TW202201279A - Marking device and defect marking method - Google Patents
Marking device and defect marking method Download PDFInfo
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- TW202201279A TW202201279A TW109130507A TW109130507A TW202201279A TW 202201279 A TW202201279 A TW 202201279A TW 109130507 A TW109130507 A TW 109130507A TW 109130507 A TW109130507 A TW 109130507A TW 202201279 A TW202201279 A TW 202201279A
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
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Abstract
Description
本發明是有關於一種標記設備及標記方法,且特別是有關於一種便於標記缺陷的標記設備及缺陷標記方法。The present invention relates to a marking apparatus and a marking method, and more particularly, to a marking apparatus and a defect marking method which are convenient for marking defects.
隨著科技的發展,顯示裝置被廣泛應用在許多電子産品上,如手機、平板電腦、手錶等。With the development of science and technology, display devices are widely used in many electronic products, such as mobile phones, tablet computers, watches and so on.
目前,顯示裝置液晶螢幕的檢測通常先用檢測機台進行檢測,當檢測到液晶螢幕存在缺陷時,操作人員將液晶螢幕從檢測機台取下,放置到複判機台上進行複判,然後,再將液晶螢幕重新放置到檢測機台上對缺陷區域進行缺陷拍照,並根據複判結果對拍照的圖片進行缺陷標注,並將標注後的圖片儲存在檢測機台中。現有的缺陷標注方式需要在檢測機台和複判機台之間傳送液晶螢幕,工作效率低下。At present, the inspection of the LCD screen of the display device is usually carried out by the inspection machine first. When a defect in the LCD screen is detected, the operator removes the LCD screen from the inspection machine and places it on the re-evaluation machine for re-evaluation, and then , and then reposition the LCD screen on the inspection machine to take pictures of the defects in the defect area, and mark the pictures for defects according to the re-judgment results, and store the marked pictures in the inspection machine. The existing defect labeling method needs to transmit the LCD screen between the inspection machine and the re-judgment machine, and the work efficiency is low.
因此,如何能使得無需在檢測機台和複判機台之間傳送液晶螢幕也能實現缺陷標記,實爲需要解决的問題之一。Therefore, how to realize defect marking without transferring the liquid crystal screen between the inspection machine and the re-judgment machine is actually one of the problems to be solved.
本發明的實施例提供一種標記設備及缺陷標記方法,能夠實現不用在檢測機台和複判機台之間傳送液晶螢幕也能實現缺陷標記,提高工作效率。Embodiments of the present invention provide a marking device and a defect marking method, which can realize defect marking without transferring a liquid crystal screen between a detection machine and a re-judgment machine, and improve work efficiency.
本發明一實施例的標記設備,設置於一檢測機台及一複判機台之間,包括一條碼識別模組,用於識別一待檢測物的條碼;一數據傳輸模組,用於根據所述條碼從所述檢測機台接收一檢測數據;一輸入模組,用於根據所述複判機台的複判結果,標記所述檢測數據,生成一標記數據;其中,所述數據傳輸模組還用於將所述標記數據輸出至一儲存設備。The marking device according to an embodiment of the present invention is disposed between a detection machine and a re-judgment machine, and includes a barcode identification module for identifying a barcode of an object to be detected; a data transmission module for according to The barcode receives a detection data from the detection machine; an input module is used to mark the detection data according to the re-judgment result of the judgment machine, and generate a label data; wherein, the data transmission The module is also used for outputting the marked data to a storage device.
上述的標記設備,其中,所述標記設備還包括一顯示模組,用於顯示所述檢測數據和/或所述標記數據。In the above-mentioned marking device, wherein, the marking device further comprises a display module for displaying the detection data and/or the marking data.
上述的標記設備,其中,所述標記數據包括所述檢測數據及一缺陷數據。In the above marking device, wherein the marking data includes the detection data and a defect data.
上述的標記設備,其中,所述缺陷數據包括缺陷座標和/或缺陷類型。The above marking device, wherein the defect data includes defect coordinates and/or defect types.
上述的標記設備,其中,所述檢測數據或所述標記數據爲圖片格式。In the above marking device, wherein the detection data or the marking data is in a picture format.
本發明一實施例的缺陷標記方法,採用上述的標記設備,包括所述檢測機台對所述待檢測物進行檢測,並生成一檢測數據;所述複判機台對所述待檢測物進行複判檢測;所述標記設備掃描所述待檢測物的條碼,並根據所述條碼讀取所對應的所述檢測數據;根據所述複判機台的複判檢測結果,所述標記設備對所述檢測數據進行標記,生成一標記數據;所述標記設備將所述標記數據輸出至一儲存設備。The defect marking method according to an embodiment of the present invention adopts the above-mentioned marking equipment, including the detection machine to detect the object to be detected, and to generate a detection data; Rejudgment detection; the marking device scans the barcode of the object to be detected, and reads the corresponding detection data according to the barcode; The detection data is marked to generate marked data; the marking device outputs the marked data to a storage device.
上述的標記方法,其中,所述標記設備還用於顯示所述檢測數據和/或所述標記數據。In the above-mentioned marking method, the marking device is further configured to display the detection data and/or the marking data.
上述的標記方法,其中,所述標記數據包括所述檢測數據及一缺陷數據。In the above marking method, the marking data includes the detection data and a defect data.
上述的標記方法,其中,所述缺陷數據包括缺陷座標和/或缺陷類型。In the above marking method, the defect data includes defect coordinates and/or defect types.
上述的標記方法,其中,所述檢測數據或所述標記數據爲圖片格式。In the above marking method, wherein the detection data or the marking data is in a picture format.
以下結合附圖和具體實施例對本發明進行詳細描述,但不作爲對本發明的限定。The present invention is described in detail below with reference to the accompanying drawings and specific embodiments, but is not intended to limit the present invention.
下面結合附圖對本發明的結構原理和工作原理作具體的描述。The structural principle and working principle of the present invention will be described in detail below with reference to the accompanying drawings.
圖1是本發明一實施例待檢測物的結構示意圖。如圖1所示,待檢測物10例如可以是液晶螢幕、顯示面板等設備,待檢測物10上設置有具有唯一標識的條碼11,不可避免的,在生産、測試或轉送過程中,待檢測物10上可能會産生一些缺陷12,這些缺陷12可能包括各種類型,例如異物、短路、斷路等等。這就需要在檢測時,將這些缺陷12的座標及類型標記出來,以便後續進行修復。FIG. 1 is a schematic structural diagram of an object to be detected according to an embodiment of the present invention. As shown in FIG. 1 , the object to be detected 10 can be, for example, a liquid crystal screen, a display panel and other equipment. The object to be detected 10 is provided with a
圖2A是本發明一實施例標記設備的結構組成示意圖。圖2B是本發明一實施例標記設備的外觀結構示意圖。圖2C是本發明一實施例標記設備顯示的檢測數據示意圖。圖2D是本發明一實施例標記設備標注缺陷數據的示意圖。如圖1、圖2A所示,標記設備100設置於檢測機台200及複判機台300之間。其中,標記設備100與檢測機台200之間可以通過有線或無線的方式傳輸檢測數據,本發明並不以此爲限。檢測機台200首先掃描待檢測物10的條碼11,對待檢測物10進行檢測。當待檢測物10存在缺陷12時,檢測機台200會生成一檢測數據,檢測數據例如爲對存在缺陷的區域拍照獲得的圖片,並將檢測數據儲存在內置的儲存設備中。FIG. 2A is a schematic diagram of the structure and composition of a marking device according to an embodiment of the present invention. FIG. 2B is a schematic diagram of the appearance structure of a marking device according to an embodiment of the present invention. 2C is a schematic diagram of detection data displayed by a marking device according to an embodiment of the present invention. FIG. 2D is a schematic diagram of marking defect data by a marking device according to an embodiment of the present invention. As shown in FIG. 1 and FIG. 2A , the
如圖1、圖2A、圖2B所示,標記設備100具有顯示模組104,顯示模組104分爲條碼顯示區1041以及數據顯示區1042。條碼顯示區1041用於顯示待檢測物10的條碼11,數據顯示區1042用於顯示檢測機台200生成的檢測數據。As shown in FIG. 1 , FIG. 2A , and FIG. 2B , the
如圖1、圖2A、圖2C所示,標記設備100通過條碼識別模組101掃描存在缺陷12的待檢測物10的條碼11後,將待檢測物10置於複判機台300上進行複判。此時,標記設備100的數據傳輸模組102根據待檢測物10的條碼11,從檢測機台100中接收條碼11所對應待檢測物10的檢測數據,並將檢測數據顯示在顯示模組104上。根據複判機台300的複判結果,使用標記設備100的輸入模組103,對檢測數據進行標記。如圖2D所示,當檢測數據爲圖片格式時,可以直接在圖片上標注缺陷數據。缺陷數據包括缺陷的座標以及缺陷的類型,本發明僅以上述兩種數據爲例,並不以此爲限。標記設備100將標注有缺陷數據的圖片儲存爲標記數據,並通過數據傳輸模組102將標記數據輸出至檢測機台200內置的儲存設備(圖中未示出)中。當然,也可以將標記數據輸出至其他儲存設備,例如伺服器、雲儲存設備等,本發明並不以此爲限。As shown in FIG. 1 , FIG. 2A , and FIG. 2C , after the
其中,輸入模組103和顯示模組104可採用觸控顯示面板實現,檢測數據以及標記數據可顯示在觸控顯示面板上,並通過觸控顯示面板作爲輸入,進行缺陷數據的標注。當然,輸入模組103和顯示模組104也可分開設置。The
同樣,條碼掃描模組101可以是集成於標記設備100中,也可以是外接於標記設備100上,標記設備100可通過條碼掃描模組101掃描條碼11,也可以通過手工輸入的方式獲得條碼11,本發明並不以此爲限。Similarly, the
圖3是本發明一實施例缺陷標記方法的流程圖。如圖1至圖3所示,本發明的缺陷標記方法S100採用圖2A所示的標記設備100實現,具體包括如下步驟:
步驟S1:檢測機台200對待檢測物10進行檢測,當待檢測物10存在缺陷12時,檢測機台200會對待檢測物10的缺陷區域進行拍照,生成檢測數據,並將檢測數據儲存在檢測機台200內置的儲存設備中;
步驟S2:將存在缺陷12的待檢測物10從檢測機台200上取下,並傳送至複判機台300,複判人員利用複判機台300對存在缺陷12的待檢測物10進行人工複判檢測;
步驟S3:在將存在缺陷12的待檢測物10傳送至複判機台300的過程中,利用標記設備100掃描存在缺陷12的待檢測物10的條碼11,將掃描的條碼11顯示在標記設備100的條碼顯示區1041,並根據所掃描的條碼11從檢測機台200的內置儲存設備中讀取條碼11所對應的檢測數據,標記設備100通過數據傳輸模組102從檢測機台200中接收條碼11所對應的檢測數據,並將檢測數據顯示在標記設備100的數據顯示區1042上;
步驟S4:根據複判機台300的複判檢測結果,使用標記設備100的輸入模組103對檢測數據進行標記,將缺陷數據標記至檢測數據,待所有缺陷數據標記完成,標記設備100將標記有缺陷數據的檢測數據儲存,生成標記數據;
步驟S5:標記設備100通過數據傳輸模組102將標記數據輸出至檢測機台200的內置儲存設備中。FIG. 3 is a flowchart of a defect marking method according to an embodiment of the present invention. As shown in FIG. 1 to FIG. 3 , the defect marking method S100 of the present invention is implemented by using the marking
其中,步驟S1可重複進行,直至所有的待檢測物10均檢測完畢後再進行後面的步驟。Wherein, step S1 can be repeated until all the objects to be detected 10 have been detected, and then the subsequent steps can be performed.
綜上,依照本發明的實施例,本發明的標記設備可以使得直接對檢測數據進行標記,不需將待檢測物(液晶螢幕、顯示面板)從複判機台上傳送至檢測機台即可進行標記,提高工作效率。To sum up, according to the embodiments of the present invention, the marking device of the present invention can directly mark the detection data without transferring the object to be detected (liquid crystal screen, display panel) from the re-judgment machine to the testing machine. Tagging to improve work efficiency.
另外,當應用於人工智能檢測系統時,本發明中的標記數據可以作爲人工智能檢測機台的學習素材,人工智能檢測機台通過對大量標記數據的學習,可以提高自動化檢測的準確性。In addition, when applied to an artificial intelligence detection system, the labeled data in the present invention can be used as a learning material for an artificial intelligence detection machine, and the artificial intelligence detection machine can improve the accuracy of automatic detection by learning a large amount of labeled data.
當然,本發明還可有其它多種實施例,在不背離本發明精神及其實質的情况下,熟悉本領域的技術人員當可根據本發明作出各種相應的改變和變形,但這些相應的改變和變形都應屬於本發明所附的申請專利範圍的保護範圍。Of course, the present invention can also have other various embodiments, without departing from the spirit and essence of the present invention, those skilled in the art can make various corresponding changes and modifications according to the present invention, but these corresponding changes and All deformations should belong to the protection scope of the appended patent application scope of the present invention.
10:待檢測物 11:條碼 12:缺陷 100:標記設備 101:條碼識別模組 102:數據傳輸模組 103:輸入模組 104:顯示模組 1041:條碼顯示區 1042:數據顯示區 200:檢測機台 300:複判機台 S100:缺陷標記方法 S1~S5:步驟10: Object to be detected 11: Barcode 12: Defects 100: Tag Equipment 101: Barcode identification module 102: Data transmission module 103: Input module 104: Display module 1041: Barcode display area 1042: Data display area 200: Detection machine 300: Re-judgment machine S100: Defect marking method S1~S5: Steps
圖1是本發明一實施例待檢測物的結構示意圖。 圖2A是本發明一實施例標記設備的結構組成示意圖。 圖2B是本發明一實施例標記設備的外觀結構示意圖。 圖2C是本發明一實施例標記設備顯示的檢測數據示意圖。 圖2D是本發明一實施例標記設備標注缺陷數據的示意圖。 圖3是本發明一實施例缺陷標記方法的流程圖。FIG. 1 is a schematic structural diagram of an object to be detected according to an embodiment of the present invention. FIG. 2A is a schematic diagram of the structure and composition of a marking device according to an embodiment of the present invention. FIG. 2B is a schematic diagram of the appearance structure of a marking device according to an embodiment of the present invention. 2C is a schematic diagram of detection data displayed by a marking device according to an embodiment of the present invention. FIG. 2D is a schematic diagram of marking defect data by a marking device according to an embodiment of the present invention. FIG. 3 is a flowchart of a defect marking method according to an embodiment of the present invention.
100:標記設備100: Tag Equipment
101:條碼識別模組101: Barcode identification module
102:數據傳輸模組102: Data transmission module
103:輸入模組103: Input module
104:顯示模組104: Display module
200:檢測機台200: Detection machine
300:複判機台300: Re-judgment machine
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CN107144992B (en) * | 2017-06-23 | 2020-07-10 | 武汉精测电子集团股份有限公司 | Full-automatic L CD detection control system and method based on AOI technology |
CN110006903A (en) * | 2018-01-05 | 2019-07-12 | 皓琪科技股份有限公司 | Printed circuit board rechecks system, marker method and reinspection method |
TWI667575B (en) * | 2018-06-29 | 2019-08-01 | 由田新技股份有限公司 | Defect inspection system and method using artificil intelligence |
CN110208286B (en) * | 2019-06-21 | 2020-08-28 | 上海精测半导体技术有限公司 | Detection equipment |
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2020
- 2020-06-16 CN CN202010551511.8A patent/CN113805365A/en active Pending
- 2020-09-04 TW TW109130507A patent/TW202201279A/en unknown
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