。其中,將雙晶視為分開之晶粒進行測定。In this embodiment, the average grain size of the copper foil is preferably 0.5 to 4.0 μm. If the average grain size is less than 0.5 μm, the tensile strength becomes larger than desired. Specifically, when the strength becomes too high, the flexural rigidity becomes large, so especially when the surface-treated copper foil is used for a flexible printed wiring board, the amount of spring back becomes large, which is not suitable for flexible printing. The tendency of wiring board use. When the average crystal grain size exceeds 4.0 μm, the crystal grains cannot be refined, and the tensile strength becomes smaller than a desired value. Specifically, it becomes difficult to sufficiently increase the strength, and the etching factor and the circuit linearity deteriorate, and the etching property decreases. In order to avoid errors, the measurement of the average grain size was performed by observing the foil surface with a viewing area of 15 μm×15 μm for 10 viewing areas or more. For the observation of the foil surface, SIM (Scanning Ion Microscope) or SEM (Scanning Electron Microscope) can be used, and the average grain size can be determined according to the cutting method described in JIS H 0501. Among them, the twin crystals were measured as separate crystal grains.

於本實施形態中,表面處理銅箔之拉伸強度為235~290 MPa。如上述,藉由使晶粒微細化而提升拉伸強度。於印刷配線板之製造步驟及構裝於製品時等,因承受外力而引起之電路剝離伴有電路之變形。於伴有此種變形之剝離的情形時,外力於界面上集中之範圍會根據剝離對象之變形容易度而變化。於容易變形之情形時,外力集中於界面上之狹窄範圍,另一方面,於難以變形之情形時,則外力於界面上之寬廣範圍分散。即,藉由採用強度高且不易變形之表面處理銅箔作為電路,可於界面上之寬廣範圍分散外力,而可抑制電路剝離。本發明人等發現尤其是於細間距電路中,由於電路寬度窄,故外力容易集中,取決於剝離對象之變形困難度的外力之分散變得更為重要。於表面處理銅箔之拉伸強度未達235 MPa之情形時,界面上承受之外力無法充分分散從而無法抑制電路剝離。又,若表面處理銅箔之拉伸強度超過290 MPa,則雖然可充分抑制電路剝離,但強度變得過高,抗彎剛度變大。尤其是於將表面處理銅箔用於撓性印刷配線板之情形時,具有彈回量變大而不適於撓性印刷配線板用途之傾向。拉伸強度係藉由以IPC-TM-650為標準之拉伸試驗,以試驗片寬12.7 mm、室溫(15~35℃)、拉伸速度50.8 mm/min、標距50 mm,於與銅箔之軋壓方向(或MD方向)平行的方向上進行拉伸試驗。In this embodiment, the tensile strength of the surface-treated copper foil is 235-290 MPa. As described above, the tensile strength is improved by refining the crystal grains. During the manufacturing process of the printed wiring board and the assembly of the product, the circuit peeling caused by the external force is accompanied by the deformation of the circuit. In the case of peeling accompanied by such deformation, the range in which the external force is concentrated on the interface varies according to the ease of deformation of the peeled object. In the case of easy deformation, the external force is concentrated in a narrow range on the interface, on the other hand, in the case of difficult deformation, the external force is dispersed in a wide range on the interface. That is, by using the surface-treated copper foil with high strength and not easily deformed as the circuit, the external force can be dispersed in a wide range on the interface, and the circuit peeling can be suppressed. The inventors of the present invention found that, in particular, in a fine-pitch circuit, since the circuit width is narrow, the external force tends to be concentrated, and the dispersion of the external force depending on the difficulty of deformation of the peeling object becomes more important. When the tensile strength of the surface-treated copper foil is less than 235 MPa, the external force on the interface cannot be sufficiently dispersed to prevent circuit peeling. Moreover, when the tensile strength of the surface-treated copper foil exceeds 290 MPa, although circuit peeling can be suppressed sufficiently, the strength becomes too high, and the bending rigidity becomes large. In particular, when the surface-treated copper foil is used for a flexible printed wiring board, there is a tendency that the amount of spring back becomes large and it is not suitable for the use of a flexible printed wiring board. The tensile strength is measured by the tensile test with IPC-TM-650 as the standard, with a test piece width of 12.7 mm, room temperature (15-35°C), tensile speed of 50.8 mm/min, and gauge length of 50 mm. The tensile test is carried out in the direction parallel to the rolling direction (or MD direction) of the copper foil.

於本實施形態中,對表面處理銅箔於300℃進行30分鐘熱處理後之拉伸強度亦可為235~290 MPa(換言之,拉伸強度為235~290 MPa之表面處理銅箔亦可為於300℃經進行30分鐘熱處理時者)。本實施形態之表面處理銅箔可用於印刷配線板,將表面處理銅箔與作為基材之樹脂積層而成的覆銅積層板,係於200~400℃進行熱處理以使樹脂固化,故存在晶粒因再結晶而粗大化之可能性。 另一方面,本實施形態之表面處理銅箔亦可為對表面處理銅箔於300℃進行30分鐘熱處理後之拉伸強度為235~290 MPa,其物性係著眼於對與樹脂積層前之表面處理銅箔進行了上述熱處理時之狀態而規定。該於300℃進行30分鐘之熱處理,係模擬了於覆銅積層板積層時對樹脂進行固化熱處理之溫度條件者。 In this embodiment, the tensile strength of the surface-treated copper foil after heat treatment at 300° C. for 30 minutes may be 235 to 290 MPa (in other words, the surface-treated copper foil with a tensile strength of 235 to 290 MPa may be 300 ℃ after heat treatment for 30 minutes). The surface-treated copper foil of this embodiment can be used for printed wiring boards. The copper-clad laminate, which is formed by laminating the surface-treated copper foil and a resin as a base material, is heat-treated at 200 to 400° C. to cure the resin. Possibility of grain coarsening due to recrystallization. On the other hand, the surface-treated copper foil of the present embodiment may have a tensile strength of 235 to 290 MPa after heat-treating the surface-treated copper foil at 300° C. for 30 minutes, and its physical properties focus on the surface before being laminated with the resin. The treated copper foil is defined as the state when the above-mentioned heat treatment is performed. The heat treatment at 300° C. for 30 minutes simulates the temperature conditions of curing and heat treatment of the resin during lamination of the copper-clad laminate.

銅箔之厚度無特別限定,例如可設為1~1000 μm,或者1~500 μm,或者1~300 μm,或者3~100 μm,或者5~70 μm,或者6~35 μm,或者9~18 μm。The thickness of the copper foil is not particularly limited. 18 μm.

本實施形態之銅箔,例如可以下述方式製造。首先,於銅鑄錠添加上述添加物並使其溶解,進行鑄造,然後進行熱軋、冷軋及退火,並進行上述最終冷軋,藉此可製造箔。The copper foil of this embodiment can be manufactured as follows, for example. First, the above-mentioned additives are added to a copper ingot, dissolved, and cast, followed by hot rolling, cold rolling, and annealing, and the above-mentioned final cold rolling, whereby a foil can be produced.

又,本實施形態之表面處理銅箔1可使用上述銅箔2,並依照該技術領域中周知之方法而製造。此處,第1表面處理層3及第2表面處理層4之Ni附著量、Ni附著量之比,例如可藉由改變所形成之表面處理層的種類、厚度等而控制。又,第1表面處理層3之Rzjis可藉由調整第1表面處理層3之形成條件等而控制。Moreover, the surface-treated copper foil 1 of this embodiment can be manufactured according to the method well-known in this technical field using the above-mentioned copper foil 2. Here, the ratio of the Ni adhesion amount and the Ni adhesion amount of the first surface treatment layer 3 and the second surface treatment layer 4 can be controlled, for example, by changing the type, thickness, etc. of the surface treatment layer to be formed. In addition, the Rzjis of the first surface treatment layer 3 can be controlled by adjusting the formation conditions of the first surface treatment layer 3 and the like.

<覆銅積層板> 本實施形態之覆銅積層板10,具備上述表面處理銅箔1及接著於表面處理銅箔1之第1表面處理層3的基材11。 作為基材11,並無特別限定,可使用該技術領域中周知者。作為基材11之例,可舉紙基材酚樹脂、紙基材環氧樹脂、合成纖維布基材環氧樹脂、玻璃布-紙複合基材環氧樹脂、玻璃布-玻璃不織布複合基材環氧樹脂、玻璃布基材環氧樹脂、聚酯(聚對苯二甲酸乙二酯、聚萘二甲酸乙二酯等)膜、聚醯亞胺膜、液晶聚合物、氟樹脂等,又,較佳具有絕緣性。 <Copper clad laminate> The copper-clad laminate 10 of the present embodiment includes the above-mentioned surface-treated copper foil 1 and a base material 11 of the first surface-treated layer 3 attached to the surface-treated copper foil 1 . It does not specifically limit as the base material 11, A well-known thing in this technical field can be used. Examples of the substrate 11 include paper-based phenolic resin, paper-based epoxy resin, synthetic fiber cloth-based epoxy resin, glass cloth-paper composite substrate epoxy resin, glass cloth-glass nonwoven composite substrate Epoxy resin, glass cloth substrate epoxy resin, polyester (polyethylene terephthalate, polyethylene naphthalate, etc.) film, polyimide film, liquid crystal polymer, fluororesin, etc., and , preferably insulating.

作為覆銅積層板10之製造方法,並無特別限定,可依照該技術領域中周知之方法,藉由將表面處理銅箔1與基材11接著而製造。例如,使表面處理銅箔1與基材11積層並熱壓接合即可。It does not specifically limit as a manufacturing method of the copper clad laminated board 10, According to the method well-known in this technical field, it can manufacture by adhering the surface-treated copper foil 1 and the base material 11. For example, the surface-treated copper foil 1 and the base material 11 may be laminated and bonded by thermocompression.

又,於本實施形態之覆銅積層板為用於撓性印刷配線板之情形時,可使用聚對苯二甲酸乙二酯、聚醯亞胺、聚萘二甲酸乙二酯、液晶聚合物之膜作為基材11,作為基材11與表面處理銅箔1之積層方法,亦可將成為基材11之材料塗佈於表面處理銅箔1之表面並加熱成膜。又,亦可使用樹脂膜作為基材11,並於樹脂膜與表面處理銅箔1之間使用以下接著劑,亦可不使用接著劑而將樹脂膜熱壓接合於表面處理銅箔1。惟,就不對樹脂膜施加多餘之熱量的觀點,較佳使用接著劑。於使用膜作為基材11之情形時,可將該膜透過接著劑層積層於表面處理銅箔1。於此情形時,較佳使用與膜為同成分之接著劑。例如,於使用聚醯亞胺膜作為基材11之情形時,較佳為接著劑層亦使用聚醯亞胺系接著劑。再者,此處所謂聚醯亞胺系接著劑,係指含有醯亞胺鍵之接著劑,亦包含聚醚醯亞胺等。In addition, when the copper-clad laminate of this embodiment is used for a flexible printed wiring board, polyethylene terephthalate, polyimide, polyethylene naphthalate, liquid crystal polymer can be used The film is used as the base material 11, and as a lamination method of the base material 11 and the surface-treated copper foil 1, the material that becomes the base material 11 can also be coated on the surface of the surface-treated copper foil 1 and heated to form a film. Moreover, a resin film may be used as the base material 11, and the following adhesive may be used between the resin film and the surface-treated copper foil 1, or the resin film may be thermocompression-bonded to the surface-treated copper foil 1 without using an adhesive. However, from the viewpoint of not applying excessive heat to the resin film, it is preferable to use an adhesive. When a film is used as the base material 11, the film can be laminated on the surface-treated copper foil 1 through an adhesive. In this case, it is preferable to use an adhesive having the same composition as the film. For example, when a polyimide film is used as the base material 11, it is preferable that a polyimide-based adhesive is also used for the adhesive layer. In addition, the polyimide-based adhesive here refers to an adhesive containing an imide bond, and also includes polyetherimide and the like.

<印刷配線板> 本實施形態之印刷配線板具備對上述覆銅積層板10之表面處理銅箔1進行蝕刻而形成的電路圖案。作為印刷配線板之製造方法,並無特別限定,可藉由周知之方法製造,可使用光蝕刻技術將電路形成於覆銅積層板10。又,亦可視需要對電路實施鍍覆,並對覆蓋層膜進行層疊,而獲得撓性印刷配線板(撓性配線板)。 <Printed wiring board> The printed wiring board of the present embodiment includes a circuit pattern formed by etching the surface-treated copper foil 1 of the copper-clad laminate 10 described above. It does not specifically limit as a manufacturing method of a printed wiring board, It can manufacture by a well-known method, and a circuit can be formed in the copper clad laminate 10 using a photolithography technique. Moreover, as needed, a circuit may be plated, and a coverlay film may be laminated to obtain a flexible printed wiring board (flexible wiring board).

以上,對本發明之實施形態進行了說明,但本發明之表面處理銅箔、覆銅積層板及印刷配線板並不限定於上述例,可施加適當之變更。 [實施例] As mentioned above, although embodiment of this invention was described, the surface-treated copper foil, copper clad laminated board, and printed wiring board of this invention are not limited to the above-mentioned example, A suitable change can be added. [Example]

以下,藉由實施例對本實施形態進一步具體地進行說明,但本實施形態完全不受該等實施例之限定。Hereinafter, the present embodiment will be described in more detail by way of examples, but the present embodiment is not limited to these examples at all.

探討了是否能夠製造表面處理銅箔,並將該表面處理銅箔接著於基板而獲得覆銅積層板,形成自基板之剝離減少且細間距化之電路圖案。It was investigated whether it is possible to manufacture a surface-treated copper foil, attach the surface-treated copper foil to a substrate to obtain a copper-clad laminate, and form a circuit pattern with reduced peeling from the substrate and a finer pitch.

以下述方式獲得各實施例及各比較例之表面處理銅箔。 <實施例:表面處理銅箔1> 使用電解銅於非氧化性環境下製作鑄錠。鑄錠所含有之銅的比率為99.99質量%。將該鑄錠於900℃以上均質化退火後,進行熱軋,並進行冷軋與退火。最終退火後,進行最終冷軋而最終獲得厚度為12 μm之箔。 然後,藉由在上述銅箔樣品之一面依序形成粗化處理層、耐熱層及鉻酸鹽處理層作為第1表面處理層,並於上述銅箔樣品之另一面依序形成耐熱層及鉻酸鹽處理層作為第2表面處理層,而獲得表面處理銅箔。用以形成各層之條件如下。 再者,表面處理銅箔1之各物性係利用後述之方法進行評估,其結果如表1所示。 ・第1表面處理層之粗化處理層 藉由電鍍而形成粗化處理層。 鍍覆液組成:10~20 g/L之Cu,50~100 g/L之硫酸 鍍覆液溫度:25~50℃ 電鍍條件:分為2階段施加電流 第1階段:電流密度45.0 A/dm 2,時間1.4秒,庫侖量60.8 As/dm 2第2階段:電流密度4.1 A/dm 2,時間2.8秒、庫侖量11.8 As/dm 2・第1表面處理層之耐熱層 藉由電鍍而形成耐熱層。 鍍覆液組成:1~30 g/L之Ni,1~30 g/L之Zn 鍍覆液pH:2~5 鍍覆液溫度:30~50℃ 電鍍條件:電流密度2.1 A/dm 2,時間0.7秒,庫侖量1.4 As/dm 2・第1表面處理層之鉻酸鹽處理層 藉由電鍍而形成鉻酸鹽處理層。 鍍覆液組成:1~10 g/L之K 2Cr 2O 2,0.01~10 g/L之Zn 鍍覆液pH:2~5 鍍覆液溫度:30~50℃ 電鍍條件:電流密度2.1 A/dm 2,時間1.4秒,庫侖量2.9 As/dm 2・第2表面處理層之耐熱層 藉由電鍍而形成耐熱層。 鍍覆液組成:1~30 g/L之Ni,1~30 g/L之Zn 鍍覆液pH:2~5 鍍覆液溫度:30~50℃ 電鍍條件:電流密度2.1 A/dm 2,時間0.7秒,庫侖量1.4 As/dm 2・第2表面處理層之鉻酸鹽處理層 藉由浸漬鉻酸鹽處理而形成鉻酸鹽處理層。 鉻酸鹽液組成:1~10 g/L之K 2Cr 2O 2,0.01~10 g/L之Zn 鉻酸鹽液pH:2~5 鉻酸鹽液溫度:30~50℃ The surface-treated copper foil of each Example and each comparative example was obtained as follows. <Example: Surface-treated copper foil 1> An ingot was produced in a non-oxidizing environment using electrolytic copper. The ratio of copper contained in the ingot was 99.99 mass %. After the ingot is homogenized and annealed at 900° C. or higher, hot rolling is performed, and cold rolling and annealing are performed. After final annealing, final cold rolling was performed to finally obtain a foil with a thickness of 12 μm. Then, a roughening treatment layer, a heat-resistant layer and a chromate treatment layer were sequentially formed on one side of the copper foil sample as the first surface treatment layer, and a heat-resistant layer and a chromium layer were sequentially formed on the other side of the copper foil sample. The acid-acid-treated layer serves as the second surface-treated layer to obtain a surface-treated copper foil. The conditions for forming each layer are as follows. In addition, each physical property of the surface-treated copper foil 1 was evaluated by the method mentioned later, and Table 1 shows the result.・The roughening treatment layer of the first surface treatment layer is formed by electroplating to form a roughening treatment layer. Plating bath composition: 10~20 g/L of Cu, 50~100 g/L of sulfuric acid Plating bath temperature: 25~50℃ Plating conditions: divided into 2 stages applying current Stage 1: current density 45.0 A/dm 2 , time 1.4 seconds, coulomb weight 60.8 As/dm 2 2nd stage: current density 4.1 A/dm 2 , time 2.8 seconds, coulomb weight 11.8 As/dm 2・The heat-resistant layer of the first surface treatment layer is formed by electroplating Heat resistant layer. Composition of plating solution: Ni of 1~30 g/L, Zn of 1 to 30 g/L pH of plating solution: 2 to 5 Temperature of plating solution: 30 to 50℃ Electroplating conditions: current density 2.1 A/dm 2 , The time was 0.7 seconds, the coulomb amount was 1.4 As/dm 2 . The chromate-treated layer of the first surface-treated layer was electroplated to form a chromate-treated layer. Composition of plating solution: 1~10 g/L K 2 Cr 2 O 2 , 0.01~10 g/L Zn plating solution pH: 2~5 Plating solution temperature: 30~50℃ Electroplating condition: current density 2.1 A/dm 2 , time 1.4 seconds, coulomb weight 2.9 As/dm 2 · Heat-resistant layer of the second surface treatment layer A heat-resistant layer was formed by electroplating. Composition of plating solution: Ni of 1~30 g/L, Zn of 1 to 30 g/L pH of plating solution: 2 to 5 Temperature of plating solution: 30 to 50℃ Electroplating conditions: current density 2.1 A/dm 2 , Time 0.7 seconds, coulomb amount 1.4 As/dm 2・The chromate-treated layer of the second surface-treated layer is chromated by immersion chromate treatment to form a chromate-treated layer. Composition of chromate solution: K 2 Cr 2 O 2 of 1~10 g/L, Zn of 0.01~10 g/L pH of chromate solution: 2~5 Temperature of chromate solution: 30~50℃

<比較例:表面處理銅箔2> 表面處理銅箔2係降低了表面處理銅箔1之拉伸強度的銅箔。 表面處理銅箔2之各物性,係利用後述之方法進行評估,將其結果示於表1。 <Comparative example: Surface-treated copper foil 2> The surface-treated copper foil 2 is a copper foil in which the tensile strength of the surface-treated copper foil 1 is lowered. Each physical property of the surface-treated copper foil 2 was evaluated by the method mentioned later, and the result is shown in Table 1.

[表1]    厚度 (μm) 第1表面處理層 第2表面處理層 Ni附著量之比* 拉伸強度 (MPa) Ni附著量 (μg/dm 2 Zn附著量 (μg/dm 2 Co附著量 (μg/dm 2 Cr附著量 (μg/dm 2 Ni附著量 (μg/dm 2 Zn附著量 (μg/dm 2 Cr附著量 (μg/dm 2 實施例 表面處理銅箔1 12 64 470 - 67 63 361 17 1.02 251 比較例 表面處理銅箔2 12 65 453 - 63 64 299 19 1.01 153 *:第1表面處理層之Ni附著量相對於第2表面處理層之Ni附著量的比 [Table 1] Thickness (μm) 1st surface treatment layer 2nd surface treatment layer Ni adhesion ratio* Tensile strength (MPa) Ni adhesion amount (μg/dm 2 ) Zn adhesion amount (μg/dm 2 ) Co adhesion amount (μg/dm 2 ) Cr adhesion amount (μg/dm 2 ) Ni adhesion amount (μg/dm 2 ) Zn adhesion amount (μg/dm 2 ) Cr adhesion amount (μg/dm 2 ) Example Surface Treatment Copper Foil 1 12 64 470 - 67 63 361 17 1.02 251 Comparative Example Surface-treated copper foil 2 12 65 453 - 63 64 299 19 1.01 153 *: The ratio of the Ni adhesion amount of the first surface treatment layer to the Ni adhesion amount of the second surface treatment layer

對於上述表面處理銅箔1、2,接著下述基材。 <基材> 使用FR-4基材(玻璃布基材環氧樹脂之一種)作為基材。 The following base materials are next to the above-mentioned surface-treated copper foils 1 and 2. <Substrate> Use FR-4 substrate (one of glass cloth substrate epoxy resin) as the substrate.

使用上述表面處理銅箔及基材,以下述方式獲得覆銅積層板。 <實施例1> 於表面處理銅箔1之第1表面處理層的表面接著基材,獲得覆銅積層板1。具體而言,於銅箔之第1表面處理層的表面積層基材,並藉由加熱壓製(4 MPa)施加300℃×30分鐘之熱處理而貼合,獲得覆銅積層板1。 Using the above-mentioned surface-treated copper foil and base material, a copper-clad laminate was obtained in the following manner. <Example 1> A base material was adhered to the surface of the 1st surface-treated layer of the surface-treated copper foil 1, and the copper-clad laminated board 1 was obtained. Specifically, the surface layer base material of the first surface treatment layer of the copper foil was bonded by applying heat treatment at 300° C. for 30 minutes by hot pressing (4 MPa) to obtain a copper clad laminate 1 .

<比較例1> 將表面處理銅箔1變更為表面處理銅箔2,除此以外以與實施例1同樣之方法獲得覆銅積層板2。 對上述覆銅積層板1、2進行後述之剝離強度評估,將其結果示於表2。 <Comparative Example 1> Except having changed the surface-treated copper foil 1 to the surface-treated copper foil 2, the copper-clad laminated board 2 was obtained by the method similar to Example 1. The peeling strength evaluation mentioned later was performed about the said copper clad laminated board 1, 2, and the result is shown in Table 2.

以下述方法進行各物性、各評估。Each physical property and each evaluation were performed by the following methods.

<表面處理銅箔之拉伸強度> 對上述表面處理銅箔施加300℃×30分鐘之熱處理,獲得表面處理銅箔樣品。對各表面處理銅箔樣品,藉由以IPC-TM-650為標準之拉伸試驗,以上述條件測定拉伸強度。 <Tensile strength of surface-treated copper foil> A heat treatment of 300° C.×30 minutes was applied to the above-mentioned surface-treated copper foil to obtain a surface-treated copper foil sample. With respect to each surface-treated copper foil sample, the tensile strength was measured under the above-mentioned conditions by a tensile test based on IPC-TM-650.

<第1表面處理層及第2表面處理層中之各元素附著量的測定> Ni、Zn及Co之附著量,係藉由將各表面處理層溶解於濃度20質量%之硝酸,並使用VARIAN公司製造之原子吸光分光光度計(型號:AA240FS),以原子吸光法進行定量分析而進行測定。又,Cr之附著量係藉由將各表面處理層溶解於濃度7質量%之鹽酸,並與上述同樣地以原子吸光法進行定量分析而進行測定。 <Measurement of the adhesion amount of each element in the first surface treatment layer and the second surface treatment layer> The adhesion amounts of Ni, Zn, and Co were quantitatively analyzed by atomic absorption spectrophotometer by dissolving each surface treatment layer in nitric acid with a concentration of 20% by mass, and using an atomic absorption spectrophotometer (model: AA240FS) manufactured by VARIAN. to measure. In addition, the adhesion amount of Cr was measured by dissolving each surface treatment layer in hydrochloric acid having a concentration of 7 mass %, and performing quantitative analysis by atomic absorption method in the same manner as described above.

<剝離強度> 上述覆銅積層板1、2之剝離強度(剝離容易度)係以JIS C 6471 8.1為標準進行測定。測定用之試驗片,係使用氯化銅電路蝕刻液製作10 mm寬之電路於覆銅積層板。又,測定係將銅箔自基板剝離,並於90°方向持續地拉伸,將10 mm以上之測定長度內負載穩定之範圍內的最低值作為剝離強度。 再者,於剝離強度為0.80 kgf/cm以上之情形時,可評估為電路圖案難以剝離。 <Peel Strength> The peel strength (ease of peeling) of the copper-clad laminates 1 and 2 was measured in accordance with JIS C 6471 8.1. The test piece used for the measurement is a copper-clad laminate with a circuit of 10 mm width made by using copper chloride circuit etching solution. In addition, in the measurement, the copper foil was peeled off from the substrate, and the copper foil was continuously stretched in the 90° direction, and the lowest value within the range where the load was stable within the measurement length of 10 mm or more was defined as the peel strength. In addition, when the peeling strength is 0.80 kgf/cm or more, it can be estimated that the circuit pattern is difficult to peel off.

[表2]    表面處理銅箔 基材 剝離強度(kgf/cm) 實施例1 表面處理銅箔1 FR-4 0.90 比較例1 表面處理銅箔2 FR-4 0.68 [產業上之可利用性] [Table 2] Surface treated copper foil substrate Peel strength (kgf/cm) Example 1 Surface treated copper foil 1 FR-4 0.90 Comparative Example 1 Surface treated copper foil 2 FR-4 0.68 [Industrial Availability]

若根據本發明,可提供一種能夠減少自基板之剝離並形成細間距化之電路圖案的表面處理銅箔及覆銅積層板。 又,若根據本發明,可提供一種減少自基板之剝離且具有細間距化之電路圖案的印刷配線板。 According to the present invention, it is possible to provide a surface-treated copper foil and a copper-clad laminate capable of reducing peeling from a substrate and forming a fine-pitch circuit pattern. Moreover, according to this invention, the peeling from a board|substrate is reduced, and the printed wiring board which has a fine-pitch circuit pattern can be provided.

1:表面處理銅箔 2:銅箔 3:第1表面處理層 4:第2表面處理層 10:覆銅積層板 11:基材 1: Surface treated copper foil 2: copper foil 3: The first surface treatment layer 4: The second surface treatment layer 10: Copper clad laminate 11: Substrate

[圖1]係表示已將本實施形態之表面處理銅箔接著於基材之狀態的剖視圖。1 is a cross-sectional view showing a state in which the surface-treated copper foil of the present embodiment has been bonded to a base material.

1:表面處理銅箔 1: Surface treated copper foil

2:銅箔 2: copper foil

3:第1表面處理層 3: The first surface treatment layer

4:第2表面處理層 4: The second surface treatment layer

10:覆銅積層板 10: Copper clad laminate

11:基材 11: Substrate

Claims (11)

一種表面處理銅箔,該表面處理銅箔具有銅箔、形成於該銅箔之一面的第1表面處理層及形成於該銅箔之另一面的第2表面處理層,該第1表面處理層之Ni附著量相對於該第2表面處理層之Ni附著量的比為0.01~2.0,該表面處理銅箔之拉伸強度為235~290 MPa, 該銅箔由99.0質量%以上之Cu及其餘不可避免之雜質所構成。 A surface-treated copper foil comprising copper foil, a first surface-treated layer formed on one side of the copper foil and a second surface-treated layer formed on the other side of the copper foil, the first surface-treated layer The ratio of the Ni adhesion amount to the Ni adhesion amount of the second surface treatment layer is 0.01 to 2.0, and the tensile strength of the surface treated copper foil is 235 to 290 MPa, This copper foil consists of 99.0 mass % or more of Cu and other unavoidable impurities. 如請求項1之表面處理銅箔,其中,該Ni附著量之比為0.8~1.5。The surface-treated copper foil of claim 1, wherein the ratio of the Ni adhesion amount is 0.8 to 1.5. 如請求項1或2之表面處理銅箔,其中,該第1表面處理層之Ni附著量為20~200 μg/dm 2The surface-treated copper foil according to claim 1 or 2, wherein the Ni adhesion amount of the first surface-treated layer is 20 to 200 μg/dm 2 . 如請求項1或2之表面處理銅箔,其中,該第1表面處理層之Zn附著量為20~1000 μg/dm 2The surface-treated copper foil according to claim 1 or 2, wherein the Zn adhesion amount of the first surface-treated layer is 20 to 1000 μg/dm 2 . 如請求項1或2之表面處理銅箔,其中,該第1表面處理層之Rzjis為0.3~1.5。The surface-treated copper foil according to claim 1 or 2, wherein the Rzjis of the first surface-treated layer is 0.3 to 1.5. 如請求項1或2之表面處理銅箔,其中,該銅箔由符合JIS-H3100(C1100)標準之精銅或JIS-H3100(C1011)之無氧銅所構成。The surface-treated copper foil as claimed in claim 1 or 2, wherein the copper foil is made of pure copper conforming to JIS-H3100 (C1100) or oxygen-free copper of JIS-H3100 (C1011). 如請求項1或2之表面處理銅箔,其中,該銅箔進而含有總計0.002~0.825質量%之選自P、Ti、Sn、Ni、Be、Zn、In及Mg之群中之1種以上的添加元素而成。The surface-treated copper foil according to claim 1 or 2, wherein the copper foil further contains 0.002 to 0.825 mass % in total of at least one selected from the group consisting of P, Ti, Sn, Ni, Be, Zn, In, and Mg of added elements. 如請求項1或2之表面處理銅箔,其中,拉伸強度為235~290 MPa之該表面處理銅箔係於300℃進行了30分鐘熱處理時之該表面處理銅箔。The surface-treated copper foil of claim 1 or 2, wherein the surface-treated copper foil with a tensile strength of 235-290 MPa is the surface-treated copper foil when heat-treated at 300° C. for 30 minutes. 如請求項1或2之表面處理銅箔,其中,該第1表面處理層接著於基材。The surface-treated copper foil according to claim 1 or 2, wherein the first surface-treated layer is attached to the base material. 一種覆銅積層板,其具備如請求項1或2之表面處理銅箔及接著於該表面處理銅箔之該第1表面處理層的基材。A copper-clad laminate comprising the surface-treated copper foil as claimed in claim 1 or 2 and a base material of the first surface-treated layer attached to the surface-treated copper foil. 一種印刷配線板,其具備對如請求項10之覆銅積層板之該表面處理銅箔進行蝕刻而形成的電路圖案。A printed wiring board provided with a circuit pattern formed by etching the surface-treated copper foil of the copper-clad laminate as claimed in claim 10.
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