TW202145409A - An apparatus for semiconductor dies bonding and method thereof - Google Patents
An apparatus for semiconductor dies bonding and method thereof Download PDFInfo
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/52—Mounting semiconductor bodies in containers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/04—Mounting of components, e.g. of leadless components
- H05K13/0404—Pick-and-place heads or apparatus, e.g. with jaws
- H05K13/0408—Incorporating a pick-up tool
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/04—Mounting of components, e.g. of leadless components
- H05K13/0404—Pick-and-place heads or apparatus, e.g. with jaws
- H05K13/0411—Pick-and-place heads or apparatus, e.g. with jaws having multiple mounting heads
Abstract
Description
本發明涉及一種黏合半導體晶粒的裝置，該裝置包括旋轉台，旋轉台具有多個附著在該旋轉台的周緣上的拾取頭，其中，該些拾取頭相對於該旋轉台的中心點具有相似的距離；一半導體晶粒拾取站包括至少一個可定位在該旋轉台的周緣上的第一推動器，其中該第一推動器包括面向該拾取頭的第一推動頭，並且該第一推動頭與該拾取頭成一直線；一半導體晶粒黏合站包括至少一個可定位在該旋轉轉檯的周緣上的第二推動器，其中該第二推動器包括面向該拾取頭的第二推動頭，並且該第二推動頭與該拾取頭成一直線；該第一和第二推動器沿該旋轉台的縱軸平行地間隔開。至少一個第一索引器(indexer，裝卸機)和至少一個第二索引器佈置成使得該第一索引器和該第二索引器可操作地反覆依序沿單軌進給系統在X軸方向和Y軸方向上移動，該半導體晶粒黏合站可位於該單軌進給系統上方。The present invention relates to a device for bonding semiconductor dies, the device comprising a rotary table having a plurality of pick-up heads attached to the periphery of the rotary table, wherein the pick-up heads have similarities with respect to the center point of the rotary table distance; a semiconductor die pickup station includes at least one first pusher positionable on the periphery of the turntable, wherein the first pusher includes a first pusher head facing the pickup head, and the first pusher head in line with the pick head; a semiconductor die bonding station includes at least one second pusher positionable on the periphery of the rotating turntable, wherein the second pusher includes a second pusher head facing the pick head, and the The second pusher head is aligned with the pick head; the first and second pushers are spaced parallel to each other along the longitudinal axis of the rotary table. At least one first indexer (loader) and at least one second indexer are arranged such that the first indexer and the second indexer are operable to iteratively sequentially along the monorail feed system in the X-axis direction and the Y-axis Moving in the axial direction, the semiconductor die bonding station can be positioned above the monorail feed system.
眾所周知，對於現有的基於旋轉台的晶粒黏合或晶粒附著應用，需要導線架XY索引器來移動(index)一間距(pitch)並補償XY偏移量。在從索引器上卸下當前完成的導線架之後，單個索引器平台只能裝載新的導線架或基板架以用於後續生產。在卸載當前框架和載入新框架之間有很長的等待時間或閒置時間。因此，這導致了低速黏合製程並降低了生產量。As is well known, for existing turntable based die attach or die attach applications, lead frame XY indexers are required to index a pitch and compensate for the XY offset. After the currently completed lead frame is removed from the indexer, a single indexer platform can only be loaded with new lead frames or substrate frames for subsequent production. There is a long wait or idle time between unloading the current frame and loading the new frame. Consequently, this results in a low speed bonding process and reduces throughput.
為了解決上述缺點，已做了各種嘗試。例如，Beatson等人，在WO2005/124830A2公開了一種具有顯著增加生產量且用於移動和接合電子部件的裝置和方法。該裝置包括索引器，該索引器具有與至少一個彈匣分類機耦合的部件。索引器包括第一輸送器部件、與第一輸送器部件相鄰的第二輸送器部件、設置在第一輸送器部件和第二輸送器部件下方的至少一個加熱器以及佈置在第一輸送器部件和第二輸送器部件下方且使工件保持抵靠輸送器部分的上表面的至少一個真空裝置。第一輸送器部件和第二輸送器部件構造成從至少一個彈匣分類機接收工件。該裝置被配置為在第一工件被該至少一個加熱器加熱或由該打線機接合的同時，將第二工件裝載到該第二輸送器部件上。但是，該現有技術與本發明相比具有不同的佈置和構造，因此不能顯著減少基於旋轉台的晶粒黏合製程的空轉時間，特別是在裝載新框架和卸載完成框架之間的空轉時間。Various attempts have been made in order to solve the above-mentioned disadvantages. For example, Beatson et al. in WO2005/124830A2 disclose an apparatus and method for moving and joining electronic components with significantly increased throughput. The apparatus includes an indexer having a component coupled to at least one magazine sorter. The indexer includes a first conveyor part, a second conveyor part adjacent to the first conveyor part, at least one heater disposed below the first conveyor part and the second conveyor part, and disposed on the first conveyor part At least one vacuum device below the member and the second conveyor member and holding the workpiece against the upper surface of the conveyor portion. The first conveyor member and the second conveyor member are configured to receive workpieces from at least one magazine sorter. The apparatus is configured to load a second workpiece onto the second conveyor member while the first workpiece is heated by the at least one heater or engaged by the wire bonding machine. However, this prior art has a different arrangement and configuration compared to the present invention, and thus cannot significantly reduce the idle time of a turntable based die bonding process, especially between loading a new frame and unloading a completed frame.
因此，透過具有黏合半導體晶粒的裝置和方法來減輕該缺點將是有利的，其中，該裝置包括至少一個第一索引器和至少一個第二索引器，該至少一個第一索引器和該至少一個第二索引器被佈置成可操控地、不斷地反覆依序沿著單軌進給系統在X軸方向和Y軸方向上移動，並且該半導體晶粒黏合站可位於該單軌進給系統上方。透過具有該裝置的佈置，裝載新框架和卸載完成的框架的過程實質上並行且同時進行，因此與常規的黏合製程相比，加快了整個黏合製程並實現了更高的每小時單位產量（UPH）。Accordingly, it would be advantageous to mitigate this disadvantage by having an apparatus and method for bonding semiconductor dies, wherein the apparatus includes at least one first indexer and at least one second indexer, the at least one first indexer and the at least one second indexer A second indexer is arranged to operably move in an X-axis direction and a Y-axis direction along the monorail feed system in continuous iterative sequence, and the semiconductor die bonding station may be located above the monorail feed system. With this arrangement, the process of loading new frames and unloading completed frames is substantially parallel and simultaneous, thus speeding up the entire bonding process and achieving higher unit throughput per hour (UPH) compared to conventional bonding processes. ).
因此，本發明的主要目的是提供黏合半導體晶粒的裝置和方法，其目的是減少當前導線架的卸載與新導線架的載入之間的空轉時間。Therefore, the main object of the present invention is to provide an apparatus and method for bonding semiconductor dies, the object of which is to reduce the idle time between the unloading of the current lead frame and the loading of the new lead frame.
本發明的又一個目的是提供一種黏合半導體晶粒的裝置和方法，其中該方法顯著提高了黏合製程的速度。Yet another object of the present invention is to provide an apparatus and method for bonding semiconductor dies, wherein the method significantly increases the speed of the bonding process.
本發明的又一個目的是提供一種黏合半導體晶粒的裝置和方法，與常規黏合製程相比，該方法能夠提高生產能力。Yet another object of the present invention is to provide an apparatus and method for bonding semiconductor dies, which can improve throughput compared with conventional bonding processes.
本發明的又一個目的是提供一種黏合半導體晶粒的裝置和方法，與常規黏合製程相比，該方法能夠實現更高的每小時單位產量（UPH）。Yet another object of the present invention is to provide an apparatus and method for bonding semiconductor dies, which can achieve higher unit throughput per hour (UPH) than conventional bonding processes.
本發明的又一個目的是提供一種黏合半導體晶粒的裝置和方法，其中該方法使得兩個索引器能夠輪流交替轉動並透過XY軸運動彼此迴避。Yet another object of the present invention is to provide an apparatus and method for bonding semiconductor dies, wherein the method enables two indexers to alternately rotate alternately and avoid each other through XY axis motion.
透過理解以下本發明的詳細描述或在實踐中採用本發明，本發明的其他目的將變得顯而易見。Other objects of the present invention will become apparent upon understanding the following detailed description of the invention or by employing the invention in practice.
根據本發明的較佳實施例，提供了以下內容：According to a preferred embodiment of the present invention, the following are provided:
一種黏合半導體晶粒的裝置，包括： 一旋轉台，具有多個拾取頭附接到該旋轉台的周緣，其中該些拾取頭相對於該旋轉台的中心點具有相似的距離； 一半導體晶粒拾取站，包括至少一個可定位在該旋轉台的周緣上的第一推動器，其中該第一推動器包括面向該拾取頭的第一推動頭，並且該第一推動頭與該拾取頭成一直線； 一半導體晶粒黏合站，包括至少一個可定位在該旋轉台的周緣上的第二推動器，其中該第二推動器包括面向該拾取頭的第二推動頭，並且該第二推動頭與該拾取頭成一直線；以及 該第一和第二推動器沿該旋轉台的縱軸平行地間隔開； 其特徵在於： 該裝置還包括至少一個第一索引器和至少一個第二索引器，該至少一個索引器和該第二索引器被配置成可操作地反覆依序沿單軌進給系統在X軸方向和Y軸方向上移動，並且該半導體晶粒黏合站可定位在該單軌進給系統上方。A device for bonding semiconductor die, comprising: a turntable having a plurality of pick-up heads attached to the periphery of the turntable, wherein the pick-up heads have similar distances from a center point of the turntable; A semiconductor die pick-up station including at least one first pusher positionable on the periphery of the turntable, wherein the first pusher includes a first pusher head facing the pickup head, and the first pusher head is connected to the Pick up head in a straight line; a semiconductor die bonding station including at least one second pusher positionable on the periphery of the turntable, wherein the second pusher includes a second pusher head facing the pick head, and the second pusher head is connected to the The pickup head is aligned; and the first and second pushers are spaced parallel to each other along the longitudinal axis of the rotary table; It is characterized by: The apparatus also includes at least one first indexer and at least one second indexer, the at least one indexer and the second indexer being configured to be operatively iteratively sequential in the X-axis direction and the Y-axis along the monorail feed system direction and the semiconductor die bonding station can be positioned over the monorail feed system.
在本發明的另一個實施例中，提供：In another embodiment of the present invention, there is provided:
一種黏合半導體晶粒的方法，包括以下步驟： （i）在半導體晶粒拾取站透過多個拾取頭從至少一個輸入晶圓拾取至少一個半導體晶粒；以及 （ii）將該半導體晶粒轉移到半導體晶粒黏合站；以及 （iii）隨後將該半導體晶粒結合到至少一個第一索引器或至少一個第二索引器的至少一個導線架； 其特徵在於： 該第一索引器和第二索引器可操作地反覆依序沿著單軌進給系統在X軸方向和Y軸方向上移動。A method of bonding semiconductor die, comprising the following steps: (i) picking up at least one semiconductor die from at least one input wafer through a plurality of pick heads at a semiconductor die pick station; and (ii) transferring the semiconductor die to a semiconductor die bonding station; and (iii) subsequently bonding the semiconductor die to at least one leadframe of at least one first indexer or at least one second indexer; It is characterized by: The first indexer and the second indexer are operable to move in an X-axis direction and a Y-axis direction along the monorail feed system in an iterative sequence.
在下面的詳細描述中，闡述了許多具體細節以便提供對本發明的透徹理解。然而，本領域普通技術人員將理解，可以在沒有這些具體細節的情況下實踐本發明。在其他情況下，沒有詳細描述眾所周知的方法，過程和/或元件，以免使本發明不清楚。In the following detailed description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, one of ordinary skill in the art will understand that the present invention may be practiced without these specific details. In other instances, well-known methods, procedures and/or elements have not been described in detail so as not to obscure the present invention.
從僅以示例方式參考附圖的實施例的以下描述中，將更清楚地理解本發明，該附圖未按比例繪製。The invention will be more clearly understood from the following description of embodiments which refer, by way of example only, to the accompanying drawings, which are not drawn to scale.
如本公開內容和本文所附申請專利範圍中所使用的，單數形式“一個”，“一種”和“該”包括複數指示物，除非上下文清楚地指示或另外指出。As used in this disclosure and the scope of the claims appended hereto, the singular forms "a," "an," and "the" include plural referents unless the context clearly dictates otherwise.
在本說明書的整個公開和申請專利範圍中，單詞“包括”及其變體，例如“包括”和“包含”，是指“包括但不限於”，並且不意圖排除例如其他元件，整數或步驟。“示例性”是指“的示例”，並且不意圖傳達較佳或理想實施例的指示，“諸如”不是限制性的，而是用於說明目的。Throughout the disclosure and patentability of this specification, the word "comprise" and variations such as "including" and "comprising" mean "including but not limited to" and is not intended to exclude, for example, other elements, integers or steps . "Exemplary" means "an example of," and is not intended to convey an indication of a preferred or ideal embodiment, and "such as" is not limiting, but is used for purposes of illustration.
參考圖1，其為黏合半導體晶粒的裝置（1）的示例圖，特別是在基於旋轉台的半導體晶粒黏合。如圖所示，黏合半導體晶粒的裝置（1）包括：旋轉台（101），該旋轉台（101）具有多個附接到該旋轉台（101）的周緣的拾取頭（103），其中，該些拾取頭（103）相對於該旋轉台（101）的中心點具有相似的距離；半導體晶粒拾取站（DPS），包括至少一個可定位在該旋轉台（101）周緣的第一推動器（105），其中該第一推動器（105）包括面向該拾取頭（103）的第一推動頭（106），且該第一推動頭（106）與該拾取頭（103）成一直線，以將拾取頭（103）推向至少一個輸入晶圓（119），從而從該輸入晶圓（119）拾取至少一個半導體晶粒，並且該半導體晶粒將被轉移到一半導體晶粒黏合站（DBS）。該半導體晶粒黏合站（DBS）包括至少一個第二推動器（107），其可定位在該旋轉台（101）的周緣，其中，該第二推動器（107）包括面向該拾取頭（103）的第二推動頭（108）且該第二推動頭（108）與該拾取頭（103）成一直線，以使該拾取頭（103）能夠將該半導體晶粒附著或黏合到至少一個導線架上。Referring to FIG. 1 , there is shown an exemplary diagram of an apparatus ( 1 ) for bonding semiconductor die, particularly in turntable-based semiconductor die bonding. As shown, the apparatus (1) for bonding semiconductor dies comprises: a turntable (101) having a plurality of pick-up heads (103) attached to the periphery of the turntable (101), wherein , the pick-up heads (103) have a similar distance from the center point of the turntable (101); a semiconductor die pick-up station (DPS) includes at least one first pusher that can be positioned on the periphery of the turntable (101) a device (105), wherein the first pusher (105) comprises a first pusher head (106) facing the pickup head (103), and the first pusher head (106) is in line with the pickup head (103), to push the pickup head (103) towards at least one input wafer (119) to pick up at least one semiconductor die from the input wafer (119), and the semiconductor die will be transferred to a semiconductor die bonding station ( DBS). The semiconductor die bonding station (DBS) includes at least one second pusher (107) positionable on the periphery of the turntable (101), wherein the second pusher (107) includes facing the pick head (103) ) and the second pusher head (108) is aligned with the pick-up head (103) to enable the pick-up head (103) to attach or bond the semiconductor die to at least one lead frame superior.
另外，該第一和第二推動器（105、107）沿著該旋轉台（101）的縱向軸線平行地間隔開。該裝置（1）還包括至少一個第一索引器（109）和至少一個第二索引器（111），該第一索引器（109）和該第二索引器（111）被設置成可操作地反覆依序沿單軌進給系統在X軸方向和Y軸方向上移動。並且該半導體晶粒黏合站（DBS）可定位在該單軌進給系統上方。於是，當第一索引器（109）和第二索引器（111）分別在每個特定站同時執行任務時，將大大減少當前導線架的卸載與新導線架的載入之間的空轉時間，從而加快了整個半導體晶粒黏合的製程。Additionally, the first and second pushers (105, 107) are spaced parallel to each other along the longitudinal axis of the rotary table (101). The apparatus (1) further comprises at least one first indexer (109) and at least one second indexer (111), the first indexer (109) and the second indexer (111) being operatively arranged It moves in the X-axis and Y-axis directions repeatedly and sequentially along the single-track feed system. And the semiconductor die bonding station (DBS) can be positioned above the monorail feed system. Thus, when the first indexer (109) and the second indexer (111) perform tasks simultaneously at each specific station, the idle time between the unloading of the current lead frame and the loading of the new lead frame will be greatly reduced, Thus, the entire semiconductor die bonding process is accelerated.
此外，該裝置（1）還包括在該旋轉台（101）的周緣下方的至少一個預黏合視覺檢查系統（113），其中該預黏合視覺檢查（113）能夠檢查和拍攝該半導體晶粒的至少一個圖像，以便在晶粒黏合製程之前透過該第一索引器（109）和在該第二索引器（111）補償該半導體晶粒的位置，其中，該圖像包括半導體晶粒的XYØ偏移。這是為了確保半導體晶粒以精確的方位定位，以避免任何半導體晶粒未對準的情況發生。Furthermore, the device (1) also comprises at least one pre-bonding visual inspection system (113) below the periphery of the turntable (101), wherein the pre-bonding visual inspection (113) is capable of inspecting and photographing at least one of the semiconductor die an image to compensate for the position of the semiconductor die through the first indexer (109) and at the second indexer (111) prior to the die bonding process, wherein the image includes the XYØ offset of the semiconductor die shift. This is to ensure that the semiconductor die is positioned in a precise orientation to avoid any misalignment of the semiconductor die.
該裝置（1）還包括佈置在該第一推動器（105）上方的至少一個第一成像單元（115）和佈置在該第二推動器（107）上方的至少一個第二成像單元（117）。透過該佈置，該第一成像單元（115）能夠拍攝該半導體晶粒的至少一個圖像，以便在晶粒拾取程序之前定位該半導體晶粒，該第二成像單元（117）能夠拍攝至少一個導線架的至少一個圖像，以便在晶粒黏合製程之前定位該導線架，並在黏合之後拍攝該半導體晶粒的位置。The device (1) further comprises at least one first imaging unit (115) arranged above the first pusher (105) and at least one second imaging unit (117) arranged above the second pusher (107) . With this arrangement, the first imaging unit (115) is capable of taking at least one image of the semiconductor die in order to locate the semiconductor die prior to the die pick-up procedure, and the second imaging unit (117) is capable of taking at least one wire at least one image of the frame to locate the lead frame prior to the die bonding process and to photograph the position of the semiconductor die after bonding.
另外，該第一索引器（109）和第二索引器（111）分別由至少一個X軸致動器（未示出）和至少一個Y軸致動器（未示出）致動。Additionally, the first indexer (109) and the second indexer (111) are actuated by at least one X-axis actuator (not shown) and at least one Y-axis actuator (not shown), respectively.
如圖2所示，展示了黏合半導體晶粒（2）的示例性方法流程。在該方法流程中，開始於步驟（i）在半導體晶粒拾取站（DPS）處透過多個拾取頭（103）從至少一個輸入晶圓（119）拾取至少一個半導體晶粒，其中拾取頭（103）安裝在旋轉台（101）（201）的周緣上；接著，步驟（ii）借助於該旋轉台（101）（203）的旋轉運動的手段，透過該拾取頭（103）將該半導體晶粒轉移到半導體晶粒黏合站（DBS）；隨後，（iii）將該半導體晶粒黏合到至少一個第一索引器（109）或至少一個第二索引器（111）的至少一個導線架（205）；藉此，該第一索引器（109）和第二索引器（111）可反覆地依序沿單軌進給系統在X軸方向和Y軸方向上移動。與傳統黏合製程相比，由該第一索引器（109）和第二索引器（111）執行操控實質上平行並同時載入新導線架和卸載完成的導線架的程序，能夠實現更高的單位小時產能（UPH）並提高生產量。As shown in FIG. 2, an exemplary method flow for bonding semiconductor die (2) is shown. In the method flow, starting at step (i) at a semiconductor die pick-up station (DPS), at least one semiconductor die is picked up from at least one input wafer (119) by a plurality of pick-up heads (103), wherein the pick-up heads ( 103) is mounted on the periphery of the rotary table (101) (201); then, step (ii) by means of the rotary motion of the rotary table (101) (203), the semiconductor wafer is passed through the pick-up head (103) Die transfer to a semiconductor die bonding station (DBS); subsequently, (iii) bonding the semiconductor die to at least one lead frame (205) of at least one first indexer (109) or at least one second indexer (111) ); whereby the first indexer (109) and the second indexer (111) can be repeatedly moved in the X-axis direction and the Y-axis direction along the single-track feed system in sequence. Compared with the traditional bonding process, the procedures performed by the first indexer (109) and the second indexer (111) to manipulate substantially parallel and simultaneously load new lead frames and unload completed lead frames can achieve higher Capacity per hour (UPH) and increase throughput.
此外，該將該半導體晶粒黏合到至少一個第一索引器（109）或至少一個第二索引器（111）（205）的步驟（iii）包括以下子步驟（可以根據需要反復執行以下子步驟）：（a）在完成該第一索引器（109）的黏合製程之後，將該第一索引器（109）初始化為卸載位置，同時將該第二索引器（111）移動至黏合位置（301）；（b）連同該第二索引器（111）的黏合製程，從該第一索引器（109）卸載至少一個導線架（303）；最終，（c）連同該第二索引器（111）的黏合製程，將該第一索引器（109）移動到裝載位置（305）；接著，（d）連同該第二索引器（111）的黏合製程，將至少一組新的導線架裝載到該第一索引器（109）（307）；然後，（e）在將該第二索引器（111）初始化為卸載位置的同時，將該第一索引器（109）重新移動至黏合位置（309）；接下來，（f）連同該第一索引器（109）的黏合製程，從該第二索引器（111）卸載至少一個導線架（311）；（g）連同該第一索引器（109）的黏合製程，將該第二索引器（111）移動到裝載位置（313）；（h）連同該第一索引器（109）的黏合製程，將至少一組新的導線架載入到該第二索引器（111）（315）。In addition, the step (iii) of bonding the semiconductor die to at least one first indexer (109) or at least one second indexer (111) (205) includes the following sub-steps (the following sub-steps can be repeatedly performed as needed) ): (a) After completing the bonding process of the first indexer (109), initialize the first indexer (109) to the unloading position, while moving the second indexer (111) to the bonding position (301) ); (b) together with the bonding process of the second indexer (111), unloading at least one lead frame (303) from the first indexer (109); finally, (c) together with the second indexer (111) The bonding process of the first indexer (109) is moved to the loading position (305); then, (d) together with the bonding process of the second indexer (111), at least one new set of lead frames is loaded into the The first indexer (109) (307); then, (e) re-moving the first indexer (109) to the glued position (309) while initializing the second indexer (111) to the unloaded position Next, (f) together with the bonding process of the first indexer (109), unloading at least one lead frame (311) from the second indexer (111); (g) together with the first indexer (109) the bonding process of the first indexer (109), moving the second indexer (111) to the loading position (313); (h) together with the bonding process of the first indexer (109), loading at least a new set of lead frames into the first indexer (109) Two indexers (111) (315).
如上所述之方法（2），在步驟（b）(連同該第二索引器（111）的黏合製程，從該第一索引器（109）卸載至少一個導線架（303）)之前，還包括子步驟：檢查該第一索引器（109）的卸載位置，以確保該第一索引器（109）和第二索引器（111）不會同時在黏合位置。Method (2) as described above, before step (b) (to unload at least one lead frame (303) from the first indexer (109) together with the bonding process of the second indexer (111)), further comprising Sub-step: Check the unloading position of the first indexer (109) to ensure that the first indexer (109) and the second indexer (111) are not in the glued position at the same time.
1:裝置 101:旋轉台 103:拾取頭 105:第一推動器 106:第一推動頭 107:第二推動器 108:第二推動頭 109:第一索引器 111:第二索引器 113:預黏合視覺檢查系統 115:第一成像單元 117:第二成像單元 119:輸入晶圓 DBS:半導體晶粒黏合站 DPS:半導體晶粒拾取站1: Device 101: Rotary table 103: Pickup Head 105: First pusher 106: First push head 107: Second pusher 108: Second push head 109: First Indexer 111: Second Indexer 113: Pre-bonded Visual Inspection System 115: The first imaging unit 117: Second imaging unit 119: Input Wafer DBS: Semiconductor Die Bonding Station DPS: Semiconductor Die Picking Station
在結合附圖並研究了詳細說明之後，將能瞭解到本發明的其他方面及其優點，其中： 圖1為本發明的示例圖； 圖2為本發明的示例性方法流程；以及 圖3為本發明的另一示例性方法流程。Other aspects and advantages of the present invention will become apparent after a study of the detailed description in conjunction with the accompanying drawings, wherein: Fig. 1 is an example diagram of the present invention; Figure 2 is an exemplary method flow of the present invention; and FIG. 3 is another exemplary method flow of the present invention.
1:裝置1: Device
101:旋轉台101: Rotary table
103:拾取頭103: Pickup Head
105:第一推動器105: First pusher
106:第一推動頭106: First push head
107:第二推動器107: Second pusher
108:第二推動頭108: Second push head
109:第一索引器109: First Indexer
111:第二索引器111: Second Indexer
113:預黏合視覺檢查系統113: Pre-bonded Visual Inspection System
115:第一成像單元115: The first imaging unit
117:第二成像單元117: Second imaging unit
119:輸入晶圓119: Input Wafer
DBS:半導體晶粒黏合站DBS: Semiconductor Die Bonding Station
DPS:半導體晶粒拾取站DPS: Semiconductor Die Picking Station
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