TW202221341A - Handler, tester, and testing equipment - Google Patents

Abstract

The present invention reveals a handler, having a framework and a correction assembly. The framework has a testing zone which is adapted for a tester to be disposed thereto. The tester has a testing socket for receiving and testing electronic component. The correction assembly has several distance sensors. The distance sensors are disposed beneath the framework, detecting at several reference points respectively to determine the certain distance between the framework and the tester at several different points. Therefore, parallelity between the framework and the tester could be timely detected for installing and assembling the framework and the tester, enhancing assembling efficiency of the testing equipment.

Description

Test work machines, test machines and test equipment

The present invention provides a calibration unit which can be applied to a test work machine, a test machine and a test equipment to improve the assembly accuracy and assembly convenience of the machine and the test machine.

At present, electronic component testing equipment includes a test machine and a test machine. The test machine is equipped with testers with different numbers of test seats according to the operation needs. Before the test operation, the test machine is assembled under the machine table of the test machine , so that the tester can hold and test electronic components.

Please refer to FIG. 1 , the testing machine 10 is provided with a through hole 12 in the testing area of the machine table 11 , and a positioning mechanism is provided on the bottom surface. The support plate 21 is provided with a plurality of support members 22 and a tester. The tester includes an electrically connected circuit board 23 and a test seat 24. The test seat 24 is used to support and test electronic components. The tester 20 is also corresponding to the support plate 21. The positions of the plurality of guides 131 are provided with a plurality of joints 25; before the test operation, the staff moves the test machine 20 to the bottom of the machine table 11 of the test machine 10, and visually inspects the plurality of pieces of the test machine 20 The engaging pieces 25 are aligned and joined to the plurality of guide pieces 131 of the machine table 11, and then the plurality of catch pieces 132 of the positioning mechanism are used to catch the plurality of catch pieces 22 of the testing machine 20, and the testing machine 20 is positioned on the machine stand Below the test area of 11 , a plurality of test seats 24 are inserted through the through holes 12 of the machine table 11 for performing the operation of testing electronic components.

Of course, the test seat 24 has a plurality of probes for electrically contacting a plurality of contacts of the electronic components. If one of the probes cannot contact the contacts, the test yield of the electronic components will be affected. However, the current assembly of the tester 20 During the operation, the staff only visually assembles the testing machine 20 under the machine table 11 of the testing machine 10, and cannot ensure the parallelism of the assembly of the testing machine 20 and the machine table 11, because the testing machine 20 is easily assembled on the machine table with a slight tilt 11. As a result, the test seat 24 on the testing machine 20 is in an inclined configuration, so that the probes of the testing seat 24 cannot contact the contacts of the electronic components, thereby affecting the test yield of the electronic components. The inclined assembly will significantly affect the test quality.

Furthermore, since the testing machine 20 is bulky and is assembled under the machine table 11 , and the plurality of guides 131 are respectively disposed on the front half and the rear half of the bottom surface of the machine table 11 , the staff must be in a very small and dark space. , the plurality of joints 25 of the testing machine 20 are adjusted and aligned with the plurality of guide pieces 131 of the positioning table 11 by visual means, and the testing machine 20 and the machine table 11 can be assembled, which is not only time-consuming but also impossible to assemble. In order to improve the assembly performance, it is more likely that the joint member 25 or the guide member 131 may be damaged due to the repeated alignment during manual visual assembly, thereby affecting the stability of the assembly and positioning of the testing machine 20 in the future.

The first objective of the present invention is to provide a testing machine, including a machine and a calibration unit. The machine is provided with a test area for accommodating a tester. The tester performs testing operations on electronic components, and the calibration unit is located in the test area of the machine. There are a plurality of distance sensors on the bottom surface, and the plurality of distance sensors sense whether the distance values of the reference stations at different positions are the same, so as to detect the parallelism of the reference stations and the machine, which can be used in real time. Correct the assembly angle of the machine or multiple reference stations, thereby improving the assembly performance of the test machine.

The second objective of the present invention is to provide a testing machine, which includes a support plate and a calibration unit, the support plate is used for assembling a tester, the calibration unit is provided with a plurality of distance sensors on the support plate, and the plurality of distance sensors sense a plurality of different distances. Whether the distance values of the reference stations of the position are the same, it is used to check the parallelism of multiple reference stations and the support plate, and the assembly angle of the support plate or multiple reference stations can be corrected in real time, thereby improving the assembly efficiency of the testing machine.

The third objective of the present invention is to provide a test equipment, including a test machine, a test machine and a calibration unit. The test machine is provided with a test area on the machine table, the test machine is provided with a support plate, and the calibration unit is provided with a plurality of distance sensors and a plurality of reference stations, a plurality of distance sensors are assembled on one of the machine table and the support plate, and a plurality of reference stations are set on the other of the machine table or the support plate, and are relative to the plurality of distance sensors A tester, before the test machine is assembled on the test work machine, uses a plurality of distance sensors of the calibration unit to sense whether the distance values of a plurality of reference stations at different positions are the same, so as to quickly detect whether the machine table and the support plate are maintained. Parallel, the parallelism of the assembly of the testing machine can be corrected and adjusted in real time, thereby improving the assembly efficiency.

The fourth object of the present invention is to provide a calibration unit, which is provided with a plurality of marking components at a plurality of reference stations, and uses a plurality of distance sensors to sense the positions of the plurality of marking components, so as to facilitate the rapid calibration of the testing machine or the testing operation. The assembly position of the machine, thereby improving the assembly efficiency.

The fifth object of the present invention is to provide a calibration unit, which utilizes a plurality of distance sensors to sense the positions of a plurality of marking components, so as to facilitate the calibration of the assembly position of the testing machine or the testing machine, without using the joints of the testing machine multiple times. Adjusting the receiving parts of the alignment machine by collision and contact can effectively prevent the damage of the connecting parts or the receiving parts, thereby prolonging the service life and facilitating the stability of the assembly and positioning of the test machine in the future.

In order to make your examiners further understand the present invention, hereby give a preferred embodiment and cooperate with the drawings, the details are as follows:

Referring to FIGS. 2 and 3 , the first embodiment of the present invention discloses a test machine 30 including a machine 31 and a calibration unit. The machine 31 is provided with a test area, and the calibration unit is provided with a plurality of calibration units on the bottom surface of the test area of the machine 31 . A distance sensor, a plurality of distance sensors sense a plurality of reference stations at different positions, so as to detect the distance values of the plurality of reference stations for calibrating the parallelism of the plurality of reference stations and the machine 31 .

Furthermore, the testing machine 30 of the present invention is equipped with a feeding device 32, a receiving device 33, a conveying device, a calibration unit and a central control device (not shown) on the machine 31, and the machine 31 is provided with at least one test area, The feeding device 32 is provided with at least one feeding holder for accommodating the electronic components to be tested, the receiving device 33 is provided with at least one receiving holder for accommodating the electronic components to be tested, and the conveying device is provided with at least one feeding device, For transferring electronic components, in this embodiment, the conveying device is provided with a first feeder 341 to take out the electronic components to be tested from the feeding device 32, and transfer the electronic components to be tested to the first stage 342. A carrier 342 is used to transfer the electronic components to be tested to the test area, and a second carrier 343 is used to carry the electronic components that have been tested. The second feeder 344 is placed on the test area, the first carrier 342 and the second carrier 344. The stage 343 transfers the electronic components to be tested and the electronic components that have been tested , the third mover 345 transfers the tested electronic components of the second stage 343 to the receiving device 33 for storage; the central control device is used to control and integrate the actions of each device, and perform automatic operations to improve the operation efficiency. Practical benefits.

In addition, the machine table 31 has a through hole 311 in the test area, and at least one guide piece and at least one positioning piece are arranged on the bottom surface of the through hole 311. Further, the guide piece can be a guide pin or a slot for positioning The components can be clamps or bolts; in this embodiment, the machine 31 is provided with a positioning mechanism on the bottom surface of the through hole 311 in the test area, and the positioning mechanism is provided with a plurality of first guide pieces 351 and a plurality of second guide pieces 351 . The first guide member 351 is a guide pin, the second guide member 352 is a slot, and the plurality of positioning members 353 are driven by the driving source to move in the X direction.

The calibration unit is provided with a plurality of distance sensors on the bottom surface of the test area of the machine 31, and the plurality of distance sensors sense whether the distance values of the reference stations at different positions are the same, so as to detect the plurality of reference stations. The parallelism with the machine table 31 can instantly correct the assembly angle of the machine table 31 or a plurality of reference stations.

Furthermore, the distance sensor can be a laser distance sensor, and the light projection part of the distance sensor can be directed towards the reference station, or it can be used with a reflector according to operational requirements, for example, the light projection part of the distance sensor can be directed towards the reflection mirror, and reflect the light to the reference station through the mirror.

The reference station of the calibration unit is located at any part of the object to be inspected (such as the testing machine, the ground or the desktop) relative to the distance sensor. For example, the reference station can be located on the support plate of the testing machine. When the test area of the machine 31 is below, it is used for the distance sensor to sense the distance of the reference station of the object to be detected.

Furthermore, the distance sensor can be installed on the bottom surface of the machine table 31 or any element located on the bottom surface of the machine table 31 according to the operation requirements. in this embodiment.

Furthermore, the distance sensor can be fixed on the bottom surface of the machine table 31 or can be moved on the bottom surface of the machine table 31 according to the operation requirements. The distance sensor is driven to move in at least one direction to adjust the use position of the distance sensor.

Further, the calibration unit is provided with a processor to receive the sensing data transmitted by the plurality of distance sensors to determine whether the plurality of reference stations and the machine 31 maintain the same distance, and the processor is connected to at least one display for displaying sensing data.

In this embodiment, the calibration unit is provided with a plurality of distance sensors 36 on the bottom surface of the test area of the machine 31 and on the peripheral side of the through hole 311 . The distance sensor 36 has a light projection portion 361 and is a laser For the distance sensor, the light-projecting portion 361 of the distance sensor 36 faces the reference station, that is, the light-projecting portion 361 of the distance sensor 36 faces downward, so as to project light to the reference station below the machine 31 .

Please refer to FIGS. 2 , 3 and 4 . The testing machine 30 of the present invention is used for assembling an object that is a testing machine 40 . The testing machine 40 has a support plate 41 , and the base 42 of the support board 41 is used for assembling a tester. The tester includes electrical properties The connected circuit board 43 and the test seat 44 with probes, the circuit board 43 is electrically connected to the test machine 40 , the test seat 44 is used for holding and testing electronic components, and the test machine 40 is also on the support plate 41 corresponding to the test machine 30 . The positions of the first guide piece 351 and the second guide piece 352 are arranged with the first joint piece 451 and the second joint piece 452 , and the positioning mechanism is provided with a stopper 453 at the position of the pedestal 42 corresponding to the positioning piece 353 ; The bulky testing machine 40 is moved under the machine table 31 of the testing machine 30, and the tester is positioned relative to the through hole 311 of the testing area of the machine table 31, since the support plate 41 of the testing machine 40 is located in a plurality of distance senses of the calibration unit The detection path of the detector 36 is determined, and the calibration unit can use the positions of the support plate 41 corresponding to the plurality of distance sensors 36 as the plurality of reference stations A.

During calibration, the calibration unit uses a plurality of distance sensors 36 to project light to a plurality of reference stations A on the support plate 41 of the testing machine 40 according to the detection path, since the plurality of distance sensors 36 are located on the machine table. A plurality of different positions (such as the front half and the rear half) of the bottom surface of the 31 can sense the distance values of the reference station A in a plurality of different positions of the support plate 41. If the plurality of distance sensors 36 sense a plurality of The distance values are the same, which means that the support plate 41 of the testing machine 40 and the machine table 31 of the testing machine 30 are kept parallel, and the testing machine 40 can be directly assembled under the testing area of the machine table 31, so that the test seat 44 can be placed in the machine table. The through hole 311 of 31 is used for performing electronic component testing operations. On the contrary, if the distance values sensed by the plurality of distance sensors 36 are different, it represents the support plate 41 of the testing machine 40 and the machine of the testing machine 30. 31 is not parallel, the staff needs to correct and adjust the assembling angle of the testing machine 40; therefore, the testing machine 30 can be pre-sequenced before assembling the testing machine 40, so that the calibration unit detects the support plate 41 of the testing machine 40 and the testing machine 40. The parallelism of the machine table 31 of 30 ensures the assembly quality of the testing machine 40 and the testers on it, thereby improving the testing quality of electronic components.

Please refer to FIG. 5 , the second embodiment of the present invention is different from the first embodiment in that the calibration unit is provided with a marking component at the reference station A for the distance sensor to sense the alignment; in this embodiment, the calibration unit Marking parts 37 with colors are respectively arranged on the plurality of reference stations A of the support plate 41 of the testing machine 40; the staff moves the testing machine 40 to the bottom of the machine table 31 of the testing machine 30, and uses the plurality of distance senses of the calibration unit The detector 36 projects light to the reference station A. When the plurality of distance sensors 36 sense strong reflected light, it means that the light of the plurality of distance sensors 36 is accurately aligned with the plurality of lights on the support plate 41 The marking part 37 , that is, the plurality of first joint pieces 451 and the second joint pieces 452 of the testing machine 40 are precisely aligned with the first guide pieces 351 and the second guide pieces 352 of the test machine 30 ; therefore, the staff can The test machine 40 and the test work machine 30 are assembled quickly and accurately, thereby improving the assembly efficiency.

Please refer to FIG. 6 , a third embodiment of the present invention discloses a testing machine 40 including a support plate 41 and a calibration unit, the support plate 41 is used for assembling a tester, the tester is used for performing testing operations on electronic components, and the calibration unit is located on the support plate 41 A plurality of distance sensors are provided, and the plurality of distance sensors sense a plurality of reference stations at different positions to detect the distance values of the plurality of reference stations for calibrating the plurality of reference stations and the support plate 41 In this embodiment, the support plate 41 of the testing machine 40 is provided with a pedestal 42 for assembling the tester, and the tester includes an electrically connected circuit board 43 and a test seat 44 with probes, and the circuit board 43 is electrically connected The testing machine 40 and the test seat 44 are used for holding and testing electronic components. The testing machine 40 is further provided with a first joint piece 451 and a second joint piece 452 on the support plate 41 , and the calibration unit is provided with a circumference of the pedestal 42 of the support board 41 . A plurality of distance sensors 46 . The worker moves the testing machine 40 under the machine table 31 of a testing machine 30, and the calibration unit uses the positions of the bottom surface of the machine table 31 corresponding to the plurality of distance sensors 46 as the plurality of reference stations B, and the plurality of test machines 40 The distance sensors 46 project light toward the plurality of reference stations B of the testing machine 30 to detect whether the distance values of the plurality of reference stations B are the same. When the distance values sensed by the plurality of distance sensors 46 are the same , representing the support plate 41 of the testing machine 40 and the machine table 31 of the testing machine 30 are kept parallel, and then the testing machine 40 is assembled under the test area of the machine 31 of the testing machine 30 for accurate testing of electronic components.

Please refer to FIG. 7 , the difference between the fourth embodiment of the present invention and the third embodiment is that the calibration unit sets a marking part 47 at the reference station B for the distance sensor 46 to detect the alignment; in this embodiment, The calibration unit sets marking parts 47 with colors on the plurality of reference stations B on the bottom surface of the machine table 31 of the test sorting machine 30 . The plurality of first joint pieces 451 and the second joint pieces 452 are precisely aligned with the first guide piece 351 and the second guide piece 352 of the test machine 30 , so that the staff can quickly and accurately assemble the test machine 40 and the test machine 30, thereby improving the assembly efficiency.

Please refer to FIG. 2 to FIG. 7 , a test equipment is disclosed, including a test machine 30 , a test machine 40 and a calibration unit. The test machine 30 is provided with a machine table 31 , the test machine 40 is provided with a support plate 41 , and the calibration unit is provided with a plurality of A distance sensor and a plurality of reference stations, the plurality of distance sensors are assembled on one of the machine table 31 of the test machine 30 or the support plate 41 of the test machine 40, and the plurality of reference stations are arranged on the test machine The other one of the machine 31 of the 30 or the support plate 41 of the testing machine 40 is relative to the plurality of distance sensors , the plurality of distance sensors are used for sensing the distance values of the plurality of reference stations, and for calibrating the parallelism of the machine 31 and the support plate 41 . Furthermore, the calibration unit is provided with a marking component at the reference station for the distance sensor to detect the alignment. However, the test machine 30 of the test equipment can be equipped with a feeding device 32, a receiving device 33, a conveying device, a calibration unit and a central control device (not shown in the figure) on the machine table 31 according to the operation requirements. , the operation sequence is as described above, so it is not repeated here.

[acquaintance] 10: Test the work machine 11: Machine 12: Through hole 131: Conductor 132: Clips 20: Test machine 21: Bearing plate 22: Bearings 23: circuit board 24: Test seat 25: Joints [this invention] 30: Test the work machine 31: Machine 311: Through hole 32: Feeding device 33: Receiving device 341: First mover 342: The first stage 343: Second stage 344: Second mover 345: Third mover 351: The first lead 352: Second guide 353: Positioning pieces 36: Distance sensor 361: Light Projector 37: Marking Parts A: Base station 40: Test machine 41: Bearing plate 42: Pedestal 43: circuit board 44: Test seat 451: The first joint 452: Second joint 453: Stopper 46: Distance sensor 47: Marking Parts B: Reference station

Figure 1: The configuration diagram of the conventional test machine and the test machine. FIG. 2 is a top view of the first embodiment of the present invention. Figure 3: Front view of the first embodiment of the present invention. FIG. 4 is a schematic diagram of the use of the first embodiment of the present invention. Figure 5: A diagram of a second embodiment of the present invention. Figure 6: A diagram of a third embodiment of the present invention. Figure 7: A diagram of a fourth embodiment of the present invention.

30: Test the work machine

31: Machine

311: Through hole

351: The first lead

352: Second guide

353: Positioning pieces

36: Distance sensor

A: Base station

40: Test machine

41: Bearing plate

42: Pedestal

44: Test seat

Claims (10)

A test work machine, including: Machine: with at least one test area; Calibration unit: a plurality of distance sensors are arranged on the bottom surface of the test area of the machine, the A plurality of distance sensors sense a plurality of reference stations at different positions, so as to detect the distance values of the plurality of reference stations for calibrating the parallelism of the plurality of reference stations and the machine. The test work machine according to claim 1, wherein the bottom surface of the machine table is provided with a positioning mechanism, the The calibration unit sets the plurality of distance sensors on the positioning mechanism. The test work machine as claimed in claim 1, wherein the calibration unit is located at the plurality of reference stations With marking parts. The test work machine according to any one of claims 1 to 3, wherein the calibration unit is provided with at least a mirror opposite to the distance sensor. The test work machine according to any one of claims 1 to 3, the distance of the calibration unit The sensor is arranged on the adjuster, and the adjuster is used to drive the distance sensor to move in at least one direction to adjust the position. A test machine comprising: Bearing plate: with at least one seat; Calibration unit: a plurality of distance sensors are arranged on the carrier plate, and the plurality of distance sensors The device senses a plurality of reference stations at different positions, so as to detect the distance values of the plurality of reference stations, so as to correct the parallelism of the plurality of reference stations and the support plate. The test work machine as claimed in claim 6, wherein the calibration unit is located at the plurality of reference stations With marking parts. The test work machine as claimed in claim 6 or 7, wherein the distance sensor of the calibration unit is equipped with It is placed on the adjuster, and the adjuster is used to drive the distance sensor to move in at least one direction to adjust the position. A test device comprising: Test work machine: equipped with a machine; Testing machine: It is assembled under the machine table of the testing machine, and is provided with a support plate; Calibration unit: provided with a plurality of distance sensors and a plurality of reference stations, the plurality of A distance sensor is assembled on one of the machine table and the support plate, and the plurality of reference stations are arranged on the other one of the machine table and the support plate, and are opposite to the plurality of distance sensors, The plurality of distance sensors are used for sensing the distance values of the plurality of reference stations , which is used to correct the parallelism of the machine and the carrier. The test equipment as claimed in claim 9, wherein the calibration unit is located at the plurality of reference stations With marking parts.

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