CN113805365A - Marking apparatus and defect marking method - Google Patents
Marking apparatus and defect marking method Download PDFInfo
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- CN113805365A CN113805365A CN202010551511.8A CN202010551511A CN113805365A CN 113805365 A CN113805365 A CN 113805365A CN 202010551511 A CN202010551511 A CN 202010551511A CN 113805365 A CN113805365 A CN 113805365A
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- marking
- data
- detection
- defect
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Abstract
The invention provides a marking apparatus and a defect marking method. The marking equipment is arranged between a detection machine and a re-judging machine and comprises a bar code identification module for identifying a bar code of an object to be detected; the data transmission module is used for receiving detection data from the detection machine station according to the bar code; the input module is used for marking the detection data according to the re-judgment result of the re-judgment machine table to generate marked data; the data transmission module is further used for outputting the marking data to a storage device.
Description
Technical Field
The present invention relates to a marking apparatus and a marking method, and more particularly, to a marking apparatus and a defect marking method that facilitate marking defects.
Background
With the development of technology, display devices are widely used in many electronic products, such as mobile phones, tablet computers, watches, and the like.
At present, the detection of the liquid crystal screen of the display device is generally performed by using a detection machine, when a defect of the liquid crystal screen is detected, an operator takes the liquid crystal screen off the detection machine, places the liquid crystal screen on a re-judgment machine for re-judgment, then places the liquid crystal screen on the detection machine again for defect shooting of a defect area, marks the shot picture with the defect according to the re-judgment result, and stores the marked picture in the detection machine. The existing defect labeling mode needs to transmit the liquid crystal screen between the detection machine and the re-judgment machine, and the working efficiency is low.
Therefore, how to realize the defect marking without transferring the liquid crystal screen between the inspection machine and the re-judgment machine is one of the problems to be solved.
Disclosure of Invention
The embodiment of the invention provides a marking device and a defect marking method, which can realize defect marking without transmitting a liquid crystal screen between a detection machine and a re-judgment machine and improve the working efficiency.
The marking equipment provided by the embodiment of the invention is arranged between a detection machine and a re-judging machine, and comprises a bar code identification module, a re-judging module and a marking module, wherein the bar code identification module is used for identifying a bar code of an object to be detected; the data transmission module is used for receiving detection data from the detection machine station according to the bar code; the input module is used for marking the detection data according to the re-judgment result of the re-judgment machine table to generate marked data; the data transmission module is further used for outputting the marking data to a storage device.
The marking device described above, wherein the marking device further comprises a display module for displaying the detection data and/or the marking data.
The marking device is further provided, wherein the marking data includes the detection data and a defect data.
The marking apparatus as described above, wherein the defect data includes defect coordinates and/or defect type.
In the above marking device, the detection data or the marking data is in a picture format.
The defect marking method of the embodiment of the invention adopts the marking equipment, and comprises the steps that the detection machine station detects the object to be detected and generates detection data; the re-judging platform carries out re-judging detection on the object to be detected; the marking equipment scans the bar code of the object to be detected and reads the corresponding detection data according to the bar code; according to the re-judgment detection result of the re-judgment machine platform, the marking equipment marks the detection data to generate marked data; the marking device outputs the marking data to a storage device.
The marking method is characterized in that the marking device is further configured to display the detection data and/or the marking data.
In the above marking method, the marking data includes the detection data and a defect data.
The marking method above, wherein the defect data comprises defect coordinates and/or defect type.
In the above marking method, the detection data or the marking data is in a picture format.
The invention is described in detail below with reference to the drawings and specific examples, but the invention is not limited thereto.
Drawings
FIG. 1 is a schematic structural diagram of an object to be detected according to an embodiment of the present invention.
Fig. 2A is a schematic structural diagram of a marking apparatus according to an embodiment of the present invention.
Fig. 2B is a schematic structural diagram of an appearance of a marking device according to an embodiment of the present invention.
Fig. 2C is a schematic diagram of the detected data displayed by the marking device according to an embodiment of the present invention.
FIG. 2D is a diagram illustrating a marking apparatus marking defect data according to an embodiment of the present invention.
FIG. 3 is a flowchart illustrating a defect marking method according to an embodiment of the invention.
Wherein, the reference numbers:
10: object to be detected
11: bar code
12: defect of
100: marking apparatus
101: bar code identification module
102: data transmission module
103: input module
104: display module
1041: bar code display area
1042: data display area
200: detection machine
300: re-judging machine
S100: defect marking method
S1-S5: step (ii) of
Detailed Description
The invention will be described in detail with reference to the following drawings, which are provided for illustration purposes and the like:
FIG. 1 is a schematic structural diagram of an object to be detected according to an embodiment of the present invention. As shown in fig. 1, the object 10 to be detected may be, for example, a liquid crystal screen, a display panel, or the like, and the barcode 11 with a unique identifier is disposed on the object 10 to be detected, so that inevitably, some defects 12 may be generated on the object 10 to be detected during production, test, or transportation, and these defects 12 may include various types, such as foreign matters, short circuits, open circuits, and the like. This requires that the coordinates and type of these defects 12 be marked for subsequent repair at the time of inspection.
Fig. 2A is a schematic structural diagram of a marking apparatus according to an embodiment of the present invention. Fig. 2B is a schematic structural diagram of an appearance of a marking device according to an embodiment of the present invention. Fig. 2C is a schematic diagram of the detected data displayed by the marking device according to an embodiment of the present invention. FIG. 2D is a diagram illustrating a marking apparatus marking defect data according to an embodiment of the present invention. . As shown in fig. 1 and 2A, the marking apparatus 100 is disposed between the inspection tool 200 and the re-judging tool 300. The marking device 100 and the detection machine 200 may transmit the detection data in a wired or wireless manner, which is not limited in the present invention. The detection machine 200 firstly scans the barcode 11 of the object 10 to be detected, and detects the object 10 to be detected. When the object 10 has a defect 12, the inspection machine 200 generates inspection data, for example, a picture obtained by photographing the area having the defect, and stores the inspection data in a built-in storage device.
As shown in fig. 1, fig. 2A, and fig. 2B, the marking device 100 has a display module 104, and the display module 104 is divided into a barcode display area 1041 and a data display area 1042. The barcode display area 1041 is used for displaying the barcode 11 of the object to be detected 10, and the data display area 1042 is used for displaying the detection data generated by the detection machine 200.
As shown in fig. 1, fig. 2A, and fig. 2C, after the marking device 100 scans the barcode 11 of the object to be detected 10 with the defect 12 through the barcode recognition module 101, the object to be detected 10 is placed on the re-judging machine 300 for re-judgment. At this time, the data transmission module 102 of the marking device 100 receives the detection data of the object 10 to be detected corresponding to the barcode 11 from the detection machine 100 according to the barcode 11 of the object 10 to be detected, and displays the detection data on the display module 104. According to the re-judgment result of the re-judgment machine 300, the input module 103 of the marking device 100 is used for marking the detection data. As shown in fig. 2D, when the inspection data is in a picture format, the defect data can be directly marked on the picture. The defect data includes the coordinates of the defect and the type of the defect, and the invention is only exemplified by the above two data, and not limited thereto. The marking device 100 stores the pictures marked with the defective data as marking data, and outputs the marking data to a storage device (not shown) built in the inspection machine 200 through the data transmission module 102. Of course, the tag data may also be output to other storage devices, such as a server, a cloud storage device, and the like, which is not limited to this.
The input module 103 and the display module 104 may be implemented by a touch display panel, and the detection data and the marking data may be displayed on the touch display panel, and the touch display panel is used as an input to label the defect data. Of course, the input module 103 and the display module 104 may be separately provided.
Similarly, the barcode scanning module 101 may be integrated in the marking device 100, or may be externally connected to the marking device 100, and the marking device 100 may scan the barcode 11 through the barcode scanning module 101, or may obtain the barcode 11 through a manual input method, which is not limited by the invention.
FIG. 3 is a flowchart illustrating a defect marking method according to an embodiment of the invention. As shown in fig. 1 to 3, the defect marking method S100 of the present invention is implemented by using the marking apparatus 100 shown in fig. 2A, and specifically includes the following steps:
step S1: the detection machine 200 detects the object 10 to be detected, when the object 10 to be detected has a defect 12, the detection machine 200 photographs the defect area of the object 10 to be detected to generate detection data, and stores the detection data in a storage device built in the detection machine 200;
step S2: taking the object to be detected 10 with the defect 12 off the detection machine 200, and transmitting the object to be detected to the re-judging machine 300, wherein the re-judging personnel uses the re-judging machine 300 to carry out manual re-judging detection on the object to be detected 10 with the defect 12;
step S3: in the process of transmitting the object to be detected 10 with the defect 12 to the re-judging machine 300, scanning the barcode 11 of the object to be detected 10 with the defect 12 by using the marking device 100, displaying the scanned barcode 11 in the barcode display area 1041 of the marking device 100, reading the detection data corresponding to the barcode 11 from the built-in storage device of the detecting machine 200 according to the scanned barcode 11, receiving the detection data corresponding to the barcode 11 from the detecting machine 200 by the marking device 100 through the data transmission module 102, and displaying the detection data on the data display area 1042 of the marking device 100;
step S4: according to the re-judgment detection result of the re-judgment machine platform 300, the input module 103 of the marking device 100 is used for marking the detection data, the defect data are marked to the detection data, and after all the defect data are marked, the marking device 100 stores the detection data marked with the defect data to generate marking data;
step S5: the marking device 100 outputs the marking data to the built-in storage device of the inspection machine 200 through the data transmission module 102.
Step S1 can be repeated until all the objects 10 are detected, and then the subsequent steps are performed.
In summary, according to the embodiment of the present invention, the marking device of the present invention can directly mark the detection data without transferring the object to be detected (the liquid crystal display, the display panel) from the re-judging machine to the detecting machine for marking, thereby improving the working efficiency.
In addition, when the method is applied to an artificial intelligence detection system, the marking data can be used as a learning material of an artificial intelligence detection machine, and the accuracy of automatic detection can be improved by learning a large amount of marking data through the artificial intelligence detection machine.
The present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof, and it should be understood that various changes and modifications can be effected therein by one skilled in the art without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (10)
1. A marking device is arranged between a detection machine and a re-judgment machine, and is characterized by comprising:
the bar code identification module is used for identifying a bar code of an object to be detected;
the data transmission module is used for receiving detection data from the detection machine station according to the bar code;
the input module is used for marking the detection data according to the re-judgment result of the re-judgment machine table to generate marked data;
the data transmission module is further used for outputting the marking data to a storage device.
2. A marking device as claimed in claim 1, characterized in that the marking device further comprises a display module for displaying the detection data and/or the marking data.
3. The marking apparatus according to claim 1, wherein the marking data includes the detection data and a defect data.
4. A marking apparatus as claimed in claim 3, characterized in that the defect data comprise defect coordinates and/or defect types.
5. The marking device of claim 1, wherein the detection data or the marking data is in a picture format.
6. A defect marking method using the marking apparatus according to claim 1, comprising:
the detection machine station detects the object to be detected and generates detection data;
the re-judging platform carries out re-judging detection on the object to be detected;
the marking equipment scans the bar code of the object to be detected and reads the corresponding detection data according to the bar code;
according to the re-judgment detection result of the re-judgment machine platform, the marking equipment marks the detection data to generate marked data;
the marking device outputs the marking data to a storage device.
7. A marking method as claimed in claim 6, characterized in that the marking device is also adapted to display the detection data and/or the marking data.
8. The marking method according to claim 6, wherein the marking data includes the inspection data and a defect data.
9. Marking method according to claim 8, characterized in that the defect data comprise defect coordinates and/or defect type.
10. The marking method according to claim 6, wherein the detection data or the marking data is in a picture format.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010551511.8A CN113805365A (en) | 2020-06-16 | 2020-06-16 | Marking apparatus and defect marking method |
| TW109130507A TW202201279A (en) | 2020-06-16 | 2020-09-04 | Marking device and defect marking method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010551511.8A CN113805365A (en) | 2020-06-16 | 2020-06-16 | Marking apparatus and defect marking method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113805365A true CN113805365A (en) | 2021-12-17 |
Family
ID=78943159
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010551511.8A Pending CN113805365A (en) | 2020-06-16 | 2020-06-16 | Marking apparatus and defect marking method |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN113805365A (en) |
| TW (1) | TW202201279A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005093462A (en) * | 2003-09-12 | 2005-04-07 | Shigeki Kobayashi | Inspection device |
| KR100705657B1 (en) * | 2005-10-19 | 2007-04-09 | (주) 인텍플러스 | Sorting method of semiconductor package |
| CN101499434A (en) * | 2008-01-30 | 2009-08-05 | 奥林巴斯株式会社 | Checking system |
| CN107144992A (en) * | 2017-06-23 | 2017-09-08 | 武汉精测电子技术股份有限公司 | Full-automatic LCD detecting and controlling systems and method based on AOI technologies |
| CN110006903A (en) * | 2018-01-05 | 2019-07-12 | 皓琪科技股份有限公司 | Printed circuit board rechecks system, marker method and reinspection method |
| CN110208286A (en) * | 2019-06-21 | 2019-09-06 | 上海精测半导体技术有限公司 | A kind of detection device |
| CN110659662A (en) * | 2018-06-29 | 2020-01-07 | 由田新技股份有限公司 | Flaw detection system and method using artificial intelligence |
-
2020
- 2020-06-16 CN CN202010551511.8A patent/CN113805365A/en active Pending
- 2020-09-04 TW TW109130507A patent/TW202201279A/en unknown
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005093462A (en) * | 2003-09-12 | 2005-04-07 | Shigeki Kobayashi | Inspection device |
| KR100705657B1 (en) * | 2005-10-19 | 2007-04-09 | (주) 인텍플러스 | Sorting method of semiconductor package |
| CN101499434A (en) * | 2008-01-30 | 2009-08-05 | 奥林巴斯株式会社 | Checking system |
| CN107144992A (en) * | 2017-06-23 | 2017-09-08 | 武汉精测电子技术股份有限公司 | Full-automatic LCD detecting and controlling systems and method based on AOI technologies |
| CN110006903A (en) * | 2018-01-05 | 2019-07-12 | 皓琪科技股份有限公司 | Printed circuit board rechecks system, marker method and reinspection method |
| CN110659662A (en) * | 2018-06-29 | 2020-01-07 | 由田新技股份有限公司 | Flaw detection system and method using artificial intelligence |
| CN110208286A (en) * | 2019-06-21 | 2019-09-06 | 上海精测半导体技术有限公司 | A kind of detection device |
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| Publication number | Publication date |
|---|---|
| TW202201279A (en) | 2022-01-01 |
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