TWI749827B - Surface treatment copper foil, copper clad laminate and printed wiring board - Google Patents

Surface treatment copper foil, copper clad laminate and printed wiring board Download PDF

Info

Publication number
TWI749827B
TWI749827B TW109137201A TW109137201A TWI749827B TW I749827 B TWI749827 B TW I749827B TW 109137201 A TW109137201 A TW 109137201A TW 109137201 A TW109137201 A TW 109137201A TW I749827 B TWI749827 B TW I749827B
Authority
TW
Taiwan
Prior art keywords
copper foil
treatment layer
treated
surface treatment
layer
Prior art date
Application number
TW109137201A
Other languages
Chinese (zh)
Other versions
TW202122641A (en
Inventor
五刀郁浩
Original Assignee
日商Jx金屬股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商Jx金屬股份有限公司 filed Critical 日商Jx金屬股份有限公司
Publication of TW202122641A publication Critical patent/TW202122641A/en
Application granted granted Critical
Publication of TWI749827B publication Critical patent/TWI749827B/en

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • C25D5/12Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/16Electroplating with layers of varying thickness
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/06Wires; Strips; Foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroplating Methods And Accessories (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Laminated Bodies (AREA)

Abstract

本發明係一種表面處理銅箔,其具有銅箔及形成於該銅箔之至少一面之表面處理層。該表面處理銅箔之將表面處理層之突出峰部與中心部分離之負荷面積率SMr1為16〜28%。The present invention is a surface-treated copper foil, which has a copper foil and a surface-treated layer formed on at least one side of the copper foil. The surface-treated copper foil has a load area ratio SMr1 that separates the protruding peak portion and the center portion of the surface-treated layer from 16 to 28%.

Description

表面處理銅箔、覆銅積層板及印刷配線板Surface treatment copper foil, copper clad laminate and printed wiring board

本發明係關於一種表面處理銅箔、覆銅積層板及印刷配線板。The invention relates to a surface-treated copper foil, a copper clad laminate and a printed wiring board.

覆銅積層板被廣泛用於可撓性印刷配線板等各種用途中。該可撓性印刷配線板藉由以下方法製造:對覆銅積層板之銅箔進行蝕刻而形成導體圖案(亦稱為「配線圖案」),並利用焊料將電子零件連接安裝於導體圖案上。Copper clad laminates are widely used in various applications such as flexible printed wiring boards. The flexible printed wiring board is manufactured by the following method: the copper foil of the copper clad laminate is etched to form a conductor pattern (also called "wiring pattern"), and the electronic parts are connected and mounted on the conductor pattern by solder.

近年來,於電腦、移動終端等電子機器中,隨著通信之高速化及大容量化,電氣訊號之高頻化不斷發展,需要一種能夠應對這種趨勢之可撓性印刷配線板。尤其是電氣訊號之頻率越高則訊號功率之損耗(衰減)越大,越容易變得無法讀取資料,因此要求降低訊號功率之損耗。In recent years, in electronic equipment such as computers and mobile terminals, with the increase in communication speed and capacity, and the high frequency of electrical signals, there is a need for a flexible printed wiring board that can cope with this trend. In particular, the higher the frequency of the electrical signal, the greater the loss (attenuation) of the signal power, and the more easily it becomes impossible to read data. Therefore, it is required to reduce the loss of signal power.

電子線路中之訊號功率損耗(傳輸損耗)主要可分為兩種。一種是導體損耗,即由銅箔所導致之損耗,另一種是介電損耗,即由樹脂基材所導致之損耗。 導體損耗於高頻區域具有集膚效應,並且電流具有流經導體表面之特性,因此如果銅箔表面粗糙,則意味著會導致電流沿著複雜的路徑流動。因此,為了減少高頻訊號之導體損耗,理想的是降低銅箔之表面粗糙度。以下,於本說明書中僅記載為「傳輸損耗」及「導體損耗」時,主要係指「高頻訊號之傳輸損耗」及「高頻訊號之導體損耗」。There are two main types of signal power loss (transmission loss) in electronic circuits. One is conductor loss, that is, the loss caused by copper foil, and the other is dielectric loss, that is, the loss caused by the resin substrate. The conductor loss has a skin effect in the high-frequency region, and the current has the characteristic of flowing through the surface of the conductor. Therefore, if the surface of the copper foil is rough, it means that the current will flow along a complicated path. Therefore, in order to reduce the conductor loss of high-frequency signals, it is ideal to reduce the surface roughness of the copper foil. Hereinafter, when only "transmission loss" and "conductor loss" are described in this manual, they mainly refer to "high-frequency signal transmission loss" and "high-frequency signal conductor loss".

另一方面,由於介電損耗取決於樹脂基材之種類,理想的是於流通高頻訊號之電路基板中使用由低介電常數材料(例如液晶聚合物、低介電常數聚醯亞胺)形成之樹脂基材。又,介電損耗還受使銅箔與樹脂基材之間接著之接著劑影響,因此理想的是不使用接著劑地使銅箔與樹脂基材之間接著。 對此,為了不使用接著劑地使銅箔與樹脂基材之間接著,提出於銅箔之至少一面形成表面處理層之方法。例如,於專利文獻1中提出一種於銅箔上設置由粗化粒子形成之粗化處理層,並於最表層形成矽烷偶合處理層之方法。 [先前技術文獻] [專利文獻]On the other hand, since the dielectric loss depends on the type of resin base material, it is ideal to use low-dielectric constant materials (such as liquid crystal polymer, low-dielectric constant polyimide) in the circuit board for circulating high-frequency signals. The formed resin substrate. In addition, the dielectric loss is also affected by the adhesive that bonds the copper foil and the resin base material. Therefore, it is desirable to bond the copper foil and the resin base material without using an adhesive. In this regard, in order to bond between the copper foil and the resin substrate without using an adhesive, a method of forming a surface treatment layer on at least one surface of the copper foil has been proposed. For example, Patent Document 1 proposes a method of providing a roughening treatment layer formed of roughened particles on a copper foil, and forming a silane coupling treatment layer on the outermost layer. [Prior Technical Literature] [Patent Literature]

[專利文獻1]日本特開2012-112009號公報[Patent Document 1] JP 2012-112009 A

[發明所欲解決之課題][The problem to be solved by the invention]

粗化處理層雖然可藉由粗化粒子之定錨效應提高銅箔與樹脂基材間之接著性,但存在因集膚效應而加大導體損耗之情形,因此理想的是減少電沈積於銅箔表面之粗化粒子。另一方面,若減少電沈積於銅箔表面之粗化粒子,粗化粒子之定錨效應便會降低,從而無法充分獲得銅箔與樹脂基材之接著性。尤其是相較於以往之樹脂基材而言,由液晶聚合物、低介電常數聚醯亞胺等低介電常數材料形成之樹脂基材難以與銅箔接著,故期望開發出提高銅箔與樹脂基材間之接著性的方法。 又,矽烷偶合處理層雖然具有提高銅箔與樹脂基材間之接著性的效果,但根據其種類有時提高接著性之效果並不充分。Although the roughening treatment layer can improve the adhesion between the copper foil and the resin substrate by the anchoring effect of the roughening particles, the skin effect may increase the conductor loss. Therefore, it is ideal to reduce the electrodeposition on the copper Roughened particles on the foil surface. On the other hand, if the roughened particles electrodeposited on the surface of the copper foil are reduced, the anchoring effect of the roughened particles will be reduced, so that the adhesion between the copper foil and the resin substrate cannot be sufficiently obtained. In particular, compared with conventional resin substrates, resin substrates made of low-dielectric constant materials such as liquid crystal polymer and low-dielectric constant polyimide are difficult to bond with copper foil. Therefore, it is desired to develop improved copper foils. The method of adhesion to the resin substrate. In addition, although the silane coupling treatment layer has the effect of improving the adhesion between the copper foil and the resin substrate, the effect of improving the adhesion may be insufficient depending on the type.

本發明之實施形態係為了解決如上所述之問題而完成者,其目的在於提供一種表面處理銅箔,其可提高與樹脂基材、尤其是適合高頻用途之樹脂基材之接著性。 又,本發明之實施形態之目的在於提供一種覆銅積層板,其樹脂基材、尤其是適合高頻用途之樹脂基材與表面處理銅箔之間的接著性優異。 進而,本發明之實施形態之目的在於提供一種印刷配線板,其樹脂基材、尤其是適合高頻用途之樹脂基材與電路圖案之間的接著性優異。 [解決課題之技術手段]The embodiment of the present invention was completed in order to solve the above-mentioned problems, and its purpose is to provide a surface-treated copper foil that can improve the adhesion to a resin substrate, especially a resin substrate suitable for high-frequency applications. In addition, an object of the embodiments of the present invention is to provide a copper-clad laminate having excellent adhesion between a resin substrate, particularly a resin substrate suitable for high-frequency applications, and a surface-treated copper foil. Furthermore, an object of an embodiment of the present invention is to provide a printed wiring board whose resin substrate, particularly suitable for high-frequency applications, has excellent adhesion between the resin substrate and the circuit pattern. [Technical means to solve the problem]

本發明人等為了解決上述問題而對表面處理銅箔進行了銳意研究,其結果發現於表面處理層之表面粗糙度之各種指標中,將突出峰部與中心部分離之負荷面積率SMr1、突出峰部高度Spk、及中心部之水平差Sk與表面處理銅箔與樹脂基材間之接著性密切相關,基於以上見解,藉由將SMr1、Spk或Sk控制在特定範圍內,可提高表面處理銅箔與樹脂基材間之接著性,從而完成本發明之實施形態。In order to solve the above-mentioned problems, the inventors have conducted intensive research on surface-treated copper foil. As a result, they have found that among the various indicators of surface roughness of the surface-treated layer, the load area ratio SMr1, which separates the protrusion peak from the center part, is the protrusion area ratio SMr1. The peak height Spk and the level difference Sk at the center are closely related to the adhesion between the surface-treated copper foil and the resin substrate. Based on the above findings, by controlling SMr1, Spk or Sk within a specific range, the surface treatment can be improved The adhesiveness between the copper foil and the resin substrate completes the embodiment of the present invention.

即,本發明之實施形態係關於一種表面處理銅箔,其具有銅箔及形成於上述銅箔之至少一面之表面處理層,將上述表面處理層之突出峰部與中心部分離之負荷面積率SMr1為16〜28%。 又,本發明之實施形態係關於一種表面處理銅箔,其具有銅箔及形成於上述銅箔之至少一面之表面處理層,上述表面處理層之突出峰部高度Spk為1.2〜2.5 μm。 又,本發明之實施形態係關於一種表面處理銅箔,其具有銅箔及形成於上述銅箔之至少一面之表面處理層,上述表面處理層之中心部之水平差Sk為1.0〜2.0 μm。 又,本發明之實施形態係關於一種覆銅積層板,其具備上述表面處理銅箔及與上述表面處理銅箔之表面處理層接著之樹脂基材。 進而,本發明之實施形態係關於一種印刷配線板,其具備對上述覆銅積層板之上述表面處理銅箔進行蝕刻所形成之電路圖案。 [發明之效果]That is, the embodiment of the present invention relates to a surface-treated copper foil having a copper foil and a surface-treated layer formed on at least one side of the copper foil, and the load area ratio of separating the protruding peak portion and the center portion of the surface-treated layer SMr1 is 16-28%. In addition, the embodiment of the present invention relates to a surface-treated copper foil, which has a copper foil and a surface-treated layer formed on at least one side of the copper foil, and the protrusion peak height Spk of the surface-treated layer is 1.2-2.5 μm. In addition, the embodiment of the present invention relates to a surface-treated copper foil, which has a copper foil and a surface-treated layer formed on at least one side of the copper foil, and the level difference Sk at the center of the surface-treated layer is 1.0 to 2.0 μm. In addition, an embodiment of the present invention relates to a copper-clad laminated board provided with the above-mentioned surface-treated copper foil and a resin substrate bonded to the surface-treated layer of the above-mentioned surface-treated copper foil. Furthermore, the embodiment of this invention relates to a printed wiring board provided with the circuit pattern formed by etching the said surface-treated copper foil of the said copper clad laminated board. [Effects of the invention]

根據本發明之實施形態,可提供一種表面處理銅箔,其能夠提高與樹脂基材、尤其是適合高頻用途之樹脂基材之接著性。 又,根據本發明之實施形態,可提供一種覆銅積層板,其樹脂基材、尤其是適合高頻用途之樹脂基材與表面處理銅箔之間的接著性優異。 進而,根據本發明之實施形態,可提供一種印刷配線板,其樹脂基材、尤其是適合高頻用途之樹脂基材與電路圖案之間的接著性優異。According to the embodiment of the present invention, a surface-treated copper foil can be provided, which can improve the adhesion to a resin substrate, especially a resin substrate suitable for high-frequency applications. Furthermore, according to the embodiment of the present invention, it is possible to provide a copper-clad laminate having excellent adhesion between a resin substrate, particularly a resin substrate suitable for high-frequency applications, and a surface-treated copper foil. Furthermore, according to the embodiment of the present invention, it is possible to provide a printed wiring board whose resin substrate, particularly suitable for high-frequency applications, has excellent adhesion between the resin substrate and the circuit pattern.

以下,對本發明之較佳之實施形態具體地進行說明,但本發明並不受該等限定地解釋,可於不脫離本發明之主旨之範圍內,基於業者之知識而進行各種變更、改良等。以下之實施形態中所揭示之多個構成要素可藉由適當地組合而形成各種發明。例如,可從以下之實施形態所示之全部構成要素中刪除幾個構成要素,亦可將不同實施形態之構成要素適當組合。Hereinafter, preferred embodiments of the present invention will be described in detail, but the present invention is not to be interpreted in such a limited manner, and various changes and improvements can be made based on the knowledge of the industry without departing from the scope of the present invention. A plurality of constituent elements disclosed in the following embodiments can be appropriately combined to form various inventions. For example, several constituent elements may be deleted from all the constituent elements shown in the following embodiments, or constituent elements of different embodiments may be appropriately combined.

(實施形態1) 本發明之實施形態1係關於一種表面處理銅箔,其具有銅箔及形成於銅箔之至少一面之表面處理層,將表面處理層之突出峰部與中心部分離之負荷面積率SMr1為16〜28%。 又,本發明之實施形態1係關於一種覆銅積層板,其具備上述表面處理銅箔及與上述表面處理銅箔之表面處理層接著之樹脂基材。 進而,本發明之實施形態1係關於一種印刷配線板,其具備對上述覆銅積層板之表面處理銅箔進行蝕刻所形成之電路圖案。(Embodiment 1) The first embodiment of the present invention relates to a surface-treated copper foil, which has a copper foil and a surface-treated layer formed on at least one side of the copper foil, and the load area ratio SMr1 that separates the protruding peak portion and the center portion of the surface-treated layer is 16 ~28%. In addition, the first embodiment of the present invention relates to a copper-clad laminate including the above-mentioned surface-treated copper foil and a resin substrate bonded to the surface-treated layer of the above-mentioned surface-treated copper foil. Furthermore, Embodiment 1 of this invention relates to a printed wiring board provided with the circuit pattern formed by etching the surface-treated copper foil of the said copper clad laminated board.

本發明之實施形態1之表面處理銅箔之表面處理層可僅形成於銅箔之一面,亦可形成於銅箔之兩面。又,於表面處理層形成於銅箔之兩面之情形時,表面處理層之種類可相同,亦可不同。The surface treatment layer of the surface-treated copper foil of the first embodiment of the present invention may be formed on only one side of the copper foil, or may be formed on both sides of the copper foil. In addition, when the surface treatment layer is formed on both sides of the copper foil, the type of the surface treatment layer may be the same or different.

將突出峰部與中心部分離之負荷面積率SMr1係表示位於中心部之上方的突出峰部之比率,突出峰部之比率越大則SMr1之值越大。SMr1依據ISO 25178進行測定。於表面處理銅箔之表面處理層接著樹脂基材之情形時,若表面處理層之突出峰部之比率較小,則從表面處理層剝離樹脂基材時之力(以下稱為「剝離力」)集中於中心部之表面。對此,藉由將表面處理層之SMr1設為16%以上(增大突出峰部之比率),由於突出峰部之存在而能夠容易使剝離力朝向突出峰部之高度方向分散。其結果,表面處理銅箔與樹脂基材之接著力變高。另一方面,藉由將表面處理層之SMr1設為28%以下,可抑制由集膚效應所導致之傳輸損耗之增大。The load area ratio SMr1 that separates the protruding peak portion from the center portion represents the ratio of the protruding peak portion located above the center portion. The greater the ratio of the protruding peak portion, the greater the value of SMr1. SMr1 is measured in accordance with ISO 25178. When the surface treatment layer of the surface treatment copper foil is attached to the resin substrate, if the ratio of the protruding peaks of the surface treatment layer is small, the force when peeling the resin substrate from the surface treatment layer (hereinafter referred to as "peeling force") ) Concentrated on the surface of the center. In this regard, by setting the SMr1 of the surface treatment layer to 16% or more (increasing the ratio of the protruding peaks), the peeling force can be easily dispersed in the height direction of the protruding peaks due to the existence of the protruding peaks. As a result, the adhesion between the surface-treated copper foil and the resin substrate becomes higher. On the other hand, by setting the SMr1 of the surface treatment layer to 28% or less, the increase in transmission loss caused by the skin effect can be suppressed.

表面處理層之突出峰部高度Spk較佳為1.2〜2.5 μm。 此處,突出峰部高度Spk依據ISO 25178進行測定。於表面處理銅箔之表面處理層接著樹脂基材之情形時,若表面處理層之突出峰部較低,則剝離力便會集中於中心部之表面。對此,藉由將表面處理層之Spk設為1.2 μm以上(使突出峰部變高),由於突出峰部之存在而能夠容易使剝離力朝向突出峰部之高度方向分散。其結果,表面處理銅箔與樹脂基材之接著力變高。另一方面,藉由將表面處理層之Spk設為2.5 μm以下,可抑制由集膚效應所導致之傳輸損耗之增大。The height Spk of the protruding peak of the surface treatment layer is preferably 1.2~2.5 μm. Here, the protrusion height Spk is measured in accordance with ISO 25178. When the surface treatment layer of the surface treatment copper foil is connected to the resin substrate, if the protruding peak of the surface treatment layer is low, the peeling force will be concentrated on the surface of the center part. In this regard, by setting the Spk of the surface treatment layer to 1.2 μm or more (to increase the height of the protruding peak), the peeling force can be easily dispersed in the height direction of the protruding peak due to the existence of the protruding peak. As a result, the adhesion between the surface-treated copper foil and the resin substrate becomes higher. On the other hand, by setting the Spk of the surface treatment layer to 2.5 μm or less, the increase in transmission loss caused by the skin effect can be suppressed.

於表面處理層中,表面處理層之中心部之水平差Sk較佳為1.0〜2.0 μm。 此處,表面處理層之中心部之水平差Sk表示除去突出峰部與突出穀部之部分(中心部)的高度差異之程度,依據ISO 25178進行測定。於表面處理銅箔之表面處理層接著樹脂基材之情形時,若中心部之高度差異較小,則中心部變為大致平面狀,剝離力集中於其上表面。對此,藉由將表面處理層之Sk設為1.0 μm以上(增大中心部之高度差異),使中心部之上表面為凸凹面狀,從而能夠容易使剝離力朝向中心部之高度方向分散。其結果,表面處理銅箔與樹脂基材之接著力變高。另一方面,藉由將表面處理層之Sk設為2.0 μm以下,可抑制由集膚效應所導致之傳輸損耗之增大。In the surface treatment layer, the level difference Sk at the center of the surface treatment layer is preferably 1.0 to 2.0 μm. Here, the level difference Sk of the center part of the surface treatment layer represents the degree of the height difference of the part (central part) excluding the protrusion peak part and the protrusion valley part, and is measured in accordance with ISO 25178. When the surface treatment layer of the surface-treated copper foil is connected to the resin substrate, if the height difference of the center part is small, the center part becomes approximately flat, and the peeling force is concentrated on the upper surface. In this regard, by setting the Sk of the surface treatment layer to 1.0 μm or more (increasing the height difference of the center part), the upper surface of the center part is made convex and concave, so that the peeling force can be easily dispersed in the height direction of the center part. . As a result, the adhesion between the surface-treated copper foil and the resin substrate becomes higher. On the other hand, by setting the Sk of the surface treatment layer to 2.0 μm or less, the increase in transmission loss caused by the skin effect can be suppressed.

對表面處理層之種類並無特別限定,可使用本技術領域中公知之各種表面處理層。 作為表面處理層之例,可列舉:粗化處理層、耐熱處理層、防銹處理層、鉻酸鹽處理層、矽烷偶合處理層等。該等層可單獨使用或將2種以上組合使用。其中,就與樹脂基材之接著性之觀點而言,表面處理層較佳為具有粗化處理層。 又,於表面處理層具有選自由耐熱處理層、防銹處理層、鉻酸鹽處理層及矽烷偶合處理層所組成之群中的1種以上層之情形時,該等層較佳為設置於粗化處理層上。The type of surface treatment layer is not particularly limited, and various surface treatment layers known in the technical field can be used. As an example of a surface treatment layer, a roughening treatment layer, a heat-resistant treatment layer, a rust-preventing treatment layer, a chromate treatment layer, a silane coupling treatment layer, etc. are mentioned. These layers can be used alone or in combination of two or more kinds. Among them, from the viewpoint of adhesion to the resin substrate, the surface treatment layer preferably has a roughening treatment layer. In addition, when the surface treatment layer has one or more layers selected from the group consisting of a heat-resistant treatment layer, an anti-rust treatment layer, a chromate treatment layer, and a silane coupling treatment layer, the layers are preferably provided on Coarse the treatment layer.

此處,作為一例,將於銅箔之一面具有粗化處理層之表面處理銅箔的剖面示意圖示於圖1。 如圖1所示,形成於銅箔10之一面之粗化處理層包含:一次粗化粒子20、被覆一次粗化粒子20之覆蓋鍍覆層30、及形成於覆蓋鍍覆層30上之二次粗化粒子40。較佳為由覆蓋鍍覆層30被覆之一次粗化粒子20為大致球狀,並且二次粗化粒子40以樹枝狀擴展之方式形成。若為此種結構,則容易將表面處理層之SMr1、Spk及Sk控制在上述範圍內。Here, as an example, a cross-sectional schematic diagram of a surface-treated copper foil having a roughening treatment layer on one surface of the copper foil is shown in FIG. 1. As shown in FIG. 1, the roughening treatment layer formed on one surface of the copper foil 10 includes: primary roughening particles 20, a covering plating layer 30 covering the primary roughening particles 20, and two of them formed on the covering plating layer 30 Sub-roughened particles 40. Preferably, the primary roughening particles 20 covered by the covering plating layer 30 are substantially spherical, and the secondary roughening particles 40 are formed in a dendritic manner. With such a structure, it is easy to control SMr1, Spk, and Sk of the surface treatment layer within the above-mentioned range.

作為一次粗化粒子20,並無特別限定,可由選自由銅、鎳、鈷、磷、鎢、砷、鉬、鉻及鋅所組成之群中的元素或包含2種以上之元素之合金形成。其中一次粗化粒子20較佳為由銅或銅合金形成,尤佳為由銅形成。 作為覆蓋鍍覆層30,並無特別限定,可由銅、銀、金、鎳、鈷、鋅等形成。 作為二次粗化粒子40,並無特別限定,可由選自由鎳、鈷、銅、鋅所組成之群中的金屬或包含2種以上金屬之合金形成。其中二次粗化粒子40較佳為由銅合金形成,尤佳為由Cu-Co-Ni合金形成。The primary roughening particles 20 are not particularly limited, and may be formed of an element selected from the group consisting of copper, nickel, cobalt, phosphorus, tungsten, arsenic, molybdenum, chromium, and zinc, or an alloy containing two or more elements. Among them, the primary roughening particles 20 are preferably formed of copper or copper alloy, and particularly preferably formed of copper. The covering plating layer 30 is not particularly limited, and may be formed of copper, silver, gold, nickel, cobalt, zinc, or the like. The secondary roughening particles 40 are not particularly limited, and may be formed of a metal selected from the group consisting of nickel, cobalt, copper, and zinc, or an alloy containing two or more metals. Among them, the secondary roughening particles 40 are preferably formed of a copper alloy, and particularly preferably formed of a Cu-Co-Ni alloy.

粗化處理層可藉由電鍍形成。其條件並無特別限定,可根據所使用之電鍍裝置進行調整,典型條件如下所示。 (一次粗化粒子20之形成條件R1) 鍍覆液組成:5〜15 g/L之Cu、40〜100 g/L之硫酸 鍍覆液溫度:20〜50℃ 電鍍條件:電流密度30〜60 A/dm2 、庫侖量40〜100 As/dm2 The roughening treatment layer can be formed by electroplating. The conditions are not particularly limited and can be adjusted according to the electroplating equipment used. Typical conditions are shown below. (Formation condition R1 of primary coarsening particles 20) Composition of plating solution: 5~15 g/L Cu, 40~100 g/L sulfuric acid plating solution temperature: 20~50℃ Electroplating conditions: current density 30~60 A/dm 2 , Coulomb amount 40~100 As/dm 2

(覆蓋鍍覆層30之形成條件R2) 鍍覆液組成:10〜30 g/L之Cu、70〜130 g/L之硫酸 鍍覆液溫度:30〜60℃ 電鍍條件:電流密度4.8〜15 A/dm2 ,庫侖量10〜35 As/dm2 (Formation condition R2 of covering plating layer 30) Composition of plating solution: 10~30 g/L Cu, 70~130 g/L sulfuric acid plating solution temperature: 30~60℃ Electroplating conditions: current density 4.8~15 A/dm 2 , Coulomb amount 10~35 As/dm 2

(二次粗化粒子40之形成條件Y) 鍍覆液組成:10〜20 g/L之Cu、5〜15 g/L之Co、5〜15 g/L之Ni pH:2〜3 鍍覆液溫度:30〜40℃ 電鍍條件:電流密度15〜45 A/dm2 ,庫侖量15〜55 As/dm2 (Condition Y for the formation of secondary coarsening particles 40) Composition of plating solution: 10-20 g/L Cu, 5-15 g/L Co, 5-15 g/L Ni pH: 2~3 Plating Liquid temperature: 30~40℃ Electroplating conditions: current density 15~45 A/dm 2 , coulomb amount 15~55 As/dm 2

一次粗化粒子20之形成條件R1中,庫侖量越小越會抑制一次粗化粒子20於Z方向(垂直於銅箔10之方向)上之生長。又,覆蓋鍍覆層30之形成條件R2中,庫侖量越大則層越會於XYZ方向上均勻且較厚地生長。因此,藉由將庫侖量(R1)/庫侖量(R2)控制在6.0以下,較佳為控制在4.0以下,可將由覆蓋鍍覆層30被覆之一次粗化粒子20之形狀控制為大致球狀〜大致半球狀之形狀。並且,將由覆蓋鍍覆層30被覆之一次粗化粒子20控制為大致球狀〜大致半球狀之形狀,然後形成二次粗化粒子40,藉此變得容易將二次粗化粒子40以呈樹枝狀擴展之方式形成於覆蓋鍍覆層30上。 再者,若庫侖量(R1)/庫侖量(R2)超過6.0,則一次粗化粒子20於Z方向上之生長變大,因此由覆蓋鍍覆層30被覆之一次粗化粒子20之形狀成為大致橢球〜大致半橢球之形狀。因此,形成於覆蓋鍍覆層30上之二次粗化粒子40變得難以呈樹枝狀擴展。In the formation condition R1 of the primary roughened particles 20, the smaller the Coulomb amount, the more the primary roughened particles 20 will be inhibited from growing in the Z direction (the direction perpendicular to the copper foil 10). In addition, in the formation condition R2 of the covering plating layer 30, the larger the Coulomb amount, the more uniformly and thicker the layer grows in the XYZ direction. Therefore, by controlling the coulomb amount (R1)/coulomb amount (R2) below 6.0, preferably below 4.0, the shape of the primary coarsening particles 20 covered by the coating layer 30 can be controlled to be approximately spherical ~Roughly hemispherical shape. In addition, the primary roughened particles 20 covered by the coating layer 30 are controlled to have a roughly spherical to roughly hemispherical shape, and then the secondary roughened particles 40 are formed, thereby making it easy to form the secondary roughened particles 40 into The way of dendritic expansion is formed on the covering plating layer 30. Furthermore, if the Coulomb amount (R1)/Coulomb amount (R2) exceeds 6.0, the growth of the primary roughened particles 20 in the Z direction becomes larger, so the shape of the primary roughened particles 20 covered by the coating layer 30 becomes Roughly ellipsoidal ~ roughly semi-ellipsoidal shape. Therefore, it becomes difficult for the secondary roughening particles 40 formed on the covering plating layer 30 to spread in a dendritic shape.

作為耐熱處理層及防銹處理層,並無特別限定,可由本技術領域中公知之材料形成。再者,耐熱處理層有時亦會發揮作為防銹處理層之功能,因此亦可形成具有耐熱處理層及防銹處理層兩種功能的一個層作為耐熱處理層及防銹處理層。 作為耐熱處理層及/或防銹處理層,可為包含選自由鎳、鋅、錫、鈷、鉬、銅、鎢、磷、砷、鉻、釩、鈦、鋁、金、銀、鉑族元素、鐵、鉭所組成之群中的1種以上元素(可為金屬、合金、氧化物、氮化物、硫化物等任意形態)之層。其中較佳為耐熱處理層及/或防銹處理層為Ni-Zn層或Zn層。尤其是若為Ni含量少於Zn含量之Ni-Zn層、或不含Ni之Zn層,則可並不較大程度地降低耐熱效果及防銹效果地降低導體損耗,因此較佳。The heat-resistant treatment layer and the anti-rust treatment layer are not particularly limited, and they can be formed of materials known in the technical field. Furthermore, the heat-resistant treatment layer sometimes also functions as an anti-rust treatment layer, so it is also possible to form a layer having both functions of the heat-resistant treatment layer and the anti-rust treatment layer as the heat-resistant treatment layer and the anti-rust treatment layer. As the heat-resistant treatment layer and/or the anti-rust treatment layer, it may contain elements selected from the group consisting of nickel, zinc, tin, cobalt, molybdenum, copper, tungsten, phosphorus, arsenic, chromium, vanadium, titanium, aluminum, gold, silver, and platinum group elements A layer of more than one element (metal, alloy, oxide, nitride, sulfide, etc.) from the group consisting of, iron, and tantalum. Among them, it is preferable that the heat-resistant treatment layer and/or the anti-rust treatment layer is a Ni-Zn layer or a Zn layer. In particular, if it is a Ni-Zn layer with a Ni content less than a Zn content, or a Zn layer without Ni, the conductor loss can be reduced without greatly reducing the heat-resistance effect and the rust-preventing effect, so it is preferable.

耐熱處理層及防銹處理層可藉由電鍍形成。其條件並無特別限定,可根據所使用之電鍍裝置調整,使用普通電鍍裝置形成耐熱處理層(Ni-Zn層)時之條件如下所示。 鍍覆液組成:1〜30 g/L之Ni、1〜30 g/L之Zn 鍍覆液pH:2〜5 鍍覆液溫度:30〜50℃ 電鍍條件:電流密度1〜10 A/dm2 ,時間0.1〜5秒The heat-resistant treatment layer and the anti-rust treatment layer can be formed by electroplating. The conditions are not particularly limited, and can be adjusted according to the electroplating device used. The conditions for forming the heat-resistant layer (Ni-Zn layer) using a common electroplating device are as follows. Plating bath composition: 1~30 g/L Ni, 1~30 g/L Zn Plating bath pH: 2~5 Plating bath temperature: 30~50℃ Electroplating conditions: current density 1~10 A/dm 2. Time 0.1~5 seconds

作為鉻酸鹽處理層,並無特別限定,可由本技術領域中公知之材料形成。 此處,本說明書中之所謂「鉻酸鹽處理層」係指由包含鉻酸酐、鉻酸、重鉻酸、鉻酸鹽或重鉻酸鹽之液體所形成之層。鉻酸鹽處理層可為包含鈷、鐵、鎳、鉬、鋅、鉭、銅、鋁、磷、鎢、錫、砷、鈦等元素(可為金屬、合金、氧化物、氮化物、硫化物等任意形態)之層。作為鉻酸鹽處理層之例,可列舉:經鉻酸酐或重鉻酸鉀水溶液處理之鉻酸鹽處理層、經包含鉻酸酐或重鉻酸鉀及鋅之處理液處理之鉻酸鹽處理層等。The chromate treatment layer is not particularly limited, and can be formed of materials known in the technical field. Here, the "chromate treatment layer" in this specification refers to a layer formed of a liquid containing chromic anhydride, chromic acid, dichromic acid, chromate, or dichromate. The chromate treatment layer may contain elements such as cobalt, iron, nickel, molybdenum, zinc, tantalum, copper, aluminum, phosphorus, tungsten, tin, arsenic, titanium, etc. (may be metals, alloys, oxides, nitrides, sulfides) And so on any form) layer. Examples of the chromate treatment layer include: chromate treatment layer treated with chromic anhydride or potassium dichromate aqueous solution, chromate treatment layer treated with a treatment solution containing chromic anhydride or potassium dichromate and zinc Wait.

鉻酸鹽處理層可藉由浸漬鉻酸鹽處理、電解鉻酸鹽處理等公知之方法形成。該等條件並無特別限定,例如形成通常的浸漬鉻酸鹽處理層時之條件如下所示。 鉻酸鹽液組成:1〜10 g/L之K2 Cr2 O7 、0.01〜10 g/L之Zn 鉻酸鹽液pH:2〜5 鉻酸鹽液溫度:30〜55℃The chromate treatment layer can be formed by a known method such as immersion chromate treatment and electrolytic chromate treatment. These conditions are not particularly limited. For example, the conditions for forming a normal immersion chromate treatment layer are as follows. Chromate solution composition: 1~10 g/L K 2 Cr 2 O 7 , 0.01~10 g/L Zn Chromate solution pH: 2~5 Chromate solution temperature: 30~55℃

作為矽烷偶合處理層,並無特別限定,可由本技術領域中公知之材料形成。 此處,本說明書中之「矽烷偶合處理層」係指由矽烷偶合劑形成之層。 作為矽烷偶合劑,並無特別限定,可使用本技術領域中公知之矽烷偶合劑。作為矽烷偶合劑之例,可列舉:胺基系矽烷偶合劑、環氧系矽烷偶合劑、巰基系矽烷偶合劑、甲基丙烯醯氧基系矽烷偶合劑、乙烯基系矽烷偶合劑、咪唑系矽烷偶合劑、三

Figure 109137201-A0304-12-0000-4
系矽烷偶合劑等。其中,較佳為胺基系矽烷偶合劑、環氧系矽烷偶合劑。上述矽烷偶合劑可單獨使用或將2種以上組合使用。 作為代表性之矽烷偶合處理層之形成方法,可列舉藉由塗佈N-2-(胺基乙基)-3-胺基丙基三甲氧基矽烷(信越化學工業股份有限公司製造之KBM603)之1.2體積%水溶液(pH:10)並使其乾燥而形成矽烷偶合處理層之方法。The silane coupling treatment layer is not particularly limited, and can be formed of materials known in the art. Here, the "silane coupling treatment layer" in this specification refers to a layer formed of a silane coupling agent. The silane coupling agent is not particularly limited, and silane coupling agents known in the art can be used. Examples of silane coupling agents include: amino-based silane coupling agents, epoxy-based silane coupling agents, mercapto-based silane coupling agents, methacryloxy-based silane coupling agents, vinyl-based silane coupling agents, and imidazole-based silane coupling agents. Silane coupling agent, three
Figure 109137201-A0304-12-0000-4
Department of silane coupling agent and so on. Among them, amine-based silane coupling agents and epoxy-based silane coupling agents are preferred. The above-mentioned silane coupling agent can be used alone or in combination of two or more kinds. As a representative method for forming the silane coupling treatment layer, it can be exemplified by coating N-2-(aminoethyl)-3-aminopropyltrimethoxysilane (KBM603 manufactured by Shin-Etsu Chemical Co., Ltd.) The 1.2 volume% aqueous solution (pH: 10) and drying to form a silane coupling treatment layer.

作為銅箔,並無特別限定,可為電解銅箔或壓延銅箔中之任一種。電解銅箔通常藉由使銅從硫酸銅鍍浴電解析出於鈦鼓或不鏽鋼鼓上而製造,具有形成於鼓側之平坦的S面(磨光面)、及形成於與S面相反側之M面(磨砂面)。通常情況下,電解銅箔之M面具有凹凸,因此於電解銅箔之M面形成表面處理層,使該表面處理層與樹脂基材接著,藉此可提高表面處理層與樹脂基材之接著性。It does not specifically limit as a copper foil, It may be either electrolytic copper foil or rolled copper foil. Electrolytic copper foil is usually produced by electrolysis of copper from a copper sulfate plating bath on a titanium drum or stainless steel drum, and has a flat S surface (polished surface) formed on the drum side and formed on the side opposite to the S surface The M surface (frosted surface). Normally, the M surface of the electrolytic copper foil has unevenness, so a surface treatment layer is formed on the M surface of the electrolytic copper foil to bond the surface treatment layer to the resin substrate, thereby improving the adhesion between the surface treatment layer and the resin substrate sex.

作為銅箔之材料,並無特別限定,於銅箔為壓延銅箔之情形時,可使用通常作為印刷配線板之電路圖案而使用之精銅(JIS H3100 合金編號C1100)、無氧銅(JIS H3100 合金編號C1020或JIS H3510 合金編號C1011)等高純度之銅。又,例如亦可使用如含Sn之銅、含Ag之銅、添加有Cr、Zr或Mg等之銅合金、添加有Ni及Si等之卡遜系銅合金等銅合金。再者,本說明書中之「銅箔」亦包括銅合金箔之概念。The material of copper foil is not particularly limited. When the copper foil is rolled copper foil, refined copper (JIS H3100 alloy number C1100) and oxygen-free copper (JIS High-purity copper such as H3100 alloy number C1020 or JIS H3510 alloy number C1011). In addition, for example, copper alloys such as copper containing Sn, copper containing Ag, copper alloys containing Cr, Zr, or Mg, and Carson-based copper alloys containing Ni, Si, and the like can also be used. Furthermore, "copper foil" in this specification also includes the concept of copper alloy foil.

銅箔之厚度並無特別限定,例如可設為1〜1000 μm、或1〜500 μm、或1〜300 μm、或3〜100 μm、或5〜70 μm、或6〜35 μm、或9〜18 μm。The thickness of the copper foil is not particularly limited. For example, it can be set to 1~1000 μm, or 1 to 500 μm, or 1 to 300 μm, or 3 to 100 μm, or 5 to 70 μm, or 6 to 35 μm, or 9 ~18 μm.

具有上述構成之表面處理銅箔可依據本技術領域中公知之方法製造。此處,表面處理層之SMr1、Spk及Sk可藉由調整表面處理層之形成條件、尤其是上述粗化處理層之形成條件等而進行控制。The surface-treated copper foil having the above-mentioned structure can be manufactured according to a method known in the art. Here, the SMr1, Spk, and Sk of the surface treatment layer can be controlled by adjusting the formation conditions of the surface treatment layer, especially the formation conditions of the roughening treatment layer.

本發明之實施形態1之表面處理銅箔將使表面處理層之突出峰部與中心部分離之負荷面積率SMr1控制在16〜28%,因此於表面處理銅箔之表面處理層接著樹脂基材之情形時,由於突出峰部之存在而能夠容易使剝離力朝向突出峰部之高度方向分散。因此,該表面處理銅箔可提高與樹脂基材、尤其是適合高頻用途之樹脂基材之接著性。The surface-treated copper foil of the first embodiment of the present invention controls the load area ratio SMr1, which separates the protruding peak portion from the center portion of the surface-treated layer, to 16-28%, so the surface-treated layer of the surface-treated copper foil is connected to the resin substrate In this case, due to the existence of the protruding peak, the peeling force can be easily dispersed in the height direction of the protruding peak. Therefore, the surface-treated copper foil can improve adhesion to resin substrates, especially resin substrates suitable for high-frequency applications.

本發明之實施形態1之覆銅積層板可藉由於上述表面處理銅箔之表面處理層接著樹脂基材而製造。 作為樹脂基材,並無特別限定,可使用本技術領域中公知之樹脂基材。作為樹脂基材之例,可列舉:紙基材酚系樹脂、紙基材環氧樹脂、合成纖維布基材環氧樹脂、玻璃布-紙複合基材環氧樹脂、玻璃布-玻璃不織布複合基材環氧樹脂、玻璃布基材環氧樹脂、聚酯膜、聚醯亞胺膜、液晶聚合物、氟樹脂等。The copper-clad laminated board of the first embodiment of the present invention can be manufactured by bonding the surface treatment layer of the above-mentioned surface-treated copper foil to a resin substrate. The resin substrate is not particularly limited, and resin substrates known in this technical field can be used. Examples of resin substrates include: paper-based phenol resin, paper-based epoxy resin, synthetic fiber cloth-based epoxy resin, glass cloth-paper composite substrate epoxy resin, glass cloth-glass nonwoven composite Base material epoxy resin, glass cloth base material epoxy resin, polyester film, polyimide film, liquid crystal polymer, fluororesin, etc.

作為表面處理銅箔與樹脂基材之接著方法,並無特別限定,可依據本技術領域中公知之方法進行。例如,使表面處理銅箔與樹脂基材積層並進行熱壓接合即可。 如上所示地製造之覆銅積層板可用於製造印刷配線板。The bonding method of the surface-treated copper foil and the resin substrate is not particularly limited, and it can be performed according to a method known in the technical field. For example, what is necessary is just to laminate a surface-treated copper foil and a resin base material, and to perform thermocompression bonding. The copper clad laminated board manufactured as shown above can be used to manufacture printed wiring boards.

本發明之實施形態1之覆銅積層板使用上述表面處理銅箔,因此可提高與樹脂基材、尤其是適合高頻用途之樹脂基材之接著性。The copper-clad laminated board of the first embodiment of the present invention uses the above-mentioned surface-treated copper foil, and therefore can improve the adhesiveness with a resin substrate, especially a resin substrate suitable for high-frequency applications.

本發明之實施形態1之印刷配線板可藉由對上述覆銅積層板之表面處理銅箔進行蝕刻形成電路圖案而製造。作為電路圖案之形成方法,並無特別限定,可使用減成法、半加成法等公知之方法。其中,電路圖案之形成方法較佳為減成法。The printed wiring board of Embodiment 1 of the present invention can be manufactured by etching the surface-treated copper foil of the above-mentioned copper-clad laminated board to form a circuit pattern. The method of forming the circuit pattern is not particularly limited, and known methods such as a subtractive method and a semi-additive method can be used. Among them, the method of forming the circuit pattern is preferably a subtractive method.

於藉由減成法製造印刷配線板之情形時,較佳為以如下方式進行。首先,對覆銅積層板之表面處理銅箔的表面塗佈抗蝕劑,進行曝光及顯影而形成特定抗蝕圖案。其次,藉由蝕刻將未形成抗蝕圖案之部分(不需要的部分)之表面處理銅箔去除而形成電路圖案。最後,去除表面處理銅箔上之抗蝕圖案。 再者,該減成法中之各種條件並無特別限定,可依據本技術領域中公知之條件進行。In the case of manufacturing a printed wiring board by a subtractive method, it is preferably performed as follows. First, a resist is applied to the surface of the surface-treated copper foil of the copper-clad laminate, and exposed and developed to form a specific resist pattern. Secondly, the surface-treated copper foil of the portion where the resist pattern is not formed (unnecessary portion) is removed by etching to form a circuit pattern. Finally, remove the resist pattern on the surface-treated copper foil. Furthermore, the various conditions in the subtractive method are not particularly limited, and can be performed according to conditions known in the technical field.

本發明之實施形態1之印刷配線板使用上述覆銅積層板,故樹脂基材、尤其是適合高頻用途之樹脂基材與電路圖案之間的接著性優異。The printed wiring board according to the first embodiment of the present invention uses the above-mentioned copper-clad laminate, so the resin substrate, especially suitable for high-frequency applications, has excellent adhesion between the resin substrate and the circuit pattern.

(實施形態2) 本發明之實施形態2係關於一種表面處理銅箔,其具有銅箔及形成於銅箔之至少一面之表面處理層,表面處理層之突出峰部高度Spk為1.2〜2.5 μm。 又,本發明之實施形態2係關於一種覆銅積層板,其具備上述表面處理銅箔及與上述表面處理銅箔之表面處理層接著之樹脂基材。 進而,本發明之實施形態2係關於一種印刷配線板,其具備對上述覆銅積層板之表面處理銅箔進行蝕刻所形成之電路圖案。 再者,於本發明之實施形態2之說明中,省略關於與本發明之實施形態1相同之特徵的說明。(Embodiment 2) The second embodiment of the present invention relates to a surface-treated copper foil, which has a copper foil and a surface-treated layer formed on at least one surface of the copper foil, and the protrusion peak height Spk of the surface-treated layer is 1.2~2.5 μm. In addition, the second embodiment of the present invention relates to a copper-clad laminate including the above-mentioned surface-treated copper foil and a resin substrate bonded to the surface-treated layer of the above-mentioned surface-treated copper foil. Furthermore, Embodiment 2 of this invention relates to a printed wiring board provided with the circuit pattern formed by etching the surface-treated copper foil of the said copper clad laminated board. Furthermore, in the description of the second embodiment of the present invention, the description of the same features as those of the first embodiment of the present invention will be omitted.

於本發明之實施形態2之表面處理銅箔中,藉由將表面處理層之Spk設為1.2 μm以上,由於突出峰部之存在而能夠容易使剝離力朝向突出峰部之高度方向分散,因此表面處理銅箔與樹脂基材之接著力變高。另一方面,藉由將表面處理層之Spk設為2.5 μm以下,可抑制由集膚效應所導致之傳輸損耗之增大。In the surface-treated copper foil of the second embodiment of the present invention, by setting the Spk of the surface-treated layer to 1.2 μm or more, the peeling force can be easily dispersed in the height direction of the protruding peak due to the existence of the protruding peak. The adhesion between the surface-treated copper foil and the resin substrate becomes higher. On the other hand, by setting the Spk of the surface treatment layer to 2.5 μm or less, the increase in transmission loss caused by the skin effect can be suppressed.

於表面處理層中,表面處理層之中心部之水平差Sk較佳為1.0〜2.0 μm。 藉由將表面處理層之Sk設為1.0 μm以上,使中心部之上表面為凸凹面狀,能夠容易使剝離力朝向中心部之高度方向分散,因此表面處理銅箔與樹脂基材之接著力變高。另一方面,藉由將表面處理層之Sk設為2.0 μm,可抑制由集膚效應所導致之傳輸損耗之增大。In the surface treatment layer, the level difference Sk at the center of the surface treatment layer is preferably 1.0 to 2.0 μm. By setting the Sk of the surface treatment layer to 1.0 μm or more, the upper surface of the center part is made convex and concave, and the peeling force can be easily dispersed in the height direction of the center part. Therefore, the adhesion of the surface treatment copper foil to the resin substrate Becomes high. On the other hand, by setting the Sk of the surface treatment layer to 2.0 μm, the increase in transmission loss caused by the skin effect can be suppressed.

本發明之實施形態2之表面處理銅箔可依據本技術領域中公知之方法製造。此處,表面處理層之Spk及Sk可藉由調整表面處理層之形成條件、尤其是上述粗化處理層之形成條件等而進行控制。The surface-treated copper foil of Embodiment 2 of the present invention can be manufactured according to a method known in the art. Here, the Spk and Sk of the surface treatment layer can be controlled by adjusting the formation conditions of the surface treatment layer, especially the formation conditions of the above-mentioned roughening treatment layer.

本發明之實施形態2之表面處理銅箔將表面處理層之突出峰部高度Spk控制在1.2〜2.5 μm,因此由於突出峰部之存在而能夠容易使剝離力朝向突出峰部之高度方向分散。因此,該表面處理銅箔可提高與樹脂基材、尤其是適合高頻用途之樹脂基材之接著性。In the surface-treated copper foil of the second embodiment of the present invention, the protrusion peak height Spk of the surface treatment layer is controlled to 1.2~2.5 μm, so the peeling force can be easily dispersed in the height direction of the protrusion peak due to the existence of the protrusion peak. Therefore, the surface-treated copper foil can improve adhesion to resin substrates, especially resin substrates suitable for high-frequency applications.

本發明之實施形態2之覆銅積層板可藉由於上述表面處理銅箔之表面處理層接著樹脂基材而製造。 本發明之實施形態2之覆銅積層板使用了上述表面處理銅箔,因此可提高與樹脂基材、尤其是適合高頻用途之樹脂基材之接著性。The copper-clad laminated board of the second embodiment of the present invention can be manufactured by bonding the surface treatment layer of the above-mentioned surface-treated copper foil to a resin substrate. The copper-clad laminated board of the second embodiment of the present invention uses the above-mentioned surface-treated copper foil, and therefore can improve the adhesion with the resin substrate, especially the resin substrate suitable for high-frequency applications.

本發明之實施形態2之印刷配線板可藉由對上述覆銅積層板之表面處理銅箔進行蝕刻形成電路圖案而製造。 本發明之實施形態2之印刷配線板使用了上述覆銅積層板,因此樹脂基材、尤其是適合高頻用途之樹脂基材與電路圖案之間的接著性優異。The printed wiring board of the second embodiment of the present invention can be manufactured by etching the surface-treated copper foil of the above-mentioned copper clad laminate to form a circuit pattern. The printed wiring board of the second embodiment of the present invention uses the above-mentioned copper-clad laminate, and therefore has excellent adhesion between the resin base material, especially the resin base material suitable for high-frequency applications, and the circuit pattern.

(實施形態3) 本發明之實施形態3係關於一種表面處理銅箔,其具有銅箔及形成於銅箔之至少一面之表面處理層,表面處理層之中心部之水平差Sk為1.0〜2.0 μm。 又,本發明之實施形態3係關於一種覆銅積層板,其具備上述表面處理銅箔及與上述表面處理銅箔之表面處理層接著之樹脂基材。 進而,本發明之實施形態3係關於一種印刷配線板,其具備對上述覆銅積層板之表面處理銅箔進行蝕刻所形成之電路圖案。 再者,於本發明之實施形態3之說明中,省略關於與本發明之實施形態1相同之特徵。(Embodiment 3) The third embodiment of the present invention relates to a surface-treated copper foil, which has a copper foil and a surface-treated layer formed on at least one side of the copper foil, and the level difference Sk at the center of the surface-treated layer is 1.0 to 2.0 μm. In addition, the third embodiment of the present invention relates to a copper-clad laminate including the above-mentioned surface-treated copper foil and a resin substrate bonded to the surface-treated layer of the above-mentioned surface-treated copper foil. Furthermore, Embodiment 3 of this invention relates to a printed wiring board provided with the circuit pattern formed by etching the surface-treated copper foil of the said copper clad laminated board. In addition, in the description of the third embodiment of the present invention, the same features as those of the first embodiment of the present invention are omitted.

於本發明之實施形態3之表面處理銅箔中,藉由將表面處理層之Sk設為1.0 μm以上,使中心部之上表面為凸凹面狀,能夠容易使剝離力朝向中心部之高度方向分散,因此表面處理銅箔與樹脂基材之接著力變高。另一方面,藉由將表面處理層之Sk設為2.0 μm以下,可抑制由集膚效應所導致之傳輸損耗之增大。In the surface-treated copper foil of the third embodiment of the present invention, by setting the Sk of the surface-treated layer to 1.0 μm or more, the upper surface of the center part is made convex and concave, and the peeling force can be easily directed toward the height direction of the center part. Disperse, so the adhesion between the surface-treated copper foil and the resin substrate becomes higher. On the other hand, by setting the Sk of the surface treatment layer to 2.0 μm or less, the increase in transmission loss caused by the skin effect can be suppressed.

本發明之實施形態3之表面處理銅箔可依據本技術領域中公知之方法而製造。此處,表面處理層之Sk可藉由調整表面處理層之形成條件、尤其是上述粗化處理層之形成條件等而進行控制。The surface-treated copper foil of Embodiment 3 of the present invention can be manufactured according to a method known in the art. Here, the Sk of the surface treatment layer can be controlled by adjusting the formation conditions of the surface treatment layer, especially the formation conditions of the above-mentioned roughening treatment layer.

本發明之實施形態3之表面處理銅箔將表面處理層之中心部之水平差Sk控制在1.0〜2.0 μm,因此使中心部之上表面為凸凹面狀,能夠容易使剝離力朝向中心部之高度方向分散。因此,該表面處理銅箔可提高與樹脂基材、尤其是適合高頻用途之樹脂基材之接著性。The surface treatment copper foil of the third embodiment of the present invention controls the level difference Sk of the center part of the surface treatment layer to 1.0~2.0 μm, so the upper surface of the center part is made convex and concave, and the peeling force can be easily directed toward the center part. Dispersion in height direction. Therefore, the surface-treated copper foil can improve adhesion to resin substrates, especially resin substrates suitable for high-frequency applications.

本發明之實施形態3之覆銅積層板可藉由於上述表面處理銅箔之表面處理層接著樹脂基材而製造。 本發明之實施形態3之覆銅積層板使用了上述表面處理銅箔,因此可提高與樹脂基材、尤其是適合高頻用途之樹脂基材之接著性。The copper-clad laminated board of the third embodiment of the present invention can be manufactured by bonding the surface treatment layer of the above-mentioned surface-treated copper foil to a resin substrate. The copper clad laminated board of the third embodiment of the present invention uses the above-mentioned surface-treated copper foil, and therefore can improve the adhesion to the resin substrate, especially the resin substrate suitable for high-frequency applications.

本發明之實施形態3之印刷配線板可藉由對上述覆銅積層板之表面處理銅箔進行蝕刻形成電路圖案而製造。 本發明之實施形態3之印刷配線板使用了上述覆銅積層板,因此樹脂基材、尤其是適合高頻用途之樹脂基材與電路圖案之間的接著性優異。 [實施例]The printed wiring board of Embodiment 3 of the present invention can be manufactured by etching the surface-treated copper foil of the above-mentioned copper-clad laminated board to form a circuit pattern. The printed wiring board of the third embodiment of the present invention uses the above-mentioned copper-clad laminate, and therefore has excellent adhesion between the resin base material, especially the resin base material suitable for high-frequency applications, and the circuit pattern. [Example]

以下,藉由實施例對本發明之實施形態進一步具體地進行說明,但本發明並不受該等實施例任何限定。Hereinafter, the embodiments of the present invention will be described in further detail with examples, but the present invention is not limited in any way by these examples.

(實施例1) 準備壓延銅箔A(再結晶化後之楊氏模數為120 GPa、厚度為12 μm),對其中一面進行脫脂及酸洗後,形成粗化處理層作為表面處理層,藉此獲得表面處理銅箔。粗化處理層之形成條件如下所示。 <一次粗化粒子之形成條件R1> 鍍覆液組成:11 g/L之Cu、50 g/L之硫酸 鍍覆液溫度:25℃ 電鍍條件:電流密度35.6 A/dm2 、庫侖量72.7 As/dm2 (Example 1) Prepare rolled copper foil A (Young's modulus after recrystallization is 120 GPa, thickness is 12 μm), one side is degreased and pickled, and a roughening treatment layer is formed as the surface treatment layer. Thereby, a surface-treated copper foil is obtained. The formation conditions of the roughened layer are as follows. <Formation condition R1 of primary coarsening particles> Plating bath composition: 11 g/L Cu, 50 g/L sulfuric acid Plating bath temperature: 25℃ Plating conditions: current density 35.6 A/dm 2 , coulomb amount 72.7 As /dm 2

(覆蓋鍍覆層之形成條件R2) 鍍覆液組成:20 g/L之Cu、100 g/L之硫酸 鍍覆液溫度:50℃ 電鍍條件:電流密度9.9 A/dm2 、庫侖量30.3 As/dm2 (Formation condition R2 of covering coating layer) Composition of plating solution: 20 g/L Cu, 100 g/L sulfuric acid plating temperature: 50℃ Electroplating conditions: current density 9.9 A/dm 2 , coulomb amount 30.3 As /dm 2

(二次粗化粒子40之形成條件Y) 鍍覆液組成:15.5 g/L之Cu、7.5 g/L之Co、9.5 g/L之Ni pH:2.4 鍍覆液溫度:36℃ 電鍍條件:電流密度33.1 A/dm2 、庫侖量44.8 As/dm2 (Formation condition Y of secondary coarsening particles 40) Composition of plating solution: 15.5 g/L Cu, 7.5 g/L Co, 9.5 g/L Ni pH: 2.4 Plating bath temperature: 36℃ Plating conditions: Current density 33.1 A/dm 2 , Coulomb amount 44.8 As/dm 2

(實施例2〜14、及比較例1) 如表1所示地變更壓延銅箔之種類、R1、R2及Y之電流密度及庫侖量中之至少一者,除此以外與實施例1同樣地進行而獲得表面處理銅箔。再者,於表1中,壓延銅箔B為再結晶化後之楊氏模數為85 GPa、厚度為12 μm之壓延銅箔。(Examples 2-14, and Comparative Example 1) Except changing at least one of the type of rolled copper foil, the current density of R1, R2, and Y, and the amount of coulomb as shown in Table 1, it carried out similarly to Example 1, and obtained the surface-treated copper foil. Furthermore, in Table 1, rolled copper foil B is a rolled copper foil with a Young's modulus of 85 GPa after recrystallization and a thickness of 12 μm.

[表1]    壓延銅箔之種類 電流密度(A/dm2 庫侖量(As/dm2 R1 R2 Y R1 R2 Y R1/R2 實施例1 A 35.6 9.9 33.1 72.7 30.3 44.8 2.4 實施例2 A 35.6 9.9 36.0 72.7 30.3 47.1 2.4 實施例3 A 35.6 9.9 37.8 72.7 30.3 49.4 2.4 實施例4 A 31.1 9.9 31.0 47.5 22.7 30.5 2.1 實施例5 A 39.3 4.9 30.9 80.3 15.2 40.4 5.3 實施例6 A 59.9 9.9 41.2 91.6 22.7 40.4 4.0 實施例7 A 51.6 9.9 41.2 78.9 22.7 40.4 3.5 實施例8 A 34.2 9.9 31.0 69.5 22.7 40.4 3.1 實施例9 A 34.2 9.9 29.3 69.5 22.7 36.9 3.1 實施例10 A 31.1 13.2 31.4 63.2 30.3 40.4 2.1 實施例11 B 41.9 6.6 31.0 85.3 15.2 40.4 5.6 實施例12 B 45.0 9.9 25.1 91.6 22.7 32.8 4.0 實施例13 B 45.0 9.9 19.3 91.6 22.7 18.0 4.0 實施例14 B 51.6 9.9 41.2 78.9 22.7 40.4 3.5 比較例1 B 45.3 4.7 30.1 61.5 7.2 26.9 8.6 [Table 1] Types of rolled copper foil Current density (A/dm 2 ) Coulomb amount (As/dm 2 ) R1 R2 Y R1 R2 Y R1/R2 Example 1 A 35.6 9.9 33.1 72.7 30.3 44.8 2.4 Example 2 A 35.6 9.9 36.0 72.7 30.3 47.1 2.4 Example 3 A 35.6 9.9 37.8 72.7 30.3 49.4 2.4 Example 4 A 31.1 9.9 31.0 47.5 22.7 30.5 2.1 Example 5 A 39.3 4.9 30.9 80.3 15.2 40.4 5.3 Example 6 A 59.9 9.9 41.2 91.6 22.7 40.4 4.0 Example 7 A 51.6 9.9 41.2 78.9 22.7 40.4 3.5 Example 8 A 34.2 9.9 31.0 69.5 22.7 40.4 3.1 Example 9 A 34.2 9.9 29.3 69.5 22.7 36.9 3.1 Example 10 A 31.1 13.2 31.4 63.2 30.3 40.4 2.1 Example 11 B 41.9 6.6 31.0 85.3 15.2 40.4 5.6 Example 12 B 45.0 9.9 25.1 91.6 22.7 32.8 4.0 Example 13 B 45.0 9.9 19.3 91.6 22.7 18.0 4.0 Example 14 B 51.6 9.9 41.2 78.9 22.7 40.4 3.5 Comparative example 1 B 45.3 4.7 30.1 61.5 7.2 26.9 8.6

對於上述實施例及比較例中所獲得之表面處理銅箔,使用掃描電子顯微鏡(SEM)觀察表面處理層之表面狀態。其結果,於實施例1〜14中確認到許多粗化粒子(尤其是二次粗化粒子)呈樹枝狀擴展之結構,相對於此,於比較例1中幾乎未確認到該結構。作為代表例,將實施例1及比較例1之表面處理銅箔之表面處理層(粗化處理層)之SEM照片(20,000倍、傾斜40°)示於圖2中。For the surface-treated copper foil obtained in the above-mentioned examples and comparative examples, the surface state of the surface-treated layer was observed using a scanning electron microscope (SEM). As a result, many roughened particles (especially secondary roughened particles) were confirmed to have a dendritic structure in Examples 1-14. In contrast, in Comparative Example 1, this structure was hardly confirmed. As a representative example, SEM photographs (20,000 times, 40° inclination) of the surface treatment layer (roughening treatment layer) of the surface treatment copper foil of Example 1 and Comparative Example 1 are shown in FIG. 2.

繼而,對上述實施例及比較例中所獲得之表面處理銅箔進行下述特性評價。 <表面處理層之SMr1、Spk、Sk> 使用奧林巴斯股份有限公司製造之雷射顯微鏡(LEXT OLS4000)進行圖像攝影。使用奧林巴斯股份有限公司製造之雷射顯微鏡(LEXT OLS4100)之解析軟體進行所拍攝到之圖像之解析。SMr1、Spk及Sk之測定分別依據ISO 25178進行。又,該等之測定結果以任意3處測得之值之平均值為測定結果。再者,測定時之溫度設為23〜25℃。又,雷射顯微鏡及解析軟體之主要設定條件如下所示。 物鏡:MPLAPON50XLEXT(倍率:50倍、數值孔徑:0.95、液浸類型:空氣、機械鏡筒長度:∞、蓋玻璃厚度:0、視野數:FN18) 光學變焦倍率:1倍 掃描模式:XYZ高精度(高度解析度:10 nm、讀取資料之像素數:1024×1024) 讀取圖像尺寸[像素數]:橫257 μm×縱258 μm[1024×1024] (於橫向上進行測定,因此相當於257 μm之評價長度) DIC:關 多層:關 雷射強度:100 偏移(offset):0 共焦水平(confocal level):0 光束徑光闌:關 圖像平均:1次 雜訊降低:開 亮度不均修正:開 光學雜訊濾波器:開 截止:無(λc、λs、λf均無) 濾波器:高斯濾波器 雜訊去除:於測定前處理 表面(斜率)修正:實施Next, the following property evaluations were performed on the surface-treated copper foils obtained in the above-mentioned Examples and Comparative Examples. <SMr1, Spk, Sk of surface treatment layer> A laser microscope (LEXT OLS4000) manufactured by Olympus Co., Ltd. was used for image photography. Use the analysis software of the laser microscope (LEXT OLS4100) manufactured by Olympus Co., Ltd. to analyze the captured images. The measurement of SMr1, Spk and Sk is carried out in accordance with ISO 25178, respectively. In addition, the measurement result is the average of the values measured at any three places as the measurement result. Furthermore, the temperature at the time of measurement is set to 23-25°C. In addition, the main setting conditions of the laser microscope and analysis software are as follows. Objective: MPLAPON50XLEXT (magnification: 50 times, numerical aperture: 0.95, liquid immersion type: air, mechanical lens barrel length: ∞, cover glass thickness: 0, number of fields of view: FN18) Optical zoom magnification: 1 times Scanning mode: XYZ high precision (height resolution: 10 nm, number of pixels for reading data: 1024×1024) Read image size [number of pixels]: 257 μm horizontal × 258 μm vertical [1024×1024] (Measured in the horizontal direction, so it is equivalent to an evaluation length of 257 μm) DIC: Off Multi-layer: Off Laser intensity: 100 Offset: 0 Confocal level: 0 Beam path diaphragm: off Image average: 1 time Noise reduction: On Uneven brightness correction: On Optical noise filter: On Cut-off: None (none of λc, λs, λf) Filter: Gaussian filter Noise removal: processing before measurement Surface (slope) correction: implementation

<剝離強度> 使表面處理銅箔與樹脂基材[LCP:液晶聚合物樹脂(羥基苯甲酸(酯)與羥基萘甲酸(酯)之共聚物)膜(可樂麗股份有限公司製造之Vecstar(註冊商標)CTQ;厚度為50 μm或100 μm)]貼合後,於TD方向(壓延銅箔之寬度方向)上形成寬3 mm之電路。繼而,依據JIS C6471:1995測定於TD180°方向上以50 mm/分鐘之速度自樹脂基材之表面剝離電路(表面處理銅箔)時之強度(TD180°剝離強度)。進行3次測定,將其平均值作為剝離強度之結果。若剝離強度為0.50 kgf/cm以上,則可以說電路(表面處理銅箔)與樹脂基材之接著性良好。 再者,電路寬度之調整藉由使用氯化銅蝕刻液之通常之減成蝕刻方法進行。<Peel strength> Make surface treatment of copper foil and resin substrate [LCP: Liquid crystal polymer resin (copolymer of hydroxybenzoic acid (ester) and hydroxynaphthoic acid (ester)) film (Vecstar (registered trademark) CTQ manufactured by Kuraray Co., Ltd.; The thickness is 50 μm or 100 μm)] After bonding, a circuit with a width of 3 mm is formed in the TD direction (the width direction of the rolled copper foil). Then, in accordance with JIS C6471: 1995, the strength (TD180° peel strength) when the circuit (surface-treated copper foil) is peeled off the surface of the resin substrate at a speed of 50 mm/min in the TD180° direction is measured. The measurement was performed 3 times, and the average value was used as the result of the peel strength. If the peel strength is 0.50 kgf/cm or more, it can be said that the adhesion between the circuit (surface-treated copper foil) and the resin substrate is good. Furthermore, the circuit width is adjusted by the usual subtractive etching method using copper chloride etching solution.

將上述特性評價之結果示於表2中。The results of the above-mentioned characteristic evaluation are shown in Table 2.

[表2]    SMr1 (%) Spk (μm) Sk (μm) 剝離強度 (kgf/cm) 樹脂基材之厚度 (μm) 實施例1 22.1 2.14 1.12 0.85 100 實施例2 24.8 2.09 1.69 0.82 100 實施例3 26.4 2.32 1.35 0.84 100 實施例4 20.8 1.73 1.13 0.84 100 實施例5 23.0 1.56 0.30 0.69 100 實施例6 23.9 2.08 1.57 0.73 50 實施例7 22.9 1.91 1.56 0.74 50 實施例8 21.1 1.69 1.29 0.79 50 實施例9 19.4 1.54 1.15 0.63 50 實施例10 19.8 1.52 0.30 0.78 50 實施例11 22.7 1.81 1.78 0.61 50 實施例12 15.2 1.27 1.27 0.55 50 實施例13 16.3 1.28 1.50 0.58 50 實施例14 21.8 1.77 1.50 0.73 50 比較例1 15.1 0.9 0.93 0.47 50 [Table 2] SMr1 (%) Spk (μm) Sk (μm) Peel strength (kgf/cm) Thickness of resin substrate (μm) Example 1 22.1 2.14 1.12 0.85 100 Example 2 24.8 2.09 1.69 0.82 100 Example 3 26.4 2.32 1.35 0.84 100 Example 4 20.8 1.73 1.13 0.84 100 Example 5 23.0 1.56 0.30 0.69 100 Example 6 23.9 2.08 1.57 0.73 50 Example 7 22.9 1.91 1.56 0.74 50 Example 8 21.1 1.69 1.29 0.79 50 Example 9 19.4 1.54 1.15 0.63 50 Example 10 19.8 1.52 0.30 0.78 50 Example 11 22.7 1.81 1.78 0.61 50 Example 12 15.2 1.27 1.27 0.55 50 Example 13 16.3 1.28 1.50 0.58 50 Example 14 21.8 1.77 1.50 0.73 50 Comparative example 1 15.1 0.9 0.93 0.47 50

如表1所示,表面處理層之SMr1、Spk及/或Sk處於特定之範圍內之實施例1〜14之表面處理銅箔的剝離強度較高。 另一方面,表面處理層之SMr1、Spk及Sk處於特定之範圍外之比較例1之表面處理銅箔的剝離強度較低。As shown in Table 1, the surface-treated copper foils of Examples 1 to 14 in which the SMr1, Spk, and/or Sk of the surface treatment layer are within a specific range have higher peel strength. On the other hand, the surface-treated copper foil of Comparative Example 1 in which SMr1, Spk, and Sk of the surface-treated layer were outside the specified range had a low peel strength.

根據以上結果可知:根據本發明之實施形態,可提供能夠提高與樹脂基材、尤其是適合高頻用途之樹脂基材之接著性的表面處理銅箔。又,根據本發明之實施形態,可提供樹脂基材、尤其是適合高頻用途之樹脂基材與表面處理銅箔之間的接著性優異之覆銅積層板。進而,根據本發明之實施形態,可提供樹脂基材、尤其是適合高頻用途之樹脂基材與電路圖案之間的接著性優異之印刷配線板。From the above results, it can be seen that according to the embodiments of the present invention, it is possible to provide a surface-treated copper foil capable of improving the adhesion to a resin substrate, especially a resin substrate suitable for high-frequency applications. Furthermore, according to the embodiment of the present invention, it is possible to provide a copper-clad laminate having excellent adhesion between a resin substrate, particularly a resin substrate suitable for high-frequency applications, and a surface-treated copper foil. Furthermore, according to the embodiment of the present invention, it is possible to provide a printed wiring board having excellent adhesion between a resin substrate, particularly a resin substrate suitable for high-frequency applications, and a circuit pattern.

none

[圖1]係於銅箔之一面具有粗化處理層之表面處理銅箔的剖面示意圖。 [圖2]係實施例1及比較例1之表面處理銅箔之表面處理層的SEM照片。[Figure 1] is a schematic cross-sectional view of a surface-treated copper foil with a roughening treatment layer on one side of the copper foil. [Figure 2] is an SEM photograph of the surface treatment layer of the surface treatment copper foil of Example 1 and Comparative Example 1.

Claims (11)

一種表面處理銅箔,其具有銅箔及形成於上述銅箔之至少一面之表面處理層,將上述表面處理層之突出峰部與中心部分離之負荷面積率SMr1為16~28%,上述表面處理層之突出峰部高度Spk為1.2~2.5μm。 A surface-treated copper foil, which has a copper foil and a surface treatment layer formed on at least one surface of the above-mentioned copper foil, and the load area ratio SMr1 that separates the protruding peak part and the center part of the above-mentioned surface treatment layer is 16-28%, and the above-mentioned surface The height Spk of the protruding peak of the treatment layer is 1.2~2.5μm. 如請求項1之表面處理銅箔,其中,上述表面處理層之中心部之水平差Sk為1.0~2.0μm。 Such as the surface treatment copper foil of claim 1, wherein the level difference Sk of the center part of the surface treatment layer is 1.0~2.0μm. 一種表面處理銅箔,其具有銅箔及形成於上述銅箔之至少一面之表面處理層,上述表面處理層之突出峰部高度Spk為1.2~2.5μm。 A surface-treated copper foil, which has a copper foil and a surface treatment layer formed on at least one side of the copper foil, and the protrusion peak height Spk of the surface treatment layer is 1.2-2.5 μm. 如請求項3之表面處理銅箔,其中,上述表面處理層之中心部之水平差Sk為1.0~2.0μm。 Such as the surface treatment copper foil of claim 3, wherein the level difference Sk of the center part of the surface treatment layer is 1.0~2.0μm. 一種表面處理銅箔,其具有銅箔及形成於上述銅箔之至少一面之表面處理層,上述表面處理層之中心部之水平差Sk為1.0~2.0μm,將上述表面處理層之突出峰部與中心部分離之負荷面積率SMr1為16~28%。 A surface-treated copper foil, which has a copper foil and a surface treatment layer formed on at least one side of the above-mentioned copper foil, the level difference Sk of the center part of the above-mentioned surface treatment layer is 1.0~2.0μm, and the protruding peak part of the above-mentioned surface treatment layer The load area ratio SMr1 separated from the center is 16~28%. 如請求項1至5中任一項之表面處理銅箔,其中,上述表面處理層具有粗化處理層。 The surface-treated copper foil according to any one of claims 1 to 5, wherein the surface-treated layer has a roughening treatment layer. 如請求項6之表面處理銅箔,其中,上述粗化處理層包含:一次粗化粒子、被覆上述一次粗化粒子之覆蓋鍍覆層、及形成於上述覆蓋鍍覆層上之二次粗化粒子。 The surface-treated copper foil of claim 6, wherein the roughening treatment layer includes: primary roughening particles, a covering plating layer covering the primary roughening particles, and a secondary roughening formed on the covering plating layer particle. 如請求項6之表面處理銅箔,其中,上述表面處理層於上述粗化處理層上進而具有選自由耐熱處理層、防銹處理層、鉻酸鹽處理層及矽烷偶合處理層所組成之群中之1種以上之層。 The surface treatment copper foil of claim 6, wherein the surface treatment layer further has a heat-resistant treatment layer, an anti-rust treatment layer, a chromate treatment layer, and a silane coupling treatment layer on the roughening treatment layer One or more of the layers. 如請求項1至5中任一項之表面處理銅箔,其中,上述銅箔為壓延銅箔。 The surface-treated copper foil according to any one of claims 1 to 5, wherein the above-mentioned copper foil is a rolled copper foil. 一種覆銅積層板,其具備請求項1至9中任一項之表面處理銅箔及與上述表面處理銅箔之表面處理層接著之樹脂基材。 A copper-clad laminated board is provided with the surface-treated copper foil of any one of claims 1 to 9 and a resin substrate bonded to the surface-treated layer of the above-mentioned surface-treated copper foil. 一種印刷配線板,其具備對請求項10之覆銅積層板之上述表面處理銅箔進行蝕刻所形成之電路圖案。 A printed wiring board provided with a circuit pattern formed by etching the above-mentioned surface-treated copper foil of the copper-clad laminated board of claim 10.
TW109137201A 2019-12-13 2020-10-27 Surface treatment copper foil, copper clad laminate and printed wiring board TWI749827B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP2019-225893 2019-12-13
JP2019225893A JP7300976B2 (en) 2019-12-13 2019-12-13 Surface treated copper foil, copper clad laminate and printed wiring board

Publications (2)

Publication Number Publication Date
TW202122641A TW202122641A (en) 2021-06-16
TWI749827B true TWI749827B (en) 2021-12-11

Family

ID=76329739

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109137201A TWI749827B (en) 2019-12-13 2020-10-27 Surface treatment copper foil, copper clad laminate and printed wiring board

Country Status (3)

Country Link
JP (1) JP7300976B2 (en)
TW (1) TWI749827B (en)
WO (1) WO2021117338A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI802225B (en) * 2021-07-09 2023-05-11 日商Jx金屬股份有限公司 Surface treated copper foil, copper clad laminate and printed wiring board
JPWO2023281776A1 (en) * 2021-07-09 2023-01-12

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201722219A (en) * 2015-08-06 2017-06-16 Jx Nippon Mining & Metals Corp Carrier-Attached Copper Foil, Laminate, Method For Producing Printed Wiring Board, And Method For Producing Electronic Device
TW201742212A (en) * 2016-04-14 2017-12-01 三井金屬鑛業股份有限公司 Treated surface copper foil, copper foil with carrier as well as methods for manufacturing copper-clad laminate and printed circuit board using same

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014152352A (en) 2013-02-06 2014-08-25 Sh Copper Products Corp Composite copper foil and production method thereof
JP7409760B2 (en) 2016-12-05 2024-01-09 Jx金属株式会社 Method for manufacturing surface-treated copper foil, copper foil with carrier, laminate, printed wiring board, and manufacturing method for electronic equipment
JP2019178416A (en) 2018-03-30 2019-10-17 Jx金属株式会社 Metal material, printed wiring board, printed wiring board manufacturing method, and electronic equipment manufacturing method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201722219A (en) * 2015-08-06 2017-06-16 Jx Nippon Mining & Metals Corp Carrier-Attached Copper Foil, Laminate, Method For Producing Printed Wiring Board, And Method For Producing Electronic Device
TW201742212A (en) * 2016-04-14 2017-12-01 三井金屬鑛業股份有限公司 Treated surface copper foil, copper foil with carrier as well as methods for manufacturing copper-clad laminate and printed circuit board using same

Also Published As

Publication number Publication date
TW202122641A (en) 2021-06-16
JP2021095595A (en) 2021-06-24
WO2021117338A1 (en) 2021-06-17
JP7300976B2 (en) 2023-06-30

Similar Documents

Publication Publication Date Title
TW202122642A (en) Surface-treated copper foil, copper-clad laminate plate, and printed wiring board
TWI716210B (en) Surface treatment copper foil, copper clad laminate and printed wiring board
TWI749827B (en) Surface treatment copper foil, copper clad laminate and printed wiring board
TWI747088B (en) Surface treatment copper foil, copper clad laminate and printed wiring board
JP2019210520A (en) Surface-treated copper foil, copper-clad laminate and printed wiring board
WO2024070247A1 (en) Surface-treated copper foil, copper-cladded laminate plate, and printed wiring board
WO2024070248A1 (en) Surface-treated copper foil, copper-clad laminate, and printed wiring board
WO2022153580A1 (en) Surface-treated copper foil, copper-clad laminate, and printed wiring board
WO2024070245A1 (en) Surface-treated copper foil, copper-clad laminate plate, and printed wiring board
WO2024070246A1 (en) Surface-treated copper foil, copper-cladded laminate plate, and printed wiring board
WO2023281759A1 (en) Surface-treated copper foil, copper-clad laminate, and printed wiring board
WO2023281777A1 (en) Surface-treated copper foil, copper-clad laminate plate, and printed wiring board
WO2023281774A1 (en) Surface-treated copper foil, copper-clad laminate and printed wiring board
WO2023281778A1 (en) Surface-treated copper foil, copper-clad laminate board, and printed wiring board
WO2023281776A1 (en) Surface-treated copper foil, copper-cladded laminate plate, and printed wiring board
WO2023281775A1 (en) Surface-treated copper foil, copper-clad laminate, and printed wiring board
TW202413724A (en) Surface treated copper foil, copper clad laminates and printed wiring boards
TW202413736A (en) Surface treated copper foil, copper clad laminates and printed wiring boards
TW202415155A (en) Surface treated copper foil, copper clad laminates and printed wiring boards
TW202415156A (en) Surface treated copper foil, copper clad laminates and printed wiring boards