TW201933317A - 可撓性微發光二極體顯示模組 - Google Patents
可撓性微發光二極體顯示模組 Download PDFInfo
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- TW201933317A TW201933317A TW107102860A TW107102860A TW201933317A TW 201933317 A TW201933317 A TW 201933317A TW 107102860 A TW107102860 A TW 107102860A TW 107102860 A TW107102860 A TW 107102860A TW 201933317 A TW201933317 A TW 201933317A
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- light
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- display module
- diode display
- semiconductor material
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- 238000006243 chemical reaction Methods 0.000 claims abstract description 94
- 239000000758 substrate Substances 0.000 claims abstract description 69
- 239000010410 layer Substances 0.000 claims description 112
- 239000000463 material Substances 0.000 claims description 59
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- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims description 30
- 238000004519 manufacturing process Methods 0.000 claims description 16
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 10
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- 239000011241 protective layer Substances 0.000 claims description 10
- RNQKDQAVIXDKAG-UHFFFAOYSA-N aluminum gallium Chemical compound [Al].[Ga] RNQKDQAVIXDKAG-UHFFFAOYSA-N 0.000 claims description 6
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- 229910052738 indium Inorganic materials 0.000 claims description 6
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 6
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- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 claims description 5
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 claims description 5
- 239000002184 metal Substances 0.000 claims description 5
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- 235000012239 silicon dioxide Nutrition 0.000 claims description 5
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- 239000011651 chromium Substances 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 4
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- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 3
- 239000000843 powder Substances 0.000 claims description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 2
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- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 claims 1
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- 229910010413 TiO 2 Inorganic materials 0.000 claims 1
- SBFDPWWVJYLRGG-UHFFFAOYSA-N [N]=O.[P] Chemical compound [N]=O.[P] SBFDPWWVJYLRGG-UHFFFAOYSA-N 0.000 claims 1
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- IBIRZFNPWYRWOG-UHFFFAOYSA-N phosphane;phosphoric acid Chemical compound P.OP(O)(O)=O IBIRZFNPWYRWOG-UHFFFAOYSA-N 0.000 claims 1
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- PFNQVRZLDWYSCW-UHFFFAOYSA-N (fluoren-9-ylideneamino) n-naphthalen-1-ylcarbamate Chemical compound C12=CC=CC=C2C2=CC=CC=C2C1=NOC(=O)NC1=CC=CC2=CC=CC=C12 PFNQVRZLDWYSCW-UHFFFAOYSA-N 0.000 description 2
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- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- UQZIWOQVLUASCR-UHFFFAOYSA-N alumane;titanium Chemical compound [AlH3].[Ti] UQZIWOQVLUASCR-UHFFFAOYSA-N 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
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- 229910052733 gallium Inorganic materials 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
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- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 description 1
Classifications
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- H—ELECTRICITY
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- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
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- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/075—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
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- H01L27/15—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission
- H01L27/153—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission in a repetitive configuration, e.g. LED bars
- H01L27/156—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission in a repetitive configuration, e.g. LED bars two-dimensional arrays
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- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
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- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
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- H01L33/502—Wavelength conversion materials
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- G—PHYSICS
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- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
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- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
- G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
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- H01L2933/00—Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
- H01L2933/0083—Periodic patterns for optical field-shaping in or on the semiconductor body or semiconductor body package, e.g. photonic bandgap structures
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- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/04—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
- H01L33/06—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction within the light emitting region, e.g. quantum confinement structure or tunnel barrier
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- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/12—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a stress relaxation structure, e.g. buffer layer
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- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
- H01L33/32—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table containing nitrogen
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- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
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- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
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- H01L33/507—Wavelength conversion elements the elements being in intimate contact with parts other than the semiconductor body or integrated with parts other than the semiconductor body
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- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/508—Wavelength conversion elements having a non-uniform spatial arrangement or non-uniform concentration, e.g. patterned wavelength conversion layer, wavelength conversion layer with a concentration gradient of the wavelength conversion material
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- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
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- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
本發明提出一種可撓性微發光二極體顯示模組,係由一可撓性基板、一基板保護層、一晶格匹配層、複數個發光結構、一透明導電基板、以及一光色轉換層所組成。本發明特別令所述光色轉換層具有複數個紅光轉換單元、複數個綠光轉換單元與複數個藍光轉換單元,並以單一紅光轉換單元、單一綠光轉換單元、單一藍光轉換單元、與多個發光結構構成單一像素。如此設計,即使多個發光結構包含了數個無法正常發光的發光結構,仍舊可以利用像素補正電路對其它正常的發光結構進行亮度均勻性的調整,使得可撓性微發光二極體顯示模組的瑕疵像素能夠符合規定。
Description
本發明係關於顯示器的相關技術領域,尤指一種可撓性微發光二極體顯示模組。
隨著顯示器技術的高度發展,薄膜電晶體液晶顯示器(Thin film transistor liquid crystal display, TFT-LCD)現已完全取代傳統的陰極射線管(Cathode ray tube, CRT)顯示器。圖1即顯示習知的TFT-LCD顯示模組的示意性側面剖視圖。如圖1所示,TFT-LCD顯示模組1a係包括:背光單元11a、下偏光片12a、下玻璃基板13a、複數個光閥(optical valves)14a、液晶層15a、透明電極16a、彩色濾光片17a、上玻璃基板18a、以及上偏光片19a。其中,所述光閥14a即為薄膜電晶體,且彩色濾光片17a包括紅光轉換部、綠光轉換部與藍光轉換部。
值得說明的是,隨著薄膜電晶體之製程技術的進步,TFT-LCD顯示模組1a的像素密度也被顯著提升。可惜的是,肇因於液晶層15a非自發光(self-luminous)材料,以TFT-LCD顯示模組1a顯示影像之時,除了使用光閥14a控制液晶層15a的液晶排列方向之外,尚需要同時以背光單元11a提供白光並利用紅光轉換材料、綠光轉換材料與藍光轉換材料將白光轉換成紅光、綠光與藍光以構成一色光。熟悉TFT-LCD顯示模組1a之開發與製造的工程師應該都瞭解,液晶層15a的穿透率成為TFT-LCD顯示模組1a的光電效率低落、亮度不足與動態對比不佳的主因。另一方面,背光單元11a通常包括複數個白光LED元件與導光板;其中,白光LED元件所能提供的色飽和度仍不如三原色LED元件,導致TFT-LCD顯示模組1a能夠展現的最佳色域僅72%NTSC。
近年來,因具有節能、廣色域(~140%NTSC)、高亮度、高動態對比等優點,以LED顯示模組製成的各式LED顯示器獲得廣泛的應用。圖2即顯示現有的LED顯示模組的立體分解圖。如圖2所示,LED顯示模組1’係包括:玻璃基板11’、膠黏層12’、由複數紅光LED元件14R’、複數綠光LED元件14G’與複數藍光LED元件14B’組成的LED矩陣、攜載複數縱向導線16C’的第一導線基板15’、以及攜載複數橫向導線16R’的第二導線基板15b’。於LED顯示模組1’之中,一顆紅光LED元件14R’、一顆綠光LED元件14G’與一顆藍光LED元件14B’共同表示一個像素(pixel)。由此可推論,以Full HD(1920×1080)的5.5吋(12.2 cm × 6.8 cm)的LED顯示模組1’而言,每個像素大小(pixel size)約63μm × 63μm。
如長期涉及LED元件開發與製造的工程師所熟知的,GaN或InGaN為LED元件的主要發光材料,其中GaN本身具有缺陷密度過高的問題;同時,GaN與藍寶石(Al2
O3
)基板之間又具有晶格不匹配的問題。雖然可透過在GaN與藍寶石基板之間插入由AlN製成的晶格匹配層(或稱緩衝層)來解決所述晶格不匹配之問題,但是AlN製成的晶格匹配層本身帶有的缺陷卻也同時造成不同LED元件之間具有發光品質不一的問題。
繼續地參閱圖2,並請同時參閱圖3,係顯示LED顯示模組與其控制電路的架構圖。所述LED顯示模組1’之中的每個LED元件(14R’, 14G’, 14B’)通常係由包含列驅動單元2R’、欄驅動單元2C’、訊號控制與處理單元20’、以及像素補正單元2PC’的一顯示控制電路2’所控制。值得注意的是,每個像素的光色是由紅光LED元件14R’所發出的紅光、綠光LED元件14G’所發出的綠光、與藍光LED元件14B’所發出的藍光所決定。因此,基於不同LED元件之間會因為製程誤差顯示出發光品質不一的問題,現有的LED顯示模組1’的顯示控制電路2’通常會搭載像素補正單元2PC’,用以對每個像素內的紅光LED元件14R’、綠光LED元件14G’與藍光LED元件14B’進行亮度均勻性補償與白光色度校正。這樣的補償方式也被稱為「壞點修復」。然而,假設後端的像素補正單元2PC’仍舊無法完美地對一特定像素內的紅光LED元件14R’、綠光LED元件14G’與藍光LED元件14B’進行亮度均勻性補償,該特定像素便會被視為瑕疵像素(defective pixel)。下表(1)整理出目前IBM出產的筆記型電腦產品的最大容許壞點數。 表(1)
由上述說明可以得知,如何有效地減少LED顯示模組1’之瑕疵像素的數量成為各家顯示器廠商的主要課題。有鑑於此,本案之發明人係極力加以研究創作,而終於研發完成本發明之一種可撓性微發光二極體顯示模組。
習知的LED顯示模組係以一顆紅光LED元件、一顆綠光LED元件與一顆藍光LED元件構成單一像素,是以習知的LED顯示模組經常因為LED元件的主要發光材料(GaN)或晶格匹配層(AlN)具有過高的缺陷密度,故而於出廠時便帶有一定數量的瑕疵像素(defective pixel)。有鑑於此,本發明之主要目的在於提出一種可撓性微發光二極體顯示模組,其係由一可撓性基板、一基板保護層、一晶格匹配層、複數個發光結構、一透明導電基板、以及一光色轉換層所組成。本發明特別令所述光色轉換層具有複數個紅光轉換單元、複數個綠光轉換單元與複數個藍光轉換單元,並以單一紅光轉換單元、單一綠光轉換單元、單一藍光轉換單元、與多個發光結構構成單一像素。如此設計,即使多個發光結構包含數個無法正常發光的發光結構,仍舊可以利用像素補正電路對其它正常的發光結構進行亮度均勻性之調整,使得可撓性微發光二極體顯示模組的瑕疵像素能夠符合規定。
為了達成上述本發明之主要目的,本案發明人係提供所述可撓性微發光二極體顯示模組之一實施例,係包括: 一可撓性基板,係由一薄金屬製成; 一基板保護層,係覆於該可撓性基板之上,或包覆該可撓性基板; 一晶格匹配層,係形成於該基板保護層之上; 複數個發光結構,係形成於該晶格匹配層之上,並排列成一陣列;並且,每個發光結構係包括: 一第一半導體材料層,係形成於該晶格匹配層之上; 一主動層,係形成於該第一半導體材料層之上; 一第二半導體材料層,係形成於該主動層之上; 一第一電極,係電性連接該第一半導體材料層;及 一第二電極,係電性連接該第二半導體材料層; 一透明導電基板,係置於該複數個發光結構之上,並具有複數條第一導線與複數條第二導線;其中,每條第一導線係電性連接至該第一電極,且每條第二導線係電性連接至該第二電極;以及 一光色轉換層,係置於該透明導電基板之上,並具有複數個紅光轉換單元、複數個綠光轉換單元與複數個藍光轉換單元; 其中,每一個紅光轉換單元、每一個綠光轉換單元與每一個藍光轉換單元皆隔著該透明導電基板而覆蓋多個發光結構。
為了能夠更清楚地描述本發明所提出之一種可撓性微發光二極體顯示模組,以下將配合圖式,詳盡說明本發明之較佳實施例。
請參閱圖4,係顯示本發明之一種可撓性微發光二極體顯示模組的第一實施例的示意性立體圖。如圖4所示,本發明之可撓性微發光二極體顯示模組1可搭配顯示器殼體、相關驅動電路、與人機介面而被製成各式LED顯示器,並於基礎構成上包括:一可撓性基板10、一基板保護層11、一晶格匹配層12、複數個發光結構13、一透明導電基板14、以及一光色轉換層15。於本發明中,可撓性基板10可以是厚度介於20μm至500μm之間的一薄金屬基板,且該薄金屬基板的製程材料可以是不鏽鋼、銅、金、鎳、鉬、鈦、鎢、前述任兩者之組合、或前述任兩者以上之組合。並且,基板保護層11係覆於該可撓性基板10之上,且其厚度係介於50nm至1000nm之間。或者,於製程上亦可令基板保護層11整個包覆可撓性基板10。如此,在製造發光結構13的多個半導磊晶層之時,可藉由基板保護層11的阻絕而有效防止可撓性基板10受到磊晶材料的汙染。於此,該基板保護層11之製造材料可為下列任一者:二氧化矽(SiO2
)、二氧化鈦(TiO2
)、氧化鎳(NiO)、氧化鋁(Al2
O3
)、氧化鋅(ZnO)、氮化物、鹵化物、矽基化合物、前述任兩者之組合、或前述任兩者以上之組合。
值得注意的是,基板保護層11位於可撓性基板10與晶格匹配層12之間,且晶格匹配層12由具有特定晶向的單晶材料所製成,例如:氮化鋁(AlN)、未摻雜的氮化鎵(undoped GaN)、或氧化鋅(ZnO)。以二氧化矽與氮化鋁分別作為基板保護層11與晶格匹配層12的示範性材料,其中氮化鋁為六方纖鋅礦結構,具有a=0.311nm、c=0.498nm的晶格常數;另一方面,β-方石英晶系的二氧化矽(β-Cristobalite SiO2
)則具有a=0.499nm晶格常數。因此,熟悉薄膜沉積製程的工程師可以推知,以二氧化矽作為基板保護層11,除了能夠達到保護可撓性基板10避免其受到磊晶氣相物質的汙染以外,同時還可以令氮化鋁膜(即,晶格匹配層12)以c軸排向形成於該基板保護層11之上。須補充說明的是,其它可作為基板保護層11與晶格匹配層12的材料係整理於下表(2)與表(3)之中。 表(2)
表(3)
必須補充說明的是,晶格匹配層12的製造材料也可以選用晶格常數接近整數倍於GaN的單晶材料,例如:II-VI族半導體化合物的硫化鋅(ZnS)的晶格常數a=0.623nm、II-VI族半導體化合物的硒化鋅(ZnSe)的晶格常數a=0.653nm。另一方面,隨著發光顏色的不同,發光結構13的第一半導體材料層131、主動層132與第二半導體材料層133的材料的選用也跟著不同。傳統上,GaP、GaAsP、及AlGaAs為發光結構13之主動層132的主要材料,使得發光結構13能夠發出波長範圍介於580nm至740nm之間的可見光。然而,隨著有機金屬化學氣相沉積(metal-organic chemical vapor deposition, MOCVD)製程技術越趨進步,氮化鎵(GaN)、氮化鋁鎵(Alx
Ga1-x
N)、或氮化銦鎵(Inx
Ga1-x
N)已成為主動層132的主要材料。於本發明中,主要是以GaN作為發光結構13之中的主動層132,使該發光結構13發出藍色光。
熟悉LED晶粒(die)之設計與製造的元件工程師都知道的是,以GaN製成的主動層132會於第一半導體材料層131與第二半導體材料層133形成單一量子井結構;其中,所述第一半導體材料層131之製造材料為N型氮化鎵(n-type gallium nitride, n-GaN),例如摻雜矽(Si)的氮化鎵。另外,所述第二半導體材料層133之製造材料為P型氮化鎵(p-type gallium nitride, p-GaN),例如摻雜鎂(Mg)的氮化鎵。然而,為了提升電子與電洞於主動層132內的復合效率,也可以將主動層132進一步地設計成一個多重量子井結構;其中,該多重量子井結構可為下列任一者:氮化鎵(GaN)與氮化銦鎵(InxGa1-xN)的多重堆疊結構、氮化鎵(GaN)與氮化鋁鎵(AlxGa1-xN)的多重堆疊結構、或氮化鋁鎵(AlxGa1-xN)與氮化銦鎵(InxGa1-xN)的多重堆疊結構。
繼續地參閱圖4。第一電極134係電性連接該第一半導體材料層131,且所述第二電極135係形成於該第二半導體材料層133之上;其中,第一電極134與第二電極135的製造材料可為下列任一者:鋁(Al)、銀(Ag)、鈦(Ti)、鎳(Ni)、金(Au)、銅(Cu)、鉻(Cr)、鉑(Pt)、前述任兩者之組合、或前述任兩者以上之組合。例如,第一電極134與第二電極135可為鎳-金複合結構或鈦-鋁複合結構。如圖4所示,由複數個發光結構13所排列而成的一LED陣列係形成於晶格匹配層12之上,且透明導電基板14與光色轉換層15係依序地置於該LED陣列之上。其中,透明導電基板14具有複數條第一導線141與複數條第二導線142;並且,每條第一導線141係電性連接至該第一電極134,且每條第二導線142係電性連接至該第二電極135。
本發明最主要的技術特徵在於,令所述光色轉換層15具有複數個紅光轉換單元15R、複數個綠光轉換單元15G與複數個藍光轉換單元15B,並同時使得每一個紅光轉換單元15R、每一個綠光轉換單元15G與每一個藍光轉換單元15B皆對應有多個發光結構13。請再同時參閱圖5所顯示的光色轉換層與複數個發光結構的上視圖;並且,請同時參閱圖6,係顯示光色轉換層、透明導電基板與複數個發光結構的側面剖視圖。根據本發明之設計,單一紅光轉換單元15R會將多個發光結構13所發出的藍光轉換成一紅光(例如圖6所示),單一綠光轉換單元15G會將多個發光結構13所發出的藍光轉換成一綠光,且單一藍光轉換單元15B會將多個發光結構13所發出的藍光轉換成具有特定波長的藍光。換句話說,以Full HD(1920×1080)的5.5吋(12.2 cm × 6.8 cm)的可撓性微發光二極體顯示模組1而言,由一個紅光轉換單元15R、一個綠光轉換單元15G與一個藍光轉換單元15B所構成的單一像素大小(pixel size)約63μm × 63μm;並且,每一個色光轉換單元底下對應有多個發光結構13。
繼續地參閱圖4、圖5與圖6,並請同時參閱圖7。係顯示可撓性微發光二極體顯示模組與其控制電路的架構圖。所述可撓性微發光二極體顯示模組1之中的每個發光結構13係由包含列驅動單元2R、欄驅動單元2C、訊號控制與處理單元20、以及像素補正單元2PC的一顯示控制電路2所控制。圖8係顯示光色轉換層與複數個發光結構的上視圖。由圖8可發現,利用亮度對電流實驗方法(L-I-V curve)可發現,紅光轉換單元15R下方的多個發光結構13包含兩個不良晶粒;並且,綠光轉換單元15G與藍光轉換單元15B下方的多個發光結構13同樣也包含兩個不良晶粒。在這種情況下,仍舊可以利用像素補正單元2PC透過訊號控制與處理單元20對其它正常的發光結構13進行亮度均勻性補償,使得每個畫素所發出的色光的平均亮度盡量相同。簡單地說,不同於習知技術係以單一紅光LED元件14R’、單一綠光LED元件14G’與單一藍光LED元件14B’構成單一像素(如圖2所示),本發明係以單一紅光轉換單元15R、單一綠光轉換單元15G、單一藍光轉換單元15B、與複數個發光結構13構成單一像素。並且,根據本發明之特殊設計,即使該複數個發光結構13之中包含了多個異常的LED晶粒,其它正常的發光結構13仍舊可以發出藍光,並由紅光轉換單元15R、綠光轉換單元15G與藍光轉換單元15B轉換成紅光、綠光與藍光之後,而後發出一色光以表示該像素。
繼續地參閱圖9,係顯示發光結構的側面剖視圖。如圖9所示,為了提升每個發光結構13的出光效率(out coupling efficiency),於製程上可於第一電極134與第一半導體材料層131之間設置一第一透明導電基層134a,並同時於第二電極135與第二半導體材料層133之間設置一第二透明導電基層135a。並且,就製程上而言,第一透明導電基層134a與第二透明導電基層135a可以是氧化銦錫(Indium tin oxide, ITO)薄膜、氧化鋅(ZnO)薄膜、鎳-金複合薄膜。
另一方面,本發明係藉由摻雜複數個光色轉換粒子於一膠體封裝層之中的方式,製成所謂的光色轉換層15。可想而知,該複數個光色轉換粒子係膠體封裝層之中構成該複數個紅光轉換單元15R、該複數個綠光轉換單元15G與該複數個藍光轉換單元15B。特別地,所述光色轉換粒子可以是螢光粉或者量子點,且其常用的製程材料係整理於下表(4)與表(5)之中。 表(4)
表(5)
接著請參閱圖10,係顯示本發明之可撓性微發光二極體顯示模組的第二實施例的示意性立體圖。比較圖4與圖10可以得知,藉由將一微透鏡陣列19加入前述第一實施例的結構中,便可獲得所述可撓性微發光二極體顯示模組的第二實施例。如圖10所示,所述微透鏡陣列19係設置於該光色轉換層15之上。
如此,上述係已完整且清楚地說明本發明之可撓性微發光二極體顯示模組;並且,經由上述可知本發明係具有下列之優點:
(1)習知的LED顯示模組1’(如圖2所示)係以一顆紅光LED元件14R’、一顆綠光LED元件14G’與一顆藍光LED元件14B’構成單一像素,是以習知的LED顯示模組1’經常因為LED元件的主要發光材料(GaN)或晶格匹配層具有過高的缺陷密度,故而於出廠時便帶有一定數量的瑕疵像素(defective pixel)。有鑑於此,本發明提出一種可撓性微發光二極體顯示模組,其係由一可撓性基板10、一基板保護層11、一晶格匹配層12、複數個發光結構13、一透明導電基板14、以及一光色轉換層15所組成。本發明特別令光色轉換層15具有複數個紅光轉換單元15R、複數個綠光轉換單元15G與複數個藍光轉換單元15B,並以單一紅光轉換單元15R、單一綠光轉換單元15G、單一藍光轉換單元15B、與多個發光結構13構成單一像素。如此設計,即使多個發光結構13包含數個無法正常發光的發光結構13,仍舊可以利用像素補正單元2PC對其它正常的發光結構13進行亮度均勻性之調整,使得可撓性微發光二極體顯示模組的瑕疵像素能夠符合規定。
必須加以強調的是,上述之詳細說明係針對本發明可行實施例之具體說明,惟該實施例並非用以限制本發明之專利範圍,凡未脫離本發明技藝精神所為之等效實施或變更,均應包含於本案之專利範圍中。
<本發明>
1‧‧‧可撓性微發光二極體顯示模組
10‧‧‧可撓性基板
11‧‧‧基板保護層
12‧‧‧晶格匹配層
13‧‧‧發光結構
14‧‧‧透明導電基板
15‧‧‧光色轉換層
131‧‧‧第一半導體材料層
132‧‧‧主動層
133‧‧‧第二半導體材料層
134‧‧‧第一電極
135‧‧‧第二電極
141‧‧‧第一導線
142‧‧‧第二導線
15R‧‧‧紅光轉換單元
15G‧‧‧綠光轉換單元
15B‧‧‧藍光轉換單元
134a‧‧‧第一透明導電基層
135a‧‧‧第二透明導電基層
19‧‧‧微透鏡陣列
2‧‧‧顯示控制電路
2R‧‧‧列驅動單元
2C‧‧‧欄驅動單元
20‧‧‧訊號控制與處理單元
2PC‧‧‧像素補正單元
<習知>
1a‧‧‧TFT-LCD顯示模組
11a‧‧‧背光單元
12a‧‧‧下偏光片
13a‧‧‧下玻璃基板
14a‧‧‧光閥
15a‧‧‧液晶層
16a‧‧‧透明電極
17a‧‧‧彩色濾光片
18a‧‧‧上玻璃基板
19a‧‧‧上偏光片
1’‧‧‧LED顯示模組
11’‧‧‧玻璃基板
12’‧‧‧膠黏層
14R’‧‧‧紅光LED元件
14G’‧‧‧綠光LED元件
14B’‧‧‧藍光LED元件
15’‧‧‧第一導線基板
16C’‧‧‧縱向導線
15b’‧‧‧第二導線基板
16R’‧‧‧橫向導線
2’‧‧‧顯示控制電路
2R’‧‧‧列驅動單元
2C’‧‧‧欄驅動單元
20’‧‧‧訊號控制與處理單元
2PC’‧‧‧像素補正單元
圖1係顯示習知的TFT-LCD顯示模組的示意性側面剖視圖; 圖2係顯示現有的LED顯示模組的立體分解圖; 圖3係顯示LED顯示模組與其控制電路的架構圖; 圖4係顯示本發明之一種可撓性微發光二極體顯示模組的第一實施例的示意性立體圖; 圖5係顯示光色轉換層與複數個發光結構的上視圖; 圖6係顯示光色轉換層、透明導電基板與複數個發光結構的側面剖視圖; 圖7係顯示可撓性微發光二極體顯示模組與其控制電路的架構圖; 圖8係顯示光色轉換層與複數個發光結構的上視圖; 圖9係顯示發光結構的側面剖視圖; 圖10係顯示本發明之可撓性微發光二極體顯示模組的第二實施例的示意性立體圖。
Claims (14)
- 一種可撓性微發光二極體顯示模組,係包括: 一可撓性基板,係由一薄金屬製成; 一基板保護層,係覆於該可撓性基板之上,或包覆該可撓性基板; 一晶格匹配層,係形成於該基板保護層之上; 複數個發光結構,係形成於該晶格匹配層之上,並排列成一陣列;並且,每個發光結構係包括: 一第一半導體材料層,係形成於該晶格匹配層之上; 一主動層,係形成於該第一半導體材料層之上; 一第二半導體材料層,係形成於該主動層之上; 一第一電極,係電性連接該第一半導體材料層;及 一第二電極,係電性連接該第二半導體材料層; 一透明導電基板,係置於該複數個發光結構之上,並具有複數條第一導線與複數條第二導線;其中,每條第一導線係電性連接至該第一電極,且每條第二導線係電性連接至該第二電極;以及 一光色轉換層,係置於該透明導電基板之上,並具有複數個紅光轉換單元、複數個綠光轉換單元與複數個藍光轉換單元; 其中,每一個紅光轉換單元、每一個綠光轉換單元與每一個藍光轉換單元係隔著該透明導電基板而覆蓋多個發光結構。
- 如申請專利範圍第1項所述之可撓性微發光二極體顯示模組,其中,所述薄金屬的製造材料可為下列任一者:不鏽鋼、銅、金、鎳、鉬、鈦、鎢、前述任兩者之組合、或前述任兩者以上之組合。
- 如申請專利範圍第1項所述之可撓性微發光二極體顯示模組,其中,所述晶格匹配層之製造材料可為下列任一者:氮化鋁(AlN)、未摻雜的氮化鎵(undoped GaN)、或氧化鋅(ZnO)。
- 如申請專利範圍第1項所述之可撓性微發光二極體顯示模組,其中,所述基板保護層之製造材料可為下列任一者:二氧化矽(SiO2 )、二氧化鈦(TiO2 )、氧化鎳(NiO)、氧化鋁(Al2 O3 )、氧化鋅(ZnO)、氮化物、鹵化物、矽基化合物、前述任兩者之組合、或前述任兩者以上之組合。
- 如申請專利範圍第1項所述之可撓性微發光二極體顯示模組,其中,所述第一半導體材料層之製造材料為N型氮化鎵(n-type gallium nitride, n-GaN),且所述第二半導體材料層之製造材料為P型氮化鎵(p-type gallium nitride, p-GaN)。
- 如申請專利範圍第1項所述之可撓性微發光二極體顯示模組,其中,所述主動層於該第一半導體材料層與該第二半導體材料層形成單一量子井結構,且該主動層的製造材料可為下列任一者:氮化鎵(GaN)、氮化鋁鎵(Alx Ga1-x N)、或氮化銦鎵(Inx Ga1-x N)。
- 如申請專利範圍第1項所述之可撓性微發光二極體顯示模組,其中,所述主動層於該第一半導體材料層與該第二半導體材料層形成一個多重量子井結構,且該多重量子井結構可為下列任一者:氮化鎵與氮化銦鎵(Inx Ga1-x N)的多重堆疊結構、氮化鎵與氮化鋁鎵(Alx Ga1-x N)的多重堆疊結構、或氮化鋁鎵(Alx Ga1-x N)與氮化銦鎵(Inx Ga1-x N)的多重堆疊結構。
- 如申請專利範圍第1項所述之可撓性微發光二極體顯示模組,其中,所述第一電極與所述第二電極的製造材料可為下列任一者:鋁(Al)、銀(Ag)、鈦(Ti)、鎳(Ni)、金(Au)、銅(Cu)、鉻(Cr)、鉑(Pt)、前述任兩者之組合、或前述任兩者以上之組合。
- 如申請專利範圍第1項所述之可撓性微發光二極體顯示模組,其中,該可撓性基板的厚度係介於20μm至500μm之間,且該基板保護層的厚度係介於50nm至1000nm之間。
- 如申請專利範圍第1項所述之可撓性微發光二極體顯示模組,更包括: 一透明導電基板,係形成於該第一電極與該第一半導體材料層之間,並同時形成於該第二電極與該第二半導體材料層之間。
- 如申請專利範圍第1項所述之可撓性微發光二極體顯示模組,其中,該光色轉換層為一膠體封裝層,且複數個光色轉換粒子係摻雜於該膠體封裝層之中,以構成該複數個紅光轉換單元、該複數個綠光轉換單元與該複數個藍光轉換單元。
- 如申請專利範圍第1項所述之可撓性微發光二極體顯示模組,更包括:一微透鏡陣列,係設置於該光色轉換層之上。
- 如申請專利範圍第11項所述之可撓性微發光二極體顯示模組,其中,該光色轉換粒子可為下列任一者:矽酸鹽類螢光粉、鋁酸鹽類螢光粉、磷酸鹽類螢光粉、硫化物螢光粉、氮化物螢光粉、或氮氧化物螢光粉。
- 如申請專利範圍第11項所述之可撓性微發光二極體顯示模組,其中,該光色轉換粒子為一量子點,且所述量子點可為下列任一者:II-VI族複合物、III-V族複合物、具有殼-核結構之II-VI族複合物、具有殼-核結構之III-V族複合物、具有合金結構之非球形II-VI量子點、上述任兩者之組合、或上述任兩者以上之組合。
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- 2018-03-02 US US15/910,148 patent/US10177124B1/en not_active Expired - Fee Related
- 2018-03-06 JP JP2018039633A patent/JP6615925B2/ja not_active Expired - Fee Related
- 2018-03-08 CN CN201810191167.9A patent/CN110085617A/zh active Pending
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JP6615925B2 (ja) | 2019-12-04 |
JP2019129305A (ja) | 2019-08-01 |
US10177124B1 (en) | 2019-01-08 |
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