TW201925528A - Light irradiation apparatus and thin film forming apparatus capable of finely activating an indium oxide precursor through heating the substrate - Google Patents

Light irradiation apparatus and thin film forming apparatus capable of finely activating an indium oxide precursor through heating the substrate Download PDF

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TW201925528A
TW201925528A TW107141558A TW107141558A TW201925528A TW 201925528 A TW201925528 A TW 201925528A TW 107141558 A TW107141558 A TW 107141558A TW 107141558 A TW107141558 A TW 107141558A TW 201925528 A TW201925528 A TW 201925528A
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substrate
light irradiation
indium oxide
excimer lamps
oxide precursor
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TW107141558A
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Chinese (zh)
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柿村崇
北村嘉孝
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日商斯庫林集團股份有限公司
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Abstract

The present invention provides a light irradiation apparatus and a thin film forming apparatus capable of finely activating an indium oxide precursor. A substrate (W) on which a coating film including an indium oxide precursor is formed is irradiated with ultraviolet light from a plurality of excimer lamps (51). The irradiation interval d between the plurality of excimer lamps (51) and the substrate (W) is significantly shorter than the arrangement interval (p) of the plurality of excimer lamps (51). The irradiation interval (d) is 2 mm or more and 10 mm or less. The space between the plurality of excimer lamps (51) and the substrate (W) is set as an atmospheric environment. By sliding the substrate (W) relative to the plurality of excimer lamps (51), whereby the ultraviolet ray is uniformly irradiated onto the coating film on the substrate (W) in an atmosphere containing oxygen, and thus the indium oxide precursor contained in the coating film is finely optically activated.

Description

光照射裝置及薄膜形成裝置Light irradiation device and film forming device

本發明是關於一種對用於半導體用途的形成有包含氧化銦的前驅物的塗布膜的基板照射紫外線來使此氧化銦前驅物光學活化的光照射裝置、以及包括此光照射裝置的薄膜形成裝置。The present invention relates to a light irradiation device that irradiates ultraviolet light on a substrate on which a coating film containing an indium oxide precursor is formed for semiconductor use to optically activate the indium oxide precursor, and a thin film forming device including the light irradiation device .

典型的是在使氧化銦等金屬氧化物的薄膜成膜時使用濺鍍技術。在濺鍍技術中,在真空腔室內使氬等的離子碰撞靶材,並使已被打出的粒子堆積在基板的表面上而使薄膜成膜。但是,濺鍍技術除需要產生高真空的裝置以外,具有如下的缺點:當使金屬氧化膜成膜時,產生氧缺位(oxygen vacancy)且薄膜的特性下降。另外,在濺鍍技術中,也存在難以調整薄膜的組成比這一問題。A sputtering technique is typically used when forming a thin film of a metal oxide such as indium oxide. In the sputtering technique, ions such as argon are collided with a target in a vacuum chamber, and the particles that have been printed are deposited on the surface of the substrate to form a thin film. However, in addition to the apparatus which requires a high vacuum, the sputtering technique has a drawback in that when a metal oxide film is formed into a film, oxygen vacancy occurs and the characteristics of the film are degraded. Further, in the sputtering technique, there is also a problem that it is difficult to adjust the composition ratio of the film.

因此,正在研究使用液相法來製造金屬氧化物的薄膜。例如,在專利文獻1、專利文獻2中提出有如下的技術:將含有氧化銦前驅物的組成物塗布在基板上,對所述組成物照射規定波長範圍的紫外線後,通過熱來將組成物轉換成含有氧化銦的層。 [現有技術文獻] [專利文獻]Therefore, a liquid phase method for producing a film of a metal oxide is being studied. For example, Patent Document 1 and Patent Document 2 propose a technique in which a composition containing an indium oxide precursor is applied onto a substrate, and the composition is irradiated with ultraviolet rays of a predetermined wavelength range, and then the composition is heated by heat. Converted to a layer containing indium oxide. [Prior Art Document] [Patent Literature]

[專利文獻1]國際公開第2011/073005號 [專利文獻2]國際公開第2012/062575號[Patent Document 1] International Publication No. 2011/073005 [Patent Document 2] International Publication No. 2012/062575

[發明所要解決的問題] 對含有氧化銦前驅物的組成物照射紫外線是為了使此氧化銦前驅物光學活化,在專利文獻1、專利文獻2中揭示有使用低壓水銀燈照射紫外線。但是,從低壓水銀燈中照射的紫外線的能量低,因此存在無法使氧化銦前驅物充分地活化這一問題。[Problems to be Solved by the Invention] The composition containing the indium oxide precursor is irradiated with ultraviolet rays in order to optically activate the indium oxide precursor. Patent Document 1 and Patent Document 2 disclose that ultraviolet rays are irradiated using a low-pressure mercury lamp. However, since the energy of the ultraviolet ray irradiated from the low pressure mercury lamp is low, there is a problem that the indium oxide precursor cannot be sufficiently activated.

本發明是鑒於所述課題而成者,其目的在於提供一種可使氧化銦前驅物良好地活化的光照射裝置及薄膜形成裝置。 [解決問題的技術手段]The present invention has been made in view of the above problems, and an object thereof is to provide a light irradiation device and a thin film forming device which can activate a fine indium oxide precursor well. [Technical means to solve the problem]

為了解決所述課題,技術手段1的發明是一種對形成有包含氧化銦前驅物的塗布膜的基板照射紫外線來使此氧化銦前驅物光學活化的光照射裝置,其特徵在於包括:多個棒狀的準分子燈,沿著規定方向相互平行地排列;以及移動部,使所述基板相對於多個所述準分子燈,沿著所述規定方向相對地移動;且多個所述準分子燈與通過所述移動部而移動的所述基板的照射間隔比多個所述準分子燈的排列間隔短。In order to solve the above problems, the invention of the first aspect of the invention is a light irradiation device which irradiates ultraviolet light on a substrate on which a coating film containing an indium oxide precursor is formed to optically activate the indium oxide precursor, and is characterized in that it includes a plurality of rods. Excimer lamps arranged in parallel with each other along a predetermined direction; and a moving portion for relatively moving the substrate along the predetermined direction with respect to the plurality of the excimer lamps; and a plurality of the excimer The irradiation interval between the lamp and the substrate moved by the moving portion is shorter than the arrangement interval of the plurality of excimer lamps.

另外,技術手段2的發明是根據技術手段1的發明的光照射裝置,其特徵在於:所述照射間隔為2 mm以上且10 mm以下。Further, the invention of the invention is the light irradiation device according to the invention of the first aspect, characterized in that the irradiation interval is 2 mm or more and 10 mm or less.

另外,技術手段3的發明是根據技術手段1或技術手段2的發明的光照射裝置,其特徵在於:所述移動部使所述基板相對於多個所述準分子燈往返移動。Further, the invention of the invention is the light irradiation device according to the invention of the first aspect or the technical means 2, wherein the moving unit reciprocates the substrate with respect to the plurality of excimer lamps.

另外,技術手段4的發明是根據技術手段1至技術手段3的任一者的發明的光照射裝置,其特徵在於:將多個所述準分子燈與通過所述移動部而移動的所述基板之間設為含有氧的環境。Further, the invention of the invention is the light irradiation device according to any one of the technical means 1 to 3, characterized in that the plurality of the excimer lamps and the movement by the moving portion are An environment containing oxygen is provided between the substrates.

另外,技術手段5的發明是根據技術手段4的發明的光照射裝置,其特徵在於:所述環境中的氧濃度為15%以上且20%以下。Further, the invention of the invention is the light irradiation device according to the invention of the fourth aspect, characterized in that the oxygen concentration in the environment is 15% or more and 20% or less.

另外,技術手段6的發明是一種形成包含氧化銦的薄膜的薄膜形成裝置,其特徵在於包括:塗布處理部,將含有氧化銦前驅物的塗布液塗布在基板上而在所述基板上形成塗布膜;技術手段1至技術手段5的任一者中記載的光照射裝置;以及熱處理部,對通過所述光照射裝置而使所述氧化銦前驅物光學活化的所述基板進行加熱來使所述氧化銦前驅物熱活化。Further, the invention of the sixth aspect of the invention is a thin film forming apparatus for forming a thin film containing indium oxide, comprising: a coating processing unit that applies a coating liquid containing an indium oxide precursor onto a substrate to form a coating on the substrate a film; the light irradiation device according to any one of the technical means 1 to 5; and a heat treatment unit that heats the substrate that optically activates the indium oxide precursor by the light irradiation device The indium oxide precursor is thermally activated.

另外,技術手段7的發明是根據技術手段6的發明的薄膜形成裝置,其特徵在於:還包括:搬入搬出部,搬入未處理的基板,並且搬出處理完的基板;以及搬送機器人,針對所述搬入搬出部、所述塗布處理部、所述熱處理部及所述光照射裝置搬送基板;且在所述搬送機器人的周圍配置所述搬入搬出部、所述塗布處理部、所述熱處理部及所述光照射裝置。According to a fourth aspect of the invention, in the film forming apparatus according to the invention of the sixth aspect of the invention, further comprising: a loading/unloading unit, loading an unprocessed substrate, and carrying out the processed substrate; and transporting the robot The loading/unloading unit, the coating processing unit, the heat treatment unit, and the light irradiation device transport the substrate; and the loading/unloading unit, the coating processing unit, the heat treatment unit, and the storage unit are disposed around the transfer robot The light irradiation device is described.

另外,技術手段8的發明是根據技術手段6的發明的薄膜形成裝置,其特徵在於:還包括:搬入部,搬入未處理的基板;搬出部,搬出處理完的基板;第1搬送機器人,針對所述搬入部、所述塗布處理部及所述光照射裝置搬送基板;以及第2搬送機器人,針對所述光照射裝置、所述熱處理部及所述搬出部搬送基板;且在所述第1搬送機器人與所述第2搬送機器人之間配置所述光照射裝置。 [發明的效果]According to a third aspect of the invention, there is provided a film forming apparatus according to the invention of the sixth aspect, further comprising: a loading unit that carries an unprocessed substrate; and a carrying unit that carries out the processed substrate; and the first transport robot The loading unit, the coating processing unit, and the light irradiation device transport the substrate; and the second transfer robot transports the substrate to the light irradiation device, the heat treatment unit, and the carry-out unit; and the first The light irradiation device is disposed between the transfer robot and the second transfer robot. [Effects of the Invention]

根據技術手段1至技術手段8的發明,由於包括多個棒狀的準分子燈,且多個準分子燈與通過移動部而移動的基板的照射間隔比多個準分子燈的排列間隔短,因此可使用放射的紫外線的能量高的準分子燈來使氧化銦前驅物良好地活化。According to the inventions of the technical means 1 to 8, the plurality of rod-shaped excimer lamps are included, and the irradiation intervals of the plurality of excimer lamps and the substrate moved by the moving portion are shorter than the arrangement intervals of the plurality of excimer lamps. Therefore, an excimer lamp having a high energy of ultraviolet rays emitted can be used to cause the indium oxide precursor to be well activated.

以下,一面參照圖式一面對本發明的實施方式進行詳細說明。Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

<第1實施方式> 圖1是表示本發明的薄膜形成裝置的整體配置結構的圖。本發明的薄膜形成裝置1是在基板的表面上形成含有氧化銦的薄膜的裝置。成為處理對象的基板可以是玻璃基板,也可以是半導體晶片(本實施方式中為矩形的玻璃基板)。另外,成為處理對象的基板的形狀或尺寸也無特別限定,可設為適宜的形狀或尺寸。薄膜形成裝置1包括:裝載機/卸載機20、塗布處理部30、熱處理部40、光照射處理部50及搬送機器人10。在第1實施方式中,採用在搬送機器人10的周圍配置有裝載機/卸載機20、塗布處理部30、熱處理部40及光照射處理部50的所謂的集束型設備(cluster tool)型的佈局。另外,在圖1及以後的各圖中,為了容易理解,視需要將各部的尺寸或數量誇張或簡化來描繪。<First Embodiment> Fig. 1 is a view showing an overall arrangement structure of a thin film forming apparatus of the present invention. The thin film forming apparatus 1 of the present invention is a device for forming a thin film containing indium oxide on the surface of a substrate. The substrate to be processed may be a glass substrate or a semiconductor wafer (a rectangular glass substrate in the present embodiment). Further, the shape or size of the substrate to be processed is not particularly limited, and may be an appropriate shape or size. The film forming apparatus 1 includes a loader/unloader 20, a coating processing unit 30, a heat treatment unit 40, a light irradiation processing unit 50, and a transfer robot 10. In the first embodiment, a so-called cluster tool type layout in which the loader/unloader 20, the coating processing unit 30, the heat treatment unit 40, and the light irradiation processing unit 50 are disposed around the transport robot 10 is employed. . In addition, in each of FIG. 1 and subsequent figures, in order to make it easy to understand, it is necessary to exaggerate or simplify the dimension or number of each part as needed.

裝載機/卸載機20是將未處理的基板搬入薄膜形成裝置1中,並且將薄膜形成處理已結束的基板從薄膜形成裝置1中搬出的搬入搬出部。裝載機/卸載機20包括收納未處理及處理完的基板的收納部、及與搬送機器人10進行基板的交接的移載機器人等(均省略圖示)。The loader/unloader 20 is a loading/unloading unit that carries an unprocessed substrate into the film forming apparatus 1 and carries out the film forming process from the film forming apparatus 1 . The loader/unloader 20 includes a storage unit that houses an unprocessed and processed substrate, and a transfer robot that transfers the substrate to the transfer robot 10 (all of which are not shown).

塗布處理部30是將含有氧化銦前驅物的塗布液塗布在基板的表面上而在基板上形成此塗布液的塗布膜的處理部。作為塗布處理部30,例如可採用:使噴出塗布液的狹縫噴嘴以固定速度對保持為靜止狀態的基板掃描並塗布塗布液的狹縫塗布機、或者一面使基板旋轉一面對此基板的旋轉中心噴出塗布液來使塗布液在基板表面上擴散的旋塗機等。The coating treatment unit 30 is a treatment unit that applies a coating liquid containing an indium oxide precursor onto the surface of the substrate to form a coating film of the coating liquid on the substrate. The coating processing unit 30 may be, for example, a slit coater that scans a substrate that is held in a stationary state at a fixed speed by a slit nozzle that ejects the coating liquid, or rotates the substrate while rotating the substrate. A spin coater or the like that ejects the coating liquid from the center of rotation to spread the coating liquid on the surface of the substrate.

熱處理部40是對通過光照射處理部50而使塗布膜中所含有的氧化銦前驅物光學活化的基板進行加熱來使此氧化銦前驅物熱活化的處理部。作為熱處理部40,例如可使用通過吹送熱風來對基板進行加熱的熱處理爐。熱處理部40將基板加熱至約350℃。The heat treatment unit 40 is a treatment unit that heats the substrate that optically activates the indium oxide precursor contained in the coating film by the light irradiation treatment unit 50 to thermally activate the indium oxide precursor. As the heat treatment unit 40, for example, a heat treatment furnace that heats the substrate by blowing hot air can be used. The heat treatment portion 40 heats the substrate to about 350 °C.

搬送機器人10與裝載機/卸載機20、塗布處理部30、熱處理部40及光照射處理部50進行基板的交接來將基板依次搬送至這些處理部中。The transport robot 10 and the loader/unloader 20, the coating processing unit 30, the heat treatment unit 40, and the light irradiation processing unit 50 transfer the substrates to sequentially transport the substrates to the processing units.

圖2是表示光照射處理部50的結構的圖。光照射處理部50是本發明的光照射裝置,其對形成有包含氧化銦前驅物的塗布膜的基板照射紫外線來使此氧化銦前驅物光學活化。光照射處理部50包括多個準分子燈51與使基板W移動的移動部55。FIG. 2 is a view showing a configuration of the light irradiation processing unit 50. The light irradiation treatment unit 50 is a light irradiation device according to the present invention, which irradiates ultraviolet light on a substrate on which a coating film containing an indium oxide precursor is formed to optically activate the indium oxide precursor. The light irradiation processing unit 50 includes a plurality of excimer lamps 51 and a moving portion 55 that moves the substrate W.

多支(第1實施方式中為三支)準分子燈51分別為棒狀的燈。在第1實施方式中,以各準分子燈51的長邊方向沿著水平方向相互變得平行的方式排列有三支準分子燈51。準分子燈51是在由放電等離子體所激發的放電氣體恢復成基底狀態時發出特有的光譜的紫外線(準確而言,真空紫外線(Vacuum Ultraviolet,VUV))的燈。本實施方式的準分子燈51放射波長為172 nm的真空紫外線。A plurality of (three in the first embodiment) excimer lamps 51 are rod-shaped lamps. In the first embodiment, three excimer lamps 51 are arranged such that the longitudinal direction of each excimer lamp 51 is parallel to each other in the horizontal direction. The excimer lamp 51 is a lamp that emits a specific spectrum of ultraviolet rays (accurately, vacuum ultraviolet (VUV)) when the discharge gas excited by the discharge plasma returns to the base state. The excimer lamp 51 of the present embodiment emits vacuum ultraviolet rays having a wavelength of 172 nm.

移動部55包括多個搬送輥56及驅動部57。多個搬送輥56以各自的長邊方向沿著水平方向相互變得平行的方式排列在多個準分子燈51的下方。驅動部57使多個搬送輥56同步旋轉。多個搬送輥56通過驅動部57而在正方向或反方向上旋轉,由此如圖2中的箭頭AR2所示般,由多個搬送輥56支撐的基板W沿著水平方向(即,多個準分子燈51的排列方向)滑動移動。另外,多個搬送輥56的直徑及根數可設為對應於基板W的尺寸的適宜的直徑及根數。The moving unit 55 includes a plurality of conveying rollers 56 and a driving unit 57. The plurality of transport rollers 56 are arranged below the plurality of excimer lamps 51 such that their respective longitudinal directions are parallel to each other in the horizontal direction. The drive unit 57 rotates the plurality of transport rollers 56 in synchronization. The plurality of conveying rollers 56 are rotated in the forward direction or the reverse direction by the driving portion 57, whereby the substrate W supported by the plurality of conveying rollers 56 is horizontally (that is, plural as shown by an arrow AR2 in FIG. 2) The alignment direction of the excimer lamp 51 is slidably moved. Further, the diameter and the number of the plurality of conveying rollers 56 can be set to an appropriate diameter and number corresponding to the size of the substrate W.

圖3是將多個準分子燈51的附近放大表示的圖。多個準分子燈51沿著水平方向隔開均等的間隔而相互平行地排列。多個準分子燈51的排列間隔p為30 mm~60 mm。所謂排列間隔p,是指鄰接的準分子燈51的中心間距離。另外,棒狀的各準分子燈51的直徑約為20 mm。FIG. 3 is an enlarged view of the vicinity of a plurality of excimer lamps 51. The plurality of excimer lamps 51 are arranged in parallel with each other at equal intervals in the horizontal direction. The arrangement interval p of the plurality of excimer lamps 51 is 30 mm to 60 mm. The arrangement interval p refers to the distance between the centers of the adjacent excimer lamps 51. Further, each of the rod-shaped excimer lamps 51 has a diameter of about 20 mm.

另一方面,多個準分子燈51與通過移動部55而移動的基板W之間的照射間隔d為2 mm以上且10 mm以下。即,多個準分子燈51與通過移動部55而移動的基板W的照射間隔d明顯比多個準分子燈51的排列間隔p短。另外,嚴格來說,照射間隔d是準分子燈51的外壁面的下端與通過移動部55而使基板W存在於此準分子燈51的下方時的基板W的上表面的間隔。三支準分子燈51沿著水平方向排列,基板W通過移動部55而沿著水平方向移動,因此三支準分子燈51的各者與基板W的照射間隔d一樣。On the other hand, the irradiation interval d between the plurality of excimer lamps 51 and the substrate W moved by the moving portion 55 is 2 mm or more and 10 mm or less. That is, the irradiation interval d between the plurality of excimer lamps 51 and the substrate W moved by the moving portion 55 is significantly shorter than the arrangement interval p of the plurality of excimer lamps 51. In addition, strictly speaking, the irradiation interval d is the interval between the lower end of the outer wall surface of the excimer lamp 51 and the upper surface of the substrate W when the substrate W is present under the excimer lamp 51 by the moving portion 55. The three excimer lamps 51 are arranged in the horizontal direction, and the substrate W is moved in the horizontal direction by the moving portion 55. Therefore, each of the three excimer lamps 51 has the same irradiation interval d as the substrate W.

另外,在各準分子燈51的外壁面的附近設置有環境調整機構59。環境調整機構59包括省略圖示的排氣機構與供氧機構,可調整對應的準分子燈51與基板W之間的空間的環境。另外,在本實施方式中,環境調整機構59未進行特別的環境調整,多個準分子燈51與基板W之間的空間為大氣環境。Further, an environment adjustment mechanism 59 is provided in the vicinity of the outer wall surface of each excimer lamp 51. The environment adjustment mechanism 59 includes an exhaust mechanism and an oxygen supply mechanism (not shown), and can adjust the environment of the space between the corresponding excimer lamp 51 and the substrate W. Further, in the present embodiment, the environment adjustment mechanism 59 does not perform special environmental adjustment, and the space between the plurality of excimer lamps 51 and the substrate W is an atmospheric environment.

繼而,對具有所述結構的薄膜形成裝置1中的處理程序進行說明。圖4是表示薄膜形成裝置1中的處理程序的流程圖。Next, the processing procedure in the thin film forming apparatus 1 having the above configuration will be described. FIG. 4 is a flowchart showing a processing procedure in the thin film forming apparatus 1.

首先,將未處理的基板W搬入薄膜形成裝置1中(步驟S1)。具體而言,將未處理的基板W從薄膜形成裝置1的外部搬入裝載機/卸載機20中。在被搬入裝載機/卸載機20中之前的基板W的表面上形成有電晶體等元件的圖案。作為先於朝裝載機/卸載機20中搬入基板W進行的處理,可以先進行此基板W的表面清洗處理。作為此種清洗處理,可例示:利用藥液對基板W的表面進行清洗的藥液清洗、或利用刷子機械式地從基板W的表面上去除污染物質的刷子清洗等。First, the unprocessed substrate W is carried into the film forming apparatus 1 (step S1). Specifically, the unprocessed substrate W is carried into the loader/unloader 20 from the outside of the film forming apparatus 1. A pattern of an element such as a transistor is formed on the surface of the substrate W before being carried into the loader/unloader 20. The surface cleaning process of the substrate W may be performed first as a process of loading the substrate W into the loader/unloader 20. As such a cleaning treatment, a chemical liquid for cleaning the surface of the substrate W by a chemical liquid or a brush for mechanically removing a contaminant from the surface of the substrate W by a brush can be exemplified.

被搬入裝載機/卸載機20中的未處理的基板W由搬送機器人10接收,並被搬入塗布處理部30中。另外,在未進行如所述般的表面清洗處理的情況下,可以在將基板W搬入塗布處理部30中之前搬入光照射處理部50中,並從準分子燈51對基板W的表面照射紫外線,由此將附著在所述表面上的污染物質分解去除。The unprocessed substrate W carried into the loader/unloader 20 is received by the transfer robot 10 and carried into the coating processing unit 30. Further, when the surface cleaning treatment as described above is not performed, the substrate W can be carried into the light irradiation treatment portion 50 before being carried into the coating treatment portion 30, and the surface of the substrate W can be irradiated with ultraviolet rays from the excimer lamp 51. Thereby, the pollutants attached to the surface are decomposed and removed.

對被搬入塗布處理部30中的基板W進行塗布處理(步驟S2)。塗布處理部30將含有氧化銦前驅物的塗布液塗布在基板W的表面上而在基板W上形成此塗布液的塗布膜。此處,所謂「氧化銦前驅物」,是指通過被活化而變化成氧化銦的物質,例如可例示鹵化銦醇鹽(通式InX(OR)2 ,式中R為烷基及/或烷氧基烷基,X為F、Cl、Br或I)。使此種氧化銦前驅物分散在溶劑或分散介質中來構成塗布液。作為溶劑或分散介質,可使用:醇、甲苯、二甲苯、二乙醚等。The substrate W loaded into the coating processing unit 30 is subjected to coating processing (step S2). The coating treatment unit 30 applies a coating liquid containing an indium oxide precursor onto the surface of the substrate W to form a coating film of the coating liquid on the substrate W. Here, the term "indium oxide precursor" means a substance which is changed to indium oxide by activation, and examples thereof include an indium halide alkoxide (in the formula InX(OR) 2 wherein R is an alkyl group and/or an alkane. Alkoxy group, X is F, Cl, Br or I). The indium oxide precursor is dispersed in a solvent or a dispersion medium to form a coating liquid. As the solvent or dispersion medium, an alcohol, toluene, xylene, diethyl ether or the like can be used.

塗布處理部30將所述塗布液塗布在基板W上而形成塗布膜。在基板W上,以一樣的膜厚形成含有氧化銦前驅物的塗布膜。塗布處理部30中的剛塗布後的塗布膜是含有大量溶劑的濕潤狀態的膜。因此,可以通過塗布處理部30來使塗布膜中所含有的溶劑蒸發而使塗布膜乾燥。由於塗布膜中所含有的溶劑具有揮發性,因此即便在常溫常壓下,也在比較短的時間內蒸發。The coating treatment unit 30 applies the coating liquid onto the substrate W to form a coating film. A coating film containing an indium oxide precursor was formed on the substrate W with the same film thickness. The coating film immediately after application in the coating treatment unit 30 is a film in a wet state containing a large amount of solvent. Therefore, the coating film can be evaporated by the coating treatment unit 30 to evaporate the solvent contained in the coating film. Since the solvent contained in the coating film is volatile, it evaporates in a relatively short period of time even under normal temperature and normal pressure.

繼而,搬送機器人10將形成有塗布膜的基板W從塗布處理部30中搬出並搬入光照射處理部50中。光照射處理部50對形成在基板W上的塗布膜照射紫外線來使塗布膜中所含有的氧化銦前驅物光學活化(步驟S3)。Then, the transport robot 10 carries out the substrate W on which the coating film is formed from the coating processing unit 30 and carries it into the light irradiation processing unit 50. The light irradiation treatment unit 50 irradiates the coating film formed on the substrate W with ultraviolet rays to optically activate the indium oxide precursor contained in the coating film (step S3).

通過搬送機器人10而搬入光照射處理部50中的基板W由多個搬送輥56支撐。而且,驅動部57使多個搬送輥56旋轉來使基板W沿著水平方向滑動移動。在第1實施方式中,使基板W從多個準分子燈51的排列區域的一側側方朝另一側側方移動後,使基板W從所述另一側側方朝所述一側側方移動。即,移動部55使基板W相對於多個準分子燈51往返移動。另外,在本實施方式中,使基板W相對於多個準分子燈51往返一次,但往返的次數可設為適宜的次數。The substrate W carried into the light irradiation processing unit 50 by the transport robot 10 is supported by a plurality of transport rollers 56. Further, the drive unit 57 rotates the plurality of transport rollers 56 to slide the substrate W in the horizontal direction. In the first embodiment, the substrate W is moved from one side of the array area of the plurality of excimer lamps 51 to the other side, and the substrate W is moved from the other side to the side. Move sideways. That is, the moving unit 55 reciprocates the substrate W with respect to the plurality of excimer lamps 51. Further, in the present embodiment, the substrate W is reciprocated once with respect to the plurality of excimer lamps 51, but the number of round trips can be set to an appropriate number of times.

另外,多個準分子燈51放射波長為172 nm的真空紫外線。移動部55使基板W相對於多個準分子燈51往返移動,由此在基板W的上表面上,來自各準分子燈51的紫外線的照射區域沿著基板W的移動方向得到掃描。由此,對形成在基板W上的塗布膜照射紫外線。通過對塗布膜照射紫外線,而使塗布膜中所含有的氧化銦前驅物光學活化。Further, the plurality of excimer lamps 51 emit vacuum ultraviolet rays having a wavelength of 172 nm. The moving portion 55 reciprocates the substrate W with respect to the plurality of excimer lamps 51, whereby the irradiation region of the ultraviolet rays from the respective excimer lamps 51 is scanned along the moving direction of the substrate W on the upper surface of the substrate W. Thereby, the coating film formed on the substrate W is irradiated with ultraviolet rays. The indium oxide precursor contained in the coating film is optically activated by irradiating the coating film with ultraviolet rays.

通過移動部55而移動的基板W的移動速度例如為0.5 m/min。使基板W以此移動速度相對於三支準分子燈51往返移動,由此從三支準分子燈51對於基板W上表面的各區域的總照射時間變成40秒~60秒左右。The moving speed of the substrate W moved by the moving portion 55 is, for example, 0.5 m/min. The substrate W is reciprocated with respect to the three-submolecular lamp 51 at this moving speed, whereby the total irradiation time from the three excimer lamps 51 to the respective regions on the upper surface of the substrate W becomes about 40 seconds to 60 seconds.

然而,為了使塗布膜中所含有的氧化銦前驅物良好地活化,必須在含有氧的環境中對塗布膜照射紫外線。因此,在本實施方式中,在將多個準分子燈51與基板W之間的空間設為大氣環境的狀態下進行紫外線照射。另一方面,從準分子燈51中放射的波長為172 nm的真空紫外線具有由氧吸收這一性質。因此,使多個準分子燈51與通過移動部55而移動的基板W的照射間隔d比多個準分子燈51的排列間隔p短並設為2 mm以上且10 mm以下。若照射間隔d超過10 mm,則從準分子燈51中放射的真空紫外線幾乎由存在於準分子燈51與基板W之間的大氣環境的氧吸收而不到達基板W上的塗布膜上。若照射間隔d為10 mm以下,則即便準分子燈51與基板W之間為含有氧的環境,從準分子燈51中放射的真空紫外線也完全不被吸收而可到達基板W上的塗布膜上。另外,若照射間隔d未滿2 mm,則準分子燈51與基板W過於靠近,而產生基板W的上表面與準分子燈51的一部分在移動時接觸的擔憂。因此種理由,而將多個準分子燈51與基板W的照射間隔d限定為2 mm以上且10 mm以下。However, in order to satisfactorily activate the indium oxide precursor contained in the coating film, it is necessary to irradiate the coating film with ultraviolet rays in an atmosphere containing oxygen. Therefore, in the present embodiment, ultraviolet irradiation is performed in a state where the space between the plurality of excimer lamps 51 and the substrate W is an atmospheric environment. On the other hand, the vacuum ultraviolet ray having a wavelength of 172 nm radiated from the excimer lamp 51 has a property of being absorbed by oxygen. Therefore, the irradiation interval d between the plurality of excimer lamps 51 and the substrate W moved by the moving portion 55 is shorter than the arrangement interval p of the plurality of excimer lamps 51, and is set to 2 mm or more and 10 mm or less. When the irradiation interval d exceeds 10 mm, the vacuum ultraviolet rays radiated from the excimer lamp 51 are almost absorbed by the oxygen present in the atmosphere between the excimer lamp 51 and the substrate W without reaching the coating film on the substrate W. When the irradiation interval d is 10 mm or less, even if the environment between the excimer lamp 51 and the substrate W is oxygen-containing, the vacuum ultraviolet rays emitted from the excimer lamp 51 are not absorbed at all and can reach the coating film on the substrate W. on. Further, when the irradiation interval d is less than 2 mm, the excimer lamp 51 and the substrate W are too close to each other, and there is a concern that the upper surface of the substrate W and a part of the excimer lamp 51 are in contact with each other during movement. For this reason, the irradiation interval d between the plurality of excimer lamps 51 and the substrate W is limited to 2 mm or more and 10 mm or less.

另外,由於照射間隔d明顯比多個準分子燈51的排列間隔p短,因此基板W的上表面上的來自多個準分子燈51的紫外線的照射區域變成離散的狀態。因此,在本實施方式中,使基板W相對於多個準分子燈51滑動移動,由此將紫外線均勻地照射在基板W的上表面的整個面上。更具體而言,以從多個準分子燈51的各者對於基板W的上表面的整個面的照射時間變得一樣的方式,使基板W的整體往返滑動移動。由此,不僅在基板W的上表面的整個面上紫外線的照射時間變得一樣,而且即便在多個準分子燈51中存在照射強度的偏差,基板W的上表面的整個面上的照射條件也變得一樣。通過在含有氧的環境中將紫外線均勻地照射在基板W上的塗布膜上,而使塗布膜中所含有的氧化銦前驅物良好地光學活化。另外,當對塗布膜照射紫外線時,優選例如抑制準分子燈51的發熱,以不使基板W被過度地加熱。Further, since the irradiation interval d is significantly shorter than the arrangement interval p of the plurality of excimer lamps 51, the irradiation regions of the ultraviolet rays from the plurality of excimer lamps 51 on the upper surface of the substrate W become discrete. Therefore, in the present embodiment, the substrate W is slidably moved with respect to the plurality of excimer lamps 51, whereby the ultraviolet rays are uniformly irradiated onto the entire surface of the upper surface of the substrate W. More specifically, the entire substrate W is slidably moved back and forth so that the irradiation time of the entire surface of the upper surface of the substrate W is the same from each of the plurality of excimer lamps 51. Thereby, not only the irradiation time of the ultraviolet rays is the same on the entire upper surface of the substrate W but also the irradiation conditions of the entire surface of the upper surface of the substrate W even if there is a variation in the irradiation intensity in the plurality of excimer lamps 51. It has also become the same. The indium oxide precursor contained in the coating film is favorably optically activated by uniformly irradiating ultraviolet rays on the coating film on the substrate W in an atmosphere containing oxygen. Further, when the coating film is irradiated with ultraviolet rays, it is preferable to suppress the heat generation of the excimer lamp 51, for example, so that the substrate W is not excessively heated.

其後,搬送機器人10將紫外線照射處理已結束的基板W從光照射處理部50中搬出並搬入熱處理部40中。熱處理部40對基板W實施加熱處理來使基板W上的塗布膜中所含有的氧化銦前驅物熱活化(步驟S4)。熱處理部40中的加熱處理也在大氣環境中,即含有氧的環境中進行。熱處理部40以約350℃將基板W加熱30分鐘~1時間左右。在含有氧的環境中對基板W上的塗布膜進行加熱,由此使塗布膜中所含有的氧化銦前驅物熱活化而生成氧化銦。其結果,通過所述一連串的處理而在基板W上形成含有氧化銦的薄膜。After that, the transport robot 10 carries out the substrate W whose ultraviolet irradiation treatment has been completed from the light irradiation processing unit 50 and carries it into the heat treatment unit 40. The heat treatment unit 40 heat-processes the substrate W to thermally activate the indium oxide precursor contained in the coating film on the substrate W (step S4). The heat treatment in the heat treatment portion 40 is also performed in an atmosphere, that is, an environment containing oxygen. The heat treatment unit 40 heats the substrate W at about 350 ° C for about 30 minutes to 1 hour. The coating film on the substrate W is heated in an atmosphere containing oxygen to thermally activate the indium oxide precursor contained in the coating film to form indium oxide. As a result, a film containing indium oxide is formed on the substrate W by the series of processes.

在加熱處理結束後,搬送機器人10從熱處理部40中取出基板W並再次搬入裝載機/卸載機20中。然後,將處理完的基板W從裝載機/卸載機20朝薄膜形成裝置1的外部搬出而完成對於基板W的一連串的薄膜形成處理。After the completion of the heat treatment, the transfer robot 10 takes out the substrate W from the heat treatment unit 40 and reloads it into the loader/unloader 20. Then, the processed substrate W is carried out from the loader/unloader 20 to the outside of the film forming apparatus 1 to complete a series of film formation processes for the substrate W.

在第1實施方式中,使用準分子燈51對基板W上的含有氧化銦前驅物的塗布膜照射紫外線。與低壓水銀燈相比,準分子燈51放射的紫外線的能量高,因此適合於使塗布膜中所含有的氧化銦前驅物光學活化。然而,從準分子燈51中放射的波長為172 nm的真空紫外線具有由氧吸收這一性質。因此,就準分子燈51的紫外線照射效率的觀點而言,優選在多個準分子燈51與基板W之間不存在氧。另一方面,為了使塗布膜中所含有的氧化銦前驅物良好地活化,必須在含有氧的環境中對塗布膜照射紫外線。即,就步驟上的觀點而言,需要含有氧的環境,但就紫外線照射效率的觀點而言,優選不含氧的環境。In the first embodiment, the coating film containing the indium oxide precursor on the substrate W is irradiated with ultraviolet rays using the excimer lamp 51. Since the energy of the ultraviolet light emitted from the excimer lamp 51 is higher than that of the low pressure mercury lamp, it is suitable for optically activating the indium oxide precursor contained in the coating film. However, the vacuum ultraviolet ray having a wavelength of 172 nm radiated from the excimer lamp 51 has a property of being absorbed by oxygen. Therefore, from the viewpoint of the ultraviolet irradiation efficiency of the excimer lamp 51, it is preferable that oxygen is not present between the plurality of excimer lamps 51 and the substrate W. On the other hand, in order to activate the indium oxide precursor contained in the coating film satisfactorily, it is necessary to irradiate the coating film with ultraviolet rays in an atmosphere containing oxygen. That is, from the viewpoint of the step, an environment containing oxygen is required, but from the viewpoint of ultraviolet irradiation efficiency, an environment containing no oxygen is preferable.

為了滿足所述相反的要求,在將多個準分子燈51與基板W之間的空間設為大氣環境(氧濃度約為20%)的狀態下進行紫外線照射。若為大氣環境,則含有約20%的氧,因此可使塗布膜中所含有的氧化銦前驅物良好地活化。另外,若為氧濃度約為20%的大氣環境,則將準分子燈51與基板W的照射間隔d設為10 mm以下來使兩者靠近,由此從準分子燈51中放射的真空紫外線完全不被吸收而可到達基板W上的塗布膜上。In order to satisfy the above-mentioned opposite requirements, ultraviolet irradiation is performed in a state where the space between the plurality of excimer lamps 51 and the substrate W is an atmospheric environment (oxygen concentration is approximately 20%). In the case of an atmospheric environment, since about 20% of oxygen is contained, the indium oxide precursor contained in the coating film can be favorably activated. In the case of an atmospheric environment having an oxygen concentration of about 20%, the irradiation interval d between the excimer lamp 51 and the substrate W is set to 10 mm or less to bring the two into close proximity, whereby the vacuum ultraviolet rays emitted from the excimer lamp 51 are emitted. It is not absorbed at all and can reach the coating film on the substrate W.

而且,若使多個準分子燈51與基板W靠近且照射間隔d明顯變得比多個準分子燈51的排列間隔p短,則各準分子燈51的照射範圍受到限定,因此使基板W相對於多個準分子燈51滑動移動。由此,在含有氧的環境中將紫外線均勻地照射在基板W上的塗布膜上,可使塗布膜中所含有的氧化銦前驅物良好地光學活化。Further, when the plurality of excimer lamps 51 are brought close to the substrate W and the irradiation interval d is significantly shorter than the arrangement interval p of the plurality of excimer lamps 51, the irradiation range of each of the excimer lamps 51 is limited, so that the substrate W is made The sliding movement is performed with respect to the plurality of excimer lamps 51. Thereby, the ultraviolet ray is uniformly irradiated onto the coating film on the substrate W in an atmosphere containing oxygen, and the indium oxide precursor contained in the coating film can be favorably optically activated.

<第2實施方式> 繼而,對本發明的第2實施方式進行說明。圖5是表示第2實施方式的薄膜形成裝置1a的整體配置結構的圖。第2實施方式的薄膜形成裝置1a的處理部的佈局與第1實施方式的薄膜形成裝置1不同。第2實施方式的薄膜形成裝置1a包括:裝載機21、塗布處理部30、光照射處理部50、熱處理部40、卸載機22、第1搬送機器人11及第2搬送機器人12。另外,在圖5中,對與第1實施方式相同的部件標注相同的符號。<Second Embodiment> Next, a second embodiment of the present invention will be described. FIG. 5 is a view showing an overall arrangement configuration of a thin film forming apparatus 1a according to the second embodiment. The layout of the processing unit of the thin film forming apparatus 1a of the second embodiment is different from that of the thin film forming apparatus 1 of the first embodiment. The film forming apparatus 1a of the second embodiment includes a loader 21, a coating processing unit 30, a light irradiation processing unit 50, a heat treatment unit 40, an unloader 22, a first transfer robot 11, and a second transfer robot 12. In FIG. 5, the same members as those in the first embodiment are denoted by the same reference numerals.

在第2實施方式中,在第1搬送機器人11的周圍配置裝載機21、塗布處理部30及光照射處理部50。另一方面,在第2搬送機器人12的周圍配置卸載機22、熱處理部40及光照射處理部50。光照射處理部50配置在第1搬送機器人11與第2搬送機器人12之間。In the second embodiment, the loader 21, the coating processing unit 30, and the light irradiation processing unit 50 are disposed around the first transfer robot 11. On the other hand, the unloader 22, the heat treatment unit 40, and the light irradiation processing unit 50 are disposed around the second transfer robot 12. The light irradiation processing unit 50 is disposed between the first transfer robot 11 and the second transfer robot 12 .

裝載機21是將未處理的基板W搬入薄膜形成裝置1a中的搬入部。卸載機22是將處理完的基板W從薄膜形成裝置1a中搬出的搬出部。與進行未處理基板的搬入及處理完基板的搬出兩者的第1實施方式的裝載機/卸載機20不同,裝載機21是搬入專用的單元,卸載機22是搬出專用的單元。The loader 21 is a loading unit that carries the unprocessed substrate W into the film forming apparatus 1a. The unloader 22 is a carry-out unit that carries out the processed substrate W from the film forming apparatus 1a. Unlike the loader/unloader 20 of the first embodiment in which both the unprocessed substrate is carried in and the processed substrate is unloaded, the loader 21 is a dedicated unit for loading, and the unloader 22 is a unit for carrying out the loading.

第1搬送機器人11及第2搬送機器人12具有與第1實施方式的搬送機器人10相同的結構。另外,塗布處理部30、熱處理部40及光照射處理部50為與第1實施方式相同的部件。在第2實施方式中,第1搬送機器人11針對裝載機21、塗布處理部30及光照射處理部50搬送基板W。另外,第2搬送機器人12針對光照射處理部50、熱處理部40及卸載機22搬送基板W。第2實施方式的光照射處理部50對基板W照射紫外線,並且也發揮將基板W從第1搬送機器人11交接至第2搬送機器人12中的作用。The first transfer robot 11 and the second transfer robot 12 have the same configuration as the transfer robot 10 of the first embodiment. The coating treatment unit 30, the heat treatment unit 40, and the light irradiation treatment unit 50 are the same members as those of the first embodiment. In the second embodiment, the first transfer robot 11 transports the substrate W to the loader 21, the coating processing unit 30, and the light irradiation processing unit 50. Further, the second transfer robot 12 transports the substrate W to the light irradiation processing unit 50, the heat treatment unit 40, and the unloader 22. In the light irradiation processing unit 50 of the second embodiment, the substrate W is irradiated with ultraviolet rays, and the substrate W is transferred from the first transfer robot 11 to the second transfer robot 12 .

在第2實施方式中,將未處理的基板W從薄膜形成裝置1a的外部搬入裝載機21中。被搬入裝載機21中的未處理的基板W由第1搬送機器人11接收,並被搬入塗布處理部30中。在塗布處理部30中,對基板W進行含有氧化銦前驅物的塗布液的塗布處理。在進行塗布處理後,第1搬送機器人11將形成有塗布膜的基板W從塗布處理部30中搬出並搬入光照射處理部50中。In the second embodiment, the unprocessed substrate W is carried into the loader 21 from the outside of the film forming apparatus 1a. The unprocessed substrate W carried into the loader 21 is received by the first transfer robot 11 and carried into the coating processing unit 30. In the coating treatment unit 30, a coating treatment of a coating liquid containing an indium oxide precursor is performed on the substrate W. After the coating process, the first transfer robot 11 carries out the substrate W on which the coating film is formed from the coating processing unit 30 and carries it into the light irradiation processing unit 50.

與第1實施方式同樣地,光照射處理部50一面使基板W相對於多個準分子燈51滑動移動,一面從多個準分子燈51對形成在基板W上的塗布膜照射紫外線來使塗布膜中所含有的氧化銦前驅物光學活化。另外,在第1實施方式中使基板W相對於多個準分子燈51往返移動,但在第2實施方式中,也可以使基板W相對於多個準分子燈51朝一個方向(從第1搬送機器人11朝向第2搬送機器人12的方向)移動一次。與第1實施方式同樣地,使基板W相對於多個準分子燈51滑動移動,由此在含有氧的環境中將紫外線均勻地照射在基板W上的塗布膜上,而使塗布膜中所含有的氧化銦前驅物良好地光學活化。In the same manner as the first embodiment, the light-irradiation processing unit 50 illuminates the substrate W with respect to the plurality of excimer lamps 51, and applies ultraviolet rays to the coating film formed on the substrate W from the plurality of excimer lamps 51 to apply the coating. The indium oxide precursor contained in the film is optically activated. Further, in the first embodiment, the substrate W is reciprocated with respect to the plurality of excimer lamps 51. However, in the second embodiment, the substrate W may be oriented in one direction with respect to the plurality of excimer lamps 51 (from the first The transport robot 11 moves once in the direction of the second transport robot 12). In the same manner as in the first embodiment, the substrate W is slidably moved relative to the plurality of excimer lamps 51, whereby the ultraviolet ray is uniformly irradiated onto the coating film on the substrate W in an atmosphere containing oxygen, and the coating film is placed in the coating film. The indium oxide precursor contained is well optically activated.

紫外線照射處理已結束的基板W由第2搬送機器人12從光照射處理部50中搬出並搬入熱處理部40中。在熱處理部40中進行基板W的加熱處理,由此使基板W上的塗布膜中所含有的氧化銦前驅物熱活化。The substrate W whose ultraviolet irradiation treatment has been completed is carried out by the second transfer robot 12 from the light irradiation processing unit 50 and carried into the heat treatment unit 40. The heat treatment of the substrate W is performed in the heat treatment portion 40, whereby the indium oxide precursor contained in the coating film on the substrate W is thermally activated.

在加熱處理結束後,第2搬送機器人12從熱處理部40中取出基板W並搬入卸載機22中。然後,將處理完的基板W從卸載機22朝薄膜形成裝置1a的外部搬出而完成對於基板W的一連串的薄膜形成處理。After the completion of the heat treatment, the second transfer robot 12 takes out the substrate W from the heat treatment unit 40 and carries it into the unloader 22 . Then, the processed substrate W is carried out from the unloader 22 to the outside of the film forming apparatus 1a to complete a series of film forming processes for the substrate W.

<變形例> 以上,對本發明的實施方式進行了說明,但本發明只要不脫離其主旨,則除所述實施方式以外可進行各種變更。例如,在所述實施方式中,在將多個準分子燈51與基板W之間的空間設為大氣環境的狀態下進行紫外線照射,但並不限定於此,也可以通過環境調整機構59來調整此空間的環境。如上所述,為了使氧化銦前驅物良好地活化而需要氧,相對於此,就紫外線照射效率的觀點而言優選不存在氧。因此,環境調整機構59以準分子燈51與基板W之間的空間的環境中的氧濃度變成15%以上且20%以下的方式進行環境調整。若準分子燈51與基板W之間的空間的環境中的氧濃度為15%以上且20%以下,則可使塗布膜中所含有的氧化銦前驅物良好地活化。另外,將準分子燈51與基板W的照射間隔d設為10 mm以下來使兩者靠近,由此從準分子燈51中放射的真空紫外線完全不被吸收而可到達基板W上的塗布膜上。其結果,與所述實施方式同樣地,通過使基板W相對於多個準分子燈51滑動移動,而在含有氧的環境中將紫外線均勻地照射在基板W上的塗布膜上,可使塗布膜中所含有的氧化銦前驅物良好地光學活化。<Modifications> The embodiments of the present invention have been described above, but the present invention can be variously modified in addition to the above embodiments without departing from the scope of the invention. For example, in the above-described embodiment, ultraviolet irradiation is performed in a state where the space between the plurality of excimer lamps 51 and the substrate W is an atmospheric environment. However, the present invention is not limited thereto, and the environment adjustment mechanism 59 may be used. Adjust the environment for this space. As described above, oxygen is required in order to activate the indium oxide precursor well, and it is preferable that oxygen is not present from the viewpoint of ultraviolet irradiation efficiency. Therefore, the environment adjustment mechanism 59 performs environmental adjustment so that the oxygen concentration in the environment of the space between the excimer lamp 51 and the substrate W becomes 15% or more and 20% or less. When the oxygen concentration in the environment between the excimer lamp 51 and the substrate W is 15% or more and 20% or less, the indium oxide precursor contained in the coating film can be favorably activated. In addition, when the irradiation interval d between the excimer lamp 51 and the substrate W is set to 10 mm or less to bring them closer together, the vacuum ultraviolet rays emitted from the excimer lamp 51 are not absorbed at all and can reach the coating film on the substrate W. on. As a result, similarly to the above-described embodiment, by sliding the substrate W against the plurality of excimer lamps 51, the ultraviolet rays are uniformly irradiated onto the coating film on the substrate W in an atmosphere containing oxygen, so that coating can be performed. The indium oxide precursor contained in the film is well optically activated.

另外,在所述實施方式中,使基板W相對於多個準分子燈51移動,但也可以一面在靜止狀態下支撐基板W,一面使多個準分子燈51相對於此基板W移動。即,只要使基板W相對於多個準分子燈51相對地移動即可。Further, in the above-described embodiment, the substrate W is moved relative to the plurality of excimer lamps 51, but the plurality of excimer lamps 51 may be moved relative to the substrate W while supporting the substrate W in a stationary state. That is, the substrate W may be relatively moved with respect to the plurality of excimer lamps 51.

另外,在所述實施方式中配置有三支準分子燈51,但準分子燈51的支數可設為適宜的支數。Further, in the above embodiment, three excimer lamps 51 are disposed, but the number of excimer lamps 51 can be set to an appropriate number.

另外,在所述實施方式中,通過多個搬送輥56來支撐基板W並使其滑動移動,但也可以通過空氣使基板W浮起並滑動移動來代替所述方式。Further, in the above-described embodiment, the substrate W is supported and slidably moved by the plurality of transport rollers 56, but the substrate W may be floated and slid by air to replace the above.

另外,包含光照射處理部50的處理部的配置結構並不限定於圖1、圖2的佈局,只要是可進行按照圖4中所示的處理程序的處理的佈局即可。 [產業上的可利用性]In addition, the arrangement structure of the processing unit including the light irradiation processing unit 50 is not limited to the layout of FIGS. 1 and 2, and may be any layout as long as the processing according to the processing program shown in FIG. 4 can be performed. [Industrial availability]

本發明的技術適合於形成用於薄膜電晶體(Thin Film Transistor,TFT)等的製造的含有電特性優異的氧化銦的薄膜。The technique of the present invention is suitable for forming a thin film containing indium oxide excellent in electrical characteristics for use in the production of a thin film transistor (TFT) or the like.

1、1a‧‧‧薄膜形成裝置1, 1a‧‧‧ film forming device

10‧‧‧搬送機器人10‧‧‧Transfer robot

11‧‧‧第1搬送機器人11‧‧‧1st transport robot

12‧‧‧第2搬送機器人12‧‧‧2nd transfer robot

20‧‧‧裝載機/卸載機20‧‧‧Loader/Unloader

21‧‧‧裝載機21‧‧‧Loader

22‧‧‧卸載機22‧‧‧Unloader

30‧‧‧塗布處理部30‧‧‧ Coating Processing Department

40‧‧‧熱處理部40‧‧‧ Heat Treatment Department

50‧‧‧光照射處理部50‧‧‧Light Irradiation Processing Department

51‧‧‧準分子燈51‧‧‧Excimer lamp

55‧‧‧移動部55‧‧‧Mobile Department

56‧‧‧搬送輥56‧‧‧Transport roller

57‧‧‧驅動部57‧‧‧ Drive Department

59‧‧‧環境調整機構59‧‧‧Environmental Adjustment Agency

AR2‧‧‧箭頭AR2‧‧‧ arrow

d‧‧‧照射間隔D‧‧‧ Irradiation interval

p‧‧‧排列間隔P‧‧‧ arrangement interval

W‧‧‧基板W‧‧‧Substrate

S1~S5‧‧‧步驟S1 ~ S5‧‧‧ steps

圖1是表示本發明的薄膜形成裝置的整體配置結構的圖。 圖2是表示光照射處理部的結構的圖。 圖3是將多個準分子燈的附近放大表示的圖。 圖4是表示薄膜形成裝置中的處理程序的流程圖。 圖5是表示第2實施方式的薄膜形成裝置的整體配置結構的圖。Fig. 1 is a view showing an overall arrangement structure of a thin film forming apparatus of the present invention. FIG. 2 is a view showing a configuration of a light irradiation treatment unit. Fig. 3 is an enlarged view showing the vicinity of a plurality of excimer lamps. 4 is a flow chart showing a processing procedure in the thin film forming apparatus. FIG. 5 is a view showing an overall arrangement configuration of a thin film forming apparatus according to a second embodiment.

Claims (8)

一種光照射裝置,其是對形成有包含氧化銦前驅物的塗布膜的基板照射紫外線來使所述氧化銦前驅物光學活化的光照射裝置,其特徵在於包括: 多個棒狀的準分子燈,沿著規定方向相互平行地排列;以及 移動部,使所述基板相對於多個所述準分子燈,沿著所述規定方向相對地移動;且 多個所述準分子燈與通過所述移動部而移動的所述基板的照射間隔比多個所述準分子燈的排列間隔短。A light irradiation device that irradiates ultraviolet light on a substrate on which a coating film containing an indium oxide precursor is formed to optically activate the indium oxide precursor, and is characterized by comprising: a plurality of rod-shaped excimer lamps Arranging parallel to each other along a prescribed direction; and moving the portion to relatively move the substrate along the predetermined direction with respect to the plurality of the excimer lamps; and a plurality of the excimer lamps The irradiation interval of the substrate moved by the moving portion is shorter than the arrangement interval of the plurality of the excimer lamps. 如申請專利範圍第1項所述的光照射裝置,其中, 所述照射間隔為2 mm以上且10 mm以下。The light irradiation device according to claim 1, wherein the irradiation interval is 2 mm or more and 10 mm or less. 如申請專利範圍第1項或第2項所述的光照射裝置,其中, 所述移動部使所述基板相對於多個所述準分子燈往返移動。The light irradiation device according to the first or second aspect of the invention, wherein the moving portion reciprocates the substrate relative to the plurality of excimer lamps. 如申請專利範圍第1項或第2項所述的光照射裝置,其中, 將多個所述準分子燈與通過所述移動部而移動的所述基板之間設為含有氧的環境。The light irradiation device according to the first or second aspect of the invention, wherein the plurality of the excimer lamps and the substrate moved by the moving portion are in an environment containing oxygen. 如申請專利範圍第4項所述的光照射裝置,其中, 所述環境中的氧濃度為15%以上且20%以下。The light irradiation device according to claim 4, wherein the oxygen concentration in the environment is 15% or more and 20% or less. 一種薄膜形成裝置,其是形成包含氧化銦的薄膜的薄膜形成裝置,其特徵在於包括: 塗布處理部,將含有氧化銦前驅物的塗布液塗布在基板上而在所述基板上形成塗布膜; 如申請專利範圍第1項至第5項中任一項所述的光照射裝置;以及 熱處理部,對通過所述光照射裝置而使所述氧化銦前驅物光學活化的所述基板進行加熱來使所述氧化銦前驅物熱活化。A thin film forming apparatus which is a thin film forming apparatus for forming a thin film containing indium oxide, comprising: a coating processing unit that applies a coating liquid containing an indium oxide precursor onto a substrate to form a coating film on the substrate; The light irradiation device according to any one of claims 1 to 5, wherein the heat treatment unit heats the substrate optically activated by the light irradiation device to the indium oxide precursor The indium oxide precursor is thermally activated. 如申請專利範圍第6項所述的薄膜形成裝置,更包括: 搬入搬出部,搬入未處理的基板,並且搬出處理完的基板;以及 搬送機器人,針對所述搬入搬出部、所述塗布處理部、所述熱處理部及所述光照射裝置搬送基板;且 在所述搬送機器人的周圍配置所述搬入搬出部、所述塗布處理部、所述熱處理部及所述光照射裝置。The film forming apparatus according to claim 6, further comprising: a loading/unloading unit, loading an unprocessed substrate, and carrying out the processed substrate; and a transfer robot for the loading/unloading unit and the coating processing unit The heat treatment unit and the light irradiation device transport the substrate, and the loading/unloading unit, the coating processing unit, the heat treatment unit, and the light irradiation device are disposed around the transfer robot. 如申請專利範圍第6項所述的薄膜形成裝置,更包括: 搬入部,搬入未處理的基板; 搬出部,搬出處理完的基板; 第1搬送機器人,針對所述搬入部、所述塗布處理部及所述光照射裝置搬送基板;以及 第2搬送機器人,針對所述光照射裝置、所述熱處理部及所述搬出部搬送基板;且 在所述第1搬送機器人與所述第2搬送機器人之間配置所述光照射裝置。The film forming apparatus according to claim 6, further comprising: a loading unit that carries the unprocessed substrate; a carrying-out unit that carries out the processed substrate; and a first transport robot that performs the coating process on the loading unit And the second light transfer device, wherein the second transfer robot transports the substrate to the light irradiation device, the heat treatment unit, and the carry-out unit, and the first transfer robot and the second transfer robot The light irradiation device is disposed between.
TW107141558A 2017-12-06 2018-11-22 Light irradiation apparatus and thin film forming apparatus capable of finely activating an indium oxide precursor through heating the substrate TW201925528A (en)

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