TW201542351A - Roughened copper foil, copper-clad laminate, and printed wiring board - Google Patents

Roughened copper foil, copper-clad laminate, and printed wiring board Download PDF

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TW201542351A
TW201542351A TW104102806A TW104102806A TW201542351A TW 201542351 A TW201542351 A TW 201542351A TW 104102806 A TW104102806 A TW 104102806A TW 104102806 A TW104102806 A TW 104102806A TW 201542351 A TW201542351 A TW 201542351A
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copper foil
copper
laser
roughened
layer
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TW104102806A
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Chinese (zh)
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TWI579137B (en
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Hiroaki Tsuyoshi
Makoto Hosokawa
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Mitsui Mining & Smelting Co
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/383Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by microetching
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/0006Working by laser beam, e.g. welding, cutting or boring taking account of the properties of the material involved
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/352Working by laser beam, e.g. welding, cutting or boring for surface treatment
    • B23K26/3568Modifying rugosity
    • B23K26/3584Increasing rugosity, e.g. roughening
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/38Removing material by boring or cutting
    • B23K26/382Removing material by boring or cutting by boring
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/60Preliminary treatment
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0044Mechanical working of the substrate, e.g. drilling or punching
    • H05K3/0047Drilling of holes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2103/00Materials to be soldered, welded or cut
    • B23K2103/08Non-ferrous metals or alloys
    • B23K2103/12Copper or alloys thereof
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/03Metal processing
    • H05K2203/0307Providing micro- or nanometer scale roughness on a metal surface, e.g. by plating of nodules or dendrites
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/10Using electric, magnetic and electromagnetic fields; Using laser light
    • H05K2203/107Using laser light
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/022Processes for manufacturing precursors of printed circuits, i.e. copper-clad substrates

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Laminated Bodies (AREA)
  • Laser Beam Processing (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)

Abstract

This roughened copper foil is provided with a roughened surface having a fine uneven surface structure formed on both surfaces of a copper foil by needle-like or plate-like protrusions having a maximum length of 500 nm, and comprises a copper composite compound containing copper oxide. One surface of the copper foil is a laser-irradiated surface that has been irradiated by laser light during laser processing, while the other surface is an adhesion surface that adheres with an insulation layer construction material. The roughened copper foil for laser drilling is suitable for the formation of a buildup layer of a printed wiring board, and forms a high quality multilayer printed wiring board.

Description

粗化處理銅箔、覆銅積層板及印刷電路板 Roughening copper foil, copper clad laminate and printed circuit board

本申請書,係關於粗化處理銅箔、覆銅積層板及印刷電路板,特別是關於具有成為雷射吸光面之粗化處理面之粗化處理銅箔、覆銅積層板及印刷電路板。 The present application relates to a roughened copper foil, a copper clad laminate, and a printed circuit board, and more particularly to a roughened copper foil, a copper clad laminate, and a printed circuit board having a roughened surface which is a laser light absorbing surface. .

近年來,對於覆銅層積板形成100μm徑以下之小徑的導孔時,主要是進行雷射開孔加工。施以雷射開孔加工時,係使用實施了「黑化處理」之銅箔,或是實施了黑化處理之覆銅層積板。 In recent years, when a copper-clad laminate is formed into a small-diameter via hole having a diameter of 100 μm or less, laser hole drilling is mainly performed. When laser drilling is performed, a copper foil subjected to "blackening treatment" or a copper-clad laminate which has been subjected to blackening treatment is used.

例如,在專利文獻1,做為提供導孔之導通信賴性高之印刷電路板及其製造方法為目的,開示了「由在金屬箔施以黑化處理而形成黑化膜之工程;在絕緣基板中導孔形成部分之底部,使黑化膜為對面的狀態來貼覆金屬箔之工程;對於絕緣基板照射雷射,形成以金屬箔為底部之導孔的工程;對於露出於導孔底部之金屬箔實施除膠渣工程;對於露出於導孔底部之金屬箔進行軟蝕刻之工程;藉由軟蝕刻而確認導孔底部之金屬箔表面沒有黑化膜之工程;在導孔內部形成金屬電鍍膜之工程;對於金屬箔施以蝕刻而形成導體圖樣之工程所形成」之方法。 For example, in Patent Document 1, as a printed circuit board having a high conductivity of a via hole and a method of manufacturing the same, a project of forming a blackened film by blackening a metal foil is disclosed; The bottom of the via hole forming portion of the substrate is formed so that the blackened film is in the opposite state to cover the metal foil; the insulating substrate is irradiated with the laser to form a conductive hole with the metal foil as the bottom; for the exposed bottom of the via hole The metal foil is subjected to a desmear process; the metal foil exposed at the bottom of the via hole is soft-etched; the surface of the metal foil at the bottom of the via hole is confirmed by soft etching to have no blackened film; the metal is formed inside the via hole A method of electroplating a film; a method of forming a conductor pattern by etching a metal foil.

又,在專利文獻2,做為提供適合以雷射法形成確 保從外層銅箔之銅箔電路層之層間導通所用之形成通孔、導孔之貫通孔或是凹部之覆銅層積板為目的,開示了「藉由在覆銅層積板之外層銅箔的表面上形成微細的銅氧化物或微細銅粒等,使用滿足雷射光之反射率在86%以下,亮度(L值)為22以下等之條件之覆銅層積板」。然後,為了得到滿足雷射光之反射率在86%以下,亮度(L值)為22以下等之條件之覆銅層積板,記載著對於形成覆銅層積板之外層之銅箔表面施以黑化處理。 Also, in Patent Document 2, it is suitable to provide a laser-based method. For the purpose of forming a through-hole, a via hole for a via hole or a copper-clad laminate for a recess in the copper foil circuit layer of the outer copper foil, it is shown that "the copper layer is laminated on the copper-clad laminate. A fine copper oxide or fine copper particles are formed on the surface of the foil, and a copper clad laminate having a reflectance of laser light of 86% or less and a luminance (L value) of 22 or less is used. Then, in order to obtain a copper-clad laminate which satisfies the condition that the reflectance of the laser light is 86% or less and the luminance (L value) is 22 or less, it is described that the surface of the copper foil which forms the outer layer of the copper-clad laminate is applied. Blackening treatment.

【先前技術文獻】 [Previous Technical Literature]

【專利文獻】 [Patent Literature]

專利文獻1:日本專利特開平11-261216號公報 Patent Document 1: Japanese Patent Laid-Open No. Hei 11-261216

專利文獻2:日本專利特開2001-68816號公報 Patent Document 2: Japanese Patent Laid-Open Publication No. 2001-68816

然而,若使用專利文獻1所開示之金屬箔,由於在與絕緣基板之接著面實施了黑化處理,因此可得到與絕緣性樹脂基材之接著性良好之導體圖樣。然而,專利文獻1,開示著藉由所謂的共型光罩法之形成導孔時所用之金屬箔。亦即,使用專利文獻1所記載之金屬箔之情況,在形成導孔時,需要藉由蝕刻在金屬箔之導孔形成部分形成開口部,無法藉由所謂直接雷射法形成導孔。 However, when the metal foil disclosed in Patent Document 1 is used, since the blackening treatment is performed on the surface of the insulating substrate, a conductor pattern having good adhesion to the insulating resin substrate can be obtained. However, Patent Document 1 discloses a metal foil used for forming a via hole by a so-called common mask method. In other words, in the case of using the metal foil described in Patent Document 1, it is necessary to form an opening in the via hole forming portion of the metal foil by etching, and it is not possible to form the via hole by a so-called direct laser method.

另一方面,若使用專利文獻2所開示之覆銅層積板,雖不需要進行導孔形成部分之蝕刻,而可同時雷射加工銅箔與絕緣層,但該雷射開孔加工性能有產生差異的情況。若在 銅箔表面實施黑化處理,則在銅箔表面上生成針狀結晶,該表面會變成黑色的粗糙面而雷射光之吸光率提升。此針狀結晶係從銅箔的表面細長地突出,所以很脆弱。因此,在覆銅層積板之操作時,若黑化處理表面與其他的物體接觸等被施加輕微的摩擦力,則該處的針狀結晶斷裂,該處會局部地變得帶有光澤。此結果,會產生雷射光之吸光率之面內差異。又,若黑化處理面之表面形狀變化,其全面變成光澤面,則會有完全無法進行雷射開孔加工之情況。因此,為了良好地加工導孔,且抑制製品良率之低下,在操作具有黑化處理層之覆銅層積板時,需要非常細心注意不對於黑化處理面造成損傷。 On the other hand, when the copper clad laminate shown in Patent Document 2 is used, it is not necessary to perform etching of the via hole forming portion, and the copper foil and the insulating layer can be laser-processed at the same time, but the laser opening processing property is The situation that produces a difference. If at When the surface of the copper foil is blackened, needle-like crystals are formed on the surface of the copper foil, and the surface becomes a black rough surface and the absorbance of the laser light is increased. This needle crystal is elongated from the surface of the copper foil, so it is very fragile. Therefore, in the operation of the copper clad laminate, if a slight frictional force is applied to the blackened surface in contact with other objects, the needle crystals at this point are broken, and the place becomes locally lustrous. This result produces an in-plane variation in the absorbance of the laser light. Further, if the surface shape of the blackened surface changes, and the entire surface becomes a shiny surface, the laser drilling process may not be performed at all. Therefore, in order to process the via hole well and to suppress the low yield of the product, it is necessary to pay great attention to the damage of the blackened surface when operating the copper clad laminate having the blackened layer.

因此,在市場上,具有:耐擦傷性能高、容易操作,且雷射吸光率高之適合雷射開孔加工之粗化處理面,與絕緣層構成材之密著性優良之粗化處理面之雷射開孔加工用之銅箔、使用該粗化處理銅箔之覆銅層積板以及印刷電路板一直被期待。 Therefore, in the market, it has a roughened surface which is suitable for laser drilling and has a high abrasion resistance, is easy to handle, and has a high laser absorbance, and is excellent in adhesion to the insulating layer. A copper foil for laser drilling, a copper clad laminate using the roughened copper foil, and a printed circuit board have been expected.

因此,本發明者等銳意研究的結果,發現藉由採用以下所述雷射開孔加工用之粗化處理銅箔、使用該粗化處理銅箔之覆銅層積板及印刷電路板,可解決上述課題。以下,說明與本申請有關之發明之概要。 Therefore, as a result of intensive studies by the inventors of the present invention, it has been found that by using the roughened copper foil for laser hole drilling described below, the copper clad laminate using the roughened copper foil, and the printed circuit board, Solve the above problems. The outline of the invention related to the present application will be described below.

(雷射開孔加工用之粗化處理銅箔) (roughening copper foil for laser drilling)

與本申請書有關之雷射開孔加工用之粗化處理銅箔,其特徵在於:係在銅箔之兩面,具有由含有氧化銅之銅複合化合物所形成之最大長度為500nm以下之針狀或板狀之凸狀部所形 成之微細凹凸構造之粗化處理面,前述銅箔之一方的面為雷射加工時被雷射光照射之雷射照射面,另一方的面為與絕緣層構成材之接著面。 The roughened copper foil for laser drilling according to the present application is characterized in that it has a needle shape formed by a copper composite compound containing copper oxide and having a maximum length of 500 nm or less on both surfaces of the copper foil. Or a plate-like convex shape In the roughened surface of the fine concavo-convex structure, one surface of the copper foil is a laser irradiation surface that is irradiated with laser light during laser processing, and the other surface is a surface of the insulating layer.

(覆銅層積板) (Copper laminate)

與本申請書有關之覆銅層積板,其特徵在於:與本申請有關之雷射開孔加工用之粗化處理銅箔至少層積在絕緣構成材之單面。 A copper clad laminate according to the present application is characterized in that the roughened copper foil for laser drilling according to the present application is laminated on at least one side of the insulating constituent.

(印刷電路板) (A printed circuit board)

與本申請書有關之印刷電路板,其特徵在於:係具有使用與本申請書有關之雷射開孔加工用之粗化處理銅箔而形成之銅層。 A printed circuit board according to the present application is characterized in that it has a copper layer formed by using a roughened copper foil for laser opening processing according to the present application.

與本申請書有關之雷射開孔加工用之粗化處理銅箔,分別在雷射加工時被雷射光照射之雷射照射面,以及與絕緣構成材之接著面上,包括具有耐擦傷性能優良之由含有氧化銅之銅複合化合物所形成之最大程度為500nm以下之針狀或板狀之凸狀部所形成之微細凹凸構造之粗化處理面。只要使用使用此雷射開孔加工用之粗化處理銅箔之覆銅層積板,不僅與絕緣構成材之密著性優良,且雷射吸光率高,由於耐擦傷性能優良之具有由含有氧化銅之銅複合化合物所形成之微細凹凸構造之粗化面存在於外表面,可發揮優良之雷射開孔加工性能,且作業員在操作該覆銅層積板時,變得不需要特別注意,可提升作業效率。其結果,對於覆銅層積板之雷射開孔加工性能之差異減少,安定之開孔變得可能。特別是,此雷射開孔加 工用之粗化處理銅箔,適合於印刷電路板之增層層之形成,而可提供良好的品質之多層印刷電路板。 The roughened copper foil for laser hole drilling processing according to the present application includes a laser irradiation surface irradiated with laser light during laser processing, and a bonding surface with the insulating material, respectively, including scratch resistance A roughened surface of a fine concavo-convex structure formed of a needle-like or plate-like convex portion formed of a copper composite compound containing copper oxide and having a maximum of 500 nm or less. As long as the copper-clad laminate using the roughened copper foil for laser drilling is used, it is excellent not only in adhesion to the insulating member, but also has high laser absorbance and excellent scratch resistance. The roughened surface of the fine concavo-convex structure formed by the copper-copper composite compound is present on the outer surface, and exhibits excellent laser drilling performance, and the operator does not need to special when operating the copper-clad laminate. Note that it can improve work efficiency. As a result, the difference in the processing performance of the laser opening of the copper clad laminate is reduced, and the opening of the stability becomes possible. In particular, this laser opening plus The roughening copper foil is suitable for the formation of a build-up layer of a printed circuit board, and can provide a good quality multilayer printed circuit board.

1‧‧‧覆銅層積板 1‧‧‧Copper laminate

2‧‧‧銅箔 2‧‧‧ copper foil

3‧‧‧電極面側之粗化處理面 3‧‧‧The roughening surface of the electrode side

4‧‧‧析出面側之粗化處理面 4‧‧‧The roughening surface of the surface

5‧‧‧絕緣層 5‧‧‧Insulation

6‧‧‧雷射照射面之相反側之銅箔 6‧‧‧ Copper foil on the opposite side of the laser irradiation surface

7‧‧‧絕緣層構成材 7‧‧‧Insulation layer

8‧‧‧內層電路 8‧‧‧ Inner layer circuit

9‧‧‧內層基板 9‧‧‧ Inner substrate

10‧‧‧導孔 10‧‧‧ Guide hole

23‧‧‧第1增層配線電路 23‧‧‧1st build-up wiring circuit

24‧‧‧電鍍層 24‧‧‧Electroplating

31‧‧‧第1增層電路層 31‧‧‧1st build-up circuit layer

32‧‧‧第2增層層 32‧‧‧2nd layer

40‧‧‧具有第1增層層之層積體 40‧‧‧Layer with the first build-up layer

41‧‧‧具有第1增層電路層之層積體 41‧‧‧Layer with the first build-up circuit layer

42‧‧‧具有第2增層層之層積體 42‧‧‧Layer with second build-up

第1圖係表示與本申請書有關之雷射開孔加工用之粗化處理銅箔(電解銅箔)之電極面側及析出面側之粗化處理面之掃描式電子顯微鏡觀察照片(氧化處理之浸漬時間為2分鐘之樣品)。 FIG. 1 is a scanning electron microscope observation photograph of the roughened surface of the electrode surface side and the deposition surface side of the roughened copper foil (electrolytic copper foil) for laser drilling processing according to the present application (oxidation) The immersion time of the treatment was 2 minutes).

第2圖係表示設置於與本申請書有關之雷射開孔加工用之粗化處理銅箔之粗化處理面之微細凹凸構造之掃描式電子顯微鏡觀察照片。 Fig. 2 is a scanning electron microscope observation photograph of a fine concavo-convex structure provided on a roughened surface of a roughened copper foil for laser opening processing according to the present application.

第3圖係為了表示在與本申請書有關之雷射開孔加工方法所使用之覆銅層積板之基本層構成之模式剖面圖。 Fig. 3 is a schematic cross-sectional view showing the basic layer configuration of a copper clad laminate used in the laser drilling method relating to the present application.

第4圖係為了表示在與本申請書有關之雷射開孔加工方法所使用之覆銅層積板之基本層構成之模式剖面圖。 Fig. 4 is a schematic cross-sectional view showing the basic layer configuration of a copper clad laminate used in the laser drilling method of the present application.

第5圖係為了表示使用雷射光形成盲導孔時之雷射開孔加工之概念之模式剖面圖。 Fig. 5 is a schematic cross-sectional view showing the concept of laser drilling processing when a blind via hole is formed using laser light.

第6圖係為了表示以增層法製造多層印刷電路板之工程之製造流程之表示用之模式剖面圖。 Fig. 6 is a schematic cross-sectional view showing the manufacturing process of the process for producing a multilayer printed circuit board by the build-up method.

第7圖係為了表示以增層法製造多層印刷電路板之工程之製造流程之表示用之模式剖面圖。 Fig. 7 is a schematic cross-sectional view showing the manufacturing process of the process for producing a multilayer printed circuit board by the build-up method.

以下,說明與本申請書有關之「覆銅層積板之形態」及「印刷電路板之形態」。又,在「覆銅層積板之形態」 中,一併說明與本申請書有關之「雷射開孔加工用之粗化處理銅箔之形態」。 Hereinafter, the "form of a copper clad laminate" and "a form of a printed circuit board" relating to the present application will be described. Also, in the "form of copper clad laminates" In the following, the "formation of the roughened copper foil for laser drilling" related to this application will be described.

<覆銅層積板之形態> <Form of copper clad laminate>

1.覆銅層積板 Copper clad laminate

與本發明有關之覆銅層積板,係將與本申請書有關之雷射開孔加工用之粗化處理銅箔至少層積於絕緣層之構成材之單面上為特徵,主要,作為經過雷射開孔加工工程而製造之印刷電路板之製造材料而使用。又,與本申請書有關之覆銅層積板,只要為至少在絕緣構成材之單面上層積與本申請書有關之雷射開孔加工用之粗化處理銅箔之物即可,也可為在該當絕緣構成材之兩面分別層積與本申請書有關之雷射開孔加工用之粗化處理銅箔之兩面覆銅層積板。以下,首先,對於與本申請書有關之雷射開孔加工用之粗化處理銅箔說明。 The copper-clad laminate according to the present invention is characterized in that the roughened copper foil for laser opening processing according to the present application is characterized in that at least one layer of the constituent material of the insulating layer is laminated, mainly as It is used as a manufacturing material for printed circuit boards manufactured by laser drilling processing. Further, the copper-clad laminate according to the present application may be a material for roughening the copper foil for laser drilling according to the present application, at least on one side of the insulating member. It is possible to laminate a copper-clad laminate on both sides of the roughened copper foil for laser boring processing in accordance with the present application on both sides of the insulating structural member. Hereinafter, first, the roughened copper foil for laser drilling processing according to the present application will be described.

1-1.雷射開孔加工用之粗化處理銅箔 1-1. Roughening copper foil for laser drilling

與本申請有關之雷射開孔加工用之粗化處理銅箔,銅箔之兩面上,具有藉由含有氧化銅(以及根據必要之氧化亞銅)之銅複合化合物所形成之最大長度500nm以下之針狀或板狀之凸狀部所形成之微細凹凸構造之粗化處理面。以下,僅將「具有藉由含有氧化銅之銅複合化合物所形成之最大長度500nm以下之針狀或板狀之凸狀部所形成之微細凹凸構造之粗化處理面」稱為粗化處理面。又,在以下,有將在兩面具有此粗化處理面之與本申請書有關之雷射開孔加工用之粗化處理銅箔稱為「兩面粗化處理銅箔」之情況。若使用該兩面粗化處理銅箔製造覆銅層積板,藉由使一方側之該粗化處理面做為覆銅層積 板之雷射照射面,使另一方側之粗化處理面做為與絕緣層構成材之接著面,可製造雷射開孔加工性能良好,且銅層與絕緣層構成材之密著性良好之覆銅層積板。又,在層積絕緣層構成材,與上述兩面粗化處理銅箔等而得到之覆銅層積板中,由該兩面粗化處理銅箔等所形成之銅箔層稱為銅層。 The roughened copper foil for laser hole drilling according to the present application has a maximum length of 500 nm or less formed on both sides of the copper foil by a copper composite compound containing copper oxide (and, if necessary, cuprous oxide). The roughened surface of the fine concavo-convex structure formed by the needle-like or plate-like convex portion. In the following, the roughened surface of the fine concavo-convex structure formed by the convex portion having a needle shape or a plate shape having a maximum length of 500 nm or less formed by a copper composite compound containing copper oxide is referred to as a roughened surface. . In the following, the roughened copper foil for laser drilling according to the present application having such a roughened surface on both sides is referred to as "two-side roughening copper foil". When the copper-clad laminate is produced by using the two-side roughened copper foil, the roughened surface on one side is used as a copper clad laminate. The laser-illuminated surface of the plate has the roughened surface on the other side as the back surface of the insulating layer, and the laser drilling performance is good, and the adhesion between the copper layer and the insulating layer is good. Copper clad laminate. Further, in the copper clad laminate obtained by laminating the insulating layer constituent material and the above-described two-side roughening treatment of the copper foil, the copper foil layer formed by the two-side roughening treatment of the copper foil or the like is referred to as a copper layer.

接著,對於製造與本申請書有關之雷射開孔加工用之粗化處理銅箔時可適合使用之銅箔說明。該銅箔,可為壓延銅箔及電解銅箔之任一種,該銅箔之種類並沒有特別限定。又,該銅箔之厚度雖並沒有特別限定,但對於該覆銅層積板,若考慮到藉由雷射開孔加工形成導孔時之雷射開孔加工性能,該銅箔之厚度以12μm以下為佳。若考慮到操作之容易性,以7μm~12μm為佳。但是,在本申請書所指的「銅箔」,係指上述微細凹凸構造形成前之銅箔。 Next, a description will be given of a copper foil which can be suitably used in the production of a roughened copper foil for laser drilling in accordance with the present application. The copper foil may be either a rolled copper foil or an electrolytic copper foil, and the type of the copper foil is not particularly limited. Further, although the thickness of the copper foil is not particularly limited, the thickness of the copper foil is determined by considering the laser drilling performance when the via hole is formed by laser drilling for the copper clad laminate. 12 μm or less is preferred. When considering the ease of operation, it is preferably 7 μm to 12 μm. However, the term "copper foil" as used herein refers to a copper foil before the formation of the fine concavo-convex structure.

該銅箔,在雷射光照射側之面,「以雷射法測定57570μm2之二次元領域時之表面積(三次元面積:Aμm2),與二次元領域之面積之比[(A)/(57570)]所算出之表面積比(B)」之值在1.1以上為佳,1.5以上更佳。表面積比(B)若為1.1以上,雷射開孔加工性能良好,在1.5以上變得更良好。另一方面,比表面積比(B)之值若超過3,則銅箔本身之厚度會產生差異,其結果,開孔孔徑會容易產生差異。又,銅箔本身之厚度差異若過大,則藉由雷射開孔加工所形成之導孔之真圓度也會低下。因此,在該銅箔之雷射光照射側之面之表面積比(B)之值在3以下為佳。 This copper foil, on the side of the laser light irradiation side, "measures the surface area (three-dimensional area: Aμm 2 ) in the field of the secondary region of 57570 μm 2 by the laser method, and the ratio of the area of the secondary element field [(A)/( 57570)] The calculated surface area ratio (B)" is preferably 1.1 or more, and more preferably 1.5 or more. When the surface area ratio (B) is 1.1 or more, the laser drilling performance is good, and it is more preferably 1.5 or more. On the other hand, if the value of the specific surface area ratio (B) exceeds 3, the thickness of the copper foil itself may vary, and as a result, the aperture diameter may be easily different. Further, if the difference in thickness of the copper foil itself is too large, the roundness of the via hole formed by the laser opening process is also lowered. Therefore, the surface area ratio (B) of the surface on the laser light irradiation side of the copper foil is preferably 3 or less.

又,該銅箔之雷射光照射側之面的表面粗度(Rzjis) 為2.0μm以上為佳。對於具有表面粗度(Rzjis)為2.0μm以上之面之銅箔,藉由形成上述微細凹凸構造,雷射開孔加工性能變得更良好,表面粗度(Rzjis)若在3.0μm以上則更良好。表面粗度愈粗,在銅層之雷射光之反射率低下,雷射開孔加工性能提升而較佳。另一方面,若表面粗度(Rzjis)為6.0μm以上,此情況,銅箔本身之厚度也會產生差異,同於上述,雷射孔徑容易產生差異,銅箔本身之厚度之差異若過大,則導孔的真圓度也會低下。因此,在該銅箔之雷射光照射面側之面之表面粗度(Rzjis)以在6.0μm以下為佳。 Moreover, the surface roughness (Rzjis) of the surface of the copper foil on the side irradiated with the laser light It is preferably 2.0 μm or more. In the copper foil having a surface having a surface roughness (Rzjis) of 2.0 μm or more, by forming the fine concavo-convex structure, the laser drilling performance is further improved, and when the surface roughness (Rzjis) is 3.0 μm or more, good. The thicker the surface roughness, the lower the reflectance of the laser light in the copper layer, and the better the laser hole drilling performance. On the other hand, if the surface roughness (Rzjis) is 6.0 μm or more, in this case, the thickness of the copper foil itself may vary. As described above, the laser aperture is likely to be different, and the difference in the thickness of the copper foil itself is too large. Then the roundness of the guide hole will also be low. Therefore, the surface roughness (Rzjis) of the surface on the side of the laser light irradiation surface of the copper foil is preferably 6.0 μm or less.

另一方面,與該銅箔之絕緣樹脂基材之接著面之表面特性並沒有特別限定,但使用該覆銅層積板進行電路形成之情況,從形成具有良好之蝕刻因子微細間距電路之觀點來看,該表面粗度(Rzjis)以在2.0μm以下為佳,1.5μm以下更佳,更以在1.0μm以下為佳。又,表面之光澤度(Gs60°)以在100以上為佳,而在300以上更佳。 On the other hand, the surface characteristics of the contact surface of the insulating resin substrate of the copper foil are not particularly limited, but the circuit formation is performed using the copper clad laminate, and the viewpoint of forming a fine pitch circuit having a good etching factor is employed. The surface roughness (Rzjis) is preferably 2.0 μm or less, more preferably 1.5 μm or less, and still more preferably 1.0 μm or less. Further, the glossiness of the surface (Gs 60°) is preferably 100 or more, and more preferably 300 or more.

若在與具有上述表面特性之銅箔之絕緣層構成材之接著面形成上述微細凹凸構造,不僅可得到與絕緣層構成材之良好之密著性,且可形成高頻特性良好之電路。亦即,為了抑制在高頻電路之由於表皮效應所造成之傳送損失,被要求藉由表面之平滑的導體形成電路。在此,本申請書所指之在接著面設置微細凹凸構造之情況,被認為由於接著面表面所被賦予之微細凹凸構造而有高頻信號之傳送損失之虞。然而,如上述,該微細凹凸構造,係由含有氧化銅(以及根據必要之氧化亞銅)之銅複合化合物所形成之凸狀部所形成,因此在該微細 凹凸構造層不會流過高頻信號。因此,該粗化處理銅箔會顯示與藉由不具有粗化處理面之無粗化銅箔所形成銅層之情況同等之高頻特性。又,該粗化處理面,對於使用於高頻基板之低介電率之絕緣層構成材之密著性良好。因此,在銅箔之兩面具有該微細凹凸構造之兩面粗化處理銅箔,也適合做為高頻電路形成材料及多層印刷電路板之電路形成材料。 When the fine concavo-convex structure is formed on the surface of the insulating layer constituent material of the copper foil having the above surface characteristics, not only good adhesion to the insulating layer constituent material but also a circuit having high frequency characteristics can be obtained. That is, in order to suppress transmission loss due to the skin effect in the high frequency circuit, it is required to form a circuit by a smooth conductor on the surface. Here, in the case where the fine concavo-convex structure is provided on the succeeding surface, it is considered that there is a transmission loss of a high-frequency signal due to the fine concavo-convex structure provided on the surface of the adjoining surface. However, as described above, the fine concavo-convex structure is formed by a convex portion formed of a copper composite compound containing copper oxide (and, if necessary, cuprous oxide), and thus the fine The embossed structure layer does not flow through the high frequency signal. Therefore, the roughened copper foil exhibits high frequency characteristics equivalent to those in the case of a copper layer formed without a roughened copper foil having a roughened surface. Further, the roughened surface has good adhesion to the insulating layer constituent material having a low dielectric constant for use in a high-frequency substrate. Therefore, the double-faced roughened copper foil having the fine uneven structure on both sides of the copper foil is also suitable as a circuit forming material for a high-frequency circuit forming material and a multilayer printed wiring board.

1-2.微細凹凸構造 1-2. Fine uneven structure

本申請書所指之微細凹凸構造,係藉由「由含有氧化銅之銅複合化合物所形成之最大長度為500nm以下之針狀或板狀之凸狀部」所形成。該微細凹凸構造,例如,係對於銅箔之表面以後述方法施以氧化處理,之後,根據必要,藉由施以還原處理而可得到。使用此兩面粗化處理銅箔,藉由將此層積於絕緣層構成材而製造覆銅層積板,不僅可在表面上具有該微細凹凸構造,且可容易地得到絕緣層構成材與銅層之密著性良好之覆銅層積板。在以下,一邊參照圖式,以使用電解銅箔之情況為例,對於本申請書所指之微細凹凸構造詳細說明。 The fine concavo-convex structure referred to in the present application is formed by "a needle-like or plate-like convex portion having a maximum length of 500 nm or less formed of a copper composite compound containing copper oxide". The fine concavo-convex structure is, for example, oxidized by a method described later on the surface of the copper foil, and then, if necessary, subjected to a reduction treatment. By using the two-side roughening treatment of the copper foil, a copper clad laminate is produced by laminating the insulating layer constituent material, and the fine concavo-convex structure can be provided not only on the surface but also the insulating layer constituent material and copper can be easily obtained. A copper clad laminate with good adhesion to the layer. Hereinafter, the case where the electrolytic copper foil is used will be described as an example with reference to the drawings, and the fine concavo-convex structure referred to in the present application will be described in detail.

在第1圖,使用一般的電解銅箔,顯示做為兩面粗化處理銅箔時之粗化處理面(電極面側之粗化處理面3,析出面側之粗化處理面4(參照第3圖~第6圖)之掃描式電子顯微鏡之觀察照片。如第1圖所示,觀察到在電解銅箔之各粗化處理面,分別由於突出成針狀或板狀之微細的凸狀部互相鄰接密集集中,在電解銅箔之表面形成了極微細之凹凸構造,這些的凸狀部沿著電解銅箔之表面形狀,如被覆電解銅箔之表面般設置之狀態。 In the first embodiment, the roughened surface (the roughened surface 3 on the electrode surface side and the roughened surface 4 on the deposition surface side) are shown in the case of using a general-purpose electrolytic copper foil. 3 to 6) The observation photograph of the scanning electron microscope. As shown in Fig. 1, it was observed that each of the roughened surfaces of the electrolytic copper foil was protruded into a needle-like or plate-like fine convex shape. The portions are densely concentrated adjacent to each other, and an extremely fine concavo-convex structure is formed on the surface of the electrolytic copper foil. These convex portions are provided along the surface shape of the electrolytic copper foil, for example, on the surface of the electrolytic copper foil.

如第1圖,若對比電極面側之粗化處理面與析出面側之粗化處理面,各面之巨觀的表面形狀不同。此巨觀的表面形狀的相異,被認為是起因於形成該微細凹凸構造前之電解銅箔本身之電極面與析出面之巨觀的表面形狀之相異。由此來看,在銅箔之表面設置本申請書所指之微細凹凸構造的情況,被認為可維持微細凹凸構造形成前之銅箔之巨觀的表面形狀。 As shown in Fig. 1, when the roughened surface on the surface side of the electrode and the roughened surface on the side of the deposited surface are used, the surface shape of each surface is different. The difference in the surface shape of this giant is considered to be due to the difference in the surface shape of the electrode surface of the electrodeposited copper foil itself before the formation of the fine uneven structure and the giant surface of the deposition surface. From the viewpoint of the fact that the fine concavo-convex structure referred to in the present application is provided on the surface of the copper foil, it is considered that the superficial surface shape of the copper foil before the formation of the fine concavo-convex structure can be maintained.

電解銅箔,係在回轉型之電解滾筒表面上使銅電解析出,藉由將此捲取而可得到。因此,電解銅箔之與電解滾筒的表面接觸側之面(以下,稱為「電極面」),由於轉印了電解銅箔之表面形狀,一般而言,平滑而具有光澤。另一方面,另一面(以下,稱為「析出面」),具有銅電解析出而形成之凹凸形狀。若參照第1圖,可知道粗化處理面分別維持著電解銅箔之各面之粗化處理前之巨觀的表面形狀,電極面具有比較平滑的巨觀的表面形狀,析出面具有具有凹凸之巨觀的表面形狀。這被認為與粗化處理前之電解銅箔之巨觀的表面形狀相同。本申請書所指之微細凹凸構造,由於係沿著表面形狀,最大長度在500nm以下之針狀或板狀之凸狀部如被覆銅箔之表面般,密集設置於銅箔表面,因此形成該微細凹凸構造後,電解銅箔之各面的巨觀的表面形狀也被認為可以維持。 The electrolytic copper foil is obtained by electrolyzing copper on the surface of a rotary type electrolytic drum, and is obtained by winding this. Therefore, the surface of the electrodeposited copper foil on the side in contact with the surface of the electrolytic drum (hereinafter referred to as "electrode surface") is generally smooth and shiny due to the surface shape of the electrodeposited copper foil. On the other hand, the other surface (hereinafter referred to as "precipitation surface") has a concavo-convex shape formed by analysis of copper. Referring to Fig. 1, it is understood that the roughened surface maintains the surface shape of the macroscopic surface before the roughening treatment of each surface of the electrolytic copper foil, and the electrode surface has a relatively smooth giant surface shape, and the precipitated surface has irregularities. The superficial surface shape. This is considered to be the same as the superficial surface shape of the electrolytic copper foil before the roughening treatment. The fine concavo-convex structure referred to in the present application is formed in a needle-like or plate-like convex portion having a maximum length of 500 nm or less along the surface shape, such as a surface of a copper foil, and is densely disposed on the surface of the copper foil. After the fine concavo-convex structure, the superficial surface shape of each surface of the electrolytic copper foil is also considered to be maintained.

又,該微細凹凸構造,係藉由最大長度500nm以下之凸狀部而形成,若參照第1圖,各凸狀部配列在電解銅箔的表面之配列間距較各凸狀部之長度短。在此,雷射開孔加工時係使用主波長9.4μm及10.6μm之碳酸氣體雷射。各凸狀部之配列間距較此碳酸氣體雷射之發光波長短,該粗化處理面會 抑制由於碳酸氣體雷射所造成之雷射光的反射,而以高吸光率吸收雷射光。又,形成設置在該粗化處理面之微細凹凸構造之凸狀部的最大長度短至在500nm以下,不同於以往之黑化處理,不存在從銅箔表面細細長長得突出之凸狀部,即使其他的物體與該粗化處理面的表面接觸,也可抑制該凸狀部折斷等之損傷。因此,在做為兩面粗化處理銅箔之情況,即使操作時作業員的手指等接觸到該粗化處理面,也不會發生形成該微細凹凸構造之凸狀部折斷而粗化處理面的表面形狀局部地變化,或是氧化銅的微粉飛散至周圍等之所謂落塵,而可容易地操作。其結果,可防止雷射開孔加工性能之差異,或是該兩面粗化處理銅箔與絕緣層構成材之密著性發生面內差異。 Further, the fine concavo-convex structure is formed by a convex portion having a maximum length of 500 nm or less. Referring to Fig. 1, the arrangement pitch of the convex portions arranged on the surface of the electrodeposited copper foil is shorter than the length of each convex portion. Here, in the laser drilling process, a carbon dioxide gas laser having a dominant wavelength of 9.4 μm and 10.6 μm is used. The arrangement pitch of each convex portion is shorter than the emission wavelength of the carbon dioxide gas laser, and the roughening treatment surface will The reflection of the laser light caused by the carbon dioxide gas laser is suppressed, and the laser light is absorbed at a high light absorption rate. Further, the maximum length of the convex portion forming the fine concavo-convex structure provided on the roughened surface is as short as 500 nm or less, unlike the conventional blackening treatment, there is no convex portion which is elongated and elongated from the surface of the copper foil. Even if another object comes into contact with the surface of the roughened surface, damage such as breakage of the convex portion can be suppressed. Therefore, in the case where the copper foil is roughened on both sides, even if the operator's finger or the like comes into contact with the roughened surface during the operation, the convex portion forming the fine uneven structure is not broken and the treated surface is roughened. The surface shape is locally changed, or the fine powder of copper oxide is scattered to the so-called dust falling around, and can be easily handled. As a result, it is possible to prevent the difference in the processing performance of the laser opening, or the in-plane difference in the adhesion between the two-sided roughened copper foil and the insulating layer constituent material.

接著,一邊參照第2圖,對於上述凸狀部之「最大長度」說明。第2圖,係表示與本申請書有關之雷射開孔加工用之粗化處理銅箔之剖面之掃描式電子顯微鏡觀察照片。如第2圖所示,在該粗化處理銅箔之剖面,觀察到呈細線狀之部分為凸狀部。在第2圖,可確認到由於互相密集之無數的凸狀部,銅箔的表面被覆蓋,各凸狀部係沿著銅箔的表面形狀突出於銅箔的表面而設置。在本申請書中,「凸狀部之最大長度」,係指在該粗化處理銅箔之剖面,測定上述觀察呈線(線分)狀之各凸狀部的底端至先端為止的長度時之最大值。若僅考量在雷射照射面之雷射開孔加工性能之情況,該凸狀部之最大長度愈長,雷射光的吸光率愈高,雷射開孔加工性能提升。然而,由於該凸狀部之最大長度愈短,可使在其他物體接觸到粗化處理面時愈不易受到損傷,因此操作會變得容易。又,凸狀部的最 大長度短者,較可維持粗化處理前之銅箔的表面形狀,可抑制在粗化處理前後之表面粗度的變化。因此,該凸狀部之最大長度短者,可藉由微細的奈米錨定效果而得到與絕緣層構成材之良好的密著性,且與使用所謂無粗化銅箔之情況同等之具有良好的蝕刻因子之微細間距電路的形成變得可能。因此,從一邊維持良好的雷射開孔加工性能,且使操作變得更容易之觀點,以及一邊得到與絕緣層構成材之良好的密著性,且得到良好的蝕刻因子之觀點來看,該凸狀部的最大長度以在400nm以下為佳,300nm以下更佳。另一方面,凸狀部之最大長度若未滿100nm,雷射開孔加工性能低下。又,若凸狀部之最大長度過短,會有無法得到充分之奈米錨定效果的情況。因此,該凸狀部之最大長度在100nm以上為佳。 Next, the "maximum length" of the convex portion will be described with reference to Fig. 2 . Fig. 2 is a scanning electron microscope observation photograph showing a cross section of a roughened copper foil for laser drilling processing according to the present application. As shown in Fig. 2, in the cross section of the roughened copper foil, a portion having a thin line shape was observed as a convex portion. In Fig. 2, it was confirmed that the surface of the copper foil was covered by the infinite number of convex portions which were dense with each other, and each of the convex portions was provided to protrude from the surface of the copper foil along the surface shape of the copper foil. In the present application, the "maximum length of the convex portion" means the length of the convex portion of the roughened copper foil, and the length from the bottom end to the tip end of each of the convex portions observed in the line (line division) is measured. The maximum value of the time. If only the processing performance of the laser opening on the laser irradiation surface is considered, the longer the maximum length of the convex portion, the higher the light absorption rate of the laser light, and the processing performance of the laser opening is improved. However, since the maximum length of the convex portion is shorter, the other object is less likely to be damaged when it comes into contact with the roughened surface, so that the operation becomes easy. Again, the most convex When the large length is short, the surface shape of the copper foil before the roughening treatment can be maintained, and the change in the surface roughness before and after the roughening treatment can be suppressed. Therefore, the shortest length of the convex portion can obtain good adhesion to the insulating layer constituent material by the fine nano anchoring effect, and is equivalent to the case where the so-called roughened copper foil is used. The formation of fine pitch circuits with good etch factors becomes possible. Therefore, from the viewpoint of maintaining good laser drilling performance and making the operation easier, and obtaining good adhesion to the insulating layer constituent material and obtaining a good etching factor, The maximum length of the convex portion is preferably 400 nm or less, more preferably 300 nm or less. On the other hand, if the maximum length of the convex portion is less than 100 nm, the laser hole drilling performance is low. Further, if the maximum length of the convex portion is too short, a sufficient nano anchoring effect may not be obtained. Therefore, the maximum length of the convex portion is preferably 100 nm or more.

又,如第2圖所示,微細凹凸構造在銅箔之表層部分係被目視確認為層狀。以下,將微細凹凸構造在銅箔之表層部分占領為層狀之領域稱為微細凹凸構造層。此微細凹凸構造層,係相當於上述凸狀部從銅箔的表面突出之厚度方向的長度(高度)。然而,形成微細凹凸構造之各凸狀部的長度或突出方向並非一定,各凸狀部之突出方向對於銅箔之厚度方向不平行。且,各凸狀部之高度有差異。因此,微細凹凸構造層之厚度會產生差異。然而,該凸狀部之最大長度與微細凹凸構造層之間有一定的相關關係。本發明者們進行反覆試驗的結果,在該微細凹凸構造層之平均厚度為400nm以下的情況,上述凸狀部的最大長度為500nm以下。在此情況,如上述,由於不存在從銅層的表面長長突出之凸狀部,因此不僅可進行沒有差異之 良好的雷射開孔加工,且變得容易操作。在此同時,可得到與絕緣層構成材之良好的密著性,且可防止面內之兩者的密著性產生差異。更且,可得到良好的蝕刻因子。 Further, as shown in Fig. 2, the fine concavo-convex structure was visually confirmed to be a layered portion in the surface layer portion of the copper foil. Hereinafter, a field in which the fine concavo-convex structure is occupied as a layer in the surface layer portion of the copper foil is referred to as a fine concavo-convex structure layer. The fine concavo-convex structure layer corresponds to a length (height) in the thickness direction in which the convex portion protrudes from the surface of the copper foil. However, the length or the protruding direction of each convex portion forming the fine concavo-convex structure is not constant, and the protruding direction of each convex portion is not parallel to the thickness direction of the copper foil. Moreover, the height of each convex portion is different. Therefore, the thickness of the fine concavo-convex structure layer is different. However, there is a certain correlation between the maximum length of the convex portion and the fine concavo-convex structure layer. As a result of the repeated test, when the average thickness of the fine concavo-convex structure layer is 400 nm or less, the maximum length of the convex portion is 500 nm or less. In this case, as described above, since there is no convex portion that protrudes long from the surface of the copper layer, not only the difference can be made. Good laser hole drilling and easy handling. At the same time, good adhesion to the insulating layer constituent material can be obtained, and the difference in adhesion between the two surfaces can be prevented. Moreover, a good etching factor can be obtained.

使用掃描式電子顯微鏡,以傾斜角45°,50000倍以上的倍率平面地觀察該粗化處理面時,互相鄰接之凸狀部中,可與其他的凸狀部分離觀察之先端部分的長度在250nm以下為佳。在此,「可與其他的凸狀部分離觀察之先端部分的長度(以下,有僅略為「先端部分的長度」之情況)」,係指以下所示長度。例如,若藉由掃描式電子顯微鏡觀察上述粗化處理面之表面,一邊參照第1圖,如上述,由於在該粗化處理面凸狀部突出成針狀或板狀,該凸狀部密集設置在銅箔的表面,因此從銅箔表面無法觀察凸狀部的底端部,亦即銅複合化合物所形成之凸狀部與銅箔之界面。因此,如上述,在平面地觀察該銅箔之粗化處理面時,將互相密集而鄰接之凸狀部中,與其他凸狀部分離而可獨立存在做為一個凸狀部來觀察之部分稱為上述「可與其他的凸狀部分離觀察之先端部分的長度」,此先端部分的長度,係指從該凸狀部的先端(亦即先端部分的先端),到與其他的凸狀部可分離觀察之最底端部側之位置為止的長度。 When the roughened surface is planarly observed at a magnification of 45° or more at a tilt angle of 45° or more using a scanning electron microscope, the length of the tip end portion which can be separated from the other convex portions can be observed in the convex portion adjacent to each other. Below 250 nm is preferred. Here, the length of the tip end portion which can be observed separately from the other convex portions (hereinafter, the case where only the length of the tip end portion is slightly) is the length shown below. For example, when the surface of the roughened surface is observed by a scanning electron microscope, the first figure is referred to. As described above, the convex portion is densely formed in a needle shape or a plate shape on the roughened surface. Since it is provided on the surface of the copper foil, the bottom end portion of the convex portion, that is, the interface between the convex portion formed by the copper composite compound and the copper foil cannot be observed from the surface of the copper foil. Therefore, as described above, when the roughened surface of the copper foil is observed in a planar manner, the convex portions that are densely adjacent to each other are separated from the other convex portions and can be independently observed as a convex portion. It is referred to as "the length of the tip end portion which can be observed separately from other convex portions", and the length of the tip end portion refers to the tip end of the convex portion (that is, the tip end of the tip end portion) to other convex shapes. The length of the portion at which the bottom end portion of the observation portion can be separated can be separated.

該凸狀部之先端部分的長度,若在250nm以下之情況,上述凸狀部之最大長度大約在500nm以下。如上述,若考慮雷射開孔加工性能,凸狀部之最大長度長者為佳,該凸狀部之先端部分之長度也以長者為佳。然而,若該凸狀部之先端部分的長度愈長,在其他物體接觸時等容易受到損傷。又,凸 狀部的最大長度短者,較可維持粗化處理前之銅箔的表面形狀,可抑制在粗化處理前後之表面粗度的變化。因此,該凸狀部之最大長度短者,可藉由微細的奈米錨定效果而得到與絕緣層構成材之良好的密著性,且與使用所謂無粗化銅箔之情況同等之具有良好的蝕刻因子之微細間距電路的形成變得可能。因此,從一邊維持將該粗化處理面做為雷射照射面使用時之良好的雷射開孔加工性能,且使操作變得更容易之觀點,以及一邊得到與絕緣層構成材之良好的密著性,且得到良好的蝕刻因子之觀點來看,該凸狀部的先端部分的長度以在200nm以下為佳,100nm以下更佳。另一方面,該凸狀部之先端部分之長度若未滿30nm,雷射開孔加工性能低下。因此,該凸狀部之先端部分的長度在50nm以上為佳。 When the length of the tip end portion of the convex portion is 250 nm or less, the maximum length of the convex portion is approximately 500 nm or less. As described above, in consideration of the laser hole drilling performance, the maximum length of the convex portion is preferably long, and the length of the tip end portion of the convex portion is also preferably the length. However, if the length of the tip end portion of the convex portion is longer, it is easily damaged when other objects are in contact. Convex When the maximum length of the portion is shorter, the surface shape of the copper foil before the roughening treatment can be maintained, and the change in the surface roughness before and after the roughening treatment can be suppressed. Therefore, the shortest length of the convex portion can obtain good adhesion to the insulating layer constituent material by the fine nano anchoring effect, and is equivalent to the case where the so-called roughened copper foil is used. The formation of fine pitch circuits with good etch factors becomes possible. Therefore, from the viewpoint of maintaining excellent laser drilling performance when the roughened surface is used as a laser irradiation surface, and making the operation easier, and obtaining a material which is excellent in composition with the insulating layer, The length of the tip end portion of the convex portion is preferably 200 nm or less and more preferably 100 nm or less from the viewpoint of adhesion and a good etching factor. On the other hand, if the length of the tip end portion of the convex portion is less than 30 nm, the laser hole drilling performance is lowered. Therefore, the length of the tip end portion of the convex portion is preferably 50 nm or more.

更且,對於該凸狀部之上述最大長度,該凸狀部之上述先端部分的長度在1/2以下為佳。該比率在1/2以下的情況,藉由一邊與其他的凸狀部分離,凸狀部的先端部分從銅箔表面突出,可藉由此微細凹凸構造,更緻密地被覆銅箔表面。 Further, for the maximum length of the convex portion, the length of the tip end portion of the convex portion is preferably 1/2 or less. When the ratio is 1/2 or less, the tip end portion of the convex portion protrudes from the surface of the copper foil by being separated from the other convex portions, and the surface of the copper foil can be more densely covered by the fine uneven structure.

對於在該粗化處理面之微細凹凸構造之表面,使氪吸附而測定時之比表面積(以下,僅稱為「Kr吸附比表面積」)滿足0.035m2/g以上之條件為佳。這是由於此Kr吸附比表面積,若為0.035m2/g以上,則在粗化處理面之上述凸狀部之平均高度為200nm等級,可安定地確保良好的雷射開孔加工性能、耐擦傷性能、與絕緣層構成材之良好的密著性等之故。在此,Kr吸附比表面積之上限雖沒有限定,該上限約為0.3m2/g程度,而以0.2m2/g更佳。又,此時之Kr吸附比表面積,係使 用麥克默瑞提克公司製比表面積.細孔分布測定裝置3Flex,對於試料進行300℃×2小時的加熱做為前處理,使用液態氮溫度做為吸附溫度,使用氪(Kr)做為吸附氣體測定。 The surface area (hereinafter, simply referred to as "Kr adsorption specific surface area") when the ruthenium is adsorbed and measured on the surface of the fine uneven structure of the roughened surface is preferably 0.035 m 2 /g or more. This is because the Kr adsorption specific surface area is 0.035 m 2 /g or more, and the average height of the convex portion on the roughened surface is 200 nm, which ensures stable laser drilling performance and resistance. The scratch performance and the good adhesion to the insulating layer constituent material. Here, the upper limit of the Kr adsorption specific surface area is not limited, and the upper limit is about 0.3 m 2 /g, and more preferably 0.2 m 2 /g. Moreover, the specific surface area of Kr adsorption at this time is the specific surface area of McMurstock. The pore distribution measuring device 3Flex measures the sample at 300 ° C for 2 hours as a pretreatment, uses the liquid nitrogen temperature as the adsorption temperature, and uses krypton (Kr) as the adsorption gas.

接著,對於構成微細凹凸構造之成分說明。如上述,上述凸狀部係由含有氧化銅之銅複合化合物所形成。在本申請書中。從雷射開孔加工性能良好的觀點來看,在雷射照射面側,構成微細凹凸構造之該銅複合化合物以由氧化銅來形成為最佳,在以氧化銅為主成分之同時,也可含有氧化亞銅。又,任一情況皆可含有少量金屬銅。 Next, the components constituting the fine concavo-convex structure will be described. As described above, the convex portion is formed of a copper composite compound containing copper oxide. In this application. From the viewpoint of good laser drilling performance, the copper composite compound constituting the fine uneven structure on the side of the laser irradiation surface is preferably formed of copper oxide, and is mainly composed of copper oxide. It may contain cuprous oxide. Also, in any case, a small amount of metallic copper may be contained.

亦即,對於使用X光光電子能譜(X-ray Photoelectron Spectroscopy:以下僅稱為「XPS」。)分析上述微細凹凸構造之構成元素時所得到之Cu(I)的波峰面積,與Cu(II)之波峰面積之合計面積,Cu(I)之波鋒面積所占比率(以下,稱為占有面積率),在將該粗化處理面做為雷射照射面之情況以未滿50%為佳。 In other words, the peak area of Cu(I) obtained by analyzing the constituent elements of the fine concavo-convex structure by X-ray photoelectron spectroscopy (hereinafter referred to as "XPS"), and Cu (II) The total area of the peak areas, the ratio of the area of the wave front of Cu(I) (hereinafter referred to as the occupied area ratio), and the case where the roughened surface is used as the laser irradiation surface is less than 50%. good.

在此,說明藉由XPS,分析上述微細凹凸構造層之構成元素的方法。若藉由XPS分析微細凹凸構造層之構成元素,可將Cu(I)及Cu(II)之各波峰分離檢出。但是,分離檢出Cu(I)及Cu(II)之各波峰的情況,大部分的Cu(I)波峰之肩部會有與Cu(0)波峰被重覆觀測的情況。如此Cu(0)之波峰被重覆觀察的情況,包含此肩部,被看作為Cu(I)波峰。亦即,在本申請發明,使用XPS分析形成微細凹凸構造之銅複合化合物的構成元素,將出現在對應Cu 2p 3/2之結合能之932.4eV之Cu(I),及出現在934.3eV之Cu(II)之光電子檢出而可得到之各波峰波 形分離,從各成分之波鋒面積來特定Cu(I)波峰之占有面積率。但是,使用ULVAC PHI股份公司製Quantum 2000(光束條件:40W、200μm徑)做為XPS分析裝置,使用「MultiPack ver.6.1A」做為解析軟體,可進行狀態.半定量用窄掃描測定。 Here, a method of analyzing the constituent elements of the fine concavo-convex structure layer by XPS will be described. When the constituent elements of the fine concavo-convex structure layer are analyzed by XPS, the peaks of Cu(I) and Cu(II) can be separated and detected. However, when the peaks of Cu(I) and Cu(II) are separated and detected, most of the Cu(I) peaks may be repeatedly observed with the Cu(0) peak. When the peak of Cu(0) is repeatedly observed, the shoulder is included and is regarded as a Cu(I) peak. That is, in the invention of the present application, the constituent elements of the copper composite compound which forms the fine concavo-convex structure by XPS analysis will appear in Cu(I) corresponding to the binding energy of Cu 2p 3/2 of 932.4 eV, and appear at 934.3 eV. Cu (II) photoelectron detection can be obtained from each wave Shape separation, the area ratio of Cu(I) peaks is specified from the wave front area of each component. However, Quantum 2000 (beam condition: 40 W, 200 μm diameter) manufactured by ULVAC PHI Co., Ltd. was used as the XPS analyzer, and "MultiPack ver.6.1A" was used as the analysis software to perform the state. Semi-quantitative determination by narrow scan.

如以上所得到之Cu(I)波峰,被認為是由來自構成氧化亞銅(氧化第一銅:Cu2O)的1價的銅。然後,Cu(II)波峰,被認為是由來自構成氧化銅(氧化第二銅:CuO)之2價的銅。更且,Cu(0)波峰,被認為是由來自構成金屬銅之0價的銅。因此,Cu(I)之波鋒面積的占有率若未滿50%之情況,在構成該粗化處理層之銅複合化合物中氧化亞銅所占比率較氧化銅所占比率小。考慮雷射開孔加工性能之情況,該Cu(I)波峰之占有率愈小愈佳。亦即,該占有率,如未滿40%,未滿30%,未滿20%等般,其值愈小雷射開孔加工性能愈提升,若該占有率為0%,亦即構成微細凹凸構造之凸狀部僅由氧化銅所形成為最佳。 The Cu(I) peak obtained as described above is considered to be derived from monovalent copper constituting cuprous oxide (oxidized first copper: Cu 2 O). Then, the Cu(II) peak is considered to be derived from bivalent copper constituting copper oxide (oxidized second copper: CuO). Further, the Cu(0) peak is considered to be derived from the zero-valent copper constituting the metallic copper. Therefore, if the occupation ratio of the wave front area of Cu(I) is less than 50%, the ratio of cuprous oxide in the copper composite compound constituting the roughened layer is smaller than the ratio of copper oxide. Considering the processing performance of the laser opening, the smaller the occupancy of the Cu(I) peak is, the better. That is to say, if the occupancy rate is less than 40%, less than 30%, less than 20%, etc., the smaller the value, the higher the processing performance of the laser opening, and if the occupation rate is 0%, it constitutes a fine The convex portion of the uneven structure is preferably formed only of copper oxide.

另一方面,在與絕緣層構成材之接著面,銅複合化合物以含有氧化銅及氧化亞銅為佳,而以氧化亞銅為主成分較佳。具體而言,在與絕緣層構成材之接著面,上述Cu(I)波峰之占有率在50%以上為佳,而以70%以上較佳,80%以上更佳。氧化銅,相較於氧化亞銅,對於蝕刻液等之酸的溶解性高。因此,Cu(I)波峰之占有面積率若未滿50%的情況,對於該銅層實施雷射開孔加工後,更藉由蝕刻法進行電路形成的情況,微細凹凸構造之構成成分有變得容易溶解於蝕刻液之情況,有事後銅電路與絕緣層構成材之間的密著性低下的情況,而不佳。 在該接著面,Cu(I)之波峰占有面積率的上限值雖沒有特別限定,但為99%以下。Cu(I)波峰之占有面積率愈低,則絕緣層構成材與該接著面之密著性有提升之傾向。因此,為得到兩者之良好的密著性,Cu(I)波峰之專有面積率以在98%以下為佳,而在95%以下更佳。又,Cu(I)波峰之占有面積率,可以Cu(I)/{Cu(I)+Cu(II)}×100(%)之計算式算出。 On the other hand, the copper composite compound preferably contains copper oxide and cuprous oxide on the surface of the insulating layer constituent material, and cuprous oxide is preferred as the main component. Specifically, the Cu(I) peak occupancy ratio is preferably 50% or more and more preferably 70% or more, and more preferably 80% or more, on the surface of the insulating layer constituent material. Copper oxide has a high solubility in an acid such as an etching solution compared to cuprous oxide. Therefore, when the area ratio of the Cu(I) peak is less than 50%, the laser layer is subjected to laser drilling, and then the circuit is formed by an etching method, and the constituent components of the fine uneven structure are changed. In the case where it is easy to dissolve in the etching liquid, there is a case where the adhesion between the copper circuit and the insulating layer constituent material is lowered, which is not preferable. The upper limit of the area occupied by the peak of Cu(I) is not particularly limited, but is 99% or less. The lower the occupied area ratio of the Cu(I) peak, the more the adhesion of the insulating layer constituent material to the bonding surface tends to be improved. Therefore, in order to obtain good adhesion between the two, the exclusive area ratio of the Cu(I) peak is preferably 98% or less, and more preferably 95% or less. Further, the area ratio of the Cu(I) peak can be calculated by a calculation formula of Cu(I) / {Cu(I) + Cu(II)} × 100 (%).

以上所述微細凹凸構造,例如,可藉由下述以濕式在銅箔表面實施粗化處理來形成。首先,藉由以濕式法在銅箔的表面施以氧化處理,在銅箔表面形成以氧化銅(氧化第二銅)為主成分之銅複合化合物。藉由此,可在銅箔的表面形成由以氧化銅為主成分之銅複合化合物所形成之「針狀或板狀之凸狀部所形成之微細凹凸構造」。之後,根據必要,藉由對於該銅化合物施以還原處理而使氧化銅之一部分轉換成氧化亞銅(氧化第一銅),而可在銅箔的表面形成由含有氧化銅及氧化亞銅之銅複合化合物所形成之「針狀或板狀之凸狀部所形成之微細凹凸構造」。在此,本申請書所指的「微細凹凸構造」本身,係在氧化處理銅箔表面之階段,由含有氧化銅之銅化合物所形成。因此,形成以氧化銅為主成分之微細凹凸構造,或是由氧化銅所形成之微細凹凸構造之情況,在施以氧化處理後,不需要實施還原處理,只要結束該粗化處理即可。另一方面,在形成以一定比例含有氧化亞銅之微細凹凸構造之情況,實施該還原處理即可。即使施以還原處理,可以在幾乎維持藉由此以氧化銅為主成分之銅化合物所形成之微細凹凸構造之形狀下,將氧化銅之一部份轉換成氧化亞銅。其結果,可形成由含 有氧化銅及氧化亞銅之銅複合化合物所形成之「微細凹凸構造」。如此,藉由對銅箔表面以濕式法施以適當的氧化處理後,根據必要,實施必要程度之還原處理,上述之「微細凹凸構造」之形成變得可能。又,在以氧化銅為主成分之銅複合化合物,或是含有氧化銅及氧化亞銅之銅複合化合物,也可少量含有金屬銅。 The fine concavo-convex structure described above can be formed, for example, by performing a roughening treatment on the surface of the copper foil in a wet manner as follows. First, a copper composite compound containing copper oxide (second copper oxide) as a main component is formed on the surface of the copper foil by oxidation treatment on the surface of the copper foil by a wet method. As a result, a "fine concavo-convex structure formed by a convex portion of a needle shape or a plate shape" formed of a copper composite compound containing copper oxide as a main component can be formed on the surface of the copper foil. Thereafter, if necessary, a portion of the copper oxide is converted into cuprous oxide (oxidized first copper) by subjecting the copper compound to a reduction treatment, and a copper oxide and cuprous oxide are formed on the surface of the copper foil. A fine concavo-convex structure formed by a convex portion of a needle shape or a plate shape formed by a copper composite compound. Here, the "fine concavo-convex structure" referred to in the present application is formed of a copper compound containing copper oxide at the stage of oxidizing the surface of the copper foil. Therefore, in the case of forming a fine concavo-convex structure mainly composed of copper oxide or a fine concavo-convex structure formed of copper oxide, it is not necessary to carry out a reduction treatment after the oxidation treatment, and the roughening treatment may be completed. On the other hand, in the case where a fine uneven structure containing cuprous oxide is formed in a certain ratio, the reduction treatment may be carried out. Even if the reduction treatment is applied, a part of the copper oxide can be converted into cuprous oxide in a shape in which the fine concavo-convex structure formed by the copper compound mainly composed of copper oxide is maintained. The result can be formed by A "fine concavo-convex structure" formed of a copper composite compound of copper oxide and cuprous oxide. In this way, after the surface of the copper foil is subjected to an appropriate oxidation treatment by a wet method, if necessary, a reduction treatment is performed as necessary, and the formation of the above-mentioned "fine concavo-convex structure" becomes possible. Further, a copper composite compound containing copper oxide as a main component or a copper composite compound containing copper oxide and cuprous oxide may contain a small amount of metallic copper.

例如,藉由上述濕式實施粗化處理時,使用氫氧化鈉溶液等之鹼性溶液為佳。藉由以鹼性溶液,將銅箔的表面氧化,可在銅箔的表面上形成針狀或板狀之以氧化銅為主成分之銅複合化合物所形成之凸狀部。在此,藉由鹼性溶液對於銅箔的表面時施氧化處理之情況,有該凸狀部成長得很長,其最大長度超過500nm之情況,難以形成本申請書所指之微細凹凸構造。因此,為了構成上述微細凹凸構造,為了形成上述微細凹凸構造,使用含有可抑制在銅箔表面之氧化之氧化抑制劑的鹼性溶液為佳。 For example, when the roughening treatment is carried out by the wet method described above, it is preferred to use an alkaline solution such as a sodium hydroxide solution. By oxidizing the surface of the copper foil with an alkaline solution, a convex portion formed of a copper composite compound containing copper oxide as a main component in a needle shape or a plate shape can be formed on the surface of the copper foil. Here, when the surface of the copper foil is oxidized by the alkaline solution, the convex portion grows long, and when the maximum length exceeds 500 nm, it is difficult to form the fine concavo-convex structure referred to in the present application. Therefore, in order to form the fine concavo-convex structure, it is preferable to use an alkaline solution containing an oxidation inhibitor capable of suppressing oxidation of the surface of the copper foil in order to form the fine concavo-convex structure.

做為如此之氧化抑制劑,例如,可舉出氨基矽烷耦合劑。若使用含有氨基矽烷耦合劑之鹼性溶液,在銅箔表面施以氧化處理,則該鹼性溶液中之氨基矽烷耦合劑吸附在銅箔表面,而可抑制鹼性溶液所造成之銅箔表面的氧化。其結果,可抑制氧化銅之針狀結晶的成長,而可在銅層的表面形成極微細的凹凸構造。 As such an oxidation inhibitor, for example, an amino silane coupling agent can be mentioned. If an alkaline solution containing an amino decane coupling agent is used and an oxidation treatment is applied to the surface of the copper foil, the amino decane coupling agent in the alkaline solution is adsorbed on the surface of the copper foil, and the surface of the copper foil caused by the alkaline solution can be suppressed. Oxidation. As a result, growth of needle crystals of copper oxide can be suppressed, and an extremely fine uneven structure can be formed on the surface of the copper layer.

做為上述矽烷耦合劑,具體而言,可使用N-2-(氨基乙基)-3-氨基丙基甲基二甲氧矽烷、N-2-(氨基乙基)-3-氨基丙基三甲氧矽烷、3-氨基丙基三甲氧矽烷、3-氨基丙基三乙氧 矽烷、3-三乙氧矽烷-N-(1,3-二甲機-丁亞基)丙胺、N-苯基-3-氨基丙基三甲氧基矽烷等。這些皆溶解於鹼性溶液,可在鹼性溶液中被安定地保持之同時,發揮抑制上述銅箔表面之氧化之效果。 As the above decane coupling agent, specifically, N-2-(aminoethyl)-3-aminopropylmethyldimethoxydecane, N-2-(aminoethyl)-3-aminopropyl group can be used. Trimethoxy decane, 3-aminopropyltrimethoxy decane, 3-aminopropyl triethoxy Decane, 3-triethoxyoxane-N-(1,3-dimethyl-butylene)propylamine, N-phenyl-3-aminopropyltrimethoxydecane, and the like. These are all dissolved in an alkaline solution, and can be stably held in an alkaline solution while exerting an effect of suppressing oxidation of the surface of the copper foil.

如上述,藉由以含有氨基系矽烷耦合劑之鹼性溶液,對於銅箔的表面施以氧化處理而形成之微細凹凸構造,在之後,即使施以還原處理也可幾乎維持該形狀。其結果,可形成具有:含有氧化銅及氧化亞銅,由這些的銅複合化合物所形成之最大長度在500nm以下之針狀或板狀的凸狀部所形成之微細凹凸構造的粗化處理面。又,在還原處理中,藉由調整還原劑濃度、溶液pH、溶液溫度等,而可適當調整對於使用XPS定性分析形成微細凹凸構造之銅複合化合物的構成元素時所得到之Cu(I)波鋒面積與Cu(II)波峰面積之合計面積,Cu(I)之波峰占有面積。又,例如,藉由將銅箔浸漬於鹼性溶液,在銅箔之兩面形成以氧化銅為主成分之微細凹凸構造,之後,若僅對於與絕緣層構成材之接著面施以還原處理,即可做成關於雷射照射面Cu(I)之波峰之占有率為0%或未滿2%,關於接著面,Cu(I)之波峰占有率為50%以上之兩面粗化處理銅箔。又,可使兩面之Cu(I)之波峰之占有率為適當適切之值。若藉由XPS分析以上述方法形成之微細凹凸構造的構成元素,會檢出「-COOH」之存在。 As described above, the fine concavo-convex structure formed by subjecting the surface of the copper foil to an oxidation treatment by an alkaline solution containing an amino-based decane coupling agent can be almost maintained even after the reduction treatment. As a result, a roughened surface having a fine concavo-convex structure formed of a needle-like or plate-like convex portion having a maximum length of 500 nm or less formed of a copper composite compound containing copper oxide and cuprous oxide can be formed. . In the reduction treatment, the Cu(I) wave obtained when the constituent elements of the copper composite compound having a fine uneven structure is formed by qualitative analysis using XPS can be appropriately adjusted by adjusting the concentration of the reducing agent, the pH of the solution, the temperature of the solution, and the like. The total area of the front area and the Cu(II) peak area, and the peak area occupied by Cu(I). Further, for example, by immersing the copper foil in an alkaline solution, a fine concavo-convex structure containing copper oxide as a main component is formed on both surfaces of the copper foil, and then, only the adhesion surface to the surface of the insulating layer constituent material is subjected to reduction treatment. It is possible to make a double-sided roughening copper foil with a peak occupancy ratio of Cu(I) of the laser irradiation surface Cu(I) of 0% or less than 2%, and a crest occupancy ratio of Cu(I) of 50% or more with respect to the adhesion surface. . Further, the occupation ratio of the peak of Cu(I) on both sides can be appropriately adjusted. When the constituent elements of the fine concavo-convex structure formed by the above method are analyzed by XPS, the presence of "-COOH" is detected.

如上述之氧化處理及還原處理,由於可藉由使用各處理溶液之濕式法來進行,因此可藉由將銅箔浸漬於處理溶液中等之方法而簡易地在銅箔的兩面形成上述微細凹凸構 造。因此,若利用此濕式法,在銅箔之兩面形成微細凹凸構造,不僅可使雷射照射面側之雷射開孔加工性良好之同時,也可藉由由於該微細凹凸構造之錨定效果而使絕緣層構成材與銅箔之密著性良好。更且,該微細凹凸構造,係如上述,由於耐擦傷性能高,即使在銅箔的兩面形成該微細凹凸構造,操作也很容易,可維持雷射照射面側之表面之微細凹凸構造,而可防止落粉等。 Since the oxidation treatment and the reduction treatment described above can be carried out by a wet method using each treatment solution, the above-mentioned fine unevenness can be easily formed on both sides of the copper foil by immersing the copper foil in a treatment solution or the like. Structure Made. Therefore, when the wet method is used, the fine concavo-convex structure is formed on both surfaces of the copper foil, and the laser drilling processability on the laser irradiation surface side can be improved, and the anchoring structure can be anchored by the fine concavo-convex structure. The effect is that the insulating layer constituent material and the copper foil have good adhesion. In addition, as described above, the fine concavo-convex structure has high scratch resistance, and even if the fine concavo-convex structure is formed on both surfaces of the copper foil, the operation is easy, and the fine concavo-convex structure on the surface of the laser irradiation surface side can be maintained. It can prevent falling powder and the like.

1-3.矽烷耦合劑處理 1-3. Treatment with decane coupling agent

在與上述兩面粗化處理銅箔之絕緣層構成材之接著面,為了改善加工成印刷電路板時之耐吸濕劣化特性,也可設置矽烷耦合劑層。設置在該粗化處理面之矽烷耦合劑處理層,可使用烯烴官能矽烷、環氧官能矽烷、乙烯官能矽烷、丙烯酸官能矽烷、氨基官能矽烷以及巰基官能矽烷之任一種做為矽烷耦合劑而形成。這些矽烷耦合劑,係以一般式R-Si(OR’)n來表示(在此,R:以氨基或乙烯基等為代表之有機官能機,OR’:以甲氧基或乙氧基為代表之加水分解基,n:2或3。)。 The decane coupling agent layer may be provided on the adhesion surface of the insulating layer constituent material of the two-side roughened copper foil in order to improve the moisture absorption deterioration resistance when processed into a printed circuit board. The decane coupling agent treatment layer disposed on the roughening treatment surface may be formed by using any one of an olefin functional decane, an epoxy functional decane, an ethylene functional decane, an acrylic functional decane, an amino functional decane, and a decyl functional decane as a decane coupling agent. . These decane coupling agents are represented by the general formula R-Si(OR')n (here, R: an organic functional machine represented by an amino group or a vinyl group, OR': a methoxy group or an ethoxy group) Representative of the hydrolysis base, n: 2 or 3.).

在此所說的矽烷耦合劑,更具體而言,係指以與用於印刷電路板用之預浸料之玻璃布同樣的矽烷耦合劑為中心,可使用乙烯基三甲氧基矽烷、乙烯基苯基三甲氧基矽烷、γ-甲基丙烯酰三甲氧基矽烷、γ-環氧丙氧三甲氧基矽烷、4-丁基縮水甘油醚三甲氧基矽烷、γ-氨丙基三乙氧基矽烷、N-β(氨乙基)γ-氨丙基三甲氧基矽烷、N-3-(4-(3-氨基丙)丁)丙基-3-氨丙基三甲氧基矽烷、咪唑矽烷、三嗪矽烷、3-丙烯酰甲氧基矽烷、γ-巰丙基三甲氧基矽烷等。 The decane coupling agent as used herein, more specifically, refers to the same decane coupling agent as the glass cloth used for the prepreg for printed circuit boards, and vinyl trimethoxy decane or vinyl can be used. Phenyltrimethoxydecane, γ-methacryloyltrimethoxydecane, γ-glycidoxytrimethoxydecane, 4-butyl glycidyl ether trimethoxydecane, γ-aminopropyltriethoxy矽, N-β(aminoethyl)γ-aminopropyltrimethoxydecane, N-3-(4-(3-aminoprop)butyl)propyl-3-aminopropyltrimethoxydecane, imidazolium , triazine decane, 3-acryloyl methoxy decane, γ-mercaptopropyl trimethoxy decane, and the like.

在此所列舉的矽烷耦合劑,不會對成為印刷電路板之後的特性造成不好的影響。至於使用此矽烷耦合劑中之哪一種類,可根據該覆銅層積板的用途等,來適當選擇。 The decane coupling agents listed herein do not adversely affect the characteristics after becoming a printed circuit board. Which one of the decane coupling agents is used can be appropriately selected depending on the use of the copper clad laminate or the like.

以上所述矽烷耦合劑,係以水為主溶劑,使該矽烷耦合劑成分成為0.5g/L~10g/L之濃度範圍而含有,使用室溫程度的溫度之矽烷耦合劑處理液為佳。此矽烷耦合劑處理液之矽烷耦合劑濃度若低於0.5g/L的情況,矽烷耦合劑之吸著速度慢,不符合一般商業基準之利益,吸附也變得不均一。另一方面,若該矽烷耦合劑濃度即使超過10g/L,吸附速度也不會特別變快,也沒有辦法使耐吸濕劣化性等性能品質特別提升,因此不經濟而不佳。 The decane coupling agent described above is preferably a water-based solvent, and the decane coupling agent component is contained in a concentration range of 0.5 g/L to 10 g/L, and a decane coupling agent treatment liquid having a temperature of room temperature is preferred. When the concentration of the decane coupling agent of the decane coupling agent treatment liquid is less than 0.5 g/L, the susceptibility of the decane coupling agent is slow, which does not conform to the general commercial standard, and the adsorption becomes uneven. On the other hand, when the concentration of the decane coupling agent exceeds 10 g/L, the adsorption rate does not become particularly high, and there is no possibility that the performance quality such as moisture absorption deterioration resistance is particularly improved, which is not economically preferable.

使用此矽烷耦合劑處理液之對於粗化處理面的矽烷耦合劑之吸附方法,可採用浸漬法、淋浴法、噴霧法等,並沒有特別限定,亦即,只要配合工程設計,可使該粗化處理面與矽烷耦合劑處理液最均一地接觸、吸附之方法即可。 The adsorption method of the decane coupling agent for the roughened surface by using the decane coupling agent treatment liquid may be a dipping method, a shower method, a spray method, or the like, and is not particularly limited, that is, as long as the engineering design is used, the coarsening can be performed. The method of contacting and adsorbing the treatment surface with the decane coupling agent treatment liquid most uniformly can be carried out.

在該粗化處理面上使矽烷耦合劑吸附後,進行充分的乾燥,促進該粗化處理面之-OH基與所吸附之矽烷耦合劑之縮合反應,使縮合的結果所產生之水分完全蒸發。關於此時之乾燥方法並沒有特別限定。例如,可使用電熱器,或也可為吹附溫風之衝風法,並沒有特別限制,採用對應製造線之乾燥方法與乾燥條件即可。但是,以上所說明之矽烷耦合劑處理係對於與絕緣層構成材之接著面所進行之處理,不需要對於雷射照射面實施。 After the decane coupling agent is adsorbed on the roughened surface, sufficient drying is carried out to promote the condensation reaction between the -OH group of the roughened surface and the adsorbed decane coupling agent, so that the moisture generated by the condensation is completely evaporated. . The drying method at this time is not particularly limited. For example, an electric heater or an air blowing method for blowing warm air may be used, and it is not particularly limited, and a drying method and a drying condition corresponding to the manufacturing line may be employed. However, the decane coupling agent treatment described above is not required to be applied to the laser irradiation surface for the treatment with the bonding surface of the insulating layer constituent material.

1-4.粗化處理面之亮度L* 1-4. The brightness of the roughened surface L*

如上述,構成微細凹凸構造之最大長度在500nm以下之針狀或板狀之凸狀部,較碳酸氣體雷射之波長短,且以較可視光之波長領域短之間距配列。射入該粗化處理面之光,在微細凹凸構造內重複亂反射的結果,會衰減。亦即,該粗化處理層做為吸光面而作用,該粗化處理面的表面若與粗化處理前相比,暗色化成黑色化、茶褐色化。亦即,與本申請書有關之覆銅層積板,其表面之粗化處理面之色調也有特色,L*a*b*表色系中亮度L*之值為30以下。此亮度L*之值若超過30而成為明亮色調的情況,則為構成微細凹凸構造之上述凸狀部的最大長度超過500nm之情況而不佳。又,在L*之值超過30之情況,即使上述凸狀部的最大長度在500nm以下,也有該凸狀部在銅箔的表面沒有充分密集設置的情況。如此,亮度L*之值若超過30之情況,被認為粗化處理不充分,或是粗化處理之狀態不均。在此情況,有為了得到良好的雷射開孔加工性能、耐擦傷性能、與絕緣層構成材之良好的密著性等所進行之粗化處理進行地不充分之虞而不佳。又,該亮度L*之值以在25以下為佳。亮度L*之值在25以下之情況,會成為更適合雷射開孔加工之粗化處理面。又,亮度L*之測定,係使用日本電色工業股份公司製分光色差計SE2000,亮度的校正係使用附屬於測定裝置之白色板,根據JIS Z8722:2000進行。然後,關於同一部位進行3次的測定,將3次的亮度L*之測定資料的平均值,做為本申請書中所指亮度L*之值。又,即使在粗化處理面施以上述矽烷耦合劑處理,在矽烷耦合劑處理之前後,該粗化處理面之亮度L*之值不會產生變動。 As described above, the needle-like or plate-like convex portion having the maximum length of the fine concavo-convex structure of 500 nm or less is shorter than the wavelength of the carbon dioxide gas laser and is arranged at a shorter distance from the wavelength range of the visible light. The light incident on the roughened surface is attenuated as a result of repeating the disordered reflection in the fine concavo-convex structure. That is, the roughened layer acts as a light absorbing surface, and the surface of the roughened surface is darkened to become blackish or brownish as compared with before the roughening treatment. That is, the copper-clad laminate associated with the present application has a characteristic color tone on the roughened surface of the surface, and the value of the brightness L* in the L*a*b* color system is 30 or less. When the value of the luminance L* exceeds 30 and the color tone is bright, it is not preferable that the maximum length of the convex portion constituting the fine concavo-convex structure exceeds 500 nm. Further, when the value of L* exceeds 30, even if the maximum length of the convex portion is 500 nm or less, the convex portion may not be sufficiently densely formed on the surface of the copper foil. Thus, if the value of the brightness L* exceeds 30, it is considered that the roughening process is insufficient or the state of the roughening process is not uniform. In this case, it is not preferable to perform insufficient roughening treatment in order to obtain good laser drilling performance, scratch resistance, and good adhesion to the insulating layer constituent material. Further, the value of the luminance L* is preferably 25 or less. When the value of the brightness L* is 25 or less, it becomes a roughening treatment surface which is more suitable for laser drilling. In addition, the measurement of the brightness L* was performed by a spectrophotometer SE2000 manufactured by Nippon Denshoku Industries Co., Ltd., and the brightness was corrected using a white plate attached to the measuring device according to JIS Z8722:2000. Then, the measurement was performed three times on the same portion, and the average value of the measurement data of the brightness L* of three times was taken as the value of the brightness L* indicated in the present application. Further, even if the above-described decane coupling agent treatment is applied to the roughened surface, the value of the brightness L* of the roughened surface does not fluctuate after the decane coupling agent treatment.

1-5.覆銅層積板之層構成 1-5. Layer composition of copper clad laminate

說明關於與本申請書有關之覆銅層積板1之具體的層構成。該覆銅層積板,例如,係包括第3圖及第4圖所示之基本的層構成。第3圖,係表示電解銅箔2之析出面側之粗化處理面4成為外表面而做為雷射照射面所使用時之層構成例,第4圖係表示電解銅箔2之電極面側之粗化處理面3成為覆銅層積板之外表面,而做為雷射照射面使用時之層構成例。在任一情況,另一面側之粗化處理面皆成為與絕緣層構成材之接著面。又,如第3圖及第4圖所示,在與該覆銅層積板之雷射光之照射側反對側之面(另一面),也可層積本申請書所指之雷射開孔加工用之粗化處理銅箔。使用壓延銅箔取代電解銅箔之情況,也與這些的形態相同。在任一種形態,都只要在絕緣構成材之至少單面上層積上述兩面粗化處理銅箔即可,藉由採用該構成,可使覆銅層積板1之雷射照射面做為本申請書所指粗化處理面。如上述,只要在雷射照射面設置上述微細凹凸構造,該粗化處理面會做為雷射光吸光面而作用,因此,容易地雷射開孔加工變得可能。又,若沒有將覆銅層積板1之另一面側做為雷射照射面使用之情況,該另一面側之銅層可採用任意的構成。但是,藉由層積具有上述微細凹凸構造之銅箔做為絕緣層構成材,如上述,可得到與絕緣層構成材之良好的密著性。 The specific layer constitution of the copper clad laminate 1 relating to the present application will be described. The copper clad laminate includes, for example, a basic layer configuration as shown in Figs. 3 and 4. 3 is a view showing an example of a layer configuration when the roughened surface 4 on the deposition surface side of the electrolytic copper foil 2 is an outer surface and used as a laser irradiation surface, and FIG. 4 is an electrode surface of the electrolytic copper foil 2. The side roughening treatment surface 3 is an outer layer surface of the copper clad laminate, and is used as a layer constitution example when the laser irradiation surface is used. In either case, the roughened surface on the other side is the surface of the insulating layer. Further, as shown in FIGS. 3 and 4, the laser opening referred to in the present application may be laminated on the opposite side (the other surface) of the irradiation side of the laser light on the copper clad laminate. Roughening copper foil for processing. The case where the rolled copper foil is used instead of the electrolytic copper foil is also the same as these. In either case, the two-side roughened copper foil may be laminated on at least one side of the insulating constituent material. By adopting this configuration, the laser-illuminated surface of the copper-clad laminate 1 can be used as the present application. Refers to the roughening treatment surface. As described above, if the fine uneven structure is provided on the laser irradiation surface, the roughened surface acts as a laser light absorbing surface, and thus it is easy to perform laser drilling. Further, if the other side of the copper clad laminate 1 is not used as the laser irradiation surface, the copper layer on the other side may have any configuration. However, by laminating a copper foil having the above-described fine concavo-convex structure as an insulating layer constituent material, as described above, good adhesion to the insulating layer constituent material can be obtained.

又,如第3圖及第4圖所示,具有雷射照射面之銅層2,與另一面側之銅層2之間存在絕緣層5。此絕緣層5係藉由樹脂等之絕緣層構成材料所形成之層,並非限定於絕緣層構成材。 Further, as shown in FIGS. 3 and 4, the insulating layer 5 is present between the copper layer 2 having the laser irradiation surface and the copper layer 2 on the other surface side. The insulating layer 5 is a layer formed of a material constituting an insulating layer such as a resin, and is not limited to the insulating layer constituting material.

2.雷射開孔加工方法之基本概念 2. The basic concept of laser drilling method

接著,一邊參照第5圖,對於使用上述覆銅層積板實施雷射開孔加工之方法說明。在此,以對於與第3圖(1-C)所示形態具有同樣之層構成之覆銅層積板施以雷射開孔加工之情況為例說明。在本申請書中,實施雷射開孔加工時,係將上述粗化處理面4做為雷射照射面使用,藉由對於該粗化處理面4照射碳酸氣體雷射等雷射光,可形成如第5圖(B)所示之盲導孔10。此時,藉由調整雷射光之照射時間等,也可使貫通至雷射照射面之另一面側之貫通導孔為可能。在該情況,在第5圖(B)中,雷射光之照射側之反對面側之銅層2,係成為該銅層2之雷射光之照射側之面。亦即,藉由使與絕緣層5接觸之表面,為具有由銅複合化合物所形成之最大長度為500nm以下之針狀或板狀之凸狀部所形成之微細凹凸構造之粗化處理面3,而可使形成貫通導孔時之雷射開孔加工性能提升。 Next, a method of performing laser drilling processing using the above-described copper clad laminate will be described with reference to FIG. Here, a case where the copper-clad laminate having the same layer configuration as that shown in Fig. 3 (1-C) is subjected to laser drilling is described as an example. In the present application, when the laser drilling process is performed, the roughened surface 4 is used as a laser irradiation surface, and the roughened surface 4 is irradiated with laser light such as a carbon dioxide gas to form a laser beam. The blind via 10 as shown in Fig. 5(B). At this time, by adjusting the irradiation time of the laser light or the like, it is possible to penetrate the through-holes on the other surface side of the laser irradiation surface. In this case, in the fifth diagram (B), the copper layer 2 on the opposite side of the irradiation side of the laser light is the surface on the irradiation side of the laser light of the copper layer 2. In other words, the surface of the surface which is in contact with the insulating layer 5 is a roughened surface 3 having a fine concavo-convex structure formed of a needle-like or plate-like convex portion having a maximum length of 500 nm or less formed of a copper composite compound. In addition, the processing performance of the laser opening when the through hole is formed can be improved.

在此,試著思考對於藉由使本申請書中之雷射照射面為上述粗化處理面,而可使雷射開孔加工性能提升之理由。首先,藉由將銅層之外表面做為上述粗化處理面,使銅層之外表面具有微細凹凸構造,如上述,由於該粗化處理面會成為黑色或茶褐色之粗糙面而抑制雷射光之反射,因此可將雷射光之熱能有效率地供給於雷射光照射部位。相對於此,覆銅層積板之雷射照射面為銅層本身之情況,若在銅層之表面沒有施以粗化處理或黑化處理等,則在銅層的表面,雷射光被反射,而無法有效率地將雷射光之熱能供給於雷射光照射部位。 Here, it is attempted to consider the reason why the laser drilling process performance can be improved by making the laser irradiation surface in the present application the roughened surface. First, by using the outer surface of the copper layer as the roughened surface, the outer surface of the copper layer has a fine uneven structure. As described above, since the roughened surface becomes a rough surface of black or brownish brown, the laser light is suppressed. The reflection is so that the thermal energy of the laser light can be efficiently supplied to the laser light irradiation portion. On the other hand, in the case where the laser irradiation surface of the copper clad laminate is the copper layer itself, if the surface of the copper layer is not subjected to roughening treatment or blackening treatment, the laser light is reflected on the surface of the copper layer. The thermal energy of the laser light cannot be efficiently supplied to the laser light irradiation portion.

又,相對於銅之沸點2562℃,氧化銅及氧化亞銅 之沸點分別為2000℃、1800℃,與銅相比,氧化銅及氧化亞銅之沸點低。因此,若將雷射光對於上述粗化處理面照設,相較於銅層本身為外表面之情況,粗化處理面之雷射照射部位很快達到沸點。另一方面,相對於銅之熱傳導率在700℃為354W.m-1.K-1,氧化銅及氧化亞銅之熱傳導率,在700℃皆為20W.m-1.K-1以下。亦即,氧化銅及氧化亞銅之熱傳導率為銅之熱傳導率之數十分之1以下。另一方面,相對於氧化銅及氧化亞銅之熔點分別為1201℃、1235℃,銅之熔點低至1083℃。因此,對於前述粗化處理面照射雷射光之情況,相較於銅層本身為外表面之情況,對於上述粗化處理面照射雷射光之情況,在雷射照射部位之外側,熱傳達之速度變慢。其結果,可使熱集中在深度方向,而可容易地使銅層之溫度在熔點以上。因此,藉由在雷射照射面具有由上述銅複合化合物所形成之微細凹凸構造,相較於銅層本身為外表面之情況,可效率良好地進行雷射開孔加工。 Further, with respect to the boiling point of copper of 2562 ° C, the boiling points of copper oxide and cuprous oxide are 2000 ° C and 1800 ° C, respectively, and the boiling points of copper oxide and cuprous oxide are lower than those of copper. Therefore, if the laser light is applied to the roughened surface, the laser irradiation portion of the roughened surface quickly reaches the boiling point as compared with the case where the copper layer itself is the outer surface. On the other hand, the thermal conductivity relative to copper is 354 W at 700 ° C. m -1 . The thermal conductivity of K -1 , copper oxide and cuprous oxide is 20W at 700 ° C. m -1 . K -1 or less. That is, the thermal conductivity of copper oxide and cuprous oxide is one tenth or less of the thermal conductivity of copper. On the other hand, the melting points of copper oxide and cuprous oxide are 1201 ° C and 1235 ° C, respectively, and the melting point of copper is as low as 1083 ° C. Therefore, in the case where the roughened surface is irradiated with the laser light, compared with the case where the copper layer itself is the outer surface, the speed of heat transfer is performed on the outer side of the laser irradiation portion when the roughened surface is irradiated with the laser light. Slow down. As a result, heat can be concentrated in the depth direction, and the temperature of the copper layer can be easily made higher than the melting point. Therefore, by having the fine concavo-convex structure formed of the copper composite compound on the laser irradiation surface, the laser drilling process can be efficiently performed compared to the case where the copper layer itself is the outer surface.

又,在第5圖,係對於使用具有第3圖(1-C)所示層構成之覆銅層積板1施以雷射開孔加工之情況說明,但具有第3圖及第4圖所示之任一層構造之覆銅層積板1等,若覆銅層積板之雷射照射面之銅層使用本申請書所指之兩面粗化處理銅箔而形成,即使為具有其他層構成之覆銅層積板,也可以與上述同樣的步驟施以雷射開孔加工。 In addition, in the fifth drawing, the case where the copper-clad laminate 1 having the layer configuration shown in Fig. 3 (1-C) is subjected to laser drilling is described, but the third and fourth drawings are provided. In the copper-clad laminate 1 or the like of any of the layer structures shown, if the copper layer of the laser-illuminated surface of the copper-clad laminate is formed by using the two-side roughened copper foil referred to in the present application, even if it has other layers The copper clad laminate formed may be subjected to laser drilling in the same manner as described above.

<印刷電路板之形態> <Form of printed circuit board>

與本申請書有關之印刷電路板,係以包括使用了雷射開孔加工用之粗化處理銅箔而形成之銅層為特徵,例如,可為使用 與本申請書有關之覆銅層積板而製造之印刷電路板。又,與本申請書有關之印刷電路板,只要具有使用上述兩面粗化處理銅箔而形成之銅層及可,例如,可為藉由第6圖及第7圖所示工程而製造之多層印刷電路板,但並非限定於以下所說明之多層印刷電路板,其具體的層構成或製造方法等也沒有特別限定。 The printed circuit board relating to the present application is characterized by including a copper layer formed by using a roughened copper foil for laser drilling, for example, for use. A printed circuit board manufactured by laminating copper laminates related to the present application. Further, the printed circuit board according to the present application may have a copper layer formed by using the above-described two-side roughening copper foil, and may be, for example, a multilayer manufactured by the processes shown in FIGS. 6 and 7. The printed circuit board is not limited to the multilayer printed circuit board described below, and the specific layer configuration, manufacturing method, and the like are not particularly limited.

第6及第7圖係表示藉由所謂增層法之多層印刷電路板之製造工程之一例。例如,如第6圖(A)所示,在具有內層電路8之內層基板9之兩面,介在預浸料或樹脂薄膜等之絕緣層構成材7,層積與本申請書有關之上述兩面粗化處理銅箔。又,在第6圖(A)所示例,係舉例做為內層積板9,在其兩面具有內層電路8,形成了層間接續用之填充導孔(導孔)10之物。但是,內層積板9並非限定於第6圖(A)所示形態,其層構成等可為任意之物。 The sixth and seventh drawings show an example of a manufacturing process of a multilayer printed circuit board by a so-called build-up method. For example, as shown in Fig. 6(A), on both sides of the inner layer substrate 9 having the inner layer circuit 8, the insulating layer constituent material 7 such as a prepreg or a resin film is laminated, and the above is related to the present application. The copper foil is roughened on both sides. Further, in the example shown in Fig. 6(A), the inner laminated board 9 is exemplified, and the inner layer circuit 8 is provided on both sides thereof to form a layer in which the via hole (via) 10 is indirectly continued. However, the inner laminate 9 is not limited to the embodiment shown in Fig. 6(A), and the layer configuration and the like may be arbitrary.

如上述,若在內層積板9之兩面介在絕緣層構成材7層積本申請書所指之兩面粗化處理銅箔,會成為在內層基板9之兩面形成了第1增層層30之第1具有增層層之層積體40(參照第6圖(B))。然後,對於第1增層層30之粗化處理面4,分別照射雷射光,例如,以同於上述方法施以雷射開孔加工。之後,施以為了除去由於雷射開孔加工所產生之樹脂殘渣之除膠渣處理,在導孔內之內壁部施以層間導通電鍍處理而形成電鍍層24之同時,將導孔內電鍍充填,做為充填導孔。然後,藉由蝕刻加工形成第1增層配線層31,而成為具有為了與內層基板9之內層電路接續之充填導孔10之第1具有增層電路層層積體41(參照第7圖(C))。 As described above, when the two surfaces of the inner laminated board 9 are laminated on the insulating layer forming material 7 to laminate the two-side roughened copper foil referred to in the present application, the first build-up layer 30 is formed on both surfaces of the inner layer substrate 9. The first laminate 40 having a buildup layer (see Fig. 6(B)). Then, the roughened surface 4 of the first buildup layer 30 is irradiated with laser light, for example, by laser drilling in the same manner as described above. Thereafter, in order to remove the desmear treatment of the resin residue generated by the laser drilling process, the inner wall portion of the via hole is subjected to interlayer conduction plating treatment to form the plating layer 24, and the via hole is plated. Fill as a filling guide hole. Then, the first build-up wiring layer 31 is formed by etching, and the first build-up circuit layer laminate 41 having the via holes 10 for connecting to the inner layer circuit of the inner substrate 9 is formed (see the seventh). Figure (C)).

更且,若在第7圖(C)所示第1具有增層電路層層積體41之兩面上,介在預浸料或樹脂箔膜等之絕緣層構成材7,層積兩面粗化處理銅箔2,會成為第7圖(D)所示具有第2增層層32之第2具有增層層層積體42。從此階段,施以與第6圖(B)及第7圖(C)同樣之工程,再度,介在預浸料或樹脂薄膜等之絕緣層構成材7,根據必要反覆進行層積兩面粗化處理銅箔2之操作,而可成為具有第n電路圖樣層(n≧3:整數)之增層基板。 Further, on both surfaces of the first multilayered layered laminated body 41 shown in Fig. 7(C), the insulating layer forming material 7 such as a prepreg or a resin foil film is laminated and roughened on both sides. The copper foil 2 is the second buildup layered body 42 having the second buildup layer 32 shown in Fig. 7(D). At this stage, the same construction as in Fig. 6 (B) and Fig. 7 (C) is applied, and the insulating layer constituent material 7 such as a prepreg or a resin film is placed again, and the two sides are roughened as necessary. The operation of the copper foil 2 can be a build-up substrate having an nth circuit pattern layer (n≧3: integer).

然後,結束了最終增層層積之增層層基板,係根據必要施以雷射開孔加工、除殘膠處理、在導孔內施以層間導通電鍍處理而形成電鍍層之同時,電鍍充填導孔內而成為充填導孔10。之後,將外層之銅層蝕刻加工等,形成外層電路而成為多層印刷電路板。 Then, the build-up layer substrate of the final build-up layer is finished, and the plating is performed by performing laser opening processing, removing residual glue treatment, and performing interlayer conduction plating treatment in the via hole to form a plating layer, and plating filling. The guide hole 10 is filled in the guide hole. Thereafter, the outer copper layer is etched or the like to form an outer layer circuit to form a multilayer printed wiring board.

上述印刷電路板,由於使用了與本申請書有關之兩面粗化處理銅箔,因此雷射開孔加工性能良好,具有做為印刷電路板之良好的導孔。又,藉由接著面側之微細凹凸構造,而使對於內層電路之絕緣層構成材得到良好的密著性為可能。 Since the above-mentioned printed circuit board uses the double-faced roughened copper foil related to the present application, the laser drilling performance is good, and it has a good pilot hole as a printed circuit board. Moreover, it is possible to obtain good adhesion to the insulating layer constituent material of the inner layer circuit by the fine concavo-convex structure on the surface side.

以下,透過實施例及比較例,說明關於使用與本申請書有關之雷射開孔加工用之粗化處理銅箔製造覆銅層積板及印刷電路板時之技術上的優勢。 Hereinafter, technical advantages in the production of a copper clad laminate and a printed circuit board using the roughened copper foil for laser drilling according to the present application will be described by way of examples and comparative examples.

【實施例1】 [Example 1]

做為電解銅箔,使用析出面的表面粗度(Rzjis)為3.2μm,表面積比(B)為1.2,光澤度[Gs(60°)]為2,電極面之表面粗度(Rzjis)為1.2μm,表面積比(B)為1.05,光澤度[Gs(60°)]為110 之厚12μm之電解銅箔,對於該析出面及電極面。以以下步驟施以表面處理。又,表面粗度、表面積比、光澤度之測定方法係如下述。 As the electrolytic copper foil, the surface roughness (Rzjis) of the deposition surface was 3.2 μm, the surface area ratio (B) was 1.2, the gloss [Gs (60°)] was 2, and the surface roughness (Rzjis) of the electrode surface was 1.2μm, surface area ratio (B) is 1.05, gloss [Gs (60°)] is 110 An electrolytic copper foil having a thickness of 12 μm is applied to the deposition surface and the electrode surface. The surface treatment was applied in the following procedure. Further, the method of measuring the surface roughness, the surface area ratio, and the gloss is as follows.

[粗度之測定] [Measurement of thickness]

使用小坂研究所製之探針式表面粗度計SE3500,依照JIS B 0601-2001進行表面粗度的測定。 The surface roughness was measured in accordance with JIS B 0601-2001 using a probe type surface roughness meter SE3500 manufactured by Otaru Laboratory.

[表面積比之測定] [Measurement of surface area ratio]

使用股份公司KEYENCE雷射顯微鏡VK-X1000,根據藉由以雷射法測定57570μm2之二次元領域時之表面積A,根據上述計算式求得表面積比(B)。 Using the stock company KEYENCE laser microscope VK-X1000, the surface area ratio (B) was determined according to the above calculation formula based on the surface area A when the field of the secondary region of 57570 μm 2 was measured by a laser method.

[光澤度之測定] [Measurement of gloss]

使用日本電色工業股份公司製光澤計PG-1M型,根據光澤度之測定方法之JIS Z 8741-1997,進行光澤度之測定。 Glossiness was measured by JIS Z 8741-1997, which is a method for measuring glossiness, using a gloss meter PG-1M type manufactured by Nippon Denshoku Industries Co., Ltd.

對於此電解銅箔,進行預備處理後,施以粗化處理。以下,依序說明。 This electrolytic copper foil was subjected to a preliminary treatment and then subjected to a roughening treatment. The following is explained in order.

預備處理:將該電解銅箔浸漬於氫氧化鈉水溶液,進行鹼性脫脂處理,進行水洗。然後,將此鹼性脫脂處理結束後之電解銅箔浸漬於硫酸濃度為5質量%之硫酸系水溶液1分鐘後,進行水洗。 Preparation treatment: The electrolytic copper foil was immersed in an aqueous sodium hydroxide solution, subjected to alkaline degreasing treatment, and washed with water. Then, the electrolytic copper foil after completion of the alkaline degreasing treatment was immersed in a sulfuric acid-based aqueous solution having a sulfuric acid concentration of 5 mass% for 1 minute, and then washed with water.

粗化處理:對於前述預備處理結束後之電解銅箔,施以氧化處理。在氧化處理,係在液溫70℃,pH=12,含有亞氯酸濃度150g/L、N-2-(氨基乙基)-3-氨基丙基三甲基矽烷濃度10g/L之氫氧化鈉溶液中,將該電解銅箔浸漬既定的氧化處理時間(1分鐘、2分鐘、4分鐘、10分鐘),而得到在電解銅 箔的兩面,分別具有以氧化銅為主成分之由銅複合化合物所形成之微細凹凸構造之4種類的試料。 Roughening treatment: The electrolytic copper foil after the completion of the preliminary treatment is subjected to an oxidation treatment. Oxidation treatment, at a liquid temperature of 70 ° C, pH = 12, containing chlorous acid concentration of 150g / L, N-2-(aminoethyl)-3-aminopropyltrimethyl decane concentration of 10g / L of hydration In the sodium solution, the electrolytic copper foil is immersed for a predetermined oxidation treatment time (1 minute, 2 minutes, 4 minutes, 10 minutes) to obtain copper in the electrolytic solution. Each of the two sides of the foil has four kinds of samples each having a fine concavo-convex structure composed of a copper composite compound containing copper oxide as a main component.

接著,對於氧化處理結束後之4種類的試料,分別施以還原處理。在還原處理,係將氧化處理結束後之各試料,浸漬於使用碳酸鈉與氫氧化鈉而調整至pH=12之二甲胺硼烷濃度20g/L之水溶液(室溫)中1分鐘進行還原處理,水洗,乾燥。藉由這些的工程,將電解銅箔之兩面的氧化銅的一部分還原而成為氧化亞銅,而做成具有由含有氧化銅及氧化亞銅之銅複合化合物所形成之微細凹凸構造之粗化處理面。根據以上的工程,可得到與本申請書有關之在兩面設有微細凹凸構造之4種類的雷射開孔加工用兩面粗化處理銅箔。 Next, the four types of samples after the completion of the oxidation treatment were subjected to a reduction treatment. In the reduction treatment, each sample after completion of the oxidation treatment was immersed in an aqueous solution (room temperature) having a concentration of dimethylamine borane of 20 g/L adjusted to pH=12 with sodium carbonate and sodium hydroxide for 1 minute to carry out reduction. Treatment, washing and drying. By the above-mentioned process, a part of the copper oxide on both surfaces of the electrolytic copper foil is reduced to form cuprous oxide, and the roughening structure having a fine concavo-convex structure formed of a copper composite compound containing copper oxide and cuprous oxide is formed. surface. According to the above-described work, it is possible to obtain four types of roughened copper foil for laser opening processing in which four kinds of fine concavo-convex structures are provided on both sides in accordance with the present application.

然後,對於上述4種類之雷射開孔加工用兩面粗化處理銅箔之粗化處理面,使用XPS進行定性分析,求得對於Cu(I)之波鋒面積與Cu(II)之波鋒面積的合計面積之Cu(I)之波鋒面積的占有面積率。又,此定性分析的結果,在粗化處理面上「-COO基」之存在也被明確地確認。更且,在此實施例所得到之粗化處理銅箔之Kr吸附比表面積及亮度L*整理示於以下之表1。又,在表1中,「Kr吸附比表面積」僅表示為「比表面積」。 Then, for the roughening treatment surface of the two-side roughening copper foil for the above four types of laser opening processing, qualitative analysis is performed using XPS, and the wave front area of Cu(I) and the wave front of Cu(II) are obtained. The area ratio of the wave front area of Cu(I) of the total area of the area. Moreover, as a result of this qualitative analysis, the presence of the "-COO group" on the roughened surface was also clearly confirmed. Further, the Kr adsorption specific surface area and the luminance L* of the roughened copper foil obtained in this example are shown in Table 1 below. In addition, in Table 1, "Kr adsorption specific surface area" is only shown as "specific surface area."

然後,對於上述之兩面上形成了銅複合化合物之上述4種類的試料,測定剝離強度。在測定時,將各試料分別在絕緣構成材之FR-4預浸料(Panasonic股份公司製R1551)上,使用真空加壓機,以加壓壓力2.9MPa,溫度190℃,加壓時間90分鐘之條件層積而製作覆銅層積板。接著,使用此覆 銅層積板,以蝕刻法,製作具有3.0mm寬之剝離強度測定用直線電路之試驗基板。然後,根據JIS C6481(1996),對於各試料測定剝離強度。 Then, the peel strength was measured for the above four types of samples in which the copper composite compound was formed on both surfaces. In the measurement, each sample was placed on an FR-4 prepreg (R1551 manufactured by Panasonic Corporation) of an insulating component, and a vacuum press was used at a pressurization pressure of 2.9 MPa, a temperature of 190 ° C, and a press time of 90 minutes. The conditions are laminated to produce a copper clad laminate. Then use this overlay A copper laminated plate was subjected to an etching method to prepare a test substrate having a linear circuit for measuring a peel strength of 3.0 mm. Then, the peel strength was measured for each sample in accordance with JIS C6481 (1996).

【實施例2】 [Example 2]

在實施例2,係對於與實施例1相同之電解銅箔,依照以下步驟,製作在單面上包括具有由以氧化銅為主成分之銅複合化合物所形成之凸狀部形成之微細凹凸構造之粗化處理面,另一面上包括具有含有以氧化銅及氧化亞銅之銅複合化合物所形成之凸狀部形成之微細凹凸構造之粗化處理面之兩面粗化處理銅箔,將此兩面粗化處理銅箔之另一面側層積於絕緣層構成材而製作覆銅層積板。對於上述電解銅箔之預備處理與氧化處理(粗化處理)係同於實施例1而進行,因此在此省略說明,對於氧化處理後之還原處理以後之工程說明。 In the second embodiment, the electrolytic copper foil which is the same as in the first embodiment is formed into a fine concavo-convex structure including a convex portion formed of a copper composite compound containing copper oxide as a main component on one surface in accordance with the following procedure. The surface of the roughened surface includes a roughened copper foil having a roughened surface having a fine uneven structure formed of a convex portion formed of a copper composite compound of copper oxide and cuprous oxide, and the two surfaces are roughened. The other side of the roughened copper foil was laminated on the insulating layer constituent material to form a copper clad laminate. Since the preliminary treatment and the oxidation treatment (roughening treatment) of the above-mentioned electrolytic copper foil are carried out in the same manner as in the first embodiment, the description thereof will be omitted here, and the construction after the reduction treatment after the oxidation treatment will be described.

粗化處理(還原處理):如上述,對於實施了同於實施例1之預備處理及氧化處理(氧化處理時間2分鐘)之電解銅箔,如下述進行還原處理。在實施例2,不對於成為雷射照射面之側的施以還原處理,而僅對於成為與絕緣層構成材之接著面側之面,淋浴噴霧與實施例1相同之還原處理溶液。 Roughening treatment (reduction treatment): As described above, the electrolytic copper foil subjected to the preliminary treatment and the oxidation treatment (oxidation treatment time of 2 minutes) in the same manner as in Example 1 was subjected to reduction treatment as follows. In the second embodiment, the reduction treatment was carried out in the same manner as in the first embodiment except that the reduction treatment was applied to the side of the laser irradiation surface, and only the surface on the side of the adhesion surface of the insulating layer was used.

矽烷耦合劑處理:然後,對於實施了還原處理之面,亦即對於與絕緣層構成材之接著面,施以矽烷耦合劑處理。具體而言,係在還原處理後水洗,將矽烷耦合劑處理液(以離子交換水為溶劑,含有5g/L濃度之γ-環氧丙氧三甲氧基矽烷之水溶液),以淋浴法吹附在實施了上述還原處理之面,進行矽烷耦合劑之吸附。然後,矽烷耦合劑之吸附結束後,使用 電熱器,在氣氛溫度120℃之氣氛中,使表面的水分蒸發,促進在該粗化處理面之-OH基與矽烷耦合劑之縮合反應。 Treatment with decane coupling agent: Then, the surface subjected to the reduction treatment, that is, the surface of the material constituting the insulating layer, is treated with a decane coupling agent. Specifically, after the reduction treatment, the water is washed, and the decane coupling agent treatment liquid (aqueous solution containing γ-glycidoxytrimethoxydecane having a concentration of 5 g/L in ion-exchanged water as a solvent) is blown by a shower method. The adsorption of the decane coupling agent is carried out on the surface where the above reduction treatment is carried out. Then, after the adsorption of the decane coupling agent is completed, use The electric heater evaporates the surface water in an atmosphere at an atmospheric temperature of 120 ° C to promote the condensation reaction of the -OH group and the decane coupling agent on the roughened surface.

使用在以上的工程所得到之兩面粗化處理銅箔,同於實施例1,製作覆銅層積板。然後,同於實施例1製作試驗基板,測定剝離強度。 A copper clad laminate was produced in the same manner as in Example 1 except that the copper foil was roughened on both sides obtained in the above work. Then, a test substrate was produced in the same manner as in Example 1, and the peel strength was measured.

【比較例】 [Comparative example]

[比較例1] [Comparative Example 1]

在比較例1,係在與實施例1所用之電解銅箔同樣之電解銅箔的兩面,施以以往之黑化處理,使微細的銅氧化物形成附著,而成為黑褐色的狀態。此時之黑化處理條件,係採用亞氯酸鈉25g/L,氫氧化鈉20g/L,烷基酯6g/L,液溫67℃,處理時間4分鐘。將在此兩面上實施了黑化處理之電解銅箔(以下,稱為「兩面黑化處理銅箔」),以與實施例1相同的條件層積於上述之FR-4預浸料之兩面,得到覆銅層積板。 In Comparative Example 1, the conventional blackening treatment was applied to both surfaces of the electrolytic copper foil similar to the electrolytic copper foil used in Example 1, and the fine copper oxide was adhered to a dark brown state. The blackening treatment conditions at this time were 25 g/L of sodium chlorite, 20 g/L of sodium hydroxide, 6 g/L of an alkyl ester, a liquid temperature of 67 ° C, and a treatment time of 4 minutes. Electrolytic copper foil (hereinafter referred to as "two-faced blackened copper foil") subjected to blackening treatment on both surfaces thereof was laminated on both sides of the above-mentioned FR-4 prepreg under the same conditions as in Example 1. , to obtain a copper clad laminate.

[比較例2] [Comparative Example 2]

在比較例,係在與實施例1所用之電解銅箔同樣之電解銅箔的兩面,施以以往之黑化處理及還原處理(還原黑化處理)。此時之黑化處理條件,採用含有羅門哈斯電子材料股份公司製之氧化處理液之「PRO BOND 80A OXIDE SOLUTION」10vol%及「PRO BOND 80B OXIDE SOLUTION」20vol%之水溶液,液溫85℃,處理時間5分鐘。然後,將實施了黑化處理之電解銅箔,以下述還原處理條件施以還原處理。還原處理條件,係採用含有羅門哈斯電子材料股份公司製之還原處理液之「CIRCUPOSIT PB OXIDE CONVERTER 60C」6.7vol%, 「CUPOSITZ」1.5vol%之水溶液,液溫35℃,處理時間5分鐘。將在此兩面上實施了還原黑化處理之電解銅箔(以下,稱為「兩面還原黑化處理銅箔」),以與實施例1相同的條件層積於上述之FR-4預浸料之兩面,得到覆銅層積板。 In the comparative example, the conventional blackening treatment and reduction treatment (reduction blackening treatment) were applied to both surfaces of the electrolytic copper foil similar to the electrolytic copper foil used in Example 1. At this time, the blackening treatment conditions were as follows: "PRO BOND 80A OXIDE SOLUTION" 10 vol% and "PRO BOND 80B OXIDE SOLUTION" 20 vol% aqueous solution containing the oxidation treatment liquid of Rohm and Haas Electronic Materials Co., Ltd., liquid temperature 85 ° C, Processing time is 5 minutes. Then, the electrolytic copper foil subjected to the blackening treatment was subjected to a reduction treatment under the following reduction treatment conditions. The reduction treatment conditions were 6.7 vol% using "CIRCUPOSIT PB OXIDE CONVERTER 60C" containing a reducing treatment liquid manufactured by Rohm and Haas Electronic Materials Co., Ltd. "CUPOSITZ" 1.5 vol% aqueous solution, liquid temperature 35 ° C, treatment time 5 minutes. An electrolytic copper foil (hereinafter referred to as "double-sided reduction blackening copper foil") subjected to reduction blackening treatment on both surfaces thereof was laminated on the above-mentioned FR-4 prepreg under the same conditions as in Example 1. On both sides, a copper clad laminate is obtained.

在以下表1,表示在實施例1及實施例2所得到之在兩面設置了微細凹凸之4種類的雷射開孔加工用兩面粗化處理銅箔之比表面積、亮度L*、剝離強度之各測定結果。更且,表示使用XPS定性分析銅複合化合物之構成元素時之Cu(I)波峰之占有面積率(%)。又,在表1表示比較例1及比較例2所得到之兩面黑化處理銅箔及兩面黑化還原處理銅箔比表面積、亮度L*、剝離強度之各測定結果。 Table 1 below shows the specific surface area, the brightness L*, and the peel strength of the four-side roughened copper foil for laser opening processing in which four types of fine concavities and convexities are provided on both surfaces, which are obtained in the first and second embodiments. Each measurement result. Further, the occupancy area ratio (%) of the Cu(I) peak when the constituent elements of the copper composite compound were qualitatively analyzed by XPS was used. Further, Table 1 shows the results of measurement of the specific surface area, the brightness L*, and the peel strength of the two-faced blackened copper foil obtained in Comparative Example 1 and Comparative Example 2 and the two-faced blackened reduction copper foil.

從此表1可理解到,即使使氧化處理時間在1分鐘~10分鐘之間變動,形成於析出面及電極面之雙方之微細凹凸的最大長度皆在500nm以下,在粗化處理面之定性分析中所 檢出的內容也沒有差異。更且,關於粗化處理面之亮度L*之值,也顯示18~26之差異很少的值。相對於此,Kr吸附比表面積,係與氧化處理時間之增加成正比,值變大。然後,這4種類之雷射開孔加工用兩面粗化處理銅箔之剝離強度,即使是最短的氧化處理時間,也可得到實用上充分的剝離強度,可得到與Kr吸附比表面積之值成正比之剝離強度。由此來看,可理解到實施例所採用之氧化處理時間為適當的時間。 As can be understood from Table 1, even if the oxidation treatment time is changed from 1 minute to 10 minutes, the maximum length of the fine unevenness formed on both the deposition surface and the electrode surface is 500 nm or less, and qualitative analysis on the roughened surface. Central There is no difference in the content checked out. Further, regarding the value of the brightness L* of the roughened surface, a value having a small difference of 18 to 26 is also displayed. On the other hand, the Kr adsorption specific surface area is proportional to the increase in the oxidation treatment time, and the value becomes large. Then, in the four types of laser drilling, the peeling strength of the copper foil treated by the two-side roughening treatment can obtain a practically sufficient peeling strength even in the shortest oxidation treatment time, and the value of the specific surface area to be adsorbed with Kr can be obtained. It is proportional to the peel strength. From this point of view, it can be understood that the oxidation treatment time employed in the examples is an appropriate time.

接著,對於雷射開孔加工性能檢討。在實施例及實施例2,係使用與本申請書有關之雷射開孔加工用兩面粗化處理銅箔,使用包括具有由銅複合化合物所形成之最大長度為500nm以下之針狀或板狀之凸狀部形成之微細凹凸構造之粗化處理面之覆銅層積板。相對於此,比較例1,係將實施了以往之黑化處理之電解銅箔層積於絕緣層構成材之物,比較例2,係將實施了以往之還原黑化處理之電解銅箔層積於絕緣層構成材之物。然後,使用濾紙(No.5B),以人手輕輕摩擦與實施例有關之覆銅層積板及與比較例有關之覆銅層積板之雷射照射面,其結果,與實施例1及實施例2有關之覆銅層積板之粗化處理面,在僅以目視觀察下,沒有任何變化。相對於此,與比較例1及比較例2有關之覆銅層積板之黑化處理面或是還原黑化處理面,產生光澤。將此以濾紙摩擦後之表面做為雷射照射面,進行開孔加工。 Next, a review of the processing performance of the laser opening. In the embodiment and the second embodiment, the copper foil for double-face roughening treatment for laser hole drilling according to the present application is used, and a needle-like or plate-like shape having a maximum length of 500 nm or less formed of a copper composite compound is used. A copper clad laminate having a roughened surface of a fine concavo-convex structure formed by a convex portion. On the other hand, in Comparative Example 1, the electrolytic copper foil subjected to the conventional blackening treatment was laminated on the insulating layer constituent material, and in Comparative Example 2, the electrolytic copper foil layer subjected to the conventional reduction blackening treatment was used. The material that is accumulated in the insulating layer. Then, using a filter paper (No. 5B), the laser-illuminated surface of the copper-clad laminate which is related to the embodiment and the copper-clad laminate which is related to the comparative example was gently rubbed by hand, and as a result, with Example 1 and The roughened surface of the copper clad laminate according to Example 2 was not changed by visual observation. On the other hand, the blackened surface or the reduced blackened surface of the copper-clad laminate according to Comparative Example 1 and Comparative Example 2 produced gloss. The surface rubbed with the filter paper is used as a laser irradiation surface to perform the drilling process.

此時之碳酸氣體雷射照射條件,係預定以光罩徑2.3mm,脈衝寬度14μsec,脈衝能量15.0mJ,位移量0.8,雷射光徑124μm,對於使用了雷射開孔加工用兩面粗化處理銅箔 之覆銅層積板,形成80μm之加工徑的孔,而進行各試料100射之導孔形成試驗。因此,做為本發明者等之判斷基準,加工後之孔徑成為80μm以上之範圍,判斷加工良好地進行。以下,將其結果示於以下表2。 At this time, the carbon dioxide gas irradiation conditions are predetermined to have a mask diameter of 2.3 mm, a pulse width of 14 μsec, a pulse energy of 15.0 mJ, a displacement of 0.8, and a laser beam diameter of 124 μm, for the use of laser aperture processing for two-sided roughening treatment. Copper foil The copper-clad laminate was formed into a hole having a processing diameter of 80 μm, and a pilot hole formation test was performed for each sample 100. Therefore, as a criterion for judging by the inventors and the like, the pore diameter after the processing is in the range of 80 μm or more, and it is judged that the processing is performed satisfactorily. Hereinafter, the results are shown in Table 2 below.

從表2可知,調查此雷射開孔加工用兩面粗化處理銅箔之雷射開孔加工性能之結果,在實施例1及實施例2之情況,在全部的試料,可判斷進行了良好地雷射開孔加工。相對於此,比較例1及比較例2之情況,由於在黑化處理表面或還原黑化處理表面產生摩擦所造成的光澤,開口率為40%,而且,可理解到開孔徑分布具有很大的幅度。亦即,可說是沒有達到安定的雷射開孔加工。又,表2所指開孔率,係指進行100射之導孔形成試驗,可開孔之射數的比率。然後,開孔徑分布,係指測定在100射之導孔形成試驗中所得到之導孔的開孔徑時 之分布幅度。 As can be seen from Table 2, the results of the laser drilling performance of the double-faced roughened copper foil for the laser drilling process were investigated. In the case of the first and second embodiments, it was judged that all the samples were in good condition. The mine is shot open. On the other hand, in the case of Comparative Example 1 and Comparative Example 2, the opening ratio was 40% due to the gloss caused by friction on the blackened surface or the reduced blackened surface, and it is understood that the open pore size distribution is large. Amplitude. That is to say, it can be said that the laser drilling process has not been achieved. In addition, the opening ratio referred to in Table 2 refers to the ratio of the number of shots that can be opened by performing a pilot hole formation test of 100 shots. Then, the opening pore size distribution is measured when the opening diameter of the pilot hole obtained in the 100-well conducting hole formation test is measured. The extent of the distribution.

【產業上之可利用性】 [Industrial Availability]

藉由使用與本申請書有關之雷射開孔加工用之粗化處理銅箔,製造覆銅層積板或印刷電路板,可使雷射吸光率高、耐擦傷性能優良之具有由銅複合化合物所形成之微細凹凸構造之粗化處理面做為銅層之外表面。因此,可發揮與對於銅層之表面施以以往之黑化處理時同等以上之雷射開孔加工性能,且作業員在操作該覆銅層積板時變得不需要細心地注意,作業效率提升。其結果,對於覆銅層積板之雷射開孔加工性能之差異減少,安定之開孔變得可能。與此同時,可得到與絕緣層構成材之良好的密著性,而可防止在面內兩者之密著性產生差異。更且,可得到良好之蝕刻因子。特別是,該雷射開孔加工用之粗化處理銅箔,很適合應用於印刷電路板之增層法,藉由使用該粗化處理銅箔形成增層層,可提供品質良好之多層印刷電路板。 By using a roughened copper foil for laser hole drilling processing according to the present application, a copper clad laminate or a printed circuit board is produced, and the laser absorbance is high and the scratch resistance is excellent. The roughened surface of the fine concavo-convex structure formed by the compound is used as the outer surface of the copper layer. Therefore, it is possible to exhibit the same performance as the laser drilling process when the surface of the copper layer is subjected to the conventional blackening treatment, and the worker does not need to pay careful attention when operating the copper-clad laminate, and the work efficiency is obtained. Upgrade. As a result, the difference in the processing performance of the laser opening of the copper clad laminate is reduced, and the opening of the stability becomes possible. At the same time, good adhesion to the insulating layer constituent material can be obtained, and the difference in adhesion between the two in the surface can be prevented. Moreover, a good etching factor can be obtained. In particular, the roughened copper foil for laser hole drilling is suitable for use in a build-up method of a printed circuit board, and a multilayered layer can be provided by using the roughened copper foil to form a build-up layer. Circuit board.

2‧‧‧銅箔 2‧‧‧ copper foil

4‧‧‧析出面側之粗化處理面 4‧‧‧The roughening surface of the surface

7‧‧‧絕緣層構成材 7‧‧‧Insulation layer

8‧‧‧內層電路 8‧‧‧ Inner layer circuit

10‧‧‧導孔 10‧‧‧ Guide hole

23‧‧‧第1增層配線電路 23‧‧‧1st build-up wiring circuit

24‧‧‧電鍍層 24‧‧‧Electroplating

30‧‧‧第1增層層 30‧‧‧1st build-up

31‧‧‧第1增層電路層 31‧‧‧1st build-up circuit layer

32‧‧‧第2增層層 32‧‧‧2nd layer

41‧‧‧具有第1增層電路層之層積體 41‧‧‧Layer with the first build-up circuit layer

42‧‧‧具有第2增層層之層積體 42‧‧‧Layer with second build-up

Claims (13)

一種雷射開孔加工用之粗化處理銅箔,其特徵在於:在銅箔之兩面,包括具有由含有氧化銅之銅複合化合物所形成之最大長度為500nm以下之針狀或板狀之凸狀部所形成之微細凹凸構造之粗化處理面,前述銅箔之一方的面為雷射加工時被雷射光照射之雷射照射面,另一方的面為與絕緣層構成材之接著面。 A roughened copper foil for laser hole drilling, characterized in that: on both sides of the copper foil, a needle-like or plate-like convex shape having a maximum length of 500 nm or less formed by a copper composite compound containing copper oxide is included The roughened surface of the fine concavo-convex structure formed by the shape is one surface of the copper foil which is a laser irradiation surface irradiated with laser light during laser processing, and the other surface is a surface of the insulating layer. 根據申請專利範圍第1項之雷射開孔加工用之粗化處理銅箔,其中,對於藉由X光光電子能譜分析法分析前述粗化處理面之構成元素時所得到之Cu(I)之波鋒面積,與Cu(II)之波鋒面積之合計面積,Cu(I)之波鋒面積所佔比率,前述雷射照射面側為未滿50%,前述接著面側為50%以上。 The roughened copper foil for laser hole drilling according to the first aspect of the patent application, wherein the Cu(I) obtained by analyzing the constituent elements of the roughened surface by X-ray photoelectron spectroscopy The area of the wave front, the total area of the wave front area of Cu(II), and the ratio of the wave front area of Cu(I), the side of the laser irradiation surface is less than 50%, and the side of the above-mentioned surface is 50% or more. . 根據申請專利範圍第1項之雷射開孔加工用之粗化處理銅箔,其中,前述雷射照射面,具有以氧化銅為主成分之銅複合化物所形成之前述微細凹凸構造,前述接著面側具有以氧化亞銅為主成分之銅複合氧化物所形成之前述微細凹凸構造。 The roughened copper foil for laser drilling according to the first aspect of the invention, wherein the laser irradiation surface has the fine concavo-convex structure formed of a copper composite containing copper oxide as a main component, and the The surface side has the above-described fine concavo-convex structure formed of a copper composite oxide containing cuprous oxide as a main component. 根據申請專利範圍第1項之雷射開孔加工用之粗化處理銅箔,其中,使用掃描式電子顯微鏡,以傾斜角45°、50000倍以上之倍率觀察前述粗化處理面時,互相鄰接之凸狀部之中,與其他的凸狀部可分離觀察之先端部分的長度為250nm以下。 The roughened copper foil for laser drilling according to the first aspect of the invention, wherein the roughened surface is observed at a magnification of 45° or more and a magnification of 50,000 times or more by using a scanning electron microscope Among the convex portions, the length of the tip end portion which is separable from the other convex portions is 250 nm or less. 根據申請專利範圍第4項之雷射開孔加工用之粗化處理銅箔,其中,對於前述凸狀部之前述最大長度,前述凸狀部 之前述先端部分之長度為1/2以下。 The roughened copper foil for laser hole drilling according to the fourth aspect of the patent application, wherein the convex portion is formed for the maximum length of the convex portion The length of the aforementioned tip end portion is 1/2 or less. 根據申請專利範圍第1項之雷射開孔加工用之粗化處理銅箔,其中,在前述粗化處理層之表面上吸附氪而測定之比表面積為0.035m2/g以上。 The roughened copper foil for laser drilling according to the first aspect of the invention, wherein the specific surface area measured by adsorbing ruthenium on the surface of the roughened layer is 0.035 m 2 /g or more. 根據申請專利範圍第1項之雷射開孔加工用之粗化處理銅箔,其中,前述粗化處理層面之以L*a*b*表色系表示時之亮度L*為30以下。 The roughened copper foil for laser opening processing according to the first aspect of the invention is characterized in that the brightness L* when the roughening treatment layer is expressed by the L*a*b* color system is 30 or less. 根據申請專利範圍第1項之雷射開孔加工用之粗化處理銅箔,其中,將前述銅箔之雷射照射面側以雷射法測定57570μm2之二次元領域時之表面積稱為三次元表面積(Aμm2),對於前述二次元領域之面積之三次元表面積之比為B時,B為1.1以上。 The roughened copper foil for laser hole drilling according to the first aspect of the patent application, wherein the surface area of the laser irradiation surface side of the copper foil measured by a laser method in the secondary region of 57570 μm 2 is referred to as three times. The element surface area (Aμm 2 ), when the ratio of the three-dimensional surface area of the area of the above-mentioned secondary element is B, B is 1.1 or more. 根據申請專利範圍第1項之雷射開孔加工用之粗化處理銅箔,其中,前述銅箔之前述接著面側之表面粗度(Rzjis)為2.0μm以下。 The roughened copper foil for laser hole drilling according to the first aspect of the invention, wherein the copper foil has a surface roughness (Rzjis) of 2.0 μm or less. 根據申請專利範圍第1項之雷射開孔加工用之粗化處理銅箔,其中,對於前述接著面施以矽烷耦合劑處理。 The roughened copper foil for laser hole drilling according to the first aspect of the patent application, wherein the ruthenium coupling agent treatment is applied to the subsequent surface. 一種覆銅層積板,其特徵在於:將申請專利範圍第1項之雷射開孔加工用之粗化處理銅箔層積在絕緣層構成材之至少單面上。 A copper clad laminate characterized in that the roughened copper foil for laser opening processing of the first application of the patent application is laminated on at least one surface of the insulating layer constituent material. 一種印刷電路板,其特徵在於:具有使用申請專利範圍第1項之雷射開孔加工用之粗化處理銅箔所形成之銅層。 A printed circuit board comprising a copper layer formed by using a roughened copper foil for laser opening processing according to claim 1 of the patent application. 根據申請專利範圍第12項之印刷電路板,其中,在前述銅層及前述絕緣層,係具有由於雷射開孔加工所形成之導孔。 The printed circuit board according to claim 12, wherein the copper layer and the insulating layer have via holes formed by laser drilling.
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