TW202104302A - Dicing tape and dicing die-bonding film - Google Patents

Dicing tape and dicing die-bonding film Download PDF

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TW202104302A
TW202104302A TW109116898A TW109116898A TW202104302A TW 202104302 A TW202104302 A TW 202104302A TW 109116898 A TW109116898 A TW 109116898A TW 109116898 A TW109116898 A TW 109116898A TW 202104302 A TW202104302 A TW 202104302A
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acrylate
die
adhesive layer
structural unit
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田中俊平
田村彰規
福井章洋
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日商日東電工股份有限公司
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    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • C09J7/38Pressure-sensitive adhesives [PSA]
    • C09J7/381Pressure-sensitive adhesives [PSA] based on macromolecular compounds obtained by reactions involving only carbon-to-carbon unsaturated bonds
    • C09J7/385Acrylic polymers
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    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/06Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material
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    • BPERFORMING OPERATIONS; TRANSPORTING
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
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    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F220/10Esters
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    • C08F220/16Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms
    • C08F220/18Esters of monohydric alcohols or phenols of phenols or of alcohols containing two or more carbon atoms with acrylic or methacrylic acids
    • C08F220/1809C9-(meth)acrylate
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    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F8/00Chemical modification by after-treatment
    • C08F8/30Introducing nitrogen atoms or nitrogen-containing groups
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/18Manufacture of films or sheets
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    • C09J11/00Features of adhesives not provided for in group C09J9/00, e.g. additives
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    • C09J133/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
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    • C09J133/04Homopolymers or copolymers of esters
    • C09J133/06Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, the oxygen atom being present only as part of the carboxyl radical
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2270/00Resin or rubber layer containing a blend of at least two different polymers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
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    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
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  • Adhesive Tapes (AREA)
  • Dicing (AREA)
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Abstract

Provided is a dicing tape or the like, which includes a base layer and an adhesive layer overlapping with the base layer, wherein the adhesive layer includes an acrylic polymer, the acrylic polymer includes a constitutional unit of C9-C11 alkyl (meth)acrylate and a constitutional unit of hydroxyl group-containing (meth)acrylate, and the acrylic polymer includes 40 mol% or more and 85 mol% or less of the constitutional unit of C9-C11 alkyl (meth)acrylate.

Description

切晶帶、及切晶黏晶膜Slicing tape, and slicing chip mucous film

本發明係關於一種例如於製造半導體積體電路時使用之切晶帶、及具備該切晶帶之切晶黏晶膜。The present invention relates to a dicing tape used in the manufacture of semiconductor integrated circuits, and a dicing die attach film provided with the dicing tape.

先前,已知有於半導體積體電路之製造中使用之切晶黏晶膜。此種切晶黏晶膜例如具備切晶帶及積層於該切晶帶且接著於晶圓之黏晶層。切晶帶具有基材層、及與黏晶層接觸之黏著層。此種切晶黏晶膜於半導體積體電路之製造中例如以下述方式使用。Previously, there are known dicing die films used in the manufacture of semiconductor integrated circuits. Such a dicing die bonding film includes, for example, a dicing tape and a die bonding layer laminated on the dicing tape and then on the wafer. The dicing tape has a substrate layer and an adhesive layer in contact with the die-bonding layer. Such a dicing die-bonding film is used in the manufacture of semiconductor integrated circuits in the following manner, for example.

製造半導體積體電路之方法通常具備:藉由高積體之電子電路於矽晶圓之單面側形成電路面之前步驟、及自形成有電路面之晶圓將晶片切出並進行組裝之後步驟。 後步驟例如具有如下步驟:安裝步驟,其係將晶圓之與電路面為相反側之面貼附於黏晶層,將晶圓固定於切晶帶;切晶步驟,其係藉由割斷處理將經由黏晶層貼附於切晶帶之半導體晶圓加工成較小之晶片(die);擴展步驟,其係使加工為較小之半導體晶片彼此之間隔擴大;拾取步驟,其係將黏晶層與黏著劑層之間剝離,於貼附有黏晶層之狀態下取出半導體晶片(die);及黏晶步驟,其係使貼附有黏晶層之狀態之半導體晶片(die)接著於被接著體。半導體積體電路經過該等步驟而製造。 上述之製造方法之拾取步驟中,被割斷之半導體晶片和與其密接之相當於晶片之尺寸之黏晶層一起被拾取機構之銷構件自切晶帶之下側頂起,且自切晶帶被拾取。 但是,近年來,隨著半導體製品之輕薄化及高積體化,半導體晶圓之厚度與從前相比變薄。若使用此種半導體晶圓,則更容易產生半導體晶圓因拾取步驟中之上述之頂起而發生變形從而破損之問題。為了防止此種破損,對切晶帶要求於割斷後即便以較少之頂起量亦能夠自黏晶膜良好地剝離之性能、即良好之拾取性。The method of manufacturing a semiconductor integrated circuit usually includes: a step before a circuit surface is formed on a single side of a silicon wafer by a high-integration electronic circuit, and a step after the chip is cut out from the wafer with the circuit surface and assembled . The latter steps include, for example, the following steps: the mounting step, which is to attach the surface of the wafer on the opposite side to the circuit surface to the die-bonding layer, and fix the wafer to the dicing tape; the dicing step, which is processed by cutting The semiconductor wafers attached to the dicing tape through the die bonding layer are processed into smaller dies; the expansion step is to expand the distance between the smaller semiconductor chips that are processed; the picking step is to bond The wafer layer and the adhesive layer are peeled off, and the semiconductor chip (die) is taken out in the state where the die layer is attached; and the die bonding step is to adhere the semiconductor chip (die) in the state where the die layer is attached To be followed by the body. Semiconductor integrated circuits are manufactured through these steps. In the pick-up step of the above-mentioned manufacturing method, the cut semiconductor wafer and the die bonding layer corresponding to the size of the wafer in close contact with it are pushed up from the lower side of the dicing tape by the pin member of the pickup mechanism, and the self-cutting tape is Pick up. However, in recent years, as semiconductor products have become thinner and more compact, the thickness of semiconductor wafers has become thinner than before. If such a semiconductor wafer is used, the problem of deformation and breakage of the semiconductor wafer due to the above-mentioned lifting in the pickup step is more likely to occur. In order to prevent such damage, the dicing tape is required to be able to peel off the die-bonding film with a small amount of lift after cutting, that is, good pick-up properties.

對此,作為先前之切晶黏晶膜,例如已知有具備由包含基礎聚合物及熱交聯劑之黏著劑組合物形成之黏著劑層者(專利文獻1)。 於專利文獻1中記載之切晶黏晶膜中,黏著劑層係加熱前之凝膠分率未達90質量%且加熱後之凝膠分率變化為90質量%以上之層。藉由加熱而凝膠分率成為90質量%以上之黏著劑層可容易地與黏晶層剝離。 [先前技術文獻] [專利文獻]In this regard, as a conventional chip adhesive film, for example, a known adhesive layer is provided with an adhesive composition containing a base polymer and a thermal crosslinking agent (Patent Document 1). In the diced wafer described in Patent Document 1, the adhesive layer has a gel fraction of less than 90% by mass before heating and a change in the gel fraction after heating of 90% by mass or more. The adhesive layer whose gel fraction becomes 90% by mass or more by heating can be easily peeled off from the adhesive crystal layer. [Prior Technical Literature] [Patent Literature]

[專利文獻1]日本專利特開2010-278427號公報[Patent Document 1] Japanese Patent Laid-Open No. 2010-278427

[發明所欲解決之問題][The problem to be solved by the invention]

但是,對於如上所述之能夠使拾取性良好之切晶黏晶膜或切晶帶,尚不能說進行了充分之研究。However, it cannot be said that sufficient research has been conducted on the diced die-cut film or die-cut tape that can provide good pick-up properties as described above.

因此,本發明之課題在於提供一種能夠使拾取性良好之切晶帶、及能夠使拾取性良好之切晶黏晶膜。 [解決問題之技術手段]Therefore, the subject of the present invention is to provide a dicing tape capable of achieving good pick-up properties and a dicing die bonding film capable of achieving good pick-up properties. [Technical means to solve the problem]

為了解決上述課題,本發明之切晶帶之特徵在於, 其係具備基材層、及與該基材層重疊之黏著劑層者,且 前述黏著劑層包含丙烯酸系聚合物, 前述丙烯酸系聚合物包含(甲基)丙烯酸C9〜C11烷基酯之結構單元及含羥基之(甲基)丙烯酸酯之結構單元, 前述丙烯酸系聚合物包含前述(甲基)丙烯酸C9〜C11烷基酯之結構單元40 mol%以上且85 mol%以下。 根據上述構成之切晶帶,能夠發揮良好之拾取性。In order to solve the above-mentioned problems, the dicing tape of the present invention is characterized in that: It is provided with a substrate layer and an adhesive layer overlapping the substrate layer, and The aforementioned adhesive layer contains acrylic polymer, The aforementioned acrylic polymer contains structural units of C9~C11 alkyl (meth)acrylates and structural units of hydroxyl-containing (meth)acrylates, The aforementioned acrylic polymer contains the structural units of the aforementioned (meth)acrylic acid C9~C11 alkyl ester of 40 mol% or more and 85 mol% or less. According to the dicing tape with the above structure, good pick-up properties can be exerted.

於本發明之切晶帶中,較佳為前述丙烯酸系聚合物包含前述含羥基之(甲基)丙烯酸酯之結構單元1 mol%以上且30 mol%以下。藉此,能夠發揮更良好之拾取性。In the dicing tape of the present invention, it is preferable that the acrylic polymer includes 1 mol% or more and 30 mol% or less of the structural units of the hydroxyl-containing (meth)acrylate. With this, better pick-up properties can be exerted.

於本發明之切晶帶中,較佳為前述含羥基之(甲基)丙烯酸酯之結構單元為含羥基之(甲基)丙烯酸C2〜C4烷基酯之結構單元。藉此,能夠發揮更良好之拾取性。In the dicing tape of the present invention, it is preferable that the structural unit of the aforementioned hydroxyl-containing (meth)acrylate is the structural unit of the hydroxyl-containing (meth)acrylate C2-C4 alkyl ester. With this, better pick-up properties can be exerted.

於本發明之切晶帶中,較佳為前述丙烯酸系聚合物進而具有含聚合性基之(甲基)丙烯酸酯之結構單元。藉此,能夠發揮更良好之拾取性。In the dicing tape of the present invention, it is preferable that the aforementioned acrylic polymer further has a structural unit of (meth)acrylate containing a polymerizable group. With this, better pick-up properties can be exerted.

於本發明之切晶帶中,較佳為前述丙烯酸系聚合物以莫耳比[C/(B+C)]計,相對於前述含羥基之(甲基)丙烯酸酯之結構單元(B)及前述含聚合性基之(甲基)丙烯酸酯之結構單元(C),包含前述含聚合性基之(甲基)丙烯酸酯之結構單元(C)0.50以上且0.95以下。藉此,能夠發揮更良好之拾取性。In the dicing tape of the present invention, it is preferable that the aforementioned acrylic polymer is calculated in molar ratio [C/(B+C)] with respect to the structural unit (B) of the aforementioned hydroxyl-containing (meth)acrylate and the aforementioned The polymerizable group-containing (meth)acrylate structural unit (C) includes the aforementioned polymerizable group-containing (meth)acrylate structural unit (C) 0.50 to 0.95. With this, better pick-up properties can be exerted.

本發明之切晶黏晶膜具備上述之切晶帶、及積層於該切晶帶之黏著劑層之黏晶層。 [發明之效果]The chip adhesive film of the present invention includes the above-mentioned chipping tape and a chip bonding layer laminated on the adhesive layer of the chipping tape. [Effects of Invention]

本發明之切晶帶及切晶黏晶膜發揮能夠使拾取性良好之效果。The dicing tape and the dicing chip adhesive film of the present invention have the effect of enabling good pick-up properties.

以下,一面參照圖式一面對本發明之切晶黏晶膜及切晶帶之一實施形態進行說明。Hereinafter, one embodiment of the dicing die bonding film and the dicing tape of the present invention will be described with reference to the drawings.

本實施形態之切晶黏晶膜1如圖1所示,具備切晶帶20、及積層於該切晶帶20之黏著劑層22且與半導體晶圓接著之黏晶層10。As shown in FIG. 1, the dicing die-cutting film 1 of this embodiment includes a die-cutting tape 20 and an adhesive layer 22 laminated on the die-cutting tape 20 and a die-bonding layer 10 bonded to a semiconductor wafer.

本實施形態之切晶帶20通常為長條片,在使用之前以捲繞之狀態保管。本實施形態之切晶黏晶膜1黏貼於具有比經割斷處理之矽晶圓大一圈之內徑之圓環狀之框並切割而使用。The dicing tape 20 of this embodiment is usually a long piece, and is stored in a wound state before use. The dicing die sticking film 1 of this embodiment is pasted on an annular frame with an inner diameter that is one circle larger than that of the silicon wafer subjected to the slicing process, and then cut and used.

本實施形態之切晶帶20具備基材層21、及與該基材層21重疊之黏著劑層22。黏著劑層22至少包含丙烯酸系聚合物。 上述之丙烯酸系聚合物於分子中至少具有(甲基)丙烯酸C9〜C11烷基酯之結構單元及含羥基之(甲基)丙烯酸酯之結構單元。 再者,本說明書中,「(甲基)丙烯酸酯」之表述表示甲基丙烯酸酯(methacrylate)及丙烯酸酯(acrylate)中之至少一者。同樣地,「(甲基)丙烯酸」之表述表示甲基丙烯酸及丙烯酸中之至少一者。The dicing tape 20 of this embodiment includes a base layer 21 and an adhesive layer 22 overlapping the base layer 21. The adhesive layer 22 contains at least an acrylic polymer. The above-mentioned acrylic polymer has at least the structural unit of C9~C11 alkyl (meth)acrylate and the structural unit of hydroxyl-containing (meth)acrylate in the molecule. Furthermore, in this specification, the expression "(meth)acrylate" means at least one of methacrylate and acrylate. Similarly, the expression "(meth)acrylic acid" means at least one of methacrylic acid and acrylic acid.

本實施形態中,黏著劑層22例如包含上述之丙烯酸系聚合物、異氰酸酯化合物(交聯劑)、及聚合起始劑。In this embodiment, the adhesive layer 22 includes, for example, the above-mentioned acrylic polymer, isocyanate compound (crosslinking agent), and polymerization initiator.

黏著劑層22較佳為具有3 μm以上且200 μm以下之厚度。藉由黏著劑層22之厚度為3 μm以上,能夠使對黏晶層10之黏著力更良好。藉由黏著劑層22之厚度為200 μm以下,切晶帶20之操作性變得更良好。黏著劑層22之形狀及大小通常與基材層21之形狀及大小相同。The adhesive layer 22 preferably has a thickness of 3 μm or more and 200 μm or less. With the thickness of the adhesive layer 22 being 3 μm or more, the adhesion to the die bonding layer 10 can be made better. When the thickness of the adhesive layer 22 is 200 μm or less, the operability of the dicing tape 20 becomes better. The shape and size of the adhesive layer 22 are generally the same as the shape and size of the base layer 21.

本實施形態中,上述之丙烯酸系聚合物由(甲基)丙烯酸C9〜C11烷基酯之結構單元、含羥基之(甲基)丙烯酸酯之結構單元及含聚合性基之(甲基)丙烯酸酯之結構單元構成。再者,結構單元為構成丙烯酸系聚合物之主鏈之單元。上述之丙烯酸系聚合物中之各側鏈包含於構成主鏈之各結構單元中。In this embodiment, the above-mentioned acrylic polymer is composed of structural units of C9~C11 alkyl (meth)acrylates, structural units of (meth)acrylates containing hydroxyl groups, and (meth)acrylic acids containing polymerizable groups. The structural unit of the ester is composed. Furthermore, the structural unit is a unit constituting the main chain of the acrylic polymer. Each side chain in the above-mentioned acrylic polymer is contained in each structural unit constituting the main chain.

黏著劑層22中所含之丙烯酸系聚合物中,上述之結構單元可藉由1 H-NMR、13 C-NMR等NMR(Nuclear Magnetic Resonance,核磁共振)分析、熱分解GC/MS(Gas Chromatography-Mass Spectrometry,氣相層析質譜)分析、及紅外分光法等進行確認。再者,丙烯酸系聚合物中之上述之結構單元之莫耳比率通常由使丙烯酸系聚合物進行聚合時之調配量(添加量)算出。In the acrylic polymer contained in the adhesive layer 22, the above-mentioned structural units can be analyzed by NMR (Nuclear Magnetic Resonance, nuclear magnetic resonance) such as 1 H-NMR, 13 C-NMR, and thermal decomposition GC/MS (Gas Chromatography). -Mass Spectrometry, gas chromatography mass spectrometry) analysis, and infrared spectroscopy to confirm. In addition, the molar ratio of the above-mentioned structural unit in the acrylic polymer is usually calculated from the compounding amount (addition amount) when the acrylic polymer is polymerized.

(甲基)丙烯酸C9〜C11烷基酯之結構單元源自(甲基)丙烯酸C9〜C11烷基酯單體。換言之,(甲基)丙烯酸C9〜C11烷基酯單體進行了聚合反應後之分子結構為(甲基)丙烯酸C9〜C11烷基酯之結構單元。詳細而言,藉由(甲基)丙烯酸C9〜C11烷基酯單體之聚合反應產生之鍵構成丙烯酸系聚合物之主鏈之一部分。「C9〜C11烷基」之表述表示對(甲基)丙烯酸進行酯鍵結之烴部分之碳數。換言之,(甲基)丙烯酸C9〜C11烷基酯單體表示(甲基)丙烯酸與碳數9〜11之醇(通常為1元醇)進行酯鍵結而成之單體。 C9〜C11烷基之烴部分可為飽和烴,亦可為不飽和烴。例如,C9〜C11烷基之烴部分為直鏈狀飽和烴、支鏈狀飽和烴、脂環式烴、芳香族烴。上述烴部分較佳為直鏈狀飽和烴或支鏈狀飽和烴,更佳為支鏈狀飽和烴。 再者,C9〜C11烷基之烴部分較佳為不包含含有氧(O)或氮(N)等之極性基。藉此,能夠抑制烷基聚合物之極性極端地提高。因此,可抑制黏著劑層22對黏晶層10具有過度之親和性。因此,能夠自黏晶層10將切晶帶20更良好地剝離。The structural unit of (meth)acrylic acid C9~C11 alkyl ester is derived from (meth)acrylic acid C9~C11 alkyl ester monomer. In other words, the molecular structure of the C9~C11 alkyl (meth)acrylate monomer after the polymerization reaction is the structural unit of the C9~C11 alkyl (meth)acrylate. In detail, the bonds generated by the polymerization reaction of (meth)acrylic acid C9~C11 alkyl ester monomers constitute a part of the main chain of the acrylic polymer. The expression "C9~C11 alkyl" means the carbon number of the hydrocarbon moiety ester-bonded to (meth)acrylic acid. In other words, (meth)acrylic acid C9~C11 alkyl ester monomer means a monomer formed by ester bonding of (meth)acrylic acid and an alcohol with 9 to 11 carbon atoms (usually a monohydric alcohol). The hydrocarbon part of the C9~C11 alkyl group may be a saturated hydrocarbon or an unsaturated hydrocarbon. For example, the hydrocarbon portion of the C9 to C11 alkyl group is linear saturated hydrocarbon, branched saturated hydrocarbon, alicyclic hydrocarbon, and aromatic hydrocarbon. The aforementioned hydrocarbon portion is preferably a linear saturated hydrocarbon or a branched saturated hydrocarbon, and more preferably a branched saturated hydrocarbon. Furthermore, the hydrocarbon portion of the C9~C11 alkyl group preferably does not contain a polar group containing oxygen (O) or nitrogen (N). This can suppress the extreme increase in the polarity of the alkyl polymer. Therefore, it is possible to prevent the adhesive layer 22 from having excessive affinity for the die bond layer 10. Therefore, the dicing tape 20 can be peeled off from the adhesive crystal layer 10 more satisfactorily.

作為(甲基)丙烯酸C9〜C11烷基酯之結構單元,例如可列舉:(甲基)丙烯酸正壬酯、(甲基)丙烯酸異(第二)壬酯、(甲基)丙烯酸第三壬酯、(甲基)丙烯酸異𦯉基酯、(甲基)丙烯酸正癸酯、(甲基)丙烯酸異(第二)癸酯、(甲基)丙烯酸第三癸酯、(甲基)丙烯酸正十一烷基酯、(甲基)丙烯酸異(第二)十一烷基酯、(甲基)丙烯酸第三-十一烷基酯等之各結構單元。 作為(甲基)丙烯酸C9〜C11烷基酯之結構單元,較佳為(甲基)丙烯酸壬酯之結構單元及丙烯酸癸酯之結構單元中之至少1種,更佳為(甲基)丙烯酸異壬酯之結構單元及(甲基)丙烯酸異癸酯之結構單元中之至少1種。 (甲基)丙烯酸烷基酯結構單元中,若烴部分之碳數為8以下,則黏著劑層22與黏晶層10之親和性過度升高,由此有難以將切晶帶20自黏晶層10剝離之虞。又,若烴部分之碳數為12以上,則黏著劑層22與黏晶層10之親和性過度降低,由此有於半導體積體電路之製造方法(於後文詳細敍述)中切晶帶20自黏晶層10意外剝離之虞。烴部分之碳數尤佳為9或10。As the structural unit of the C9~C11 alkyl (meth)acrylate, for example, n-nonyl (meth)acrylate, iso(second)nonyl (meth)acrylate, tertiary nonyl (meth)acrylate Esters, iso(meth)acrylate, n-decyl (meth)acrylate, iso(second) decyl (meth)acrylate, tertiary decyl (meth)acrylate, n-decyl (meth)acrylate Structural units of undecyl ester, iso(second) undecyl (meth)acrylate, and tertiary undecyl (meth)acrylate. The structural unit of C9~C11 alkyl (meth)acrylate is preferably at least one of the structural unit of nonyl (meth)acrylate and the structural unit of decyl acrylate, more preferably (meth)acrylic acid At least one of the structural unit of isononyl ester and the structural unit of isodecyl (meth)acrylate. In the alkyl (meth)acrylate structural unit, if the carbon number of the hydrocarbon moiety is 8 or less, the affinity between the adhesive layer 22 and the crystal bonding layer 10 is excessively increased, thereby making it difficult to self-adhere the dicing tape 20 The crystal layer 10 may be peeled off. In addition, if the carbon number of the hydrocarbon portion is 12 or more, the affinity between the adhesive layer 22 and the die bonding layer 10 is excessively reduced, which is useful in the manufacturing method of semiconductor integrated circuits (described in detail later). 20 The self-adhesive crystal layer 10 may be accidentally peeled off. The carbon number of the hydrocarbon part is particularly preferably 9 or 10.

上述之丙烯酸系聚合物於分子中包含(甲基)丙烯酸C9〜C11烷基酯之結構單元(以下,有時簡稱為A成分)40 mol%以上且85 mol%以下。 上述之丙烯酸系聚合物包含(甲基)丙烯酸C9〜C11烷基酯之結構單元40 mol%以上且85 mol%以下,因此能夠發揮良好之拾取性。 上述之丙烯酸系聚合物更佳為包含(甲基)丙烯酸C9〜C11烷基酯之結構單元45 mol%以上。又,更佳為包含80 mol%以下。The above-mentioned acrylic polymer contains the structural unit of (meth)acrylic acid C9~C11 alkyl ester (hereinafter, sometimes referred to as A component) 40 mol% or more and 85 mol% or less in the molecule. The above-mentioned acrylic polymer contains 40 mol% or more and 85 mol% or less of the structural units of C9~C11 alkyl (meth)acrylate, and therefore can exhibit good pick-up properties. The above-mentioned acrylic polymer more preferably contains 45 mol% or more of structural units of C9~C11 alkyl (meth)acrylate. Moreover, it is more preferable to contain 80 mol% or less.

上述之mol%為以構成丙烯酸系聚合物之主鏈之單體為基礎之值。詳細而言,於丙烯酸系聚合物之聚合時組入至主鏈之聚合起始劑或鏈轉移劑不被考慮在上述之mol%中。以下,於說明書中同樣。 換言之,上述之丙烯酸系聚合物具有聚合前之(甲基)丙烯酸酯單體中之(甲基)丙烯醯基之不飽和雙鍵部分藉由聚合連接而成之主鏈。上述之mol%為相對於藉由聚合而構成主鏈之(甲基)丙烯酸酯單體之總莫耳數之莫耳百分率。再者,丙烯酸系聚合物之側鏈中之分子結構不被考慮在上述之mol%中。The above-mentioned mol% is a value based on the monomer constituting the main chain of the acrylic polymer. In detail, the polymerization initiator or chain transfer agent incorporated into the main chain during the polymerization of the acrylic polymer is not considered in the above-mentioned mol%. Hereinafter, it is the same in the description. In other words, the above-mentioned acrylic polymer has a main chain formed by polymerizing the unsaturated double bond portion of the (meth)acrylic acid ester monomer in the (meth)acrylate monomer before polymerization. The above-mentioned mol% is the mole percentage relative to the total moles of the (meth)acrylate monomers constituting the main chain by polymerization. Furthermore, the molecular structure in the side chain of the acrylic polymer is not considered in the above-mentioned mol%.

丙烯酸系聚合物具有含羥基之(甲基)丙烯酸酯之結構單元,上述結構單元之羥基容易與異氰酸酯基進行反應。 藉由預先使具有含羥基之(甲基)丙烯酸酯之結構單元之丙烯酸系聚合物及異氰酸酯化合物共存於黏著劑層22中,能夠適度地使黏著層高分子化。因此,丙烯酸系聚合物能夠充分進行凝膠化。因此,黏著劑層22能夠維持形狀且發揮黏著性能。The acrylic polymer has a structural unit of (meth)acrylate containing a hydroxyl group, and the hydroxyl group of the aforementioned structural unit easily reacts with an isocyanate group. By preliminarily coexisting an acrylic polymer having a structural unit of a hydroxyl-containing (meth)acrylate and an isocyanate compound in the adhesive layer 22, the adhesive layer can be appropriately polymerized. Therefore, the acrylic polymer can be sufficiently gelled. Therefore, the adhesive layer 22 can maintain the shape and exhibit adhesive performance.

含羥基之(甲基)丙烯酸酯之結構單元源自含羥基之(甲基)丙烯酸酯單體。換言之,含羥基之(甲基)丙烯酸酯單體進行了聚合反應後之分子結構為含羥基之(甲基)丙烯酸酯之結構單元。詳細而言,藉由含羥基之(甲基)丙烯酸酯單體之聚合反應而產生之鍵構成丙烯酸系聚合物之主鏈之一部分。The structural unit of the hydroxyl-containing (meth)acrylate is derived from the hydroxyl-containing (meth)acrylate monomer. In other words, the molecular structure of the hydroxyl-containing (meth)acrylate monomer after polymerization reaction is the structural unit of the hydroxyl-containing (meth)acrylate. Specifically, the bond produced by the polymerization reaction of the hydroxyl-containing (meth)acrylate monomer constitutes a part of the main chain of the acrylic polymer.

含羥基之(甲基)丙烯酸酯之結構單元較佳為含羥基之(甲基)丙烯酸C2〜C4烷基酯之結構單元。「C2〜C4烷基」之表述表示對(甲基)丙烯酸進行酯鍵結之烴部分之碳數。換言之,含羥基之(甲基)丙烯酸C2〜C4烷基酯單體表示(甲基)丙烯酸與碳數2〜4之醇(通常為2元醇)進行酯鍵結而成之單體。 C2〜C4烷基之烴部分通常為飽和烴。例如,C2〜C4烷基之烴部分為直鏈狀飽和烴或支鏈狀飽和烴。C2〜C4烷基之烴部分較佳為不包含含有氧(O)或氮(N)等之極性基。 再者,含羥基之(甲基)丙烯酸酯之結構單元中,羥基(-OH基)可與烴部分之任意碳(C)鍵結。羥基(-OH基)較佳為與烴部分之末端之碳(C)鍵結。The structural unit of the hydroxyl-containing (meth)acrylate is preferably the structural unit of the hydroxyl-containing (meth)acrylate C2-C4 alkyl ester. The expression "C2~C4 alkyl" means the carbon number of the hydrocarbon moiety ester-bonded to (meth)acrylic acid. In other words, the hydroxyl-containing (meth)acrylic C2~C4 alkyl ester monomer refers to a monomer formed by ester bonding of (meth)acrylic acid and an alcohol with a carbon number of 2 to 4 (usually a dihydric alcohol). The hydrocarbon portion of the C2~C4 alkyl group is usually a saturated hydrocarbon. For example, the hydrocarbon portion of the C2~C4 alkyl group is a linear saturated hydrocarbon or a branched saturated hydrocarbon. The hydrocarbon portion of the C2~C4 alkyl group preferably does not contain a polar group containing oxygen (O) or nitrogen (N). Furthermore, in the structural unit of the hydroxyl-containing (meth)acrylate, the hydroxyl group (-OH group) can be bonded to any carbon (C) of the hydrocarbon moiety. The hydroxyl group (-OH group) is preferably bonded to the carbon (C) at the end of the hydrocarbon moiety.

作為含羥基之(甲基)丙烯酸C2〜C4烷基酯之結構單元,例如可列舉:(甲基)丙烯酸羥基乙酯、(甲基)丙烯酸羥基丙酯、(甲基)丙烯酸羥基正丁酯或(甲基)丙烯酸羥基異丁酯等(甲基)丙烯酸羥基丁酯之各結構單元。再者,(甲基)丙烯酸羥基丁酯之結構單元中,羥基(-OH基)可與烴部分之末端之碳(C)鍵結,亦可與烴部分之末端以外之碳(C)鍵結。As the structural unit of the hydroxyl-containing C2~C4 alkyl (meth)acrylate, for example, hydroxyethyl (meth)acrylate, hydroxypropyl (meth)acrylate, and hydroxyn-butyl (meth)acrylate can be mentioned. Or (meth) hydroxyisobutyl acrylate and other structural units of (meth) hydroxybutyl acrylate. Furthermore, in the structural unit of hydroxybutyl (meth)acrylate, the hydroxyl group (-OH group) can be bonded to the carbon (C) at the end of the hydrocarbon moiety, or can be bonded to the carbon (C) other than the end of the hydrocarbon moiety. Knot.

作為含羥基之(甲基)丙烯酸C2〜C4烷基酯之結構單元,並無特別限定,例如可為(甲基)丙烯酸羥基乙酯及(甲基)丙烯酸羥基丁酯中之至少任一者之結構單元,更具體而言,可為(甲基)丙烯酸2-羥基乙酯及(甲基)丙烯酸4-羥基丁酯中之至少任一者之結構單元。The structural unit of the hydroxyl-containing C2-C4 alkyl (meth)acrylate is not particularly limited. For example, it may be at least any one of hydroxyethyl (meth)acrylate and hydroxybutyl (meth)acrylate The structural unit, more specifically, may be a structural unit of at least any one of 2-hydroxyethyl (meth)acrylate and 4-hydroxybutyl (meth)acrylate.

丙烯酸系聚合物較佳為於分子中含有含羥基之(甲基)丙烯酸酯之結構單元(以下,有時簡稱為B成分)1 mol%以上且30 mol%以下。 藉由含有含羥基之(甲基)丙烯酸酯之結構單元1 mol%以上,能夠與異氰酸酯化合物(交聯劑)進行交聯反應之羥基變得較多。因此,丙烯酸系聚合物能夠藉由交聯充分進行凝膠化。其結果,可抑制黏著劑層22之流動性。因此,黏著劑層22能夠維持形狀且發揮黏著性能。因此,能夠使照射活性能量線(紫外線等)前之黏著劑層22之黏著力(拾取步驟前)良好地發揮。 丙烯酸系聚合物更佳為含有含羥基之(甲基)丙烯酸酯之結構單元1.5 mol%以上,進而較佳為包含2.0 mol%以上。 又,藉由含有含羥基之(甲基)丙烯酸酯之結構單元30 mol%以下,黏著劑層22之極性可被抑制為較低。因此,黏著劑層22與黏晶層10之極性之相互作用得到抑制,能夠將切晶帶20自黏晶層10更良好地剝離。因此,於照射活性能量線(紫外線等)後,能夠發揮更良好之拾取性。 丙烯酸系聚合物更佳為含有含羥基之(甲基)丙烯酸酯之結構單元20 mol%以下,進而較佳為包含17.5 mol%以下,尤佳為包含10 mol%以下。The acrylic polymer preferably contains a hydroxyl-containing (meth)acrylate structural unit (hereinafter, sometimes referred to as component B) in the molecule by 1 mol% or more and 30 mol% or less. By containing 1 mol% or more of the structural unit of the hydroxyl-containing (meth)acrylate, there are more hydroxyl groups capable of undergoing a crosslinking reaction with the isocyanate compound (crosslinking agent). Therefore, the acrylic polymer can be sufficiently gelled by crosslinking. As a result, the fluidity of the adhesive layer 22 can be suppressed. Therefore, the adhesive layer 22 can maintain the shape and exhibit adhesive performance. Therefore, the adhesive force (before the pick-up step) of the adhesive layer 22 before irradiating active energy rays (ultraviolet rays, etc.) can be exhibited satisfactorily. The acrylic polymer more preferably contains 1.5 mol% or more of the structural unit of the hydroxyl-containing (meth)acrylate, and further preferably contains 2.0 mol% or more. In addition, by containing 30 mol% or less of the structural unit of the hydroxyl-containing (meth)acrylate, the polarity of the adhesive layer 22 can be suppressed to be low. Therefore, the polar interaction between the adhesive layer 22 and the die-bonding layer 10 is suppressed, and the dicing tape 20 can be peeled off from the die-bonding layer 10 more satisfactorily. Therefore, after irradiation with active energy rays (ultraviolet rays, etc.), better pick-up properties can be exhibited. The acrylic polymer is more preferably 20 mol% or less of the structural unit of the hydroxyl-containing (meth)acrylate, further preferably 17.5 mol% or less, and particularly preferably 10 mol% or less.

本實施形態中,上述之丙烯酸系聚合物如上所述進而含有含聚合性基之(甲基)丙烯酸酯之結構單元。換言之,上述之丙烯酸系聚合物包含於側鏈具有聚合性不飽和雙鍵之含聚合性基之(甲基)丙烯酸酯之結構單元。 藉由上述之丙烯酸系聚合物含有含聚合性基之(甲基)丙烯酸酯之結構單元,能夠於拾取步驟前藉由活性能量線(紫外線等)之照射使黏著劑層22硬化。詳細而言,藉由紫外線等活性能量線之照射,由光聚合起始劑產生自由基,藉由該自由基之作用,能夠使丙烯酸系聚合物彼此進行交聯反應。藉此,能夠使黏著劑層22之黏著力於照射後比照射前降低。而且,有能夠使黏晶層10自黏著劑層22良好地剝離,能夠發揮更良好之拾取性之優點。 再者,作為活性能量線,可採用紫外線、放射線、電子束。In this embodiment, the aforementioned acrylic polymer further contains a polymerizable group-containing (meth)acrylate structural unit as described above. In other words, the aforementioned acrylic polymer includes a structural unit of (meth)acrylate having a polymerizable unsaturated double bond in a side chain. Since the aforementioned acrylic polymer contains a polymerizable group-containing (meth)acrylate structural unit, the adhesive layer 22 can be cured by irradiation with active energy rays (ultraviolet rays, etc.) before the pickup step. Specifically, by irradiation with active energy rays such as ultraviolet rays, a photopolymerization initiator generates free radicals, and by the action of the free radicals, the acrylic polymers can undergo a crosslinking reaction with each other. Thereby, the adhesive force of the adhesive layer 22 can be reduced after irradiation than before irradiation. In addition, there is an advantage that the die bond layer 10 can be peeled off from the adhesive layer 22 well, and better pick-up properties can be exerted. Furthermore, as the active energy rays, ultraviolet rays, radiation rays, and electron beams can be used.

含聚合性基之(甲基)丙烯酸酯之結構單元可藉由使分子中具有可與羥基鍵結之官能基及聚合性基之單體與含羥基之(甲基)丙烯酸酯之結構單元鍵結而形成。上述之官能基亦可為與羥基之反應性較高之異氰酸酯基。換言之,上述之單體亦可為於分子之兩末端分別具有異氰酸酯基及乙烯基者。乙烯基例如亦可為(甲基)丙烯醯基之一部分。 具體而言,含聚合性基之(甲基)丙烯酸酯之結構單元亦可具有使上述之含羥基之(甲基)丙烯酸酯之結構單元中之羥基與含異氰酸酯基之(甲基)丙烯酸酯單體之異氰酸酯基進行胺基甲酸酯鍵結而成之分子結構。換言之,含聚合性基之(甲基)丙烯酸酯之結構單元亦可具有源自含羥基之(甲基)丙烯酸酯之結構單元且經由源自羥基之胺基甲酸酯鍵而鍵結有聚合性基((甲基)丙烯醯基)之分子結構。The structural unit of the (meth)acrylate containing a polymerizable group can be bonded to the structural unit of the (meth)acrylate containing a hydroxyl group with a monomer having a functional group and a polymerizable group that can be bonded to a hydroxyl group in the molecule. Knot formed. The above-mentioned functional group may also be an isocyanate group with higher reactivity with the hydroxyl group. In other words, the above-mentioned monomers may also have isocyanate groups and vinyl groups at both ends of the molecule. The vinyl group may also be a part of a (meth)acryloyl group, for example. Specifically, the structural unit of the polymerizable group-containing (meth)acrylate may have the hydroxyl group in the above-mentioned hydroxyl-containing (meth)acrylate structural unit and the isocyanate group-containing (meth)acrylate A molecular structure formed by urethane bonding of isocyanate groups of monomers. In other words, the structural unit of the (meth)acrylate containing the polymerizable group may also have the structural unit derived from the (meth)acrylate containing the hydroxyl group and polymerized via the urethane bond derived from the hydroxyl group. The molecular structure of the sex group ((meth)acryloyl group).

具有聚合性基之含聚合性基之(甲基)丙烯酸酯之結構單元可於丙烯酸系聚合物之聚合後製備。例如,可於(甲基)丙烯酸C9〜C11烷基酯單體與含羥基之(甲基)丙烯酸酯單體之共聚後,使含羥基之(甲基)丙烯酸酯之結構單元之一部分中之羥基與含異氰酸酯基之聚合性單體之異氰酸酯基進行胺基甲酸酯化反應,藉此獲得上述之含聚合性基之(甲基)丙烯酸酯之結構單元。The structural unit of the polymerizable group-containing (meth)acrylate having a polymerizable group can be prepared after the polymerization of the acrylic polymer. For example, after the copolymerization of C9~C11 alkyl (meth)acrylate monomers and hydroxyl-containing (meth)acrylate monomers, one part of the structural units of the hydroxyl-containing (meth)acrylate can be The hydroxyl group and the isocyanate group of the isocyanate group-containing polymerizable monomer undergo a urethane reaction, thereby obtaining the above-mentioned polymerizable group-containing (meth)acrylate structural unit.

上述之含異氰酸酯基之(甲基)丙烯酸酯單體較佳為於分子中具有1個異氰酸酯基且具有1個(甲基)丙烯醯基。作為上述單體,例如可列舉:(甲基)丙烯酸2-異氰酸根合乙酯。The aforementioned isocyanate group-containing (meth)acrylate monomer preferably has one isocyanate group and one (meth)acrylic acid group in the molecule. As said monomer, (meth)acrylic acid 2-isocyanato ethyl ester is mentioned, for example.

上述之丙烯酸系聚合物較佳為於分子中含有含聚合性基之(甲基)丙烯酸酯之結構單元(以下,有時簡稱為C成分)7.0 mol%以上,更佳為包含7.5 mol%以上,進而較佳為包含13.5 mol%以上。又,較佳為包含C成分60 mol%以下,更佳為包含54 mol%以下,進而較佳為包含52 mol%以下。The above-mentioned acrylic polymer preferably contains a polymerizable group-containing (meth)acrylate structural unit (hereinafter, sometimes referred to as component C) in the molecule, 7.0 mol% or more, more preferably 7.5 mol% or more It is more preferable to contain 13.5 mol% or more. Moreover, it is preferable to contain 60 mol% or less of C component, it is more preferable to contain 54 mol% or less, and it is more preferable to contain 52 mol% or less.

上述之丙烯酸系聚合物較佳為於分子中含有含羥基之(甲基)丙烯酸酯之結構單元及含聚合性基之(甲基)丙烯酸酯之結構單元15 mol%以上且60 mol%以下。The above-mentioned acrylic polymer preferably contains a hydroxyl group-containing (meth)acrylate structural unit and a polymerizable group-containing (meth)acrylate structural unit 15 mol% or more and 60 mol% or less in the molecule.

上述之丙烯酸系聚合物較佳為以莫耳比[A/(B+C)]計,相對於含羥基之(甲基)丙烯酸酯之結構單元(B)及含聚合性基之(甲基)丙烯酸酯之結構單元(C),包含(甲基)丙烯酸C9〜C11烷基酯之結構單元(A)0.5以上且6.0以下。 藉由上述之比[A/(B+C)]為0.5以上,能夠抑制於活性能量線(於後文詳細敍述)之照射後黏著劑層22過度硬化。因此,將被割斷之半導體晶片和與其密接之相當於晶片之尺寸之黏晶層10自切晶帶20剝離時,黏著劑層22可較容易地發生變形。藉此,剝離角度變得更充分,其結果,能夠更良好地剝離。又,藉由上述之比[A/(B+C)]為6.0以下,於活性能量線之照射後,黏著劑層22能夠更良好地進行硬化收縮。因此,黏著劑層22對黏晶層10之剝離力於照射後更良好地降低。 上述之比[A/(B+C)]更佳為0.6以上,進而較佳為0.67,尤佳為0.7以上。 上述之比[A/(B+C)]更佳為5.67以下,進而較佳為5.5以下,尤佳為5.0以下。The above-mentioned acrylic polymer is preferably in terms of molar ratio [A/(B+C)] relative to the structural unit (B) of the hydroxyl-containing (meth)acrylate and the polymerizable group-containing (meth)acrylic acid The structural unit (C) of the ester includes the structural unit (A) of the C9~C11 alkyl (meth)acrylate from 0.5 to 6.0. When the above ratio [A/(B+C)] is 0.5 or more, it is possible to suppress excessive hardening of the adhesive layer 22 after irradiation with active energy rays (described in detail later). Therefore, the adhesive layer 22 can be deformed relatively easily when the cut semiconductor wafer and the die bonding layer 10 of the size equivalent to the wafer that are in close contact with the die are peeled from the dicing tape 20. Thereby, the peeling angle becomes more sufficient, and as a result, it can peel more favorable. In addition, since the above-mentioned ratio [A/(B+C)] is 6.0 or less, the adhesive layer 22 can be cured and contracted more satisfactorily after the active energy ray is irradiated. Therefore, the peeling force of the adhesive layer 22 to the die bond layer 10 is better reduced after irradiation. The aforementioned ratio [A/(B+C)] is more preferably 0.6 or more, still more preferably 0.67, and particularly preferably 0.7 or more. The aforementioned ratio [A/(B+C)] is more preferably 5.67 or less, still more preferably 5.5 or less, and particularly preferably 5.0 or less.

上述之丙烯酸系聚合物較佳為以莫耳比[B/(B+C)]計,相對於含羥基之(甲基)丙烯酸酯之結構單元(B)及含聚合性基之(甲基)丙烯酸酯之結構單元(C),含有含羥基之(甲基)丙烯酸酯之結構單元(B)0.05以上且0.50以下。 上述之比[B/(B+C)]更佳為0.06以上,進而較佳為0.07以上。 上述之比[B/(B+C)]更佳為0.40以下,進而較佳為0.20以下。The above-mentioned acrylic polymer is preferably in terms of molar ratio [B/(B+C)] relative to the structural unit (B) of the hydroxyl-containing (meth)acrylate and the polymerizable group-containing (meth)acrylic acid The structural unit (C) of the ester and the structural unit (B) of the (meth)acrylate containing a hydroxyl group are 0.05 to 0.50. The aforementioned ratio [B/(B+C)] is more preferably 0.06 or more, and still more preferably 0.07 or more. The aforementioned ratio [B/(B+C)] is more preferably 0.40 or less, and still more preferably 0.20 or less.

上述之丙烯酸系聚合物較佳為以莫耳比[C/(B+C)]計,相對於含羥基之(甲基)丙烯酸酯之結構單元(B)及含聚合性基之(甲基)丙烯酸酯之結構單元(C),含有含聚合性基之(甲基)丙烯酸酯之結構單元(C)0.50以上且0.95以下。 藉由上述之比[C/(B+C)]為0.50以上,能夠藉由伴隨紫外線等之照射之聚合反應使黏著劑層22更充分地進行硬化收縮。因此,能夠使將黏晶層10自黏著劑層22剝離時之剝離力更充分地降低。又,藉由使上述之比[C/(B+C)]為0.95以下,能夠與異氰酸酯化合物(交聯劑)進行反應之羥基變得較多。因此,丙烯酸系聚合物彼此發生交聯,從而能夠更充分地進行凝膠化。其結果,黏著劑層22之流動性得到抑制,黏著劑層22能夠維持形狀且發揮黏著性能。 上述之比[C/(B+C)]更佳為0.60以上,進而較佳為0.80以上。 上述之比[C/(B+C)]更佳為0.95以下,進而較佳為0.94以下,尤佳為0.93以下。The above-mentioned acrylic polymer is preferably in terms of molar ratio [C/(B+C)] relative to the structural unit (B) of the hydroxyl-containing (meth)acrylate and the polymerizable group-containing (meth)acrylic acid The structural unit (C) of the ester contains the structural unit (C) of the (meth)acrylate containing a polymerizable group from 0.50 to 0.95. When the above-mentioned ratio [C/(B+C)] is 0.50 or more, the adhesive layer 22 can be cured and contracted more sufficiently by the polymerization reaction accompanied by irradiation of ultraviolet rays or the like. Therefore, the peeling force when peeling the die-bonding layer 10 from the adhesive layer 22 can be reduced more sufficiently. In addition, by making the above-mentioned ratio [C/(B+C)] 0.95 or less, the number of hydroxyl groups that can react with the isocyanate compound (crosslinking agent) increases. Therefore, the acrylic polymers are cross-linked to each other, and gelation can be more adequately performed. As a result, the fluidity of the adhesive layer 22 is suppressed, and the adhesive layer 22 can maintain the shape and exhibit adhesive performance. The above-mentioned ratio [C/(B+C)] is more preferably 0.60 or more, and still more preferably 0.80 or more. The aforementioned ratio [C/(B+C)] is more preferably 0.95 or less, still more preferably 0.94 or less, and particularly preferably 0.93 or less.

上述之丙烯酸系聚合物較佳為以莫耳比(B/A)計,相對於(甲基)丙烯酸C9〜C11烷基酯之結構單元(A),含有含羥基之(甲基)丙烯酸酯之結構單元(B)0.01以上且0.80以下。 藉由上述之比(B/A)為0.01以上,能夠與異氰酸酯化合物(交聯劑)進行反應之羥基變得較多。因此,丙烯酸系聚合物彼此進行交聯而能夠更充分地進行凝膠化。其結果,黏著劑層22之流動性得到抑制,黏著劑層22能夠維持形狀且發揮黏著性能。 藉由上述之比(B/A)為0.08以下,黏著劑層22之極性可被抑制為較低。因此,黏著劑層22與黏晶層10之極性之相互作用得到抑制,能夠將切晶帶20自黏晶層10更良好地剝離。 上述之比(B/A)更佳為0.02以上,進而較佳為0.03以上。 上述之比(B/A)更佳為0.75以下,進而較佳為0.70以下。The above-mentioned acrylic polymer preferably contains a hydroxyl-containing (meth)acrylate based on the molar ratio (B/A) relative to the structural unit (A) of the C9~C11 alkyl (meth)acrylate The structural unit (B) is 0.01 or more and 0.80 or less. When the above-mentioned ratio (B/A) is 0.01 or more, the number of hydroxyl groups that can react with the isocyanate compound (crosslinking agent) increases. Therefore, the acrylic polymers are cross-linked to each other and can be more fully gelled. As a result, the fluidity of the adhesive layer 22 is suppressed, and the adhesive layer 22 can maintain the shape and exhibit adhesive performance. With the above ratio (B/A) being 0.08 or less, the polarity of the adhesive layer 22 can be suppressed to be low. Therefore, the polar interaction between the adhesive layer 22 and the die-bonding layer 10 is suppressed, and the dicing tape 20 can be peeled off from the die-bonding layer 10 more satisfactorily. The above-mentioned ratio (B/A) is more preferably 0.02 or more, and still more preferably 0.03 or more. The aforementioned ratio (B/A) is more preferably 0.75 or less, and still more preferably 0.70 or less.

上述之丙烯酸系聚合物較佳為以莫耳比(C/A)計,相對於(甲基)丙烯酸C9〜C11烷基酯之結構單元(A),含有含聚合性基之(甲基)丙烯酸酯之結構單元(C)0.08以上且1.40以下。 藉由上述之比(C/A)為0.08以上,能夠藉由紫外線等之照射使黏著劑層22更充分地硬化收縮,能夠更良好地將黏晶層自切晶帶20剝離。又,藉由上述之比(C/A)為1.40以下,能夠抑制黏著劑層22因紫外線等之照射而過度地進行硬化收縮。再者,若抑制黏著劑層22之過度之硬化收縮,則將被割斷之半導體晶片和與其密接之相當於晶片之尺寸之黏晶層自切晶帶20剝離時,黏著劑層22可較容易地發生變形。藉此,剝離角度變得更充分,其結果,能夠更良好地剝離。 上述之比(C/A)更佳為0.09以上,進而較佳為0.10以上,尤佳為0.20以上。 上述之比(C/A)更佳為1.35以下,進而較佳為1.30以下,尤佳為1.20以下。The above-mentioned acrylic polymer is preferably in terms of molar ratio (C/A), relative to the structural unit (A) of the C9~C11 alkyl (meth)acrylate, and contains a polymerizable group-containing (meth) The structural unit (C) of the acrylate is 0.08 or more and 1.40 or less. When the above-mentioned ratio (C/A) is 0.08 or more, the adhesive layer 22 can be cured and shrunk more sufficiently by irradiation with ultraviolet rays or the like, and the die-bonding layer can be peeled from the die-cutting tape 20 more satisfactorily. In addition, when the above-mentioned ratio (C/A) is 1.40 or less, it is possible to prevent the adhesive layer 22 from being excessively cured and contracted due to irradiation of ultraviolet rays or the like. Furthermore, if the excessive hardening and shrinkage of the adhesive layer 22 is suppressed, the adhesive layer 22 can be easily peeled from the dicing tape 20 when the cut semiconductor wafer and the adhesive layer corresponding to the size of the wafer in close contact with it are peeled off from the dicing tape 20 The ground is deformed. Thereby, the peeling angle becomes more sufficient, and as a result, it can peel more favorable. The above-mentioned ratio (C/A) is more preferably 0.09 or more, still more preferably 0.10 or more, and particularly preferably 0.20 or more. The aforementioned ratio (C/A) is more preferably 1.35 or less, still more preferably 1.30 or less, and particularly preferably 1.20 or less.

上述之丙烯酸系聚合物較佳為以莫耳比(C/B)計,相對於含羥基之(甲基)丙烯酸酯之結構單元(B),含有含聚合性基之(甲基)丙烯酸酯之結構單元(C)0.9以上且18.0以下。 藉由上述之比(C/B)為0.9以上,能夠藉由紫外線等之照射使黏著劑層22更充分地進行硬化收縮,能夠更充分地使黏著劑層22之照射後之黏著力降低。因此,能夠更良好地自切晶帶20將黏晶層剝離。 藉由上述之比(C/B)為18.0以下,能夠與異氰酸酯化合物(交聯劑)進行交聯反應之羥基變得較多。因此,丙烯酸系聚合物能夠藉由交聯充分地進行凝膠化。其結果,黏著劑層22之流動性得到抑制。因此,黏著劑層22能夠維持形狀且發揮黏著性能。 上述之比(C/B)更佳為0.95以上,進而較佳為1.0以上。 上述之比(C/B)更佳為17.5以下,進而較佳為17.33以下,尤佳為17.0以下。The above-mentioned acrylic polymer preferably contains a polymerizable group-containing (meth)acrylate relative to the structural unit (B) of the hydroxyl-containing (meth)acrylate in terms of molar ratio (C/B) The structural unit (C) is above 0.9 and below 18.0. When the above-mentioned ratio (C/B) is 0.9 or more, the adhesive layer 22 can be cured and contracted more sufficiently by irradiation with ultraviolet rays or the like, and the adhesive force of the adhesive layer 22 after irradiation can be reduced more sufficiently. Therefore, the die-bonding layer can be peeled off from the die-cutting tape 20 more satisfactorily. When the above-mentioned ratio (C/B) is 18.0 or less, the number of hydroxyl groups that can undergo a crosslinking reaction with the isocyanate compound (crosslinking agent) increases. Therefore, the acrylic polymer can be sufficiently gelled by crosslinking. As a result, the fluidity of the adhesive layer 22 is suppressed. Therefore, the adhesive layer 22 can maintain the shape and exhibit adhesive performance. The above-mentioned ratio (C/B) is more preferably 0.95 or more, and still more preferably 1.0 or more. The aforementioned ratio (C/B) is more preferably 17.5 or less, still more preferably 17.33 or less, and particularly preferably 17.0 or less.

較佳之方式中,上述之丙烯酸系聚合物包含(甲基)丙烯酸異壬酯之結構單元、含羥基之(甲基)丙烯酸酯之結構單元及含聚合性基之(甲基)丙烯酸酯之結構單元,含羥基之(甲基)丙烯酸酯之結構單元為(甲基)丙烯酸羥基乙酯之結構單元或(甲基)丙烯酸羥基丁酯之結構單元中之至少一者。 進而較佳之方式中,含聚合性基之(甲基)丙烯酸酯之結構單元具有含羥基之(甲基)丙烯酸酯之結構單元之一部分羥基進行胺基甲酸酯化反應而成之胺基甲酸酯鍵,進而具有經由該胺基甲酸酯鍵而組入之(甲基)丙烯醯基作為聚合性基。In a preferred embodiment, the above-mentioned acrylic polymer comprises a structural unit of isononyl (meth)acrylate, a structural unit of (meth)acrylate containing a hydroxyl group, and a structure of (meth)acrylate containing a polymerizable group The unit, the structural unit of the hydroxyl-containing (meth)acrylate is at least one of the structural unit of hydroxyethyl (meth)acrylate or the structural unit of hydroxybutyl (meth)acrylate. In a further preferred embodiment, the structural unit of the (meth)acrylate containing a polymerizable group has a urethane formed by a partial hydroxyl group of the structural unit of the (meth)acrylate containing a hydroxyl group. The acid ester bond further has a (meth)acrylic acid group incorporated via the urethane bond as a polymerizable group.

本實施形態之切晶帶20具備包含上述之丙烯酸系聚合物之黏著劑層22。黏著劑層22進而包含異氰酸酯化合物(交聯劑)。異氰酸酯化合物之一部分亦可為藉由胺基甲酸酯化反應等進行反應後之狀態。 異氰酸酯化合物於分子中具有多個異氰酸酯基。藉由異氰酸酯化合物於分子中具有多個異氰酸酯基,能夠使黏著劑層22中之丙烯酸系聚合物間之交聯反應進行。詳細而言,藉由使異氰酸酯化合物之一部分異氰酸酯基與丙烯酸系聚合物之羥基進行反應、另一部分異氰酸酯基與其他丙烯酸系聚合物之羥基進行反應,可進行經由異氰酸酯化合物之交聯反應。The dicing tape 20 of this embodiment is provided with the adhesive layer 22 containing the acrylic polymer mentioned above. The adhesive layer 22 further contains an isocyanate compound (crosslinking agent). A part of the isocyanate compound may be in a state after being reacted by a urethane reaction or the like. The isocyanate compound has a plurality of isocyanate groups in the molecule. Since the isocyanate compound has a plurality of isocyanate groups in the molecule, the crosslinking reaction between the acrylic polymers in the adhesive layer 22 can proceed. Specifically, by reacting one part of the isocyanate group of the isocyanate compound with the hydroxyl group of the acrylic polymer, and the other part of the isocyanate group reacting with the hydroxyl group of the other acrylic polymer, the crosslinking reaction via the isocyanate compound can be carried out.

作為異氰酸酯化合物,例如可列舉:脂肪族二異氰酸酯、脂環族二異氰酸酯、或芳香脂肪族二異氰酸酯等二異氰酸酯。Examples of the isocyanate compound include diisocyanates such as aliphatic diisocyanates, alicyclic diisocyanates, and aromatic aliphatic diisocyanates.

作為脂肪族二異氰酸酯,例如可列舉:伸乙基二異氰酸酯、四亞甲基二異氰酸酯、六亞甲基二異氰酸酯、2,4,4-或2,2,4-三甲基六亞甲基二異氰酸酯、2,6-二異氰酸根合己酸甲酯等。 作為脂環族二異氰酸酯,例如可列舉:3-異氰酸根合甲基-3,5,5-三甲基環己烷、1,3-或1,4-雙(異氰酸根合甲基)環己烷、甲基環己烷-2,4-或2,6-二異氰酸酯、二環己基甲烷-4,4'-二異氰酸酯、1,3-或1,4-二異氰酸根合環己烷等。 作為芳香族二異氰酸酯,例如可列舉:間苯二異氰酸酯或對苯二異氰酸酯、二苯基甲烷-4,4'-二異氰酸酯、2,4-或2,6-甲苯二異氰酸酯、1,3'-或1,4-雙(異氰酸根合甲基)苯、1,3-或1,4-雙(α-異氰酸根合異丙基)苯等。Examples of aliphatic diisocyanates include ethylene diisocyanate, tetramethylene diisocyanate, hexamethylene diisocyanate, 2,4,4- or 2,2,4-trimethylhexamethylene Diisocyanate, 2,6-diisocyanato methyl caproate, etc. As the alicyclic diisocyanate, for example, 3-isocyanatomethyl-3,5,5-trimethylcyclohexane, 1,3- or 1,4-bis(isocyanatomethyl ) Cyclohexane, methylcyclohexane-2,4- or 2,6-diisocyanate, dicyclohexylmethane-4,4'-diisocyanate, 1,3- or 1,4-diisocyanate Cyclohexane and so on. Examples of aromatic diisocyanates include m-phenylene diisocyanate or p-phenylene diisocyanate, diphenylmethane-4,4'-diisocyanate, 2,4- or 2,6-toluene diisocyanate, 1,3' -Or 1,4-bis(isocyanatomethyl)benzene, 1,3- or 1,4-bis(α-isocyanatoisopropyl)benzene, etc.

又,作為異氰酸酯化合物,可列舉:三異氰酸酯。作為三異氰酸酯,例如可列舉:三苯基甲烷-4,4',4''-三異氰酸酯、1,3,5-三異氰酸根合苯、1,3,5-三(異氰酸根合甲基)環己烷、1,3,5-三(異氰酸根合甲基)苯、2,6-二異氰酸根合己酸-2-異氰酸根合乙酯等。 進而,作為異氰酸酯化合物,例如可列舉:二異氰酸酯之二聚體或三量體等聚合多異氰酸酯、多亞甲基多伸苯基多異氰酸酯。Moreover, as an isocyanate compound, triisocyanate is mentioned. As the triisocyanate, for example, triphenylmethane-4,4',4''-triisocyanate, 1,3,5-triisocyanatobenzene, 1,3,5-tris(isocyanato Methyl)cyclohexane, 1,3,5-tris(isocyanatomethyl)benzene, 2,6-diisocyanatohexanoic acid-2-isocyanatoethyl, etc. Furthermore, as the isocyanate compound, for example, polymeric polyisocyanates such as dimers and trimers of diisocyanates, and polymethylene polyphenylene polyisocyanates can be cited.

此外,作為異氰酸酯化合物,例如可列舉:使過量之上述異氰酸酯化合物與含活性氫化合物反應而得之多異氰酸酯。作為含活性氫化合物,可列舉:含活性氫低分子量化合物、含活性氫高分子量化合物等。 作為含活性氫低分子量化合物,例如可列舉:乙二醇、丙二醇、二丙二醇、二乙二醇、三乙二醇、2,2,4-三甲基-1,3-戊二醇、新戊二醇、己二醇、環己烷二甲醇、環己二醇、氫化雙酚A、苯二甲醇、甘油、三羥甲基乙烷、三羥甲基丙烷、己三醇、季戊四醇、山梨糖醇(sorbitol)、山梨糖醇(sorbit)、蔗糖、蓖麻油、乙二胺、六亞甲基二胺、二乙醇胺、三乙醇胺、水、氨、脲等,作為含活性氫高分子量化合物,可列舉:各種聚醚多元醇、聚酯多元醇、聚胺基甲酸酯多元醇、丙烯酸多元醇、環氧多元醇等。In addition, as an isocyanate compound, for example, a polyisocyanate obtained by reacting an excess of the above-mentioned isocyanate compound with an active hydrogen-containing compound is mentioned. Examples of the active hydrogen-containing compound include active hydrogen-containing low-molecular-weight compounds, active hydrogen-containing high-molecular-weight compounds, and the like. Examples of low molecular weight compounds containing active hydrogen include ethylene glycol, propylene glycol, dipropylene glycol, diethylene glycol, triethylene glycol, 2,2,4-trimethyl-1,3-pentanediol, and new Pentylene glycol, hexanediol, cyclohexane dimethanol, cyclohexanediol, hydrogenated bisphenol A, benzenedimethanol, glycerin, trimethylolethane, trimethylolpropane, hexanetriol, pentaerythritol, sorbitol Sugar alcohol (sorbitol), sorbit (sorbit), sucrose, castor oil, ethylenediamine, hexamethylenediamine, diethanolamine, triethanolamine, water, ammonia, urea, etc., as high molecular weight compounds containing active hydrogen, Examples include various polyether polyols, polyester polyols, polyurethane polyols, acrylic polyols, epoxy polyols, and the like.

進而,作為異氰酸酯化合物,亦可使用脲基甲酸酯化多異氰酸酯、縮二脲化多異氰酸酯等。 上述之異氰酸酯化合物可單獨使用1種或組合使用2種以上。Furthermore, as an isocyanate compound, allophanate polyisocyanate, biuret polyisocyanate, etc. can also be used. The above-mentioned isocyanate compounds can be used individually by 1 type or in combination of 2 or more types.

作為上述之異氰酸酯化合物,較佳為芳香族二異氰酸酯與含活性氫低分子量化合物之反應物。芳香族二異氰酸酯之反應物由於異氰酸酯基之反應速度比較慢,因此包含上述反應物之黏著劑層22可抑制過度地進行硬化。作為上述之異氰酸酯化合物,較佳為分子中具有3個以上之異氰酸酯基者。The aforementioned isocyanate compound is preferably a reactant of an aromatic diisocyanate and an active hydrogen-containing low molecular weight compound. The reactant of the aromatic diisocyanate has a relatively slow reaction speed of the isocyanate group, so the adhesive layer 22 containing the reactant can prevent excessive hardening. The above-mentioned isocyanate compound is preferably one having 3 or more isocyanate groups in the molecule.

黏著劑層22中所含之聚合起始劑為能夠藉由施加之熱或光之能量而使聚合反應開始之化合物。藉由黏著劑層22包含聚合起始劑,能夠於對黏著劑層22賦予熱能或光能時,使丙烯酸系聚合物間之交聯反應進行。詳細而言,能夠使具有含聚合性基之(甲基)丙烯酸酯之結構單元之丙烯酸系聚合物間,聚合性基彼此之聚合反應開始,從而使黏著劑層22硬化。藉此,如上所述,能夠發揮更良好之拾取性。 作為聚合起始劑,例如可採用光聚合起始劑或熱聚合起始劑等。作為聚合起始劑,可使用通常之市售製品。The polymerization initiator contained in the adhesive layer 22 is a compound capable of starting the polymerization reaction by applying heat or light energy. Since the adhesive layer 22 contains a polymerization initiator, when heat or light energy is applied to the adhesive layer 22, the crosslinking reaction between the acrylic polymers can proceed. In detail, it is possible to start the polymerization reaction of the polymerizable groups between the acrylic polymers having the structural unit of the polymerizable group-containing (meth)acrylate, thereby hardening the adhesive layer 22. As a result, as described above, better pick-up properties can be exerted. As the polymerization initiator, for example, a photopolymerization initiator, a thermal polymerization initiator, or the like can be used. As the polymerization initiator, usual commercially available products can be used.

黏著劑層22可進而包含除上述之成分以外之其他成分。作為其他成分,例如可列舉:黏著賦予劑、塑化劑、填充劑、防老化劑、抗氧化劑、紫外線吸收劑、光穩定劑、耐熱穩定劑、抗靜電劑、界面活性劑、輕剝離化劑等。其他成分之種類及使用量可根據目的而適當地選擇。The adhesive layer 22 may further include other components in addition to the above-mentioned components. Examples of other components include: adhesion imparting agents, plasticizers, fillers, anti-aging agents, antioxidants, ultraviolet absorbers, light stabilizers, heat-resistant stabilizers, antistatic agents, surfactants, and light release agents Wait. The types and usage amounts of other ingredients can be appropriately selected according to the purpose.

本實施形態之切晶帶20具備與上述之黏著劑層22貼合之基材層21。基材層21例如為金屬箔、紙或布等纖維片、橡膠片、樹脂膜等。基材層21亦可具有積層結構。 作為構成基材層21之纖維片,可列舉:紙、織布、不織布等。 作為樹脂膜之材質,例如可列舉:聚乙烯(PE)、聚丙烯(PP)、乙烯-丙烯共聚物等聚烯烴;乙烯-乙酸乙烯酯共聚物(EVA)、離子聚合物樹脂、乙烯-(甲基)丙烯酸共聚物、乙烯-(甲基)丙烯酸酯(無規、交替)共聚物等乙烯之共聚物;聚對苯二甲酸乙二酯(PET)、聚萘二甲酸乙二酯(PEN)、聚對苯二甲酸丁二酯(PBT)等聚酯;聚丙烯酸酯;聚氯乙烯(PVC);聚胺基甲酸酯;聚碳酸酯;聚苯硫醚(PPS);脂肪族聚醯胺、全芳香族聚醯胺(芳綸)等聚醯胺;聚醚醚酮(PEEK);聚醯亞胺;聚醚醯亞胺;聚偏二氯乙烯;ABS(丙烯腈-丁二烯-苯乙烯共聚物);纖維素或纖維素衍生物;含聚矽氧高分子;含氟高分子等。該等可單獨使用1種或組合使用2種以上。The dicing tape 20 of the present embodiment includes a base layer 21 bonded to the above-mentioned adhesive layer 22. The base layer 21 is, for example, a metal foil, a fiber sheet such as paper or cloth, a rubber sheet, a resin film, or the like. The base material layer 21 may have a laminated structure. Examples of the fiber sheet constituting the base layer 21 include paper, woven fabric, non-woven fabric, and the like. As the material of the resin film, for example, polyolefin such as polyethylene (PE), polypropylene (PP), ethylene-propylene copolymer; ethylene-vinyl acetate copolymer (EVA), ionomer resin, ethylene-( Meth) acrylic copolymers, ethylene-(meth)acrylate (random, alternating) copolymers and other ethylene copolymers; polyethylene terephthalate (PET), polyethylene naphthalate (PEN) ), polybutylene terephthalate (PBT) and other polyesters; polyacrylate; polyvinyl chloride (PVC); polyurethane; polycarbonate; polyphenylene sulfide (PPS); aliphatic poly Polyamides, fully aromatic polyamides (aramid) and other polyamides; polyether ether ketone (PEEK); polyimine; polyether imine; polyvinylidene chloride; ABS (acrylonitrile-butane Olefin-styrene copolymer); cellulose or cellulose derivatives; polysiloxane-containing polymers; fluorine-containing polymers. These can be used individually by 1 type or in combination of 2 or more types.

於基材層21具有樹脂膜之情形時,亦可對樹脂膜實施延伸處理等,控制伸長率等變形性。 對於基材層21之表面,為了提高與黏著劑層22之密接性,亦可實施表面處理。作為表面處理,例如可採用鉻酸處理、臭氧暴露、火焰暴露、高壓電擊暴露、離子化放射線處理等基於化學方法或物理方法之氧化處理等。又,亦可實施基於增黏塗佈劑、底塗劑、接著劑等塗佈劑之塗佈處理。When the base material layer 21 has a resin film, the resin film may be subjected to a stretching treatment or the like to control deformability such as elongation. For the surface of the base material layer 21, in order to improve the adhesion with the adhesive layer 22, surface treatment may also be performed. As the surface treatment, for example, chromic acid treatment, ozone exposure, flame exposure, high-voltage electric shock exposure, ionized radiation treatment, and other oxidation treatments based on chemical or physical methods can be used. In addition, coating treatment based on coating agents such as thickening coating agents, primers, and adhesives may also be performed.

對於基材層21之背面側(不與黏著劑層22重疊之側),為了賦予剝離性,例如亦可利用聚矽氧系樹脂或氟系樹脂等脫模劑(剝離劑)等而實施塗佈處理。 對於基材層21,就能夠自背面側對黏著劑層22施加紫外線等活性能量線之方面而言,較佳為透光性(紫外線透過性)之樹脂膜等。For the back side of the base layer 21 (the side that does not overlap with the adhesive layer 22), in order to impart releasability, for example, it may be coated with a release agent (release agent) such as silicone resin or fluorine resin. Cloth processing. The base layer 21 is preferably a light-transmitting (ultraviolet-transmitting) resin film or the like in terms of being able to apply active energy rays such as ultraviolet rays to the adhesive layer 22 from the back side.

本實施形態之切晶帶20亦可於使用前之狀態下具備覆蓋黏著劑層22之一面(黏著劑層22之不與基材層21重疊之面)之剝離片。於面積比黏著劑層22小之黏晶層10以容納於黏著劑層22之方式配置之情形時,剝離片以覆蓋黏著劑層22及黏晶層10之兩者之方式配置。剝離片係為了保護黏著劑層22而使用,在將黏晶層10貼附於黏著劑層22之前被剝離。The dicing tape 20 of this embodiment may be provided with a release sheet covering one surface of the adhesive layer 22 (the surface of the adhesive layer 22 that does not overlap the base layer 21) in the state before use. When the adhesive layer 10 having an area smaller than the adhesive layer 22 is arranged in a manner to be accommodated in the adhesive layer 22, the release sheet is arranged in a manner to cover both the adhesive layer 22 and the adhesive layer 10. The peeling sheet is used to protect the adhesive layer 22 and is peeled off before attaching the die bonding layer 10 to the adhesive layer 22.

作為剝離片,例如可使用利用聚矽氧系、長鏈烷基系、氟系、硫化鉬等剝離劑進行了表面處理之塑膠膜或紙等。 又,作為剝離片,例如可使用聚四氟乙烯、聚氯三氟乙烯、聚氟乙烯、聚偏二氟乙烯、四氟乙烯-六氟丙烯共聚物、氯氟乙烯-偏二氟乙烯共聚物等氟系聚合物製之膜;聚乙烯、聚丙烯等聚烯烴製之膜;聚對苯二甲酸乙二酯(PET)等聚酯製之膜等。 又,作為剝離片,例如可使用利用氟系剝離劑或丙烯酸長鏈烷基酯系剝離劑等剝離劑進行了表面塗佈之塑膠膜或紙類等。 再者,剝離片可作為用於支持黏著劑層22之支持材料而利用。剝離片尤其是於將黏著劑層22重疊於基材層21上時適合使用。詳細而言,可於剝離片與黏著劑層22積層之狀態下使黏著劑層22重疊於基材層21,重疊後將剝離片剝離(轉印),藉此於基材層21上重疊黏著劑層22。As the release sheet, for example, a plastic film or paper that has been surface-treated with a release agent such as a silicone-based, long-chain alkyl-based, fluorine-based, or molybdenum sulfide can be used. In addition, as the release sheet, for example, polytetrafluoroethylene, polychlorotrifluoroethylene, polyvinyl fluoride, polyvinylidene fluoride, tetrafluoroethylene-hexafluoropropylene copolymer, and chlorofluoroethylene-vinylidene fluoride copolymer can be used. Films made of fluorine-based polymers; films made of polyolefins such as polyethylene and polypropylene; films made of polyesters such as polyethylene terephthalate (PET). In addition, as the release sheet, for example, a plastic film or paper coated with a release agent such as a fluorine-based release agent or a long-chain alkyl acrylate-based release agent can be used. Furthermore, the release sheet can be used as a support material for supporting the adhesive layer 22. The release sheet is particularly suitable for use when the adhesive layer 22 is stacked on the base layer 21. In detail, the adhesive layer 22 can be overlapped on the base layer 21 with the release sheet and the adhesive layer 22 laminated, and after the overlap, the release sheet is peeled off (transferred), thereby overlaying and adhering on the base layer 21剂层22。 Agent layer 22.

其次,對本實施形態之切晶黏晶膜1詳細地進行說明。Next, the diced die attach film 1 of this embodiment will be described in detail.

本實施形態之切晶黏晶膜1具備:上述之切晶帶20、及積層於該切晶帶20之黏著劑層22之黏晶層10。黏晶層10於半導體積體電路之製造中接著於半導體晶圓。The dicing die-cutting film 1 of this embodiment includes the above-mentioned die-cutting tape 20 and the die-cutting layer 10 laminated on the adhesive layer 22 of the die-cutting tape 20. The die bonding layer 10 is adhered to the semiconductor wafer during the manufacture of the semiconductor integrated circuit.

黏晶層10可包含熱硬化性樹脂及熱塑性樹脂中之至少一者。黏晶層10較佳為包含熱硬化性樹脂及熱塑性樹脂。The die bonding layer 10 may include at least one of a thermosetting resin and a thermoplastic resin. The die bonding layer 10 preferably contains thermosetting resin and thermoplastic resin.

作為熱硬化性樹脂,例如可列舉:環氧樹脂、酚樹脂、胺基樹脂、不飽和聚酯樹脂、聚胺基甲酸酯樹脂、聚矽氧樹脂、熱硬化性聚醯亞胺樹脂等。作為上述熱硬化性樹脂,可僅採用1種或採用2種以上。就含有更少之可能成為作為黏晶對象之半導體晶片之腐蝕原因之離子性雜質等之方面而言,作為上述熱硬化性樹脂,較佳為環氧樹脂。作為環氧樹脂之硬化劑,較佳為酚樹脂。Examples of thermosetting resins include epoxy resins, phenol resins, amino resins, unsaturated polyester resins, polyurethane resins, silicone resins, thermosetting polyimide resins, and the like. As said thermosetting resin, only 1 type or 2 or more types can be used. In terms of containing fewer ionic impurities that may cause corrosion of the semiconductor wafer as the bonding target, the thermosetting resin is preferably an epoxy resin. As the hardener of epoxy resin, phenol resin is preferred.

作為上述環氧樹脂,例如可列舉:雙酚A型、雙酚F型、雙酚S型、溴化雙酚A型、氫化雙酚A型、雙酚AF型、聯苯型、萘型、茀型、苯酚酚醛清漆型、鄰甲酚酚醛清漆型、三羥基苯基甲烷型、四酚基乙烷型、乙內醯脲型、異氰尿酸三縮水甘油酯型、或縮水甘油胺型之各環氧樹脂。 作為環氧樹脂,就富於與作為硬化劑之酚樹脂之反應性且耐熱性優異之方面而言,較佳為雙酚A型環氧樹脂。Examples of the above epoxy resin include: bisphenol A type, bisphenol F type, bisphenol S type, brominated bisphenol A type, hydrogenated bisphenol A type, bisphenol AF type, biphenyl type, naphthalene type, One of the sulphur type, phenol novolak type, o-cresol novolak type, trihydroxyphenylmethane type, tetraphenol ethane type, hydantoin type, triglycidyl isocyanurate type, or glycidylamine type Each epoxy resin. As the epoxy resin, a bisphenol A type epoxy resin is preferable in terms of being rich in reactivity with a phenol resin as a hardening agent and excellent in heat resistance.

酚樹脂可作為環氧樹脂之硬化劑而發揮作用。作為酚樹脂,例如可列舉:酚醛清漆型酚樹脂、可溶酚醛型酚樹脂、聚對羥基苯乙烯等聚氧苯乙烯等。 作為酚醛清漆型酚樹脂,例如可列舉:苯酚酚醛清漆樹脂、苯酚芳烷基樹脂、甲酚酚醛清漆樹脂、第三丁基苯酚酚醛清漆樹脂、壬基苯酚酚醛清漆樹脂等。 作為酚樹脂,較佳為苯酚酚醛清漆樹脂,更佳為聯苯酚醛清漆樹脂。該等酚樹脂作為環氧樹脂(黏晶用接著劑)之硬化劑而發揮作用時,能夠進一步提高作為接著劑之環氧樹脂之接著性。 作為上述酚樹脂,可僅採用1種或採用2種以上。Phenolic resin can act as a hardener for epoxy resin. As a phenol resin, polyoxystyrene, such as a novolak type phenol resin, a resol type phenol resin, polyparahydroxystyrene, etc. are mentioned, for example. As a novolak-type phenol resin, a phenol novolak resin, a phenol aralkyl resin, a cresol novolak resin, a tertiary butylphenol novolak resin, a nonylphenol novolak resin, etc. are mentioned, for example. As the phenol resin, a phenol novolak resin is preferable, and a biphenol novolak resin is more preferable. When these phenol resins act as hardeners for epoxy resins (adhesives for die bonding), the adhesiveness of epoxy resins as adhesives can be further improved. As said phenol resin, only 1 type or 2 or more types can be used.

黏晶層10中,酚樹脂之羥基相對於環氧樹脂之環氧基1當量較佳為0.5當量以上且2.0當量以下,更佳為0.7當量以上且1.5當量以下。藉此,能夠充分進行環氧樹脂與酚樹脂之硬化反應。In the die-bonding layer 10, the hydroxyl group of the phenol resin is preferably 0.5 equivalent or more and 2.0 equivalent or less with respect to 1 equivalent of the epoxy group of the epoxy resin, and more preferably 0.7 equivalent or more and 1.5 equivalent or less. Thereby, the hardening reaction of the epoxy resin and the phenol resin can fully proceed.

於黏晶層10包含熱硬化性樹脂之情形時,黏晶層10中之上述熱硬化性樹脂之含有比率相對於黏晶層10之總質量較佳為5質量%以上且60質量%以下,更佳為10質量%以上且50質量%以下。藉此,黏晶層10能夠適當地表現作為熱硬化型接著劑之功能。When the die-bonding layer 10 contains thermosetting resin, the content ratio of the above-mentioned thermosetting resin in the die-bonding layer 10 relative to the total mass of the die-bonding layer 10 is preferably 5% by mass or more and 60% by mass or less, More preferably, it is 10% by mass or more and 50% by mass or less. Thereby, the die-bonding layer 10 can appropriately perform the function as a thermosetting adhesive.

作為黏晶層10中可包含之熱塑性樹脂,例如可列舉:天然橡膠、丁基橡膠、異戊二烯橡膠、氯丁二烯橡膠、乙烯-乙酸乙烯酯共聚物、乙烯-丙烯酸共聚物、乙烯-丙烯酸酯共聚物、聚丁二烯樹脂、聚碳酸酯樹脂、熱塑性聚醯亞胺樹脂、6-尼龍(製品名)或6,6-尼龍(製品名)等聚醯胺樹脂、苯氧基樹脂、丙烯酸系樹脂、PET或PBT等飽和聚酯樹脂、聚醯胺醯亞胺樹脂、氟樹脂等。 作為上述熱塑性樹脂,就離子性雜質較少且耐熱性較高,因此能夠進一步確保黏晶層10之接著性之方面而言,較佳為丙烯酸系樹脂。 作為上述熱塑性樹脂,可僅採用1種或採用2種以上。As the thermoplastic resin that can be contained in the die-bonding layer 10, for example, natural rubber, butyl rubber, isoprene rubber, chloroprene rubber, ethylene-vinyl acetate copolymer, ethylene-acrylic acid copolymer, ethylene -Acrylate copolymer, polybutadiene resin, polycarbonate resin, thermoplastic polyimide resin, polyamide resin such as 6-nylon (product name) or 6,6-nylon (product name), phenoxy Resin, acrylic resin, saturated polyester resin such as PET or PBT, polyimide resin, fluororesin, etc. As the above-mentioned thermoplastic resin, an acrylic resin is preferable in terms of having less ionic impurities and high heat resistance, so that the adhesiveness of the die-bonding layer 10 can be further ensured. As the above-mentioned thermoplastic resin, only one type or two or more types can be used.

上述丙烯酸系樹脂較佳為分子中之結構單元中(甲基)丙烯酸烷基酯之結構單元以質量比率計最多之聚合物。作為該(甲基)丙烯酸烷基酯,例如可列舉:(甲基)丙烯酸C2〜C4烷基酯。 上述丙烯酸系樹脂亦可包含源自可與(甲基)丙烯酸烷基酯單體共聚之其他單體成分之結構單元。 作為上述其他單體成分,例如可列舉:含羧基之單體、酸酐單體、含羥基之單體、含縮水甘油基之單體、含磺酸基之單體、含磷酸基之單體、丙烯醯胺、丙烯腈等含官能基之單體、或其他各種多官能性單體等。 就黏晶層10能夠發揮更高之凝聚力之方面而言,上述丙烯酸系樹脂較佳為(甲基)丙烯酸烷基酯(尤其是烷基部分之碳數為4以下之(甲基)丙烯酸烷基酯)、含羧基之單體、含氮原子之單體、及多官能性單體(尤其是聚縮水甘油基系多官能單體)之共聚物,更佳為丙烯酸乙酯、丙烯酸丁酯、丙烯酸、丙烯腈、及聚縮水甘油基(甲基)丙烯酸酯之共聚物。The above-mentioned acrylic resin is preferably a polymer having the most structural units of alkyl (meth)acrylate in the structural units in the molecule in terms of mass ratio. Examples of the alkyl (meth)acrylate include C2 to C4 alkyl (meth)acrylate. The above-mentioned acrylic resin may also contain structural units derived from other monomer components copolymerizable with the alkyl (meth)acrylate monomer. Examples of the above-mentioned other monomer components include: carboxyl group-containing monomers, acid anhydride monomers, hydroxyl group-containing monomers, glycidyl group-containing monomers, sulfonic acid group-containing monomers, phosphoric acid group-containing monomers, Functional group-containing monomers such as acrylamide and acrylonitrile, or various other multifunctional monomers. In terms of the higher cohesive force of the sticky layer 10, the acrylic resin is preferably an alkyl (meth)acrylate (especially an alkyl (meth)acrylate with a carbon number of 4 or less in the alkyl part). Base ester), carboxyl-containing monomers, nitrogen-containing monomers, and copolymers of multifunctional monomers (especially polyglycidyl-based multifunctional monomers), more preferably ethyl acrylate and butyl acrylate , Acrylic acid, acrylonitrile, and polyglycidyl (meth)acrylate copolymer.

就容易將黏晶層10之彈性或黏性設定為期望之範圍內之方面而言,上述丙烯酸系樹脂之玻璃轉移溫度(Tg)較佳為5℃以上且35℃以下,更佳為10℃以上且30℃以下。In terms of the ease of setting the elasticity or viscosity of the die-bonding layer 10 within a desired range, the glass transition temperature (Tg) of the acrylic resin is preferably 5°C or more and 35°C or less, more preferably 10°C Above and below 30°C.

於黏晶層10包含熱硬化性樹脂及熱塑性樹脂之情形時,關於黏晶層10中之上述熱塑性樹脂之含有比率,相對於除填料以外之有機成分(例如,熱硬化性樹脂、熱塑性樹脂、硬化觸媒等、矽烷偶合劑、染料)之總質量,較佳為30質量%以上且70質量%以下,更佳為40質量%以上且60質量%以下,進而較佳為45質量%以上且55質量%以下。再者,藉由改變熱硬化性樹脂之含有比率,能夠調整黏晶層10之彈性或黏性。When the die-bonding layer 10 contains thermosetting resin and thermoplastic resin, the content ratio of the above-mentioned thermoplastic resin in the die-bonding layer 10 is relative to the organic components (e.g., thermosetting resin, thermoplastic resin, The total mass of hardening catalyst, etc., silane coupling agent, dye) is preferably 30% by mass or more and 70% by mass or less, more preferably 40% by mass or more and 60% by mass or less, and still more preferably 45% by mass or more and 55 mass% or less. Furthermore, by changing the content ratio of the thermosetting resin, the elasticity or viscosity of the die-bonding layer 10 can be adjusted.

於黏晶層10之熱塑性樹脂具有熱硬化性官能基之情形時,作為該熱塑性樹脂,例如可採用含熱硬化性官能基之丙烯酸系樹脂。該含熱硬化性官能基之丙烯酸系樹脂較佳為於分子中以最多之質量比率包含源自(甲基)丙烯酸烷基酯之結構單元。作為該(甲基)丙烯酸烷基酯,例如可列舉:上述例示之(甲基)丙烯酸(甲基)烷基酯。 另一方面,作為含熱硬化性官能基之丙烯酸系樹脂中之熱硬化性官能基,例如可列舉:縮水甘油基、羧基、羥基、異氰酸酯基等。其中較佳為縮水甘油基。換言之,作為含熱硬化性官能基之丙烯酸系樹脂,較佳為含縮水甘油基之丙烯酸系樹脂。 黏晶層10較佳為含有含熱硬化性官能基之丙烯酸系樹脂及硬化劑。作為硬化劑,可列舉:作為黏著劑層22中可包含之硬化劑所例示者。於含熱硬化性官能基之丙烯酸系樹脂中之熱硬化性官能基為縮水甘油基之情形時,較佳為使用具有多個酚結構之化合物作為硬化劑。例如,可使用上述之各種酚樹脂作為硬化劑。When the thermoplastic resin of the die bond layer 10 has a thermosetting functional group, as the thermoplastic resin, for example, an acrylic resin containing a thermosetting functional group can be used. The acrylic resin containing a thermosetting functional group preferably contains a structural unit derived from an alkyl (meth)acrylate in the molecule at the largest mass ratio. As this (meth)acrylic acid alkyl ester, the (meth)acrylic acid (meth)alkyl ester exemplified above can be mentioned, for example. On the other hand, as a thermosetting functional group in the acrylic resin containing a thermosetting functional group, a glycidyl group, a carboxyl group, a hydroxyl group, an isocyanate group etc. are mentioned, for example. Among them, glycidyl is preferred. In other words, as the acrylic resin containing a thermosetting functional group, a glycidyl group-containing acrylic resin is preferable. The die bonding layer 10 preferably contains a thermosetting functional group-containing acrylic resin and a curing agent. Examples of the curing agent include those exemplified as the curing agent that can be contained in the adhesive layer 22. When the thermosetting functional group in the thermosetting functional group-containing acrylic resin is a glycidyl group, it is preferable to use a compound having a plurality of phenolic structures as the curing agent. For example, the various phenol resins mentioned above can be used as hardeners.

黏晶層10較佳為含有填料。藉由改變黏晶層10中之填料之量,能夠更容易地調整黏晶層10之彈性及黏性。進而,能夠調整黏晶層10之導電性、導熱性、彈性模數等物性。 作為填料,可列舉:無機填料及有機填料。作為填料,較佳為無機填料。 作為無機填料,例如可列舉:包含氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、矽酸鈣、矽酸鎂、氧化鈣、氧化鎂、氧化鋁、氮化鋁、氮化硼、結晶質二氧化矽或非晶質二氧化矽等二氧化矽等之填料。又,作為無機填料之材質,可列舉:鋁、金、銀、銅、鎳等金屬單質、或合金等。亦可為硼酸鋁晶鬚、非晶形碳黑、石墨等填料。填料之形狀可為球狀、針狀、片狀等各種形狀。作為填料,可僅採用上述之1種或採用2種以上。The crystal bonding layer 10 preferably contains a filler. By changing the amount of filler in the die-bonding layer 10, the elasticity and viscosity of the die-bonding layer 10 can be adjusted more easily. Furthermore, the electrical conductivity, thermal conductivity, and elastic modulus of the die-bonding layer 10 can be adjusted. Examples of fillers include inorganic fillers and organic fillers. As the filler, inorganic fillers are preferred. Examples of inorganic fillers include: aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, calcium silicate, magnesium silicate, calcium oxide, magnesium oxide, aluminum oxide, aluminum nitride, boron nitride, crystalline Filler of silicon dioxide such as silicon dioxide or amorphous silicon dioxide. In addition, as the material of the inorganic filler, simple metal such as aluminum, gold, silver, copper, and nickel, or alloys, etc. can be mentioned. It can also be fillers such as aluminum borate whiskers, amorphous carbon black, and graphite. The shape of the filler can be spherical, needle-like, flake-like and other shapes. As the filler, only one of the above-mentioned types or two or more types may be used.

上述填料之平均粒徑較佳為0.005 μm以上且10 μm以下,更佳為0.005 μm以上且1 μm以下。藉由上述平均粒徑為0.005 μm以上,對半導體晶圓等被接著體之潤濕性、接著性進一步提高。藉由上述平均粒徑為10 μm以下,能夠更充分地發揮由添加之填料帶來之特性,又,能夠進一步發揮黏晶層10之耐熱性。填料之平均粒徑例如可使用光度式之粒度分佈計(例如,製品名「LA-910」,堀場製作所公司製造)而求出。The average particle diameter of the filler is preferably 0.005 μm or more and 10 μm or less, more preferably 0.005 μm or more and 1 μm or less. With the above-mentioned average particle size being 0.005 μm or more, the wettability and adhesiveness to adherends such as semiconductor wafers are further improved. When the above-mentioned average particle size is 10 μm or less, the characteristics brought about by the added filler can be more fully exhibited, and the heat resistance of the die-bonding layer 10 can be further exhibited. The average particle diameter of the filler can be determined using, for example, a photometric particle size distribution meter (for example, product name "LA-910", manufactured by Horiba Manufacturing Co., Ltd.).

於黏晶層10包含填料之情形時,上述填料之含有比率相對於黏晶層10之總質量較佳為30質量%以上且70質量%以下,更佳為40質量%以上且60質量%以下,進而較佳為42質量%以上且55質量%以下。When the die-bonding layer 10 contains a filler, the content ratio of the filler relative to the total mass of the die-bonding layer 10 is preferably 30% by mass or more and 70% by mass or less, more preferably 40% by mass or more and 60% by mass or less , More preferably 42% by mass or more and 55% by mass or less.

黏晶層10亦可根據需要包含其他成分。作為上述其他成分,例如可列舉:硬化觸媒、阻燃劑、矽烷偶合劑、離子捕捉劑、染料等。 作為阻燃劑,例如可列舉:三氧化銻、五氧化銻、溴化環氧樹脂等。 作為矽烷偶合劑,例如可列舉:β-(3,4-環氧環己基)乙基三甲氧基矽烷、γ-縮水甘油氧基丙基三甲氧基矽烷、γ-縮水甘油氧基丙基甲基二乙氧基矽烷等。 作為離子捕捉劑,例如可列舉:水滑石類、氫氧化鉍、苯并三唑等。 作為上述其他添加劑,可僅採用1種或採用2種以上。The die bonding layer 10 may also contain other components as needed. Examples of the above-mentioned other components include curing catalysts, flame retardants, silane coupling agents, ion scavengers, dyes, and the like. As the flame retardant, for example, antimony trioxide, antimony pentoxide, brominated epoxy resin, etc. may be mentioned. As the silane coupling agent, for example, β-(3,4-epoxycyclohexyl)ethyltrimethoxysilane, γ-glycidoxypropyltrimethoxysilane, γ-glycidoxypropylmethyl Group diethoxy silane and so on. As an ion scavenger, hydrotalcite, bismuth hydroxide, benzotriazole, etc. are mentioned, for example. As the above-mentioned other additives, only one type or two or more types may be used.

就容易調整彈性及黏性之方面而言,黏晶層10較佳為包含熱塑性樹脂(尤其是丙烯酸系樹脂)、熱硬化性樹脂、及填料。 黏晶層10中,丙烯酸系樹脂等熱塑性樹脂相對於除填料以外之有機成分之總質量之含有比率較佳為30質量%以上且70質量%以下,更佳為40質量%以上且60質量%以下,進而較佳為45質量%以上且55質量%以下。 相對於黏晶層10之總質量,填料之含有比率較佳為30質量%以上且70質量%以下,更佳為40質量%以上且60質量%以下,進而較佳為42質量%以上且55質量%以下。In terms of easy adjustment of elasticity and viscosity, the die-bonding layer 10 preferably includes a thermoplastic resin (especially an acrylic resin), a thermosetting resin, and a filler. In the die bond layer 10, the content ratio of the thermoplastic resin such as acrylic resin to the total mass of the organic components other than the filler is preferably 30% by mass or more and 70% by mass or less, more preferably 40% by mass or more and 60% by mass Hereinafter, it is more preferably 45% by mass or more and 55% by mass or less. Relative to the total mass of the die bond layer 10, the filler content is preferably 30% by mass or more and 70% by mass or less, more preferably 40% by mass or more and 60% by mass or less, and still more preferably 42% by mass or more and 55 Less than mass%.

黏晶層10之厚度並無特別限定,例如為1 μm以上且200 μm以下。上述厚度之上限值較佳為100 μm,更佳為80 μm。上述厚度之下限值較佳為3 μm,更佳為5 μm。再者,於黏晶層10為積層體之情形時,上述之厚度為積層體之總厚度。The thickness of the die bond layer 10 is not particularly limited, and is, for example, 1 μm or more and 200 μm or less. The upper limit of the above thickness is preferably 100 μm, more preferably 80 μm. The lower limit of the aforementioned thickness is preferably 3 μm, more preferably 5 μm. Furthermore, when the die-bonding layer 10 is a laminated body, the above-mentioned thickness is the total thickness of the laminated body.

黏晶層10之玻璃轉移溫度(Tg)較佳為0℃以上,更佳為10℃以上。藉由上述玻璃轉移溫度為0℃以上,能夠藉由冷擴展將黏晶層10容易地割斷。黏晶層10之玻璃轉移溫度之上限例如為100℃。The glass transition temperature (Tg) of the die-bonding layer 10 is preferably 0°C or higher, more preferably 10°C or higher. When the above-mentioned glass transition temperature is 0° C. or higher, the adhesive layer 10 can be easily cut by cold expansion. The upper limit of the glass transition temperature of the die-bonding layer 10 is, for example, 100°C.

黏晶層10例如如圖1所示,亦可具有單層結構。本說明書中,單層係指僅具有由同種組合物形成之層。由同種組合物形成之層積層多層而成之形態亦為單層。 另一方面,黏晶層10例如亦可具有由2種以上之不同之組合物分別形成之層進行積層而成之多層結構。The die-bonding layer 10 may have a single-layer structure as shown in FIG. 1, for example. In this specification, a single layer means only a layer formed from the same composition. The form of a layered multilayer formed by the same composition is also a single layer. On the other hand, the sticky layer 10 may have, for example, a multilayer structure in which layers formed from two or more different compositions are laminated.

本實施形態之切晶黏晶膜1於使用時,例如藉由照射紫外線而使黏著劑層22硬化。詳細而言,在一面接著有半導體晶圓之黏晶層10與貼合於該黏晶層10之另一面之黏著劑層22積層之狀態下,至少對黏著劑層22照射紫外線等。例如,自配置有基材層21之側照射紫外線等,使經過了基材層21之紫外線等到達黏著劑層22。藉由紫外線等之照射,黏著劑層22發生硬化。 藉由於照射後黏著劑層22發生硬化,能夠降低黏著劑層22之黏著力,因此能夠於照射後自黏著劑層22將黏晶層10(接著有半導體晶圓之狀態)比較容易地剝離。藉此,能夠發揮良好之拾取性。When the diced die sticking film 1 of this embodiment is used, the adhesive layer 22 is cured by, for example, irradiating ultraviolet rays. In detail, in a state where the die bonding layer 10 of a semiconductor wafer and the adhesive layer 22 attached to the other side of the die bonding layer 10 are laminated on one side, at least the adhesive layer 22 is irradiated with ultraviolet rays or the like. For example, ultraviolet rays and the like are irradiated from the side where the base material layer 21 is arranged, so that the ultraviolet rays and the like that have passed through the base material layer 21 reach the adhesive layer 22. The adhesive layer 22 is cured by irradiation with ultraviolet rays or the like. Since the adhesive layer 22 is hardened after irradiation, the adhesive force of the adhesive layer 22 can be reduced. Therefore, the die bond layer 10 (in the state where the semiconductor wafer is next) can be easily peeled off from the adhesive layer 22 after irradiation. In this way, good pick-up properties can be exerted.

活性能量線(紫外線等)之照射能量至少為50 mJ/cm2 以上。照射能量例如為50 mJ/cm2 以上且500 mJ/cm2 以下,較佳為100 mJ/cm2 以上且300 mJ/cm2 以下。通常,除了黏著劑層22與黏晶層10貼合之區域之周緣部之外,照射活性能量線。於進行局部照射之情形時,隔著形成有圖案之光罩進行照射,藉此能夠設置未照射之區域。又,可以點狀進行照射而形成照射區域。 用於照射紫外線之裝置並無特別限定,例如可使用日東精機公司製造之製品名「UM810」。The irradiation energy of active energy rays (ultraviolet rays, etc.) is at least 50 mJ/cm 2 or more. The irradiation energy is, for example, 50 mJ/cm 2 or more and 500 mJ/cm 2 or less, preferably 100 mJ/cm 2 or more and 300 mJ/cm 2 or less. Usually, except for the peripheral part of the area where the adhesive layer 22 and the die bond layer 10 are bonded, active energy rays are irradiated. In the case of partial irradiation, irradiation is performed through a patterned photomask, thereby enabling the setting of unirradiated areas. In addition, it is possible to irradiate in dots to form an irradiated area. The device for irradiating ultraviolet rays is not particularly limited. For example, the product name "UM810" manufactured by Nitto Seiki Co., Ltd. can be used.

於活性能量線之照射前,黏著劑層22與黏晶層10間之剝離強度(α)較佳為0.4(N/20 mm)以上且4.0(N/20 mm)以下。 另一方面,於活性能量線之照射後,黏著劑層22與黏晶層10間之剝離強度(β)較佳為0.1(N/20 mm)以下。上述剝離強度(β)亦可為0.03(N/20 mm)以上。 活性能量線之照射前(α)與照射後(β)之黏著劑層22與黏晶層10間之剝離強度之比(α/β)較佳為4.0以上且40.5以下。 再者,上述之活性能量線之照射於實施例中記載之條件下進行。又,上述之剝離強度相關之數值按照實施例中記載之試驗條件而測定。Before the active energy ray is irradiated, the peel strength (α) between the adhesive layer 22 and the die bond layer 10 is preferably 0.4 (N/20 mm) or more and 4.0 (N/20 mm) or less. On the other hand, after the active energy ray is irradiated, the peel strength (β) between the adhesive layer 22 and the die bond layer 10 is preferably 0.1 (N/20 mm) or less. The aforementioned peel strength (β) may be 0.03 (N/20 mm) or more. The ratio (α/β) of the peel strength between the adhesive layer 22 and the die bond layer 10 before (α) and after (β) irradiation of active energy rays is preferably 4.0 or more and 40.5 or less. Furthermore, the above-mentioned active energy ray irradiation was performed under the conditions described in the examples. In addition, the above-mentioned value related to peel strength was measured in accordance with the test conditions described in the examples.

切晶黏晶膜1中,於活性能量線之照射後藉由邊緣剝離試驗測定黏著劑層22與黏晶層10之間之剝離強度時之最大強度較佳為0.10(N/10 mm)以上且0.50(N/10 mm)以下。 再者,上述之邊緣剝離試驗之最大強度相關之數值按照實施例中記載之試驗條件而測定。In the chip adhesive film 1, the maximum strength when the peel strength between the adhesive layer 22 and the adhesive layer 10 is measured by the edge peel test after the irradiation of active energy rays is preferably 0.10 (N/10 mm) or more And 0.50 (N/10 mm) or less. Furthermore, the above-mentioned value related to the maximum strength of the edge peel test was measured according to the test conditions described in the examples.

上述之剝離強度(α或β)及上述之最大強度例如可藉由減少黏晶層10中所含之填料之量而提高。The above-mentioned peeling strength (α or β) and the above-mentioned maximum strength can be increased by reducing the amount of filler contained in the die-bonding layer 10, for example.

本實施形態之切晶黏晶膜1亦可於使用前之狀態下具備覆蓋黏晶層10之一面(黏晶層10之不與黏著劑層22重疊之面)之剝離片。剝離片係為了保護黏晶層10而使用,並在即將將被接著體(例如半導體晶圓)貼附於黏晶層10之前被剝離。 作為該剝離片,可採用與上述之剝離片相同者。該剝離片可作為用於支持黏晶層10之支持材料而利用。剝離片於將黏晶層10重疊於黏著劑層22上時適合使用。詳細而言,可於剝離片與黏晶層10積層之狀態下使黏晶層10重疊於黏著劑層22,重疊後將剝離片剝離(轉印),藉此於黏著劑層22上重疊黏晶層10。The chip adhesive film 1 of the present embodiment may also be provided with a peeling sheet covering one side of the die bond layer 10 (the side of the die bond layer 10 that does not overlap the adhesive layer 22) in the state before use. The peeling sheet is used to protect the die-bonding layer 10 and is peeled off immediately before attaching the adherend (for example, a semiconductor wafer) to the die-bonding layer 10. As this release sheet, the same thing as the above-mentioned release sheet can be used. The release sheet can be used as a support material for supporting the die bond layer 10. The release sheet is suitable for use when overlaying the die bonding layer 10 on the adhesive layer 22. In detail, the die-bonding layer 10 can be overlapped on the adhesive layer 22 with the release sheet and die-bonding layer 10 laminated, and the release sheet can be peeled off (transferred) after the overlap, thereby superimposing and adhering on the adhesive layer 22晶层10。 Crystal layer 10.

本實施形態之切晶黏晶膜1由於以如上方式構成,因此能夠發揮良好之拾取性。Since the dicing die attach film 1 of this embodiment is configured as described above, it can exhibit good pick-up properties.

其次,對本實施形態之切晶帶20及切晶黏晶膜1之製造方法進行說明。Next, the manufacturing method of the dicing tape 20 and the dicing die sticking film 1 of this embodiment will be described.

本實施形態之切晶黏晶膜1之製造方法具備: 製造切晶帶20之步驟(切晶帶之製造方法)、及於製造之切晶帶20重疊黏晶層10而製造切晶黏晶膜1之步驟。The manufacturing method of the dicing die sticking film 1 of this embodiment includes: The step of manufacturing the dicing tape 20 (the manufacturing method of the dicing tape), and the step of overlapping the die-bonding layer 10 on the manufactured dicing tape 20 to produce the dicing die-bonding film 1.

切晶帶之製造方法(製造切晶帶之步驟)具備: 合成步驟,其係合成丙烯酸系聚合物; 黏著劑層製作步驟,其係自包含上述丙烯酸系聚合物、異氰酸酯化合物、聚合起始劑、溶劑、及根據目的適宜追加之其他成分之黏著劑組合物中使溶劑揮發而製作黏著劑層22;及 積層步驟,其係使黏著劑層22與基材層21貼合,藉此將基材層21與黏著劑層22積層。The manufacturing method of the dicing tape (the steps of manufacturing the dicing tape) has: Synthesis step, which is to synthesize acrylic polymer; The manufacturing step of the adhesive layer is to make the adhesive layer 22 by volatilizing the solvent from the adhesive composition containing the above-mentioned acrylic polymer, isocyanate compound, polymerization initiator, solvent, and other components suitably added according to the purpose; and In the laminating step, the adhesive layer 22 and the base material layer 21 are bonded together, thereby laminating the base material layer 21 and the adhesive layer 22.

於合成步驟中,例如使(甲基)丙烯酸C9〜C11烷基酯單體與含羥基之(甲基)丙烯酸酯單體進行自由基聚合,藉此合成丙烯酸系聚合物中間物。 自由基聚合可藉由通常之方法進行。例如,可使上述之各單體溶解於溶劑並且一面加熱一面進行攪拌,添加聚合起始劑,藉此合成丙烯酸系聚合物中間物。為了調整丙烯酸系聚合物之分子量,亦可於鏈轉移劑之存在下進行聚合。 其次,使丙烯酸系聚合物中間物中所含之含羥基之(甲基)丙烯酸酯之結構單元之一部分羥基與含異氰酸酯基之聚合性單體之異氰酸酯基藉由胺基甲酸酯化反應進行鍵結。藉此,含羥基之(甲基)丙烯酸酯之結構單元之一部分形成為含聚合性基之(甲基)丙烯酸酯之結構單元。 胺基甲酸酯化反應可藉由通常之方法進行。例如,於溶劑及胺基甲酸酯化觸媒之存在下,一面加熱一面對丙烯酸系聚合物中間物及含異氰酸酯基之聚合性單體進行攪拌。藉此,能夠使丙烯酸系聚合物中間物之羥基之一部分與含異氰酸酯基之聚合性單體之異氰酸酯基進行胺基甲酸酯鍵結。 再者,為了有效率地進行胺基甲酸酯化反應,亦可於Sn觸媒等之存在下進行胺基甲酸酯化反應。In the synthesis step, for example, the C9~C11 (meth)acrylic acid C9~C11 alkyl ester monomer and the hydroxyl-containing (meth)acrylate monomer are subjected to free radical polymerization, thereby synthesizing the acrylic polymer intermediate. Free radical polymerization can be carried out by a usual method. For example, the above-mentioned monomers can be dissolved in a solvent and stirred while being heated, and a polymerization initiator can be added, thereby synthesizing an acrylic polymer intermediate. In order to adjust the molecular weight of the acrylic polymer, polymerization can also be carried out in the presence of a chain transfer agent. Secondly, a partial hydroxyl group of the structural unit of the hydroxyl group-containing (meth)acrylate contained in the acrylic polymer intermediate and the isocyanate group of the isocyanate group-containing polymerizable monomer are reacted by urethane formation. Bond. Thereby, a part of the structural unit of the (meth)acrylate containing a hydroxyl group is formed as a structural unit of the (meth)acrylate containing a polymerizable group. The urethane reaction can be carried out by a usual method. For example, in the presence of a solvent and a urethane catalyst, the acrylic polymer intermediate and the isocyanate group-containing polymerizable monomer are stirred while heating. Thereby, a part of the hydroxyl group of the acrylic polymer intermediate can be urethane-bonded with the isocyanate group of the isocyanate group-containing polymerizable monomer. In addition, in order to efficiently carry out the urethane reaction, the urethane reaction may be carried out in the presence of a Sn catalyst or the like.

於黏著劑層製作步驟中,例如使丙烯酸系聚合物、異氰酸酯化合物、及聚合起始劑溶解於溶劑,製備黏著劑組合物。藉由改變溶劑之量,能夠調整組合物之黏度。其次,將黏著劑組合物塗佈於剝離片。作為塗佈方法,例如採用輥塗敷、網版塗敷、凹版塗敷等通常之塗佈方法。對經塗佈之組合物實施脫溶劑處理或固化處理等,藉此使經塗佈之黏著劑組合物固化,製作黏著劑層22。 脫溶劑處理例如於80℃以上且150℃以下、0.5分鐘以上且5分鐘以下之條件下進行。In the adhesive layer preparation step, for example, an acrylic polymer, an isocyanate compound, and a polymerization initiator are dissolved in a solvent to prepare an adhesive composition. By changing the amount of solvent, the viscosity of the composition can be adjusted. Next, the adhesive composition is applied to the release sheet. As the coating method, for example, ordinary coating methods such as roll coating, screen coating, and gravure coating are used. The coated composition is subjected to solvent removal treatment or curing treatment, thereby curing the coated adhesive composition, and the adhesive layer 22 is produced. The solvent removal treatment is performed, for example, under conditions of 80°C or higher and 150°C or lower, 0.5 minutes or longer and 5 minutes or shorter.

積層步驟中,將與剝離片重疊之狀態之黏著劑層22與基材層21重疊積層。再者,剝離片在直到使用前為止可為與黏著劑層22重疊之狀態。 再者,為了促進交聯劑與丙烯酸系聚合物之反應,又,為了促進交聯劑與基材層21之表面部分之反應,亦可於積層步驟之後,於50℃環境下實施48小時之老化處理步驟。 再者,基材層21可使用市售之膜等,亦可藉由通常之方法進行製膜而製作。作為進行製膜之方法,例如可列舉:壓延製膜法、有機溶劑中之澆鑄法、密閉體系中之吹脹擠出法、T模擠出法、共擠出法、乾式層壓法等。In the layering step, the adhesive layer 22 and the base material layer 21 in a state of being overlapped with the release sheet are stacked and laminated. Furthermore, the release sheet may be in a state overlapping with the adhesive layer 22 until before use. Furthermore, in order to promote the reaction between the crosslinking agent and the acrylic polymer, and in order to promote the reaction between the crosslinking agent and the surface portion of the base layer 21, it is also possible to perform 48 hours at 50°C after the lamination step. Aging treatment steps. Furthermore, a commercially available film or the like may be used for the base layer 21, or it may be produced by forming a film by a normal method. As a method of film formation, for example, a calendering film forming method, a casting method in an organic solvent, an inflation extrusion method in a closed system, a T die extrusion method, a co-extrusion method, a dry lamination method, etc. can be mentioned.

藉由該等步驟,能夠製造切晶帶20。Through these steps, the dicing tape 20 can be manufactured.

切晶黏晶膜之製造方法(製造切晶黏晶膜之步驟)具備: 樹脂組合物製備步驟,其係製備用於形成黏晶層10之樹脂組合物; 黏晶層製作步驟,其係由樹脂組合物製作黏晶層10;及 貼附步驟,其係於如上所述地製造之切晶帶20之黏著劑層22貼附黏晶層10。The manufacturing method of chip adhesive film (the step of manufacturing chip adhesive film) includes: The resin composition preparation step, which is to prepare the resin composition used to form the die-bonding layer 10; The die-bonding layer manufacturing step, which is to make the die-bonding layer 10 from the resin composition; and The attaching step is to attach the adhesive layer 10 to the adhesive layer 22 of the dicing tape 20 manufactured as described above.

於樹脂組合物製備步驟中,例如將環氧樹脂、環氧樹脂之硬化觸媒、丙烯酸系樹脂、酚樹脂、溶劑等混合並將各樹脂溶解於溶劑,藉此製備樹脂組合物。藉由改變溶劑之量,能夠調整組合物之黏度。再者,作為該等樹脂,可使用市售之製品。In the resin composition preparation step, for example, epoxy resin, epoxy resin curing catalyst, acrylic resin, phenol resin, solvent, etc. are mixed and each resin is dissolved in the solvent, thereby preparing the resin composition. By changing the amount of solvent, the viscosity of the composition can be adjusted. Furthermore, as these resins, commercially available products can be used.

於黏晶層製作步驟中,例如將如上所述地製備之樹脂組合物塗佈於剝離片。作為塗佈方法,並無特別限定,例如可採用輥塗敷、網版塗敷、凹版塗敷等通常之塗佈方法。其次,根據需要,藉由脫溶劑處理或硬化處理等,使塗佈之組合物固化,製作黏晶層10。 脫溶劑處理例如於70℃以上且160℃以下、1分鐘以上且5分鐘以下之條件下進行。In the manufacturing step of the die-bonding layer, for example, the resin composition prepared as described above is applied to the release sheet. The coating method is not particularly limited. For example, ordinary coating methods such as roll coating, screen coating, and gravure coating can be used. Next, as necessary, the applied composition is cured by solvent removal treatment or hardening treatment, etc., to produce the crystal bonding layer 10. The solvent removal treatment is performed, for example, under the conditions of 70° C. or higher and 160° C. or lower, 1 minute or longer and 5 minutes or shorter.

於貼附步驟中,自切晶帶20之黏著劑層22及黏晶層10分別將剝離片剝離,以黏晶層10與黏著劑層12直接接觸之方式使兩者貼合。例如,可藉由進行壓接而貼合。貼合時之溫度並無特別限定,例如為30℃以上且50℃以下,較佳為35℃以上且45℃以下。貼合時之線壓並無特別限定,較佳為0.1 kgf/cm以上且20 kgf/cm以下,更佳為1 kgf/cm以上且10 kgf/cm以下。In the attaching step, the adhesive layer 22 and the die-bonding layer 10 of the die-cutting tape 20 respectively peel off the release sheet, and the die-bonding layer 10 and the adhesive layer 12 are attached in such a way that the die-bonding layer 10 and the adhesive layer 12 are in direct contact. For example, it can be bonded by crimping. The temperature at the time of bonding is not particularly limited, and is, for example, 30°C or higher and 50°C or lower, preferably 35°C or higher and 45°C or lower. The linear pressure during bonding is not particularly limited, but is preferably 0.1 kgf/cm or more and 20 kgf/cm or less, more preferably 1 kgf/cm or more and 10 kgf/cm or less.

如上所述地製造之切晶黏晶膜1例如作為用於製造半導體積體電路之輔助用具而使用。以下,對使用中之具體例進行說明。The diced die attach film 1 manufactured as described above is used, for example, as an auxiliary tool for manufacturing semiconductor integrated circuits. The following describes specific examples in use.

製造半導體積體電路之方法通常具備自形成有電路面之半導體晶圓將晶片切出並進行組裝之步驟。 該步驟例如具有如下步驟:半切割步驟,為了藉由割斷處理將半導體晶圓加工為晶片(die)而於半導體晶圓形成槽,進而將半導體晶圓進行研削而減薄厚度;安裝步驟,其係將經半切割加工之半導體晶圓之一面(例如,與電路面為相反側之面)貼附於黏晶層10,將半導體晶圓固定於切晶帶20;擴展步驟,其係使經半切割加工之半導體晶片彼此之間隔擴大;拾取步驟,其係將黏晶層10與黏著劑層22之間進行剝離並於貼附有黏晶層10之狀態下取出半導體晶片(die);及黏晶步驟,其係將貼附有黏晶層10之狀態之半導體晶片(die)接著於被接著體。實施該等步驟時,本實施形態之切晶帶(切晶黏晶膜)作為製造輔助用具而使用。 於半切割步驟中,如圖2A〜圖2D所示,實施用於將半導體積體電路割斷成小片(die)之半切割加工。詳細而言,於半導體晶圓之與電路面為相反側之面貼附晶圓加工用帶T。又,將切晶環R安裝於晶圓加工用帶T。於貼附有晶圓加工用帶T之狀態下形成分割用之槽。於形成有槽之面貼附背面研磨帶G,另一方面,將開始貼附之晶圓加工用帶T剝離。於貼附有背面研磨帶G之狀態下實施研削加工直至半導體晶圓成為特定之厚度為止。 於安裝步驟中,如圖3A〜圖3B所示,將切晶環R安裝於切晶帶20之黏著劑層22後,於露出之黏晶層10之面貼附經半切割加工之半導體晶圓。其後,自半導體晶圓將背面研磨帶G剝離。 於擴展步驟中,如圖4A〜圖4C所示,將切晶環R固定於擴展裝置之保持器H。使擴展裝置所具備之頂起構件U自切晶黏晶膜1之下側頂起,藉此將切晶黏晶膜1進行延伸使得其於面方向上擴展。藉此,於特定之溫度條件下將經半切割加工之半導體晶圓割斷。上述溫度條件例如為-20〜5℃,較佳為-15〜0℃、更佳為-10〜-5℃。使頂起構件U下降,藉此將擴展狀態解除。進而,於擴展步驟中,如圖5A〜圖5B所示,於更高之溫度條件下將切晶帶20進行延伸以使面積擴大。藉此,將經割斷之相鄰之半導體晶片沿膜面之面方向拉離,進而使間隔擴大。 於拾取步驟中,如圖6所示,將貼附有黏晶層10之狀態之半導體晶片自切晶帶20之黏著層剝離。詳細而言,使銷構件P上升,從而將拾取對象之半導體晶片隔著切晶帶20頂起。藉由吸附治具J保持頂起之半導體晶片。 於黏晶步驟中,將貼附有黏晶層10之狀態之半導體晶片接著於被接著體。The method of manufacturing a semiconductor integrated circuit usually includes a step of cutting out the wafer from the semiconductor wafer on which the circuit surface is formed and then assembling it. This step includes, for example, the following steps: a half-cutting step, in order to process the semiconductor wafer into a die by a slicing process, forming a groove in the semiconductor wafer, and then grinding the semiconductor wafer to reduce the thickness; the mounting step, which One side of the semi-cut semiconductor wafer (for example, the side opposite to the circuit surface) is attached to the die bonding layer 10, and the semiconductor wafer is fixed to the die dicing tape 20; the expansion step is to make the die The distance between the semi-cut semiconductor chips is enlarged; the pickup step is to peel off the die bond layer 10 and the adhesive layer 22 and take out the semiconductor die with the die bond layer 10 attached; and The die bonding step is to attach the semiconductor die with the die bonding layer 10 attached to the bonded body. When performing these steps, the dicing tape (chip slicing film) of this embodiment is used as a manufacturing auxiliary tool. In the half-cutting step, as shown in FIGS. 2A to 2D, a half-cutting process for cutting the semiconductor integrated circuit into dies is performed. Specifically, the wafer processing tape T is attached to the surface of the semiconductor wafer on the opposite side to the circuit surface. In addition, the dicing ring R is attached to the tape T for wafer processing. In the state where wafer processing tape T is attached, grooves for dividing are formed. The back polishing tape G is attached to the surface where the grooves are formed, and on the other hand, the wafer processing tape T that has been attached is peeled off. In the state where the back grinding tape G is attached, the grinding process is performed until the semiconductor wafer reaches a specific thickness. In the mounting step, as shown in FIGS. 3A to 3B, after the dicing ring R is mounted on the adhesive layer 22 of the dicing tape 20, a semi-cut semiconductor crystal is attached to the exposed surface of the die bonding layer 10 round. After that, the back polishing tape G is peeled off from the semiconductor wafer. In the expansion step, as shown in FIGS. 4A to 4C, the dicing ring R is fixed to the holder H of the expansion device. The lifting member U included in the expansion device is raised from the lower side of the dicing die attach film 1, thereby extending the dicing die attach film 1 so that it expands in the plane direction. In this way, the semi-cut semiconductor wafer is cut under specific temperature conditions. The above-mentioned temperature conditions are, for example, -20 to 5°C, preferably -15 to 0°C, more preferably -10 to -5°C. The lifting member U is lowered, thereby releasing the expanded state. Furthermore, in the expanding step, as shown in FIGS. 5A to 5B, the dicing tape 20 is expanded under a higher temperature condition to expand the area. Thereby, the adjacent semiconductor wafers that have been cut are pulled apart along the surface direction of the film surface, thereby expanding the gap. In the pick-up step, as shown in FIG. 6, the semiconductor wafer in the state where the die-bonding layer 10 is attached is peeled from the adhesive layer of the die-cutting tape 20. Specifically, the pin member P is raised, and the semiconductor wafer to be picked up is pushed up via the dicing tape 20. The lifted semiconductor chip is held by the suction jig J. In the die bonding step, the semiconductor chip in the state where the die bonding layer 10 is attached is attached to the adherend.

藉由本說明書所揭示之事項包含以下者。 (1) 一種切晶帶,其係具備基材層及與該基材層重疊之黏著劑層者,且 前述黏著劑層包含丙烯酸系聚合物, 前述丙烯酸系聚合物包含(甲基)丙烯酸C9〜C11烷基酯之結構單元及含羥基之(甲基)丙烯酸酯之結構單元, 前述丙烯酸系聚合物包含前述(甲基)丙烯酸C9〜C11烷基酯之結構單元40 mol%以上且85 mol%以下。 (2) 如上述(1)所記載之切晶帶,其中前述丙烯酸系聚合物包含前述含羥基之(甲基)丙烯酸酯之結構單元1 mol%以上且30 mol%以下。 (3) 如上述(2)所記載之切晶帶,其中前述含羥基之(甲基)丙烯酸酯之結構單元為含羥基之(甲基)丙烯酸C2〜C4烷基酯之結構單元。 (4) 如上述(1)至(3)中任一項所記載之切晶帶,其中前述(甲基)丙烯酸C9〜C11烷基酯之結構單元為(甲基)丙烯酸壬酯之結構單元及丙烯酸癸酯之結構單元中之至少1種。 (5) 如上述(1)至(4)中任一項所記載之切晶帶,其中前述丙烯酸系聚合物以莫耳比(B/A)計,相對於前述(甲基)丙烯酸C9〜C11烷基酯之結構單元(A),包含前述含羥基之(甲基)丙烯酸酯之結構單元(B)0.01以上且0.80以下。 (6) 如上述(1)至(5)中任一項所記載之切晶帶,其中前述丙烯酸系聚合物進而具有含聚合性基之(甲基)丙烯酸酯之結構單元。 (7) 如上述(6)所記載之切晶帶,其中前述含聚合性基之(甲基)丙烯酸酯之結構單元具有使前述含羥基之(甲基)丙烯酸酯之結構單元中之羥基與含異氰酸酯基之(甲基)丙烯酸酯單體之異氰酸酯基進行胺基甲酸酯鍵結而成之分子結構。 (8) 如上述(6)或(7)所記載之切晶帶,其中前述丙烯酸系聚合物於分子中包含前述含羥基之(甲基)丙烯酸酯之結構單元及前述含聚合性基之(甲基)丙烯酸酯之結構單元15 mol%以上且60 mol%以下。 (9) 如上述(6)至(8)中任一項所記載之切晶帶,其中前述丙烯酸系聚合物於分子中包含前述含聚合性基之(甲基)丙烯酸酯之結構單元7.0 mol%以上且60 mol%以下。 (10) 如上述(6)至(9)中任一項所記載之切晶帶,其中前述丙烯酸系聚合物以莫耳比(C/A)計,相對於前述(甲基)丙烯酸C9〜C11烷基酯之結構單元(A),包含前述含聚合性基之(甲基)丙烯酸酯之結構單元(C)0.08以上且1.40以下。 (11) 如上述(6)至(10)中任一項所記載之切晶帶,其中前述丙烯酸系聚合物以莫耳比(C/B)計,相對於前述含羥基之(甲基)丙烯酸酯之結構單元(B),包含前述含聚合性基之(甲基)丙烯酸酯之結構單元(C)0.9以上且18.0以下。 (12) 如上述(6)至(11)中任一項所記載之切晶帶,其中前述丙烯酸系聚合物以莫耳比[A/(B+C)]計,相對於前述含羥基之(甲基)丙烯酸酯之結構單元(B)及前述含聚合性基之(甲基)丙烯酸酯之結構單元(C),包含前述(甲基)丙烯酸C9〜C11烷基酯之結構單元(A)0.5以上且6.0以下。 (13) 如上述(6)至(12)中任一項所記載之切晶帶,其中前述丙烯酸系聚合物以莫耳比[C/(B+C)]計,相對於前述含羥基之(甲基)丙烯酸酯之結構單元(B)及前述含聚合性基之(甲基)丙烯酸酯之結構單元(C),包含前述含聚合性基之(甲基)丙烯酸酯之結構單元(C)0.50以上且0.95以下。 (14) 如上述(1)至(13)中任一項所記載之切晶帶,其中前述黏著劑層包含前述丙烯酸系聚合物、異氰酸酯化合物及聚合起始劑。 (15)一種切晶黏晶膜,其具備:如上述(1)至(14)中任一項所記載之切晶帶、及積層於該切晶帶之前述黏著劑層之黏晶層。 (16) 如上述(15)所記載之切晶黏晶膜,其中前述黏晶層包含熱硬化性樹脂及熱塑性樹脂中之至少一者、及填料。The matters disclosed in this manual include the following. (1) A dicing tape, which is provided with a substrate layer and an adhesive layer overlapping the substrate layer, and The aforementioned adhesive layer contains acrylic polymer, The aforementioned acrylic polymer contains structural units of C9~C11 alkyl (meth)acrylates and structural units of hydroxyl-containing (meth)acrylates, The aforementioned acrylic polymer contains the structural units of the aforementioned (meth)acrylic acid C9~C11 alkyl ester of 40 mol% or more and 85 mol% or less. (2) The dicing tape as described in the above (1), wherein the acrylic polymer includes 1 mol% or more and 30 mol% or less of the structural units of the hydroxyl-containing (meth)acrylate. (3) The dicing tape described in (2) above, wherein the structural unit of the hydroxyl-containing (meth)acrylate is the structural unit of the hydroxyl-containing (meth)acrylate C2-C4 alkyl ester. (4) The dicing tape described in any one of (1) to (3) above, wherein the structural unit of the aforementioned C9~C11 alkyl (meth)acrylate is the structural unit of nonyl (meth)acrylate and decyl acrylate At least one of the structural units of the ester. (5) The dicing tape described in any one of (1) to (4) above, wherein the acrylic polymer is measured in molar ratio (B/A) relative to the C9~C11 alkyl group of (meth)acrylic acid. The structural unit (A) of the ester includes the structural unit (B) of the aforementioned hydroxyl-containing (meth)acrylate from 0.01 to 0.80. (6) The dicing tape described in any one of (1) to (5) above, wherein the acrylic polymer further has a polymerizable group-containing (meth)acrylate structural unit. (7) The dicing tape described in the above (6), wherein the structural unit of the polymerizable group-containing (meth)acrylate has the hydroxyl group in the structural unit of the hydroxyl-containing (meth)acrylate and the isocyanate-containing group The isocyanate group of the (meth)acrylate monomer is a molecular structure formed by urethane bonding. (8) The dicing tape as described in the above (6) or (7), wherein the acrylic polymer contains the structural unit of the hydroxyl-containing (meth)acrylate and the polymerizable group-containing (meth) in the molecule The structural unit of acrylate is 15 mol% or more and 60 mol% or less. (9) The dicing tape described in any one of (6) to (8) above, wherein the acrylic polymer contains 7.0 mol% or more of the structural unit of the polymerizable group-containing (meth)acrylate in the molecule, and Below 60 mol%. (10) The dicing tape as described in any one of (6) to (9) above, wherein the acrylic polymer is measured in molar ratio (C/A) relative to the C9~C11 alkyl group of (meth)acrylic acid. The structural unit (A) of the ester includes the structural unit (C) of the polymerizable group-containing (meth)acrylate of 0.08 or more and 1.40 or less. (11) The dicing tape described in any one of (6) to (10) above, wherein the acrylic polymer is based on molar ratio (C/B), relative to the hydroxyl-containing (meth)acrylate The structural unit (B) includes the structural unit (C) of the polymerizable group-containing (meth)acrylate of 0.9 or more and 18.0 or less. (12) The dicing tape described in any one of (6) to (11) above, wherein the acrylic polymer is calculated in molar ratio [A/(B+C)] relative to the hydroxyl-containing (meth)acrylic acid The structural unit (B) of the ester and the structural unit (C) of the aforementioned polymerizable group-containing (meth)acrylate, including the structural unit (A) of the aforementioned (meth)acrylate C9~C11 alkyl ester 0.5 or more and 6.0 the following. (13) The dicing tape described in any one of (6) to (12) above, wherein the acrylic polymer is based on molar ratio [C/(B+C)] relative to the hydroxyl-containing (meth)acrylic acid The structural unit (B) of the ester and the structural unit (C) of the (meth)acrylate containing the polymerizable group, including the structural unit of the (meth)acrylate containing the polymerizable group (C) 0.50 or more and 0.95 the following. (14) The dicing tape described in any one of (1) to (13) above, wherein the adhesive layer includes the acrylic polymer, an isocyanate compound, and a polymerization initiator. (15) A dicing chip adhesive film comprising: the dicing tape as described in any one of (1) to (14) above, and a crystal sticking layer laminated on the aforementioned adhesive layer of the dicing tape. (16) The die-cut die-bonding film described in (15) above, wherein the die-bonding layer includes at least one of a thermosetting resin and a thermoplastic resin, and a filler.

本實施形態之切晶帶、切晶黏晶膜如上述所例示,但本發明不限定於上述例示之切晶帶、切晶黏晶膜。 即,在不損害本發明之效果之範圍內可採用通常之切晶帶、切晶黏晶膜中使用之各種形態。 [實施例]The dicing tape and dicing adhesive film of this embodiment are as exemplified above, but the present invention is not limited to the dicing tape and dicing adhesive film exemplified above. That is, various forms used in ordinary dicing tapes and dicing sticky films can be adopted within the range that does not impair the effects of the present invention. [Example]

其次,藉由實驗例更詳細地對本發明進行說明,但本發明不限定於該等。Next, the present invention will be explained in more detail with experimental examples, but the present invention is not limited to these.

以下述方式製造切晶帶。又,使用該切晶帶,製造切晶黏晶膜。The dicing tape is manufactured in the following manner. In addition, the dicing tape is used to produce a dicing die sticking film.

<丙烯酸系聚合物之原料> 「第1合成階段」 •(甲基)丙烯酸C9〜C11烷基酯:丙烯酸異癸酯(IDA) •(甲基)丙烯酸C9〜C11烷基酯:丙烯酸異壬酯(INA) •含羥基之(甲基)丙烯酸酯:丙烯酸2-羥基乙酯(HEA) •含羥基之(甲基)丙烯酸酯:丙烯酸4-羥基丁酯(4HBA) •聚合起始劑:偶氮雙異丁腈(AIBN) •聚合溶劑:乙酸乙酯 「第2合成階段」:含聚合性基之(甲基)丙烯酸酯之結構單元之製備 •含異氰酸酯基之(甲基)丙烯酸酯單體:甲基丙烯酸2-異氰酸根合乙酯(製品名「KarenzMOI」昭和電工公司製造) •胺基甲酸酯化反應觸媒:二月桂酸二丁基錫 <切晶帶之原料> •黏著劑層 丙烯酸系聚合物(分別合成者) 異氰酸酯化合物 甲苯二異氰酸酯之三羥甲基丙烷加成物之乙酸乙酯溶液(製品名「CORONATE L」 東曹公司製造) 光聚合起始劑(製品名「Omnirad127」 IGM Resins公司製造) •基材層 EVA膜(成膜後進行電暈處理) 將製品名「Evaflex V1010」樹脂(三井杜邦化學公司製造)在無延伸下製膜成125 μm厚度,對與黏著劑層接觸之面實施電暈處理而成者 •有機溶劑(製作黏著劑層時使用) 乙酸乙酯<Raw material of acrylic polymer> "The first synthesis stage" •(Meth)acrylate C9~C11 alkyl ester: Isodecyl acrylate (IDA) • (Meth) acrylic acid C9~C11 alkyl ester: isononyl acrylate (INA) •Hydroxy-containing (meth)acrylate: 2-hydroxyethyl acrylate (HEA) • (Meth) acrylate containing hydroxyl group: 4-hydroxybutyl acrylate (4HBA) •Polymerization initiator: azobisisobutyronitrile (AIBN) •Polymerization solvent: ethyl acetate "Second Synthesis Stage": Preparation of structural units of (meth)acrylate containing polymerizable groups •Isocyanate group-containing (meth)acrylate monomer: 2-isocyanatoethyl methacrylate (product name "KarenzMOI" manufactured by Showa Denko) •Carbamate reaction catalyst: dibutyltin dilaurate <Raw material of crystal cut tape> • Adhesive layer Acrylic polymer (synthesized separately) Isocyanate compound The ethyl acetate solution of the trimethylolpropane adduct of toluene diisocyanate (product name "CORONATE L" manufactured by Tosoh Corporation) Photopolymerization initiator (product name "Omnirad127" manufactured by IGM Resins) •Substrate layer EVA film (corona treatment after film formation) The product name "Evaflex V1010" resin (manufactured by Mitsui DuPont Chemical Co., Ltd.) is formed into a film with a thickness of 125 μm without stretching, and the surface in contact with the adhesive layer is corona treated. •Organic solvent (used when making adhesive layer) Ethyl acetate

(實施例1) 以下述方式合成丙烯酸系聚合物中間物後,由丙烯酸系聚合物中間物合成丙烯酸系聚合物。使用合成之丙烯酸系聚合物製作黏著劑層,製造切晶帶。 「第1合成階段:丙烯酸系聚合物中間物之合成」 將上述之原料以表1所示之量(質量份)混合而製備混合物。對在1 L圓底可分離式燒瓶裝備有可分離式蓋、分液漏斗、溫度計、氮氣導入管、李比希冷凝器、真空密封裝置(Vacuumseal)、攪拌棒、攪拌葉片之狀態之聚合用實驗裝置投入上述之混合物。一面攪拌一面於常溫下進行6小時氮氣置換。其後,一面流入氮氣,一面攪拌,並且維持62℃3小時,其後於75℃下維持2小時。藉此,進行聚合反應,冷卻至室溫,獲得聚合物溶液(包含各丙烯酸系聚合物之基礎聚合物之溶液)。 「第2合成階段:各丙烯酸系聚合物之合成」 向獲得之聚合物溶液(含丙烯酸系聚合物中間物之溶液)中以表1所示之量添加作為聚合性(甲基)丙烯酸酯單體之甲基丙烯酸2-異氰酸根合乙酯(製品名「KarenzMOI」 昭和電工公司製造)及二月桂酸二丁基錫IV(和光純藥工業公司製造),於空氣氛圍下、在50℃攪拌24小時。 「黏著劑層用組合物之製備」 相對於丙烯酸系聚合物之固形物成分100質量份混合表5所示之量之異氰酸酯化合物[CORONATE L]及光聚合起始劑(Omnirad127)。加入作為稀釋溶劑之乙酸乙酯,以固形物成分之含有率成為20質量%之方式製備黏著劑層用組合物。 「黏著劑層之製作」 作為剝離片,準備PET系膜(製品名「DIAFOIL MRF38」 三菱化學公司製造)。對該膜之單面實施有脫模處理。於實施有脫模處理之剝離片之面塗佈如上所述地製備之黏著劑層用組合物。對塗佈之組合物於剝離片上進行120℃3分鐘之乾燥處理,製作厚度10 μm之黏著劑層。 「切晶帶之製造」 於黏著劑層與剝離片重疊之狀態下,以不混入氣泡之方式將黏著劑層貼合於基材層(EVA膜)之電暈處理面。於50℃下進行48小時之乾燥處理,製造切晶帶。(Example 1) After synthesizing the acrylic polymer intermediate in the following manner, the acrylic polymer is synthesized from the acrylic polymer intermediate. Synthetic acrylic polymer is used to make adhesive layer to make dicing tape. "The first synthesis stage: the synthesis of acrylic polymer intermediates" The above-mentioned raw materials were mixed in the amounts (parts by mass) shown in Table 1 to prepare a mixture. The 1 L round bottom separable flask is equipped with a separable cap, a separatory funnel, a thermometer, a nitrogen introduction tube, a Liebig condenser, a vacuum sealing device (Vacuumseal), a stirring rod, and a stirring blade. The experimental device for polymerization Add the above mixture. While stirring, perform nitrogen replacement at room temperature for 6 hours. Thereafter, while flowing nitrogen gas, the mixture was stirred and maintained at 62°C for 3 hours, and thereafter maintained at 75°C for 2 hours. Thereby, the polymerization reaction is carried out, and it is cooled to room temperature to obtain a polymer solution (a solution containing the base polymer of each acrylic polymer). "Second Synthesis Stage: Synthesis of Acrylic Polymers" To the obtained polymer solution (solution containing the acrylic polymer intermediate) was added 2-isocyanatoethyl methacrylate as a polymerizable (meth)acrylate monomer in the amount shown in Table 1 ( The product name is "Karenz MOI" (manufactured by Showa Denko Corporation) and dibutyltin dilaurate IV (manufactured by Wako Pure Chemical Industries, Ltd.) and stirred at 50°C for 24 hours in an air atmosphere. "Preparation of composition for adhesive layer" The isocyanate compound [CORONATE L] and the photopolymerization initiator (Omnirad 127) in the amounts shown in Table 5 were mixed with respect to 100 parts by mass of the solid content of the acrylic polymer. Ethyl acetate as a dilution solvent was added, and the composition for an adhesive layer was prepared so that the content rate of a solid content might become 20 mass %. "Making of Adhesive Layer" As a release sheet, a PET film (product name "DIAFOIL MRF38" manufactured by Mitsubishi Chemical Corporation) was prepared. A mold release treatment was applied to one side of the film. The adhesive layer composition prepared as described above is applied to the surface of the release sheet subjected to the release treatment. The coated composition was dried on the release sheet at 120°C for 3 minutes to form an adhesive layer with a thickness of 10 μm. "Manufacturing of Cut Strips" In the state where the adhesive layer and the release sheet are overlapped, the adhesive layer is attached to the corona treated surface of the base layer (EVA film) without air bubbles. Drying treatment is carried out at 50°C for 48 hours to produce diced wafers.

<切晶黏晶膜之製造> •黏晶層之製作 使用下述之原料,以下述方式製作黏晶層(實施例及比較例中使用相同者) 丙烯酸系樹脂:100質量份 (製品名「TEISAN RESIN SG-P3」,Nagase ChemteX公司製造) 玻璃轉移溫度12℃ 含環氧基)、 環氧樹脂:46質量份 (製品名「JER1001」,三菱化學公司製造) 雙酚A型環氧樹脂、 酚樹脂:51質量份 (製品名「MEH-7851ss」,明和化成公司製造) 聯苯酚醛清漆樹脂、 球狀二氧化矽:191質量份 (製品名「SO-25R」,ADMATECHS公司製造)、 硬化觸媒:0.6質量份 (製品名「Curesol 2PHZ」,四國化成工業公司製造) 將上述之原料及甲基乙基酮混合,製備固形物成分濃度20質量%之樹脂組合物。將該樹脂組合物塗佈於剝離片(PET 厚度50 μm)之一面。再者,對經塗佈之面預先實施了聚矽氧處理。於130℃下進行2分鐘加熱而使溶劑揮發,製作厚度10 μm之黏晶層。<Manufacturing of slicing and sticking film> •The production of the sticky layer Use the following raw materials to make the bonding layer in the following manner (the same ones are used in the examples and comparative examples) Acrylic resin: 100 parts by mass (Product name "TEISAN RESIN SG-P3", manufactured by Nagase ChemteX) Glass transition temperature 12℃, epoxy group included), Epoxy resin: 46 parts by mass (Product name "JER1001", manufactured by Mitsubishi Chemical Corporation) Bisphenol A type epoxy resin, Phenolic resin: 51 parts by mass (Product name "MEH-7851ss", manufactured by Meiwa Chemical Co., Ltd.) Biphenol novolac resin, Spherical silica: 191 parts by mass (Product name "SO-25R", manufactured by ADMATECHS), Hardening catalyst: 0.6 parts by mass (Product name "Curesol 2PHZ", manufactured by Shikoku Chemical Industry Co., Ltd.) The above-mentioned raw materials and methyl ethyl ketone were mixed to prepare a resin composition with a solid content concentration of 20% by mass. This resin composition was applied to one surface of a release sheet (PET thickness 50 μm). In addition, the coated surface was treated with silicone in advance. Heat at 130°C for 2 minutes to volatilize the solvent to form a sticky crystal layer with a thickness of 10 μm.

•黏晶層與切晶帶之貼合 將與剝離片重疊之狀態之黏晶層與切晶帶之剝離了剝離片後之黏著劑層以不混入氣泡之方式貼合。黏晶層配置於晶圓之貼合預定位置,並且為直徑比晶圓尺寸大5 mm之尺寸。使用層壓機進行貼合,製造相互貼合之黏著劑層及黏晶層配置於基材層與剝離片之間之狀態之切晶黏晶膜。 使用以此種狀態,於溫度18〜25℃、濕度40〜60%、遮光條件下放置24小時而得之膜作為試驗用樣品。•Adhesion of the die bonding layer and the die cutting tape The die-bonding layer in the state of overlapping with the peeling sheet and the adhesive layer of the dicing tape after the peeling sheet is peeled off are bonded together so as not to mix in air bubbles. The die-bonding layer is arranged at the predetermined position of the wafer, and has a size that is 5 mm larger in diameter than the wafer size. Laminator is used for laminating to produce a diced die sticking film in a state where the adhesive layer and die bonding layer that are attached to each other are arranged between the substrate layer and the peeling sheet. In this state, a film obtained by standing for 24 hours at a temperature of 18-25°C, a humidity of 40-60%, and a light-shielding condition is used as a test sample.

(實施例2〜15) 按照表1〜表3、及表5所示之調配組成,與實施例1同樣地製造切晶帶及切晶黏晶膜。(Examples 2~15) According to the blending compositions shown in Table 1 to Table 3 and Table 5, the dicing tape and the dicing sticky film were produced in the same manner as in Example 1.

(比較例1〜8) 按照表4及表5所示之調配組成,與實施例1同樣地製造切晶帶及切晶黏晶膜。(Comparative Examples 1 to 8) According to the compounding composition shown in Table 4 and Table 5, the dicing tape and the dicing die sticking film were produced in the same manner as in Example 1.

將用於製造實施例及比較例之切晶帶及切晶黏晶膜之調配組成示於表1〜表5。The blending compositions of the dicing tape and the dicing sticky film used in the production of the examples and comparative examples are shown in Tables 1 to 5.

[表1] 單位:質量份 第1合成階段 實施例1 實施例2 實施例3 實施例4 實施例5 實施例6 INA 121.15 121.15 105.97 105.97 173.01 173.01 HEA 106.39 106.39 - - 54.54 54.54 4HBA - - 115.59 115.59 - - AIBN 0.46 0.46 0.44 0.44 0.46 0.46 聚合溶劑 372.00 372.00 378.00 378.00 372.00 372.00 第2合成階段 甲基丙烯酸2-異氰酸根合乙酯 71.09 127.96 62.18 111.93 36.44 65.59 反應觸媒 0.36 0.64 0.31 0.56 0.18 0.33 [Table 1] Unit: parts by mass The first synthesis stage Example 1 Example 2 Example 3 Example 4 Example 5 Example 6 INA 121.15 121.15 105.97 105.97 173.01 173.01 HEA 106.39 106.39 - - 54.54 54.54 4HBA - - 115.59 115.59 - - AIBN 0.46 0.46 0.44 0.44 0.46 0.46 Polymerization solvent 372.00 372.00 378.00 378.00 372.00 372.00 Synthesis stage 2 2-isocyanatoethyl methacrylate 71.09 127.96 62.18 111.93 36.44 65.59 Reaction catalyst 0.36 0.64 0.31 0.56 0.18 0.33

[表2] 單位:質量份 第1合成階段 實施例7 實施例8 實施例9 實施例10 實施例11 實施例12 INA 159.22 159.22 200.41 200.41 196.36 196.36 HEA - - 39.11 39.11 - - 4HBA 62.34 62.34 -    25.20 25.20 AIBN 0.44 0.44 0.48 0.48 0.44 0.44 聚合溶劑 378.00 378.00 360.00 360.00 378.00 378.00 第2合成階段 甲基丙烯酸2-異氰酸根合乙酯 33.54 60.37 14.24 25.63 13.56 24.40 反應觸媒 0.17 0.30 0.07 0.13 0.07 0.12 [Table 2] Unit: parts by mass The first synthesis stage Example 7 Example 8 Example 9 Example 10 Example 11 Example 12 INA 159.22 159.22 200.41 200.41 196.36 196.36 HEA - - 39.11 39.11 - - 4HBA 62.34 62.34 - 25.20 25.20 AIBN 0.44 0.44 0.48 0.48 0.44 0.44 Polymerization solvent 378.00 378.00 360.00 360.00 378.00 378.00 Synthesis stage 2 2-isocyanatoethyl methacrylate 33.54 60.37 14.24 25.63 13.56 24.40 Reaction catalyst 0.17 0.30 0.07 0.13 0.07 0.12

[表3] 單位:質量份 第1合成階段 實施例13 實施例14 實施例15 IDA - 175.78 136.39 INA 173.01 - - HEA 54.54 51.76 91.16 4HBA - - - AIBN 0.46 0.46 0.46 聚合溶劑 372.00 372.00 372.00 第2合成階段 甲基丙烯酸2-異氰酸根合乙酯 68.51 65.02 115.73 反應觸媒 0.34 0.33 0.58 [table 3] Unit: parts by mass The first synthesis stage Example 13 Example 14 Example 15 IDA - 175.78 136.39 INA 173.01 - - HEA 54.54 51.76 91.16 4HBA - - - AIBN 0.46 0.46 0.46 Polymerization solvent 372.00 372.00 372.00 Synthesis stage 2 2-isocyanatoethyl methacrylate 68.51 65.02 115.73 Reaction catalyst 0.34 0.33 0.58

[表4] 單位:質量份 第1合成階段 比較例1 比較例2 比較例3 比較例4 比較例5 比較例6 比較例7 比較例8 INA 213.65 213.65 204.99 204.99 109.02 109.02 94.26 94.26 HEA 39.11 39.11 - - 118.53 118.53 - - 4HBA - - 16.56 16.56 - - 127.29 127.29 AIBN 0.48 0.48 0.44 0.44 0.46 0.46 0.43 0.43 聚合溶劑 346.76 346.76 378.00 378.00 372.00 372.00 378.01 378.01 第2合成階段 甲基丙烯酸2-異氰酸根合乙酯 9.29 16.71 8.91 16.04 79.20 142.56 68.48 123.26 反應觸媒 0.05 0.08 0.04 0.08 0.40 0.71 0.34 0.62 [Table 4] Unit: parts by mass The first synthesis stage Comparative example 1 Comparative example 2 Comparative example 3 Comparative example 4 Comparative example 5 Comparative example 6 Comparative example 7 Comparative example 8 INA 213.65 213.65 204.99 204.99 109.02 109.02 94.26 94.26 HEA 39.11 39.11 - - 118.53 118.53 - - 4HBA - - 16.56 16.56 - - 127.29 127.29 AIBN 0.48 0.48 0.44 0.44 0.46 0.46 0.43 0.43 Polymerization solvent 346.76 346.76 378.00 378.00 372.00 372.00 378.01 378.01 Synthesis stage 2 2-isocyanatoethyl methacrylate 9.29 16.71 8.91 16.04 79.20 142.56 68.48 123.26 Reaction catalyst 0.05 0.08 0.04 0.08 0.40 0.71 0.34 0.62

[表5] 單位:質量份    黏著劑層用組合物 各丙烯酸系聚合物 100 異氰酸酯化合物 (CORONATE L) 0.75 光聚合起始劑 (Omnirad127) 2 [table 5] Unit: parts by mass Composition for adhesive layer Acrylic polymers 100 Isocyanate compound (CORONATE L) 0.75 Photopolymerization initiator (Omnirad127) 2

<活性能量線(紫外線)照射前之黏晶層-黏著劑層間之剝離強度測定> 將貼合有黏晶層(DAF)與黏著劑層之部分以150 mm×20 mm尺寸切出。使用手壓輥將取下了剝離片後之黏晶層貼附於SUS304BA板。此時,SUS304BA板放置於加熱至80℃之加熱板上。貼附時,使得黏晶層與SUS板之間不混入氣泡。 其後,於溫度23℃、濕度50%之環境下放置3小時,使溫度固定。利用Tensilon型拉伸試驗機(島津製作所公司製造,AGS-J),測定剝離強度(自黏著劑層將黏晶層剝離時之強度)。剝離條件為剝離速度30 mm/分鐘、剝離角度90度、溫度23℃、濕度50%。實施3次測定,將其平均值作為剝離強度之值。<Measurement of the peel strength between the adhesive layer and the adhesive layer before active energy rays (ultraviolet rays) irradiation> Cut out the part where the die-bonding layer (DAF) and the adhesive layer are attached to a size of 150 mm×20 mm. Use a hand roller to affix the die-bonding layer after removing the peeling sheet to the SUS304BA board. At this time, the SUS304BA board is placed on a hot plate heated to 80°C. When attaching, make sure that no air bubbles are mixed between the die-bonding layer and the SUS board. After that, it was placed in an environment with a temperature of 23°C and a humidity of 50% for 3 hours to fix the temperature. A Tensilon type tensile tester (manufactured by Shimadzu Corporation, AGS-J) was used to measure the peel strength (strength at which the adhesive layer was peeled off from the adhesive layer). The peeling conditions were a peeling speed of 30 mm/min, a peeling angle of 90 degrees, a temperature of 23°C, and a humidity of 50%. The measurement was performed 3 times, and the average value was used as the value of the peel strength.

<活性能量線(紫外線)照射後之黏晶層-黏著劑層間之剝離強度測定> 與上述同樣地,於溫度23℃、濕度50%之環境下放置3小時後,以下述之「紫外線照射條件」,自基材層側(膜之背面側)照射UV。進而,於溫度23℃、濕度50%之環境下放置3小時,使溫度固定。 利用Tensilon型拉伸試驗機(島津製作所公司製造,AGS-J),測定剝離強度(自黏著劑層將黏晶層剝離時之強度)。剝離條件為剝離速度100 mm/分鐘、剝離角度90度、溫度23℃、濕度50%。實施3次測定,將其平均值作為剝離強度之值。<Measurement of the peeling strength between the adhesive layer and the adhesive layer after active energy rays (ultraviolet rays) irradiation> In the same manner as above, after leaving it in an environment with a temperature of 23°C and a humidity of 50% for 3 hours, UV was irradiated from the substrate layer side (the back side of the film) under the following "ultraviolet radiation conditions". Furthermore, it was left in an environment with a temperature of 23° C. and a humidity of 50% for 3 hours to fix the temperature. A Tensilon type tensile tester (manufactured by Shimadzu Corporation, AGS-J) was used to measure the peel strength (strength at which the adhesive layer was peeled off from the adhesive layer). The peeling conditions were a peeling speed of 100 mm/min, a peeling angle of 90 degrees, a temperature of 23°C, and a humidity of 50%. The measurement was performed 3 times, and the average value was used as the value of the peel strength.

<紫外線照射後之黏著劑層之拉伸彈性模數測定> 於一對之PET性剝離片之間製作黏著劑層(厚度20 μm)。以下述之「紫外線照射條件」對黏著劑層照射紫外線。將紫外線照射後之黏著劑層切割為10 mm×30 mm之尺寸,將其作為評價樣品。 使用拉伸試驗機(ORIENTEC公司製造,製品名「RTC-1150A」),測定評價樣品之拉伸彈性模數。詳細而言,於測定溫度22℃、夾頭間距離10 mm、速度10 mm/分鐘之條件下測定SS曲線,根據SS曲線之上升求出初始彈性模數。將該值作為紫外線照射後之黏著劑層之拉伸彈性模數。實施5次測定,將其平均值作為紫外線照射後之黏著劑層之拉伸彈性模數。 「紫外線照射條件」 紫外線照射裝置:製品名-UM810(日東精機公司製造) 光源:高壓水銀燈 照射強度:50 mW/cm2 (測定機器:牛尾公司製造之「紫外線照度計UT-101」) 照射時間:6秒 累計光量:300 mJ/cm2 <Measurement of the tensile elastic modulus of the adhesive layer after ultraviolet irradiation> An adhesive layer (thickness 20 μm) was formed between a pair of PET release sheets. The adhesive layer is irradiated with ultraviolet rays under the following "ultraviolet irradiation conditions". The adhesive layer after ultraviolet irradiation was cut into a size of 10 mm×30 mm and used as an evaluation sample. Using a tensile tester (manufactured by ORIENTEC, product name "RTC-1150A"), the tensile elastic modulus of the evaluation sample was measured. Specifically, the SS curve was measured under the conditions of a measurement temperature of 22°C, a distance between the chucks of 10 mm, and a speed of 10 mm/min, and the initial elastic modulus was obtained from the rise of the SS curve. This value is taken as the tensile elastic modulus of the adhesive layer after ultraviolet irradiation. The measurement was performed 5 times, and the average value was used as the tensile elastic modulus of the adhesive layer after ultraviolet irradiation. "Ultraviolet Irradiation Conditions" Ultraviolet Irradiation Device: Product Name-UM810 (manufactured by Nitto Seiki Co., Ltd.) Light source: High-pressure mercury lamp Irradiation intensity: 50 mW/cm 2 (Measuring equipment: "Ultraviolet Illuminance Meter UT-101" manufactured by Ushio Co., Ltd.) Irradiation time :Accumulated amount of light in 6 seconds: 300 mJ/cm 2

<拾取試驗方法> 將切晶帶(日東電工公司製造之ELEP MOUNT DU-300)及切晶環貼合於12英吋之裸晶圓(厚度740 μm),使用切晶鋸裝置DFD6361(DISCO公司製造),以形成自表面起之深度為100 μm、寬度為30 μm之槽之方式,以10 mm×10 mm尺寸進行半切割切晶。半切割切晶後,自上述切晶帶之背面側照射紫外線,回收形成有槽之晶圓。 其後,於形成有槽之晶圓表面貼合背面研磨帶(表面保護用黏著膜,日東電工公司製造,ELEP MOUNT UB-3083D),使用研磨拋光裝置DGP8760(DISCO公司製造)進行研削以使厚度成為30 μm,獲得經小片化之薄晶圓。 將經小片化之薄晶圓及切晶環貼合於切晶黏晶膜,自背面研磨帶之背面側照射紫外線而使黏著劑硬化,將背面研磨帶自晶圓剝離並去除。其次,使用晶片分離裝置DDS2300(DISCO公司製造),進行晶圓及黏晶層之割斷及切晶帶之熱收縮,藉此獲得割斷樣品。具體而言,首先,利用冷擴展單元,於擴展溫度:-15℃、擴展速度:200 mm/秒、擴展量:12 mm之條件下將半導體晶圓割斷。 其後,於室溫下,於擴展速度1 mm/秒、擴展量7 mm之條件下進行常溫擴展。然後,維持擴展狀態不變,於加熱溫度200℃、風量40 L/分鐘、加熱距離20 mm、旋轉速度5°/秒之條件下,使半導體晶片之外周部分之切晶帶熱收縮。 使用黏晶機SPA-300(新川公司製造),於以下之條件下進行拾取。將400 μm以下之拾取高度下拾取成功率為90%以上之情況評價為〇、將拾取成功率未達90%之情況評價為×。 「拾取條件」 銷數:5 頂起速度:1 mm/秒 拾取高度:200〜1000 μm 拾取評價數:50<Pickup test method> The dicing tape (ELEP MOUNT DU-300 manufactured by Nitto Denko) and the dicing ring are attached to a 12-inch bare wafer (thickness 740 μm), using a dicing saw device DFD6361 (manufactured by DISCO) to form For a groove with a depth of 100 μm and a width of 30 μm from the surface, half-cutting is performed with a size of 10 mm×10 mm. After half-cut dicing, ultraviolet rays are irradiated from the back side of the dicing tape to recover the wafer with grooves formed. After that, a back polishing tape (adhesive film for surface protection, manufactured by Nitto Denko Corporation, ELEP MOUNT UB-3083D) is attached to the surface of the wafer with grooves, and the thickness is adjusted using a polishing device DGP8760 (manufactured by DISCO). It becomes 30 μm, and a thin wafer with small pieces is obtained. The diced thin wafer and dicing ring are attached to the dicing adhesive film, ultraviolet rays are irradiated from the back side of the back polishing tape to harden the adhesive, and the back polishing tape is peeled from the wafer and removed. Secondly, using a wafer separation device DDS2300 (manufactured by DISCO), the wafer and the die bonding layer are cut and the die tape is thermally shrunk to obtain a cut sample. Specifically, first, the cold expansion unit is used to cut the semiconductor wafer under the conditions of expansion temperature: -15°C, expansion speed: 200 mm/sec, and expansion amount: 12 mm. After that, at room temperature, the expansion speed is 1 mm/sec and the expansion amount is 7 mm. Then, maintaining the expanded state, under the conditions of a heating temperature of 200°C, an air volume of 40 L/min, a heating distance of 20 mm, and a rotation speed of 5°/sec, the dicing tape on the outer periphery of the semiconductor wafer is thermally contracted. Use the wafer bonding machine SPA-300 (manufactured by Xinchuan Company) to pick up under the following conditions. The case where the pickup success rate is 90% or more at a pickup height of 400 μm or less is evaluated as 0, and the case where the pickup success rate is less than 90% is evaluated as ×. "Pickup Conditions" Number of pins: 5 Jacking speed: 1 mm/sec Pickup height: 200~1000 μm Pickup evaluation number: 50

<邊緣剝離試驗(黏晶層-黏著劑層間)> 將切晶帶(日東電工公司製造之ELEP MOUNT DU-300)及切晶環貼合於12英吋之裸晶圓(厚度740 μm),使用切晶鋸裝置DFD6361(DISCO公司製造),以形成自表面起之深度為100 μm、寬度為30 μm之槽之方式,以12 mm×12 mm尺寸進行半切割切晶。 其後,於形成有槽之晶圓表面貼合背面研磨帶(表面保護用黏著膜,日東電工公司製造之ELEP MOUNT UB-3083D),使用研磨拋光裝置DGP8760(DISCO公司製造)進行研削以使厚度成為30 μm,獲得薄晶圓。 將經小片化之薄晶圓及切晶環貼合於切晶黏晶膜,自背面研磨帶之背面側照射紫外線而使黏著劑硬化,將背面研磨帶自晶圓剝離並去除。其次,使用晶片分離裝置DDS2300(DISCO公司製造)進行晶圓及黏晶層之割斷及切晶帶之熱收縮,藉此獲得割斷樣品。具體而言,首先,利用冷擴展單元,於擴展溫度:-15℃、擴展速度:200 mm/秒、擴展量:12 mm之條件下將半導體晶圓割斷。 其後,於室溫下,於擴展速度1 mm/秒、擴展量7 mm之條件下進行常溫擴展。然後,維持擴展狀態不變,於加熱溫度200℃、風量40 L/分鐘、加熱距離20 mm、旋轉速度5°/秒之條件下,使半導體晶片之外周部分之切晶帶熱收縮。 於測定中,使用連續5個晶片量(附黏晶層[DAF]),因此於測定時,用手將與預定使用之連續5個晶片(附DAF)鄰接之12個晶片(附DAF)自切晶黏晶膜上去除。然後,利用切割刀將刀片切入去除了晶片(附DAF)之區域,獲得22 mm×70 mm尺寸之搭載有連續5個晶片(附DAF)之切晶黏晶膜樣品。 於5個連續晶片之表面(並無DAF之面)貼附雙面膠帶(製品No.5000NS 日東電工公司製造)。此時,利用手壓輥,自5個連續晶片之第1個晶片之端部至第5個晶片之端部以10 mm寬度進行貼附。並且,雙面膠帶被容納在晶片表面積內。即,為雙面膠帶不自晶片表面突出地貼附之狀況。 自雙面膠帶貼附於5個連續晶片之狀態,將附屬於雙面膠帶之隔離膜剝離。使用手壓輥,將剝離所得之面貼附於SUS304BA板。其後,自切晶黏晶膜之基材層側照射紫外線。照射條件與上述之條件相同。 紫外線照射後,將SUS板、膠帶、晶片(附DAF)於溫度23℃、濕度50%之環境下放置3小時。 利用Tensilon型拉伸試驗機(島津製作所公司製造,AGS-J),測定剝離強度(自黏著劑層將黏晶層剝離時之強度)。剝離條件為剝離速度50 mm/分鐘、剝離角度90度、溫度23℃、濕度50%。實施3次測定,並將各個測定時獲得之最大強度之平均值作為邊緣剝離試驗中之測定值。<Edge peeling test (between adhesive layer and adhesive layer)> The dicing tape (ELEP MOUNT DU-300 manufactured by Nitto Denko) and the dicing ring are attached to a 12-inch bare wafer (thickness 740 μm), using a dicing saw device DFD6361 (manufactured by DISCO) to form For a groove with a depth of 100 μm and a width of 30 μm from the surface, half-cutting is performed with a size of 12 mm×12 mm. After that, a back polishing tape (adhesive film for surface protection, ELEP MOUNT UB-3083D manufactured by Nitto Denko) was attached to the surface of the wafer with the grooves formed, and the thickness was adjusted using a polishing device DGP8760 (manufactured by DISCO). It becomes 30 μm, and a thin wafer is obtained. The diced thin wafer and dicing ring are attached to the dicing adhesive film, ultraviolet rays are irradiated from the back side of the back polishing tape to harden the adhesive, and the back polishing tape is peeled from the wafer and removed. Secondly, the wafer separation device DDS2300 (manufactured by DISCO) was used to cut the wafer and the die bonding layer and thermally shrink the dicing tape to obtain a cut sample. Specifically, first, the cold expansion unit is used to cut the semiconductor wafer under the conditions of expansion temperature: -15°C, expansion speed: 200 mm/sec, and expansion amount: 12 mm. After that, at room temperature, the expansion speed is 1 mm/sec and the expansion amount is 7 mm. Then, maintaining the expanded state, under the conditions of a heating temperature of 200°C, an air volume of 40 L/min, a heating distance of 20 mm, and a rotation speed of 5°/sec, the dicing tape on the outer periphery of the semiconductor wafer is thermally contracted. In the measurement, the amount of continuous 5 wafers (attached crystal layer [DAF]) is used, so in the measurement, the 12 wafers (with DAF) adjacent to the intended use of 5 continuous wafers (with DAF) are automatically Cut the crystal on the sticky film to remove. Then, a dicing knife was used to cut the blade into the area where the wafer (with DAF) was removed, and a 22 mm×70 mm size diced die attach film sample with 5 continuous wafers (with DAF) was obtained. Attach a double-sided tape (product No. 5000NS manufactured by Nitto Denko) on the surface of the 5 continuous wafers (the side without DAF). At this time, use a hand roller to attach the 5 continuous wafers from the end of the first wafer to the end of the fifth wafer with a width of 10 mm. Also, the double-sided tape is contained within the surface area of the wafer. That is, it is a situation in which the double-sided tape is attached without protruding from the surface of the wafer. From the state where the double-sided tape is attached to 5 continuous wafers, the release film attached to the double-sided tape is peeled off. Use a hand roller to attach the peeled surface to the SUS304BA board. After that, ultraviolet rays were irradiated from the substrate layer side of the diced chip adhesive film. The irradiation conditions are the same as those mentioned above. After UV irradiation, place the SUS board, tape, and wafer (with DAF) in an environment with a temperature of 23°C and a humidity of 50% for 3 hours. A Tensilon type tensile tester (manufactured by Shimadzu Corporation, AGS-J) was used to measure the peel strength (strength at which the adhesive layer was peeled off from the adhesive layer). The peeling conditions were a peeling speed of 50 mm/min, a peeling angle of 90 degrees, a temperature of 23°C, and a humidity of 50%. Perform 3 measurements, and use the average value of the maximum strength obtained during each measurement as the measurement value in the edge peel test.

將上述之評價結果示於表6〜表9。The above evaluation results are shown in Table 6 to Table 9.

[表6] 丙烯酸系聚合物之結構單元 實施例1 實施例2 實施例3 實施例4 實施例5 實施例6 INA單元[mol%]:A 40 40 40 40 65 65 HEA單元[mol%] 60 60 - - 35 35 4HBA單元[mol%] - - 60 60 - - 含羥基之單元含有率[mol%]:B (30) (6) (30) (6) (17.5) (3.5) 含聚合性基之單元含有率[mol%]:C (30) (54) (30) (54) (17.5) (31.5) A/(B+C)[莫耳比] 0.67 0.67 0.67 0.67 1.86 1.86 B/(B+C)[莫耳比] 0.50 0.10 0.50 0.10 0.50 0.10 C/(B+C)[莫耳比] 0.50 0.90 0.50 0.90 0.50 0.90 B/A[莫耳比] 0.75 0.15 0.75 0.15 0.27 0.05 C/A[莫耳比] 0.75 1.35 0.75 1.35 0.27 0.48 C/B[莫耳比] 1.00 9.00 1.00 9.00 1.00 9.00 <物性值>                   UV照射前之剝離強度[N/20 mm]:α 2.09 1.99 1.84 1.82 1.31 1.10 UV照射後之剝離強度[N/20 mm]:β 0.10 0.09 0.09 0.08 0.09 0.08 剝離強度比(UV照射前/UV照射後)α/β 20.9 22.1 20.4 22.8 14.6 13.8 邊緣剝離試驗時之最大強度[N/10 mm] 0.47 0.49 0.32 0.37 0.15 0.17 <評價試驗結果>                   拾取髙度[μm] 400 400 350 350 200 200 400 μm以下為〇 拾取試驗後之晶片破裂 無破裂 無破裂 無破裂 無破裂 無破裂 無破裂 晶片破裂時為× [Table 6] Structural unit of acrylic polymer Example 1 Example 2 Example 3 Example 4 Example 5 Example 6 INA unit [mol%]: A 40 40 40 40 65 65 HEA unit [mol%] 60 60 - - 35 35 4HBA unit [mol%] - - 60 60 - - The content rate of hydroxyl-containing unit [mol%]: B (30) (6) (30) (6) (17.5) (3.5) The content rate of the unit containing polymerizable group [mol%]: C (30) (54) (30) (54) (17.5) (31.5) A/(B+C)[Molby] 0.67 0.67 0.67 0.67 1.86 1.86 B/(B+C)[Molby] 0.50 0.10 0.50 0.10 0.50 0.10 C/(B+C)[Molby] 0.50 0.90 0.50 0.90 0.50 0.90 B/A[Molby] 0.75 0.15 0.75 0.15 0.27 0.05 C/A[Molby] 0.75 1.35 0.75 1.35 0.27 0.48 C/B[Molby] 1.00 9.00 1.00 9.00 1.00 9.00 <Properties value> Peel strength before UV irradiation [N/20 mm]: α 2.09 1.99 1.84 1.82 1.31 1.10 Peel strength after UV irradiation [N/20 mm]: β 0.10 0.09 0.09 0.08 0.09 0.08 Peel strength ratio (before UV irradiation/after UV irradiation) α/β 20.9 22.1 20.4 22.8 14.6 13.8 Maximum strength during edge peel test [N/10 mm] 0.47 0.49 0.32 0.37 0.15 0.17 <Evaluation test result> Pick up degree [μm] 400 400 350 350 200 200 Below 400 μm is 〇 Chip breakage after pick-up test No rupture No rupture No rupture No rupture No rupture No rupture When the chip is broken, it is ×

[表7] 丙烯酸系聚合物之結構單元 實施例7 實施例8 實施例9 實施例10 實施例11 實施例12 INA單元[mol%]:A 65 65 85 85 85 85 HEA單元[mol%] - - 15 15 - - 4HBA單元[mol%] 35 35 - - 15 15 含羥基之單元含有率[mol%]:B (17.5) (3.5) (7.5) (1.5) (7.5) (1.5) 含聚合性基之單元含有率[mol%]:C (17.5) (31.5) (7.5) (13.5) (7.5) (13.5) A/(B+C)[莫耳比] 1.86 1.86 5.67 5.67 5.67 5.67 B/(B+C)[莫耳比] 0.50 0.10 0.50 0.10 0.50 0.10 C/(B+C)[莫耳比] 0.50 0.90 0.50 0.90 0.50 0.90 B/A[莫耳比] 0.27 0.05 0.09 0.02 0.09 0.02 C/A[莫耳比] 0.27 0.48 0.09 0.16 0.09 0.16 C/B[莫耳比] 1.00 9.00 1.00 9.00 1.00 9.00 <物性值>                   UV照射前之剝離強度[N/20 mm]:α 1.24 1.05 0.43 0.45 0.41 0.43 UV照射後之剝離強度[N/20 mm]:β 0.08 0.07 0.10 0.09 0.09 0.08 剝離強度比(UV照射前/UV照射後)α/β 15.6 14.9 4.3 5.0 4.5 5.3 邊緣剝離試驗時之最大強度[N/10 mm] 0.14 0.16 0.13 0.14 0.12 0.13 <評價試驗結果>                   拾取高度[μm] 200 200 200 200 200 200 400 μm以下為〇 拾取試驗後之晶片破裂 無破裂 無破裂 無破裂 無破裂 無破裂 無破裂 晶片破裂時為× [Table 7] Structural unit of acrylic polymer Example 7 Example 8 Example 9 Example 10 Example 11 Example 12 INA unit [mol%]: A 65 65 85 85 85 85 HEA unit [mol%] - - 15 15 - - 4HBA unit [mol%] 35 35 - - 15 15 The content rate of hydroxyl-containing unit [mol%]: B (17.5) (3.5) (7.5) (1.5) (7.5) (1.5) The content rate of the unit containing polymerizable group [mol%]: C (17.5) (31.5) (7.5) (13.5) (7.5) (13.5) A/(B+C)[Molby] 1.86 1.86 5.67 5.67 5.67 5.67 B/(B+C)[Molby] 0.50 0.10 0.50 0.10 0.50 0.10 C/(B+C)[Molby] 0.50 0.90 0.50 0.90 0.50 0.90 B/A[Molby] 0.27 0.05 0.09 0.02 0.09 0.02 C/A[Molby] 0.27 0.48 0.09 0.16 0.09 0.16 C/B[Molby] 1.00 9.00 1.00 9.00 1.00 9.00 <Properties value> Peel strength before UV irradiation [N/20 mm]: α 1.24 1.05 0.43 0.45 0.41 0.43 Peel strength after UV irradiation [N/20 mm]: β 0.08 0.07 0.10 0.09 0.09 0.08 Peel strength ratio (before UV irradiation/after UV irradiation) α/β 15.6 14.9 4.3 5.0 4.5 5.3 Maximum strength during edge peel test [N/10 mm] 0.14 0.16 0.13 0.14 0.12 0.13 <Evaluation test result> Pick up height [μm] 200 200 200 200 200 200 Below 400 μm is 〇 Chip breakage after pick-up test No rupture No rupture No rupture No rupture No rupture No rupture When the chip is broken, it is ×

[表8] 丙烯酸系聚合物之結構單元 實施例13 實施例14 實施例15 IDA單元[mol%]:A - 65 45 INA單元[mol%]:A 65 - - HEA單元[mol%] 35 35 55 4HBA單元[mol%] - - - 含羥基之單元含有率[mol%]:B (2) (2) (3) 含聚合性基之單元含有率[mol%]:C (33) (33) (52) A/(B+C)[莫耳比] 1.86 1.86 0.82 B/(B+C)[莫耳比] 0.06 0.06 0.05 C/(B+C)[莫耳比] 0.94 0.94 0.95 B/A[莫耳比] 0.03 0.03 0.07 C/A[莫耳比] 0.51 0.51 1.16 C/B[莫耳比] 16.50 16.50 17.33 <物性值>          UV照射前之剝離強度[N/20 mm]:α 1.09 1.55 3.21 UV照射後之剝離強度[N/20 mm]:β 0.08 0.09 0.08 剝離強度比(UV照射前/UV照射後)α/β 13.6 17.2 40.1 邊緣剝離試驗時之最大強度[N/10 mm] 0.18 0.17 0.18 <評價試驗結果>          拾取高度[μm] 200 300 200 400 μm以下為〇 拾取試驗後之晶片破裂 無破裂 無破裂 無破裂 晶片破裂時為× [Table 8] Structural unit of acrylic polymer Example 13 Example 14 Example 15 IDA unit [mol%]: A - 65 45 INA unit [mol%]: A 65 - - HEA unit [mol%] 35 35 55 4HBA unit [mol%] - - - The content rate of hydroxyl-containing unit [mol%]: B (2) (2) (3) The content rate of the unit containing polymerizable group [mol%]: C (33) (33) (52) A/(B+C)[Molby] 1.86 1.86 0.82 B/(B+C)[Molby] 0.06 0.06 0.05 C/(B+C)[Molby] 0.94 0.94 0.95 B/A[Molby] 0.03 0.03 0.07 C/A[Molby] 0.51 0.51 1.16 C/B[Molby] 16.50 16.50 17.33 <Properties value> Peel strength before UV irradiation [N/20 mm]: α 1.09 1.55 3.21 Peel strength after UV irradiation [N/20 mm]: β 0.08 0.09 0.08 Peel strength ratio (before UV irradiation/after UV irradiation) α/β 13.6 17.2 40.1 Maximum strength during edge peel test [N/10 mm] 0.18 0.17 0.18 <Evaluation test result> Pick up height [μm] 200 300 200 Below 400 μm is 〇 Chip breakage after pick-up test No rupture No rupture No rupture When the chip is broken, it is ×

[表9] 丙烯酸系聚合物之結構 單元 比較例1 比較例2 比較例3 比較例 4 比較例 5 比較例6 比較例7 比較例 8 INA單元[mol%]:A 90 90 90 90 35 35 35 35 HEA單元[mol%] 10 10 - - 65 65 - - 4HBA單元[mol%] - - 10 10 - - 65 65 含羥基之單元含有率[mol%]:B (5) (1) (5) (1) (32.5) (6.5) (32.5) (6.5) 含聚合性基之單元含有率[mol%]:C (5) (9) (5) (9) (32.5) (58.5) (32.5) (58.5) A/(B+C)[莫耳比] 9.00 9.00 9.00 9.00 0.54 0.54 0.54 0.54 B/(B+C)[莫耳比] 0.50 0.10 0.50 0.10 0.50 0.10 0.50 0.10 C/(B+C)[莫耳比] 0.50 0.90 0.50 0.90 0.50 0.90 0.50 0.90 B/A[莫耳比] 0.06 0.01 0.06 0.01 0.93 0.19 0.93 0.19 C/A[莫耳比] 0.06 0.10 0.06 0.10 0.93 1.67 0.93 1.67 C/B[莫耳比] 1.00 9.00 1.00 9.00 1.00 9.00 1.00 9.00 <物性值>                         UV照射前之剝離強度[N/20 mm]:α 0.37 0.38 0.30 0.31 2.34 2.43 2.30 2.40 UV照射後之剝離強度[N/20 mm]:β 0.27 0.22 0.25 0.21 0.12 0.11 0.11 0.11 剝離強度比(UV照射前/UV照射後)α/β 1.4 1.7 1.2 1.5 19.5 22.1 20.9 21.8 邊緣剝離試驗時之最大強度[N/10 mm] 0.28 0.23 0.26 0.22 0.62 0.68 0.60 0.66 <評價試驗結果>                         拾取高度[μm] 無法 剝離 無法 剝離 無法 剝離 無法 剝離 無法 剝離 無法 剝離 無法 剝離 無法 剝離 400 μm以下為〇 × × × × × × × × 拾取試驗後之晶片破裂 有破裂 有破裂 有破裂 有破裂 有破裂 有破裂 有破裂 有破裂 晶片破裂時為× × × × × × × × × [Table 9] Structural unit of acrylic polymer Comparative example 1 Comparative example 2 Comparative example 3 Comparative example 4 Comparative example 5 Comparative example 6 Comparative example 7 Comparative example 8 INA unit [mol%]: A 90 90 90 90 35 35 35 35 HEA unit [mol%] 10 10 - - 65 65 - - 4HBA unit [mol%] - - 10 10 - - 65 65 The content rate of hydroxyl-containing unit [mol%]: B (5) (1) (5) (1) (32.5) (6.5) (32.5) (6.5) The content rate of the unit containing polymerizable group [mol%]: C (5) (9) (5) (9) (32.5) (58.5) (32.5) (58.5) A/(B+C)[Molby] 9.00 9.00 9.00 9.00 0.54 0.54 0.54 0.54 B/(B+C)[Molby] 0.50 0.10 0.50 0.10 0.50 0.10 0.50 0.10 C/(B+C)[Molby] 0.50 0.90 0.50 0.90 0.50 0.90 0.50 0.90 B/A[Molby] 0.06 0.01 0.06 0.01 0.93 0.19 0.93 0.19 C/A[Molby] 0.06 0.10 0.06 0.10 0.93 1.67 0.93 1.67 C/B[Molby] 1.00 9.00 1.00 9.00 1.00 9.00 1.00 9.00 <Properties value> Peel strength before UV irradiation [N/20 mm]: α 0.37 0.38 0.30 0.31 2.34 2.43 2.30 2.40 Peel strength after UV irradiation [N/20 mm]: β 0.27 0.22 0.25 0.21 0.12 0.11 0.11 0.11 Peel strength ratio (before UV irradiation/after UV irradiation) α/β 1.4 1.7 1.2 1.5 19.5 22.1 20.9 21.8 Maximum strength during edge peel test [N/10 mm] 0.28 0.23 0.26 0.22 0.62 0.68 0.60 0.66 <Evaluation test result> Pick up height [μm] Can't peel off Can't peel off Can't peel off Can't peel off Can't peel off Can't peel off Can't peel off Can't peel off Below 400 μm is 〇 X X X X X X X X Chip breakage after pick-up test There is a rupture There is a rupture There is a rupture There is a rupture There is a rupture There is a rupture There is a rupture There is a rupture When the chip is broken, it is × X X X X X X X X

由上述之評價結果可知,實施例之切晶黏晶膜與比較例之切晶黏晶膜相比發揮了良好之拾取性。 [產業上之可利用性]From the above evaluation results, it can be seen that the dicing die attach film of the example exhibits better pick-up properties than the die dicing die attach film of the comparative example. [Industrial availability]

本發明之切晶帶及切晶黏晶膜適合用作例如製造半導體積體電路時之輔助用具。The dicing tape and the dicing die-bonding film of the present invention are suitable for use as an auxiliary tool when manufacturing semiconductor integrated circuits, for example.

1:切晶黏晶膜 10:黏晶層 20:切晶帶 21:基材層 22:黏著劑層 G:背面研磨帶 H:保持器 J:吸附治具 P:銷構件 R:切晶環 T:晶圓加工用帶 U:頂起構件1: slicing crystal sticking film 10: Sticky crystal layer 20: Cut crystal belt 21: Substrate layer 22: Adhesive layer G: Back grinding tape H: retainer J: Adsorption fixture P: Pin member R: Slicing ring T: Tape for wafer processing U: Jack up member

圖1係將本實施形態之切晶黏晶膜沿厚度方向切斷所得之剖視圖。 圖2A係模式性地表示半導體積體電路之製造方法中之半切割加工之情況之剖視圖。 圖2B係模式性地表示半導體積體電路之製造方法中之半切割加工之情況之剖視圖。 圖2C係模式性地表示半導體積體電路之製造方法中之半切割加工之情況之剖視圖。 圖2D係模式性地表示半導體積體電路之製造方法中之半切割加工之情況之剖視圖。 圖3A係模式性地表示半導體積體電路之製造方法中之安裝步驟之情況之剖視圖。 圖3B係模式性地表示半導體積體電路之製造方法中之安裝步驟之情況之剖視圖。 圖4A係模式性地表示半導體積體電路之製造方法中之低溫下之擴展步驟之情況之剖視圖。 圖4B係模式性地表示半導體積體電路之製造方法中之低溫下之擴展步驟之情況之剖視圖。 圖4C係模式性地表示半導體積體電路之製造方法中之低溫下之擴展步驟之情況之剖視圖。 圖5A係模式性地表示半導體積體電路之製造方法中之常溫下之擴展步驟之情況之剖視圖。 圖5B係模式性地表示半導體積體電路之製造方法中之常溫下之擴展步驟之情況之剖視圖。 圖6係模式性地表示半導體積體電路之製造方法中之拾取步驟之情況之剖視圖。Fig. 1 is a cross-sectional view of the diced die sticking film of the present embodiment cut along the thickness direction. FIG. 2A is a cross-sectional view schematically showing the half-cutting process in the manufacturing method of the semiconductor integrated circuit. FIG. 2B is a cross-sectional view schematically showing the half-cutting process in the manufacturing method of the semiconductor integrated circuit. FIG. 2C is a cross-sectional view schematically showing the half-cutting process in the manufacturing method of the semiconductor integrated circuit. FIG. 2D is a cross-sectional view schematically showing the half-cutting process in the manufacturing method of the semiconductor integrated circuit. FIG. 3A is a cross-sectional view schematically showing the state of the mounting step in the manufacturing method of the semiconductor integrated circuit. FIG. 3B is a cross-sectional view schematically showing the state of the mounting step in the manufacturing method of the semiconductor integrated circuit. 4A is a cross-sectional view schematically showing the expansion step at low temperature in the manufacturing method of the semiconductor integrated circuit. FIG. 4B is a cross-sectional view schematically showing the expansion step at a low temperature in the manufacturing method of the semiconductor integrated circuit. 4C is a cross-sectional view schematically showing the expansion step at a low temperature in the manufacturing method of the semiconductor integrated circuit. FIG. 5A is a cross-sectional view schematically showing an expansion step at room temperature in the manufacturing method of a semiconductor integrated circuit. FIG. 5B is a cross-sectional view schematically showing the expansion step at room temperature in the manufacturing method of the semiconductor integrated circuit. FIG. 6 is a cross-sectional view schematically showing the state of the pickup step in the manufacturing method of the semiconductor integrated circuit.

Claims (6)

一種切晶帶,其係具備基材層、及與該基材層重疊之黏著劑層者,且 上述黏著劑層包含丙烯酸系聚合物, 上述丙烯酸系聚合物包含(甲基)丙烯酸C9〜C11烷基酯之結構單元及含羥基之(甲基)丙烯酸酯之結構單元, 上述丙烯酸系聚合物包含上述(甲基)丙烯酸C9〜C11烷基酯之結構單元40 mol%以上且85 mol%以下。A dicing tape is provided with a substrate layer and an adhesive layer overlapping the substrate layer, and The above-mentioned adhesive layer contains an acrylic polymer, The above-mentioned acrylic polymer contains the structural unit of C9~C11 alkyl (meth)acrylate and the structural unit of hydroxyl-containing (meth)acrylate, The acrylic polymer contains the structural units of the C9~C11 alkyl (meth)acrylate at 40 mol% or more and 85 mol% or less. 如請求項1之切晶帶,其中上述丙烯酸系聚合物包含上述含羥基之(甲基)丙烯酸酯之結構單元1 mol%以上且30 mol%以下。The dicing tape of claim 1, wherein the acrylic polymer contains 1 mol% or more and 30 mol% or less of the structural unit of the hydroxyl-containing (meth)acrylate. 如請求項2之切晶帶,其中上述含羥基之(甲基)丙烯酸酯之結構單元為含羥基之(甲基)丙烯酸C2〜C4烷基酯之結構單元。Such as the dicing tape of claim 2, wherein the structural unit of the hydroxyl-containing (meth)acrylate is the structural unit of the hydroxyl-containing (meth)acrylate C2-C4 alkyl ester. 如請求項1至3中任一項之切晶帶,其中上述丙烯酸系聚合物進而具有含聚合性基之(甲基)丙烯酸酯之結構單元。The dicing tape according to any one of claims 1 to 3, wherein the acrylic polymer further has a structural unit of (meth)acrylate containing a polymerizable group. 如請求項4之切晶帶,其中上述丙烯酸系聚合物以莫耳比[C/(B+C)]計,相對於上述含羥基之(甲基)丙烯酸酯之結構單元(B)及上述含聚合性基之(甲基)丙烯酸酯之結構單元(C),包含上述含聚合性基之(甲基)丙烯酸酯之結構單元(C)0.50以上且0.95以下。The dicing tape of claim 4, wherein the acrylic polymer is calculated in molar ratio [C/(B+C)] relative to the structural unit (B) of the hydroxyl-containing (meth)acrylate and the polymer-containing The structural unit (C) of the (meth)acrylic acid ester of a sexual group includes the structural unit (C) of the above-mentioned polymerizable group-containing (meth)acrylic acid ester of 0.50 or more and 0.95 or less. 一種切晶黏晶膜,其具備如請求項1至5中任一項之切晶帶、及積層於該切晶帶之上述黏著劑層之黏晶層。A die-cutting die-bonding film is provided with a die-cutting tape according to any one of claims 1 to 5, and a die-cutting layer laminated on the above-mentioned adhesive layer of the die-cutting tape.
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