TW201944473A - Holder unit having a plurality of highly abrasion-resistant particles on the peripheral surface of the scribing wheel - Google Patents

Holder unit having a plurality of highly abrasion-resistant particles on the peripheral surface of the scribing wheel Download PDF

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Publication number
TW201944473A
TW201944473A TW108112885A TW108112885A TW201944473A TW 201944473 A TW201944473 A TW 201944473A TW 108112885 A TW108112885 A TW 108112885A TW 108112885 A TW108112885 A TW 108112885A TW 201944473 A TW201944473 A TW 201944473A
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Taiwan
Prior art keywords
wheel
pin
peripheral surface
holder unit
scoring
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TW108112885A
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Chinese (zh)
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小笠原規幸
平栗陽輔
椙山敦
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日商三星鑽石工業股份有限公司
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Publication of TW201944473A publication Critical patent/TW201944473A/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D1/00Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor
    • B28D1/22Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising
    • B28D1/225Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising for scoring or breaking, e.g. tiles
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • B24B37/32Retaining rings
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/34Accessories
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0005Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
    • B28D5/0011Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing with preliminary treatment, e.g. weakening by scoring
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B33/00Severing cooled glass
    • C03B33/02Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
    • C03B33/023Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor the sheet or ribbon being in a horizontal position
    • C03B33/033Apparatus for opening score lines in glass sheets
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B33/00Severing cooled glass
    • C03B33/10Glass-cutting tools, e.g. scoring tools

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Mining & Mineral Resources (AREA)
  • Processing Of Stones Or Stones Resemblance Materials (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)

Abstract

The holder unit of the present invention improves the quality of the workpiece to be scribed. The holder unit 100 includes: a holder 110, a pin 200 supported by the holder 110, and a scribing wheel 120 supported by the pin 200. The scribing wheel 120 has a second insertion hole 121 into which the pin 200 is inserted. The in-wheel peripheral surface 122 of the scribing wheel 120 defining the second insertion hole 121 is made of a highly abrasion-resistant material. The arithmetic average roughness Ra of the in-wheel peripheral surface 122 is 0.01 [mu]m or less. The pin 200 includes a pin body and a protective layer 220 for protecting the outer surface of the pin body. The protective layer 220 contains a plurality of highly abrasion-resistant particles having high abrasion resistance to the in-wheel peripheral surface 122.

Description

保持具單元Holder unit

本發明係關於一種用於刻劃加工之保持具單元。The present invention relates to a holder unit for scoring.

將刻劃裝置用於對脆性材料基板等被加工物形成刻劃線。刻劃裝置具備保持具單元。保持具單元具備將被加工物進行刻劃加工之刻劃輪。刻劃加工中,於刻劃輪按壓於被加工物之表面之狀態下,被加工物與刻劃輪相對移動,於被加工物上形成刻劃線。此外,作為先前之刻劃裝置之一例,可列舉專利文獻1。
[先前技術文獻]
[專利文獻]
The scoring device is used to form a score line for a workpiece such as a brittle material substrate. The scoring device includes a holder unit. The holder unit includes a scoring wheel for scoring the workpiece. In the scoring process, when the scoring wheel is pressed against the surface of the workpiece, the workpiece and the scoring wheel move relatively to form a scribe line on the workpiece. Further, as an example of a prior scoring device, Patent Document 1 can be cited.
[Prior technical literature]
[Patent Literature]

[專利文獻1]日本專利特開2017-119348號公報[Patent Document 1] Japanese Patent Laid-Open No. 2017-119348

[發明所欲解決之問題][Problems to be solved by the invention]

於使用現有之刻劃裝置,將被加工物進行刻劃加工之情形時,與隨著刻劃線之形成而於被加工物上產生的被加工物之厚度方向之裂紋即垂直裂紋之形成狀態有關之品質下降。作為品質低之情形之例,可列舉裂紋之深度於刻劃線之每個部位不同之形成狀態。認為此與刻劃加工時之刻劃輪之旋轉不穩定有關。
[解決問題之手段]
When using the existing scoring device to scribe the workpiece, the cracks in the thickness direction of the workpiece, which are generated along with the scribe line formation, are the vertical cracks. The related quality is degraded. As an example of the case where the quality is low, a crack formation depth is different from the formation state of each part of the scribe line. It is considered that this is related to the unstable rotation of the scribe wheel during the scribe process.
[Means for solving problems]

(1)本發明之保持具單元具備:保持具、被支承於上述保持具上之銷、以及被支承於上述銷上之刻劃輪;上述刻劃輪包含上述銷所插入之插入孔,規定上述插入孔之上述刻劃輪之內周面係由高耐磨損材料所形成,算術平均粗糙度Ra為0.01 μm以下,上述銷包含銷本體以及保護上述銷本體之外周面之保護層,上述保護層包含對上述內周面之耐磨損性高之多數個高耐磨損粒子。(1) The holder unit of the present invention includes a holder, a pin supported on the holder, and a scoring wheel supported on the pin; the scoring wheel includes an insertion hole into which the pin is inserted, and provides The inner peripheral surface of the scoring wheel of the insertion hole is formed of a highly wear-resistant material, and the arithmetic average roughness Ra is 0.01 μm or less. The pin includes a pin body and a protective layer for protecting the outer peripheral surface of the pin body. The protective layer includes a plurality of highly abrasion-resistant particles having high abrasion resistance to the inner peripheral surface.

刻劃加工時之刻劃輪之旋轉狀態對隨著刻劃加工而形成於被加工物上之裂紋之形成狀態造成影響。作為用以提高經刻劃加工之被加工物之品質之方法之一,可列舉使刻劃加工時之刻劃輪之旋轉穩定之方法。所謂刻劃輪之旋轉穩定之狀態,係指例如刻劃輪之旋轉阻抗不變動之狀態、或者旋轉阻抗之變動幅度微小之狀態。於刻劃輪之內周面與銷之外周面之接觸部分所產生之阻抗對刻劃輪之旋轉狀態造成影響。認為該阻抗越小,刻劃輪之旋轉狀態越穩定,經刻劃加工之被加工物之品質越提高。The rotation state of the scoring wheel during the scoring process affects the formation state of the cracks formed on the workpiece with the scoring process. As one of the methods for improving the quality of the scribed object, a method of stabilizing the rotation of the scribe wheel during the scribe process can be cited. The state in which the rotation of the scribing wheel is stable refers to, for example, a state in which the rotation impedance of the scribing wheel does not change, or a state in which the fluctuation range of the rotation impedance is small. The impedance generated at the contact portion between the inner peripheral surface of the scribe wheel and the outer peripheral surface of the pin affects the rotation state of the scribe wheel. It is considered that the smaller the impedance, the more stable the rotation state of the scribe wheel, and the higher the quality of the object to be processed after the scribe process.

作為減小上述接觸部分所產生之阻抗之方法,例如可列舉:減小刻劃輪之內周面(以下稱為「輪內周面」)及銷之外周面(以下稱為「銷外周面」)之各自之表面粗糙度之方法。本案發明者對使用依據該方法之保持具單元(以下稱為「基準保持具單元」)來進行刻劃加工之被加工物之品質進行觀察。基準保持具單元之具體構成如下所述。刻劃輪及銷分別為金剛石燒結體。為使輪內周面之表面粗糙度以及銷外周面之表面粗糙度充分減小,而對各自之面實施研磨加工。對於輪內周面,為使表面粗糙度進而減小而實施鏡面加工。As a method of reducing the impedance generated by the above-mentioned contact portion, for example, reducing the inner peripheral surface of the scoring wheel (hereinafter referred to as "wheel inner peripheral surface") and the outer surface of the pin (hereinafter referred to as "pin outer peripheral surface" ”) 'S respective methods of surface roughness. The inventor of this case observed the quality of the to-be-processed object using the holder unit based on this method (henceforth a "reference holder unit"). The specific structure of the reference holder unit is as follows. The scoring wheel and pin are diamond sintered bodies, respectively. In order to sufficiently reduce the surface roughness of the inner peripheral surface of the wheel and the surface roughness of the outer peripheral surface of the pin, the respective surfaces are polished. The inner peripheral surface of the wheel is mirror-finished in order to further reduce the surface roughness.

將被加工物以各種加工條件進行刻劃加工之結果為,確認了實際之被加工物之品質存在對輪內周面及銷外周面之表面粗糙度之較小之程度所期待之品質差之情形。具體而言,於刻劃輪相對於被加工物之行走距離超過一定之行走距離之狀態下,存在伴有向與被加工物之厚度方向不同之方向延伸之微小龜裂之刻劃線形成於被加工物上之情形。該龜裂稱為水平裂紋。於被加工物中產生水平裂紋之部分,存在被加工物之表面剝離之情形。被加工物之表面剝離之狀態稱為纖維。於刻劃輪相對於被加工物之行走距離超過一定之行走距離之狀態下,進而亦發現形成於被加工物上之垂直裂紋之進展不充分之例子。於該被加工物沿著刻劃線而分斷之情形時,存在經分斷之部分之品質下降之情況。即便對輪內周面與銷外周面之接觸部分之阻抗造成大幅度影響之表面粗糙度小,被加工物之品質亦下降之原因例如考慮如下。As a result of scoring the workpiece under various processing conditions, it was confirmed that the quality of the actual workpiece had poor quality expected from the smaller surface roughness of the wheel inner peripheral surface and the pin outer peripheral surface. situation. Specifically, in a state where the walking distance of the scoring wheel with respect to the workpiece exceeds a certain walking distance, a scribe line with microcracks extending in a direction different from the thickness direction of the workpiece is formed on The situation on the processed object. This crack is called a horizontal crack. In the part where horizontal cracks occur in the workpiece, the surface of the workpiece may peel off. The state where the surface of the workpiece is peeled is called a fiber. In the state where the walking distance of the scoring wheel relative to the workpiece exceeds a certain walking distance, an example of insufficient progress of the vertical cracks formed on the workpiece is also found. When the workpiece is divided along the scribe line, the quality of the divided portion may be reduced. Even if the surface roughness that greatly affects the impedance of the contact portion between the inner circumferential surface of the wheel and the outer circumferential surface of the pin is small, the reason why the quality of the workpiece is reduced is considered as follows, for example.

輪內周面及銷外周面之表面粗糙度均極小,由於其差小,故而於刻劃開始時,於輪內周面與銷外周面之摩擦面,燒結金剛石中所含之金剛石粒子所接觸之面積擴大,藉由磨損而緩緩出現於摩擦面上之包含鈷或鎢等金屬之燒結助劑所接觸之面積擴大,容易產生凝集。於摩擦面上凝集之部分對刻劃輪之旋轉賦予阻抗,由於因該阻抗所引起之刻劃輪之旋轉狀態之不穩定度,而認為用以形成正常之刻劃線形成之條件不穩定,被加工物之品質下降。The surface roughness of the inner peripheral surface of the wheel and the outer peripheral surface of the pin are extremely small. Because of the small difference, the diamond particles contained in the sintered diamond are in contact with the friction surface of the inner peripheral surface of the wheel and the outer peripheral surface of the pin at the beginning of the scoring. The area is enlarged, and the area contacted by the sintering aid containing metals such as cobalt or tungsten, which gradually appears on the friction surface due to abrasion, is enlarged, and aggregation is easy to occur. The part condensed on the friction surface imparts resistance to the rotation of the scribe wheel. Due to the instability of the rotation state of the scribe wheel caused by the impedance, the conditions used to form a normal scribe line formation are considered unstable. The quality of the processed object decreases.

依據表面粗糙度越小,對旋轉之阻抗越小之見解,而認為,為了減小刻劃輪之旋轉阻抗而對輪內周面進行鏡面加工之方法自身有效。但是,根據與作為與其內周面接觸之對象的銷外周面之組合之問題,而推定產生於輪內周面與銷外周面之間,藉由磨損而使旋轉阻抗變化之要因。認為該現象之發生係由於:形成摩擦面之輪內周面及銷外周面之兩者之表面粗糙度充分小;以及刻劃輪及銷分別為金剛石燒結體,且具有相同程度之硬度。Based on the knowledge that the smaller the surface roughness is, the smaller the resistance of rotation is, and it is considered that the method of mirror-polishing the inner peripheral surface of the wheel in order to reduce the rotational resistance of the scoring wheel is effective in itself. However, based on the problem with the combination of the outer peripheral surface of the pin that is the object to be in contact with the inner peripheral surface, it is estimated that the cause is caused between the inner peripheral surface of the wheel and the outer peripheral surface of the pin, and the rotation resistance changes due to wear. It is considered that the occurrence of this phenomenon is that: the surface roughness of both the inner peripheral surface of the wheel forming the friction surface and the outer peripheral surface of the pin is sufficiently small; and that the scoring wheel and the pin are diamond sintered bodies and have the same hardness.

本案發明者維持對輪內周面進行鏡面加工之方法,代替銷外周面之表面粗糙度小之金剛石燒結體之銷,而使用於作為母材之銷本體之外周面形成有保護層之銷,構成本發明之保持具單元。保護層包含對輪內周面之耐磨損性高之多數個高耐磨損粒子。所謂對輪內周面之耐磨損性高之狀態,意指於藉由與由高耐磨損材料所形成之輪內周面之接觸而產生磨損之情形時,亦為了使銷具有既定壽命而緩緩地磨損之狀態,或者實質不磨損之狀態。The inventor of the present case maintains a method of mirror-processing the inner peripheral surface of the wheel, instead of the pin of a diamond sintered body with a small surface roughness on the outer peripheral surface of the pin, the pin used as a base material has a protective layer formed on the outer peripheral surface of the pin body. A holder unit constituting the present invention. The protective layer contains a plurality of highly abrasion-resistant particles having high abrasion resistance to the inner circumferential surface of the wheel. The state of high abrasion resistance on the inner circumferential surface of the wheel means that when abrasion occurs due to contact with the inner circumferential surface of the wheel formed of a highly wear-resistant material, the pin also has a predetermined life. And the state of wear slowly, or the state of substantially no wear.

對使用本發明之保持具單元來進行刻劃加工之被加工物之品質進行觀察之結果為確認,被加工物之品質提高。獲得此種結果之原因例如考慮如下。於本發明之保持具單元之銷外周面上,與基準保持具單元之銷外周面不同,於構成保護層之多數個高耐磨損粒子之間形成間隙,且高耐磨損粒子所占之比例升高。因此,輪內周面與由保護層所構成之銷外周面之摩擦面之狀態係與基準保持具單元之輪內周面與銷外周面之摩擦面之狀態不同。由於該不同,於摩擦面上難以產生強的凝集,刻劃加工時之刻劃輪之旋轉阻抗之增加得到抑制,刻劃輪之旋轉狀態穩定。又,由於輪內周面之算術平均粗糙度Ra為0.01 μm以下,故而於輪內周面與銷外周面之摩擦面上,由表面粗糙度引起之摩擦阻抗之增加得到抑制,就該方面而言,刻劃輪之旋轉狀態之穩定性亦提高。As a result of observing the quality of the work to be scored using the holder unit of the present invention, it was confirmed that the quality of the work was improved. The reason for obtaining such a result is considered as follows, for example. On the outer peripheral surface of the pin of the holder unit of the present invention, different from the outer peripheral surface of the pin of the reference holder unit, a gap is formed between a plurality of highly abrasion-resistant particles constituting a protective layer, and the high-abrasion-resistant particles occupy the same. The proportion is increasing. Therefore, the state of the friction surface between the inner peripheral surface of the wheel and the outer peripheral surface of the pin composed of the protective layer is different from the state of the friction surface between the inner peripheral surface of the wheel and the outer peripheral surface of the pin of the reference holder unit. Due to this difference, it is difficult to produce strong agglutination on the friction surface, an increase in the rotation resistance of the scribe wheel during the scoring process is suppressed, and the rotation state of the scribe wheel is stable. In addition, since the arithmetic average roughness Ra of the inner peripheral surface of the wheel is 0.01 μm or less, the increase in frictional resistance due to the surface roughness on the friction surface between the inner peripheral surface of the wheel and the outer peripheral surface of the pin is suppressed. In other words, the stability of the rotation state of the scribing wheel is also improved.

(2)上述保持具單元之一例中,上述高耐磨損材料包含金剛石、立方晶氮化碳、六方白碳石、超硬度奈米管及立方晶氮化硼中之至少一者。
因此,輪內周面之耐磨損性進一步提高。
(2) In one example of the holder unit, the high wear-resistant material includes at least one of diamond, cubic carbon nitride, hexagonal white carbonite, ultra-hard nanometer tube, and cubic boron nitride.
Therefore, the wear resistance of the wheel inner peripheral surface is further improved.

(3)上述保持具單元之一例中,上述多數個高耐磨損粒子包含金剛石之粒子、立方晶氮化碳之粒子、六方白碳石之粒子、超硬度奈米管之粒子及立方晶氮化硼之粒子中之至少一者。
因此,保護層之耐磨損性進一步提高。
(3) In one example of the above-mentioned holder unit, the above-mentioned plurality of highly abrasion-resistant particles include diamond particles, cubic carbon nitride particles, hexagonal carbonite particles, ultra-hard nanometer tube particles, and cubic nitrogen. At least one of boronized particles.
Therefore, the abrasion resistance of the protective layer is further improved.

(4)上述保持具單元之一例中,上述高耐磨損粒子為研磨粒。
由於可利用研磨石中所使用之研磨粒來製造保護層,故而製造成本下降。
(4) In one example of the holder unit, the highly abrasion-resistant particles are abrasive particles.
Since the protective layer can be manufactured by using the abrasive particles used in the abrasive stone, the manufacturing cost is reduced.

(5)上述保持具單元之一例中,上述保護層包含將上述高耐磨損粒子結合於上述銷本體之外周面之結合劑之層,上述高耐磨損粒子包含:位於上述結合劑之層之內部的粒子被覆部、以及從上述結合劑之層之表面突出之粒子突出部。
高耐磨損粒子係於粒子被覆部,經由結合劑之層而結合於銷本體之外周面。因此,銷本體之外周面得到適當保護。粒子突出部接觸輪內周面。因此,保護層之磨損難以進行。
(5) In one example of the holder unit, the protective layer includes a layer of a bonding agent that binds the high-wear-resistant particles to the outer peripheral surface of the pin body, and the high-wear-resistant particles include: a layer located on the bonding agent A particle coating portion inside the particle and a particle protruding portion protruding from the surface of the layer of the binder.
The highly abrasion-resistant particles are bonded to the outer peripheral surface of the pin body via a layer of a bonding agent in the particle coating portion. Therefore, the outer peripheral surface of the pin body is appropriately protected. The particle protrusions contact the inner peripheral surface of the wheel. Therefore, abrasion of the protective layer is difficult to proceed.

(6)上述保持具單元之一例中,上述粒子突出部之前端為平面。
輪內周面接觸保護層之粒子突出部。刻劃加工時,刻劃輪相對於銷而旋轉,輪內周面與粒子突出部之前端形成摩擦面。隨著刻劃輪之旋轉,粒子突出部磨損。上述保持具單元中,由於粒子突出部之前端為平面,故而較粒子突出部之前端尖銳之情形而言,磨損緩緩進行。因此,於初始狀態下,與使用粒子突出部尖銳之銷之情形相比較,刻劃輪之行走距離達到一定之行走距離之情形時之銷之磨損量少,難以於銷之外周面上形成深槽。
(6) In one example of the holder unit, a front end of the particle protruding portion is flat.
The inner peripheral surface of the wheel is in contact with the particle protruding portion of the protective layer. During the scoring process, the scoring wheel rotates relative to the pin, and the inner peripheral surface of the wheel and the front end of the particle protruding portion form a friction surface. As the scoring wheel rotates, the particle protrusions wear out. In the holder unit described above, since the front end of the particle projection is flat, the wear is performed more slowly than when the front end of the particle projection is sharp. Therefore, in the initial state, compared with the case where a sharp pin with a particle protruding portion is used, the wear amount of the pin is smaller when the travel distance of the scoring wheel reaches a certain walking distance, and it is difficult to form a deeper pin on the outer peripheral surface. groove.

(7)上述保持具單元之一例中,上述結合劑為鎳。
因此,可利用電氣鍍敷來製造保護層。
(7) In one example of the holder unit, the bonding agent is nickel.
Therefore, a protective layer can be manufactured using electrical plating.

(8)上述保持具單元之一例中,上述刻劃輪為金剛石燒結體。
因此,可對各種被加工物實施高品質之刻劃加工。
(8) In one example of the holder unit, the scoring wheel is a diamond sintered body.
Therefore, high-quality scoring processing can be performed on various kinds of workpieces.

(9)上述保持具單元之一例中,沿著上述插入孔之中心軸心之方向上的上述插入孔之中間部之直徑較沿著上述插入孔之中心軸心之方向上的上述插入孔之端部之直徑更窄。
由於輪內周面與銷外周面之接觸面積變窄,故而由輪內周面之表面性狀所引起之刻劃輪之傾斜得到抑制。
(9) In one example of the holder unit, a diameter of an intermediate portion of the insertion hole in a direction along a center axis of the insertion hole is larger than a diameter of the insertion hole in a direction along a center axis of the insertion hole. The diameter of the ends is narrower.
Since the contact area between the inner peripheral surface of the wheel and the outer peripheral surface of the pin becomes narrower, the inclination of the scoring wheel caused by the surface properties of the inner peripheral surface of the wheel is suppressed.

(10)上述保持具單元之一例中,與沿著上述插入孔之中心軸心之方向平行、且通過上述插入孔之中心軸心之上述刻劃輪之剖面中,上述內周面之形狀為鼓形狀。
存在如下情形:於刻劃加工時,刻劃輪上產生包含沿著插入孔之中心軸心之方向之成分的反作用力。該反作用力係以使刻劃輪相對於銷而傾斜之方式發揮作用。上述保持具單元中,由於插入孔之內周面之形狀為鼓形狀,故而於刻劃輪上產生包含沿著中心軸心之方向之成分的反作用力之情形時亦難以產生刻劃輪之傾斜。
(10) In an example of the holder unit, in a cross section of the scoring wheel that is parallel to the direction along the center axis of the insertion hole and passes through the center axis of the insertion hole, the shape of the inner peripheral surface is Drum shape.
There are cases in which a scoring wheel generates a reaction force including a component in a direction along the center axis of the insertion hole during the scoring process. This reaction force works to incline the scoring wheel with respect to the pin. In the above-mentioned holder unit, since the shape of the inner peripheral surface of the insertion hole is a drum shape, it is also difficult to cause the inclination of the scribe wheel when a reaction force including a component along the center axis direction is generated on the scribe wheel. .

對與本發明之保持具單元相關之技術之一例進行說明。
(A)一種刻劃輪之銷,其支承刻劃輪,上述銷包含銷本體及保護上述銷本體之外周面之保護層,上述保護層包含對上述內周面之耐磨損性高之多數個高耐磨損粒子,上述保護層包含將上述高耐磨損粒子結合於上述銷本體之外周面之結合劑之層,上述高耐磨損粒子包含:位於上述結合劑之層之內部之粒子被覆部、以及從上述結合劑之層之表面突出之粒子突出部,且上述粒子突出部之前端為平面。
(B)上述刻劃輪之銷之一例中,上述多數個高耐磨損粒子包含金剛石之粒子、立方晶氮化碳之粒子、六方白碳石之粒子、超硬度奈米管之粒子及立方晶氮化硼之粒子中之至少一者。
(C)上述刻劃輪之銷之一例中,上述高耐磨損粒子為研磨粒。
(D)一種刻劃輪之銷之製造方法,上述銷支承刻劃輪;該製造方法包括:形成保護層之步驟,該保護層保護上述銷之銷本體之外周面,且包含耐磨損性高之多數個高耐磨損粒子以及將上述高耐磨損粒子結合於上述銷本體之外周面之結合劑之層;以及將上述高耐磨損粒子中之從上述結合材之層之表面突出之粒子突出部進行研磨之步驟。
[發明效果]
An example of a technique related to the holder unit of the present invention will be described.
(A) A pin of a scribing wheel, which supports the scribing wheel. The pin includes a pin body and a protective layer that protects the outer peripheral surface of the pin body. The protective layer includes a majority of abrasion resistance to the inner peripheral surface. High-wear-resistant particles, the protective layer includes a layer of a binding agent that combines the high-wear-resistant particles to the outer peripheral surface of the pin body, and the high-wear-resistant particles include: particles located inside the layer of the binder The covering portion and the particle protruding portion protruding from the surface of the layer of the bonding agent, and the front end of the particle protruding portion is flat.
(B) In one example of the pin of the scoring wheel, the above-mentioned high-wear-resistant particles include diamond particles, cubic carbon nitride particles, hexagonal white carbonite particles, ultra-hard nano-tube particles, and cubes. At least one of the particles of crystalline boron nitride.
(C) In an example of the pin of the scoring wheel, the highly abrasion-resistant particles are abrasive particles.
(D) A method for manufacturing a pin of a scribing wheel, wherein the pin supports the scribing wheel; the manufacturing method includes a step of forming a protective layer that protects the outer peripheral surface of the pin body of the pin and includes abrasion resistance A high number of highly abrasion-resistant particles and a layer of a bonding agent that binds the high-abrasion particles to the outer peripheral surface of the pin body; and protrudes from the surface of the layer of the bonding material of the high-abrasion particles A step of polishing the particle protrusions.
[Inventive effect]

根據本發明,被刻劃加工之被加工物之品質提高,可更長期地使用保持具單元。According to the present invention, the quality of the processed object is improved, and the holder unit can be used for a longer period of time.

(實施形態)
刻劃裝置係藉由在將刻劃輪按壓於被加工物上之狀態下,使刻劃輪與被加工物相對移動,而於被加工物之表面形成刻劃線。刻劃裝置之該動作稱為刻劃輪之掃描。刻劃輪之掃描方法主要分成3種方法。第1掃描方法中,於刻劃加工時保持刻劃輪之位置,對刻劃輪搬送被加工物。隨著被加工物之搬送,刻劃輪於被加工物之表面上相對地向既定之掃描方向進行掃描。第2掃描方法中,於刻劃加工時保持被加工物之位置,刻劃輪對被加工物向既定之掃描方向掃描。第3掃描方法中,第1掃描方法與第2掃描方法加以組合,刻劃輪對被加工物向既定之掃描方向掃描。
(Implementation form)
The scoring device moves the scoring wheel and the workpiece relatively in a state where the scoring wheel is pressed on the workpiece, and forms a score line on the surface of the workpiece. This action of the scoring device is called scanning of the scoring wheel. The scanning method of the scribing wheel is mainly divided into three methods. In the first scanning method, the position of the scoring wheel is maintained during the scoring process, and the workpiece is transported to the scoring wheel. As the processed object is conveyed, the scribe wheel scans the surface of the processed object relatively in the predetermined scanning direction. In the second scanning method, the position of the workpiece is maintained during the scribe process, and the scribe wheel scans the workpiece in a predetermined scanning direction. In the third scanning method, the first scanning method and the second scanning method are combined, and the scribe wheel scans the workpiece in a predetermined scanning direction.

被加工物之一例為脆性材料基板。脆性材料基板之一例為玻璃基板及陶瓷基板。玻璃基板之一例為無鹼玻璃之基板。由脆性材料基板所形成之無丙烯酸玻璃之基板例如用於平板顯示器。平板顯示器之一例為電視接收機之顯示器及智慧型手機之顯示器。An example of the object to be processed is a brittle material substrate. Examples of the brittle material substrate are a glass substrate and a ceramic substrate. An example of the glass substrate is a substrate of alkali-free glass. An acrylic glass-free substrate formed from a brittle material substrate is used, for example, in a flat panel display. Examples of the flat panel display are a display of a television receiver and a display of a smart phone.

圖1表示以可將脆性材料基板等被加工物以適當之品質進行刻劃加工之方式所構成之刻劃裝置10之一例。刻劃裝置10係藉由對刻劃輪120搬送被加工物W而於被加工物W上形成刻劃線。構成刻劃裝置10之主要元件為搬送裝置20及加工裝置30。搬送裝置20包括軌道21、平台22、直進驅動機構23、旋轉驅動機構24及真空吸引裝置25。以下之說明中,將搬送被加工物W之方向稱為搬送方向DA,將刻劃裝置10之俯視圖中與搬送方向DA正交之方向稱為寬度方向DB,且將與搬送方向DA及寬度方向DB正交之方向稱為高度方向DC。搬送方向DA中包含第1搬送方向以及與其相反之第2搬送方向。寬度方向DB中包含第1寬度方向以及與其相反之第2寬度方向。高度方向DC中包含上方及下方。FIG. 1 shows an example of a scoring device 10 configured so that a processed object such as a brittle material substrate can be scribed with an appropriate quality. The scoring device 10 forms a score line on the workpiece W by transferring the workpiece W to the scoring wheel 120. The main elements constituting the scoring device 10 are a transport device 20 and a processing device 30. The transfer device 20 includes a rail 21, a platform 22, a linear drive mechanism 23, a rotation drive mechanism 24, and a vacuum suction device 25. In the following description, a direction in which the workpiece W is conveyed is referred to as a conveying direction DA, a direction orthogonal to the conveying direction DA in the plan view of the scoring device 10 is referred to as a width direction DB, and the conveying direction DA and the width direction are referred to. The direction orthogonal to DB is called the height direction DC. The conveyance direction DA includes a first conveyance direction and a second conveyance direction opposite thereto. The width direction DB includes a first width direction and a second width direction opposite thereto. The height direction DC includes the upper and lower sides.

圖示之例中,於刻劃裝置10之基座(圖示略)上配置一對軌道21。軌道21之形狀係規定搬送方向DA之直線。其中一個軌道21與另一個軌道21係於寬度方向DB上隔開一定間隔而配置。平台22劃分為滑件22A、支柱22B及頂板22C。滑件22A係以可沿著軌道21移動之方式與各軌道21連結。支柱22B係以可於內部配置其他元件之方式構成之中空之部分,且設置於滑件22A上。頂板22C係用以配置被加工物W之部分,且設置於支柱22B上。In the example shown in the figure, a pair of rails 21 are arranged on a base (not shown) of the scoring device 10. The shape of the track 21 is a straight line defining the conveying direction DA. One of the rails 21 and the other rail 21 are arranged at a certain interval in the width direction DB. The platform 22 is divided into a slider 22A, a pillar 22B, and a top plate 22C. The slider 22A is connected to each of the rails 21 so as to be movable along the rails 21. The pillar 22B constitutes a hollow portion in such a manner that other elements can be arranged inside, and is provided on the slider 22A. The top plate 22C is a part for arranging the workpiece W, and is provided on the support pillar 22B.

直進驅動機構23使平台22相對於軌道21而移動。直進驅動機構23例如係由馬達23A及進給螺桿23B所構成。馬達23A配置於刻劃裝置10之基座(圖示略)上。馬達23A之輸出軸係以進給螺桿23B圍繞馬達23A之旋轉中心軸而旋轉之方式與進給螺桿23B連結。進給螺桿23B配置於一對軌道21之間。進給螺桿23B之長邊方向係與軌道21之長邊方向平行。滑件22A係以隨著進給螺桿23B之旋轉,而於進給螺桿23B之長邊方向上移動之方式與進給螺桿23B連結。藉由馬達23A旋轉,進給螺桿23B旋轉,且根據進給螺桿23B之旋轉方向,平台22相對於軌道21而向第1搬送方向或第2搬送方向移動。The linear drive mechanism 23 moves the platform 22 relative to the rail 21. The linear drive mechanism 23 is composed of, for example, a motor 23A and a feed screw 23B. The motor 23A is disposed on a base (not shown) of the scoring device 10. The output shaft of the motor 23A is connected to the feed screw 23B so that the feed screw 23B rotates around the rotation center axis of the motor 23A. The feed screw 23B is disposed between the pair of rails 21. The longitudinal direction of the feed screw 23B is parallel to the longitudinal direction of the rail 21. The slider 22A is connected to the feed screw 23B so as to move in the longitudinal direction of the feed screw 23B as the feed screw 23B rotates. When the motor 23A rotates, the feed screw 23B rotates, and according to the rotation direction of the feed screw 23B, the stage 22 moves to the first conveyance direction or the second conveyance direction with respect to the rail 21.

旋轉驅動機構24及真空吸引裝置25配置於支柱22B內。旋轉驅動機構24係圍繞與高度方向DC平行之中心軸心,使頂板22C相對於支柱22B而旋轉。真空吸引裝置25使配置於頂板22C上之被加工物W吸附於頂板22C上。刻劃加工係以藉由真空吸引裝置25而吸附有被加工物W之狀態來實施。The rotation driving mechanism 24 and the vacuum suction device 25 are arranged in the pillar 22B. The rotation driving mechanism 24 rotates the top plate 22C relative to the pillar 22B around a central axis parallel to the height direction DC. The vacuum suction device 25 sucks the workpiece W disposed on the top plate 22C on the top plate 22C. The scribe process is performed in a state where the workpiece W is adsorbed by the vacuum suction device 25.

加工裝置30包括:縱框31、橫框32、刻劃頭33、保持具接頭34、保持具單元100、橫驅動機構35及縱驅動機構36。縱框31、橫框32、刻劃頭33及保持具接頭34係由例如適合於各種功能之金屬所構成。The processing device 30 includes a vertical frame 31, a horizontal frame 32, a scoring head 33, a holder joint 34, a holder unit 100, a horizontal drive mechanism 35, and a vertical drive mechanism 36. The vertical frame 31, the horizontal frame 32, the scoring head 33, and the holder joint 34 are made of, for example, metal suitable for various functions.

圖示之例中,於刻劃裝置10之基座(圖示略)上配置一對縱框31。縱框31之長邊方向係與高度方向DC平行。一對縱框31係以夾持一對軌道21之方式配置於寬度方向DB上之各軌道21之外側。橫框32設置於一對縱框31之間。橫框32之長邊方向係與寬度方向DB平行。橫框32固定於各縱框31上。於橫框32上設置導件32A。導件32A係例如與橫框32之長邊方向平行之槽。In the example shown in the figure, a pair of vertical frames 31 are arranged on a base (not shown) of the scoring device 10. The longitudinal direction of the vertical frame 31 is parallel to the height direction DC. The pair of vertical frames 31 are arranged outside the respective rails 21 in the width direction DB so as to sandwich the pair of rails 21. The horizontal frame 32 is provided between a pair of vertical frames 31. The longitudinal direction of the horizontal frame 32 is parallel to the width direction DB. The horizontal frame 32 is fixed to each vertical frame 31. A guide 32A is provided on the horizontal frame 32. The guide 32A is, for example, a groove parallel to the longitudinal direction of the horizontal frame 32.

刻劃頭33係支承保持具接頭34之基座。刻劃頭33係以可沿著橫框32而於寬度方向DB上移動之方式與導件32A連結。保持具接頭34係與刻劃頭33之下部連結。保持具接頭34係以可將保持具單元100拆裝之方式來構成。The scoring head 33 is a base supporting the holder joint 34. The scoring head 33 is connected to the guide 32A so as to be movable in the width direction DB along the horizontal frame 32. The holder joint 34 is connected to the lower part of the scoring head 33. The holder joint 34 is configured so that the holder unit 100 can be detached.

橫驅動機構35係使刻劃頭33相對於橫框32而於寬度方向DB上移動。橫驅動機構35例如由馬達35A及進給螺桿35B構成。馬達35A設置於其中一個縱框31上。馬達35A之輸出軸係以進給螺桿35B圍繞馬達35A之旋轉中心軸而旋轉之方式與進給螺桿35B連結。進給螺桿35B配置於橫框32內。進給螺桿35B之長邊方向係與橫框32之長邊方向平行。刻劃頭33係以隨著進給螺桿35B之旋轉而於進給螺桿35B之長邊方向上移動之方式與進給螺桿35B連結。藉由馬達35A旋轉,進給螺桿35B旋轉,且根據進給螺桿35B之旋轉方向,刻劃頭33相對於橫框32而於第1寬度方向或第2寬度方向上移動。保持具接頭34及保持具單元100係與刻劃頭33一體地於寬度方向DB上移動。The horizontal driving mechanism 35 moves the scoring head 33 in the width direction DB with respect to the horizontal frame 32. The horizontal drive mechanism 35 is composed of, for example, a motor 35A and a feed screw 35B. The motor 35A is provided on one of the vertical frames 31. The output shaft of the motor 35A is connected to the feed screw 35B so that the feed screw 35B rotates around the rotation center axis of the motor 35A. The feed screw 35B is arranged in the horizontal frame 32. The longitudinal direction of the feed screw 35B is parallel to the longitudinal direction of the horizontal frame 32. The scoring head 33 is connected to the feed screw 35B so as to move in the longitudinal direction of the feed screw 35B as the feed screw 35B rotates. When the motor 35A rotates, the feed screw 35B rotates, and according to the rotation direction of the feed screw 35B, the scoring head 33 moves in the first width direction or the second width direction relative to the horizontal frame 32. The holder joint 34 and the holder unit 100 are moved integrally with the scoring head 33 in the width direction DB.

縱驅動機構36設置於刻劃頭33上。縱驅動機構36由例如馬達及進給螺桿(均省略圖示)構成。馬達配置於刻劃頭33內。馬達之輸出軸係以進給螺桿圍繞馬達之旋轉中心軸而旋轉之方式與進給螺桿連結。進給螺桿配置於刻劃頭33內。進給螺桿之長邊方向係與高度方向DC平行。保持具接頭34係以隨著進給螺桿之旋轉而於進給螺桿之長邊方向上移動之方式與進給螺桿連結。藉由馬達旋轉,進給螺桿旋轉,且根據進給螺桿之旋轉方向,保持具接頭34相對於刻劃頭33而於上方或下方移動。保持具單元100係與保持具接頭34一體地於高度方向DC上移動。The longitudinal driving mechanism 36 is provided on the scoring head 33. The vertical drive mechanism 36 includes, for example, a motor and a feed screw (both are not shown). The motor is disposed in the scoring head 33. The output shaft of the motor is connected to the feed screw in such a manner that the feed screw rotates around the rotation center axis of the motor. The feed screw is arranged in the scoring head 33. The longitudinal direction of the feed screw is parallel to the height direction DC. The holder joint 34 is connected to the feed screw so as to move in the longitudinal direction of the feed screw as the feed screw rotates. When the motor rotates, the feed screw rotates, and the holder joint 34 moves upward or downward relative to the scoring head 33 according to the rotation direction of the feed screw. The holder unit 100 moves in the height direction DC integrally with the holder joint 34.

圖2表示與寬度方向DB及高度方向DC平行之剖面中之保持具單元100之構造。構成保持具單元100之主要元件為保持具110、刻劃輪120及銷200。基座111相對於保持具接頭34可拆裝。銷200被支承於保持具110上,例如利用外殼140等防脫落機構來防止脫落。刻劃輪120被支承於銷200上。構成保持具110及外殼140之材料之一例為磁性體金屬。構成保持具110及外殼140之材料可各別地選擇。構成刻劃輪120之材料之一例為:燒結金剛石(Poly Crystalline Diamond)、超硬合金、單晶金剛石及多晶金剛石。構成刻劃輪120之材料可各別地選擇。FIG. 2 shows the structure of the holder unit 100 in a cross section parallel to the width direction DB and the height direction DC. The main elements constituting the holder unit 100 are a holder 110, a scoring wheel 120, and a pin 200. The base 111 is detachable from the holder joint 34. The pin 200 is supported by the holder 110 and is prevented from falling off by, for example, a falling prevention mechanism such as a housing 140. The scoring wheel 120 is supported on the pin 200. An example of a material constituting the holder 110 and the case 140 is a magnetic metal. The materials constituting the holder 110 and the case 140 can be selected individually. An example of a material constituting the scoring wheel 120 is: sintered diamond (Poly Crystalline Diamond), cemented carbide, single crystal diamond, and polycrystalline diamond. The materials constituting the scoring wheel 120 may be individually selected.

保持具110區分為基座111及一對臂112。基座111之形狀為圓柱或角柱。一對臂112係從基座111之下部向下方延伸。臂112之長邊方向係與高度方向DC平行。於寬度方向DB上,於其中一個臂112之內表面112A與另一個臂112之內表面112A之間,形成用以配置刻劃輪120之空間113。寬度方向DB上之其中一個臂112之內表面112A與另一個臂112之內表面112A之間隔係較刻劃輪120之厚度稍寬。於各臂112中形成銷200所插入之第1插入孔114。第1插入孔114係於寬度方向DB上貫通臂112之圓形之孔。形成於臂112上之內周面115規定第1插入孔114。第1插入孔114具有:於臂112之內表面112A上開口之內開口部114A、以及於臂112之外表面112B上開口之外開口部114B。The holder 110 is divided into a base 111 and a pair of arms 112. The shape of the base 111 is a cylinder or a corner post. A pair of arms 112 extend downward from the lower portion of the base 111. The longitudinal direction of the arm 112 is parallel to the height direction DC. In the width direction DB, a space 113 is formed between the inner surface 112A of one arm 112 and the inner surface 112A of the other arm 112 to arrange the scoring wheel 120. The interval between the inner surface 112A of one arm 112 and the inner surface 112A of the other arm 112 in the width direction DB is slightly wider than the thickness of the scoring wheel 120. A first insertion hole 114 into which the pin 200 is inserted is formed in each arm 112. The first insertion hole 114 is a circular hole penetrating the arm 112 in the width direction DB. The inner peripheral surface 115 formed on the arm 112 defines a first insertion hole 114. The first insertion hole 114 includes an inner opening portion 114A opened on the inner surface 112A of the arm 112 and an outer opening portion 114B opened on the outer surface 112B of the arm 112.

刻劃輪120配置於一對臂112間之空間113中。於刻劃輪120中形成銷200所插入之第2插入孔121。第2插入孔121係於厚度方向上貫通刻劃輪120之圓形之孔。形成於刻劃輪120上之內周面122(以下稱為「輪內周面122」)規定第2插入孔121。輪內周面122係由高耐磨損材料所形成。對輪內周面122實施鏡面加工。經鏡面加工之輪內周面122之算術平均粗糙度Ra小於經實施通常之精加工之面之算術平均粗糙度Ra。一例中,輪內周面122之算術平均粗糙度Ra為0.01 μm以下。較佳例中,輪內周面122之算術平均粗糙度Ra為0.005 μm以下,最大高度Rz為0.05 μm以下。高耐磨損材料包含金剛石、立方晶氮化碳、六方白碳石、超硬度奈米管及立方晶氮化硼中之至少一者。一例中,刻劃輪120為金剛石燒結體,包含形成輪內周面122之高耐磨損材料之刻劃輪120之整體包含金剛石燒結體。The scoring wheel 120 is disposed in a space 113 between the pair of arms 112. A second insertion hole 121 into which the pin 200 is inserted is formed in the scoring wheel 120. The second insertion hole 121 is a circular hole penetrating the scribe wheel 120 in the thickness direction. An inner peripheral surface 122 (hereinafter referred to as “wheel inner peripheral surface 122”) formed on the scoring wheel 120 defines a second insertion hole 121. The wheel inner peripheral surface 122 is formed of a highly wear-resistant material. The wheel inner peripheral surface 122 is mirror-finished. The arithmetic average roughness Ra of the inner peripheral surface 122 of the mirror-finished wheel is smaller than the arithmetic average roughness Ra of the surface subjected to ordinary finishing. In one example, the arithmetic average roughness Ra of the wheel inner peripheral surface 122 is 0.01 μm or less. In a preferred example, the arithmetic average roughness Ra of the wheel inner peripheral surface 122 is 0.005 μm or less, and the maximum height Rz is 0.05 μm or less. The highly wear-resistant material includes at least one of diamond, cubic carbon nitride, hexagonal white carbonite, ultra-hard nanometer tube, and cubic boron nitride. In one example, the scoring wheel 120 is a diamond sintered body, and the entire scoring wheel 120 including a highly wear-resistant material forming the wheel inner peripheral surface 122 includes the diamond sintered body.

銷200係相對於保持具110及刻劃輪120之各個而以非壓入之狀態,插入各臂112之第1插入孔114以及刻劃輪120之第2插入孔121中。銷200之粗度RC小於第1插入孔114之直徑RA以及第2插入孔121之直徑RB。銷200之長度較寬度方向DB上之其中一個第1插入孔114之外開口部114B與另一個第1插入孔114之外開口部114B之間隔稍短。The pin 200 is inserted into the first insertion hole 114 of each arm 112 and the second insertion hole 121 of the scoring wheel 120 in a non-pressed state with respect to each of the holder 110 and the scoring wheel 120. The thickness RC of the pin 200 is smaller than the diameter RA of the first insertion hole 114 and the diameter RB of the second insertion hole 121. The length of the pin 200 is slightly shorter than the interval between the opening portion 114B outside one of the first insertion holes 114 and the opening portion 114B outside the other first insertion hole 114 in the width direction DB.

輪內周面122之形狀可任意選擇。一例中,沿著刻劃輪120之第2插入孔121之中心軸心CB之方向上的第2插入孔121之中間部121A之直徑,較沿著第2插入孔121之中心軸心CB之方向上的第2插入孔121之端部121B之直徑狹窄。與刻劃輪之厚度方向平行、且通過上述插入孔之中心軸心之上述刻劃輪之剖面中,上述內周面之形狀為鼓形狀。具體而言,輪內周面122係以於沿著中心軸心CB之方向上,隨著從各側面123朝向刻劃輪120之中心,而向中心軸心CB膨脹之方式彎曲。輪內周面122與銷外周面201之關係為實質性之線接觸、或者接觸面積微小之面接觸。刻劃加工時,刻劃輪120上產生包含沿著中心軸心CB之方向之成分的反作用力。該反作用力係以使刻劃輪120相對於銷200而傾斜之方式發揮作用。於刻劃輪120傾斜之狀態下,與中心軸心CB正交之刻劃輪120之旋轉中心面不與銷200之中心軸心CC正交。保持具單元100中,由於輪內周面122為如上所述之曲面,故而難以產生刻劃加工時之刻劃輪120之傾斜。The shape of the wheel inner peripheral surface 122 can be arbitrarily selected. In one example, the diameter of the middle portion 121A of the second insertion hole 121 in the direction of the center axis CB of the second insertion hole 121 of the scoring wheel 120 is larger than that of the center axis CB of the second insertion hole 121. The diameter of the end portion 121B of the second insertion hole 121 in the direction is narrow. In the cross section of the scribe wheel parallel to the thickness direction of the scribe wheel and passing through the center axis of the insertion hole, the shape of the inner peripheral surface is a drum shape. Specifically, the wheel inner peripheral surface 122 is curved so as to expand toward the center axis CB from each side surface 123 toward the center of the scoring wheel 120 in a direction along the center axis CB. The relationship between the wheel inner peripheral surface 122 and the pin outer peripheral surface 201 is substantial line contact or surface contact with a small contact area. During the scoring process, the scoring wheel 120 generates a reaction force including a component along the center axis CB. This reaction force works to incline the scoring wheel 120 with respect to the pin 200. In a state where the scoring wheel 120 is inclined, the rotation center plane of the scoring wheel 120 orthogonal to the central axis CB is not orthogonal to the central axis CC of the pin 200. In the holder unit 100, since the wheel inner peripheral surface 122 is a curved surface as described above, it is difficult to cause the inclination of the scribe wheel 120 during the scribe process.

外殼140係與保持具110分別構成。外殼140係以可使第1插入孔114之外開口部114B開閉之方式,利用固定機構而固定於保持具110上。固定機構之一例為螺桿。外殼140係以銷200之前端202不會從第1插入孔114中飛出之方式,將第1插入孔114之外開口部114B之一部分或全部關閉。圖示之例中,外殼140將第1插入孔114之外開口部114B之一部分關閉。The case 140 is configured separately from the holder 110. The case 140 is fixed to the holder 110 by a fixing mechanism so that the opening portion 114B other than the first insertion hole 114 can be opened and closed. An example of the fixing mechanism is a screw. The casing 140 partially or completely closes one of the openings 114B outside the first insertion hole 114 so that the front end 202 of the pin 200 does not fly out of the first insertion hole 114. In the example shown in the figure, the case 140 closes a part of the opening portion 114B other than the first insertion hole 114.

刻劃裝置10可將刻劃輪120進行更換。刻劃輪120之更換方法例如可列舉第1更換方法及第2更換方法。第1更換方法中,最初將外殼140從保持具110上拆除。繼而將銷200從保持具110上抜出,刻劃輪120從保持具110之空間113中取出。繼而,將新的刻劃輪120配置於保持具110之空間113中,於臂112之第1插入孔114及刻劃輪120之第2插入孔121中插入銷200。刻劃輪120之厚度薄於各臂112之間隔,因此可容易實施更換刻劃輪120之作業。於必須更換銷200之情形時,並非從保持具110中拔出之銷200,而是新的銷200插入第1插入孔114以及第2插入孔121中。由於以可於非壓入之狀態下插入保持具110及刻劃輪120中之方式構成銷200,故而可容易實施銷200相對於保持具110之抜出及插入。The scoring device 10 can replace the scoring wheel 120. Examples of the method for replacing the scoring wheel 120 include a first replacement method and a second replacement method. In the first replacement method, the housing 140 is removed from the holder 110 first. Then, the pin 200 is pulled out from the holder 110, and the scoring wheel 120 is taken out from the space 113 of the holder 110. Next, the new scoring wheel 120 is arranged in the space 113 of the holder 110, and the pin 200 is inserted into the first insertion hole 114 of the arm 112 and the second insertion hole 121 of the scoring wheel 120. The thickness of the scoring wheel 120 is thinner than the interval between the arms 112, so the operation of replacing the scoring wheel 120 can be easily performed. When the pin 200 must be replaced, the pin 200 is not pulled out from the holder 110 but a new pin 200 is inserted into the first insertion hole 114 and the second insertion hole 121. Since the pin 200 is configured so that it can be inserted into the holder 110 and the scoring wheel 120 in a non-pressed state, the pin 200 can be easily pulled out and inserted into the holder 110.

第2更換方法係於代替外殼140而利用不同構成之防脫落機構,將銷200保持於保持具110上之情形時選擇。例如,防脫落機構包含與保持具110結合之爪部。於爪部與保持具110結合之狀態下,防脫落機構固定於保持具110上,無法相對於保持具110而進行開閉動作。第2更換方法中,於刻劃輪120及銷200保持於保持具110上之狀態下,作為一體之保持具單元100而更換。具體而言,最初將保持具單元100從保持具接頭34上拆除。繼而將新的保持具單元100安裝於保持具接頭34上。The second replacement method is selected in the case where the pin 200 is held on the holder 110 by using a different fall prevention mechanism instead of the case 140. For example, the fall-off prevention mechanism includes a claw portion coupled to the holder 110. In a state where the claw portion and the holder 110 are coupled, the fall-off prevention mechanism is fixed to the holder 110 and cannot be opened and closed with respect to the holder 110. In the second replacement method, the scoring wheel 120 and the pin 200 are held on the holder 110 and replaced as an integrated holder unit 100. Specifically, the holder unit 100 is initially removed from the holder joint 34. The new holder unit 100 is then mounted on the holder joint 34.

於刻劃加工步驟之開始前之狀態下,以刻劃輪120不接觸被加工物W之方式,縱驅動機構36將保持具單元100保持於高度方向DC之既定位置。以隨著刻劃加工步驟之開始,刻劃輪120接觸被加工物W之表面至方式,縱驅動機構36使保持具單元100從高度方向DC之既定位置向下方移動。於刻劃輪120接觸被加工物W之表面之狀態下,以藉由刻劃輪120而對被加工物W施加既定之荷重之方式,縱驅動機構36決定保持具單元100之高度方向DC之位置。In a state before the scoring processing step, the scoring wheel 120 does not contact the workpiece W, the vertical driving mechanism 36 holds the holder unit 100 at a predetermined position in the height direction DC. The vertical drive mechanism 36 moves the holder unit 100 downward from a predetermined position in the height direction DC so that the scoring wheel 120 contacts the surface of the workpiece W as the scoring processing step starts. In a state where the scoring wheel 120 is in contact with the surface of the workpiece W, the vertical drive mechanism 36 determines the height DC of the holder unit 100 in such a manner that a predetermined load is applied to the workpiece W by the scoring wheel 120. position.

圖3為銷200之剖面圖。銷200由銷本體210、以及保護銷本體210之外周面211之保護層220構成。保護層220之表面221構成銷200之外周面即銷外周面201。銷本體210為圓柱。保護層220覆蓋銷本體210之外周面211。較佳例中,於銷本體210之外周面211中,於存在與刻劃輪120之輪內周面122接觸之可能性之部分之整體設置保護層220。圖2所示之例中,於銷本體210之外周面211之整體設置保護層220。FIG. 3 is a cross-sectional view of the pin 200. The pin 200 includes a pin body 210 and a protective layer 220 that protects the outer peripheral surface 211 of the pin body 210. The surface 221 of the protective layer 220 constitutes the outer peripheral surface of the pin 200, that is, the outer peripheral surface 201 of the pin. The pin body 210 is cylindrical. The protective layer 220 covers the outer peripheral surface 211 of the pin body 210. In a preferred example, in the outer peripheral surface 211 of the pin body 210, a protective layer 220 is provided on the entirety of a portion that has a possibility of contacting the inner peripheral surface 122 of the wheel of the scoring wheel 120. In the example shown in FIG. 2, a protective layer 220 is provided on the entire outer peripheral surface 211 of the pin body 210.

保護層220包含對輪內周面122之耐磨損性高之多數個高耐磨損粒子230(參照圖4)。較佳例中,為了使銷200具有既定之壽命而構成保護層220。既定之壽命係由例如藉由刻劃加工,刻劃輪120於被加工物W上行走之距離所規定。所謂對輪內周面122之耐磨損性高之狀態,意指即使於藉由與由金剛石所形成之輪內周面122之接觸而產生磨損之情形時,亦為了使銷200具有既定之壽命而緩緩地磨損之狀態、或者實質上不磨損之狀態。The protective layer 220 includes a plurality of high abrasion resistant particles 230 (see FIG. 4) having high abrasion resistance against the wheel inner peripheral surface 122. In a preferred example, the protective layer 220 is formed so that the pin 200 has a predetermined life. The predetermined life is defined by, for example, the distance traveled by the scoring wheel 120 on the workpiece W by scoring. The state of high abrasion resistance to the wheel inner peripheral surface 122 means that even when abrasion occurs due to contact with the wheel inner peripheral surface 122 made of diamond, the pin 200 has a predetermined value. The state of wear and tear, or the state of substantially no wear.

圖4係與在作為母材之銷本體210上形成保護層220,且該保護層220未經研磨加工之狀態(以下稱為「銷200之未加工狀態」)有關之銷200之模型圖。圖示之例中,多數個高耐磨損粒子230之形狀相同,多數個高耐磨損粒子230於銷本體210之外周面211上排列,但實際之保護層220中,各個高耐磨損粒子230之形狀不同,於銷本體210之外周面211上不規則地存在多數個高耐磨損粒子230。FIG. 4 is a model diagram of the pin 200 related to a state where the protective layer 220 is formed on the pin body 210 as a base material and the protective layer 220 has not been ground (hereinafter referred to as “unprocessed state of the pin 200”). In the example shown in the figure, most of the high abrasion resistant particles 230 have the same shape, and the plurality of high abrasion resistant particles 230 are arranged on the outer peripheral surface 211 of the pin body 210. However, in the actual protective layer 220, each of the high abrasion resistant particles 230 has high abrasion resistance. The particles 230 have different shapes, and a plurality of highly abrasion-resistant particles 230 are irregularly present on the outer peripheral surface 211 of the pin body 210.

高耐磨損粒子230之種類可任意選擇。一例中,多數個高耐磨損粒子230包含金剛石之粒子、立方晶氮化碳之粒子、六方白碳石之粒子、超硬度奈米管之粒子及立方晶氮化硼之粒子中之至少一者。圖示之例中,多數個高耐磨損粒子230為金剛石之粒子。構成金剛石粒子之材料之一例為單晶金剛石及多晶金剛石。構成銷本體210之材料可任意選擇。一例中,構成銷本體210之材料之硬度低於高耐磨損粒子230之硬度。其一例為超硬合金、鋼及不鏽鋼。硬度之種類例如為努氏硬度。The type of the high abrasion resistant particles 230 can be arbitrarily selected. In one example, the plurality of highly wear-resistant particles 230 include at least one of diamond particles, cubic carbon nitride particles, hexagonal white carbonite particles, ultra-hard nanometer tube particles, and cubic boron nitride particles By. In the example shown in the figure, the plurality of highly abrasion-resistant particles 230 are particles of diamond. Examples of the material constituting the diamond particles are single crystal diamond and polycrystalline diamond. The material constituting the pin body 210 can be arbitrarily selected. In one example, the hardness of the material constituting the pin body 210 is lower than that of the high abrasion resistant particles 230. One example is cemented carbide, steel and stainless steel. The kind of hardness is, for example, Knoop hardness.

保護層220更包含將高耐磨損粒子230結合於銷本體210之外周面211上之結合劑之層240(以下稱為「結合層240」)。結合層240覆蓋銷本體210之外周面211。結合層240之構造可任意選擇。一例中,結合層240為藉由電氣鍍敷而形成之電鍍層。結合劑之種類之一例為鎳、以及包含鎳之合金。圖示之例中,結合層240係由鎳所構成。該結合層240係藉由電解鍍鎳而形成之電鍍層。The protective layer 220 further includes a layer 240 (hereinafter referred to as a “bonding layer 240”) of a binding agent that binds the high wear-resistant particles 230 to the outer peripheral surface 211 of the pin body 210. The bonding layer 240 covers the outer peripheral surface 211 of the pin body 210. The structure of the bonding layer 240 can be arbitrarily selected. In one example, the bonding layer 240 is an electroplated layer formed by electrical plating. An example of the type of the binder is nickel and an alloy containing nickel. In the example shown, the bonding layer 240 is made of nickel. The bonding layer 240 is an electroplated layer formed by electrolytic nickel plating.

高耐磨損粒子230係藉由結合層240而結合於銷本體210之外周面211。該結合係以高耐磨損粒子230可保護銷本體210之方式,於外周面211上保持高耐磨損粒子230。高耐磨損粒子230包含:位於結合層240之內部之粒子被覆部231、以及從結合層240之表面241突出之粒子突出部232。一例中,高耐磨損粒子230為研磨粒。於高耐磨損粒子230之表面233上存在多數個角234以及多數個平面235。於銷200之未加工狀態下,多數個高耐磨損粒子230大多採取角234位於粒子突出部232之前端之姿勢。The high abrasion resistant particles 230 are bonded to the outer peripheral surface 211 of the pin body 210 via the bonding layer 240. This combination is such that the high abrasion resistant particles 230 can protect the pin body 210, and the high abrasion resistant particles 230 are held on the outer peripheral surface 211. The highly abrasion-resistant particles 230 include a particle coating portion 231 located inside the bonding layer 240 and a particle protruding portion 232 protruding from the surface 241 of the bonding layer 240. In one example, the high abrasion resistant particles 230 are abrasive particles. There are a plurality of corners 234 and a plurality of planes 235 on the surface 233 of the high wear-resistant particles 230. In the unprocessed state of the pin 200, most of the highly abrasion-resistant particles 230 mostly adopt a posture in which the angle 234 is located at the front end of the particle protruding portion 232.

構成保持具單元100之銷200之初始狀態可任意選擇。所謂銷200之初始狀態,係指未使用之保持具單元100中之銷200之狀態。所選擇之初始狀態之一例為已對保護層220實施研磨加工之加工完畢狀態、以及未對保護層220實施研磨加工之未加工狀態。對於包含研磨粒之層,通常實施用以磨快之研磨加工,但對銷200之保護層220實施之研磨加工係用以減小保護層220之表面粗糙度之加工。作為研磨加工,例如可選擇:於將銷200之中央以夾具等來保持之狀態下對保護層220進行研磨之研磨加工、以及於不保持銷200之中央之狀態下對保護層220進行研磨之無中央研磨加工。The initial state of the pins 200 constituting the holder unit 100 can be arbitrarily selected. The initial state of the pin 200 refers to the state of the pin 200 in the unused holder unit 100. An example of the selected initial state is a processed state in which the protective layer 220 has been subjected to a grinding process, and an unprocessed state in which the protective layer 220 has not been subjected to a grinding process. For a layer containing abrasive particles, a grinding process for sharpening is usually performed, but a grinding process for the protective layer 220 of the pin 200 is a process for reducing the surface roughness of the protective layer 220. As the polishing process, for example, a grinding process in which the protective layer 220 is polished while the center of the pin 200 is held by a jig or the like, and a grinding process in which the protective layer 220 is not polished while the center of the pin 200 is not held, may be selected. No central grinding.

圖5為經研磨加工之保護層220之模型圖。經研磨加工之保護層220中,粒子突出部232之前端為平面235。研磨加工中,高耐磨損粒子230藉由從研磨石受到之力,而使高耐磨損粒子230之姿勢變化,多數個高耐磨損粒子230大多採取平面235位於粒子突出部232之前端之姿勢。或者,粒子突出部232之角234藉由研磨而去除,於粒子突出部232形成平面235。藉由產生高耐磨損粒子230之姿勢之變化、以及粒子突出部232中之平面235之形成之一者或兩者,保護層220之表面221係由多數個平面235所構成。此外,藉由研磨加工,多數個高耐磨損粒子230之一部分擠入銷本體210中。該高耐磨損粒子230之姿勢與研磨加工前大致相同,角234位於粒子突出部232之前端。FIG. 5 is a model diagram of the protective layer 220 after grinding. In the polished protective layer 220, the front end of the particle protruding portion 232 is a flat surface 235. During the grinding process, the high wear-resistant particles 230 change the posture of the high wear-resistant particles 230 by the force received from the grinding stone. Most of the high wear-resistant particles 230 adopt a flat surface 235 and are located at the front end of the particle protrusion 232 Pose. Alternatively, the corners 234 of the particle protrusions 232 are removed by grinding to form a flat surface 235 on the particle protrusions 232. The surface 221 of the protective layer 220 is composed of a plurality of planes 235 by one or both of changes in the posture of the highly wear-resistant particles 230 and formation of the planes 235 in the particle protrusions 232. In addition, a part of the plurality of highly abrasion-resistant particles 230 is squeezed into the pin body 210 by grinding. The posture of the highly wear-resistant particles 230 is substantially the same as that before the grinding process, and the angle 234 is located at the front end of the particle protruding portion 232.

平面235位於粒子突出部232之前端之高耐磨損粒子230從結合層240突出之量,較於研磨加工前角234位於粒子突出部232之前端之高耐磨損粒子230從結合層240突出之量少。平面235位於粒子突出部232之前端之高耐磨損粒子230從結合層240突出之量、以及於研磨加工後角234位於粒子突出部232之前端之高耐磨損粒子230從結合層240突出之量大致相等。The amount of the highly abrasion-resistant particles 230 whose plane 235 is located at the front end of the particle protrusions 232 protrudes from the bonding layer 240 compared to the grinding-resistant front angle 234 of the high-wear-resistant particles 230 located at the front end of the particle protrusions 232 protruding from the bonding layer 240 The amount is small. The amount of the highly abrasion-resistant particles 230 whose plane 235 is located at the front end of the particle protrusions 232 protrudes from the bonding layer 240, and the high-wear-resistant particles 230 at the front end of the particle protrusions 232 after grinding processing 234 protrudes from the bonding layer 240 The amounts are roughly equal.

圖6為利用三維測定機來測定未加工狀態之保護層220之輪廓的結果之一例。圖7係利用三維測定機來測定加工完畢狀態之保護層220之輪廓的結果之一例。根據圖6所示之測定結果,可確認於未加工狀態之保護層220之表面存在多數個粒子突出部232之角234。根據圖7之測定結果,可確認於加工完畢狀態之保護層220之表面存在多數個粒子突出部232之平面235。FIG. 6 is an example of a result of measuring the contour of the protective layer 220 in a raw state using a three-dimensional measuring machine. FIG. 7 is an example of a result of measuring the contour of the protective layer 220 in a processed state using a three-dimensional measuring machine. According to the measurement results shown in FIG. 6, it can be confirmed that there are a plurality of corners 234 of the particle protrusions 232 on the surface of the protective layer 220 in the unprocessed state. According to the measurement result in FIG. 7, it can be confirmed that there are a plurality of planes 235 of the particle protrusions 232 on the surface of the protective layer 220 in the processed state.

保持具單元100之使用形態例如可從第1使用形態及第2使用形態中選擇。第1使用形態係選擇未加工狀態來作為銷200之初始狀態的使用形態。第2使用形態係選擇加工完畢狀態來作為銷200之初始狀態的使用形態。可根據設置於保持具110上之銷200之種類,來選擇保持具單元100之使用形態。The use form of the holder unit 100 can be selected from, for example, a first use form and a second use form. The first use mode is a use mode in which an unprocessed state is selected as an initial state of the pin 200. The second usage pattern is a processing pattern in which the processed state is selected as the initial state of the pin 200. The use form of the holder unit 100 can be selected according to the type of the pin 200 provided on the holder 110.

圖8表示第1使用形態之刻劃輪120之行走距離短之狀態。所謂行走距離短之狀態,係指例如行走距離為0 m以上且小於基準距離之狀態。基準距離為例如通常之銷所要求之壽命之1成左右之行走距離。於刻劃輪120之行走距離短之狀態下,輪內周面122係與多數個粒子突出部232之角234接觸。藉由隨著刻劃加工時之刻劃輪120之旋轉,輪內周面122與粒子突出部232之角234摩擦,則粒子突出部232之角234磨損,粒子突出部232中之與輪內周面122之接觸部分係仿照輪內周面122之形狀而逐漸變化。FIG. 8 shows a state in which the scoring wheel 120 of the first use form has a short running distance. The state in which the walking distance is short refers to, for example, a state in which the walking distance is 0 m or more and less than the reference distance. The reference distance is, for example, a walking distance of about 10% of the life required for a normal pin. In a state where the scoring wheel 120 has a short walking distance, the wheel inner peripheral surface 122 is in contact with the corners 234 of the plurality of particle protrusions 232. By the rotation of the scoring wheel 120 during the scoring process, the inner circumferential surface 122 of the wheel rubs against the corner 234 of the particle protrusion 232, so that the angle 234 of the particle protrusion 232 wears, and the particle protrusion 232 and the wheel The contact portion of the peripheral surface 122 gradually changes according to the shape of the inner peripheral surface 122 of the wheel.

圖9表示第1使用形態之刻劃輪120之行走距離長之狀態。所謂行走距離長之狀態,係指例如行走距離為基準距離以上之狀態。於刻劃輪120之行走距離長之狀態下,粒子突出部232中之與輪內周面122之接觸部分係仿照輪內周面122之面236。面236中之高耐磨損粒子230與輪內周面122之接觸面積,與刻劃輪120之行走距離短之狀態相比較增加。因此,隨著刻劃輪120之行走距離變長,高耐磨損粒子230相對於行走距離之增加的磨損量逐漸減少。此外,於粒子突出部232之磨損量多之情形時,結合層240之一部分亦磨損。結合層240與高耐磨損粒子230相比較,硬度充分低,藉由與刻劃輪120之接觸而去除。多數個粒子突出部232中,不與輪內周面122接觸之粒子突出部232之狀態係與初始狀態相同。FIG. 9 shows a state where the scoring wheel 120 of the first use form has a long running distance. The state in which the walking distance is long refers to, for example, a state in which the walking distance is equal to or greater than the reference distance. In a state where the running distance of the scribing wheel 120 is long, the contact portion of the particle protruding portion 232 with the wheel inner peripheral surface 122 is modeled on the surface 236 of the wheel inner peripheral surface 122. The contact area between the high-wear-resistant particles 230 in the surface 236 and the wheel inner peripheral surface 122 is increased compared to a state in which the scoring wheel 120 has a short walking distance. Therefore, as the walking distance of the scoring wheel 120 becomes longer, the amount of wear of the high wear-resistant particles 230 with respect to the increase in the walking distance gradually decreases. In addition, when the amount of wear of the particle protrusions 232 is large, a part of the bonding layer 240 is also worn. Compared with the high abrasion resistant particles 230, the bonding layer 240 has a sufficiently low hardness, and is removed by contact with the scoring wheel 120. Among the plurality of particle protrusions 232, the state of the particle protrusions 232 not in contact with the wheel inner peripheral surface 122 is the same as the initial state.

圖10表示第2使用形態之刻劃輪120之行走距離短之狀態。於刻劃輪120之行走距離短之狀態下,輪內周面122與多數個粒子突出部232之平面235接觸。於包含前端存在角234之粒子突出部232之情形時,亦存在輪內周面122接觸該角234之情形。藉由隨著刻劃加工時之刻劃輪120之旋轉,輪內周面122與粒子突出部232摩擦,則粒子突出部232中之與輪內周面122之接觸部分磨損,但與第1使用形態不同,保護層220之表面係由多數個平面235所構成,故而與第1使用形態相比較,由磨損引起之形狀之變化量更少。FIG. 10 shows a state where the scoring wheel 120 of the second use form has a short running distance. In a state where the scoring wheel 120 has a short walking distance, the wheel inner peripheral surface 122 is in contact with the planes 235 of the plurality of particle protrusions 232. When the particle protrusion 232 including the corner 234 at the front end is included, there is also the case where the wheel inner peripheral surface 122 contacts the corner 234. By following the rotation of the scoring wheel 120 during the scoring process, the wheel inner peripheral surface 122 rubs against the particle protruding portion 232, so that the contact portion of the particle protruding portion 232 with the wheel inner peripheral surface 122 wears, but is The use form is different, and the surface of the protective layer 220 is composed of a plurality of flat surfaces 235. Therefore, compared with the first use form, the amount of change in shape due to abrasion is less.

圖11表示第2使用形態之刻劃輪120之行走距離長之狀態。由於粒子突出部232之磨損量少,故而於刻劃輪120之行走距離長之狀態下,輪內周面122與保護層220之關係亦與刻劃輪120之行走距離短之狀態大致相同。FIG. 11 shows a state in which the scoring wheel 120 of the second use form has a long running distance. Since the amount of wear of the particle protrusions 232 is small, the relationship between the wheel inner peripheral surface 122 and the protective layer 220 is substantially the same as the state where the scoring wheel 120 has a short running distance when the scoring wheel 120 has a long running distance.

保持具單元100之各部之尺寸例如係以如下方式來決定。刻劃輪120之外徑係從1 mm~7 mm之範圍內選擇。一例中,刻劃輪120之外徑為2 mm。刻劃輪120之厚度係從0.4 mm~1.2 mm之範圍內選擇。一例中,刻劃輪120之厚度為0.64 mm。寬度方向DB上之臂112之間隔係從0.4 mm~1.3 mm之範圍內選擇。一例中,臂112之間隔為0.66 mm。第1插入孔114之直徑RA係從0.4 mm~1.5 mm之範圍內選擇。一例中,第1插入孔114之直徑RA為0.8 mm。第2插入孔121之直徑RB係從0.4 mm~1.5 mm之範圍內選擇。一例中,第2插入孔121之直徑RB為0.8 mm。銷200之粗度RC係從0.4 mm~1.5 mm之範圍內選擇。一例中,銷200之粗度之RC為0.77 mm。The size of each part of the holder unit 100 is determined as follows, for example. The outer diameter of the scoring wheel 120 is selected from a range of 1 mm to 7 mm. In one example, the outer diameter of the scoring wheel 120 is 2 mm. The thickness of the scoring wheel 120 is selected from the range of 0.4 mm to 1.2 mm. In one example, the thickness of the scoring wheel 120 is 0.64 mm. The interval of the arms 112 in the width direction DB is selected from a range of 0.4 mm to 1.3 mm. In one example, the interval between the arms 112 is 0.66 mm. The diameter RA of the first insertion hole 114 is selected from a range of 0.4 mm to 1.5 mm. In one example, the diameter RA of the first insertion hole 114 is 0.8 mm. The diameter RB of the second insertion hole 121 is selected from a range of 0.4 mm to 1.5 mm. In one example, the diameter RB of the second insertion hole 121 is 0.8 mm. The thickness RC of the pin 200 is selected from the range of 0.4 mm to 1.5 mm. In one example, the RC of the thickness of the pin 200 is 0.77 mm.

一例中,保護層220之規格係以如下方式來決定。高耐磨損粒子230之層構成係從1層、2層及3層以上之多層中選擇。高耐磨損粒子230之粒度係以篩孔尺寸標記,係從#800~#1500之範圍內選擇。高耐磨損粒子230之粒徑係從5 μm~30 μm之範圍內選擇。結合劑中較佳為使用鎳、或者包含鎳之合金。保護層220之厚度係從5 μm~30 μm之範圍內選擇。In one example, the specifications of the protective layer 220 are determined as follows. The layer structure of the high abrasion resistant particles 230 is selected from one, two, and three or more layers. The particle size of the high abrasion resistant particles 230 is marked by the size of the sieve mesh, and is selected from the range of # 800 to # 1500. The particle diameter of the high abrasion resistant particles 230 is selected from the range of 5 μm to 30 μm. Among the binders, nickel or an alloy containing nickel is preferably used. The thickness of the protective layer 220 is selected from a range of 5 μm to 30 μm.

(實施例)
實施對實施形態之保持具單元100以及基準保持具單元之性能進行評價之試驗。以下之說明中,省略與實施形態之保持具單元100相關聯之符號。又,將刻劃輪之行走距離記述為輪行走距離。
(Example)
A test was performed to evaluate the performance of the holder unit 100 and the reference holder unit of the embodiment. In the following description, the symbols associated with the holder unit 100 according to the embodiment are omitted. The travel distance of the scribing wheel is described as the wheel travel distance.

該試驗中,測定藉由輪內周面與銷外周面之摩擦而產生之聲音之聲音位準、以及銷外周面之磨損量,基於各自之結果,對保持具單元之性能進行綜合評價。綜合評價之種類為X、Y。依據綜合評價為X之保持具單元,於輪行走距離長之情形時亦可獲得適當品質之被加工物。依據綜合評價為Y之保持具單元,於輪行走距離長之情形時存在被加工物之品質下降之顧慮。但,於掌握輪行走距離與被加工物之品質之關係,基於獲得適當品質之被加工物之加工條件而使用綜合評價為Y之保持具單元之情形時,於實際之刻劃加工時不產生特別之障礙。In this test, the sound level of the sound generated by the friction between the inner peripheral surface of the wheel and the outer peripheral surface of the pin and the amount of wear of the outer peripheral surface of the pin are measured, and the performance of the holder unit is comprehensively evaluated based on the respective results. The types of comprehensive evaluation are X and Y. Based on the comprehensive evaluation of the holder unit of X, even when the wheel travels a long distance, a workpiece of appropriate quality can also be obtained. Based on the comprehensive evaluation of the holder unit of Y, there is a concern that the quality of the workpiece will be reduced when the wheel travel distance is long. However, when grasping the relationship between the wheel travel distance and the quality of the workpiece, and using the holder unit that is comprehensively evaluated as Y based on the processing conditions of the workpiece to obtain the appropriate quality, it will not occur during the actual scribe process Special obstacles.

試驗中,使用在與刻劃輪於被加工物之表面上行走之狀況類似之狀況下,可掃描刻劃輪之試驗機。於試驗機上設置測定對象之保持具單元。所設置之保持具單元之刻劃輪接觸試驗機之輥。藉由輥旋轉,則刻劃輪旋轉,在與實際之刻劃加工時之刻劃輪之掃描類似之狀況下掃描刻劃輪。In the test, a test machine capable of scanning the scribe wheel is used in a condition similar to that of the scribe wheel walking on the surface of the workpiece. A holder unit of a measurement object is set on the testing machine. The scoring wheel of the provided holder unit contacts the roller of the testing machine. By rotating the roller, the scribe wheel is rotated, and the scribe wheel is scanned under a condition similar to the scanning of the scribe wheel during the actual scribe process.

聲音位準之測定中,使用設置於試驗機上之振動感測器、以及對振動感測器之測定結果進行分析之資料記錄器。振動感測器係測定藉由輪內周面與銷外周面之摩擦而產生之聲音。振動感測器之測定結果輸入資料記錄器中。資料記錄器對振動感測器之測定結果進行頻率分析,轉換為聲音位準。聲音位準係相對於參考之相對值。作為參考,設定使用基準保持具單元之刻劃加工時產生纖維之時間點之聲音位準。該試驗中,將參考之聲音位準設定為作為最大水準之5。聲音位準係與刻劃輪之旋轉狀態之穩定性相關。刻劃輪之旋轉狀態之穩定性越高,聲音位準越小。與聲音位準為4、5所對應之刻劃輪之旋轉狀態係與刻劃加工時形成纖維之情形時之刻劃輪之旋轉狀態類似。For sound level measurement, a vibration sensor installed on a test machine and a data logger that analyzes the measurement results of the vibration sensor are used. The vibration sensor measures the sound generated by the friction between the inner peripheral surface of the wheel and the outer peripheral surface of the pin. The measurement result of the vibration sensor is input into the data logger. The data logger performs frequency analysis on the measurement results of the vibration sensor and converts them into sound levels. The sound level is relative to the reference. As a reference, the sound level at the time point when the fiber is generated during the scoring process using the reference holder unit is set. In this test, the reference sound level was set to 5 which is the maximum level. The sound level is related to the stability of the rotation state of the scoring wheel. The higher the stability of the rotation state of the scoring wheel, the lower the sound level. The rotation state of the scribe wheel corresponding to the sound level of 4 and 5 is similar to the rotation state of the scribe wheel when the fiber is formed during the scoring process.

銷外周面之磨損量之測定時使用三維測定機。為測定磨損量,於輪行走距離為0 m之狀態、以及輪行走距離達到既定之行走距離之狀態之各個狀態下,從保持具單元中拔出銷,將該銷設置於三維測定機中,利用三維測定機來測定銷外周面之輪廓。於使用基準保持具單元之試驗中,既定之行走距離為3000 m。於使用實施形態之保持具單元之試驗中,既定之行走距離為11000 m。When measuring the amount of wear on the outer peripheral surface of the pin, a three-dimensional measuring machine was used. In order to measure the amount of wear, in each state where the wheel running distance is 0 m and the state where the wheel running distance reaches a predetermined running distance, a pin is pulled out from the holder unit, and the pin is set in a three-dimensional measuring machine. The contour of the outer peripheral surface of the pin was measured using a three-dimensional measuring machine. In the test using the reference holder unit, the predetermined walking distance is 3000 m. In the test using the holder unit of the embodiment, the predetermined walking distance was 11,000 m.

根據銷外周面之輪廓之測定結果來確認銷外周面之磨損量。具體而言,根據輪行走距離為0 m之狀態下之銷外周面之輪廓、與輪行走距離為既定之行走距離之狀態下之銷外周面之輪廓之差,來求出銷外周面之磨損量。銷之壽命係與銷外周面之磨損量相關。於銷外周面之磨損量為基準之磨損量以下之情形時,可判定為銷具有既定之壽命。基準保持具單元之銷與實施形態之保持具單元之銷由於構造不同,故而基準之磨損量之設定方法不同。與實施形態之保持具單元之銷有關之基準之磨損量主要係根據與既定之行走距離以及銷之初始狀態下之保護層之厚度之關係來設定。例如,於既定之行走距離與既定之壽命對應之情形時,基準之磨損量至少小於銷之初始狀態下之保護層之厚度。於既定之行走距離短於既定之壽命之情形時,基準之磨損量設定為更小。The amount of wear on the outer peripheral surface of the pin is confirmed based on the measurement result of the contour of the outer peripheral surface of the pin. Specifically, the abrasion of the pin outer peripheral surface is determined based on the difference between the contour of the pin outer peripheral surface when the wheel travel distance is 0 m and the contour of the pin outer peripheral surface when the wheel travel distance is a predetermined travel distance. the amount. The life of a pin is related to the amount of wear on the outer surface of the pin. In the case where the amount of wear on the outer peripheral surface of the pin is equal to or less than the reference amount, it can be determined that the pin has a predetermined life. Since the pins of the reference holder unit and the pins of the holder unit according to the embodiment are different in structure, the method of setting the reference wear amount is different. The reference abrasion amount related to the pin of the holder of the embodiment is mainly set based on the relationship with the predetermined walking distance and the thickness of the protective layer in the initial state of the pin. For example, when the predetermined walking distance corresponds to the predetermined life, the reference wear amount is at least less than the thickness of the protective layer in the initial state of the pin. When the predetermined walking distance is shorter than the predetermined life, the reference wear amount is set to be smaller.

圖12為試驗結果之一例。試驗所使用之保持具單元為2種基準保持具單元、以及2種實施形態之保持具單元之共計4種。將2種基準保持具單元分別記述為測定對象A1、測定對象A2。將2種實施形態之保持具單元分別記述為測定對象B1、測定對象B2。各測定對象A1~B2中相互對應之元件之尺寸相同。於所有測定對象之輪內周面,以輪內周面之算術平均粗糙度Ra成為0.005 μm以下,且最大高度Rz成為0.05 μm以下之方式實施鏡面加工。輪內周面與銷外周面之間無潤滑。Figure 12 shows an example of the test results. The holder units used in the test were two types of reference holder units and two holder units of two embodiments. The two types of reference holder units are described as measurement target A1 and measurement target A2, respectively. The holder units of the two embodiments are described as measurement target B1 and measurement target B2, respectively. The dimensions of the corresponding components in each of the measurement objects A1 to B2 are the same. Mirror surface processing was performed on the inner peripheral surfaces of the wheels for all measurement objects so that the arithmetic average roughness Ra of the inner peripheral surfaces of the wheels became 0.005 μm or less and the maximum height Rz became 0.05 μm or less. There is no lubrication between the inner peripheral surface of the wheel and the outer peripheral surface of the pin.

與基準保持具單元有關之試驗條件係如下所述。測定對象A1、A2之不同點為構成銷之金剛石粒子之粒徑及組成。與測定對象A1、A2有關之其他條件相同。刻劃輪及銷分別為金剛石燒結體。測定對象A1之金剛石粒子之粒徑為1 μm以下。測定對象A2之金剛石粒子之粒徑為1 μm~3 μm。The test conditions related to the reference holder unit are as follows. The difference between the measurement objects A1 and A2 is the particle size and composition of the diamond particles constituting the pin. The other conditions related to the measurement targets A1 and A2 are the same. The scoring wheel and pin are diamond sintered bodies, respectively. The particle size of the diamond particles of the measurement object A1 is 1 μm or less. The particle size of the diamond particles of the measurement object A2 is 1 μm to 3 μm.

與實施形態之保持具單元100有關之試驗條件係如下所述。測定對象B1、B2之不同點為高耐磨損粒子230之粒徑、以及銷200之初始狀態。與測定對象B1、B2有關之其他條件相同。銷本體210之材料為碳工具鋼。高耐磨損粒子230之種類為金剛石粒子。結合層240係藉由電解鍍鎳而形成之鎳之層。測定對象B1之銷200之高耐磨損粒子230之粒徑以粒度表示為#1500。測定對象B1之銷200之初始狀態為未加工狀態。測定對象B2之銷200之高耐磨損粒子230之粒徑以粒度表示為#800。測定對象B2之銷200之初始狀態為加工完畢狀態。研磨加工之方法為使用金剛石研磨粒之無中央加工。The test conditions related to the holder unit 100 according to the embodiment are as follows. The difference between the measurement objects B1 and B2 is the particle diameter of the high wear-resistant particles 230 and the initial state of the pin 200. The other conditions related to the measurement targets B1 and B2 are the same. The material of the pin body 210 is carbon tool steel. The type of the high wear-resistant particles 230 is diamond particles. The bonding layer 240 is a layer of nickel formed by electrolytic nickel plating. The particle diameter of the high abrasion resistant particle 230 of the pin 200 of the measurement object B1 was expressed as a particle size of # 1500. The initial state of the pin 200 of the measurement object B1 is an unprocessed state. The particle diameter of the high abrasion resistant particle 230 of the pin 200 of the measurement object B2 was expressed as a particle size of # 800. The initial state of the pin 200 of the measurement object B2 is a processed state. The grinding method is centerless processing using diamond abrasive particles.

與測定對象A1有關之試驗結果係如下所述。於輪行走距離100 m時,聲音位準為1。於輪行走距離1500 m時,聲音位準為4。於輪行走距離3000 m時,聲音位準為5。輪行走距離3000 m時之銷外周面之磨損量為基準之磨損量以下,但銷外周面之形狀係仿照輪內周面之形狀而稍微變化。測定對象A1中,存在聲音位準達到4、5之情形,因此與保持具單元之性能有關之綜合評價為Y。此外,由於確認於輪行走距離3000 m時聲音位準達到5,故而對於輪行走距離長於3000 m之情形,不測定聲音位準。圖中之斜線表示此情況。The test results related to the measurement target A1 are as follows. When the wheel travels a distance of 100 m, the sound level is 1. When the wheel travels a distance of 1500 m, the sound level is 4. When the wheel travels a distance of 3000 m, the sound level is 5. When the wheel travels at a distance of 3000 m, the amount of wear on the outer peripheral surface of the pin is equal to or less than the standard amount of wear. However, the shape of the outer peripheral surface of the pin changes slightly according to the shape of the inner peripheral surface of the wheel. In the measurement object A1, the sound level may reach 4, 5; therefore, the comprehensive evaluation related to the performance of the holder unit is Y. In addition, since it was confirmed that the sound level reached 5 when the wheel traveling distance was 3000 m, the sound level was not measured for the case where the wheel traveling distance was longer than 3000 m. The diagonal lines in the figure indicate this situation.

與測定對象A2有關之試驗結果係如下所述。於輪行走距離100 m時,聲音位準為2。於輪行走距離為1500 m時,聲音位準為3.5。於輪行走距離3000 m時,聲音位準為5。輪行走距離3000 m時之銷外周面之磨損量為基準之磨損量以下,但銷外周面之形狀係仿照輪內周面之形狀而稍微變化。測定對象A2中,存在聲音位準達到5之情形,因此與保持具單元之性能有關之綜合評價為Y。此外,由於確認於輪行走距離3000 m時聲音位準達到5,故而對於輪行走距離長於3000 m之情形,不測定聲音位準。圖中之斜線表示此情況。The test results related to the measurement target A2 are as follows. When the wheel travels a distance of 100 m, the sound level is 2. When the wheel travel distance is 1500 m, the sound level is 3.5. When the wheel travels a distance of 3000 m, the sound level is 5. When the wheel travels at a distance of 3000 m, the amount of wear on the outer peripheral surface of the pin is equal to or less than the standard amount of wear. However, the shape of the outer peripheral surface of the pin changes slightly according to the shape of the inner peripheral surface of the wheel. In the measurement object A2, there may be a case where the sound level reaches 5, so the comprehensive evaluation related to the performance of the holder unit is Y. In addition, since it was confirmed that the sound level reached 5 when the wheel traveling distance was 3000 m, the sound level was not measured for the case where the wheel traveling distance was longer than 3000 m. The diagonal lines in the figure indicate this situation.

與測定對象B1有關之試驗結果係如下所述。於輪行走距離100 m時,聲音位準為2。於輪行走距離1500 m時,聲音位準為1。於輪行走距離3000 m時,聲音位準為1。於輪行走距離5000 m、8000 m、11000 m時,聲音位準為0.5。輪行走距離11000 m時之銷外周面之磨損量為基準之磨損量以下,與測定對象A1、A2相比較,銷外周面之形狀之變化較小。測定對象B1中,聲音位準之最大值為2,銷外周面之磨損量為基準之磨損量以下,因此與保持具單元之性能有關之綜合評價為X。The test results related to the measurement target B1 are as follows. When the wheel travels a distance of 100 m, the sound level is 2. When the wheel travels a distance of 1500 m, the sound level is 1. When the wheel travels a distance of 3000 m, the sound level is 1. At wheel travel distances of 5000 m, 8000 m, and 11,000 m, the sound level is 0.5. When the wheel running distance is 11,000 m, the wear amount of the pin outer peripheral surface is equal to or less than the reference wear amount. Compared with the measurement objects A1 and A2, the shape of the pin outer peripheral surface changes little. In the measurement object B1, the maximum value of the sound level is 2, and the amount of wear on the outer peripheral surface of the pin is equal to or less than the amount of wear based on the reference. Therefore, the comprehensive evaluation related to the performance of the holder unit is X.

輪行走距離5000 m、8000 m、11000 m之情形時之聲音位準低於輪行走距離100 m、1500 m、3000 m之情形時之聲音位準之原因考慮如下。藉由與輪內周面之接觸,粒子突出部之角磨損,高耐磨損粒子之與輪內周面之接觸部分仿照輪內周面之形狀而變化,高耐磨損粒子與輪內周面之接觸面積增加。藉此,轉變為即便刻劃輪旋轉亦實質上不產生高耐磨損粒子之磨損之狀態、或者高耐磨損粒子之磨損難以進行之狀態,刻劃輪之旋轉狀態穩定,認為聲音位準下降。The reason why the sound level when the wheel travel distance is 5000 m, 8000 m, and 11000 m is lower than that when the wheel travel distance is 100 m, 1500 m, 3000 m is considered as follows. By contact with the inner peripheral surface of the wheel, the corners of the protruding portions of the particles wear, and the contact portion of the highly abrasion-resistant particles with the inner peripheral surface of the wheel changes in accordance with the shape of the inner peripheral surface of the wheel. The surface contact area is increased. Thereby, even if the scoring wheel rotates, it is changed to a state in which abrasion of highly abrasion-resistant particles does not substantially occur, or abrasion of high-abrasion-resistant particles is difficult to progress. decline.

與測定對象B2有關之試驗結果係如下所述。於輪行走距離100 m、1500 m、3000 m、5000 m、8000 m、11000 m之任一者時,聲音位準均為0.5。輪行走距離11000 m時之銷外周面之磨損量為基準之磨損量以下,與測定對象A1、A2相比較,銷外周面之形狀之變化小。測定對象B2中,聲音位準之最大值為0.5,銷外周面之磨損量為基準之磨損量以下,因此與保持具單元之性能有關之綜合評價為X。The test results related to the measurement target B2 are as follows. For wheel travel distances of 100 m, 1500 m, 3000 m, 5000 m, 8000 m, and 11,000 m, the sound level is 0.5. When the wheel running distance is 11000 m, the wear amount of the pin outer peripheral surface is equal to or less than the reference wear amount. Compared with the measurement objects A1 and A2, the change in the shape of the pin outer peripheral surface is small. In the measurement object B2, the maximum value of the sound level is 0.5, and the amount of wear on the outer peripheral surface of the pin is equal to or less than the amount of wear based on the reference. Therefore, the comprehensive evaluation related to the performance of the holder unit is X.

(變形例)
上述實施形態係本發明之保持具單元可採取之形態之例示,並非旨在限制該形態。本發明之保持具單元可採取與實施形態所例示之形態不同之形態。其一例為將實施形態之構成之一部分置換、變更、或省略之形態,或者於實施形態中附加新構成之形態。
(Modification)
The embodiment described above is an example of a form that the holder unit of the present invention can take, and is not intended to limit the form. The holder unit of the present invention may take a form different from that exemplified in the embodiment. One example is a form in which a part of the structure of the embodiment is replaced, changed, or omitted, or a new structure is added to the embodiment.

・銷200之剖面形狀可任意變更。一例中,銷200之剖面形狀為多角形。多角形之一例為四角形、六角形及八角形。保護層220係以覆蓋多角形之銷本體210之外周面211之方式形成。・ The cross-sectional shape of the pin 200 can be arbitrarily changed. In one example, the cross-sectional shape of the pin 200 is a polygon. Examples of the polygon are a quadrangle, a hexagon, and an octagon. The protective layer 220 is formed so as to cover the outer peripheral surface 211 of the polygonal pin body 210.

・高耐磨損粒子230之形狀可任意變更。一例中,高耐磨損粒子230之形狀為球。
・刻劃輪120之構造可任意變更。刻劃輪120之輪內周面122以外之部分係由與構成輪內周面122之高耐磨損材料不同之材料所構成。不同材料之一例係與構成輪內周面122之高耐磨損材料不同之高耐磨損材料、或者超硬合金。
・ The shape of the high abrasion resistant particles 230 can be arbitrarily changed. In one example, the shape of the high wear-resistant particles 230 is a sphere.
・ The structure of the scoring wheel 120 can be changed arbitrarily. The portion other than the wheel inner peripheral surface 122 of the scoring wheel 120 is made of a material different from the highly wear-resistant material constituting the wheel inner peripheral surface 122. An example of the different materials is a highly wear-resistant material different from the highly wear-resistant material constituting the inner circumferential surface 122 of the wheel, or a super-hard alloy.

10‧‧‧刻劃裝置10‧‧‧ scoring device

100‧‧‧保持具單元 100‧‧‧ holder unit

110‧‧‧保持具 110‧‧‧ holder

111‧‧‧基座 111‧‧‧ base

112‧‧‧臂 112‧‧‧arm

112A‧‧‧內表面 112A‧‧‧Inner surface

112B‧‧‧外表面 112B‧‧‧ Outer surface

113‧‧‧空間 113‧‧‧space

114‧‧‧第1插入孔 114‧‧‧1st insertion hole

114A‧‧‧內開口部 114A‧‧‧Inner opening

114B‧‧‧外開口部 114B‧‧‧Outer opening

115‧‧‧內周面 115‧‧‧Inner peripheral surface

120‧‧‧刻劃輪 120‧‧‧ Scribing Wheel

121‧‧‧第2插入孔(刻劃輪之插入孔) 121‧‧‧ 2nd insertion hole (insertion hole of scoring wheel)

121A‧‧‧中間部 121A‧‧‧Middle

121B‧‧‧端部 121B‧‧‧End

122‧‧‧內周面 122‧‧‧Inner peripheral surface

123‧‧‧側面 123‧‧‧ side

140‧‧‧外殼 140‧‧‧shell

200‧‧‧銷 200‧‧‧pin

201‧‧‧銷外周面 201‧‧‧pin outer surface

202‧‧‧前端 202‧‧‧Front

210‧‧‧銷本體 210‧‧‧pin body

211‧‧‧外周面 211‧‧‧outer surface

220‧‧‧保護層 220‧‧‧ protective layer

221‧‧‧表面 221‧‧‧ surface

230‧‧‧高耐磨損粒子 230‧‧‧High abrasion resistant particles

231‧‧‧粒子被覆部 231‧‧‧ particle coating

232‧‧‧粒子突出部 232‧‧‧ particle protrusion

233‧‧‧表面 233‧‧‧ surface

235‧‧‧平面 235‧‧‧plane

240‧‧‧結合層(結合劑之層) 240‧‧‧ bonding layer (layer of bonding agent)

241‧‧‧表面 241‧‧‧ surface

CB‧‧‧中心軸心(插入孔之中心軸心) CB‧‧‧Center Axis (Center Axis of Insertion Hole)

CC‧‧‧中心軸心(銷之中心軸心) CC‧‧‧center axis (center axis of pin)

RA、RB‧‧‧直徑 RA, RB‧‧‧ diameter

RC‧‧‧粗度 RC‧‧‧Coarseness

DB‧‧‧寬度方向 DB‧‧‧Width direction

DC‧‧‧高度方向 DC‧‧‧ height direction

圖1係實施形態之刻劃裝置之立體圖。FIG. 1 is a perspective view of a scoring device according to an embodiment.

圖2係圖1之保持具單元之剖面圖。 FIG. 2 is a cross-sectional view of the holder unit of FIG. 1. FIG.

圖3係圖2之銷之剖面圖。 FIG. 3 is a sectional view of the pin of FIG. 2.

圖4係未加工狀態之保護層之模型圖。 FIG. 4 is a model diagram of the protective layer in an unprocessed state.

圖5係加工完畢狀態之保護層之模型圖。 FIG. 5 is a model diagram of the protective layer in a processed state.

圖6係表示由三維測定機所得之圖4之保護層之輪廓之測定結果的圖。 FIG. 6 is a diagram showing a measurement result of the contour of the protective layer of FIG. 4 obtained by a three-dimensional measuring machine.

圖7係表示由三維測定機所得之圖5之保護層之輪廓之測定結果的圖。 FIG. 7 is a diagram showing a measurement result of the contour of the protective layer of FIG. 5 obtained by a three-dimensional measuring machine.

圖8係第1使用形態之行走距離短之狀態之保護層等之模型圖。 FIG. 8 is a model diagram of the protective layer and the like in a state where the walking distance of the first use form is short.

圖9係第1使用形態之行走距離長之狀態之保護層等之模型圖。 FIG. 9 is a model diagram of the protective layer and the like in a state where the walking distance of the first use form is long.

圖10係第2使用形態之行走距離短之狀態之保護層等之模型圖。 FIG. 10 is a model diagram of the protective layer and the like in a state where the walking distance of the second use form is short.

圖11係第2使用形態之行走距離長之狀態之保護層等之模型圖。 FIG. 11 is a model diagram of the protective layer and the like in a state where the walking distance of the second use form is long.

圖12係表示試驗結果之一例之圖。 FIG. 12 is a diagram showing an example of test results.

Claims (10)

一種保持具單元,其具備: 保持具; 銷,被支承於上述保持具;以及 刻劃輪,被支承於上述銷; 上述刻劃輪包含上述銷所插入之插入孔; 規定上述插入孔之上述刻劃輪之內周面係由高耐磨損材料所形成,算術平均粗糙度Ra為0.01 μm以下; 上述銷包含銷本體、以及保護上述銷本體之外周面之保護層; 上述保護層包含對上述內周面之耐磨損性高之多數個高耐磨損粒子。A holder unit having: Holder A pin supported by the holder; and A scoring wheel supported by the pin; The scoring wheel includes an insertion hole into which the pin is inserted; The inner peripheral surface of the scoring wheel defining the insertion hole is formed of a highly wear-resistant material, and the arithmetic average roughness Ra is 0.01 μm or less; The pin includes a pin body and a protective layer for protecting the outer surface of the pin body; The protective layer includes a plurality of highly abrasion-resistant particles having high abrasion resistance to the inner peripheral surface. 如請求項1所述之保持具單元,其中 上述高耐磨損材料包含金剛石、立方晶氮化碳、六方白碳石、超硬度奈米管、以及立方晶氮化硼中之至少一者。A holder unit as described in claim 1, wherein The high-wear-resistant material includes at least one of diamond, cubic carbon nitride, hexagonal white carbonite, ultra-hard nanometer tube, and cubic boron nitride. 如請求項1或2所述之保持具單元,其中 上述多數個高耐磨損粒子包含金剛石之粒子、立方晶氮化碳之粒子、六方白碳石之粒子、超硬度奈米管之粒子、以及立方晶氮化硼之粒子中之至少一者。The holder unit according to claim 1 or 2, wherein The plurality of high abrasion-resistant particles include at least one of diamond particles, cubic carbon nitride particles, hexagonal white carbonite particles, ultra-hard nanometer tube particles, and cubic boron nitride particles. 如請求項1或2所述之保持具單元,其中 上述高耐磨損粒子為研磨粒。The holder unit according to claim 1 or 2, wherein The highly abrasion resistant particles are abrasive particles. 如請求項1或2所述之保持具單元,其中 上述保護層包含將上述高耐磨損粒子結合於上述銷本體之外周面的結合劑之層; 上述高耐磨損粒子包含:位於上述結合劑之層之內部的粒子被覆部、以及從上述結合劑之層之表面突出之粒子突出部。The holder unit according to claim 1 or 2, wherein The protective layer includes a layer of a binding agent that binds the highly abrasion-resistant particles to the outer peripheral surface of the pin body; The highly abrasion-resistant particles include a particle coating portion located inside the layer of the bonding agent, and a particle protruding portion protruding from the surface of the layer of the bonding agent. 如請求項5所述之保持具單元,其中 上述粒子突出部之前端為平面。A holder unit as described in claim 5, wherein The front end of the particle protrusion is flat. 如請求項5所述之保持具單元,其中 上述結合劑為鎳。A holder unit as described in claim 5, wherein The binder is nickel. 如請求項1或2所述之保持具單元,其中 上述刻劃輪為金剛石燒結體。The holder unit according to claim 1 or 2, wherein The scoring wheel is a diamond sintered body. 如請求項1或2所述之保持具單元,其中 沿著上述插入孔之中心軸心之方向上的上述插入孔之中間部之直徑,較沿著上述插入孔之中心軸心之方向上的上述插入孔之端部之直徑狹窄。The holder unit according to claim 1 or 2, wherein The diameter of the middle portion of the insertion hole in the direction along the center axis of the insertion hole is narrower than the diameter of the end portion of the insertion hole in the direction along the center axis of the insertion hole. 如請求項9所述之保持具單元,其中 與沿著上述插入孔之中心軸心之方向平行、且通過上述插入孔之中心軸心的上述刻劃輪之剖面中,上述內周面之形狀為鼓形狀。A holder unit as described in claim 9, wherein In a cross section of the scoring wheel that is parallel to the direction along the center axis of the insertion hole and passes through the center axis of the insertion hole, the shape of the inner peripheral surface is a drum shape.
TW108112885A 2018-04-20 2019-04-12 Holder unit having a plurality of highly abrasion-resistant particles on the peripheral surface of the scribing wheel TW201944473A (en)

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