TW202009083A - Laser repair and inspection method for display device panel and repair and inspection apparatus suitable for the same - Google Patents
Laser repair and inspection method for display device panel and repair and inspection apparatus suitable for the same Download PDFInfo
- Publication number
- TW202009083A TW202009083A TW107141932A TW107141932A TW202009083A TW 202009083 A TW202009083 A TW 202009083A TW 107141932 A TW107141932 A TW 107141932A TW 107141932 A TW107141932 A TW 107141932A TW 202009083 A TW202009083 A TW 202009083A
- Authority
- TW
- Taiwan
- Prior art keywords
- panel
- laser
- repair
- light source
- light
- Prior art date
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/064—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
- B23K26/0648—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms comprising lenses
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
- B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/70—Auxiliary operations or equipment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/70—Auxiliary operations or equipment
- B23K26/702—Auxiliary equipment
- B23K26/707—Auxiliary equipment for monitoring laser beam transmission optics
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Laser Beam Processing (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
本發明涉及顯示面板的鐳射修復,更詳細地,涉及一種立即確認顯示面板的鐳射修復的結果,而能夠減少檢測負擔的鐳射修復及檢測方法和與其適宜的修復及檢測設備。 The present invention relates to laser repair of a display panel. More specifically, it relates to a laser repair and detection method and a repair and detection device suitable for the laser repair and detection method that can immediately confirm the results of the laser repair of the display panel and can reduce the detection burden.
鐳射加工是指將發生同步化程度較高的單一波長光線,並具有通過聚光鏡集光而獲得的高密度的能源的鐳射向被加工物的極小部分,以執行切斷(Cutting)、去除(Ablation)、蒸發、熔融等作業的加工方法。 Laser processing means that a single-wavelength light with a high degree of synchronization and a high-density energy obtained by collecting light from a condenser is directed to a very small part of the workpiece to perform cutting and removal (Ablation) ), processing methods for evaporation, melting and other operations.
用於此類鐳射加工的雷射光束,相對容易控制其形態或大小,因此,通過數位控制裝置進行控制,而適宜複雜的形狀的加工或精密加工。 The laser beam used for this type of laser processing is relatively easy to control its shape or size. Therefore, it is suitable for the processing of complex shapes or precision processing by the digital control device.
通常的鐳射加工裝置由生成鐳射的鐳射振盪器;將從所述鐳射振盪器發生的雷射光束向加工作業位置引導,並集束的光學單元;使得通過所述光學單元集束的雷射光束到達至被加工物的所需位置的位置控制器等構成。 A general laser processing device consists of a laser oscillator that generates a laser; an optical unit that guides the laser beam generated from the laser oscillator to a processing operation position and collects it; so that the laser beam bundled by the optical unit reaches to The position controller and the like of the desired position of the workpiece are constituted.
圖1概略表示以往的鐳射修復裝置的構成例的構成概念圖。 FIG. 1 schematically shows a configuration conceptual diagram of a configuration example of a conventional laser repair device.
從鐳射源10出發的鐳射通過縫隙20、第1光束分離器91、鏡筒透鏡40、第2光束分離器81、第3光束分離器51、物鏡60到達加工對象物即基板70的加工區域。 The laser beam from the
此時,縫隙是包括廣義的光罩的概念,作用是決定通過該縫隙到達基板加工區域的鐳射的大小和形狀。鏡筒透鏡40和物鏡60一同發揮作用,使得鐳射以所需的集束度到達基板70的加工區域,而進行基板加工。 At this time, the slit is a concept including a generalized photomask, and its role is to determine the size and shape of the laser beam that reaches the substrate processing area through the slit. The
影像光源53向第3光束分離器51照射光,使得從此反射的光通過物鏡60照射基板的加工區域。從加工區域反射、散射的光是影像光,攜帶加工區域的影像資訊逆向通過物鏡60,並逆向通過第3光束分離器51、第2光束分離器81、鏡筒透鏡40後,從第1光束分離器91反射向拍攝裝置93投射,而使得拍攝裝置能夠獲得關於加工區域的影像。 The
從而,在此類構成中,鏡筒透鏡40與物鏡60一同構成基板加工用鐳射到達至基板的路徑及基板加工區域的影像資訊向拍攝裝置傳送的路徑,並且,起到決定鐳射的集束度的作用和通過無限光學系統物鏡的影像光的成像及數次補正等作用。 Therefore, in such a configuration, the
並且,影像光的一部分從第2光束分離器81反射後向其側方的自動焦點感測器83投射,為了通過拍攝裝置93正確地確認在加工物件物的基板70的相應區域加工的圖案的加工過程和結果等,焦點感測器83根據確認通過鐳射在基板70的上面(表面)進行加工的圖案的物鏡60的各個倍率自動地對齊物鏡60的焦點。 In addition, part of the image light is reflected from the
具有如上述構成的鐳射修復裝置或鐳射加工裝置,因上述的便利性和精密加工性被廣泛應用於平面顯示器製造領域等。尤其,在包括 LCD或OLED的平面顯示器領域中為了圖元修復而廣泛使用。例如,不良圖元可分為輝點圖元和暗點圖元,而通常性允許的輝點圖元的基準相比暗點圖元的基準嚴格,因此,將輝點圖元暗點化而提高顯示面板的收益率。 The laser repair device or laser processing device configured as described above is widely used in the field of flat panel display manufacturing due to the above convenience and precision workability. In particular, it is widely used in the field of flat panel displays including LCD or OLED for the repair of picture elements. For example, bad primitives can be divided into bright-point primitives and dark-point primitives, and the benchmarks of normally-accepted bright-point primitives are stricter than those of dark-point primitives. Improve the profitability of the display panel.
作為上述的將輝點圖元暗點化的通常的方法,將鐳射向黑色矩陣照射而熔化黑色矩陣,並將熔化的黑色矩陣物質向異物質側引導,而將輝點圖元暗點化的方法和直接向透過光區域的濾色鏡,而使得濾色鏡的顏色變為黑色,將輝點圖元暗點化的方法。 As a general method of darkening the bright point primitives as described above, the black matrix is irradiated with laser light to melt the black matrix, and the melted black matrix material is guided to the foreign matter side, and the bright point primitives are darkened. The method and the method of directly passing the color filter through the light area, so that the color of the color filter becomes black, and the method of darkening the bright point primitive.
並且,在進行鐳射修復時,為了防止損傷面板的其他層或部位,並將能源集中在黑色矩陣或濾色鏡層等為暗點化的特定層,可利用偏光的性質和集束透鏡的焦點距離。 In addition, when performing laser repair, in order to prevent damage to other layers or parts of the panel, and to concentrate energy on a darkened specific layer such as a black matrix or a color filter layer, the nature of polarized light and the focal length of the focusing lens can be used.
例如,在韓國註冊專利第0981306號公開了'利用偏光的液晶顯示面板的修復方法'。其公開了一種利用在液晶顯示面板自身設置的偏光板,將圖元的不良部分暗點化的方式的修復加工方法。 For example, Patent No. 0981306 registered in Korea discloses a method of repairing a liquid crystal display panel using polarized light. It discloses a repairing method of using a polarizing plate provided on the liquid crystal display panel to darken the defective part of the picture element.
以往在完成面板後的主要生產線上通過點燈檢測檢測基板的不良時,如果檢測基板的不良,將該面板向鐳射修復裝置移動進行修復,並將其再次向主要生產線上移動,通過點燈檢測確認是否消除了面板的不良。此時,在較多情況下需要在進行修復後通過點燈檢測等再次檢測是否完全進行完整的修復,面板不良是否整體性地修復,尤其,對於不良的修復成功率降低時必須要進行再檢測。從而,將面板從修復加工裝置向檢測設備移動裝載,並根據需要從新設置等繁瑣和時間性、工藝效率性負擔較多。 In the past, when the defect of the substrate was detected by lighting on the main production line after the panel was completed, if the defect of the substrate was detected, the panel was moved to the laser repair device to repair, and it was moved to the main production line again, through the lighting detection Check whether the defect of the panel is eliminated. At this time, in many cases, it is necessary to re-check whether complete repair is complete through lighting detection after repair, and whether the panel defect is repaired as a whole, especially when the success rate of defective repair is reduced. . Therefore, the panel is moved and loaded from the repairing processing device to the detection equipment, and it is burdened with time-consuming and process-efficiency such as new installation as necessary.
為瞭解決上述的問題,開發了一種在主要生產線的點燈檢測 時如果發生不良,直接進行鐳射修復,並進行再檢測,或為了在鐳射修復裝置進行再檢測而結合工藝設備的技術。 In order to solve the above-mentioned problems, a technology has been developed to directly perform laser repair and re-test if a defect occurs during the lighting inspection of the main production line, or to combine process equipment for re-testing in the laser repair device.
圖2為概略性地表示說明能夠同時進行修復及再檢測的修復裝置中與圖1的修復裝置存在差異的部分的部分性構成概念圖。 FIG. 2 is a conceptual diagram schematically illustrating a partial configuration of a portion of a repair apparatus capable of performing repair and re-detection simultaneously with the repair apparatus of FIG. 1.
此時,再檢測時要再次進行點燈檢測,通過如圖1的影像光源的照明光下,還形成有在面板70下側(反面側)的可視光透射光源310,並且,從該透射光源將可視光線區域的光或白色光向面板整體照射。 At this time, when the re-detection is performed, the lighting detection is performed again. Under the illumination light of the image light source as shown in FIG. 1, a visible light
此時,進行修復前點燈檢測,問題圖元如果是時常使得光通過的強制發光圖元,使得整體圖元無法通過光而容易發現,但,修復後進行點燈檢測而照射影像光和透射光時,相應問題圖元未得到完全修復時也難以像以前一樣確切地區分。 At this time, before the repair lighting test, if the problem graphic element is a forced light-emitting graphic element that often allows light to pass, so that the entire graphic element cannot be easily found through the light, but after the repair, the lighting test is performed to illuminate the image light and transmission In light time, when the corresponding problem primitives are not completely repaired, it is difficult to distinguish exactly as before.
並且,此時為了點燈檢測向相應圖元的電極或液晶施加電壓或電流,由此,增加檢測中對液晶層和電極給予損傷的可能性。尤其,檢測的同時自動或手動地發現問題圖元而進行修復時,在點燈狀態下照射影像光和透射光並照射鐳射而對於相應圖元進行暗點化,在該過程中增加在液晶發生泡沫、材質變性可能性,從而,增加對於相應圖元或鄰接圖元產生新的問題點的可能性。 In addition, at this time, a voltage or current is applied to the electrode or liquid crystal of the corresponding picture element for lighting detection, thereby increasing the possibility of damage to the liquid crystal layer and the electrode during the detection. In particular, when a problematic picture element is found automatically or manually for repair at the time of detection, the image light and transmitted light are irradiated and laser light is irradiated under the lighting state to darken the corresponding picture element. In the process, the occurrence of liquid crystals increases. The possibility of foam or material denaturation increases the possibility of creating new problem points for the corresponding primitives or adjacent primitives.
最終,因上述問題而使得修復成功率及顯示面板的工藝收益率下降,因此,需要對其的適當的解決方案。 Eventually, due to the above problems, the repair success rate and the process yield of the display panel are reduced. Therefore, an appropriate solution to it is needed.
本發明關於上述的以往的利用鐳射的面板修復加工及再檢測方法,目的為提供一種減少需要進行再檢測的負擔,並且,在面板修復 加工時,即時地保持較高的正確度,而便於確認修復加工的成果的鐳射修復及檢測方法和與其適宜的裝置。 The present invention relates to the above-mentioned conventional panel repair processing and re-inspection method using laser, and aims to provide a reduction in the burden of re-inspection, and, during panel repair and processing, immediately maintains a high accuracy and facilitates confirmation Laser repair and detection method for repairing and processing achievements and suitable device.
本發明的目的為提供一種實質上同時進行對於修復加工及其結果的檢測,並且,在必要時還能夠進行修復再加工的鐳射修復及檢測方法和與其適宜的裝置。 The object of the present invention is to provide a laser repairing and detecting method and a device suitable for the repairing process and the results thereof, which can also perform repairing and reprocessing if necessary, at the same time.
本發明的技術方案在於:為了實現上述目的,本發明的鐳射修復及檢測方法,從利用以往的鐳射的面板修復裝置照射鐳射,並為了確認狀態在拍攝物件的面板區域的下部(反面側)設置照射相應區域而透過面板的紅外線透射光源,從而,在與用於修復的鐳射照射同時或在鐳射照射後,對於面板表面不照射影像光,從面板反面照射紫外線光,進行為檢測相應區域的拍攝,並在拍攝裝置確認其拍攝影像,確認相應區域的修復工藝的成功與否。 The technical solution of the present invention is that in order to achieve the above-mentioned object, the laser repair and detection method of the present invention irradiates laser from a panel repair device using a conventional laser, and is provided in the lower part (rear side) of the panel area of the photographed object to confirm the state The infrared transmission light source that illuminates the corresponding area and passes through the panel, so that at the same time or after laser irradiation for repair, the surface of the panel is not irradiated with image light, and the ultraviolet light is irradiated from the reverse side of the panel to perform shooting for detecting the corresponding area , And confirm the shooting image in the shooting device to confirm the success of the repair process in the corresponding area.
在本發明的方法中,確認成功與否後,如果未判斷成功時,對於相應區域再進行鐳射照射,並附加照射紫外線光進行再檢測的過程。 In the method of the present invention, after the success or failure is confirmed, if the judgment is not successful, the corresponding area is irradiated with laser light, and a process of re-detection is irradiated with ultraviolet light.
本發明的方法中,可使用如下方法:為修復的鐳射照射和紫外線光照射可同時進行,並且,為了再檢測紫外線光照射進行更加充分的時間,或紫外線光與鐳射照射無關地連續地將紅外線透射光源點燈。 In the method of the present invention, the following method can be used: the laser irradiation and ultraviolet irradiation for repair can be performed simultaneously, and the irradiation of ultraviolet light can be performed for a sufficient time for re-detection, or the ultraviolet light can continuously irradiate infrared rays independently of the laser irradiation. Transmitted light source lights up.
本發明的方法可通過原位方法進行為對於附著有偏光膜的面板整體的點燈檢測和對於點燈檢測中確認的問題圖元的鐳射修復和只有在為確認修復結果的紅外線透射光的環境下進行的非點燈檢測。 The method of the present invention can be performed by the in-situ method for the lighting inspection of the entire panel to which the polarizing film is attached and for the laser repair of the problem element confirmed in the lighting inspection and only in the environment of infrared transmitted light to confirm the repair result Non-lighting detection conducted under
本發明的方法中,將不良圖元暗點化的步驟是通過附著在面板的表面側的偏光膜和物鏡系的焦點距離的調整,而使得鐳射的能源集中 在面板的濾色鏡層。 In the method of the present invention, the step of darkening a bad pixel is to adjust the focal distance of the polarizing film attached to the surface side of the panel and the objective lens system, so that the laser energy is concentrated in the color filter layer of the panel.
本發明的裝置除了通常的修復裝置之外形成有作為從面板的反面側照射面板的透射光源的紅外線透射光源。 The device of the present invention is formed with an infrared transmission light source as a transmission light source that illuminates the panel from the reverse side of the panel in addition to the normal repair device.
本發明的拍攝裝置,整體上觀察時為能夠以充分的感度識別紫外線光,並且,從紅外線透射光源至相機等拍攝裝置的路徑上未形成有紅外線濾鏡或過濾物質,或能夠代替。 The imaging device of the present invention can recognize ultraviolet light with sufficient sensitivity when viewed as a whole, and an infrared filter or a filter substance is not formed on the path from the infrared transmission light source to the imaging device such as a camera or can be replaced.
本發明裝置形成有至少一個能夠即時地顯示相應區域或自動分析的顯示裝置或分析裝置,優選地,該顯示裝置或分析裝置即時地運行。 The device of the present invention is formed with at least one display device or analysis device capable of displaying the corresponding area or automatic analysis in real time. Preferably, the display device or analysis device operates in real time.
10,110‧‧‧鐳射光源 10,110‧‧‧Laser light source
20,120‧‧‧縫隙 20,120‧‧‧ gap
40‧‧‧鏡筒透鏡 40‧‧‧tube lens
51,81,91,127,151,281‧‧‧光束分離器 51,81,91,127,151,281‧‧‧‧beam splitter
53,153‧‧‧照明光源(影像光源) 53,153‧‧‧Light source (image light source)
60,160‧‧‧物鏡(物鏡系) 60,160‧‧‧objective lens (objective lens system)
70,170‧‧‧面板 70,170‧‧‧Panel
83‧‧‧自動焦點感測器 83‧‧‧Auto focus sensor
93,193‧‧‧拍攝裝置 93,193‧‧‧ shooting device
125‧‧‧反射鏡 125‧‧‧Reflecting mirror
140‧‧‧第1鏡筒透鏡 140‧‧‧The first lens barrel lens
240‧‧‧第2鏡筒透鏡 240‧‧‧The second lens barrel lens
310‧‧‧可視光透射光源 310‧‧‧Visible light transmission light source
330‧‧‧紅外線透射光源 330‧‧‧Infrared transmission light source
以下,參照附圖通過本發明的實施例更詳細地說明本發明。 Hereinafter, the present invention will be described in more detail through embodiments of the present invention with reference to the drawings.
圖1為表示通常的鐳射修復裝置的構成的構成概念圖;圖2為在以往的鐳射修復及再檢測設備的構成中,概略圖示與圖1進行比較的部分的構成的構成概念圖;圖3為概略性地表示適宜本發明的鐳射修復及檢測設備的構成的構成概念圖;圖4為表示本發明的鐳射修復及檢測方法的一實施例的流程圖;圖5為將拍攝根據以往的再檢測方法照射影像光和可視透射光的狀態下的問題圖元部分的面板表面側的照片與根據本發明的鐳射修復檢測方法進行鐳射修復後從後方(反面側)向面板照射紫外線光的狀態下拍攝問題圖元部分的面板表面側的比較相片。 FIG. 1 is a conceptual diagram showing the configuration of a general laser repair device; FIG. 2 is a conceptual diagram showing the configuration of a part compared with FIG. 1 in the configuration of a conventional laser repair and re-inspection device; 3 is a conceptual diagram schematically showing the configuration of the laser repair and detection device suitable for the present invention; FIG. 4 is a flowchart showing an embodiment of the laser repair and detection method of the present invention; FIG. 5 is a photograph based on the conventional Re-detection method The problem is that when the image light and visible transmitted light are irradiated, the photo of the panel surface side of the picture element part and the state of the ultraviolet light from the rear (back side) to the panel after laser repair according to the laser repair detection method of the present invention Next, take a comparison photo of the panel surface side of the problem primitive.
以下,參照附圖通過本發明的實施例更詳細地說明本發明。 Hereinafter, the present invention will be described in more detail through embodiments of the present invention with reference to the drawings.
圖3為概略表示適宜實施本發明的方法的鐳射修復加工及檢測設備的構成概念圖。 FIG. 3 is a conceptual diagram schematically showing the configuration of a laser repair processing and detection device suitable for implementing the method of the present invention.
根據本實施例的鐳射修復加工及檢測設備(以下簡稱為裝置),包括:鐳射源110,放射鐳射;縫隙120,使得鐳射通過,並調整鐳射的大小和形態;第1鏡筒透鏡140,將通過縫隙的鐳射進行一次性調整;物鏡系160,接收通過第1鏡筒透鏡的光並使其通過,將集束度進行二次性調整,向加工物件物即面板照射,並使得加工物件物的影像光向逆方向通過,而調整影像光的集束度;照明光源(影像光源:153),放射通過物鏡系照射加工對象物即顯示面板的照明光;拍攝裝置193,接收通過第2鏡筒透鏡240,接收通過第2鏡筒透鏡的影像光,獲取加工物件物的影像。 The laser repairing and testing equipment (hereinafter referred to as a device) according to this embodiment includes: a
在此,鐳射源110是包括所有鐳射振盪器和快門等對於鐳射放射所需的部件要素的概念。 Here, the
縫隙120是包括形成使得鐳射通過的縫隙而決定鐳射的大小的部分和決定鐳射的形態的圖案掩膜的廣義的概念,通過其限定通過的鐳射的大小和形態。 The
在此,通過縫隙的雷射光束向反射鏡125反射,而更換路徑向第1鏡筒透鏡140投射。第1鏡筒透鏡140通常使用焦點距離為200mm的。在縫隙120的光路徑上的前端可形成有向縫隙120提供照明的縫隙照明120a。 Here, the laser beam passing through the slit is reflected toward the
通過第1鏡筒透鏡的雷射光束在此從光束分離器127反射,通過物鏡系160再次集束,而向顯示面板的既定位置照射。由此,能夠將濾色 鏡的相應圖元的色彩層物質黑化。 The laser beam that has passed through the first barrel lens is reflected from the
並且,從照明光源153放射照明光,通過光學系從光束分離器151反射,透射光束分離器127通過物鏡系160向通過鐳射被修復的顯示面板170,並反射散射,而生成具有關於加工區域的加工狀態的影像資訊的影像光。 Then, the illumination light is radiated from the
上述影像光從逆方向通過物鏡系160被集束,通過光束分離器127,151向第2鏡筒透鏡240。 The image light is condensed through the
第2鏡筒透鏡使得投射的影像光通過,調整影像光而向拍攝裝置193投射。由此,拍攝裝置能夠獲取焦點準確適宜的影像。拍攝裝置通過與其連接的電腦和顯示器顯示影像,通過顯示的影像能夠確認鐳射修復工藝中的相應區域的加工狀態。 The second barrel lens passes the projected image light, adjusts the image light, and projects it to the imaging device 193. As a result, the imaging device can acquire an image with an accurate focus. The shooting device displays images through the computer and monitor connected to it, and the displayed images can confirm the processing status of the corresponding area in the laser repair process.
在第2鏡筒透鏡與拍攝裝置之間可設置濾光器197或偏振濾色鏡195,而在光量過多時,減少光量,或以適合於拍攝裝置的波長範圍的影像進行限制。 A
並且,在此與圖2的以往的情況不同地,在顯示面板反面側下部)與可視光透射光源310一同設置有紅外線透射光源330。紅外線透射光源330與發生可視透射光的可視光透射光源310一同設置,而根據需要只照射可視透射光,或只照射紅外線透射光,或兩個透射光都照射。透射光源可為只照射面板的部分區域,但,在此,使用整體性照射面板的透射光源。 In addition, unlike the conventional case of FIG. 2, an infrared
並且,當照射紅外線透射光時,影像光及鐳射可不照射面板表面。 Moreover, when the infrared transmission light is irradiated, the image light and laser light may not illuminate the panel surface.
並且,在上述的裝置構成中,為了照射紅外線透射光時在面 板表面明確確認修復結果,理所當然地在透射光透射面板的狀態下要防止從基板表面側至拍攝裝置阻擋紫外線光或嚴重地惡化的問題。 In addition, in the above-mentioned device configuration, in order to clearly confirm the repair result on the panel surface when irradiating infrared transmitted light, it is a matter of course to prevent ultraviolet light from being blocked or seriously deteriorated from the substrate surface side to the imaging device in the state where the transmitted light transmits the panel problem.
為此,該路徑上的各個光學要素要更換設置能夠使得沒有排除紅外線的過濾功能層,或使得位置可變而在必要時在路徑上可去除,或能夠代替其,對於紅外線照明特殊化,而尤其使得紅外線較好地通過,使其執行相應功能的光學要素。例如,在篩檢程式中沒有紅外線濾鏡,形成拍攝裝置的鏡頭中附屬的鏡片鍍膜或篩檢程式也沒有紅外線濾鏡,光束分離器也要未形成有紅外線過濾鍍膜或該成分混合在主體成分中。 For this reason, each optical element on the path should be replaced with a filter function layer that does not exclude infrared rays, or the position can be changed to be removed on the path when necessary, or it can be replaced, which is special for infrared lighting, and In particular, the optical elements that allow infrared rays to pass through better to make them perform corresponding functions. For example, there is no infrared filter in the screening program, the lens coating attached to the lens forming the shooting device or the screening program also has no infrared filter, and the beam splitter should not have an infrared filter coating or the component mixed in the main component in.
並且,雖然在圖3中未明確地圖示,在影像光路徑上通常形成有自動焦點調節裝置,優選地,在該自動焦點調節裝置中還要能夠容易地識別和驅動通過透射光的紅外線影像。 Also, although not explicitly shown in FIG. 3, an automatic focus adjustment device is usually formed on the image light path, and preferably, the automatic focus adjustment device must also be able to easily recognize and drive infrared images passing through the transmitted light .
並且,本發明考慮到與鐳射修復一同執行,在光學系的整體性構成中,通過鐳射執行修復作業時,要最大限度地防止鐳射對於紅外線透射光源或面板內的其他層結構、裝置內的光學要素產生影響。 In addition, the present invention is considered to be performed together with laser repair. In the overall structure of the optical system, when performing the repair operation by laser, it is necessary to prevent the laser from affecting the infrared transmission light source or other layer structures in the panel and the optics in the device to the greatest extent. Factors have an impact.
在上述的構成的鐳射修復及檢測設備中進行的一系列的工藝,可通過圖4的流程圖以簡單的形態進行整理。 A series of processes performed in the laser repair and inspection equipment of the above-mentioned configuration can be organized in a simple manner by the flowchart of FIG. 4.
修復及檢測設備設置在首先完成製造顯示面板後進行點燈檢測的路徑上(參照圖3)。通過以前步驟附著有表面偏光膜的狀態的完成的顯示面板向該裝置投入裝載。 The repair and inspection equipment is installed on the path of lighting inspection after the display panel is first manufactured (refer to FIG. 3). The completed display panel with the surface polarizing film attached in the previous step is loaded into the device.
首先,進行對於面板的整體性點燈檢測(S10)。在進行該檢測時,從面板反面側的可視光透射光源310照射可視光或白色光,從面板表面側照射影像光,而使得從面板表面側看到的影像傳送至拍攝裝置。 First, the overall lighting detection of the panel is performed (S10). When performing this detection, visible light or white light is irradiated from the visible light
此時,在所有圖元無法通過光地施加電壓時,整體畫面呈現黑色,但,在不良圖元上,光依然通過而能夠明確地識別。從而,通過該過程能夠識別強制發光不良圖元。通過該影像的識別通過肉眼進行,或通過影像處理以自動影像分析方法進行(S20)。 At this time, when the voltage cannot be applied to all the picture elements by light, the overall screen appears black, but the defective picture element still passes light and can be clearly recognized. Therefore, this process enables the identification of poorly illuminated primitives. Recognition of the image is performed by the naked eye, or by image processing using an automatic image analysis method (S20).
該裝置上設置有鐳射修復裝置,因此,即使感知不良也不移動面板,而以原位(in situ)方式驅動鐳射修復裝置,而將不良圖元暗點化、黑化(S30)。 Since the device is provided with a laser repair device, the panel is not moved even if it is sensed poorly, and the laser repair device is driven in situ to darken and blacken the defective pixels (S30).
即,確認此類不良圖元的位置,並向各個該位置照射鐳射,使得在該位置的形成濾色鏡層的位置方式熱變性。此時,優選地,通過物鏡等在濾色鏡層提高鐳射的集束度,提高鐳射的加工效率,並利用偏振濾色鏡及偏光的性質最大限度地防止對於面板的其他構成要素的熱化。 That is, the position of such a defective picture element is confirmed, and laser light is irradiated to each of the positions, so that the position manner in which the color filter layer is formed at the position is thermally denatured. In this case, it is preferable to increase the laser beam concentration in the color filter layer by an objective lens or the like, to improve the processing efficiency of the laser, and to use the properties of the polarizing filter and polarized light to prevent the heating of other components of the panel to the greatest extent.
通常該物質形成熱變性的黑色的非透明層,而使得光無法通過,但,鐳射修復未正確進行時,發現部分漏光現象。 Usually the substance forms a black non-transparent layer that is thermally denatured, making it impossible for light to pass through. However, when laser repair is not performed correctly, some light leakage is found.
此類問題可在下一步驟的對於鐳射修復的結果檢測步驟發現。在結果檢測中與最初的檢測步驟不同地,作為透射光源只使用紅外線透射光源,以在表面側沒有影像光(照明光)照射的狀態,進行未開封檢測。從而,在面板未接通電負荷,而在各個圖元通過液晶層使得紅外線透射光源的光透過(S40)。 Such problems can be found in the next step of the laser repair result detection step. In the result detection, unlike the initial detection step, only an infrared transmission light source is used as the transmission light source, and unopened detection is performed in a state where no image light (illumination light) is irradiated on the surface side. Therefore, the electric load is not turned on at the panel, but the light passing through the infrared light transmission source is transmitted through the liquid crystal layer in each picture element (S40).
紫外線光在正常的圖元通過濾色鏡物質層,在較好地感知紅外線的拍攝裝置中識別的影像中顯示較亮的形態,而在通過鐳射修復進行暗點化處理的圖元中無法通過熱變性的層,呈現較暗,從而,使得正常區域和不良圖元區域的差異比較鮮明地呈現。 Ultraviolet light passes through the material layer of the color filter in the normal picture element, and shows a brighter shape in the image recognized by the camera device that can better sense infrared rays, but cannot pass the thermal denaturation in the picture element darkened by laser repair The layer is darker, so that the difference between the normal area and the bad primitive area is more clearly presented.
上述的情況可通過圖5的a及b的比較照片進行確認。圖5的a為比較例,b為本實施例。並且,圖5的a的照片是進行以往的修復之後進行再檢測時照射可視透射光,依然照射表面側影像光,在該狀態下,問題圖元和正常圖元之間未明確呈現亮度的差異。 The above situation can be confirmed by comparing the photographs of a and b in FIG. 5. 5 a is a comparative example, and b is this example. In addition, the photo of a in FIG. 5 is that when the conventional repair is performed and re-detection is performed, the visible transmitted light is irradiated, and the surface-side image light is still irradiated. In this state, the difference between the brightness of the problem picture element and the normal picture element does not clearly appear .
通過如上述的本發明的方法,通過鐳射修復的圖元暗點化加工之後,不進行點燈檢測,因此,能夠防止在修復後為了點燈檢測向相應的圖元的電極或液晶施加電壓或電流,而使得液晶層和電極在檢測中受到損傷的問題,並且,能夠防止鐳射修復過程中也為了後續的修復後點燈檢測,而繼續點燈的情況下發生的問題。 According to the method of the present invention as described above, lighting detection is not performed after the darkening process of the pixel repaired by laser, therefore, it is possible to prevent the application of voltage or the voltage or the voltage to the electrode or liquid crystal of the corresponding pixel for lighting detection after repair The current causes the liquid crystal layer and the electrode to be damaged during the detection, and can prevent the problem that occurs when the lighting is continued during the laser repair process for the subsequent lighting test after the repair.
根據如上述的本發明的方法,能夠在原位進行面板點燈檢測、鐳射修復加工、修復後檢測,從而,能夠減少工序負擔,並且,利用紅外線透射光源能夠準確地確認通過修復加工是否對於問題圖元進行充分的暗點化處理,需要時還可進行附加修復,而提高整體性修復成功率,最終能夠提高面板收益率。 According to the method of the present invention as described above, it is possible to perform panel lighting detection, laser repair processing, and post-repair detection in situ, thereby reducing process burden, and using an infrared transmission light source to accurately confirm whether repair processing is a problem The primitives are fully darkened, and additional repairs can be performed when needed, and the overall repair success rate can be improved to ultimately increase the panel profitability.
以上通過限定的實施例說明瞭本發明,但,其只是為了有助於理解本發明而示例性地說明,本說明並非限定於以上特定的實施例。即,本發明的技術領域的普通技術人員能夠基於本發明進行各種變更或實施應用例,並且,此類變形例或應用例均屬於參附的權利要求範圍。 The present invention has been described above through limited embodiments, but it is only exemplified to help understand the present invention, and this description is not limited to the above specific embodiments. That is, a person of ordinary skill in the technical field of the present invention can make various changes or implement application examples based on the present invention, and such modifications or application examples all fall within the scope of the appended claims.
本發明的有益效果在於:根據本發明,在對於面板進行鐳射修復加工時,減少對其成果的再檢測負擔,能夠立即以較高的準確度容易地確認對於修復加工的成果,從而,提高鐳射修復加工的有效性及活用度,並且,能夠宏觀地提高LCD或OLED等顯示面板的製造收益率。 The beneficial effects of the present invention are: according to the present invention, when performing laser repair processing on a panel, the burden of re-detecting its results is reduced, and the results of the repair processing can be easily confirmed immediately with high accuracy, thereby improving the laser The effectiveness and utilization of the repair process, and can macroscopically increase the manufacturing yield of LCD or OLED display panels.
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020180094853A KR20200019386A (en) | 2018-08-14 | 2018-08-14 | Laser processing apparatus |
KR10-2018-0094853 | 2018-08-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW202009083A true TW202009083A (en) | 2020-03-01 |
TWI774885B TWI774885B (en) | 2022-08-21 |
Family
ID=69525480
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW107137026A TW202009081A (en) | 2018-08-14 | 2018-10-19 | Laser processing apparatus |
TW107141932A TWI774885B (en) | 2018-08-14 | 2018-11-23 | Laser repair and inspection method for display device panel and repair and inspection apparatus suitable for the same |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW107137026A TW202009081A (en) | 2018-08-14 | 2018-10-19 | Laser processing apparatus |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR20200019386A (en) |
TW (2) | TW202009081A (en) |
WO (1) | WO2020036250A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102420993B1 (en) * | 2020-06-30 | 2022-07-15 | 참엔지니어링(주) | Repair apparatus |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4094731B2 (en) * | 1998-07-24 | 2008-06-04 | 浜松ホトニクス株式会社 | Pixel defect correcting method and pixel defect correcting apparatus for liquid crystal panel |
JP2008119716A (en) * | 2006-11-10 | 2008-05-29 | Marubun Corp | Laser beam machining apparatus, and focus maintaining method therein |
KR100981306B1 (en) * | 2008-12-02 | 2010-09-10 | 참엔지니어링(주) | Method for repairing liquid crystal display panel using polarized light |
KR101129262B1 (en) * | 2010-04-21 | 2012-03-26 | 주식회사 코윈디에스티 | Optical system for laser repair apparatus |
KR20120055369A (en) * | 2010-11-23 | 2012-05-31 | 참엔지니어링(주) | Method and apparatus for repairing liquid crystal display panel |
KR101380148B1 (en) | 2012-08-31 | 2014-04-02 | (주)뮤텍코리아 | structure for regulation of processing position of laser using condensing lens |
KR101520416B1 (en) * | 2013-09-16 | 2015-05-15 | 한국기계연구원 | Laser measuring and processing device, and driving method thereof |
KR101582455B1 (en) * | 2014-04-18 | 2016-01-07 | 한국기계연구원 | Multi modal laser machining system |
KR101939876B1 (en) * | 2016-03-25 | 2019-01-17 | 주식회사 코윈디에스티 | Raser repair device |
-
2018
- 2018-08-14 KR KR1020180094853A patent/KR20200019386A/en active Application Filing
- 2018-09-06 WO PCT/KR2018/010403 patent/WO2020036250A1/en active Application Filing
- 2018-10-19 TW TW107137026A patent/TW202009081A/en unknown
- 2018-11-23 TW TW107141932A patent/TWI774885B/en active
Also Published As
Publication number | Publication date |
---|---|
TW202009081A (en) | 2020-03-01 |
KR20200019386A (en) | 2020-02-24 |
WO2020036250A1 (en) | 2020-02-20 |
TWI774885B (en) | 2022-08-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2010024082A1 (en) | Defect inspecting system, and defect inspecting method | |
JP2007241274A5 (en) | ||
KR20070092430A (en) | Apparatus for reparing pixel of display device | |
US9513499B2 (en) | Laser repairing apparatus | |
TWI567374B (en) | Defect observation device and laser processing apparatus including the same | |
JP7173641B2 (en) | LASER REPAIR AND INSPECTION METHOD FOR DISPLAY DEVICE PANEL AND REPAIR AND INSPECTION APPARATUS SUITABLE FOR THE SAME | |
KR102250626B1 (en) | Intraocular lens inspection | |
JP2010139461A (en) | Visual inspection system | |
JPH07307599A (en) | Inspection device and product manufacture | |
TWI553981B (en) | Laser processing apparatus and method | |
JP2008068284A (en) | Apparatus and method for correcting defect, and method for manufacturing pattern substrate | |
TW202009083A (en) | Laser repair and inspection method for display device panel and repair and inspection apparatus suitable for the same | |
KR20110137460A (en) | Laser repairing device and the repairign mathod thereof | |
JP6327735B2 (en) | Bright spot defect removal method and apparatus for liquid crystal display panel | |
KR101643326B1 (en) | Apparatus and method for detecting defect of lcd panel | |
JP3768029B2 (en) | Pattern defect repair device | |
JP2014077685A (en) | Device and method for detecting pattern defects | |
KR101153246B1 (en) | Substrate inspection method | |
JP5077887B2 (en) | Color filter defect correcting method and color filter defect correcting apparatus | |
CN113966527B (en) | Laser repairing method and laser repairing device | |
CN105911725A (en) | Display panel repairing device | |
KR101032090B1 (en) | Substrate inspection method | |
JP3759363B2 (en) | Inspection repair method and inspection repair device for reflective liquid crystal display device | |
KR20200052785A (en) | Repair system and repair method of display panel | |
JPH08114792A (en) | Optical device for correcting defect, defect corrector and defective part positioning method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent |