TW201703987A - 工件的貼合方法 - Google Patents
工件的貼合方法 Download PDFInfo
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- TW201703987A TW201703987A TW105107200A TW105107200A TW201703987A TW 201703987 A TW201703987 A TW 201703987A TW 105107200 A TW105107200 A TW 105107200A TW 105107200 A TW105107200 A TW 105107200A TW 201703987 A TW201703987 A TW 201703987A
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- Prior art keywords
- workpiece
- bonding
- bonding surface
- contact angle
- resin
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- 238000000034 method Methods 0.000 title claims abstract description 78
- 238000010030 laminating Methods 0.000 title abstract description 10
- 238000012545 processing Methods 0.000 claims abstract description 50
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 49
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- 230000008859 change Effects 0.000 claims abstract description 13
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- 239000002002 slurry Substances 0.000 claims description 50
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- 230000009467 reduction Effects 0.000 claims description 13
- DIOQZVSQGTUSAI-UHFFFAOYSA-N decane Chemical compound CCCCCCCCCC DIOQZVSQGTUSAI-UHFFFAOYSA-N 0.000 claims description 8
- 239000004925 Acrylic resin Substances 0.000 claims description 4
- 229920000178 Acrylic resin Polymers 0.000 claims description 4
- 150000001925 cycloalkenes Chemical class 0.000 claims description 4
- 238000005304 joining Methods 0.000 abstract description 19
- 239000007789 gas Substances 0.000 description 13
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- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
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- 230000001186 cumulative effect Effects 0.000 description 2
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- 229910052757 nitrogen Inorganic materials 0.000 description 2
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- 229910052760 oxygen Inorganic materials 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- 229910001374 Invar Inorganic materials 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
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- 239000003513 alkali Substances 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
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- 239000005388 borosilicate glass Substances 0.000 description 1
- 238000003759 clinical diagnosis Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- -1 decyl alkane Chemical class 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
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- 239000004205 dimethyl polysiloxane Substances 0.000 description 1
- 235000013870 dimethyl polysiloxane Nutrition 0.000 description 1
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- 238000007877 drug screening Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
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- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
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- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 238000005459 micromachining Methods 0.000 description 1
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- 238000010298 pulverizing process Methods 0.000 description 1
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- 229920003002 synthetic resin Polymers 0.000 description 1
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Classifications
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract
本發明的目的,係提供於所得的接合體中可確實地達成高強度的接合狀態之工件的貼合方法。
本發明的工件的貼合方法,係貼合由樹脂所成之工件,與由樹脂或玻璃所成之工件的方法,其特徵為具有對至少由樹脂所成之工件的貼合面,藉由真空紫外線或大氣壓電漿進行處理的表面活性化工程,與將兩個工件在以個別的貼合面相互接觸之方式層積之狀態下接合的接合工程;於前述表面活性化工程中,對於前述貼合面的真空紫外線或大氣壓電漿的積算處理量,在對於該積算處理量的該貼合面之水的接觸角的變化曲線之初始減少區間內的時間點中,停止對於前述貼合面的真空紫外線或大氣壓電漿所致之處理。
Description
本發明係關於貼合由合成樹脂、玻璃、矽晶圓、水晶或藍寶石所成之工件彼此的方法。
近年來,於生物化學領域中,注目使用微反應器,進行微量之試藥的分離、合成、抽出或分析等的手法。該微反應器係於例如由矽、矽氧烷樹脂或玻璃等所成的小基板上,藉由半導體微加工技術,形成微尺度的分析用通道等的微晶片所成者。使用此種微反應器的反應分析系統,被稱為微整合分析系統(Micro Total Analysis System,以下稱為「μTAS」)。依據該μTAS,可根據相對於試藥體積的表面積之比例變大等來進行高速且高精度的分析反應,又,可實現簡潔且自動化的系統。
於微晶片中,藉由於亦稱為微型通道的流通路徑,設置配置有試藥之反應區域等之具有各種功能的區域,可構成適合各種用途的晶片。作為微晶片的用途,可舉出基因解析、臨床診斷、藥物篩選等之化學、生化學、藥學、醫學、獸醫學的分野之分析,或化合物的合成、環
境計測等。
此種微晶片係典型上具有一對基板對向而被接著的構造。然後,於至少一方的基板的表面上形成有細微的流通路徑(例如,寬度10~數100μm,深度10~數100μm程度)。作為構成微晶片的基板,根據易於製造,也可進行光學檢測,主要使用玻璃基板。又,在最近,致力於雖然輕量但相較於玻璃基板較不易破損,且廉價之使用樹脂基板之微晶片的開發。
於微晶片的製造中,作為基板的貼合方法,有使用接著劑的方法、熱融接所致之方法。然而,該等方法有以下問題。
於藉由接著劑來貼合的方法中,會產生接著劑侵入微小流通路徑而使流通路徑閉塞,微小流通路徑的一部分變狹窄而流通路徑成為不均勻,或流通路徑壁面的均質特性混亂的產生之問題。
又,於藉由熱熔接來貼合的方法中,以加熱熔融溫度以上來熔接的話,在加熱階段,流通路徑被破壞,或流通路徑未保持為所定剖面形狀,故有難以進行微晶片的高功能化的問題。
因此,近年來,提案有藉由將真空紫外線照射至基板表面,使該基板的表面活性化,之後,貼合基板的方法(參照專利文獻1至5)。
[專利文獻1]日本專利第3714338號公報
[專利文獻2]日本特開2006-187730號公報
[專利文獻3]日本特開2008-19348號公報
[專利文獻4]WO2008/087800A1公報
[專利文獻5]日本專利第5152361號公報
然而,於先前的貼合方法中,發現有儘管對基板的表面照射充分量的紫外線,也會有於接合體中無法獲得高強度的接合狀態之狀況的問題。
因此,本發明的目的係提供於所得的接合體中可確實地達成高強度的接合狀態之工件的貼合方法。
本案發明者們係針對前述課題而重複銳意檢討的結果,發現工件的貼合面之紫外線的積算光量過大的話,所得之接合體的接合強度會降低,並依據此見識而完成本發明。
亦即,本發明的工件的貼合方法,係貼合由樹脂所成之工件,與由樹脂或玻璃所成之工件的方法,其特徵為:具有:
表面活性化工程,係對至少由樹脂所成之工件的貼合面,藉由真空紫外線或大氣壓電漿進行處理;及接合工程,係將兩個工件在以個別的貼合面相互接觸之方式層積之狀態下接合;於前述表面活性化工程中,對於前述貼合面的真空紫外線或大氣壓電漿的積算處理量,在對於該積算處理量的該貼合面之水的接觸角的變化曲線之初始減少區間內的時間點中,停止對於前述貼合面的真空紫外線或大氣壓電漿所致之處理。
於本發明的工件的貼合方法中,於前述表面活性化工程中,在前述貼合面之水的接觸角成為未滿30°之前,停止對於前述貼合面的真空紫外線或大氣壓電漿所致之處理為佳。
又,於前述表面活性化工程中,在前述貼合面之水的接觸角降低至比前述表面活性化工程前之初始接觸角還低之後,停止對於前述貼合面的真空紫外線或大氣壓電漿所致之處理為佳。
又,構成前述工件的樹脂,係環烯烴樹脂、丙烯酸系樹脂或矽氧烷樹脂為佳。
在本發明的工件的貼合方法中,於表面活性化工程中,對於工件之貼合面的真空紫外線或大氣壓電漿的積算處理量,在對於該積算處理量的該貼合面之水的接
觸角的變化曲線之初始減少區間內的時間點中,停止對於工件之貼合面的真空紫外線或大氣壓電漿所致之處理。因此,於所得之接合體中可確實達成高強度的接合狀態。
10‧‧‧殼體
11‧‧‧氣體供給口
12‧‧‧噴嘴
20‧‧‧電極
21‧‧‧介電體層
25‧‧‧高頻電源
[圖1]揭示大氣壓電漿裝置的一例之構造的說明圖。
[圖2]揭示針對實施例中使用的工件A所測定,對於貼合面之積算光量的該貼合面之水的接觸角之變化曲線的圖表。
[圖3]揭示針對實施例中使用的工件B所測定,對於貼合面之積算光量的該貼合面之水的接觸角之變化曲線的圖表。
[圖4]揭示針對實施例中使用的工件C所測定,對於貼合面之積算光量的該貼合面之水的接觸角之變化曲線的圖表。
[圖5]揭示針對實施例中使用的工件A所測定,對於大氣壓電漿所致之處理時間的該貼合面之水的接觸角之變化曲線的圖表。
[圖6]揭示針對實施例中使用的工件B所測定,對於大氣壓電漿所致之處理時間的該貼合面之水的接觸角之變化曲線的圖表。
[圖7]揭示針對實施例中使用的工件C所測定,對於大氣壓電漿所致之處理時間的該貼合面之水的接觸角之變
化曲線的圖表。
[圖8]揭示於實驗例1~4中針對工件A、工件B及工件C所測定,貼合面之水的接觸角與抗拉伸剪切強度的關係的曲線圖。
[圖9]揭示於實驗例5~8中針對工件A、工件B及工件C所測定,貼合面之水的接觸角與抗拉伸剪切強度的關係的曲線圖。
以下,針對本發明之工件的貼合方法的實施形態進行說明。
本發明之工件的貼合方法,係例如貼合板狀之兩個工件彼此的方法。本發明的貼合方法所適用之兩個工件,係一方的工件是由樹脂所成者,另一方的工件是由樹脂或玻璃所成者。兩個工件個別作為由相互同種的材料所成者亦可,作為由不同材料所成者亦可。
作為構成工件的樹脂,可使用聚二甲基矽氧烷等的矽氧烷樹脂、環烯烴樹脂、丙烯酸樹脂等。
作為構成工件的玻璃,可使用石英玻璃、藍寶石玻璃、鹼玻璃、硼矽酸玻璃等。
本發明的工件的貼合方法,係具有對至少由樹脂所成之工件的貼合面,藉由真空紫外線或大氣壓電漿進行處理的表面活性化工程,與將兩個工件在以個別的貼合面相互接觸之方式層積之狀態下接合的接合工程。於表面活性化工程中,僅對於由樹脂所成之工件進行處理即可,但在貼合由樹脂所成之工件與由玻璃所成之工件時,對於兩個工件雙方進行處理亦可。
以下,將真空紫外線所致之表面活性化工程稱為「紫外線處理工程」,將大氣壓電漿所致之表面活性化工程稱為「電漿處理工程」。表面活性化工程係紫外線處理工程及電漿處理工程任一方的工程。
紫外線處理工程係藉由對至少由樹脂所成之工件的貼合面,照射波長200nm以下的真空紫外線來進行。
作為放射真空紫外線的光源,可合適地使用於波長172nm具有輝線之氙準分子燈等的準分子燈、於波長185nm具有輝線的低壓水銀燈、於波長120~200nm的範圍具有輝線的氘燈。
於該紫外線處理工程中,被照射至工件的貼合面之真空紫外線的積算光量,作為對於貼合面之真空紫外線的積算處理量。然後,該積算處理量(積算光量),在對於該積算處理量之該貼合面的水之接觸角的變化曲線(以下,也稱為「接觸角/積算處理量變化曲線」)之初始減
少區間內的時間點中,停止對於工件之貼合面的真空紫外線所致之處理(真空紫外線的照射)。
積算處理量在接觸角/積算處理量變化曲線之初始減少區間外的時間點中,停止對於工件之貼合面的真空紫外線之照射時,難以於所得之接合體中達成高強度的接合狀態。
於紫外線處理工程中,接觸角/積算處理量變化曲線之初始減少區間,係如以下所求出者。
首先,對工件的貼合面,照射所定照度的真空紫外線,並且每於貼合面之積算光量到達所定值時,測定該貼合面之水的接觸角。將所得之水的接觸角的測定值,描點於表示縱軸是接觸角,橫軸是積算光量的座標系。接下來,於所得之圖表中,選擇水之接觸角的測定值對於積算光量幾乎成比例降低之測定值的範圍,求出被選擇之測定值群的近似直線(以下,稱為「近似直線A」)。又,於所得之圖表中,選擇與先行之測定值的差較小之測定的範圍,求出被選擇之測定值群的近似直線(以下,稱為「近似直線B」)。然後,將近似直線A與近似直線B的交點設為變位點,將從真空紫外線之照射的開始點到變位點為止之間,設為初始減少區間。
又,於紫外線處理工程中,在工件的貼合面之水的接觸角成為未滿30°之前,停止對於工件之貼合面的真空紫外線所致之處理為佳。在工件的貼合面之水的接觸角成為未滿30°之後,停止對於工件的貼合面之真空紫
外線的照射時,有於所得之接合體中難以達成高強度的接合狀態之狀況。
又,於紫外線處理工程中,在工件的貼合面之水的接觸角降低至比紫外線處理工程前之初始接觸角還低之後,停止對於工件之貼合面的真空紫外線的照射為佳。在工件的貼合面之水的接觸角降低至比初始接觸角還低之前,停止對於工件的貼合面之真空紫外線的照射時,有於所得之接合體中難以達成高強度的接合狀態之狀況。
被照射至工件的貼合面之真空紫外線的照度係例如10~100mW/cm2。
又,被照射至工件的貼合面之真空紫外線的照射時間,係於該貼合面之積算光量滿足前述條件的範圍內適當設定。
電漿處理工程,係藉由使來自大氣壓電漿裝置的大氣壓電漿,接觸至少由樹脂所成之工件的貼合面來進行。
圖1係揭示大氣壓電漿裝置的一例之構造的說明圖。該大氣壓電漿裝置,係具有例如由鋁所成之長方體狀的殼體10。於該殼體10內,水平配置有電性連接於高頻電源25的板狀之電極20。於該電極20的下面,形成有介電體層21。於此範例中,藉由電極20構成高壓側電極,藉由殼體10構成接地側電極。
於殼體10的上面,設置有對殼體10內供給電漿用氣
體的氣體供給口11。於殼體10的下面,形成有將發生於殼體10內的大氣壓電漿,放出至外部的複數噴嘴12。
於前述之大氣壓電漿裝置中,在大氣壓或其附近的壓力下,電漿用氣體從氣體供給口11被供給至殼體10內。在此狀態下,藉由高頻電源25對電極20與殼體10之間透過介電體層21施加高頻電場的話,電極20與殼體10之間產生介電體屏障放電,存在於殼體10與介電體層21之間的電漿用氣體游離或被激發,而產生大氣壓電漿。然後,產生的大氣壓電漿係從殼體10的噴嘴12放出至外部。
作為電漿用氣體,使用以氮氣、氬氣等作為主成分,含有氧氣0.01~5體積%所成者為佳。又,也可使用氮氣與潔淨乾燥空氣(CDA)的混合氣體。
從高頻電源25供給的電力,係頻率為20~70kHz,電壓為5~15kVp-p。
於此電漿處理工程中,對於貼合面之大氣壓電漿的積算處理量,係根據投入至大氣壓電漿裝置的電力與處理時間(大氣壓電漿的接觸時間)的積來計算出者。投入至大氣壓電漿裝置的電力為一定的話,則可將大氣壓電漿所致之處理時間,當作大氣壓電漿的積算處理量。然後,該積算處理量在接觸角/積算處理量變化曲線之初始減少區間內的時間點中,停止對於工件的貼合面之大氣壓電漿所致之處理(大氣壓電漿的接觸)。
於電漿處理工程中,接觸角/積算處理量變化
曲線之初始減少區間,係如以下所求出者。
首先,以所定電力讓大氣壓電漿裝置動作,使產生之大氣壓電漿接觸工件的貼合面,並且每於貼合面之積算處理量到達所定值時,測定該貼合面之水的接觸角。將所得之水的接觸角的測定值,描點於表示縱軸是接觸角,橫軸是積算處理量的座標系。接下來,於所得之圖表中,選擇水之接觸角的測定值對於積算處理量幾乎成比例降低之測定值的範圍,求出被選擇之測定值群的近似直線A。又,於所得之圖表中,選擇與先行之測定值的差較小之測定的範圍,求出被選擇之測定值群的近似直線B。然後,將近似直線A與近似直線B的交點設為變位點,將從大氣壓電漿之接觸的開始點到變位點為止之間,設為初始減少區間。
又,於電漿處理工程中,在工件的貼合面之水的接觸角成為未滿30°之前,停止對於工件之貼合面的大氣壓電漿所致之處理為佳。
又,於電漿處理工程中,在工件的貼合面之水的接觸角降低至低於電漿處理工程前之初始接觸角之後,停止對於工件之貼合面的大氣壓電漿所致之處理為佳。
於接合工程中,將兩個工件在以個別的貼合面相互接觸之方式層積之狀態下接合。
作為用以接合工件彼此的具體的方法,可舉出(1)在
層積兩個工件之狀態下加熱的方法,(2)在層積兩個工件之狀態下對厚度方向加壓的方法,(3)在層積兩個工件之狀態下對厚度方向一邊加壓一邊加熱的方法,(4)在層積兩個工件之狀態下對厚度方向加壓,在解除加壓後加熱的方法等。
接合工程之具體條件,係因應構成工件的材料,於該工件不會發生變形的範圍內適當設定。
舉出具體的加熱條件的話,於對兩個工件加熱時,加熱溫度為100~110℃。
又,於對兩個工件加壓時,加壓力是0.2~10MPa。
於前述之工件的貼合方法中,於表面活性化工程中,對於工件之貼合面的真空紫外線或大氣壓電漿的積算處理量,在接觸角/積算處理量變化曲線之初始減少區間內的時間點中,停止對於工件之貼合面的真空紫外線或大氣壓電漿所致之處理。因此,於所得之接合體中可確實達成高強度的接合狀態。
可獲得此種效果的理由並不一定,但可如以下推測。
例如於紫外線處理工程中,藉由對工件的貼合面照射真空紫外線,分解‧去除附著於該貼合面的有機物。伴隨此狀況,於工件的貼合面中,因為構成該工件的聚合物氧化,OH基被導入至該聚合物。藉此,讓工件的貼合面活性化。然而,達成此種狀態之後,進而對工件的貼合面照射真空紫外線的話,於工件的貼合面附近中,構成該工件
之聚合物的一部分會被分解。結果,於接合工程中,難以針對兩個工件達成高強度的接合狀態。
然後,依據本發明,積算處理量在接觸角/積算處理量變化曲線之初始減少區間內的時間點中,停止真空紫外線或大氣壓電漿所致之處理,故可防止或抑制構成工件的聚合物的一部分分解。所以,可推定於接合工程中,可針對兩個工件達成高強度的接合狀態。
以下,針對本發明之工件的貼合方法的具體實施例進行說明,但是,本發明並不限定於後述實施例。
製作後述之工件A~工件C。
工件A係由環烯烴樹脂(日本Zeon股份有限公司製「ZEONEX480R」)所成,尺寸為25mm×45mm×3mm的矩形之板狀者。
工件B係由丙烯酸系樹脂(住友化學股份有限公司製「SUMIPEX」)所成,尺寸為25mm×45mm×2mm的矩形之板狀者。
工件C係由矽氧烷樹脂(信越化學工業股份有限公司製「矽氧烷印象材SIM-260」)所成,尺寸為25mm×45mm×4mm的矩形之板狀者。
對工件A、工件B及工件C的各個貼合面,以照度成為14.4~15.3mW/cm2的條件,照射真空紫外線,並且每於貼合面之積算光量到達所定值時,測定該貼合面之水的接觸角。將所得之水的接觸角的測定值,描點於表示縱軸是接觸角,橫軸是積算光量的座標系。於圖2揭示關於工件A所得的圖表。又,於圖3揭示關於工件B所得的圖表。又,於圖4揭示關於工件C所得的圖表。然後,根據所得的圖表求出初始減少區間的變位點,測定該變位點之積算光量。
結果,關於工件A的變位點之積算光量為約250mJ/cm2,關於工件B的變位點之積算光量為約450mJ/cm2,關於工件C的變位點之積算光量為約1700mJ/cm2。
遵從圖1的構造,製作後述之規格的大氣壓電漿裝置。
殼體(10)的材質:鋁
電極(20)表面的材質:因瓦合金(Super Invar)(藉由熱熔射,於表面形成厚度為500μm的由氧化鋁所成之被膜者)
電極(20)的尺寸:50mm×300mm
殼體(10)與介電體層(21)的間隔距離:0.5mm
電壓:7.0kVp-p,頻率:60kHz,額定電力:1100VA
將工件A、工件B及工件C分別配置於其貼合面與前述之大氣壓電漿裝置的噴嘴12的距離成為3mm的位置。接下來,藉由於大氣壓電漿裝置的殼體(10)內,一邊作為電漿用氣體,供給流量為150L/min的氮氣及流量為1L/min的潔淨乾燥空氣(電漿用氣體中的氧濃度為約0.14體積%),一邊以1100VA的電力讓大氣壓電漿裝置動作,使從噴嘴(12)放出的大氣壓電漿,接觸工件A、工件B及工件C的各貼合面,每於經過所定處理時間時,測定該貼合面之水的接觸角。將所得之水的接觸角的測定值,描點於表示縱軸是接觸角,橫軸是積算光量的座標系。於圖5揭示針對工件A所得的圖表。又,於圖6揭示關於工件B所得的圖表。又,於圖7揭示關於工件C所得的圖表。然後,根據所得的圖表求出初始減少區間的變位點,作為積算處理量,測定該變位點之處理時間。結果,關於工件A的變位點之處理時間為4秒鐘,關於工件B的變位點之處理時間為5秒鐘,關於工件C的變位點之處理時間為15秒鐘。
針對兩個工件A,藉由進行後述之紫外線處理工程及接合工程,來進行貼合。
使用氙準分子燈,對兩個工件個別之貼合面,照度以14.4mW/cm2,照射時間以後述表1所示時間,照射真空紫外線。
又,紫外線處理工程結束之後,測定工件的貼合面之水的接觸角。於表1揭示結果。
將兩個工件以個別的貼合面相互接觸之方式層積。在此,兩個工件之個別的貼合面之相互接觸的接觸面積為625mm2。接下來,以加壓力為2MPa,加壓時間為300秒鐘的條件,藉由加壓,接合兩個工件。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
又,於圖8揭示貼合面之水的接觸角與抗拉伸剪切強度的關係的曲線圖。
針對兩個工件B,藉由進行後述之紫外線處理工程及接合工程,來進行貼合。
使用氙準分子燈,對兩個工件個別之貼合面,照度以14.4mW/cm2,照射時間以後述表1所示時間,照射真空紫外線。
又,紫外線處理工程結束之後,測定工件的貼合面之水的接觸角。於表1揭示結果。
將兩個工件以個別的貼合面相互接觸之方式層積。在此,兩個工件之個別的貼合面之相互接觸的接觸面積為625mm2。接下來,以加壓力為2MPa,加壓時間為300秒鐘的條件,藉由加壓,接合兩個工件。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
又,於圖8揭示貼合面之水的接觸角與抗拉伸剪切強度的關係的曲線圖。
針對兩個工件C,藉由進行後述之紫外線處理工程及接合工程,來進行貼合。
使用氙準分子燈,在照度為15.3mW/cm2,照射時間為後述表1所示時間的條件下,對兩個工件的個別貼合面照射真空紫外線。
又,紫外線處理工程結束之後,測定工件的貼合面之水的接觸角。於表1揭示結果。
將兩個工件以個別的貼合面相互接觸之方式層積。在此,兩個工件之個別的貼合面之相互接觸的接觸面積為625mm2。接下來,以加壓力為2MPa,加壓時間為300秒鐘的條件,藉由加壓,接合兩個工件。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
又,於圖8揭示貼合面之水的接觸角與抗拉伸剪切強度的關係的曲線圖。
針對材質相互不同的工件A及工件B,藉由進行後述之紫外線處理工程及接合工程,來進行貼合。
使用氙準分子燈,對工件A及工件B之個別的貼合面,照度以14.4mW/cm2,照射時間以後述表1所示時間,照射真空紫外線。
又,紫外線處理工程結束之後,測定工件的貼合面之水的接觸角。於表1揭示結果。
將工件A及工件B以個別的貼合面相互接觸之方式層積。在此,兩個工件之個別的貼合面之相互接觸的接觸
面積為625mm2。接下來,以加壓力為2MPa,加壓時間為300秒鐘的條件,藉由加壓,接合兩個工件。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表1揭示結果。
又,於圖8揭示貼合面之水的接觸角與抗拉伸剪切強度的關係的曲線圖。
根據表1的結果,可知已確認藉由貼合面之積算光量在接觸角/積算光量變化曲線之初始減少區間內的時間點中,停止對於貼合面之真空紫外線的照射,於所得之接合體中可達成高強度的接合狀態。
針對兩個工件A,藉由進行後述之電漿處理工程及接合工程,來進行貼合。
藉由將兩個工件分別配置於其貼合面與前述大氣壓電漿裝置的噴嘴的距離成為3mm的位置,以後述之條件使大氣壓電漿裝置動作,對於兩個工件分別進行大氣壓電漿所致之處理。
電漿用氣體:氮氣(流量=150L/min)及潔淨乾燥空氣(流量=1L/min)
投入電力:1100VA
處理時間:後述表2所示時間
又,電漿處理工程結束之後,測定工件的貼合面之水的接觸角。於表2揭示結果。
將兩個工件以個別的貼合面相互接觸之方式層積。在此,兩個工件之個別的貼合面之相互接觸的接觸面積為625mm2。接下來,以加壓力為2MPa,加壓時間為300秒鐘的條件,藉由加壓,接合兩個工件。
針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表2揭示結果。
又,於圖9揭示貼合面之水的接觸角與抗拉伸剪切強
度的關係的曲線圖。
遵從後述表2來變更電漿處理工程之處理時間以外,與實驗例5相同,針對兩個工件B,藉由進行電漿處理工程及接合工程來進行貼合。
又,電漿處理工程結束之後,測定工件的貼合面之水的接觸角。於表2揭示結果。
又,針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表2揭示結果。
又,於圖9揭示貼合面之水的接觸角與抗拉伸剪切強度的關係的曲線圖。
遵從後述表2來變更電漿處理工程之處理時間以外,與實驗例5相同,針對兩個工件C,藉由進行電漿處理工程及接合工程來進行貼合。
又,電漿處理工程結束之後,測定工件的貼合面之水的接觸角。於表2揭示結果。
又,針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表2揭示結果。
又,於圖9揭示貼合面之水的接觸角與抗拉伸剪切強度的關係的曲線圖。
遵從後述表2來變更電漿處理工程之處理時間以外,與實驗例5相同,針對相互材質不同的工件A及工件B,藉由進行電漿處理工程及接合工程來進行貼合。
又,電漿處理工程結束之後,測定工件的貼合面之水的接觸角。於表2揭示結果。
又,針對所得之接合體,以JIS K 6850為基準,測定抗拉伸剪切強度。於表2揭示結果。
又,於圖9揭示貼合面之水的接觸角與抗拉伸剪切強度的關係的曲線圖。
根據表2的結果,可知已確認藉由大氣壓電漿所致之處理時間(積算處理量)在接觸角/積算處理量變化曲線之初始減少區間內的時間點中,停止對於貼合面之大氣壓電漿所致之處理,於所得之接合體中可達成高強度的接合狀態。
10‧‧‧殼體
11‧‧‧氣體供給口
12‧‧‧噴嘴
20‧‧‧電極
21‧‧‧介電體層
25‧‧‧高頻電源
Claims (4)
- 一種工件的貼合方法,係貼合由樹脂所成之工件,與由樹脂或玻璃所成之工件的方法,其特徵為:具有:表面活性化工程,係對至少由樹脂所成之工件的貼合面,藉由真空紫外線或大氣壓電漿進行處理;及接合工程,係將兩個工件在以個別的貼合面相互接觸之方式層積之狀態下接合;於前述表面活性化工程中,對於前述貼合面的真空紫外線或大氣壓電漿的積算處理量,在對於該積算處理量的該貼合面之水的接觸角的變化曲線之初始減少區間內的時間點中,停止對於前述貼合面的真空紫外線或大氣壓電漿所致之處理。
- 如申請專利範圍第1項所記載之工件的貼合方法,其中,於前述表面活性化工程中,在前述貼合面之水的接觸角成為未滿30°之前,停止對於前述貼合面的真空紫外線或大氣壓電漿所致之處理。
- 如申請專利範圍第1項或第2項所記載之工件的貼合方法,其中,於前述表面活性化工程中,在前述貼合面之水的接觸角降低至比前述表面活性化工程前之初始接觸角還低之後,停止對於前述貼合面的真空紫外線或大氣壓電漿所致之處理。
- 如申請專利範圍第1項至第3項中任一項所記載之工件的貼合方法,其中,構成前述工件的樹脂,係環烯烴樹脂、丙烯酸系樹脂或矽氧烷樹脂。
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JP5152361B2 (ja) | 2011-04-20 | 2013-02-27 | ウシオ電機株式会社 | ワークの貼り合わせ方法および貼り合わせ装置 |
JP5933736B2 (ja) * | 2012-09-28 | 2016-06-15 | 国立研究開発法人科学技術振興機構 | 機能性デバイス及び機能性デバイスの製造方法 |
JP2014024340A (ja) * | 2013-09-11 | 2014-02-06 | Nitto Denko Corp | 積層体の製造方法 |
CN106132688B (zh) * | 2014-01-27 | 2020-07-14 | 康宁股份有限公司 | 用于薄片与载体的受控粘结的制品和方法 |
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TWI654071B (zh) | 2019-03-21 |
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US20180072034A1 (en) | 2018-03-15 |
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