TW202136979A - Sensing device and sensing method - Google Patents
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Abstract
Description
本發明是有關於一種感測技術,特別是關於一種感測面板的感測裝置與感測方法。The present invention relates to a sensing technology, in particular to a sensing device and a sensing method of a sensing panel.
感測裝置中的一感測電路在不進行感測操作時,容易受到來自其他感測電路的漏電流影響而讀取到錯誤的信號。因此,在感測裝置中造成錯誤信號的漏電流是一需要解決的問題。When a sensing circuit in the sensing device is not performing a sensing operation, it is susceptible to being affected by leakage currents from other sensing circuits and reading erroneous signals. Therefore, the leakage current that causes false signals in the sensing device is a problem that needs to be solved.
本案的一實施例揭露一種感測裝置,包括多級感測電路。多級感測電路包含一第n級感測電路。該第n級感測電路包含第一開關、第二開關與第三開關。第一開關的第一端耦接一資料線,第一開關用以依據第n級掃描信號導通。第二開關的第一端耦接第一開關的第二端,第二開關的第二端耦接一感測元件,第二開關用以依據第n級掃描信號導通。第三開關的第一端耦接第一開關的第二端,第三開關用以依據一控制信號導通,其中當第三開關導通時,第三開關的第一端之電壓準位與第一開關的第一端之電壓準位相等,其中n為正整數。An embodiment of this case discloses a sensing device including a multi-level sensing circuit. The multi-level sensing circuit includes an n-th level sensing circuit. The n-th level sensing circuit includes a first switch, a second switch, and a third switch. The first terminal of the first switch is coupled to a data line, and the first switch is turned on according to the nth level scanning signal. The first end of the second switch is coupled to the second end of the first switch, the second end of the second switch is coupled to a sensing element, and the second switch is turned on according to the n-th level scanning signal. The first terminal of the third switch is coupled to the second terminal of the first switch. The third switch is turned on according to a control signal. When the third switch is turned on, the voltage level of the first terminal of the third switch is the same as that of the first terminal. The voltage levels of the first terminals of the switches are equal, where n is a positive integer.
本案的另一實施例揭露一種感測方法,包含以下操作。藉由多級感測電路中之一第(n+1)級感測電路進行一感測操作,其中該多級感測電路中之一第n級感測電路包含一第一開關、一第二開關以及一第三開關,該第一開關與該第二開關由一第n級掃描信號控制,該第一開關的一第一端耦接一資料線,該第一開關的一第二端耦接該第二開關的一第一端於一操作節點,該第二開關的一第二端耦接一感測元件,該第三開關耦接該第一開關與該第二開關於該操作節點。當該第(n+1)級感測電路進行該感測操作時,導通該第n級感測電路中的該第三開關,使得該操作節點之一電壓準位與該第一開關的該第一端之一電壓準位相等,其中n為正整數。Another embodiment of this case discloses a sensing method, including the following operations. A sensing operation is performed by one of the (n+1)-th level sensing circuits in the multi-level sensing circuit, wherein one of the n-th level sensing circuits in the multi-level sensing circuit includes a first switch, a first Two switches and a third switch, the first switch and the second switch are controlled by an n-th stage scan signal, a first end of the first switch is coupled to a data line, and a second end of the first switch A first terminal of the second switch is coupled to an operating node, a second terminal of the second switch is coupled to a sensing element, and the third switch is coupled to the first switch and the second switch during the operation node. When the (n+1)th level sensing circuit performs the sensing operation, the third switch in the nth level sensing circuit is turned on, so that a voltage level of the operating node is equal to the voltage level of the first switch. The voltage levels of one of the first terminals are equal, where n is a positive integer.
於本文中,當一元件被稱為「連接」或「耦接」時,可指「電性連接」或「電性耦接」。「連接」或「耦接」亦可用以表示二或多個元件間相互搭配操作或互動。此外,雖然本文中使用「第一」、「第二」、…等用語描述不同元件,該用語僅是用以區別以相同技術用語描述的元件或操作。除非上下文清楚指明,否則該用語並非特別指稱或暗示次序或順位,亦非用以限定本發明。In this text, when a component is referred to as “connected” or “coupled”, it can be referred to as “electrically connected” or “electrically coupled”. "Connected" or "coupled" can also be used to mean that two or more components cooperate or interact with each other. In addition, although terms such as “first”, “second”, etc. are used herein to describe different elements, the terms are only used to distinguish elements or operations described in the same technical terms. Unless the context clearly indicates, the terms do not specifically refer to or imply order or sequence, nor are they used to limit the present invention.
除非另有定義,本文使用的所有術語(包括技術和科學術語)具有與本發明所屬領域的普通技術人員通常理解的相同的含義。將進一步理解的是,諸如在通常使用的字典中定義的那些術語應當被解釋為具有與它們在相關技術和本發明的上下文中的含義一致的含義,並且將不被解釋為理想化的或過度正式的意義,除非本文中明確地這樣定義。Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which the present invention belongs. It will be further understood that terms such as those defined in commonly used dictionaries should be interpreted as having meanings consistent with their meanings in the context of related technologies and the present invention, and will not be interpreted as idealized or excessive The formal meaning, unless explicitly defined as such in this article.
以下將以圖式揭露本案之複數個實施方式,為明確說明起見,許多實務上的細節將在以下敘述中一併說明。然而,應瞭解到,這些實務上的細節不應用以限制本案。也就是說,在本揭示內容部分實施方式中,這些實務上的細節是非必要的。此外,為簡化圖式起見,一些習知慣用的結構與元件在圖式中將以簡單示意的方式繪示之。Hereinafter, multiple implementation modes of this case will be disclosed in schematic form. For the sake of clarity, many practical details will be described in the following description. However, it should be understood that these practical details should not be used to limit the case. That is to say, in some implementations of the present disclosure, these practical details are unnecessary. In addition, in order to simplify the drawings, some conventionally used structures and elements are shown in the drawings in a simple and schematic manner.
第1圖為根據本案之一實施例所繪示之感測面板的示意圖。請參照第1圖,感測面板100包含閘極掃描器110、感測讀取器120、感測裝置130、多條閘極線GL(1)-GL(n+1)與多條資料線DL(1)-DL(m)。感測裝置130包含多級感測電路,其中上述多級感測電路包含第n級感測電路132與第(n+1)級感測電路134。n與m皆為正整數。Fig. 1 is a schematic diagram of a sensor panel drawn according to an embodiment of the present invention. Please refer to Figure 1, the
閘極掃描器110耦接多條閘極線GL(1)-GL(n+1),並用以提供掃描信號。感測讀取器120耦接多條資料線DL(1)-DL(m),並用以提供資料信號以讀取感測信號。在一些實施例中,第n級感測電路132耦接閘極線GL(n)與資料線DL(m)。在一些實施例中,第(n+1)級感測電路134耦接閘極線GL(n+1)與資料線DL(m)。The
在操作上,閘極掃描器110依序提供掃描信號至每一列的感測電路,當感測電路被掃描信號觸發時,資料線DL(1)-DL(m)提供一資料信號至該感測電路使感測讀取器120讀取該感測電路中的感測元件所感測到的感測信號,在感測讀取器120讀取完感測裝置130中所有感測電路的感測信號後,感測讀取器120便可以得到完整的感測畫面。In operation, the
第2圖為根據本案之一實施例所繪示的一種第1圖中的感測裝置之電路圖。請參照第2圖,為了方便說明,第2圖只畫出感測裝置130中的其中兩級感測電路,也就是第n級感測電路132與第(n+1)級感測電路134。FIG. 2 is a circuit diagram of the sensing device in FIG. 1 according to an embodiment of the present application. Please refer to Figure 2. For the convenience of description, Figure 2 only shows two of the sensing circuits in the
第n級感測電路132包含開關212、開關214、開關216與感測元件218。第(n+1)級感測電路134包含開關222、開關224、開關226與感測元件228。在一些實施例中,開關212、開關214與開關216以薄膜電晶體(TFT)實施,但本案不限於此,也可以藉由其他具有開關功能之元件實施。The n-th
如第2圖所示,開關212的第一端耦接資料線DL(m)於節點2121,開關212與開關214用以依據第n級掃描信號G(n)導通。在一些實施例中,第n級掃描線GL(n)用以提供第n級掃描信號G(n)。As shown in FIG. 2, the first end of the
如第2圖所示,開關214的第一端耦接開關212的第二端於節點2122,開關214的第二端耦接感測元件218於節點2142。開關216的第一端耦接開關212的第二端於節點2122,開關216用以依據控制信號K(n)導通。在一些實施例中,感測元件218可以藉由感光元件或感壓元件實施,但本案不限於此,也可以藉由其他感測不同類型信號之感測元件實施。As shown in FIG. 2, the first terminal of the
在開關216導通時,節點2122之電壓準位會被拉至一預定電壓準位,使得節點信號Q(n)同樣被拉至上述預定電壓準位,並且在開關212不導通的情況下使得節點2121與2122之電壓準位相等。因此,在一些實施例中,在開關216導通時,開關212的兩端之電壓準位相等,以確保在開關212不導通的情況下,流經開關212之電流為零。在一些實施例中,在開關216導通時,感測元件218所產生的漏電流無法通過開關212至資料線DL(m),從而防止漏電流造成的錯誤信號被資料線讀取。When the
在一些實施例中,當第n級掃描信號G(n)切換至致能電壓準位(如,高電壓準位)時,第n級感測電路132進行感測操作,資料線DL(m)讀取感測信號D(n),因此第n級掃描信號G(n)切換至致能電壓準位的時間又被稱為第n級感測電路132處於讀取階段。反之,在一些實施例中,第n級掃描信號G(n)切換至禁能電壓準位(如,低電壓準位)時,第n級感測電路132不進行感測操作,資料線DL(m)無法讀取感測信號D(n),因此第n級掃描信號G(n)切換至禁能電壓準位的時間又被稱為第n級感測電路132處於非讀取階段。In some embodiments, when the nth level scan signal G(n) is switched to the enable voltage level (eg, high voltage level), the nth
在一些實施例中,開關216的第二端(即節點2162)用以在第(n+1)級感測電路134處於讀取階段時接收電壓信號,該電壓信號之電壓準位可以與節點2121之電壓準位相等,因此開關216可以提供與節點2121之電壓準位相等之電壓信號至節點2122,使得開關212兩端電壓準位相等,以確保在開關212不導通的情況下,流經開關212之電流為零。因此,在一些實施例中,在第(n+1)級感測電路134處於讀取階段時,在開關212不導通的情況下,流經開關212之漏電流為零,使得資料線DL(m)在讀取第(n+1)級感測電路134之感測信號時無法通過開關212讀取到第n級感測電路132中的感測元件218所感測到的感測信號。In some embodiments, the second terminal of the switch 216 (ie, the node 2162) is used to receive a voltage signal when the (n+1)th
在一些實施例中,開關216的第二端(即節點2162)接收的電壓信號之電壓準位也可以依實際需求設定一參考電壓值。In some embodiments, the voltage level of the voltage signal received by the second terminal of the switch 216 (ie, the node 2162) can also be set to a reference voltage value according to actual requirements.
在一些實施例中,開關216的第二端(即節點2162)用以在第n級感測電路132處於非讀取階段時接收電壓信號,該電壓信號之電壓準位與節點2121之電壓準位相等,因此開關216可以提供與節點2121之電壓準位相等之電壓信號至節點2122,使得流經第一開關212之電流為零。因此,在一些實施例中,在第n級感測電路132處於非讀取階段時,流經開關212之漏電流為零,使得第n級感測電路132中的感測元件218所感測到的感測信號不會通過開關212被資料線DL(m)讀取到。In some embodiments, the second terminal (ie node 2162) of the
在一些實施例中,開關216的第二端(即節點2162)用以接收直流電壓信號。如第2圖所示,在一些實施例中,電源線DC用以提供該直流電壓信號。在一些實施例中,該直流電壓信號的電壓準位與節點2121之電壓準位相等。In some embodiments, the second terminal (ie, node 2162) of the
如第2圖所示,在一些實施例中,第(n-1)級掃描線GL(n-1)用以提供第(n-1)級掃描信號G(n-1)。在一些實施例中,第(n+1)級掃描線GL(n+1)用以提供第(n+1)級掃描信號G(n+1)。在一些實施例中,電源線Vc(n)與電源線Vc(n+1)用以提供低準位直流電壓信號,該些低準位直流電壓信號使感測元件218與感測元件228可以正常運作。As shown in FIG. 2, in some embodiments, the (n-1)th level scan line GL(n-1) is used to provide the (n-1)th level scan signal G(n-1). In some embodiments, the (n+1)th scan line GL(n+1) is used to provide the (n+1)th scan signal G(n+1). In some embodiments, the power line Vc(n) and the power line Vc(n+1) are used to provide low-level DC voltage signals. The low-level DC voltage signals enable the
第3圖為根據本案進行感測操作之一實施例所繪示之時序圖。請參照第2圖與第3圖,在第3圖所示之實施例中,在期間P31,第n級感測電路132處於非讀取階段,控制信號K(n)保持在高電壓準位以導通開關216,使得節點2122之電壓準位與節點2121之電壓準位相等,即開關212兩端電壓準位相等,以確保在開關212不導通的情況下,流經開關212之電流為零。FIG. 3 is a timing diagram of an embodiment of the sensing operation according to the present application. Please refer to FIGS. 2 and 3. In the embodiment shown in FIG. 3, during the period P31, the n-
在期間P32,第(n-1)級感測電路處於讀取階段,因此第(n-1)級掃描信號G(n-1)切換至高電壓準位,使得資料線可以讀取第(n-1)級感測電路之感測信號。In the period P32, the (n-1)th level sensing circuit is in the reading phase, so the (n-1)th level scan signal G(n-1) is switched to a high voltage level, so that the data line can read the (n-1)th level. -1) Sensing signal of class sensing circuit.
在期間P33,第n級感測電路132處於讀取階段,因此第n級掃描信號G(n)切換至高電壓準位以導通開關212與開關214,控制信號K(n)切換至低電壓準位以關閉開關216使得節點信號Q(n)的電壓準位為浮動電壓準位,此時資料線DL(m)可以通過開關212與開關214讀取感測信號D(n)。During the period P33, the nth
在期間P34,第n級感測電路132處於非讀取階段且第(n+1)級感測電路134處於讀取階段,因此第n級掃描信號G(n)切換至低電壓準位以關閉開關212與開關214,控制信號K(n)切換至高電壓準位以導通開關216,使得節點2122之電壓準位與節點2121之電壓準位相等,即開關212兩端電壓準位相等,以確保在開關212不導通的情況下,流經開關212之電流為零。During the period P34, the nth
在一些實施例中,在期間P34,第(n+1)級感測電路134處於讀取階段,第(n+1)級掃描信號G(n+1)切換至高電壓準位,控制信號K(n+1)切換至低電壓準位,以進行第(n+1)級感測電路134之感測操作。In some embodiments, during the period P34, the (n+1)th
在一些實施例中,控制信號K(n)由信號產生器或是其他的信號源(如波形產生器、函數產生器等)提供。In some embodiments, the control signal K(n) is provided by a signal generator or other signal sources (such as a waveform generator, a function generator, etc.).
第4圖為根據本案進行感測操作之另一實施例所繪示之時序圖。請參照第2圖與第4圖,期間P41至期間P43之操作與第3圖所示之實施例中期間P31至期間P33之操作相同,因此不再重複說明。第4圖之實施例與第3圖之實施例不同的是在期間P44與期間P45。FIG. 4 is a timing diagram of another embodiment of the sensing operation according to the present application. Please refer to FIG. 2 and FIG. 4, the operations in the period P41 to P43 are the same as the operations in the period P31 to P33 in the embodiment shown in FIG. 3, so the description will not be repeated. The difference between the embodiment in FIG. 4 and the embodiment in FIG. 3 is in the period P44 and the period P45.
在期間P44,第n級感測電路132在期間P42讀取完畢後,節點信號Q(n)維持在與節點2121之電壓準位相同之電壓準位,使得開關212兩端電壓準位相同,以確保在開關212不導通的情況下,流經開關212之電流為零,因此控制信號K(n)可以維持在低電壓準位且開關216維持關閉直至期間P45。In the period P44, after the nth-
在一些實施例中,節點信號Q(n)藉由節點2122的寄生電容以維持在與節點2121之電壓準位相同之電壓準位。In some embodiments, the node signal Q(n) is maintained at the same voltage level as the voltage level of the
在期間P45,控制信號K(n)切換至高電壓準位以導通開關216,使得節點2122之電壓準位與節點2121之電壓準位相等。During the period P45, the control signal K(n) is switched to the high voltage level to turn on the
在一些實施例中,期間P45發生在所有的感測電路都被掃描完畢以取得完整的感測畫面之前,或者是要讀取下一個感測畫面而閘極掃描器110開始提供下一輪的掃描信號之前,以免節點2122的寄生電容放電過多而使節點2122無法長時間維持在與節點2121之電壓準位相同之電壓準位。In some embodiments, the period P45 occurs before all the sensing circuits have been scanned to obtain a complete sensing image, or the next sensing image is to be read and the
第5圖為根據本案之一實施例所繪示的一種第1圖中的感測裝置之電路圖。相較於第2圖,第5圖更包含了開關512、開關514與電容516。FIG. 5 is a circuit diagram of the sensing device in FIG. 1 according to an embodiment of the present application. Compared with FIG. 2, FIG. 5 further includes a
如第5圖所示,在一些實施例中,開關512的控制端耦接第(n-1)級掃描線GL(n-1),開關512的第一端耦接第n級掃描線GL(n),開關512的第二端耦接開關216的控制端。在一些實施例中,開關514的控制端與開關514的第二端耦接第(n+1)級掃描線GL(n+1),開關514的第一端耦接開關216的控制端。在一些實施例中,電容516的第一端耦接開關216的控制端,電容516的第二端耦接電源線DC。As shown in FIG. 5, in some embodiments, the control terminal of the
在一些實施例中,開關512與開關514用以調整控制信號K(n)。在一些實施例中,第n級感測電路132只有開關512而沒有開關514。在另外一些實施例中,第n級感測電路132只有開關514而沒有開關512。在不同的實施例中,可以透過不同的方式來調整控制信號K(n),上述不同的方式包含使用不同的開關組合。In some embodiments, the
第6圖為根據本案進行感測操作之一實施例所繪示之時序圖。請參照第5圖與第6圖,在第6圖所示之實施例中,在期間P61,第n級感測電路132處於非讀取階段,控制信號K(n)保持在高電壓準位以導通開關216,使得節點2122之電壓準位與節點2121之電壓準位相等,即開關212兩端之電壓準位相等,以確保在開關212不導通的情況下,流經開關212之電流為零。FIG. 6 is a timing diagram of an embodiment of a sensing operation according to the present application. Please refer to FIGS. 5 and 6. In the embodiment shown in FIG. 6, during the period P61, the n-
在期間P62,第(n-1)級感測電路處於讀取階段,第(n-1)級掃描信號G(n-1)切換至高電壓準位而導通開關512,此時第n級感測電路132處於非讀取階段,因此第n級掃描信號G(n)之電壓準位為低電壓準位而關閉開關212與開關214並且通過開關512將控制信號K(n)拉至低電壓準位以關閉開關216,使得與節點2122耦接之三個開關(開關212、開關214與開關216)皆為關閉,以至於節點信號Q(n)的電壓準位為浮動電壓準位,為第n級感測電路132的讀取階段作準備。During the period P62, the (n-1)th level sensing circuit is in the reading phase, and the (n-1)th level scanning signal G(n-1) is switched to the high voltage level to turn on the
在期間P63,第n級感測電路132處於讀取階段,因此第n級掃描信號G(n)切換至高電壓準位以導通開關212與開關214,開關512與開關514分別被第(n-1)級掃描信號G(n-1)與第(n+1)級掃描信號G(n+1)關閉使得控制信號K(n)維持在低電壓準位,因此控制信號K(n)關閉開關216,使得開關216無法提供電壓信號至節點2122,此時資料線DL(m)的資料信號通過開關212與開關214將感測信號D(n)充電至高電壓準位,同時資料線DL(m)讀取感測信號D(n)。During the period P63, the nth
在期間P64,第n級感測電路132處於非讀取階段且第(n+1)級感測電路134處於讀取階段,因此第n級掃描信號G(n)切換至低電壓準位以關閉開關212與開關214,第(n+1)級掃描信號G(n+1)導通開關514而將控制信號K(n)拉至高電壓準位以導通開關216,使得節點2122之電壓準位拉至與節點2121之電壓準位相等之電壓準位,即開關212兩端之電壓準位相等,以確保在開關212不導通的情況下,流經開關212之電流為零。During the period P64, the nth
在一些實施例中,電容516用以維持控制信號K(n)。舉例來說,在期間P64,控制信號K(n)被拉至高電壓準位,電容516被控制信號K(n)充電,在期間P64之後,第(n+1)級感測電路134處於非讀取階段,第(n+1)級掃描信號G(n+1)切換至低電壓準位而關閉開關514,此時電容516便可以維持節點5122之電壓準位,使得控制信號K(n)維持在高電壓準位以導通開關216。In some embodiments, the
第7圖為根據本案之一實施例所繪示的感測方法的一流程圖。如第7圖所示,感測方法700的一實施例包含步驟S10與S12。感測方法700可以應用於第2圖所示之感測裝置130。FIG. 7 is a flowchart of the sensing method according to an embodiment of the present application. As shown in FIG. 7, an embodiment of the
請參照第7圖與第2圖,步驟S10包含: 藉由多級感測電路中之一第(n+1)級感測電路134進行一感測操作,其中該多級感測電路中之一第n級感測電路132包含開關212、開關214以及開關216,開關212與開關214由第n級掃描信號G(n)控制,開關212的第一端耦接資料線DL(m),開關212的第二端耦接開關214的第一端於節點2122,開關214的第二端耦接一感測元件218,開關216耦接開關212與開關214於節點2122,其中n為正整數。Please refer to FIG. 7 and FIG. 2. Step S10 includes: performing a sensing operation by one of the (n+1)-th
在一些實施例中,感測元件218用以感測一外部信號以產生一感測信號,資料線DL(m)用以提供一資料信號以在第n級感測電路132進行感測操作時讀取該感測信號。在一些實施例中,第n級感測電路132進行感測操作時又稱第n級感測電路132處於讀取階段。在一些實施例中,在第n級感測電路132進行感測操作時,第n級掃描信號G(n)為高電壓準位。In some embodiments, the
步驟S12包含: 當第(n+1)級感測電路134進行感測操作時,導通第n級感測電路132中的開關216,使得節點2122之電壓準位與節點2121之電壓準位相等,即開關212兩端之電壓準位相等,以確保在開關212不導通的情況下,流經開關212之電流為零。Step S12 includes: when the (n+1)th
在一些實施例中,如第7圖所示的感測方法700可以應用於第5圖所示之感測裝置130,感測方法700更包含:當第(n+1)級感測電路134進行感測操作時,藉由開關216傳送一電壓信號至節點2122,該電壓信號之電壓準位與節點2121之電壓準位相等。In some embodiments, the
在一些實施例中,如第7圖所示的感測方法700可以應用於第5圖所示之感測裝置130,感測方法700更包含:當第(n-1)級感測電路進行感測操作時,藉由第n級掃描信號G(n)關閉開關216,使得節點信號Q(n)的電壓準位為浮動電壓準位,以便隨後的第n級感測電路132進行感測操作,其中n大於等於二。In some embodiments, the
在一些實施例中,如第7圖所示的感測方法700可以應用於第5圖所示之感測裝置130,感測方法700更包含:當第n級感測電路132進行感測操作時,藉由第n級掃描信號G(n)導通開關212。In some embodiments, the
綜上所述,本發明一實施例的感測裝置及感測方法,可以在感測時大幅降低來自非讀取階段之感測電路的漏電流而減少漏電流造成之錯誤信號的問題,進而改善信號品質。In summary, the sensing device and sensing method of an embodiment of the present invention can greatly reduce the leakage current from the sensing circuit in the non-reading phase during sensing, thereby reducing the problem of false signals caused by the leakage current, and then Improve signal quality.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field can make some changes and modifications without departing from the spirit and scope of the present invention. The protection scope of the present invention shall be subject to those defined by the attached patent application scope.
100:感測面板
110:閘極掃描器
120:感測讀取器
130:感測裝置
132:第n級感測電路
134:第(n+1)級感測電路
212~216:開關
218:感測元件
222~226:開關
228:感測元件
2121:節點
2122:節點
2142:節點
2162:節點
512~514:開關
516:電容
5122:節點
700:感測方法
DL(1)~DL(m):資料線
GL(1)~GL(n+1):閘極線
K(n):控制信號
K(n+1):控制信號
Q(n):節點信號
Q(n+1):節點信號
G(n-1):第(n-1)級掃描信號
G(n):第n級掃描信號
G(n+1):第(n+1)級掃描信號
D(n):感測信號
D(n+1):感測信號
DC:電源線
Vc(n):電源線
Vc(n+1):電源線
P31~P34:期間
P41~P45:期間
P61~P64:期間
S10:步驟
S12:步驟100: Sensing panel
110: Gate Scanner
120: Sensor Reader
130: sensing device
132: nth level sensing circuit
134: (n+1)
第1圖為根據本案之一實施例所繪示之感測面板的示意圖。 第2圖為根據本案之一實施例所繪示的一種第1圖中的感測裝置之電路圖。 第3圖為根據本案進行感測操作之一實施例所繪示之時序圖。 第4圖為根據本案進行感測操作之另一實施例所繪示之時序圖。 第5圖為根據本案之一實施例所繪示的一種第1圖中的感測裝置之電路圖。 第6圖為根據本案進行感測操作之一實施例所繪示之時序圖。 第7圖為根據本案之一實施例所繪示的一流程圖。Fig. 1 is a schematic diagram of a sensor panel drawn according to an embodiment of the present invention. FIG. 2 is a circuit diagram of the sensing device in FIG. 1 according to an embodiment of the present application. FIG. 3 is a timing diagram of an embodiment of the sensing operation according to the present application. FIG. 4 is a timing diagram of another embodiment of the sensing operation according to the present application. FIG. 5 is a circuit diagram of the sensing device in FIG. 1 according to an embodiment of the present application. FIG. 6 is a timing diagram of an embodiment of a sensing operation according to the present application. Figure 7 is a flow chart drawn according to an embodiment of the present case.
國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無Domestic deposit information (please note in the order of deposit institution, date and number) without Foreign hosting information (please note in the order of hosting country, institution, date, and number) without
130:感測裝置130: sensing device
132:第n級感測電路132: nth level sensing circuit
134:第(n+1)級感測電路134: (n+1) level sensing circuit
212~216:開關212~216: switch
218:感測元件218: sensing element
222~226:開關222~226: switch
228:感測元件228: sensing element
2121:節點2121: Node
2122:節點2122: Node
2142:節點2142: Node
2162:節點2162: Node
DL(m):資料線DL(m): data line
GL(n-1)、GL(n)、GL(n+1):閘極線GL(n-1), GL(n), GL(n+1): gate line
K(n):控制信號K(n): control signal
K(n+1):控制信號K(n+1): control signal
Q(n):節點信號Q(n): node signal
Q(n+1):節點信號Q(n+1): node signal
G(n):第n級掃描信號G(n): nth level scan signal
G(n+1):第(n+1)級掃描信號G(n+1): (n+1)th level scan signal
D(n):感測信號D(n): sense signal
D(n+1):感測信號D(n+1): sensing signal
DC:電源線DC: power cord
Vc(n):電源線Vc(n): power cord
Vc(n+1):電源線Vc(n+1): power cord
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